Electronic component quality detection adjustment control system

Abstract

The invention discloses an electronic component quality detection adjustment control system, which relates to the technical field of adjustment control and comprises a use environment information integration module, a use scene information acquisition module and a quality detection parameter adjustment module. According to the electronic component quality detection adjustment control system, through the arrangement of the quality detection parameter adjustment module, electronic components with problems can be identified in the quality detection process; in the process of adjusting the quality detection parameters, the virtual high detection standard caused by the fact that electronic components do not need to reach the detection standard during direct detection due to circuit loss in the circuit can be avoided; therefore, the detection standard is correspondingly changed by combining the quality detection parameter adjustment module with the use scene of the electronic component, so that the performance surplus of the electronic component caused by the adoption of an overhigh detection standard in different use scenes can be avoided, and meanwhile, the repeated utilization rate of the bad electronic component can be increased; and the waste of bad electronic components is reduced.

Description

Technical Field

[0001] The invention relates to the technical field of regulation and control, and in particular to an electronic component quality detection and regulation control system. Background Art

[0002] With the widespread application of electronic components in electronic products, their quality and reliability have a direct impact on the performance and service life of electronic products. The failure of electronic components will cause various problems in electronic products, such as performance degradation, downtime, damage, etc., which will bring inconvenience and economic losses to users. Therefore, the quality inspection of electronic components is particularly important for electronic products. The quality inspection of electronic components has become an indispensable part of the electronics manufacturing industry.

[0003] The currently existing electronic component quality inspection system only detects whether the electronic components are suitable for the current use environment during quality inspection. It is unable to detect the performance changes of problematic electronic components during subsequent use, and is unable to accurately determine whether the problematic electronic components should be repaired or reused in other suitable circuit boards. Therefore, it is unable to perform good subsequent processing on the problematic electronic components, thereby increasing the processing cost of the problematic electronic components. Summary of the invention

[0004] The object of the present invention is to provide an electronic component quality detection and adjustment control system to solve the above-mentioned deficiencies in the prior art.

[0005] In order to achieve the above-mentioned purpose, the present invention provides the following technical solutions: an electronic component quality detection and adjustment control system, comprising a component performance change detection module, a usage environment information collection module, a usage environment information integration module, a usage scenario information collection module, a quality detection parameter adjustment module and a data association detection module, characterized in that:

[0006] The component performance change detection module is used to collect parameter information of electronic components during quality inspection, and analyze the performance changes of electronic components through the electronic component performance analysis model;

[0007] The usage scenario information acquisition module is used to receive manually input usage environment information of electronic components, the usage scenario information includes circuit information when the electronic components are used in external circuits and circuit information when the electronic components are used in external circuits, the external circuits include but are not limited to external voltage stabilization circuits, external power supply circuits, external control circuits and external power supply circuits, the internal circuits include but are not limited to internal voltage stabilization circuits, internal power supply circuits, internal control circuits and internal power supply circuits;

[0008] The use environment information collection module is used to collect the use environment information of the electronic components, and the environment information includes the use environment climate information of the electronic components, the use environment temperature information of the electronic components, and the use environment interference information of the electronic components;

[0009] The usage scenario information integration module integrates the usage scenario information of the electronic components collected by the usage scenario information acquisition module and the usage environment information of the electronic components collected by the usage environment information acquisition module based on the data integration model, thereby obtaining the electronic component usage scenario information integration data, and uses the electronic component usage scenario information integration data as a variable of the electronic component performance change prediction model, thereby obtaining the performance change prediction results of the electronic components in the usage scenarios, and compares the performance change prediction results of the electronic components in the usage scenarios with the performance changes of the electronic components detected by the component performance change detection module based on the comparison model, and marks the electronic components as standard electronic components and abnormal electronic components according to the comparison results;

[0010] The data association detection module receives the performance change prediction results of the electronic components marked as standard electronic components in the usage scenario information integration module, and analyzes the data association information between the electronic component usage scenario information integration data obtained by the usage scenario information integration module and the performance change prediction results of the electronic components marked as standard electronic components through the data association detection model, wherein the data association relationship includes the association relationship between the electronic component usage scenario information integration data and the detection current and the association relationship between the electronic component usage scenario information integration data and the detection voltage;

[0011] The quality detection parameter adjustment module is used to adjust the quality detection parameters of the electronic components marked as abnormal, thereby obtaining the usage scenario information of the abnormal electronic components in a stable performance state and the usage environment information of the abnormal electronic components in a stable performance state. The quality detection parameter adjustment module determines the appropriate usage scenario information integration data of the abnormal electronic components by adjusting the detection current of the abnormal electronic components and the detection voltage of the abnormal electronic components, and divides the appropriate usage scenario information integration data of the electronic components through a data division model to obtain the usage environment information of the abnormal electronic components and the usage scenario information of the abnormal electronic components, selects the abnormal electronic component usage environment information of the abnormal electronic components in a stable performance state and the usage scenario information of the abnormal electronic components in a stable performance state through a data selection model, matches the usage environment information of the electronic components collected by the usage environment information collection module with the abnormal electronic component usage environment information of the abnormal electronic components in a stable performance state through a data matching model, and the data matching model is also used to match the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information of the abnormal electronic components in a stable performance state.

[0012] Furthermore, the usage scenario information integration module includes:

[0013] A data collection module, used to collect the electronic component usage scenario information collected by the usage scenario information collection module and the electronic component usage environment information collected by the usage environment information collection module;

[0014] A data integration module, used to integrate the electronic component usage scenario information and the electronic component usage environment information in the data collection module based on the data integration model to obtain the electronic component usage scenario information integration data;

[0015] An electronic component performance change prediction module is used to obtain a performance change prediction result of the electronic component in the usage scenario based on the electronic component performance change prediction model and integrating the electronic component usage scenario information data as a variable;

[0016] Data comparison module: used to compare the performance change prediction results of electronic components in the usage scenario with the performance changes of electronic components detected by the component performance change detection module based on the comparison model.

[0017] Furthermore, the usage scenario information integration module includes the following working steps:

[0018] A1, collecting the electronic component usage scenario information collected by the usage scenario information collection module and the electronic component usage environment information collected by the usage environment information collection module through the data collection module;

[0019] A2, based on the data integration model, the electronic component usage scenario information in step A1 is integrated with the electronic component usage environment information to obtain electronic component usage scenario information integration data;

[0020] A3, an electronic component performance change prediction model based on the electronic component performance change prediction module, and using the electronic component usage scenario information integration data as variables, thereby obtaining a performance change prediction result of the electronic component in the usage scenario;

[0021] A4, comparing the performance change prediction result of the electronic component in the usage scenario with the performance change of the electronic component detected by the component performance change detection module based on the comparison model;

[0022] A5, marking the electronic components with the same comparison results in step A4 as standard electronic components through a data marking module, and performing subsequent production and assembly on the standard electronic components;

[0023] A6, marking the electronic components with different comparison results in step A4 as abnormal electronic components through the data marking module, and continuing to test the abnormal electronic components after adjusting the quality test parameters.

[0024] Furthermore, the data association detection module includes:

[0025] An information receiving module, used to receive the prediction results of performance changes of electronic components marked as standard electronic components in the usage scenario information integration module;

[0026] The data detection association module analyzes the data association information between the electronic component usage scenario information integration data obtained by the usage scenario information integration module and the electronic component performance change prediction results marked as standard electronic components through a data association detection model.

[0027] Furthermore, the quality detection parameter adjustment module includes:

[0028] A quality data acquisition module, used for acquiring the detection current of abnormal electronic components and the detection voltage of the abnormal electronic components;

[0029] A data adjustment module, used for adjusting the detection current and detection voltage collected in the quality data collection module based on the data adjustment model;

[0030] A data partitioning module is used to partition the integrated data of appropriate usage scenario information of electronic components based on a data partitioning model, thereby obtaining abnormal electronic component usage environment information and abnormal electronic component usage scenario information;

[0031] A data selection module, used to select abnormal electronic component use environment information of abnormal electronic components in a stable performance state and abnormal electronic component use scenario information of abnormal electronic components in a stable performance state based on a data selection model;

[0032] The data matching module is used to match the use environment information of the electronic components collected by the use environment information collection module with the abnormal electronic component use environment information of the abnormal electronic components in a stable performance state through a data matching model.

[0033] The data matching module is also used to match the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information when the abnormal electronic components are in a stable performance state through a data matching model.

[0034] Furthermore, the quality detection parameter adjustment module includes the following working steps:

[0035] B1, collecting the detection current and the detection voltage of the abnormal electronic components through the quality data collection module;

[0036] B2, adjusting the detection current and detection voltage in step B1 based on the data adjustment model;

[0037] B3, based on the adjustment result of step B2, obtaining appropriate usage scenario information integration data of the abnormal electronic components;

[0038] B4, dividing the integrated data of the appropriate usage scenario information of the electronic components through the data division model of the data division module, and then obtaining the abnormal electronic component usage environment information and the abnormal electronic component usage scenario information;

[0039] B5, selecting the abnormal electronic component use environment information and the abnormal electronic component use scenario information of the abnormal electronic component in a stable performance state through the data selection model of the data selection module;

[0040] B6, matching the use environment information of the electronic components collected by the use environment information collection module with the use environment information of the abnormal electronic components in a stable performance state through a data matching model;

[0041] B7, matching the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information of the abnormal electronic components in a stable performance state through a data matching model;

[0042] B8, marking the abnormal electronic components whose results in step B6 and step B7 are both matched as usable electronic components, and marking the abnormal electronic components whose results in step B6 and step B7 are both unmatched and whose results in step B6 and step B7 are only matched in one item as unusable electronic components;

[0043] B9, performing subsequent production and assembly of the electronic components marked as available electronic components in step B8 according to the matched usage environment information and the matched usage scenario information;

[0044] B10, repairing the electronic components marked as unusable electronic components in step B8.

[0045] Further, the following working steps are included:

[0046] S1, collecting parameter information of electronic components during quality inspection through a component performance change detection module, and analyzing performance changes of electronic components through an electronic component performance analysis model;

[0047] S2, receiving the electronic component usage environment information manually input by using the scene information acquisition module;

[0048] S3, collecting usage environment information of electronic components by using an environment information collection module;

[0049] S4, integrating the electronic component usage scenario information collected in step S2 with the electronic component usage environment information collected in step S3 by using a usage scenario information integration model of the usage scenario information integration module, thereby obtaining electronic component usage scenario information integration data;

[0050] S5, using the integrated data of the electronic component usage scenario information in step S4 as a variable of the electronic component performance change prediction model to obtain a performance change prediction result of the electronic component in the usage scenario;

[0051] S6, comparing the predicted results of the performance changes of the electronic components in the usage scenarios in step S5 with the performance changes of the electronic components detected in step S1, and marking the electronic components with the same comparison results as standard electronic components, and marking the electronic components with the same comparison results as standard electronic components and abnormal electronic components;

[0052] S7, detecting, by a data association detection module, an association relationship between the standard electronic component usage scenario information integrated data and the detection current, and an association relationship between the standard electronic component usage scenario information integrated data and the detection voltage;

[0053] S8, by the quality detection parameter adjustment module based on the data association detection result in step S7, the use scenario information of the electronic components marked as abnormal electronic components in step S6 in a stable performance state and the use environment information of the abnormal electronic components in a stable performance state;

[0054] S9, based on the use environment information of the abnormal electronic components in step S8, matching the use environment information of the electronic components collected in step S2 through a data matching model;

[0055] S10, matching based on the usage scenario information of the abnormal electronic components in step S8 and the usage scenario information of the electronic components collected in step S3 through the data matching model;

[0056] S11, marking the abnormal electronic components whose results in step S9 and step S10 are both matched as usable electronic components, and marking the abnormal electronic components whose results in step S9 and step S10 are both unmatched and whose results in step S9 and step S10 are only matched in one item as unusable electronic components;

[0057] S12, performing subsequent production and assembly of the electronic components marked as available electronic components in step S11 according to the matching use environment information and the matching use scenario information;

[0058] S13, repairing the electronic components marked as unusable electronic components in step S11.

[0059] Compared with the prior art, the electronic component quality inspection and control system provided by the present invention can not only identify electronic components with problems during the quality inspection process through the setting of the quality inspection parameter adjustment module, but also avoid the inflated inspection standards caused by the electronic components not meeting the inspection standards during direct inspection due to circuit losses in the circuit during the quality inspection parameter adjustment process. Therefore, by making corresponding changes to the inspection standards through the quality inspection parameter adjustment module in combination with the use scenarios of the electronic components, it is possible to avoid excess performance of electronic components caused by using excessively high inspection standards in different use scenarios, and at the same time increase the reuse rate of defective electronic components and reduce the waste of defective electronic components. BRIEF DESCRIPTION OF THE DRAWINGS

[0060] In order to more clearly illustrate the embodiments of the present application or the technical solutions in the prior art, the drawings required for use in the embodiments will be briefly introduced below. Obviously, the drawings described below are only some embodiments recorded in the present invention. For ordinary technicians in this field, other drawings can also be obtained based on these drawings.

[0061] Figure 1 A system structure block diagram provided for an embodiment of the present invention. DETAILED DESCRIPTION

[0062] In order to enable those skilled in the art to better understand the technical solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings.

[0063] In the description of the present invention, it should be understood that the terms "center", "longitudinal", "lateral", "length", "width", "thickness", "up", "down", "front", "back", "left", "right", "vertical", "horizontal", "top", "bottom", "inside", "outside", "clockwise", "counterclockwise" and the like indicate orientations or positional relationships based on the orientations or positional relationships shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, and do not indicate or imply that the referred device or element must have a specific orientation, be constructed and operated in a specific orientation, and therefore should not be understood as limiting the present invention.

[0064] In addition, the terms "first" and "second" are only used for descriptive purposes and cannot be understood as indicating or implying relative importance or implicitly indicating the number of technical features indicated. Therefore, the features defined as "first" and "second" may explicitly or implicitly include one or more of the features. In the description of the present invention, "multiple" means two or more, unless otherwise clearly and specifically defined. In addition, the terms "installed", "connected" and "connected" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection, or it can be indirectly connected through an intermediate medium, or it can be the internal connection of two components. For those of ordinary skill in the art, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0065] Example embodiments will be described more fully below with reference to the accompanying drawings, but the example embodiments may be embodied in different forms and should not be construed as limited to the embodiments set forth herein. On the contrary, the purpose of providing these embodiments is to make the present disclosure thorough and complete and to enable those skilled in the art to fully understand the scope of the present disclosure.

[0066] In the absence of conflict, the various embodiments of the present disclosure and the various features therein may be combined with each other.

[0067] As used herein, the term "and / or" includes any and all combinations of one or more of the associated listed items.

[0068] The terms used herein are only used to describe specific embodiments and are not intended to limit the present disclosure. As used herein, the singular forms "a", "an" and "the" are also intended to include the plural forms, unless the context clearly indicates otherwise. It will also be understood that when the terms "comprising" and / or "made of" are used in this specification, the presence of the features, wholes, steps, operations, elements and / or components is specified, but the presence or addition of one or more other features, wholes, steps, operations, elements, components and / or groups thereof is not excluded.

[0069] The embodiments described herein may be described with reference to plan views and / or cross-sectional views by means of idealized schematic diagrams of the present disclosure. Therefore, the example illustrations may be modified according to manufacturing techniques and / or tolerances. Therefore, the embodiments are not limited to the embodiments shown in the accompanying drawings, but include modifications of the configurations formed based on the manufacturing process. Therefore, the regions illustrated in the accompanying drawings have schematic properties, and the shapes of the regions shown in the figures illustrate the specific shapes of the regions of the elements, but are not intended to be limiting.

[0070] Unless otherwise defined, all terms (including technical and scientific terms) used herein have the same meaning as commonly understood by those of ordinary skill in the art. It will also be understood that terms such as those defined in commonly used dictionaries should be interpreted as having a meaning consistent with their meaning in the context of the relevant art and the present disclosure, and will not be interpreted as having an idealized or overly formal meaning unless explicitly defined as such herein.

[0071] See also Figure 1 , an electronic component quality detection and adjustment control system, including a component performance change detection module, a use environment information collection module, a use environment information integration module, a use scenario information collection module, a quality detection parameter adjustment module and a data association detection module, characterized in that:

[0072] The component performance change detection module is used to collect parameter information of electronic components during quality inspection, and analyze the performance changes of electronic components through the electronic component performance analysis model;

[0073] The usage scenario information acquisition module is used to receive manually input usage environment information of electronic components, and the usage scenario information includes circuit information when the electronic components are used in external circuits and circuit information when the electronic components are used in external circuits. The external circuit includes but is not limited to an external voltage stabilizing circuit, an external power supply circuit, an external control circuit, and an external power supply circuit. The internal circuit includes but is not limited to an internal voltage stabilizing circuit, an internal power supply circuit, an internal control circuit, and an internal power supply circuit;

[0074] The use environment information collection module is used to collect the use environment information of electronic components, and the environment information includes the use environment climate information of electronic components, the use environment temperature information of electronic components, and the use environment interference information of electronic components;

[0075] The usage scenario information integration module integrates the usage scenario information of the electronic components collected by the usage scenario information acquisition module and the usage environment information of the electronic components collected by the usage environment information acquisition module based on the data integration model, thereby obtaining the usage scenario information integration data of the electronic components, and uses the electronic component usage scenario information integration data as a variable of the electronic component performance change prediction model, thereby obtaining the performance change prediction results of the electronic components in the usage scenario, and compares the performance change prediction results of the electronic components in the usage scenario with the performance changes of the electronic components detected by the component performance change detection module based on the comparison model, and marks the electronic components as standard electronic components and abnormal electronic components according to the comparison results;

[0076] The data association detection module receives the performance change prediction results of the electronic components marked as standard electronic components in the usage scenario information integration module, and analyzes the data association information between the electronic component usage scenario information integration data obtained by the usage scenario information integration module and the performance change prediction results of the electronic components marked as standard electronic components through the data association detection model, wherein the data association relationship includes the association relationship between the electronic component usage scenario information integration data and the detection current and the association relationship between the electronic component usage scenario information integration data and the detection voltage;

[0077] The quality detection parameter adjustment module is used to adjust the quality detection parameters of electronic components marked as abnormal to obtain the usage scenario information of the abnormal electronic components in a stable performance state and the usage environment information of the abnormal electronic components in a stable performance state. The quality detection parameter adjustment module determines the appropriate usage scenario information integration data of the abnormal electronic components by adjusting the detection current and the detection voltage of the abnormal electronic components, and divides the appropriate usage scenario information integration data of the electronic components through a data division model to obtain the usage environment information of the abnormal electronic components and the usage scenario information of the abnormal electronic components. The abnormal electronic component usage environment information of the abnormal electronic components in a stable performance state and the usage scenario information of the abnormal electronic components in a stable performance state are selected through a data selection model. The usage environment information of the electronic components collected by the usage environment information collection module and the abnormal electronic component usage environment information of the abnormal electronic components in a stable performance state are matched through a data matching model. The data matching model is also used to match the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information of the abnormal electronic components in a stable performance state.

[0078] Through the setting of the quality inspection parameter adjustment module, not only can problematic electronic components be identified during the quality inspection process, but the process of adjusting the quality inspection parameters can also avoid the inflated inspection standards caused by the electronic components not meeting the inspection standards during direct inspection due to circuit losses in the circuit. Therefore, by making corresponding changes to the inspection standards through the quality inspection parameter adjustment module in combination with the usage scenarios of the electronic components, it is possible to avoid excess performance of electronic components caused by using excessively high inspection standards in different usage scenarios, and at the same time increase the reuse rate of defective electronic components and reduce the waste of defective electronic components.

[0079] The usage scenario information integration module includes:

[0080] A data collection module, used to collect the electronic component usage scenario information collected by the usage scenario information collection module and the electronic component usage environment information collected by the usage environment information collection module;

[0081] A data integration module, used to integrate the electronic component usage scenario information and the electronic component usage environment information in the data collection module based on the data integration model to obtain the electronic component usage scenario information integration data;

[0082] The electronic component performance change prediction module is used to obtain the performance change prediction results of the electronic components in the usage scenarios based on the electronic component performance change prediction model and the integrated data of the electronic component usage scenario information as variables;

[0083] Data comparison module: used to compare the performance change prediction results of electronic components in the usage scenario with the performance changes of electronic components detected by the component performance change detection module based on the comparison model.

[0084] Using the scene information integration module includes the following steps

[0085] A1, collecting the electronic component usage scenario information collected by the usage scenario information collection module and the electronic component usage environment information collected by the usage environment information collection module through the data collection module;

[0086] A2, based on the data integration model, the electronic component usage scenario information in step A1 is integrated with the electronic component usage environment information to obtain electronic component usage scenario information integration data;

[0087] A3, an electronic component performance change prediction model based on an electronic component performance change prediction module, and integrating data of electronic component usage scenario information as variables, thereby obtaining a prediction result of the performance change of electronic components in the usage scenario;

[0088] A4, comparing the performance change prediction result of the electronic component in the usage scenario with the performance change of the electronic component detected by the component performance change detection module based on the comparison model;

[0089] A5, marking the electronic components with the same comparison results in step A4 as standard electronic components through a data marking module, and performing subsequent production and assembly on the standard electronic components;

[0090] A6, marking the electronic components with different comparison results in step A4 as abnormal electronic components through the data marking module, and continuing to test the abnormal electronic components after adjusting the quality test parameters.

[0091] The data association detection module includes:

[0092] An information receiving module, used to receive the prediction results of performance changes of electronic components marked as standard electronic components in the usage scenario information integration module;

[0093] The data detection association module analyzes the data association information between the electronic component usage scenario information integration data obtained by the usage scenario information integration module and the electronic component performance change prediction results marked as standard electronic components through a data association detection model.

[0094] The quality inspection parameter adjustment module includes:

[0095] A quality data acquisition module, used to collect the detection current and the detection voltage of abnormal electronic components;

[0096] A data adjustment module, used for adjusting the detection current and detection voltage collected in the quality data collection module based on the data adjustment model;

[0097] A data partitioning module is used to partition the integrated data of appropriate usage scenario information of electronic components based on a data partitioning model, thereby obtaining abnormal electronic component usage environment information and abnormal electronic component usage scenario information;

[0098] A data selection module, used to select abnormal electronic component use environment information of abnormal electronic components in a stable performance state and abnormal electronic component use scenario information of abnormal electronic components in a stable performance state based on a data selection model;

[0099] The data matching module is used to match the use environment information of the electronic components collected by the use environment information collection module with the abnormal electronic component use environment information of the abnormal electronic components in a stable performance state through a data matching model.

[0100] The data matching module is also used to match the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information when the abnormal electronic components are in a stable performance state through a data matching model.

[0101] The quality inspection parameter adjustment module includes the following working steps:

[0102] B1, collecting the detection current and the detection voltage of the abnormal electronic components through the quality data acquisition module;

[0103] B2, adjusting the detection current and detection voltage in step B1 based on the data adjustment model;

[0104] B3, based on the adjustment result of step B2, obtaining appropriate usage scenario information integration data of the abnormal electronic components;

[0105] B4, dividing the integrated data of the appropriate usage scenario information of the electronic components through the data division model of the data division module, and then obtaining the abnormal electronic component usage environment information and the abnormal electronic component usage scenario information;

[0106] B5, selecting the abnormal electronic component use environment information and the abnormal electronic component use scenario information of the abnormal electronic component in a stable performance state through the data selection model of the data selection module;

[0107] B6, matching the use environment information of the electronic components collected by the use environment information collection module with the use environment information of the abnormal electronic components in a stable performance state through a data matching model;

[0108] B7, matching the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information of the abnormal electronic components in a stable performance state through a data matching model;

[0109] B8, marking the abnormal electronic components whose results in step B6 and step B7 are both matched as usable electronic components, and marking the abnormal electronic components whose results in step B6 and step B7 are both unmatched and whose results in step B6 and step B7 are only matched in one item as unusable electronic components;

[0110] B9, performing subsequent production and assembly of the electronic components marked as available electronic components in step B8 according to the matching use environment information and the matching use scenario information;

[0111] B10, repairing the electronic components marked as unusable electronic components in step B8.

[0112] The following steps are included:

[0113] S1, collecting parameter information of electronic components during quality inspection through a component performance change detection module, and analyzing performance changes of electronic components through an electronic component performance analysis model;

[0114] S2, receiving the electronic component usage environment information manually input by using the scene information acquisition module;

[0115] S3, collecting usage environment information of electronic components by using an environment information collection module;

[0116] S4, integrating the electronic component usage scenario information collected in step S2 with the electronic component usage environment information collected in step S3 by using a usage scenario information integration model of the usage scenario information integration module, thereby obtaining electronic component usage scenario information integration data;

[0117] S5, using the integrated data of the electronic component usage scenario information in step S4 as a variable of the electronic component performance change prediction model to obtain a performance change prediction result of the electronic component in the usage scenario;

[0118] S6, comparing the predicted results of the performance changes of the electronic components in the usage scenarios in step S5 with the performance changes of the electronic components detected in step S1, and marking the electronic components with the same comparison results as standard electronic components, and marking the electronic components with the same comparison results as standard electronic components and abnormal electronic components;

[0119] S7, detecting, by a data association detection module, an association relationship between the standard electronic component usage scenario information integrated data and the detection current, and an association relationship between the standard electronic component usage scenario information integrated data and the detection voltage;

[0120] S8, by the quality detection parameter adjustment module based on the data association detection result in step S7, the use scenario information of the electronic components marked as abnormal electronic components in step S6 in a stable performance state and the use environment information of the abnormal electronic components in a stable performance state;

[0121] S9, based on the use environment information of the abnormal electronic components in step S8, matching the use environment information of the electronic components collected in step S2 through a data matching model;

[0122] S10, matching based on the usage scenario information of the abnormal electronic components in step S8 and the usage scenario information of the electronic components collected in step S3 through the data matching model;

[0123] S11, marking the abnormal electronic components whose results in step S9 and step S10 are both matched as usable electronic components, and marking the abnormal electronic components whose results in step S9 and step S10 are both unmatched and whose results in step S9 and step S10 are only matched in one item as unusable electronic components;

[0124] S12, performing subsequent production and assembly of the electronic components marked as available electronic components in step S11 according to the matching use environment information and the matching use scenario information;

[0125] S13, repairing the electronic components marked as unusable electronic components in step S11.

[0126] The above description is only by way of illustration of certain exemplary embodiments of the present invention. It is undoubted that those skilled in the art can modify the described embodiments in various ways without departing from the spirit and scope of the present invention. Therefore, the above drawings and descriptions are illustrative in nature and should not be construed as limiting the scope of protection of the claims of the present invention.

Claims

1. An electronic component quality inspection and control system, comprising a component performance change detection module, a usage environment information collection module, a usage environment information integration module, a usage scenario information collection module, a quality inspection parameter adjustment module and a data association detection module, characterized in that: The component performance change detection module is used to collect parameter information of electronic components during quality inspection, and analyze the performance changes of electronic components through the electronic component performance analysis model; The usage scenario information acquisition module is used to receive manually input usage environment information of electronic components, the usage scenario information includes circuit information when the electronic components are used in external circuits and circuit information when the electronic components are used in external circuits, the external circuits include but are not limited to external voltage stabilization circuits, external power supply circuits, external control circuits and external power supply circuits, the internal circuits include but are not limited to internal voltage stabilization circuits, internal power supply circuits, internal control circuits and internal power supply circuits; The use environment information collection module is used to collect the use environment information of the electronic components, and the environment information includes the use environment climate information of the electronic components, the use environment temperature information of the electronic components, and the use environment interference information of the electronic components; The usage scenario information integration module integrates the usage scenario information of the electronic components collected by the usage scenario information acquisition module and the usage environment information of the electronic components collected by the usage environment information acquisition module based on the data integration model, thereby obtaining the electronic component usage scenario information integration data, and uses the electronic component usage scenario information integration data as a variable of the electronic component performance change prediction model, thereby obtaining the performance change prediction results of the electronic components in the usage scenarios, and compares the performance change prediction results of the electronic components in the usage scenarios with the performance changes of the electronic components detected by the component performance change detection module based on the comparison model, and marks the electronic components as standard electronic components and abnormal electronic components according to the comparison results; The data association detection module receives the performance change prediction results of the electronic components marked as standard electronic components in the usage scenario information integration module, and analyzes the data association information between the electronic component usage scenario information integration data obtained by the usage scenario information integration module and the performance change prediction results of the electronic components marked as standard electronic components through the data association detection model, wherein the data association relationship includes the association relationship between the electronic component usage scenario information integration data and the detection current and the association relationship between the electronic component usage scenario information integration data and the detection voltage; The quality detection parameter adjustment module is used to adjust the quality detection parameters of the electronic components marked as abnormal, thereby obtaining the usage scenario information of the abnormal electronic components in a stable performance state and the usage environment information of the abnormal electronic components in a stable performance state. The quality detection parameter adjustment module determines the appropriate usage scenario information integration data of the abnormal electronic components by adjusting the detection current of the abnormal electronic components and the detection voltage of the abnormal electronic components, and divides the appropriate usage scenario information integration data of the electronic components through a data division model to obtain the usage environment information of the abnormal electronic components and the usage scenario information of the abnormal electronic components, selects the abnormal electronic component usage environment information of the abnormal electronic components in a stable performance state and the usage scenario information of the abnormal electronic components in a stable performance state through a data selection model, matches the usage environment information of the electronic components collected by the usage environment information collection module with the abnormal electronic component usage environment information of the abnormal electronic components in a stable performance state through a data matching model, and the data matching model is also used to match the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information of the abnormal electronic components in a stable performance state.

2. The electronic component quality detection and adjustment control system according to claim 1, characterized in that: The usage scenario information integration module includes: A data collection module, used to collect the electronic component usage scenario information collected by the usage scenario information collection module and the electronic component usage environment information collected by the usage environment information collection module; A data integration module, used to integrate the electronic component usage scenario information and the electronic component usage environment information in the data collection module based on the data integration model to obtain the electronic component usage scenario information integration data; An electronic component performance change prediction module is used to obtain a performance change prediction result of the electronic component in the usage scenario based on the electronic component performance change prediction model and integrating the electronic component usage scenario information data as a variable; Data comparison module: used to compare the performance change prediction results of electronic components in the usage scenario with the performance changes of electronic components detected by the component performance change detection module based on the comparison model.

3. The electronic component quality detection and adjustment control system according to claim 2, characterized in that: The usage scenario information integration module includes the following working steps: A1, collecting the electronic component usage scenario information collected by the usage scenario information collection module and the electronic component usage environment information collected by the usage environment information collection module through the data collection module; A2, based on the data integration model, the electronic component usage scenario information in step A1 is integrated with the electronic component usage environment information to obtain electronic component usage scenario information integration data; A3, an electronic component performance change prediction model based on the electronic component performance change prediction module, and using the electronic component usage scenario information integration data as a variable, thereby obtaining a performance change prediction result of the electronic component in the usage scenario; A4, comparing the performance change prediction result of the electronic component in the usage scenario with the performance change of the electronic component detected by the component performance change detection module based on the comparison model; A5, marking the electronic components with the same comparison results in step A4 as standard electronic components through a data marking module, and performing subsequent production and assembly on the standard electronic components; A6, marking the electronic components with different comparison results in step A4 as abnormal electronic components through the data marking module, and continuing to test the abnormal electronic components after adjusting the quality test parameters.

4. The electronic component quality detection and adjustment control system according to claim 3 is characterized in that: The data association detection module comprises: An information receiving module, used to receive the prediction results of performance changes of electronic components marked as standard electronic components in the usage scenario information integration module; The data detection association module analyzes the data association information between the electronic component usage scenario information integration data obtained by the usage scenario information integration module and the electronic component performance change prediction results marked as standard electronic components through a data association detection model.

5. The electronic component quality detection and adjustment control system according to claim 4, characterized in that: The quality detection parameter adjustment module includes: A quality data acquisition module, used for acquiring the detection current of abnormal electronic components and the detection voltage of the abnormal electronic components; A data adjustment module, used for adjusting the detection current and detection voltage collected in the quality data collection module based on the data adjustment model; A data partitioning module is used to partition the integrated data of appropriate usage scenario information of electronic components based on a data partitioning model, thereby obtaining abnormal electronic component usage environment information and abnormal electronic component usage scenario information; A data selection module, used to select abnormal electronic component use environment information of abnormal electronic components in a stable performance state and abnormal electronic component use scenario information of abnormal electronic components in a stable performance state based on a data selection model; The data matching module is used to match the use environment information of the electronic components collected by the use environment information collection module with the abnormal electronic component use environment information of the abnormal electronic components in a stable performance state through a data matching model. The data matching module is also used to match the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information when the abnormal electronic components are in a stable performance state through a data matching model.

6. The electronic component quality detection and adjustment control system according to claim 5, characterized in that: The quality detection parameter adjustment module includes the following working steps: B1, collecting the detection current and the detection voltage of the abnormal electronic components through the quality data collection module; B2, adjusting the detection current and detection voltage in step B1 based on the data adjustment model; B3, based on the adjustment result of step B2, obtaining appropriate usage scenario information integration data of the abnormal electronic components; B4, dividing the integrated data of the appropriate usage scenario information of the electronic components through the data division model of the data division module, and then obtaining the abnormal electronic component usage environment information and the abnormal electronic component usage scenario information; B5, selecting the abnormal electronic component use environment information and the abnormal electronic component use scenario information of the abnormal electronic component in a stable performance state through the data selection model of the data selection module; B6, matching the use environment information of the electronic components collected by the use environment information collection module with the use environment information of the abnormal electronic components in a stable performance state through a data matching model; B7, matching the usage scenario information of the electronic components collected by the usage scenario information collection module with the abnormal electronic component usage scenario information of the abnormal electronic components in a stable performance state through a data matching model; B8, marking the abnormal electronic components whose results in step B6 and step B7 are both matched as usable electronic components, and marking the abnormal electronic components whose results in step B6 and step B7 are both unmatched and whose results in step B6 and step B7 are only matched in one item as unusable electronic components; B9, performing subsequent production and assembly of the electronic components marked as available electronic components in step B8 according to the matched usage environment information and the matched usage scenario information; B10, repairing the electronic components marked as unusable electronic components in step B8.

7. The electronic component quality detection and adjustment control system according to claim 6, characterized in that: The following steps are included: S1, collecting parameter information of electronic components during quality inspection through a component performance change detection module, and analyzing performance changes of electronic components through an electronic component performance analysis model; S2, receiving the electronic component usage environment information manually input by using the scene information acquisition module; S3, collecting usage environment information of electronic components by using an environment information collection module; S4, integrating the electronic component usage scenario information collected in step S2 with the electronic component usage environment information collected in step S3 by using a usage scenario information integration model of the usage scenario information integration module, thereby obtaining electronic component usage scenario information integration data; S5, using the integrated data of the electronic component usage scenario information in step S4 as a variable of the electronic component performance change prediction model to obtain a performance change prediction result of the electronic component in the usage scenario; S6, comparing the predicted results of the performance changes of the electronic components in the usage scenarios in step S5 with the performance changes of the electronic components detected in step S1, and marking the electronic components with the same comparison results as standard electronic components, and marking the electronic components with the same comparison results as standard electronic components and abnormal electronic components; S7, detecting, by a data association detection module, an association relationship between the standard electronic component usage scenario information integrated data and the detection current, and an association relationship between the standard electronic component usage scenario information integrated data and the detection voltage; S8, by the quality detection parameter adjustment module based on the data association detection result in step S7, the use scenario information of the electronic components marked as abnormal electronic components in step S6 in a stable performance state and the use environment information of the abnormal electronic components in a stable performance state; S9, based on the use environment information of the abnormal electronic components in step S8, matching the use environment information of the electronic components collected in step S2 through a data matching model; S10, matching based on the usage scenario information of the abnormal electronic components in step S8 and the usage scenario information of the electronic components collected in step S3 through the data matching model; S11, marking the abnormal electronic components whose results in step S9 and step S10 are both matched as usable electronic components, and marking the abnormal electronic components whose results in step S9 and step S10 are both unmatched and whose results in step S9 and step S10 are only matched in one item as unusable electronic components; S12, performing subsequent production and assembly of the electronic components marked as available electronic components in step S11 according to the matching use environment information and the matching use scenario information; S13, repairing the electronic components marked as unusable electronic components in step S11.

Images