Test central control method and system for test station of transformer manufacturer

Abstract

The invention relates to a test central control method and system for a test station of a transformer manufacturer, and belongs to the technical field of test control. Control demand information of current test equipment is acquired, control equipment is initially selected for control according to the control demand information of the current test equipment, and an initialization control result is generated; the method comprises the following steps: initializing a control result of each piece of control equipment, acquiring real-time state data information of each piece of control equipment, performing secondary analysis on the initialized control result according to the real-time state data information of each piece of control equipment to generate a secondary control result, and finally performing control interference analysis on the secondary analysis control result to generate a final control result. And the test equipment is controlled according to the final control result. According to the condition of the control equipment, the phenomenon of misoperation when the test equipment needing to be controlled in the central control network system of the test station of the transformer manufacturing plant is controlled is avoided, so that the control equipment can be in order.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of test control, in particular to a test central control method and system for transformer manufacturing plant test station. BACKGROUND

[0002] The transformer manufacturing plant test station central control network system is related to the control of transformer test station, which is composed of a main controller, a first sub-controller and a second sub-controller. The main controller is connected with the two sub-controllers by network cable. The first sub-controller is responsible for the control of generator set and voltage regulator. The second sub-controller is used for the control of transformer, mutual inductor, capacitor and total switch. The power analyzer monitors the power of transformer and controls the second sub-controller to reduce voltage or disconnect the total switch when abnormal. The main controller is connected with a computer. After abnormal operation, the data is transmitted to the computer for storage, and the abnormal signal is transmitted to the display. In addition, a temperature rise temperature measurer (temperature sensor) is provided, which can monitor the temperature change of transformer and assist in controlling the temperature rise experiment. The main controller transmits the temperature signal to the computer, and the computer displays the temperature signal in the form of a curve on the display. The central control room has only one switch outside, and the network cable is connected with a large site. It is necessary to test whether each device is normally connected. If it is not normal, a signal will be sent. However, during the control test, the control process is unreasonable, and multiple control points may control one device, which may lead to the phenomenon of misoperation. SUMMARY

[0003] The present application overcomes the shortcomings of the prior art and provides a test central control method and system for transformer manufacturing plant test station.

[0004] To achieve the above purpose, the technical scheme adopted by the present application is as follows:

[0005] The present application provides a test central control method for transformer manufacturing plant test station, which comprises the following steps:

[0006] Obtain the test equipment data required to be controlled by the transformer manufacturing plant test station central control network system, and set the control equipment according to the test equipment data required to be controlled by the transformer manufacturing plant test station central control network system;

[0007] Obtain the control requirement information of the current test equipment, and initially select the control equipment for control according to the control requirement information of the current test equipment to generate an initialization control result;

[0008] Obtain the real-time state data information of each control equipment, and perform secondary analysis on the initialization control result according to the real-time state data information of each control equipment to generate a secondary control result;

[0009] The control result of the secondary analysis is analyzed to generate a final control result, and the test equipment is controlled according to the final control result.

[0010] Further, in the test control method of the transformer factory test station, the test equipment data required to be controlled by the transformer factory test station central control network system is obtained, specifically:

[0011] The transformer factory test station central control network system is constructed, and the test equipment data of the target area is integrated into the transformer factory test station central control network system.

[0012] The service state information of each test equipment is obtained through the transformer factory test station central control network system, and it is judged whether the service state information is a preset service state.

[0013] When the service state information is the preset service state, the corresponding test equipment is taken as the test equipment required to be controlled, and the test equipment data required to be controlled by the transformer factory test station central control network system is output.

[0014] When the service state information is not the preset service state, the corresponding test equipment is taken as the test equipment not required to be controlled.

[0015] Further, in the test control method of the transformer factory test station, the control equipment is set according to the test equipment data required to be controlled by the transformer factory test station central control network system, specifically:

[0016] The control frequency data information of each test equipment is obtained, the number of control equipment is initialized, and the control frequency data information within a unit time is counted according to the control frequency data information of each test equipment.

[0017] The maximum control times of each control equipment within a unit time are obtained, and the total maximum control times are calculated according to the number of control equipment and the maximum control times of each control equipment within a unit time.

[0018] It is judged whether the total maximum control times are greater than the control frequency data information within a unit time, and if the total maximum control times are greater than the control frequency data information within a unit time, the current number of control equipment is configured.

[0019] If the total maximum control times are not greater than the control frequency data information within a unit time, the number of control equipment is increased until it is greater than the control frequency data information within a unit time.

[0020] Further, in the test control method of the transformer factory test station, control requirement information of a current test device is acquired, and a control device is initially selected for control according to the control requirement information of the current test device, to generate an initial control result, specifically including:

[0021] The control requirement information of the current test device is acquired, a control device is randomly selected for control according to the control requirement information of the current test device, position information of each control device is acquired, and position information of a test device required according to the control requirement information of the current test device is acquired;

[0022] The distance value from the position information of each control device to the position information of the corresponding test device is calculated according to the position information of each control device and the position information of the test device;

[0023] The distance value from the position information of each control device to the position information of the corresponding test device is acquired, and a total distance value is counted according to the distance value from the position information of each control device to the position information of the test device, a distance threshold value is set, and it is judged whether the total distance value is greater than the distance threshold value;

[0024] When the total distance value is greater than the distance threshold value, the control device is reselected for control, and when the total distance value is not greater than the distance threshold value, the initial control result is generated.

[0025] Further, in the test control method of the transformer factory test station, real-time state data information of each control device is acquired, and the initial control result is analyzed again according to the real-time state data information of each control device, to generate a secondary control result, specifically including:

[0026] The real-time state data information of each control device is acquired, and the real-time state data information of each control device in the initial control result is acquired according to the real-time state data information of each control device;

[0027] When the real-time state data information is working state data information, the corresponding control device is deleted from the initial control result;

[0028] When the real-time state data information is non-working state data information, the corresponding control device is maintained unchanged in the initial control result, and a secondary control result is generated.

[0029] Further, in the test control method of the transformer factory test station, control interference analysis is performed on the secondary analysis control result, to generate a final control result, and the test device is controlled according to the final control result, specifically including:

[0030] obtain network state information when the current control device and the test device transmit information, and set a network state information threshold value, and determine whether the network state information when the current control device and the test device transmit information is greater than the network state information threshold value;

[0031] when the network state information when the current control device and the test device transmit information is greater than the network state information threshold value, the corresponding control device is taken as a priority recommended device, a final control result is generated, and the test device is controlled according to the final control result;

[0032] when the network state information when the current control device and the test device transmit information is not greater than the network state information threshold value, the corresponding control device is taken as a non-priority recommended device.

[0033] The second aspect of the present application provides a test central control system of a transformer factory test station, comprising a memory and a processor, the memory comprising a test central control method program of the transformer factory test station, and the test central control method program of the transformer factory test station is executed by the processor to realize the steps of any of the test central control methods of the transformer factory test station.

[0034] The third aspect of the present application provides a computer readable storage medium comprising a test central control method program of a transformer factory test station, and the test central control method program of the transformer factory test station is executed by the processor to realize the steps of any of the test central control methods of the transformer factory test station.

[0035] The present application solves the defects in the background art, and has the following beneficial effects:

[0036] The present application obtains test device data required to be controlled by a transformer factory test station central control network system, and sets a control device according to the test device data required to be controlled by the transformer factory test station central control network system, thereby obtaining control requirement information of a current test device, and initially selecting a control device for control according to the control requirement information of the current test device, generating an initial control result, then obtaining real-time state data information of each control device, and performing secondary analysis on the initial control result according to the real-time state data information of each control device, generating a secondary control result, finally performing control interference analysis on the secondary analysis control result, generating a final control result, and controlling the test device according to the final control result. BRIEF DESCRIPTION OF DRAWINGS

[0037] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings needed to be used in the embodiments or prior art description will be briefly introduced as follows. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without creative effort.

[0038] Figure 1 A whole flow chart of a test central control method of a transformer factory test station is shown;

[0039] Figure 2 A system block diagram of a test central control system of a transformer factory test station is shown. DETAILED DESCRIPTION

[0040] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the accompanying drawings needed to be used in the embodiments or prior art description will be briefly introduced as follows. Obviously, the drawings in the following description are only some embodiments of the present application, and for those skilled in the art, other drawings can also be obtained from these drawings without creative effort.

[0041] In the following description, a lot of specific details are set forth in order to facilitate a thorough understanding of the present application, however, the present application can also be implemented in other ways different from those described herein, therefore, the protection scope of the present application is not limited by the specific embodiments disclosed below.

[0042] As shown in Figure 1 The first aspect of the present application provides a test central control method of a transformer factory test station, comprising the following steps:

[0043] S102: Obtain the test equipment data required to be controlled by the central control network system of the transformer factory test station, and set the control equipment according to the test equipment data required to be controlled by the central control network system of the transformer factory test station;

[0044] S104: Obtain the control requirement information of the current test equipment, and initially select the control equipment for control according to the control requirement information of the current test equipment, to generate an initial control result;

[0045] S106: Obtain the real-time state data information of each control equipment, and perform secondary analysis on the initial control result according to the real-time state data information of each control equipment, to generate a secondary control result;

[0046] S108: Perform control interference analysis on the secondary analysis control result, to generate a final control result, and control the test equipment according to the final control result.

[0047] It should be noted that the present invention avoids the phenomenon of erroneous operation when controlling the test equipment that needs to be controlled in the central control network system of the transformer manufacturer's test station according to the situation of the control equipment, so that the control equipment can be in order.

[0048] Furthermore, in the test central control method of the transformer manufacturing plant test station, the test equipment data that needs to be controlled by the central control network system of the transformer manufacturing plant test station is obtained, specifically:

[0049] Build a central control network system for transformer manufacturing plant test stations and integrate test equipment data in the target area into the central control network system of the transformer manufacturing plant test stations;

[0050] Obtain the service status information of each test device through the central control network system of the transformer manufacturer's test station, and determine whether the service status information is the preset service status;

[0051] When the service status information is the preset service status, the corresponding test equipment is used as the test equipment that needs to be controlled, and the test equipment data output that needs to be controlled by the central control network system of the transformer manufacturing plant test station is generated;

[0052] When the service status information is not the preset service status, the corresponding test equipment is regarded as a test equipment that does not need to be controlled.

[0053] It should be noted that the service status information includes normal operation status, fault status, etc., and the test equipment data includes data such as the test equipment type and the number of test equipment.

[0054] Furthermore, in the test central control method of the transformer manufacturing plant test station, the control equipment is set according to the test equipment data that needs to be controlled by the central control network system of the transformer manufacturing plant test station, specifically:

[0055] Obtain the control frequency data of each test device, initialize the number of control devices, and count the control frequency data within a unit time based on the control frequency data of each test device;

[0056] Obtain the maximum number of control times of each control device within a unit time, and calculate the total maximum number of control times according to the number of control devices and the maximum number of control times of each control device within a unit time;

[0057] Determine whether the total maximum control times is greater than the control frequency data information within the unit time. If the total maximum control times is greater than the control frequency data information within the unit time, configure according to the number of current control devices;

[0058] If the total maximum control times is not greater than the control frequency data information in a unit time, increase the number of control devices until it is greater than the control frequency data information in a unit time.

[0059] It should be noted that the control frequency data information of the test equipment means the number of times of control required in a unit time or the number of times of control required in a preset time. When the total maximum control times is not greater than the control frequency data information in a unit time, the number of control devices is increased, so that the control requirements of the test equipment can be guaranteed and met.

[0060] Further, in the test control method of the transformer manufacturing plant test station, the control requirement information of the current test equipment is obtained, and the control device is initially selected according to the control requirement information of the current test equipment to generate an initialization control result, which specifically includes:

[0061] The control requirement information of the current test equipment is obtained, and the control device is randomly selected according to the control requirement information of the current test equipment to generate an initialization control result, which specifically includes:

[0062] The position information of each control device is obtained, and the position information of the test equipment is obtained according to the control requirement information of the current test equipment;

[0063] The distance value from the position information of each control device to the position information of the corresponding test equipment is obtained, and the total distance value is calculated according to the distance value from the position information of each control device to the position information of the test equipment;

[0064] When the total distance value is greater than the distance threshold, the control device is reselected for control, and when the total distance value is not greater than the distance threshold, the initialization control result is generated.

[0065] It should be noted that the greater the distance value from the position information of each control device to the position information of the corresponding test equipment, the higher the control delay. Through the method, the total control delay in the target area can be guaranteed within a predetermined range.

[0066] Further, in the test control method of the transformer manufacturing plant test station, the real-time state data information of each control device is obtained, and the initialization control result is analyzed according to the real-time state data information of each control device to generate a secondary control result, which specifically includes:

[0067] Obtaining real-time state data information of each control device, and obtaining real-time state data information of each control device in the initial control result according to the real-time state data information of each control device;

[0068] When the real-time state data information is working state data information, the corresponding control device is deleted from the initial control result;

[0069] When the real-time state data information is non-working state data information, the corresponding control device is maintained in the initial control result, and a secondary control result is generated.

[0070] It should be noted that since the control device can generally control only one device, when the control device is in a working state, the corresponding control device is deleted from the initial control result, further optimizing the rationality of control. Real-time state data information includes working state, non-working state, etc.

[0071] Further, in the test control method of the transformer manufacturing plant test station, the secondary analysis control result is analyzed to generate a final control result, and the test device is controlled according to the final control result, which specifically includes:

[0072] Obtaining network state information when the current control device and the test device transmit information, and setting a network state information threshold to determine whether the network state information when the current control device and the test device transmit information is greater than the network state information threshold;

[0073] When the network state information when the current control device and the test device transmit information is greater than the network state information threshold, the corresponding control device is used as a priority recommended device to generate a final control result, and the test device is controlled according to the final control result;

[0074] When the network state information when the current control device and the test device transmit information is not greater than the network state information threshold, the corresponding control device is used as a non-priority recommended device.

[0075] It should be noted that the network state information includes information upload speed, information download speed, etc. When the network state information when the current control device and the test device transmit information is greater than the network state information threshold, it indicates that there is control interference, and the corresponding control device is used as a priority recommended device to generate a final control result, and the test device is controlled according to the final control result. When the network state information when the current control device and the test device transmit information is not greater than the network state information threshold, the corresponding control device is used as a non-priority recommended device, which can further improve the rationality of control.

[0076] Further, the method also comprises:

[0077] obtaining historical service data information of the control device, and constructing a fault prediction model of the control device based on a deep neural network, and inputting the historical service data information of the control device into the fault prediction model of the controller for training;

[0078] through the training, obtaining the trained fault prediction model of the control device, and obtaining service data information of each control device within a preset time, and inputting the service data information of the control device within the preset time into the trained fault prediction model of the control device for prediction;

[0079] through the prediction, obtaining an estimated fault time node of each control device, and judging whether the estimated fault time node of the control device is within a control demand time range of the current test device;

[0080] when the estimated fault time node of the control device is within the control demand time range of the current test device, the corresponding control device is not used as a recommended control device, and when the estimated fault time node of the control device is not within the control demand time range of the current test device, the corresponding control device is used as a recommended control device, so as to avoid the phenomenon of missing control of the test device due to the fault of the control device.

[0081] As shown in Figure 2 The second aspect of the application provides a test central control system 4 of a transformer manufacturing plant test station, which comprises a memory 41 and a processor 42, the memory 41 comprises a test central control method program of the transformer manufacturing plant test station, and when the test central control method program of the transformer manufacturing plant test station is executed by the processor 42, the following steps are realized:

[0082] obtaining test device data required to be controlled by a transformer manufacturing plant test station central control network system, and setting a control device according to the test device data required to be controlled by the transformer manufacturing plant test station central control network system;

[0083] obtaining control demand information of a current test device, and initially selecting a control device to control according to the control demand information of the current test device, to generate an initial control result;

[0084] obtaining real-time state data information of each control device, and performing secondary analysis on the initial control result according to the real-time state data information of each control device, to generate a secondary control result;

[0085] controlling interference analysis is performed on the secondary analysis control result, to generate a final control result, and the test device is controlled according to the final control result.

[0086] It should be noted that the application avoids the misoperation phenomenon of the test equipment needing to be controlled in the transformer factory test station central control network system by controlling the test equipment according to the situation of the control device, so that the control device can be orderly.

[0087] Further, in the test central control system of the transformer factory test station, the test equipment data of the transformer factory test station central control network system needing to be controlled is obtained, specifically:

[0088] The test equipment data set in the target area is integrated into the transformer factory test station central control network system.

[0089] The service state information of each test equipment is obtained through the transformer factory test station central control network system, and it is judged whether the service state information is a preset service state.

[0090] When the service state information is the preset service state, the corresponding test equipment is taken as the test equipment needing to be controlled, and the test equipment data of the transformer factory test station central control network system needing to be controlled is generated.

[0091] When the service state information is not the preset service state, the corresponding test equipment is taken as the test equipment not needing to be controlled.

[0092] It should be noted that the service state information is a normal operating state, a fault state and the like, and the test equipment data includes test equipment type, test equipment quantity information and the like.

[0093] Further, in the test central control system of the transformer factory test station, the test equipment data of the transformer factory test station central control network system needing to be controlled is obtained, specifically:

[0094] The control frequency data information of each test equipment is obtained, the number of control devices is initialized, and the control frequency data information in a unit time is counted according to the control frequency data information of each test equipment.

[0095] The maximum control times of each control device in a unit time are obtained, and the total maximum control times are calculated according to the number of control devices and the maximum control times of each control device in a unit time.

[0096] It is judged whether the total maximum control times are greater than the control frequency data information in a unit time, and if the total maximum control times are greater than the control frequency data information in a unit time, the current control device is configured according to the number of control devices.

[0097] If the total maximum control times is not greater than the control frequency data information within the unit time, increase the number of control devices until it is greater than the control frequency data information within the unit time.

[0098] It should be noted that the control frequency data information of the test equipment means the number of times required for control within a unit time. When the total maximum number of controls is not greater than the control frequency data information within a unit time, the number of control devices is increased. This can ensure and satisfy the test equipment's ability to meet control requirements.

[0099] Furthermore, in the test central control system of the transformer manufacturing plant test station, the control requirement information of the current test equipment is obtained, and the control equipment is initially selected for control based on the control requirement information of the current test equipment to generate the initialization control result, which specifically includes:

[0100] Obtain control requirement information of the current test device, randomly select a control device for control based on the control requirement information of the current test device, obtain location information of each control device, and obtain location information of the required test device based on the control requirement information of the current test device;

[0101] Calculate the distance between the location of each control device and the location of the test device according to the location information of each control device and the location information of the test device;

[0102] Obtain the distance value from the location information of each control device to the location information of the corresponding test device, calculate the total distance value based on the distance value from the location information of each control device to the location information of the test device, set a distance threshold, and determine whether the total distance value is greater than the distance threshold;

[0103] When the total distance value is greater than the distance threshold, the control device is reselected for control; when the total distance value is not greater than the distance threshold, an initialization control result is generated.

[0104] It should be noted that the greater the distance between the location information of each control device and the location information of the corresponding test device, the higher the control delay. This method can ensure that the total control delay in the target area is within a predetermined range.

[0105] Furthermore, in the test control system of the transformer manufacturing plant test station, the real-time status data information of each control device is obtained, and the initialization control results are secondary analyzed based on the real-time status data information of each control device to generate secondary control results, specifically including:

[0106] Obtaining real-time state data information of each control device, and obtaining real-time state data information of each control device in the initial control result according to the real-time state data information of each control device;

[0107] When the real-time state data information is working state data information, the corresponding control device is deleted from the initial control result;

[0108] When the real-time state data information is non-working state data information, the corresponding control device is maintained in the initial control result, and a secondary control result is generated.

[0109] It should be noted that since the control device can generally control only one device, when the control device is in a working state, the corresponding control device is deleted from the initial control result, further optimizing the rationality of control.

[0110] Further, in the test control system of the transformer manufacturing plant test station, the final control result is generated by controlling the secondary analysis control result for interference analysis, and the test equipment is controlled according to the final control result, which specifically includes:

[0111] Obtaining network state information when the current control device and the test equipment transmit information, and setting a network state information threshold to determine whether the network state information when the current control device and the test equipment transmit information is greater than the network state information threshold;

[0112] When the network state information when the current control device and the test equipment transmit information is greater than the network state information threshold, the corresponding control device is used as a priority recommended device, a final control result is generated, and the test equipment is controlled according to the final control result;

[0113] When the network state information when the current control device and the test equipment transmit information is not greater than the network state information threshold, the corresponding control device is used as a non-priority recommended device.

[0114] It should be noted that the network state information includes information upload speed, information download speed, etc. When the network state information when the current control device and the test equipment transmit information is greater than the network state information threshold, the corresponding control device is used as a priority recommended device, a final control result is generated, and the test equipment is controlled according to the final control result. When the network state information when the current control device and the test equipment transmit information is not greater than the network state information threshold, the corresponding control device is used as a non-priority recommended device, which can further improve the rationality of control.

[0115] The third aspect of the present application provides a computer readable storage medium comprising a transformer factory test station test control method program, the transformer factory test station test control method program, when executed by a processor, implements the steps of any one of the transformer factory test station test control methods.

[0116] In several embodiments provided in the present application, it should be understood that the disclosed devices and methods can be implemented in other manners. The above described device embodiments are merely schematic, for example, the division of the units is only a logical function division, and there can be another division manner in actual implementation, for example, a plurality of units or components can be combined or integrated into another system, or some features can be ignored or not executed. In addition, the displayed or discussed coupling, or direct coupling or communication connection between the components can be indirect coupling or communication connection through some interfaces, devices or units, and can be electrical, mechanical or in other forms.

[0117] The units described as separate components can or can not be physically separate, and the components displayed as units can or can not be physical units; they can be located in one place, or distributed on a plurality of network units; and some or all of the units can be selected according to actual needs to achieve the purpose of the embodiment.

[0118] In addition, each functional unit in each embodiment of the present application can be integrated into one processing unit, or each unit can be a separate unit, or two or more units can be integrated into one unit; the integrated unit can be implemented in the form of hardware, or in the form of hardware plus software functional units.

[0119] Those skilled in the art can understand that all or part of the steps of the above method embodiments can be completed by program instruction related hardware, and the foregoing program can be stored in a computer readable storage medium, and the program, when executed, executes steps including the above method embodiments; and the foregoing storage medium includes mobile storage devices, read-only memories (ROMs), random access memories (RAMs), magnetic disks or optical disks, and various media that can store program codes.

[0120] Alternatively, the above-mentioned integrated unit of the present application, if realized in the form of a software function module and sold or used as an independent product, can also be stored in a computer-readable storage medium. Based on such an understanding, the technical solutions of the embodiments of the present application can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions to make a computer device (which can be a personal computer, a server, or a network device, etc.) execute all or part of the embodiments of the present application. The aforementioned storage medium includes: mobile storage devices, ROM, RAM, magnetic disks or optical disks, and various media that can store program codes.

[0121] The above is only a specific implementation of the present application, but the protection scope of the present application is not limited thereto, any person skilled in the art can easily think of changes or replacements within the technical range disclosed by the present application, which should be covered within the protection scope of the present application. Therefore, the protection scope of the present application should be subject to the protection scope of the claims.

Claims

1. A test control method for a transformer manufacturing plant test station, characterized in that: The following steps are involved: Acquire test equipment data that needs to be controlled by the central control network system of the transformer manufacturing plant test station, and set control equipment according to the test equipment data that needs to be controlled by the central control network system of the transformer manufacturing plant test station; Acquire control requirement information of the current test device, and initially select a control device for control based on the control requirement information of the current test device to generate an initialization control result; Acquire real-time status data information of each control device, and perform secondary analysis on the initialization control result according to the real-time status data information of each control device to generate a secondary control result; By performing control interference analysis on the secondary analysis control result, a final control result is generated, and the test equipment is controlled according to the final control result.

2. The test control method for a transformer manufacturing plant test station according to claim 1, characterized in that: Obtain the test equipment data that needs to be controlled by the central control network system of the transformer manufacturing plant test station, specifically: Constructing a central control network system for a transformer manufacturing plant test station and integrating test equipment data in the target area into the central control network system for the transformer manufacturing plant test station; Obtaining service status information of each test device through the central control network system of the transformer manufacturing plant test station, and determining whether the service status information is a preset service status; When the service status information is a preset service status, the corresponding test equipment is used as the test equipment that needs to be controlled, and the test equipment data output that needs to be controlled by the central control network system of the transformer manufacturing plant test station is generated; When the service status information is not a preset service status, the corresponding test device is regarded as a test device that does not need to be controlled.

3. The test control method for a transformer manufacturing plant test station according to claim 1, characterized in that: The control equipment is set according to the test equipment data that needs to be controlled by the central control network system of the transformer manufacturing plant test station, specifically: Acquire control frequency data information of each test device, initialize the number of control devices, and count the control frequency data information within a unit time based on the control frequency data information of each test device; Obtaining a maximum number of controls per unit time for each control device, and calculating a total maximum number of controls based on the number of control devices and the maximum number of controls per unit time for each control device; Determine whether the total maximum number of control times is greater than the control frequency data information within the unit time, and if the total maximum number of control times is greater than the control frequency data information within the unit time, configure according to the number of current control devices; If the total maximum control times is not greater than the control frequency data information within the unit time, the number of control devices is increased until it is greater than the control frequency data information within the unit time.

4. The test control method for a transformer manufacturing plant test station according to claim 1, characterized in that: Obtaining control requirement information of the current test device, and initially selecting a control device for control based on the control requirement information of the current test device, and generating an initialization control result, specifically including: Obtain control requirement information of the current test device, randomly select a control device for control based on the control requirement information of the current test device, obtain location information of each control device, and obtain location information of the required test device based on the control requirement information of the current test device; Calculate the distance between the location information of the control device and the location information of the corresponding test device based on the location information of each control device and the location information of the test device; Obtaining a distance value from the location information of each control device to the location information of the corresponding test device, calculating a total distance value based on the distance value from the location information of each control device to the location information of the test device, setting a distance threshold, and determining whether the total distance value is greater than the distance threshold; When the total distance value is greater than the distance threshold, a control device is reselected for control; when the total distance value is not greater than the distance threshold, an initialization control result is generated.

5. The test control method for a transformer manufacturing plant test station according to claim 1, characterized in that: Acquiring real-time status data information of each control device, and performing secondary analysis on the initialization control result based on the real-time status data information of each control device to generate a secondary control result, specifically including: Acquire real-time status data information of each control device, and acquire real-time status data information of each control device in the initialization control result according to the real-time status data information of each control device; When the real-time status data information is working status data information, the corresponding control device is deleted from the initialization control result; When the real-time status data information is non-working status data information, the corresponding control device is maintained unchanged from the initialization control result, and a secondary control result is generated.

6. The test control method for a transformer manufacturing plant test station according to claim 1, characterized in that: Performing control interference analysis on the secondary analysis control result to generate a final control result, and controlling the test equipment according to the final control result, specifically including: Obtaining network status information when the current control device and the test device are transmitting information, setting a network status information threshold, and determining whether the network status information when the current control device and the test device are transmitting information is greater than the network status information threshold; When the network status information of the current control device and the test device during information transmission is greater than the network status information threshold, the corresponding control device is used as the priority recommended device, a final control result is generated, and the test device is controlled according to the final control result; When the network status information of the current control device during information transmission with the test device is not greater than the network status information threshold, the corresponding control device is used as a non-priority recommended device.

7. A test control system for a transformer manufacturing plant test station, characterized in that: It comprises a memory and a processor, wherein the memory comprises a test central control method program of a transformer manufacturing plant test station, and when the test central control method program of the transformer manufacturing plant test station is executed by the processor, the steps of the test central control method of the transformer manufacturing plant test station as described in any one of claims 1 to 6 are implemented.

8. A computer-readable storage medium, characterized in that It includes a test central control method program for a transformer manufacturing plant test station. When the test central control method program for the transformer manufacturing plant test station is executed by a processor, the steps of the test central control method for the transformer manufacturing plant test station according to any one of claims 1 to 6 are implemented.

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