Three-phase switch test arrangement method

Abstract

The invention discloses a three-phase switch test arrangement method, and the method comprises the steps: receiving a test request which records all target test items for testing a to-be-tested three-phase switch; arranging the sequence of the target test items to obtain a test item sequence according to the test demand on-off state corresponding to each target test item in the test request; according to the invention, an initial switch state of a to-be-tested three-phase switch is taken as a first priority of test arrangement, the same type of switch test modules required by a target test item is taken as a second priority, and the similarity of conduction switch units of the target test item is taken as a third priority to carry out test arrangement; the frequency of wiring switching of the switch test module and the corresponding test module can be reduced, and the existing three-phase switch test efficiency is greatly improved.

Description

Technical Field

[0001] The invention relates to the technical field of electrical component testing, and in particular to a method for arranging a three-phase switch test. Background Art

[0002] Three-phase switches (such as AIS switches and GIS switches) are core components in the power grid field. They need to be tested and maintained regularly to ensure their normal operation. There are many test items for three-phase switches. When performing multiple test items, multiple test instruments are required. The traditional method is to test according to the test item sequence preset by the user. However, the test item sequence preset by the user may involve the switching process of different switch test modules and the corresponding test module wiring. The entire test process is inefficient and time-consuming. Summary of the invention

[0003] In view of the above problems, the present invention is proposed to provide a method for scheduling a three-phase switch test that overcomes the above problems or at least partially solves the above problems.

[0004] In order to solve the above technical problems, the embodiments of the present application disclose the following technical solutions:

[0005] In a first aspect, an embodiment of the present invention discloses a method for scheduling a three-phase switch test, characterized in that it includes:

[0006] receiving a test request, wherein the test request records all target test items to be tested on the three-phase switch to be tested;

[0007] Arranging the order of the target test items to obtain a test item sequence according to the test requirement switch states respectively corresponding to the target test items in the test request;

[0008] The test requirement switch state of each target test item is one of an open state, a closed state, switching from a closed state to an open state, switching from an open state to a closed state, switching from an open state to a closed state and then switching to an open state;

[0009] In the test item sequence, all the target test items whose test requirements require the switch state to be an open state are arranged continuously in sequence, and all the target test items whose test requirements require the switch state to be a closed state are arranged continuously in sequence.

[0010] Furthermore, the target test item is tested by at least two switch test modules independent of each other, specifically including an insulation resistance test module, a loop resistance test module and a switch mechanical characteristic test module.

[0011] Further, according to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is an open state, the specific method includes:

[0012] Step S101, determining whether there is a target test item in the test request that the switch state is an open state; if the determination result of step S101 is yes, executing step S102; if the determination result of step S101 is no, executing step S103;

[0013] Step S102, placing all the target test items whose test requirement switch state is the open state in the test item sequence in sequence to update the test item sequence; after step S102 is completed, executing step S103;

[0014] Step S103, determining whether there is a target test item in the test request that requires the switch state to be switched from an open state to a closed state;

[0015] If the judgment result of step S103 is yes, then execute step S104; if the judgment result of step S103 is no, then execute step S105;

[0016] Step S104, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S104 is completed, executing step S105;

[0017] Step S105, determining whether there is a target test item in the test request that the switch state is a closed state;

[0018] If the judgment result of step S105 is yes, then execute step S106; if the judgment result of step S105 is no, then execute step S107;

[0019] Step S106: placing all the target test items whose test requirement switch state is the open state in sequence at the end of the test item sequence to update the test item sequence.

[0020] Further, according to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is an open state, the specific method further includes: if the judgment result of step S107 is yes, executing step S108; if the judgment result of step S107 is no, executing step S113;

[0021] Step S108, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108 is completed, executing step S109;

[0022] Step S109, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state;

[0023] If the judgment result of step S109 is yes, then execute step S110; if the judgment result of step S109 is no, then execute step S111;

[0024] Step S110, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S110 is completed, executing step S107 again;

[0025] Step S111, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state;

[0026] If the judgment result of step S111 is yes, then execute step S112; if the judgment result of step S111 is no, then execute step S115;

[0027] Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; after step S112, executing step S115;

[0028] Step S113, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state;

[0029] If the judgment result of step S113 is yes, then execute step S114; if the judgment result of step S113 is no, then execute step S115;

[0030] Step S114, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence;

[0031] Step S115, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state;

[0032] If the judgment result of step S115 is yes, then execute step S116; if the judgment result of step S115 is no, then execute step S117;

[0033] Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116 is completed, executing step S117;

[0034] Step S117: output the final test item sequence.

[0035] Further, according to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is a closed state, the specific method includes:

[0036] Step S201, determining whether there is a target test item in the test request that the switch state is a closed state;

[0037] If the judgment result of step S201 is yes, then execute step S202; if the judgment result of step S201 is no, then execute step S203;

[0038] Step S202, placing all the target test items whose test requirement switch state is the closed state in the test item sequence in sequence, so as to update the test item sequence; after step S202 is completed, executing step S203;

[0039] Step S203, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state;

[0040] If the judgment result of step S203 is yes, then execute step S204; if the judgment result of step S203 is no, then execute step S205;

[0041] Step S204, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205;

[0042] Step S205, determining whether there is a target test item in the test request whose test requirement switch state is an open state;

[0043] If the judgment result of step S205 is yes, then execute step S206; if the judgment result of step S205 is no, then execute step S207;

[0044] Step S206, placing all the target test items whose test requirement switch state is the closed state in sequence at the end of the test item sequence to update the test item sequence; after step S206 is completed, executing step S207;

[0045] Step S207: determine whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state.

[0046] Further, according to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is a closed state, the specific method further includes:

[0047] If the judgment result of step S207 is yes, then execute step S208; if the judgment result of step S207 is no, then execute step S213;

[0048] Step S208, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S208 is completed, executing step S209;

[0049] Step S209, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the closed state to the open state;

[0050] If the judgment result of step S209 is yes, then execute step S210; if the judgment result of step S209 is no, then execute step S211;

[0051] Step S210, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, executing step S207 again;

[0052] Step S211, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state;

[0053] If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215;

[0054] Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; after step S212, executing step S215;

[0055] Step S213, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state;

[0056] If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215;

[0057] Step S214, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence;

[0058] Step S215, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state;

[0059] If the judgment result of step S215 is yes, then execute step S216; if the judgment result of step S215 is no, then execute step S217;

[0060] Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S216 is completed, executing step S217;

[0061] Step S217: output the final test item sequence.

[0062] Furthermore, after the arrangement of the test with the initial switch state of the three-phase switch to be tested as the first priority is completed, the test is arranged with the same type of switch test module required by the target test item as the second priority. First, it is determined whether the test requirement switch states of the target test items are the same. When the test requirement switch states of the target test items are the same, it is further determined whether the switch test modules of the target test items are the same. If they are the same, the target test items are arranged with priority.

[0063] Further, after the arrangement of the test arrangement with the initial switch state of the three-phase switch to be tested as the second priority is completed, the test is arranged with the similarity of the conductive switch unit of the target test item as the third priority, and the specific method includes:

[0064] Step Sa1, randomly selecting one of the target test items whose test requirement switch state is an open state, and placing it at the end of the test item sequence to update the test item sequence;

[0065] Step Sa2, determining whether the test request contains the target test item that is not included in the test item sequence and whose test requirement switch state is an open state;

[0066] If the judgment result of step Sa2 is yes, then step Sa3 is executed; if the judgment result of step Sa2 is no, then the process ends;

[0067] Step Sa3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the open state as the first test item to be scheduled, and calculating the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence;

[0068] Step Sa4, placing the first test item to be arranged that has the greatest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again.

[0069] Further, after the arrangement of the test arrangement with the initial switch state of the three-phase switch to be tested as the second priority is completed, the test is arranged with the similarity of the conductive switch unit of the target test item as the third priority, and the specific method also includes:

[0070] Step Sb1, randomly selecting one of the target test items whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence;

[0071] Step Sb2, determining whether the test request includes the target test item that is not included in the test item sequence and whose test requirement switch state is the closed state;

[0072] If the judgment result of step Sb2 is yes, then step Sb3 is executed; if the judgment result of step Sb2 is no, then the process ends;

[0073] Step Sb3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the closed state as the second test item to be scheduled, and calculating the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence;

[0074] Step Sb4, placing the second test item to be arranged which has the largest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4, executing step Sb2 again.

[0075] In a second aspect, an embodiment of the present invention discloses an electronic device, including:

[0076] one or more processors;

[0077] A memory for storing one or more programs;

[0078] When the one or more programs are executed by the one or more processors, the one or more processors implement the test scheduling method.

[0079] The beneficial effects of the above technical solution provided by the embodiment of the present invention include at least:

[0080] The present invention discloses a method for scheduling a three-phase switch test, comprising: receiving a test request, wherein the test request records all target test items that need to be tested on the three-phase switch to be tested; arranging the order of the target test items to obtain a test item sequence according to the test requirement switch states respectively corresponding to the target test items in the test request; the present invention arranges the test with the initial switch state of the three-phase switch to be tested as the first priority, the same type of switch test modules required by the target test items as the second priority, and the similarity of the on-switch units of the target test items as the third priority, which can reduce the number of wiring switching of the switch test module and the corresponding test module, and greatly improve the existing three-phase switch test efficiency.

[0081] The technical solution of the present invention is further described in detail below through the accompanying drawings and embodiments. BRIEF DESCRIPTION OF THE DRAWINGS

[0082] The accompanying drawings are used to provide a further understanding of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings:

[0083] Figure 1 This is a flow chart of a method for arranging a three-phase switch test in Embodiment 1 of the present invention;

[0084] Figure 2 This is a schematic diagram of the correspondence between each test item and the switch state of the test requirement, the switch test module, and the set of the conduction switch units in Embodiment 1 of the present invention;

[0085] Figure 3 This is a schematic diagram of the structure of an electronic device in Embodiment 1 of the present invention. DETAILED DESCRIPTION

[0086] The exemplary embodiments of the present disclosure will be described in more detail below with reference to the accompanying drawings. Although the exemplary embodiments of the present disclosure are shown in the accompanying drawings, it should be understood that the present disclosure can be implemented in various forms and should not be limited by the embodiments set forth herein. On the contrary, these embodiments are provided to enable a more thorough understanding of the present disclosure and to fully convey the scope of the present disclosure to those skilled in the art.

[0087] In order to solve the problems existing in the prior art, an embodiment of the present invention provides a method for scheduling a three-phase switch test.

[0088] Example 1

[0089] The present invention discloses a method for arranging a three-phase switch test. Figure 1 ,include:

[0090] receiving a test request, wherein the test request records all target test items to be tested on the three-phase switch to be tested;

[0091] Arranging the order of the target test items to obtain a test item sequence according to the test requirement switch states respectively corresponding to the target test items in the test request;

[0092] The test requirement switch state of each target test item is one of an open state, a closed state, switching from a closed state to an open state, switching from an open state to a closed state, switching from an open state to a closed state and then switching to an open state;

[0093] In the test item sequence, all the target test items whose test requirements require the switch state to be an open state are arranged continuously in sequence, and all the target test items whose test requirements require the switch state to be a closed state are arranged continuously in sequence.

[0094] In this embodiment, the target test items are tested by at least two independent switch test modules, and the switch test modules can select some existing switch test modules, such as an insulation resistance test module, a loop resistance test module, and a switch mechanical characteristic test module.

[0095] Among them, the insulation resistance test module is used to perform at least one of the opening coil insulation resistance test, closing coil insulation resistance test, auxiliary branch coil insulation resistance test, switch break insulation test, switch body insulation test and phase-to-phase insulation test.

[0096] The loop resistance test module is used to perform at least one of an A-phase loop test, a B-phase loop test, and a C-phase loop test.

[0097] The switch mechanical characteristic test module is used to perform at least one of the following tests: switch opening and closing state judgment test, switch opening operation test, switch closing operation test, auxiliary switch operation test, energy storage test, switch opening mechanical characteristic test, switch closing mechanical characteristic test, switch closing mechanical characteristic test, auxiliary switch mechanical characteristic test, switch opening action voltage test, switch closing action voltage test, auxiliary switch action voltage test, switch opening non-tripping test, switch closing non-tripping test, auxiliary switch non-tripping test, switch opening coil DC resistance test, switch closing coil DC resistance test, auxiliary switch coil DC resistance test. In the present disclosure, the selected switch test module can be pre-selected according to the actual test needs. The switch test module itself is not the inventive point of the present disclosure and is not described in detail here.

[0098] In this embodiment, according to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is an open state, the specific method includes:

[0099] Step S101, determining whether there is a target test item in the test request that the switch state is an open state; if the determination result of step S101 is yes, executing step S102; if the determination result of step S101 is no, executing step S103;

[0100] Step S102, placing all the target test items whose test requirement switch state is the open state in the test item sequence in sequence to update the test item sequence; after step S102 is completed, executing step S103;

[0101] Step S103, determining whether there is a target test item in the test request that requires the switch state to be switched from an open state to a closed state;

[0102] If the judgment result of step S103 is yes, then execute step S104; if the judgment result of step S103 is no, then execute step S105;

[0103] Step S104, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S104 is completed, executing step S105;

[0104] Step S105, determining whether there is a target test item in the test request that the switch state is a closed state;

[0105] If the judgment result of step S105 is yes, then execute step S106; if the judgment result of step S105 is no, then execute step S107;

[0106] Step S106: Place all the target test items whose test requirement switch state is the open state at the end of the test item sequence in sequence to update the test item sequence. If the judgment result of step S107 is yes, execute step S108; if the judgment result of step S107 is no, execute step S113;

[0107] Step S108, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108 is completed, executing step S109;

[0108] Step S109, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state;

[0109] If the judgment result of step S109 is yes, then execute step S110; if the judgment result of step S109 is no, then execute step S111;

[0110] Step S110, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S110 is completed, executing step S107 again;

[0111] Step S111, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state;

[0112] If the judgment result of step S111 is yes, then execute step S112; if the judgment result of step S111 is no, then execute step S115;

[0113] Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; after step S112, executing step S115;

[0114] Step S113, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state;

[0115] If the judgment result of step S113 is yes, then execute step S114; if the judgment result of step S113 is no, then execute step S115;

[0116] Step S114, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence;

[0117] Step S115, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state;

[0118] If the judgment result of step S115 is yes, then execute step S116; if the judgment result of step S115 is no, then execute step S117;

[0119] Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116 is completed, executing step S117;

[0120] Step S117: output the final test item sequence.

[0121] It can be understood that through steps S101 to S117, the number of switching times of the switch state of the three-phase switch to be tested in the entire test process can be reduced as much as possible, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0122] In some preferred embodiments, the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is a closed state, the specific method includes:

[0123] Step S201, determining whether there is a target test item in the test request that the switch state is a closed state;

[0124] If the judgment result of step S201 is yes, then execute step S202; if the judgment result of step S201 is no, then execute step S203;

[0125] Step S202, placing all the target test items whose test requirement switch state is the closed state in the test item sequence in sequence, so as to update the test item sequence; after step S202 is completed, executing step S203;

[0126] Step S203, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state;

[0127] If the judgment result of step S203 is yes, then execute step S204; if the judgment result of step S203 is no, then execute step S205;

[0128] Step S204, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205;

[0129] Step S205, determining whether there is a target test item in the test request whose test requirement switch state is an open state;

[0130] If the judgment result of step S205 is yes, then execute step S206; if the judgment result of step S205 is no, then execute step S207;

[0131] Step S206, placing all the target test items whose test requirement switch state is the closed state in sequence at the end of the test item sequence to update the test item sequence; after step S206 is completed, executing step S207;

[0132] Step S207, determine whether there is a target test item in the test request that the switch state is switched from the open state to the closed state. If the judgment result of step S207 is yes, execute step S208; if the judgment result of step S207 is no, execute step S213;

[0133] Step S208, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S208 is completed, executing step S209;

[0134] Step S209, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the closed state to the open state;

[0135] If the judgment result of step S209 is yes, then execute step S210; if the judgment result of step S209 is no, then execute step S211;

[0136] Step S210, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, executing step S207 again;

[0137] Step S211, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state;

[0138] If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215;

[0139] Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; after step S212, executing step S215;

[0140] Step S213, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state;

[0141] If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215;

[0142] Step S214, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence;

[0143] Step S215, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state;

[0144] If the judgment result of step S215 is yes, then execute step S216; if the judgment result of step S215 is no, then execute step S217;

[0145] Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S216 is completed, executing step S217;

[0146] Step S217: output the final test item sequence.

[0147] It can be understood that through the above steps S101 to S117, the number of switching times of the switch state of the three-phase switch to be tested in the entire test process can be reduced as much as possible, which is beneficial to reducing the risk of damage to the three-phase switch to be tested due to frequent switching, and is beneficial to shortening the processing time of the entire test process.

[0148] For example, Figure 2As shown, when the test request records all target test items that need to be tested on the three-phase switch to be tested, the test sequence recorded in the test request specifically includes: A-phase loop test, opening operation test, closing operation test, C-phase loop resistance, closing non-tripping test, opening non-tripping test, opening coil insulation resistance test, closing coil insulation resistance test, B-phase loop test. The initial switch state of the three-phase switch to be tested is open. After the arrangement with the initial switch state of the three-phase switch to be tested as the first priority of the test arrangement is completed, the test arrangement sequence is: closing non-tripping test, closing coil insulation resistance test, closing operation test, C-phase loop resistance test, A-phase loop resistance test, opening non-tripping test, B-phase loop resistance test, opening coil insulation resistance and opening operation test.

[0149] After the arrangement of the test with the initial switch state of the three-phase switch to be tested as the first priority is completed, the test is arranged with the same type of switch test module required by the target test item as the second priority. The specific method includes: first, determining whether the test required switch states of the target test items are the same; when the test required switch states of the target test items are the same, continuing to determine whether the switch test modules of the target test items are the same; if they are the same, the target test items are arranged with priority.

[0150] For example, Figure 2 As shown, after the arrangement of the test arrangement with the initial switch state of the three-phase switch to be tested as the first priority is completed, the test arrangement order is: closing non-tripping test, closing coil insulation resistance test, closing operation test, A-phase loop resistance test, opening non-tripping test, B-phase loop resistance test, opening coil insulation resistance and opening operation test. The test arrangement is arranged with the same type of switch test modules required by the target test items as the second priority as disclosed in this example, and the test arrangement order is: closing non-tripping test, closing coil insulation resistance test, closing operation test, opening non-tripping test, C-phase loop resistance, A-phase loop resistance test, B-phase loop resistance test, opening coil insulation resistance and opening operation test.

[0151] In this embodiment, after the arrangement of the second priority of the test arrangement with the initial switch state of the three-phase switch to be tested is completed, the test is arranged with the similarity of the conductive switch unit of the target test item as the third priority, and the specific method includes:

[0152] Step Sa1, randomly selecting one of the target test items whose test requirement switch state is an open state, and placing it at the end of the test item sequence to update the test item sequence;

[0153] Step Sa2, determining whether the test request contains the target test item that is not included in the test item sequence and whose test requirement switch state is an open state;

[0154] If the judgment result of step Sa2 is yes, then step Sa3 is executed; if the judgment result of step Sa2 is no, then the process ends;

[0155] Step Sa3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the open state as the first test item to be scheduled, and calculating the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence;

[0156] Step Sa4, placing the first test item to be arranged that has the greatest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again.

[0157] In some preferred embodiments, the tests are arranged with the similarity of the conductive switch units of the target test items as the third priority, and the specific method further includes:

[0158] Step Sb1, randomly selecting one of the target test items whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence;

[0159] Step Sb2, determining whether the test request includes the target test item that is not included in the test item sequence and whose test requirement switch state is the closed state;

[0160] If the judgment result of step Sb2 is yes, then step Sb3 is executed; if the judgment result of step Sb2 is no, then the process ends;

[0161] Step Sb3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the closed state as the second test item to be scheduled, and calculating the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence;

[0162] Step Sb4, placing the second test item to be arranged which has the largest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4, executing step Sb2 again.

[0163] Optionally, the set similarity can be obtained by using the Jaccard similarity algorithm. Of course, other existing similarity algorithms can also be used in the present disclosure to calculate the similarity between two sets.

[0164] In the present disclosure, the greater the set similarity of the conductive switch unit sets configured for the two test items, the more similar the switch units required to be conductive when the two test items are performed are, and the fewer the number of switch units that need to adjust the switch state when the previous test item of the two test items ends and the next test item begins. Based on this, the test items with larger corresponding set similarity can be set adjacent to each other, so that the switch unit can be effectively prevented from frequently switching between the conductive state and the cut-off state, which is conducive to extending the service life of the switch unit.

[0165] For example, the tests are arranged with the same type of switch test modules required by the target test items as the second priority, and the test arrangement order is: closing non-tripping test, closing coil insulation resistance test, closing operation test, opening non-tripping test, C-phase loop resistance, A-phase loop resistance test, B-phase loop resistance test, opening coil insulation resistance and opening operation test. After the arrangement is completed with the initial switch state of the three-phase switch to be tested as the second priority of the test arrangement, the test order is: closing non-tripping test, closing coil insulation resistance test, closing operation test, opening non-tripping test, A-phase loop resistance test, B-phase loop resistance test, C-phase loop resistance, opening coil insulation resistance and opening operation test.

[0166] A method for scheduling a three-phase switch test disclosed in the present embodiment includes: receiving a test request, wherein the test request records all target test items that need to be tested on the three-phase switch to be tested; arranging the order of the target test items to obtain a test item sequence according to the test requirement switch states corresponding to each of the target test items in the test request; the present invention arranges the test with the initial switch state of the three-phase switch to be tested as the first priority, the same type of switch test modules required by the target test items as the second priority, and the similarity of the on-switch units of the target test items as the third priority, which can reduce the number of wiring switching of the switch test module and the corresponding test module, and greatly improve the existing three-phase switch test efficiency.

[0167] Example 2

[0168] Based on the same inventive concept, an embodiment of the present disclosure also provides an electronic device. Figure 3 FIG. 1 is a schematic diagram of the structure of an electronic device according to an embodiment of the present disclosure. Figure 3 As shown, an embodiment of the present disclosure provides an electronic device including: one or more processors 101, a memory 102, and one or more I / O interfaces 103. The memory 102 stores one or more programs, and when the one or more programs are executed by the one or more processors, the one or more processors implement any optimization method in the above embodiments; the one or more I / O interfaces 103 are connected between the processor and the memory, and are configured to implement information interaction between the processor and the memory.

[0169] Among them, the processor 101 is a device with data processing capabilities, including but not limited to a central processing unit (CPU), etc.; the memory 102 is a device with data storage capabilities, including but not limited to random access memory (RAM, more specifically SDRAM, DDR, etc.), read-only memory (ROM), electrically erasable programmable read-only memory (EEPROM), flash memory (FLASH); the I / O interface (read-write interface) 103 is connected between the processor 101 and the memory 102, and can realize information interaction between the processor 101 and the memory 102, including but not limited to a data bus (Bus), etc.

[0170] In some embodiments, the processor 101 , the memory 102 , and the I / O interface 103 are connected to each other via a bus 104 , and further connected to other components of the computing device.

[0171] In some embodiments, the one or more processors 101 include a field programmable gate array.

[0172] According to an embodiment of the present disclosure, a computer-readable medium is further provided, wherein a computer program is stored on the computer-readable medium, wherein when the program is executed by a processor, the steps in any optimization method in the above-mentioned embodiment are implemented.

[0173] It should be understood that the specific order or hierarchy of steps in the disclosed process is an example of an exemplary method. Based on design preferences, it should be understood that the specific order or hierarchy of steps in the process can be rearranged without departing from the scope of protection of the present disclosure. The attached method claims present the elements of the various steps in an exemplary order and are not intended to be limited to the specific order or hierarchy described.

[0174] In the above detailed description, various features are grouped together in a single embodiment to simplify the disclosure. This method of disclosure should not be interpreted as reflecting an intention that the embodiments of the claimed subject matter require more features than are clearly stated in each claim. On the contrary, as reflected in the appended claims, the invention is in a state of having less than all the features of the disclosed individual embodiments. Therefore, the appended claims are hereby expressly incorporated into the detailed description, with each claim standing on its own as a separate preferred embodiment of the invention.

[0175] Those skilled in the art will also appreciate that the various illustrative logic blocks, modules, circuits, and algorithmic steps described in conjunction with the embodiments herein can all be implemented as electronic hardware, computer software, or a combination thereof. In order to clearly illustrate the interchangeability between hardware and software, various illustrative components, blocks, modules, circuits, and steps are generally described above around their functions. Whether such functions are implemented as hardware or software depends on specific applications and the design constraints imposed on the entire system. A skilled person can implement the described functions in an alternative manner for each specific application, but such implementation decisions should not be interpreted as departing from the scope of protection of the present disclosure.

[0176] The steps of the method or algorithm described in conjunction with the embodiments herein may be directly embodied as hardware, a software module executed by a processor, or a combination thereof. The software module may be located in a RAM memory, a flash memory, a ROM memory, an EPROM memory, an EEPROM memory, a register, a hard disk, a mobile disk, a CD-ROM, or any other form of storage medium well known in the art. An exemplary storage medium is connected to the processor so that the processor can read information from the storage medium and can write information to the storage medium. Of course, the storage medium may also be an integral part of the processor. The processor and the storage medium may be located in an ASIC. The ASIC may be located in a user terminal. Of course, the processor and the storage medium may also be present in a user terminal as discrete components.

[0177] For software implementation, the techniques described in this application can be implemented with modules (e.g., procedures, functions, etc.) that perform the functions described in this application. These software codes can be stored in a memory unit and executed by a processor. The memory unit can be implemented within the processor or outside the processor. In the latter case, it is coupled to the processor in a communication manner via various means, which are well known in the art.

[0178] The above description includes examples of one or more embodiments. Of course, it is impossible to describe all possible combinations of components or methods for the purpose of describing the above embodiments, but it should be recognized by those skilled in the art that the various embodiments may be further combined and arranged. Therefore, the embodiments described herein are intended to cover all such changes, modifications and variations that fall within the scope of protection of the appended claims. In addition, with respect to the term "comprising" used in the specification or claims, the word is covered in a manner similar to the term "including", just as "including," is explained as a transitional word in the claims. In addition, any term "or" used in the specification of the claims is intended to mean "non-exclusive or".

Claims

1. A method for scheduling a three-phase switch test, characterized in that: include: receiving a test request, wherein the test request records all target test items to be tested on the three-phase switch to be tested; Arranging the order of the target test items to obtain a test item sequence according to the test requirement switch states respectively corresponding to the target test items in the test request; The test requirement switch state of each target test item is one of an open state, a closed state, switching from a closed state to an open state, switching from an open state to a closed state, switching from an open state to a closed state and then switching to an open state; In the test item sequence, all the target test items whose test requirements require the switch state to be an open state are arranged continuously in sequence, and all the target test items whose test requirements require the switch state to be a closed state are arranged continuously in sequence.

2. A three-phase switch test scheduling method as claimed in claim 1, characterized in that: The target test items are tested by at least two independent switch test modules, specifically including an insulation resistance test module, a loop resistance test module and a switch mechanical characteristic test module.

3. A three-phase switch test scheduling method as claimed in claim 1, characterized in that: According to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is an open state, the specific method includes: Step S101, determining whether there is a target test item in the test request that the switch state is an open state; if the determination result of step S101 is yes, executing step S102; if the determination result of step S101 is no, executing step S103; Step S102, placing all the target test items whose test requirement switch state is the open state in the test item sequence in sequence to update the test item sequence; after step S102 is completed, executing step S103; Step S103, determining whether there is a target test item in the test request that requires the switch state to be switched from an open state to a closed state; If the judgment result of step S103 is yes, then execute step S104; if the judgment result of step S103 is no, then execute step S105; Step S104, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S104 is completed, executing step S105; Step S105, determining whether there is a target test item in the test request that the switch state is a closed state; If the judgment result of step S105 is yes, then execute step S106; if the judgment result of step S105 is no, then execute step S107; Step S106, placing all the target test items whose test requirement switch state is the open state in sequence at the end of the test item sequence to update the test item sequence; after step S106 is completed, executing step S107; Step S107 , determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state.

4. A three-phase switch test scheduling method as claimed in claim 3, characterized in that: According to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is an open state, the specific method further includes: if the judgment result of step S107 is yes, executing step S108; if the judgment result of step S107 is no, executing step S113; Step S108, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S108 is completed, executing step S109; Step S109, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S109 is yes, then execute step S110; if the judgment result of step S109 is no, then execute step S111; Step S110, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S110 is completed, executing step S107 again; Step S111, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state; If the judgment result of step S111 is yes, then execute step S112; if the judgment result of step S111 is no, then execute step S115; Step S112, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; after step S112, executing step S115; Step S113, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S113 is yes, then execute step S114; if the judgment result of step S113 is no, then execute step S115; Step S114, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; Step S115, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state; If the judgment result of step S115 is yes, then execute step S116; if the judgment result of step S115 is no, then execute step S117; Step S116, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S116 is completed, executing step S117; Step S117: output the final test item sequence.

5. A three-phase switch test scheduling method as claimed in claim 1, characterized in that: According to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is a closed state, the specific method includes: Step S201, determining whether there is a target test item in the test request that the switch state is a closed state; If the judgment result of step S201 is yes, then execute step S202; if the judgment result of step S201 is no, then execute step S203; Step S202, placing all the target test items whose test requirement switch state is the closed state in the test item sequence in sequence, so as to update the test item sequence; after step S202 is completed, executing step S203; Step S203, determining whether there is a target test item in the test request that requires the switch state to be switched from the closed state to the open state; If the judgment result of step S203 is yes, then execute step S204; if the judgment result of step S203 is no, then execute step S205; Step S204, placing one of the target test items whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S204 is completed, executing step S205; Step S205, determining whether there is a target test item in the test request whose test requirement switch state is an open state; If the judgment result of step S205 is yes, then execute step S206; if the judgment result of step S205 is no, then execute step S207; Step S206, placing all the target test items whose test requirement switch state is the closed state in sequence at the end of the test item sequence to update the test item sequence; after step S206 is completed, executing step S207; Step S207: determine whether there is a target test item in the test request that requires the switch state to be switched from the open state to the closed state.

6. A three-phase switch test scheduling method as claimed in claim 5, characterized in that: According to the test requirement switch states respectively corresponding to the target test items in the test request, the order of the target test items is arranged to obtain a test item sequence, and the initial switch state of the three-phase switch to be tested is used as the first priority of the test arrangement. When the initial switch state of the three-phase switch to be tested is a closed state, the specific method further includes: If the judgment result of step S207 is yes, then execute step S208; if the judgment result of step S207 is no, then execute step S213; Step S208, placing one of the target test items whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence to update the test item sequence; after step S208 is completed, executing step S209; Step S209, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the closed state to the open state; If the judgment result of step S209 is yes, then execute step S210; if the judgment result of step S209 is no, then execute step S211; Step S210, placing one of the target test items that is not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence to update the test item sequence; after step S210 is completed, executing step S207 again; Step S211, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requirement switch state is switched from the open state to the closed state; If the judgment result of step S211 is yes, then execute step S212; if the judgment result of step S211 is no, then execute step S215; Step S212, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the open state to the closed state at the end of the test item sequence, so as to update the test item sequence; after step S212, executing step S215; Step S213, determining whether there is a target test item in the test request that is not included in the test item sequence and the test requires the switch state to be switched from the closed state to the open state; If the judgment result of step S213 is yes, then execute step S214; if the judgment result of step S213 is no, then execute step S215; Step S214, placing all target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is switched from the closed state to the open state at the end of the test item sequence, so as to update the test item sequence; Step S215, determining whether there is a target test item in the test request that switches from an open state to a closed state and then to an open state; If the judgment result of step S215 is yes, then execute step S216; if the judgment result of step S215 is no, then execute step S217; Step S216, placing all target test items that are switched from the open state to the closed state and then to the open state at the end of the test item sequence to update the test item sequence; after step S216 is completed, executing step S217; Step S217: output the final test item sequence.

7. A method for scheduling a three-phase switch test as described in any one of claims 3 to 6, characterized in that: After the arrangement of the test with the initial switch state of the three-phase switch to be tested as the first priority is completed, the test is arranged with the same type of switch test module required by the target test item as the second priority. The specific method includes: first, determining whether the test required switch states of the target test items are the same; when the test required switch states of the target test items are the same, continuing to determine whether the switch test modules of the target test items are the same; if they are the same, the target test items are arranged with priority.

8. A three-phase switch test scheduling method as claimed in claim 7, characterized in that: After the arrangement of the test arrangement with the initial switch state of the three-phase switch to be tested as the second priority is completed, the test is arranged with the similarity of the conductive switch unit of the target test item as the third priority, and the specific method includes: Step Sa1, randomly selecting one of the target test items whose test requirement switch state is an open state, and placing it at the end of the test item sequence to update the test item sequence; Step Sa2, determining whether the test request contains the target test item that is not included in the test item sequence and whose test requirement switch state is an open state; If the judgment result of step Sa2 is yes, then step Sa3 is executed; if the judgment result of step Sa2 is no, then the process ends; Step Sa3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the open state as the first test item to be scheduled, and calculating the set similarity between the set of on-switch units configured for each first test item to be scheduled and the set of on-switch units of the target test item at the end of the test item sequence; Step Sa4, placing the first test item to be arranged that has the greatest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sa4 is completed, executing step Sa2 again.

9. A three-phase switch test scheduling method as claimed in claim 7, characterized in that: After the arrangement of the test arrangement with the initial switch state of the three-phase switch to be tested as the second priority is completed, the test is arranged with the similarity of the conductive switch unit of the target test item as the third priority. The specific method also includes: Step Sb1, randomly selecting one of the target test items whose test requirement switch state is the closed state, and placing it at the end of the test item sequence to update the test item sequence; Step Sb2, determining whether the test request includes the target test item that is not included in the test item sequence and whose test requirement switch state is the closed state; If the judgment result of step Sb2 is yes, then step Sb3 is executed; if the judgment result of step Sb2 is no, then the process ends; Step Sb3, taking each of the target test items in the test request that are not placed in the test item sequence and whose test requirement switch state is the closed state as the second test item to be scheduled, and calculating the set similarity between the set of conductive switch units configured for each second test item to be scheduled and the set of conductive switch units of the target test item at the end of the test item sequence; Step Sb4, placing the second test item to be arranged which has the largest set similarity with the target test item at the end of the test item sequence at the end of the test item sequence to update the test item sequence; after step Sb4, executing step Sb2 again.

10. An electronic device comprising: one or more processors; A memory for storing one or more programs; When the one or more programs are executed by the one or more processors, the one or more processors implement the test scheduling method of claims 1-9.

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