Chip test fixture and chip test system

Abstract

The utility model provides a chip test fixture and a chip test system, and relates to the technical field of semiconductor test. A movable block of the movable mechanism is provided with at least one first matching part, the first matching part is used for being matched with a second matching part on the test station so as to test the performance of the chip, and the movable block is arranged to be capable of rotating in the matching process of the first matching part and the second matching part so as to enable the first matching part to be aligned with the second matching part. And the adjusting mechanism is arranged to drive the movable mechanism to move towards the direction close to the test station when being subjected to external force of the test station, so that the first matching part of the movable block is matched with the second matching part. According to the technical scheme, the movable block can rotate in the matching process of the first matching part and the second matching part, so that the first matching part is aligned with the second matching part, the situation that the chip test fixture is blocked or cannot be butted with the test station when being butted with the test station is avoided, and the chip test fixture is ensured to be smoothly butted with the test station.

Description

Technical Field

[0001] The utility model relates to the technical field of semiconductor testing, in particular to a chip testing fixture and a chip testing system. Background Art

[0002] In the prior art, during the chip testing process, the chip testing fixture needs to be docked with the testing station. When a chip testing fixture is docked with multiple testing stations or multiple chip testing fixtures are docked with multiple testing stations in a chip testing device, the chip testing fixture may become stuck or fail to dock with the testing station due to errors in part processing, motion control or visual positioning. Utility Model Content

[0003] One purpose of the utility model is to provide a chip test fixture to solve the technical problem of jamming or failure to connect the chip test fixture to a test station in the prior art.

[0004] Another object of the present invention is to provide a chip testing system having the chip testing fixture.

[0005] In particular, the utility model provides a chip testing fixture, comprising:

[0006] A mounting plate, mounted at a target location;

[0007] A movable mechanism, comprising a movable block, wherein the movable block has at least one first matching portion, wherein the first matching portion is used to match with a second matching portion on a test station to perform a performance test on the chip, and the movable block is configured to be able to rotate during the matching process between the first matching portion and the second matching portion so that the first matching portion is aligned with the second matching portion;

[0008] The adjusting mechanism is connected to the movable mechanism, and the adjusting mechanism is configured to drive the movable mechanism to move toward the test station when subjected to an external force toward the test station, so that the first matching portion of the movable block matches with the second matching portion.

[0009] Optionally, the activity mechanism further includes:

[0010] The first rotating shaft extends along the first direction and is respectively connected to the adjusting mechanism and the movable block. The movable block is configured to be able to rotate along the first rotating shaft when the first matching portion and the second matching portion match.

[0011] Optionally, the activity mechanism further includes:

[0012] The shell is hollow inside, and the two ends of the first rotating shaft are rotatably connected to the opposite two sides of the shell respectively;

[0013] The second rotating shaft extends in a second direction perpendicular to the first direction. The second rotating shaft is connected to the movable block and is rotationally connected to two opposite sides of the shell. The movable block is configured to be able to rotate along the second rotating shaft when the first matching portion and the second matching portion are matched.

[0014] Optionally, the activity mechanism further includes:

[0015] a first sleeve connected to the adjusting mechanism, wherein the first rotating shaft is inserted into the first sleeve;

[0016] The second shaft sleeve is connected to the movable block, and the second rotating shaft is inserted into the second shaft sleeve.

[0017] Optionally, the activity mechanism further includes:

[0018] A rotating member is mounted on the bottom of the second sleeve, and the movable block is sleeved on the rotating member;

[0019] Two groups of first limiting components are respectively installed on opposite sides of the movable block and connected to the second sleeve. The two groups of the first limiting components are configured to enable the movable block to rotate along a horizontal plane around the rotating member and limit the movable block during the cooperation between the first matching portion and the second matching portion.

[0020] Optionally, the adjustment mechanism comprises:

[0021] The first sliding component extends vertically and is connected to the movable mechanism. The first sliding component is configured to drive the movable mechanism to move downward after receiving a downward external force, so that the first matching portion matches with the second matching portion.

[0022] Optionally, the adjustment mechanism further includes:

[0023] a second sliding assembly connected to the first sliding assembly, wherein the second sliding assembly is configured to allow the movable block to move along a first direction during the process of the first matching portion matching with the second matching portion;

[0024] A third sliding assembly is connected to the second sliding assembly and is mounted on the mounting plate. The third sliding assembly is configured to allow the movable block to move along a second direction perpendicular to the first direction during the mating process between the first mating portion and the second mating portion.

[0025] Optionally, the adjustment mechanism further includes:

[0026] The second limiting assembly includes a first slider and a first limiting wheel installed on the second sliding assembly, the first slider is provided with a first limiting hole, the first slider has a locking state in which the first limiting wheel is restricted in the first limiting hole and an unlocking state in which the first limiting wheel can move in the first limiting hole, the first slider is configured to switch from the locking state to the unlocking state when subjected to a downward external force to allow the second sliding assembly to slide along the first direction.

[0027] Optionally, the adjustment mechanism further includes:

[0028] The third limiting assembly includes a second slider and a second limiting wheel installed on the third sliding assembly, the second slider is provided with a second limiting hole, the second slider has a locking state in which the second limiting wheel is restricted in the second limiting hole and an unlocking state in which the second limiting wheel can move in the second limiting hole, the second slider is configured to switch from the locking state to the unlocking state when subjected to a downward external force to allow the third sliding assembly to slide along the second direction.

[0029] In particular, the utility model also provides a chip testing system, including the above-mentioned chip testing fixture.

[0030] According to the solution of the utility model, the movable block of the movable mechanism has at least one first matching portion, and the first matching portion is used to match with the second matching portion on the test station to perform performance testing on the chip. The movable block is configured to be able to rotate during the process of matching between the first matching portion and the second matching portion, so that the first matching portion and the second matching portion are aligned. The adjustment mechanism is configured to drive the movable mechanism to move toward the test station when subjected to external force from the test station, so that the first matching portion of the movable block matches with the second matching portion. In the above technical solution, the movable block can rotate during the process of matching between the first matching portion and the second matching portion, so that the first matching portion is aligned with the second matching portion, thereby avoiding jamming or failure to dock when the chip test fixture is docked with the test station, and ensuring smooth docking of the chip test fixture with the test station.

[0031] Based on the detailed description of the specific embodiments of the present invention in combination with the accompanying drawings below, those skilled in the art will become more aware of the above and other purposes, advantages and features of the present invention. BRIEF DESCRIPTION OF THE DRAWINGS

[0032] Hereinafter, some specific embodiments of the present invention will be described in detail in an exemplary and non-limiting manner with reference to the accompanying drawings. The same reference numerals in the accompanying drawings indicate the same or similar components or parts. It should be understood by those skilled in the art that these drawings are not necessarily drawn to scale. In the accompanying drawings:

[0033] Figure 1is a schematic structural diagram of a chip testing fixture according to an embodiment of the utility model at one angle;

[0034] Figure 2 is a schematic structural diagram of a chip testing fixture according to an embodiment of the utility model from another angle;

[0035] Figure 3 is a schematic structural diagram of the bottom of a chip testing fixture according to an embodiment of the utility model;

[0036] Figure 4 is a schematic cross-sectional view of a chip testing fixture in one direction according to an embodiment of the utility model;

[0037] Figure 5 is a schematic cross-sectional view of a chip testing fixture according to an embodiment of the utility model in another direction;

[0038] Figure 6 It is a schematic structural diagram of a first limiting component according to an embodiment of the utility model.

[0039] Reference numerals:

[0040] 100-chip test fixture, 200-test station, 10-mounting plate, 20-movable mechanism, 30-adjusting mechanism, 11-movable block, 111-first matching part, 12-first rotating shaft, 13-second rotating shaft, 14-housing, 15-first shaft sleeve, 16-second shaft sleeve, 17-rotating member, 60-first limiting assembly, 31-first sliding assembly, 32-second sliding assembly, 33-third sliding assembly, 40-second limiting assembly, 41-first slider, 4 2-first limiting wheel, 411-first limiting hole, 50-third limiting assembly, 51-second slider, 52-second limiting wheel, 511-second limiting hole, 43-fourth slide rail, 53-fifth slide rail, 311-first slide table, 321-second slide table, 322-first slide rail, 332-third slide table, 331-second slide rail, 34-first connecting member, 35-second connecting member, 36-sixth slide rail, 37-guide rod, 61-third connecting member, 62-third rotating shaft. DETAILED DESCRIPTION

[0041] The embodiments of the present invention are described in detail below, and examples of the embodiments are shown in the accompanying drawings, wherein the same or similar reference numerals throughout represent the same or similar elements or elements having the same or similar functions. The embodiments described below with reference to the accompanying drawings are exemplary and are intended to be used to explain the present invention, and should not be construed as limiting the present invention.

[0042] In the description of the present invention, it is necessary to understand that the terms "upper" and "lower" etc. indicating the orientation or positional relationship are based on the orientation or positional relationship shown in the accompanying drawings, and are only for the convenience of describing the present invention and simplifying the description, rather than indicating or implying that the device or element referred to must have a specific orientation, be constructed and operated in a specific orientation, and therefore cannot be understood as a limitation on the present invention.

[0043] The terms "first" and "second" are used for descriptive purposes only and should not be understood as indicating or implying relative importance or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first" and "second" may explicitly or implicitly include at least one of the features, that is, include one or more of the features. In the description of the present utility model, the meaning of "multiple" is at least two, such as two, three, etc., unless otherwise clearly and specifically defined. When a feature "includes or contains" one or some of the features it covers, unless otherwise specifically described, this indicates that other features are not excluded and may further include other features.

[0044] Unless otherwise clearly specified and limited, the terms "connection", "installation" and the like should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium; it can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise clearly defined. A person skilled in the art should be able to understand the specific meanings of the above terms in the present utility model according to the specific circumstances.

[0045] Unless otherwise defined, all terms (including technical terms and scientific terms) used in the description of this embodiment have the same meanings as commonly understood by ordinary technicians in the technical field to which this application belongs.

[0046] Figure 1 is a schematic structural diagram of a chip testing fixture 100 according to an embodiment of the present invention from one angle. Figure 2 is a schematic structural diagram of a chip testing fixture 100 according to an embodiment of the present invention from another angle. Figure 3 is a schematic structural diagram of the bottom of a chip testing fixture 100 according to an embodiment of the present invention. Figure 4 is a schematic cross-sectional view of a chip testing fixture 100 in one direction according to an embodiment of the utility model. Figure 5 FIG. 1 is a schematic cross-sectional view of a chip testing fixture 100 according to an embodiment of the present invention from another direction. Figures 1 to 5As shown, in a specific embodiment, the chip test fixture 100 includes a mounting plate 10, a movable mechanism 20 and an adjustment mechanism 30, and the mounting plate 10 is installed at the target position. The movable mechanism 20 has a movable block 11, and the movable block 11 has at least one first matching portion 111. The first matching portion 111 is used to match with the second matching portion on the test station 200 to perform performance testing on the chip. The movable block 11 is configured to be able to rotate during the matching process between the first matching portion 111 and the second matching portion, so that the first matching portion 111 is aligned with the second matching portion. The adjustment mechanism 30 is connected to the movable mechanism 20, and the adjustment mechanism 30 is configured to drive the movable mechanism 20 to move toward the test station 200 when subjected to an external force toward the test station 200, so that the first matching portion 111 of the movable block 11 matches with the second matching portion. Here, a driving motor is used to press the adjustment mechanism 30 downward to drive the movable mechanism 20 downward to approach the test station 200, so as to dock with the test station 200.

[0047] In this embodiment, the movable block 11 can rotate during the cooperation between the first matching portion 111 and the second matching portion, so that the first matching portion 111 is aligned with the second matching portion, avoiding jamming or failure to dock when the chip test fixture 100 is docked with the test station 200, and ensuring smooth docking of the chip test fixture 100 with the test station 200.

[0048] In some specific embodiments, the first mating portion 111 is a positioning hole, and the second mating portion is a positioning pin. When the first mating portion 111 is aligned with the second mating portion, if the chip test fixture 100 is not aligned with the test station 200, a jam or a failure to dock will occur. In this embodiment, since the movable block 11 can rotate during the process of the first mating portion 111 and the second mating portion, the position of the first mating portion 111 can be adjusted so that the first mating portion 111 is aligned with the second mating portion, thereby ensuring that the chip test fixture 100 is docked with the test station 200 smoothly. When the positioning pin is inserted into the positioning hole, the movable block 11 continues to approach the test station 200, and the position will be adjusted under the guidance of the positioning pin.

[0049] In some specific embodiments, the movable block 11 is located at the bottom of the movable mechanism 20, and the test station 200 is located below the movable mechanism 20. Figure 1 and Figure 3 .

[0050] In some specific embodiments, the movable mechanism 20 also includes a first rotating shaft 12, which extends along the first direction and is respectively connected to the adjustment mechanism 30 and the movable block 11, and the movable block 11 is configured to be able to rotate along the first rotating shaft 12 when the first matching portion 111 and the second matching portion are matched.

[0051] In some specific embodiments, the movable mechanism 20 further includes a housing 14 and a second rotating shaft 13. The interior of the housing 14 is hollow, and the two ends of the first rotating shaft 12 are rotatably connected to the opposite sides of the housing 14. The second rotating shaft 13 extends along a second direction perpendicular to the first direction. The second rotating shaft 13 is connected to the movable block 11 and is rotatably connected to the opposite sides of the housing 14. The movable block 11 is configured to be able to rotate along the second rotating shaft 13 when the first matching portion 111 and the second matching portion are matched. Figure 1 , the first direction is the Y direction, and the second direction is the X direction.

[0052] In some specific embodiments, the movable mechanism 20 further includes a first sleeve 15 and a second sleeve 16. The first sleeve 15 is connected to the adjustment mechanism 30, and the first shaft 12 is inserted into the first sleeve 15. The second sleeve 16 is connected to the movable block 11, and the second shaft 13 is inserted into the second sleeve 16. Figure 4 and Figure 5 The first sleeve 15 and the second sleeve 16 are both provided with bearings, and the first shaft 12 and the second shaft 13 are distributed and penetrated in the corresponding bearings. The first sleeve 15 is installed above the second sleeve 16.

[0053] Figure 6 FIG. 6 is a schematic structural diagram of a first position limiting assembly 60 according to an embodiment of the present utility model. Figure 6 As shown, and see Figure 1 and Figure 2 In some specific embodiments, the movable mechanism 20 further includes a rotating member 17 and two sets of first limiting components 60. The rotating member 17 is mounted at the bottom of the second sleeve 16, and the movable block 11 is sleeved on the rotating member 17. The two sets of first limiting components 60 are respectively mounted on opposite sides of the movable block 11 and connected to the second sleeve 16. The two sets of first limiting components 60 are configured to enable the movable block 11 to rotate along the horizontal plane around the rotating member 17 during the cooperation between the first matching portion 111 and the second matching portion, and to limit the movable block 11. Here, the first limiting component 60 includes a third connecting member 61 and a third rotating shaft 62. The third connecting member 61 is mounted on the movable block 11, and the third rotating shaft 62 is mounted on the third connecting member 61 and penetrates the end of the second sleeve 16, so that the movable block 11 rotates along the horizontal plane around the rotating member 17 to adjust the position of the first matching portion 111. The angle of rotation of the movable block 11 along the horizontal plane around the rotating member 17 is ±1°. It should be noted that if a single chip test fixture 100 is docked with a single test station 200, there is no need to add a rotating member 17 and two first limit assemblies 60. If multiple chip test fixtures 100 are docked with multiple test stations 200, each chip test fixture 100 needs to add a rotating member 17 and two first limit assemblies 60 to ensure that multiple chip test fixtures 100 can be docked with multiple test stations 200 at the same time.

[0054] In some specific embodiments, the adjustment mechanism 30 includes a first sliding assembly 31 extending vertically, the first sliding assembly 31 is connected to the movable mechanism 20, and the first sliding assembly 31 is configured to drive the movable mechanism 20 to move downward after receiving a downward external force, so that the first matching portion 111 matches the second matching portion. Here, the first sliding assembly 31 includes a first slide 311, and the first slide 311 is connected to the first sleeve 15. The first sliding assembly 31 also includes a first connecting member 34, a second connecting member 35, a guide rod 37 and a sixth slide rail 36. The sixth slide rail 36 is slidably connected to the first slide 311 and is installed on the second connecting member 35. The guide rail is arranged in the first slide 311 and is fixedly connected to the second connecting member 35 through the first connecting member 34. When the first slide 311 slides along the sixth slide rail 36, it slides along the guide rail. Here, the bottom of the guide rail is connected to the first connecting member 34. The first slide 311, the guide rail and the sixth slide rail 36 are all arranged vertically.

[0055] In some specific embodiments, the adjustment mechanism 30 further includes a second sliding component 32 and a third sliding component 33, wherein the second sliding component 32 is connected to the first sliding component 31, and the second sliding component 32 is configured to allow the movable block 11 to move along the first direction during the cooperation between the first matching portion 111 and the second matching portion. The third sliding component 33 is connected to the second sliding component 32 and is mounted on the mounting plate 10, and the third sliding component 33 is configured to allow the movable block 11 to move along the second direction perpendicular to the first direction during the cooperation between the first matching portion 111 and the second matching portion. Here, the first direction is the Y direction, and the second direction is the X direction.

[0056] In this embodiment, when the chip test fixture 100 is docked with the test station 200, the movable block 11 of the chip test fixture 100 can not only rotate along the first rotation axis 12 and the second rotation axis 13, but also move along the X direction and the Y direction, which can further ensure the accurate docking of the chip test fixture 100 and the test station 200 to avoid jamming or docking failure.

[0057] In some specific embodiments, the second sliding assembly 32 includes a second slide 321 and a pair of first slide rails 322, and the second slide 321 can slide along the first slide rails 322. The second slide 321 is connected to the second connecting member 35. Specifically, the second connecting member 35 is connected to the bottom of the second slide 321, and the pair of first slide rails 322 are respectively located on both sides of the first sliding assembly 31.

[0058] In some specific embodiments, the third sliding assembly 33 includes a third slide 332 and a pair of second slide rails 331, and the third slide 332 can slide along the second slide rails 331. The third slide 332 is located below the second slide 321, and the pair of first slide rails 322 are mounted on the third slide 332. The pair of second slide rails 331 are mounted on the mounting plate 10, see Figure 4 and Figure 5 .

[0059] In some specific embodiments, the adjustment mechanism 30 also includes a second limiting assembly 40, which includes a first slider 41 and a first limiting wheel 42 installed on the second sliding assembly 32. The first slider 41 is provided with a first limiting hole 411. The first slider 41 has a locked state in which the first limiting wheel 42 is restricted in the first limiting hole 411 and an unlocked state in which the first limiting wheel 42 can move in the first limiting hole 411. The first slider 41 is configured to switch from a locked state to an unlocked state when subjected to a downward external force, so as to allow the second sliding assembly 32 to slide along the first direction.

[0060] See also Figure 1 and Figure 2 The first limiting wheel 42 is installed on the side wall of the second slide 321, and the first limiting hole 411 is narrow at the bottom and wide at the top. When the first slider 41 is not pressed downward, the first limiting wheel 42 is located at the bottom of the first limiting hole 411, and the second sliding assembly 32 cannot move along the Y direction. When the first slider 41 is pressed downward, the first slider 41 slides downward along the fourth slide rail 43, and the first limiting wheel 42 is located at the top of the first limiting hole 411, so that the second sliding assembly 32 can slide along the Y direction.

[0061] In some specific embodiments, the adjustment mechanism 30 also includes a third limiting assembly 50, which includes a second slider 51 and a second limiting wheel 52 installed on the third sliding assembly 33. The second slider 51 is provided with a second limiting hole 511. The second slider 51 has a locked state in which the second limiting wheel 52 is restricted in the second limiting hole 511 and an unlocked state in which the second limiting wheel 52 can move in the second limiting hole 511. The second slider 51 is configured to switch from a locked state to an unlocked state when subjected to a downward external force, so as to allow the third sliding assembly 33 to slide along the second direction.

[0062] See also Figure 1 and Figure 2The second limiting wheel 52 is installed on the side wall of the third slide 332, and the second limiting hole 511 is narrow at the bottom and wide at the top. When the second slider 51 is not pressed downward, the second limiting wheel 52 is located at the bottom of the second limiting hole 511, and the third sliding assembly 33 cannot move along the X direction. When the second slider 51 is pressed downward, the second slider 51 slides downward along the fifth slide rail 53, and the second limiting wheel 52 is located at the top of the second limiting hole 511, so that the third sliding assembly 33 can slide along the X direction.

[0063] In some specific embodiments, the driving motor presses the first slider 41, the second slider 51 and the first slide 311 simultaneously, so that the second limit assembly 40 and the third limit assembly 50 are unlocked, and the first slide 311 drives the movable mechanism 20 to move downward.

[0064] This embodiment further provides a chip testing system, including the above-mentioned chip testing fixture 100. The chip testing fixture 100 is not described in detail here.

[0065] The movable block 11 of the chip test fixture 100 of this embodiment can be adaptively adjusted, and the adjustment margin can cover the deviations caused by processing, motion control, vision, etc., so that the chip test fixture 100 can be smoothly connected with the test station 200.

[0066] At this point, those skilled in the art should recognize that, although multiple exemplary embodiments of the present invention have been shown and described in detail herein, many other variations or modifications that conform to the principles of the present invention can still be directly determined or derived from the contents disclosed in the present invention without departing from the spirit and scope of the present invention. Therefore, the scope of the present invention should be understood and recognized as covering all such other variations or modifications.

Claims

1. A chip testing fixture, characterized in that: include: A mounting plate, mounted at a target location; A movable mechanism, comprising a movable block, wherein the movable block has at least one first matching portion, wherein the first matching portion is used to match with a second matching portion on a test station to perform a performance test on the chip, and the movable block is configured to be able to rotate during the matching process between the first matching portion and the second matching portion so that the first matching portion is aligned with the second matching portion; The adjusting mechanism is connected to the movable mechanism, and the adjusting mechanism is configured to drive the movable mechanism to move toward the test station when subjected to an external force toward the test station, so that the first matching portion of the movable block matches with the second matching portion.

2. The chip testing fixture according to claim 1, characterized in that: The activity organization also includes: The first rotating shaft extends along the first direction and is respectively connected to the adjusting mechanism and the movable block. The movable block is configured to be able to rotate along the first rotating shaft when the first matching portion and the second matching portion match.

3. The chip testing fixture according to claim 2, characterized in that: The activity organization also includes: The shell is hollow inside, and the two ends of the first rotating shaft are rotatably connected to the opposite two sides of the shell respectively; The second rotating shaft extends in a second direction perpendicular to the first direction. The second rotating shaft is connected to the movable block and is rotationally connected to two opposite sides of the shell. The movable block is configured to be able to rotate along the second rotating shaft when the first matching portion and the second matching portion are matched.

4. The chip testing fixture according to claim 3, characterized in that: The activity organization also includes: a first sleeve connected to the adjusting mechanism, wherein the first rotating shaft is inserted into the first sleeve; The second shaft sleeve is connected to the movable block, and the second rotating shaft is inserted into the second shaft sleeve.

5. The chip testing fixture according to claim 4, characterized in that: The activity organization also includes: A rotating member is mounted on the bottom of the second sleeve, and the movable block is sleeved on the rotating member; Two groups of first limiting components are respectively installed on opposite sides of the movable block and connected to the second sleeve. The two groups of the first limiting components are configured to enable the movable block to rotate along a horizontal plane around the rotating member and limit the movable block during the cooperation between the first matching portion and the second matching portion.

6. The chip testing fixture according to claim 1, characterized in that: The regulating mechanism comprises: The first sliding component extends vertically and is connected to the movable mechanism. The first sliding component is configured to drive the movable mechanism to move downward after receiving a downward external force, so that the first matching portion matches with the second matching portion.

7. The chip testing fixture according to claim 6, characterized in that: The regulating mechanism also includes: a second sliding assembly connected to the first sliding assembly, wherein the second sliding assembly is configured to allow the movable block to move along a first direction during the process of the first matching portion matching with the second matching portion; A third sliding assembly is connected to the second sliding assembly and is mounted on the mounting plate. The third sliding assembly is configured to allow the movable block to move along a second direction perpendicular to the first direction during the mating process between the first mating portion and the second mating portion.

8. The chip testing fixture according to claim 7, characterized in that: The regulating mechanism also includes: The second limiting assembly includes a first slider and a first limiting wheel installed on the second sliding assembly, the first slider is provided with a first limiting hole, the first slider has a locking state in which the first limiting wheel is restricted in the first limiting hole and an unlocking state in which the first limiting wheel can move in the first limiting hole, the first slider is configured to switch from the locking state to the unlocking state when subjected to a downward external force to allow the second sliding assembly to slide along the first direction.

9. The chip testing fixture according to claim 7, characterized in that: The regulating mechanism also includes: The third limiting assembly includes a second slider and a second limiting wheel installed on the third sliding assembly, the second slider is provided with a second limiting hole, the second slider has a locking state in which the second limiting wheel is restricted in the second limiting hole and an unlocking state in which the second limiting wheel can move in the second limiting hole, the second slider is configured to switch from the locking state to the unlocking state when subjected to a downward external force to allow the third sliding assembly to slide along the second direction.

10. A chip testing system, characterized in that: A chip testing fixture comprising any one of claims 1-9.

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