Lamp test system and lamp test method

Abstract

The invention relates to the technical field of lighting electrical testing, in particular to a lamp testing system and method, and the system comprises an electrical parameter collection module, a harmonic analysis module, an optical collection module, a light fluctuation analysis module and an abnormality judgment module. Wherein the electrical parameter acquisition module is used for acquiring a real-time voltage waveform of an input end of a lamp; the harmonic analysis module is used for extracting a fundamental wave and each harmonic component and calculating a harmonic distortion rate; the optical acquisition module is used for synchronously acquiring light signal time sequence data of the light emitting surface of the lamp; the light fluctuation analysis module calculates the light fluctuation frequency of the light source; and the abnormity judgment module is used for generating an electrical-optical relevance index and comparing the electrical-optical relevance index with a preset threshold value so as to output a stroboscopic qualification judgment result of the lamp. According to the method, the accuracy of lamp stroboscopic detection and the causal identification capability are effectively improved by constructing the electrical-optical correlation index and realizing synchronous judgment.

Description

Technical Field

[0001] The present invention relates to the technical field of lighting electrical testing, and in particular to a lamp testing system and a lamp testing method. Background Art

[0002] With the widespread adoption of LED lighting, the flicker characteristics of lamps have become a key factor affecting visual comfort and safety. Flicker is typically caused by harmonic disturbances in the supply voltage. Within a certain range of fluctuation amplitude and frequency, it can cause visual fatigue, distraction, and even health risks such as photoinduced epilepsy. Existing detection methods often rely on a single optical sensor for frequency analysis, failing to synchronously incorporate changes in the electrical waveform on the power supply side, making it difficult to fully assess the root cause of flicker.

[0003] However, the essence of lamp flicker is the result of electrical energy disturbances affecting the light source output through the driver circuit, and its cause is typical of electro-optical coupling. Current flicker detection solutions generally ignore the dynamic correlation between electrical-side harmonic distortion and light fluctuations, lacking quantitative analysis methods for timing matching between the two, making it difficult to accurately identify flicker caused by abnormal power supply quality. Therefore, a lamp test system and lamp test method are urgently needed to address this issue. Summary of the Invention

[0004] Based on the above objectives, the present invention provides a lamp testing system and a lamp testing method.

[0005] A lamp testing system includes an electrical parameter acquisition module, a harmonic analysis module, an optical acquisition module, a light fluctuation analysis module, and an abnormality determination module; wherein:

[0006] Electrical parameter acquisition module: used to obtain the real-time voltage waveform of the lamp input terminal;

[0007] Harmonic analysis module: Based on the real-time voltage waveform, extract the fundamental wave and each harmonic component, and calculate the harmonic distortion rate;

[0008] Optical acquisition module: used to synchronously collect the timing data of the light signal from the light-emitting surface of the lamp;

[0009] Light fluctuation analysis module: calculates the light fluctuation frequency of the light source based on the optical signal timing data;

[0010] Abnormal judgment module: It is used to receive the harmonic distortion rate and light fluctuation frequency, generate the electro-optical correlation index based on the timestamp alignment of the two, and compare the correlation index with the preset threshold to output the flicker qualification judgment result of the lamp.

[0011] Optionally, the electrical parameter acquisition module includes a voltage sensing unit, a signal conditioning unit and a data acquisition unit; wherein:

[0012] Voltage sensing unit: used to connect to the input end of the lamp, detect the voltage of the AC power supply circuit through the voltage isolation probe, and output the original analog voltage signal in real time;

[0013] Signal conditioning unit: used for receiving the original analog voltage signal and performing low-noise amplification, band-pass filtering and DC offset correction on the original analog voltage signal;

[0014] Data acquisition unit: used to perform analog-to-digital conversion on the analog voltage signal after signal conditioning, and output real-time voltage waveform data in the form of a time series after conversion.

[0015] Optionally, the harmonic analysis module includes a spectrum extraction unit, a component identification unit and a distortion calculation unit; wherein:

[0016] Spectrum extraction unit: used to receive the real-time voltage waveform output by the electrical parameter acquisition module, perform full-cycle window interception processing on it, and then perform fast Fourier transform operation to extract the amplitude spectrum and phase spectrum information of the signal in the frequency domain;

[0017] Component identification unit: used to perform frequency positioning on the amplitude spectrum output by the spectrum extraction unit, identify the fundamental component and several harmonic components, and determine the amplitude and corresponding frequency of each component in the frequency domain;

[0018] Distortion calculation unit: Based on all the harmonic component information extracted by the component identification unit, after excluding the fundamental component, it calculates the overall distortion degree of the remaining harmonics relative to the fundamental wave and outputs the harmonic distortion rate.

[0019] Optionally, the component identification unit includes:

[0020] Frequency calibration subunit: used to construct a frequency coordinate axis based on the amplitude spectrum output by the spectrum extraction unit to determine the center frequency corresponding to each spectrum line, thereby establishing a one-to-one correspondence between the spectrum line index and the actual frequency;

[0021] Peak detection subunit: used to traverse the amplitude spectrum data on the frequency coordinate axis output by the frequency calibration subunit, identify the spectrum lines with amplitudes higher than the set threshold, and extract the amplitude of each spectrum line and its corresponding center frequency to form a preliminary set of candidate frequency components;

[0022] Component matching subunit: used to determine the integer multiple relationship between the center frequency and the reference frequency in the candidate frequency component set. If the condition f is met, i ≈n·f0, where n is a positive integer, f0 is the fundamental frequency, and f i If f is the center frequency, then i It is calibrated as the nth harmonic frequency, and the corresponding amplitude is recorded as the nth harmonic amplitude component.

[0023] Optionally, the distortion calculation unit includes:

[0024] Fundamental wave elimination subunit: used to filter out the fundamental wave component from all the frequency components extracted by the component identification unit, identify the corresponding fundamental wave frequency and extract its amplitude as a reference value, and at the same time eliminate the filtered fundamental wave component from the subsequent harmonic energy calculation;

[0025] Harmonic energy extraction subunit: used to extract energy from all harmonic components after removing the fundamental wave, that is, square the amplitude of each harmonic and accumulate it to obtain the total harmonic energy term E H ;

[0026] Distortion rate calculation subunit: Calculates the harmonic distortion rate based on the normalized ratio between the harmonic energy term and the fundamental amplitude. The formula is:

[0027] Among them, THD represents harmonic distortion; E H Represents the total harmonic energy term; V1 represents the fundamental wave amplitude.

[0028] Optionally, the optical acquisition module includes a photoelectric detection unit, a signal conditioning unit, a timing synchronization unit and a data cache unit; wherein:

[0029] Photoelectric detection unit: It is placed in front of the light-emitting surface of the lamp and uses a photoelectric sensor array whose response band covers the entire spectrum of visible light to convert the incident light signal into an analog current signal in real time;

[0030] Signal conditioning unit: coupled to the output end of the photodetection unit, used to perform voltage conversion and out-of-band noise suppression on the analog current signal, and output an optical analog voltage signal;

[0031] Timing synchronization unit: uses a hardware sampling clock shared with the electrical parameter acquisition module, marks the sampling start point through the synchronization trigger line, and writes an absolute timestamp at each sampling instant to achieve millisecond-level alignment;

[0032] Data cache unit: continuously buffers the optical digital sequence output by the timing synchronization unit, and outputs the optical signal timing data after framing according to the timestamp sequence.

[0033] Optionally, the light fluctuation analysis module includes a time domain normalization unit, a period detection unit, and a frequency calculation unit; wherein:

[0034] Time domain normalization unit: used to receive the optical signal timing data output by the optical acquisition module and perform normalization processing on each frame of light intensity sequence, that is, to uniformly map the light intensity value to the [0,1] interval;

[0035] Period detection unit: used to perform periodic structure recognition in the normalized optical signal by searching for continuous peak-valley structures and counting the time intervals between adjacent peaks to extract the time interval sequence T of the dominant fluctuation period;

[0036] Frequency calculation unit: Calculates the light fluctuation frequency based on the dominant period sequence output by the period detection unit. The formula is: Here, P represents the frequency of light fluctuations.

[0037] Optionally, the anomaly determination module includes a time alignment unit, a correlation factor extraction unit, and a correlation index generation unit; wherein:

[0038] Time alignment unit: This unit receives the timestamps of the harmonic distortion rate and optical fluctuation frequency recorded in their respective acquisition paths, matches the sampling times of the two types of data one by one according to a unified global clock reference, and constructs a synchronized frame set for the electrical parameter data sequence and the optical data sequence.

[0039] Correlation factor extraction unit: used to extract the harmonic distortion rate and optical fluctuation frequency at corresponding moments in the synchronous frame set, and construct a set of two-variable sequences based on time matching as the basic input for quantifying the linkage relationship between the two types of signals;

[0040] Correlation index generation unit: Based on a set of two-variable sequences, by evaluating the linear correlation between the harmonic distortion rate and the optical fluctuation frequency in time series, the output is a normalized indicator representing its coupling strength, namely the electro-optical correlation index R.

[0041] Optionally, the light fluctuation analysis module further includes a threshold detection unit and a determination output unit; wherein:

[0042] Threshold test unit: used to receive the electro-optical correlation index R output by the correlation index generation unit and call the preset stroboscopic judgment threshold R th , compare the current correlation index numerically. Specifically, if the correlation index R is less than or equal to the threshold R th When R is greater than the threshold R, it is determined that the lamp flicker level is within the predetermined range and a flicker qualified status mark is generated; th , it is determined that the lamp has a flicker risk with strong electro-optical coupling, and a flicker unqualified status mark is generated;

[0043] Judgment output unit: used to output the stroboscopic qualification judgment results in the form of structured data, including correlation index value, comparison threshold, judgment conclusion and timestamp information.

[0044] A lamp testing method, implemented by the above-mentioned lamp testing system, includes the following steps:

[0045] S1: Obtain the real-time voltage waveform at the input end of the lamp to form voltage time series data with consistent sampling point intervals;

[0046] S2: Based on the voltage time series data, extract the fundamental wave and each harmonic component, and calculate the corresponding harmonic distortion rate;

[0047] S3: Synchronously collect the timing data of the light signal from the light-emitting surface of the lamp and record the absolute timestamp;

[0048] S4: normalize and periodically detect the optical signal time series data to obtain the optical fluctuation frequency;

[0049] S5: Under a unified clock reference, align the harmonic distortion rate in S2 with the optical fluctuation frequency in S4 and calculate the electro-optical correlation index;

[0050] S6: Compare the electro-optical correlation index with a preset threshold value, and output a determination result of whether the lamp flicker is qualified.

[0051] Beneficial effects of the present invention:

[0052] The present invention synchronously collects the input voltage waveform of the lamp and the light signal data of the light-emitting surface, extracts the harmonic distortion rate and the light fluctuation frequency respectively, and achieves timing alignment of the two based on a unified time reference to construct an electro-optical correlation index. This solves the problem of separate analysis of electrical and optical signals in existing stroboscopic detection and the inability to reflect causal coupling relationships.

[0053] The present invention can achieve quantitative judgment of flicker eligibility by comparing the correlation index with a preset threshold, avoiding the uncertainty of traditional judgment relying on a single optical indicator, improving the accuracy and consistency of flicker risk identification, and having high engineering applicability and automated detection value. BRIEF DESCRIPTION OF THE DRAWINGS

[0054] In order to more clearly illustrate the technical solutions in the present invention or the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only for the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0055] Figure 1 Schematic diagram of a lamp testing system according to an embodiment of the present invention;

[0056] Figure 2 Schematic diagram of a lamp testing method according to an embodiment of the present invention. DETAILED DESCRIPTION

[0057] The present invention is described in detail below with reference to the accompanying drawings and specific embodiments. It is also noted that, to provide a more detailed description, the following embodiments are best and preferred embodiments, and those skilled in the art may employ alternative methods for implementing certain known technologies. Furthermore, the accompanying drawings are intended only to provide a more detailed description of the embodiments and are not intended to limit the present invention.

[0058] It should be noted that references in the specification to "one embodiment," "an embodiment," "an exemplary embodiment," "some embodiments," etc. indicate that the described embodiments may include specific features, structures, or characteristics, but not every embodiment necessarily includes such specific features, structures, or characteristics. In addition, when specific features, structures, or characteristics are described in conjunction with an embodiment, it is within the knowledge of persons skilled in the relevant art to implement such features, structures, or characteristics in conjunction with other embodiments (whether or not explicitly described).

[0059] In general, terms can be understood, at least in part, from their use in context. For example, depending at least in part on the context, the term "one or more" as used herein can be used to describe any feature, structure, or characteristic in the singular sense, or can be used to describe a combination of features, structures, or characteristics in the plural sense. Additionally, the term "based on" can be understood as not necessarily intended to convey an exclusive set of factors, but can instead, depending at least in part on the context, allow for the presence of other factors that are not necessarily explicitly described.

[0060] like Figure 1 As shown, a lamp testing system includes an electrical parameter acquisition module, a harmonic analysis module, an optical acquisition module, a light fluctuation analysis module, and an abnormality determination module; wherein:

[0061] Electrical parameter acquisition module: used to obtain the real-time voltage waveform of the lamp input terminal;

[0062] Harmonic analysis module: Based on the real-time voltage waveform, extract the fundamental wave and each harmonic component, and calculate the harmonic distortion rate;

[0063] Optical acquisition module: used to synchronously collect the timing data of the light signal from the light-emitting surface of the lamp;

[0064] Light fluctuation analysis module: calculates the light fluctuation frequency of the light source based on the optical signal timing data;

[0065] Abnormal judgment module: It is used to receive the harmonic distortion rate and light fluctuation frequency, generate the electro-optical correlation index based on the timestamp alignment of the two, and compare the correlation index with the preset threshold to output the flicker qualification judgment result of the lamp.

[0066] The electrical parameter acquisition module includes a voltage sensing unit, a signal conditioning unit and a data acquisition unit; wherein:

[0067] Voltage sensing unit: used to connect to the input end of the lamp in a high-frequency sampling manner, perform non-contact voltage detection on the AC power supply circuit through a voltage isolation probe, and output the original analog voltage signal in real time;

[0068] Signal conditioning unit: used to receive the original analog voltage signal and perform low-noise amplification, bandpass filtering and DC offset correction on the original analog voltage signal to improve the signal-to-noise ratio and amplitude stability of the waveform;

[0069] Data acquisition unit: This unit is used to perform high-resolution analog-to-digital conversion on the conditioned analog voltage signal, with a sampling frequency of no less than 10kHz. After conversion, the data is output in the form of a time series. Through the synergistic effect of the above units, the voltage waveform at the input end of the lamp can be stably and accurately acquired, ensuring the high fidelity of the data used in the subsequent harmonic analysis module.

[0070] The harmonic analysis module includes a spectrum extraction unit, a component identification unit, and a distortion calculation unit; wherein:

[0071] Spectrum extraction unit: used to receive the real-time voltage waveform output by the electrical parameter acquisition module, perform full-cycle window interception processing on it, and then perform fast Fourier transform operation to extract the amplitude spectrum and phase spectrum information of the signal in the frequency domain;

[0072] Component identification unit: used to perform frequency positioning on the amplitude spectrum output by the spectrum extraction unit, identify the fundamental component and several harmonic components, and determine the amplitude and corresponding frequency of each component in the frequency domain;

[0073] Distortion calculation unit: Based on all the harmonic component information extracted by the component identification unit, after excluding the fundamental component, the overall distortion degree of the remaining harmonics relative to the fundamental wave is calculated, and the harmonic distortion rate is output as a quantitative indicator for evaluating the input power quality; through the structure of the above unit, the extraction and component identification processing can be carried out, which effectively improves the accuracy of harmonic component separation and identification, making the harmonic distortion rate calculation result highly reliable, which is conducive to accurately determining the response characteristics of the lamp under the condition of input power waveform distortion.

[0074] The component identification unit includes:

[0075] Frequency calibration subunit: It is used to construct the frequency coordinate axis based on the amplitude spectrum output by the spectrum extraction unit to determine the center frequency corresponding to each spectrum line, thereby establishing a one-to-one correspondence between the spectrum line index and the actual frequency. The frequency calculation formula is: Where Δf is the frequency domain resolution, f s is the sampling rate, N is the number of sampling points;

[0076] Peak detection subunit: used to traverse the amplitude spectrum data on the frequency coordinate axis output by the frequency calibration subunit, identify the spectrum lines with amplitudes higher than the set threshold, and extract the amplitude of each spectrum line and its corresponding center frequency to form a preliminary set of candidate frequency components;

[0077] Component matching subunit: used to determine the integer multiple relationship between the center frequency and the reference frequency in the candidate frequency component set. If the condition f is met, i ≈n·f0, where n is a positive integer, f0 is the fundamental frequency, and f i If f is the center frequency, then i It is calibrated as the nth harmonic frequency, and the corresponding amplitude is recorded as the nth harmonic amplitude component; through the collaborative processing of the above sub-units, the accurate identification of each harmonic component in the spectrum and the extraction of amplitude-frequency information are achieved.

[0078] The distortion calculation unit includes:

[0079] Fundamental wave elimination subunit: It is used to filter out the fundamental wave component from all the frequency components extracted by the component identification unit, identify the corresponding fundamental wave frequency and extract its amplitude as a reference value, and at the same time eliminate the filtered fundamental wave component from the subsequent harmonic energy calculation to avoid the fundamental wave from interfering with the distortion rate calculation;

[0080] Harmonic energy extraction subunit: used to extract energy from all harmonic components after removing the fundamental wave, that is, square the amplitude of each harmonic and accumulate it to obtain the total harmonic energy term E H , the calculation formula is: Among them, E H Represents the total harmonic energy term; V n Indicates the amplitude of the nth harmonic; N indicates the maximum number of harmonics extracted; n1 is the harmonic sequence number, which is accumulated from 2;

[0081] Distortion rate calculation subunit: Calculates the harmonic distortion rate based on the normalized ratio between the harmonic energy term and the fundamental amplitude, and quantitatively describes the overall interference degree of the total harmonics on the fundamental component. The formula is:

[0082] Among them, THD represents harmonic distortion; E H Represents the total harmonic energy term; V1 represents the fundamental amplitude; through the cooperation of the above sub-units, it is possible to automatically remove the fundamental influence from the spectrum, and perform superposition and normalization processing on the energy of each harmonic, thereby outputting the harmonic distortion rate result that meets the requirements of power quality assessment.

[0083] The optical acquisition module includes a photoelectric detection unit, a signal conditioning unit, a timing synchronization unit and a data cache unit; wherein:

[0084] Photoelectric detection unit: It is placed in front of the light-emitting surface of the lamp and uses a photoelectric sensor array whose response band covers the entire spectrum of visible light to convert the incident light signal into an analog current signal in real time;

[0085] Signal conditioning unit: coupled to the output end of the photodetection unit, used to perform voltage conversion and out-of-band noise suppression on the analog current signal, and output an optical analog voltage signal;

[0086] Timing synchronization unit: uses a hardware sampling clock shared with the electrical parameter acquisition module, marks the sampling start point through the synchronization trigger line, and writes an absolute timestamp at each sampling instant to achieve millisecond-level alignment;

[0087] Data cache unit: Continuously buffers the optical digital sequence output by the timing synchronization unit, frames it in timestamp order, and outputs the optical signal timing data for use by the optical fluctuation analysis module. Through the collaboration of the above sub-units, the optical acquisition module can achieve optical signal timing acquisition synchronized with the electrical parameter data under high signal-to-noise ratio conditions, thereby providing high-time-precision and reliable optical input for stroboscopic detection, and improving the system's detection sensitivity to transient light intensity fluctuations.

[0088] The optical fluctuation analysis module includes a time domain normalization unit, a period detection unit, and a frequency calculation unit; wherein:

[0089] Time domain normalization unit: This unit receives the optical signal timing data output by the optical acquisition module and performs normalization processing on each frame of the light intensity sequence, uniformly mapping the light intensity value to the [0, 1] interval. This eliminates the interference of different luminous flux differences between lamps on fluctuation detection and enhances the uniformity of subsequent cycle recognition.

[0090] Period detection unit: This unit is used to identify periodic structures in the normalized optical signal. It searches for continuous peak-valley structures and counts the time intervals between adjacent peaks to extract the time interval sequence T of the dominant fluctuation period. The dominant period is calculated as follows: Where T represents the period of the dominant light fluctuation; t i Represents the timestamp of the i-th periodic peak; M represents the number of peak intervals participating in the periodic average;

[0091] Frequency calculation unit: Calculates the light fluctuation frequency based on the dominant period sequence output by the period detection unit. The formula is: Where P represents the light fluctuation frequency. Through the synergistic effect of the above units, it is possible to extract the dominant light fluctuation frequency from a complex light signal without relying on the specific light source type, thereby achieving effective quantification of the light stability of the lamp output.

[0092] The anomaly determination module includes a time alignment unit, a correlation factor extraction unit, and a correlation index generation unit; wherein:

[0093] Time alignment unit: This receives the timestamps of the harmonic distortion rate and optical frequency recorded in their respective acquisition paths. It then matches the sampling times of the two types of data one-to-one based on a unified global clock reference, constructing a synchronized frame set for the electrical parameter data sequence and the optical data sequence, ensuring that subsequent analysis is based on time consistency.

[0094] Correlation factor extraction unit: used to extract the harmonic distortion rate and optical fluctuation frequency at corresponding moments in the synchronous frame set, and construct a set of two-variable sequences based on time matching as the basic input for quantifying the linkage relationship between the two types of signals;

[0095] Correlation index generation unit: Based on a set of two-variable sequences, the unit evaluates the linear correlation between the harmonic distortion rate and the optical fluctuation frequency in time series and outputs a normalized index representing the coupling strength, namely the electro-optical correlation index R. Its expression is: Where R represents the electro-optical correlation index; THD i represents the harmonic distortion rate of the i-th frame; P i represents the light fluctuation frequency of the i-th frame; represents the mean value of harmonic distortion rate in all frames; represents the mean value of the optical fluctuation frequency in all frames; Q represents the number of frames, that is, the number of effective alignment samples; through the synergistic effect of the above units, the coupling relationship between voltage harmonics and optical fluctuations can be extracted on the basis of timing consistency, and the intensity of their synchronous fluctuations can be reflected in the form of numerical indicators.

[0096] The light fluctuation analysis module further includes a threshold detection unit and a determination output unit; wherein:

[0097] Threshold test unit: used to receive the electro-optical correlation index R output by the correlation index generation unit and call the preset stroboscopic judgment threshold R th , compare the current correlation index numerically. Specifically, if the correlation index R is less than or equal to the threshold R th When R is greater than the threshold R, it is determined that the lamp flicker level is within the predetermined range and a flicker qualified status mark is generated; th , it is determined that the lamp has a flicker risk with strong electro-optical coupling, and a flicker unqualified status mark is generated;

[0098] Judgment output unit: used to output the flicker eligibility judgment results in the form of structured data, including the correlation index value, comparison threshold, judgment conclusion and timestamp information. Through the combined processing of the above units, the automation and consistency of the flicker judgment logic can be achieved based on quantitative indicators, ensuring that the judgment process is not interfered with by subjective factors.

[0099] Decision threshold R th The expression is as follows: in, Represents the mean value of the correlation index of historical qualified lamps; σ valid It represents the standard deviation of the correlation index of historical qualified lamps; λ represents the safety margin coefficient, which is generally taken as 2.

[0100] like Figure 2 As shown, a lamp testing method is implemented by the above-mentioned lamp testing system, comprising the following steps:

[0101] S1: Obtain the real-time voltage waveform at the input end of the lamp to form voltage time series data with consistent sampling point intervals;

[0102] S2: Based on the voltage time series data, extract the fundamental wave and each harmonic component, and calculate the corresponding harmonic distortion rate;

[0103] S3: Synchronously collect the timing data of the light signal from the light-emitting surface of the lamp and record the absolute timestamp;

[0104] S4: normalize and periodically detect the optical signal time series data to obtain the optical fluctuation frequency;

[0105] S5: Under a unified clock reference, align the harmonic distortion rate in S2 with the optical fluctuation frequency in S4 and calculate the electro-optical correlation index;

[0106] S6: Compare the electro-optical correlation index with a preset threshold value, and output a determination result of whether the lamp flicker is qualified.

[0107] The present invention encompasses any alternatives, modifications, equivalents, and solutions that fall within the spirit and scope of the present invention. To provide a thorough understanding of the present invention, specific details are described in detail below in connection with the preferred embodiments of the present invention, but those skilled in the art will be able to fully understand the present invention without these detailed descriptions. Furthermore, to avoid unnecessary confusion regarding the essence of the present invention, well-known methods, processes, procedures, components, and circuits have not been described in detail.

[0108] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principles of the present invention. These improvements and modifications should also be regarded as within the scope of protection of the present invention.

Claims

1. A lamp testing system, characterized in that: It includes an electrical parameter acquisition module, a harmonic analysis module, an optical acquisition module, an optical fluctuation analysis module, and an anomaly determination module; wherein: Electrical parameter acquisition module: used to obtain the real-time voltage waveform of the lamp input terminal; Harmonic analysis module: Based on the real-time voltage waveform, extract the fundamental wave and each harmonic component, and calculate the harmonic distortion rate; Optical acquisition module: used to synchronously collect the timing data of the light signal from the light-emitting surface of the lamp; Light fluctuation analysis module: calculates the light fluctuation frequency of the light source based on the optical signal timing data; Abnormal judgment module: It is used to receive the harmonic distortion rate and light fluctuation frequency, generate the electro-optical correlation index based on the timestamp alignment of the two, and compare the correlation index with the preset threshold to output the flicker qualification judgment result of the lamp.

2. A lamp testing system according to claim 1, characterized in that: The electrical parameter acquisition module includes a voltage sensing unit, a signal conditioning unit and a data acquisition unit; wherein: Voltage sensing unit: used to connect to the input end of the lamp, detect the voltage of the AC power supply circuit through the voltage isolation probe, and output the original analog voltage signal in real time; Signal conditioning unit: used for receiving the original analog voltage signal and performing low-noise amplification, band-pass filtering and DC offset correction on the original analog voltage signal; Data acquisition unit: used to perform analog-to-digital conversion on the analog voltage signal after signal conditioning, and output real-time voltage waveform data in the form of a time series after conversion.

3. The lamp testing system according to claim 1, characterized in that: The harmonic analysis module includes a spectrum extraction unit, a component identification unit and a distortion calculation unit; wherein: Spectrum extraction unit: used to receive the real-time voltage waveform output by the electrical parameter acquisition module, perform full-cycle window interception processing on it, and then perform fast Fourier transform operation to extract the amplitude spectrum and phase spectrum information of the signal in the frequency domain; Component identification unit: used to perform frequency positioning on the amplitude spectrum output by the spectrum extraction unit, identify the fundamental component and several harmonic components, and determine the amplitude and corresponding frequency of each component in the frequency domain; Distortion calculation unit: Based on all the harmonic component information extracted by the component identification unit, after excluding the fundamental component, it calculates the overall distortion degree of the remaining harmonics relative to the fundamental wave and outputs the harmonic distortion rate.

4. A lamp testing system according to claim 3, characterized in that: The component identification unit comprises: Frequency calibration subunit: used to construct a frequency coordinate axis based on the amplitude spectrum output by the spectrum extraction unit to determine the center frequency corresponding to each spectrum line, thereby establishing a one-to-one correspondence between the spectrum line index and the actual frequency; Peak detection subunit: used to traverse the amplitude spectrum data on the frequency coordinate axis output by the frequency calibration subunit, identify the spectrum lines with amplitudes higher than the set threshold, and extract the amplitude of each spectrum line and its corresponding center frequency to form a preliminary set of candidate frequency components; Component matching subunit: used to determine the integer multiple relationship between the center frequency and the reference frequency in the candidate frequency component set. If the condition f is met, i ≈n·f0, where n is a positive integer, f0 is the fundamental frequency, and f i If f is the center frequency, then i It is calibrated as the nth harmonic frequency, and the corresponding amplitude is recorded as the nth harmonic amplitude component.

5. A lamp testing system according to claim 4, characterized in that: The distortion calculation unit includes: Fundamental wave elimination subunit: used to filter out the fundamental wave component from all the frequency components extracted by the component identification unit, identify the corresponding fundamental wave frequency and extract its amplitude as a reference value, and at the same time eliminate the filtered fundamental wave component from the subsequent harmonic energy calculation; Harmonic energy extraction subunit: used to extract energy from all harmonic components after removing the fundamental wave, that is, square the amplitude of each harmonic and accumulate it to obtain the total harmonic energy term E H ; Distortion rate calculation subunit: Calculates the harmonic distortion rate based on the normalized ratio between the harmonic energy term and the fundamental amplitude. The formula is: Among them, THD represents harmonic distortion; E H Represents the total harmonic energy term; V1 represents the fundamental wave amplitude.

6. The lamp testing system according to claim 1, characterized in that: The optical acquisition module includes a photoelectric detection unit, a signal conditioning unit, a timing synchronization unit and a data cache unit; wherein: Photoelectric detection unit: It is placed in front of the light-emitting surface of the lamp and uses a photoelectric sensor array whose response band covers the entire spectrum of visible light to convert the incident light signal into an analog current signal in real time; Signal conditioning unit: coupled to the output end of the photodetection unit, used to perform voltage conversion and out-of-band noise suppression on the analog current signal, and output an optical analog voltage signal; Timing synchronization unit: uses a hardware sampling clock shared with the electrical parameter acquisition module, marks the sampling start point through the synchronization trigger line, and writes an absolute timestamp at each sampling instant to achieve millisecond-level alignment; Data cache unit: continuously buffers the optical digital sequence output by the timing synchronization unit, and outputs the optical signal timing data after framing according to the timestamp sequence.

7. The lamp testing system according to claim 1, characterized in that: The light fluctuation analysis module includes a time domain normalization unit, a period detection unit and a frequency calculation unit; wherein: Time domain normalization unit: used to receive the optical signal timing data output by the optical acquisition module and perform normalization processing on each frame of light intensity sequence, that is, to uniformly map the light intensity value to the [0,1] interval; Period detection unit: used to perform periodic structure recognition in the normalized optical signal by searching for continuous peak-valley structures and counting the time intervals between adjacent peaks to extract the time interval sequence T of the dominant fluctuation period; Frequency calculation unit: Calculates the light fluctuation frequency based on the dominant period sequence output by the period detection unit. The formula is: Here, P represents the frequency of light fluctuations.

8. The lamp testing system according to claim 1, characterized in that: The anomaly determination module includes a time alignment unit, a correlation factor extraction unit, and a correlation index generation unit; wherein: Time alignment unit: This unit receives the timestamps of the harmonic distortion rate and optical fluctuation frequency recorded in their respective acquisition paths, matches the sampling times of the two types of data one by one according to a unified global clock reference, and constructs a synchronized frame set for the electrical parameter data sequence and the optical data sequence. Correlation factor extraction unit: used to extract the harmonic distortion rate and optical fluctuation frequency at corresponding moments in the synchronous frame set, and construct a set of two-variable sequences based on time matching as the basic input for quantifying the linkage relationship between the two types of signals; Correlation index generation unit: Based on a set of two-variable sequences, by evaluating the linear correlation between the harmonic distortion rate and the optical fluctuation frequency in time series, the output is a normalized indicator representing its coupling strength, namely the electro-optical correlation index R.

9. The lamp testing system according to claim 8, characterized in that: The light fluctuation analysis module further includes a threshold detection unit and a determination output unit; wherein: Threshold test unit: used to receive the electro-optical correlation index R output by the correlation index generation unit and call the preset stroboscopic judgment threshold R th , compare the current correlation index numerically. Specifically, if the correlation index R is less than or equal to the threshold R th When R is greater than the threshold R, it is determined that the lamp flicker level is within the predetermined range and a flicker qualified status mark is generated; th , it is determined that the lamp has a flicker risk with strong electro-optical coupling, and a flicker unqualified status mark is generated; Judgment output unit: used to output the stroboscopic qualification judgment results in the form of structured data, including correlation index value, comparison threshold, judgment conclusion and timestamp information.

10. A lamp testing method, implemented by a lamp testing system according to any one of claims 1 to 9, characterized in that: The following steps are involved: S1: Obtain the real-time voltage waveform at the input end of the lamp to form voltage time series data with consistent sampling point intervals; S2: Based on the voltage time series data, extract the fundamental wave and each harmonic component, and calculate the corresponding harmonic distortion rate; S3: Synchronously collect the timing data of the light signal from the light-emitting surface of the lamp and record the absolute timestamp; S4: normalize and periodically detect the optical signal time series data to obtain the optical fluctuation frequency; S5: Under a unified clock reference, align the harmonic distortion rate in S2 with the optical fluctuation frequency in S4 and calculate the electro-optical correlation index; S6: Compare the electro-optical correlation index with a preset threshold value, and output a determination result of whether the lamp flicker is qualified.

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