A current test probe

Abstract

The utility model discloses a current test probe, can directly set up the one end of voltage needle with thorn with the measured object contact in the test, and the thorn is used for breaking the oxide film, makes the probe head and the battery pole post contact well. The elastic sheet has the elastic force of making the first fixed block and the second fixed block away, so that the probe head and the measured object contact, the probe head is connected with the test platform, and the test platform can show the current data and voltage data of the measured object. The elastic sheet has high reliability, is not easy to fatigue failure, can ensure the close contact between the probe head and the measured object, improves the measurement precision and data consistency, guarantees the long -term stable electrical connection, especially suitable for the test occasion of long -time continuous work, the elastic sheet is relatively short to spring length, reduces the overall size, is favorable to the construction denser test array, improves production efficiency, the elastic sheet is relatively simple to spring installation, simplifies the assembly process, when the elastic sheet is tired, is easy to replace, and the maintenance cost is reduced.

Description

Technical Field

[0001] This utility model relates to the field of battery testing, specifically to a current testing probe. Background Technology

[0002] In battery manufacturing, formation and capacity testing are crucial steps to ensure battery performance. Formation is the first charge-discharge process after battery assembly, activating the internal chemical substances of the battery through specific current and voltage to form a stable solid electrolyte interface film. Capacity testing involves testing and classifying the formed battery for parameters such as capacity, internal resistance, and voltage to ensure performance consistency. Both formation and capacity testing require high-current probes to connect the battery to the testing equipment for charge-discharge operations. Existing probes typically rely on springs to provide the necessary contact pressure, but this design has several drawbacks: springs may fatigue and deform over time, leading to poor contact; furthermore, springs occupy a significant amount of space, increasing the length of the spring guide and the overall size of the probe; and existing spring installation requires additional tooling to secure the compressed spring, making the installation process cumbersome. Utility Model Content

[0003] To overcome the shortcomings of the existing technology, this utility model provides a current testing probe that can solve the problems of existing probes being too long, prone to fatigue, and inconvenient to assemble.

[0004] The technical solution adopted by this utility model to solve its technical problem is as follows: a current testing probe is provided, including a first fixing block, a second fixing block, a spring, an adapter cable, and a current testing assembly. The two ends of the spring are respectively connected to the first fixing block and the second fixing block. The current testing assembly includes a voltage needle and a probe head connected to the adapter cable. The probe head is fixedly mounted on the second fixing block. The voltage needle and the probe head are slidably connected, and the relative sliding direction of the two is the same as the extension and bending direction of the spring. One end of the voltage needle is provided with a spike. When the spring is in its natural state, the spike extends toward the side of the probe head away from the first fixing block.

[0005] As a further improvement to the above technical solution, the second fixing block is provided with a through hole, the probe head includes a head and a column, one end of the column is connected to the head, and the other end passes through the through hole; two nuts are threadedly connected to the column, and the second fixing block is clamped between the two nuts.

[0006] As a further improvement to the above technical solution, an anti-loosening washer is provided between the second fixing block and the nut.

[0007] As a further improvement to the above technical solution, the probe head is provided with a first guide groove, and a guide tube is provided in the first guide groove. The length direction of the guide tube is the same as the extension and retraction direction of the spring. The voltage needle is disposed in the guide tube, and a compression spring is sleeved on the outer wall of the voltage needle. One end of the compression spring is connected to the bottom of the first guide groove, and the other end is connected to the end of the voltage needle with a spike.

[0008] As a further improvement to the above technical solution, the voltage needle includes a fixing tube, a snap-fit ​​post, and a connecting part. The fixing tube is slidably connected to the guide tube, one end of the snap-fit ​​post is fixed inside the fixing tube, and the other end is connected to the connecting part.

[0009] The probe head is provided with a limiting groove on the side facing the spike. The limiting groove is connected to the first guide groove in a stepped shape. The connecting part is located in the limiting groove and abuts against one end of the compression spring. The cross-sectional area of ​​the connecting part is larger than the cross-sectional area of ​​the first guide groove.

[0010] As a further improvement to the above technical solution, a limiting block is provided in the limiting groove, and a second guide groove is provided on the side of the limiting block facing the spike. A connecting hole is provided at the bottom of the second guide groove, and the connecting hole connects the first guide groove and the second guide groove. The fixing tube passes through the connecting hole and is slidably connected to the inner wall of the connecting hole. The connecting part is located in the second guide groove, and the cross-sectional area of ​​the connecting part is larger than the cross-sectional area of ​​the connecting hole.

[0011] As a further improvement to the above technical solution, one end of the fixing tube is provided with a snap-fit ​​groove, and the snap-fit ​​post is interference-fitted into the snap-fit ​​groove.

[0012] As a further improvement to the above technical solution, both ends of the adapter cable are provided with lugs, one of which is connected to the probe head.

[0013] As a further improvement to the above technical solution, two springs are provided, and the two springs are arranged opposite to each other.

[0014] As a further improvement to the above technical solution, the voltage needle is provided with a plurality of spikes, and the plurality of spikes are connected in a serrated shape.

[0015] The beneficial effects of this invention are as follows: When the spring is in its natural state, the spikes extend towards the side of the probe head furthest from the first fixing block. Therefore, during testing, the spiked end of the voltage probe can directly contact the object under test. The spikes pierce the oxide film, ensuring good contact between the probe head and the battery terminal. The spring has an elastic force that keeps the first and second fixing blocks apart, allowing the probe head to contact the object under test. Connecting the probe head to the test bench allows the test bench to display the current and voltage data of the object under test. The spring has high reliability and is not prone to fatigue failure, ensuring tight contact between the probe head and the object under test, improving measurement accuracy and data consistency, and guaranteeing a long-term stable electrical connection. It is particularly suitable for testing applications requiring continuous operation for extended periods. The spring is shorter than a spring, reducing the overall size and facilitating the construction of denser test arrays, thus improving production efficiency. The spring is easier to install than a spring, simplifying the assembly process. When the spring fatigues, it is easy to replace, reducing maintenance costs. Attached Figure Description

[0016] The present invention will be further described below with reference to the accompanying drawings and embodiments.

[0017] Figure 1 This is a schematic diagram of the structure of the current testing probe provided in a preferred embodiment of the present invention;

[0018] Figure 2 yes Figure 1 Enlarged view of section A;

[0019] Figure 3 This is a cross-sectional view of the current testing probe near the probe tip provided in a preferred embodiment of this utility model;

[0020] Figure 4 yes Figure 3 A breakdown diagram from another angle.

[0021] Reference numerals: 1. First fixing block; 2. Second fixing block; 3. Spring; 4. Current testing assembly; 5. Adapter cable; 21. Through hole; 41. Probe head; 42. Voltage needle; 43. Head; 44. Column; 51. Wire lug.

[0022] 411. Nut; 412. Anti-loosening washer; 413. First guide groove; 414. Guide tube; 415. Compression spring; 416. Limiting groove; 417. Limiting block; 418. Second guide groove; 419. Connecting hole; 421. Spike; 422. Fixing tube; 423. Snap-fit ​​post; 424. Connecting part; 425. Snap-fit ​​groove. Detailed Implementation

[0023] The following will clearly and completely describe the concept, specific structure, and technical effects of this utility model in conjunction with embodiments and accompanying drawings, so as to fully understand the purpose, features, and effects of this utility model. Obviously, the described embodiments are only a part of the embodiments of this utility model, not all of them. Other embodiments obtained by those skilled in the art based on the embodiments of this utility model without creative effort are all within the scope of protection of this utility model. Furthermore, all connections / connections involved in the patent do not simply refer to direct contact between components, but rather to the ability to form a better connection structure by adding or reducing connecting accessories according to specific implementation conditions. For example, fixed connections / fixed installations can use screw connections, bolt connections, pin connections, key connections, adhesive connections, mortise and tenon connections, welding, riveting, etc., as needed. For detachable connections, screw connections, bolt connections, threaded connections, snap-fit ​​connections, mortise and tenon connections, Velcro connections, etc., can be used as needed. The various technical features in this utility model can be combined interactively without contradicting each other.

[0024] Please see Figure 1 A preferred embodiment of this utility model provides a current testing probe, including a first fixing block 1, a second fixing block 2, a spring 3, a current testing component 4, and an adapter cable 5. The two ends of the spring 3 are respectively connected to the first fixing block 1 and the second fixing block 2. The extension and bending of the spring 3 can increase or decrease the distance between the first fixing block 1 and the second fixing block 2. The current testing component 4 is disposed on the second fixing block 2 and is used to contact the object under test for testing. The adapter cable 5 is used to connect the current testing component 4 and the test platform to transmit the measured current to the test platform.

[0025] Specifically, the current testing assembly 4 includes a probe head 41 and a voltage needle 42. The probe head 41 is fixedly mounted on the second fixing block 2, and the voltage needle 42 is slidably connected to the probe head 41, with their relative sliding direction being the same as the extension and retraction direction of the spring 3. One end of the voltage needle 42 is provided with a spike 421. When the spring 3 is in its natural state, the spike 421 extends towards the side of the probe head 41 away from the first fixing block 1. Since the spike 421 extends towards the side of the probe head 41 away from the first fixing block 1 when the spring 3 is in its natural state, during testing, the end of the voltage needle 42 with the spike 421 can be directly brought into contact with the object under test. The spike 421 is used to pierce the oxide film, ensuring good contact between the probe head 41 and the battery terminal. The spring 3 has an elastic force that moves the first fixing block 1 and the second fixing block 2 away from each other, allowing the probe head 41 to contact the object under test. The probe head 41 is connected to the test bench, which can display the current and voltage data of the object under test. The spring 3 has high reliability and is not prone to fatigue failure. It can ensure close contact between the probe head 41 and the test object, improve measurement accuracy and data consistency, and ensure long-term stable electrical connection. It is especially suitable for testing occasions with long-term continuous operation. The spring 3 is shorter than the spring, which reduces the overall size and is conducive to building a denser test array, improving production efficiency. The spring 3 is easier to install than the spring, which simplifies the assembly process. When the spring 3 is fatigued, it is easy to replace, reducing maintenance costs.

[0026] Please see Figure 4 Furthermore, the second fixing block 2 is provided with a through hole 21. The probe head 41 includes a head 43 and a column 44. One end of the column 44 is connected to the head 43, and the other end passes through the through hole 21. Two nuts 411 are threadedly connected to the column 44. The second fixing block 2 is clamped between the two nuts 411. The assembly and disassembly are carried out by means of threaded connection, which is convenient for equipment maintenance, adjustment or reassembly.

[0027] Please see Figure 1 In this embodiment, an anti-loosening washer 412 is provided between the second fixing block 2 and the nut 411. To reduce costs, only one nut 411 is provided with an anti-loosening washer 412 between it and the second fixing block 2. In other embodiments, anti-loosening washers 412 can also be provided between both nuts 411 and the second fixing block 2. The anti-loosening washer 412 can increase the frictional resistance of the contact surface and counteract the rotation of the nut 411 relative to the column 44 caused by vibration.

[0028] Both ends of the adapter cable 5 are provided with lugs 51. One lug 51 connects to the probe head 41 and is clamped between the head 43 and one of the nuts 411. During assembly, the nut 411 can fix the adapter cable 5 to the probe head 41 for easy subsequent assembly. The other lug 51 is used to connect to the test bench. The lugs 51 enhance the reliability of the connection and increase the contact area between the adapter cable 5, the probe head 41, and the test bench, reducing contact resistance and preventing excessive resistance from causing overheating, thus ensuring the accuracy of the test results.

[0029] Please see Figure 4 The probe head 41 has a first guide groove 413 inside, and a guide tube 414 is provided inside the first guide groove 413. The length direction of the guide tube 414 is the same as the extension and retraction direction of the spring 3. The voltage needle 42 is disposed inside the guide tube 414, and a compression spring 415 is sleeved on the outer wall of the voltage needle 42. One end of the compression spring 415 is connected to the bottom of the first guide groove 413, and the other end is connected to the end of the voltage needle 42 where the spike 421 is provided. The guide tube 414 can guide the movement of the probe head 41 relative to the voltage needle 42. The spring 3 applies a spring force to the probe head 41 towards the spike 421, and the compression spring 415 is compressed. After the spring 3 is released, the probe head 41 retracts, and the spring force of the compression spring 415 can push the voltage needle 42 out for the next use.

[0030] Please see Figure 3 The voltage pin 42 includes a fixing tube 422, a snap-fit ​​post 423, and a connecting part 424. The fixing tube 422 is slidably connected to the guide tube 414. One end of the snap-fit ​​post 423 is fixed inside the fixing tube 422, and the other end is connected to the connecting part 424. Specifically, one end of the fixing tube 422 is provided with a snap-fit ​​groove 425, and the snap-fit ​​post 423 is interference-fitted into the snap-fit ​​groove 425. The interference fit can provide a high-strength connection, eliminating the need for accessories such as keys and screws, reducing manufacturing costs and assembly complexity.

[0031] Please see Figure 3-4A limiting groove 416 is provided on the side of the probe head 41 facing the spike 421. The limiting groove 416 is connected to the first guide groove 413 in a stepped shape. The connecting part 424 is located in the limiting groove 416 and abuts against one end of the compression spring 415. The cross-sectional area of ​​the connecting part 424 is larger than the cross-sectional area of ​​the first guide groove 413. The limiting groove 416 is used to limit the descent height of the probe head 41. In this embodiment, a limiting block 417 is provided in the limiting groove 416. A second guide groove 418 is provided on the side of the limiting block 417 facing the spike 421. A connecting hole 419 is provided at the bottom of the second guide groove 418. The connecting hole 419 connects the first guide groove 413 and the second guide groove 418. The fixing tube 422 passes through the connecting hole 419 and is slidably connected to the inner wall of the connecting hole 419. The connecting part 424 is located in the second guide groove 418, and the cross-sectional area of ​​the connecting part 424 is larger than the cross-sectional area of ​​the connecting hole 419. The setting of the limiting block 417 avoids direct friction between the connecting part 424 and the limiting groove 416, so as to extend the service life of the voltage needle 42. When the connecting part 424 abuts against the bottom of the second guide groove 418, the probe head 41 descends to the limit position.

[0032] Please see Figure 1 In this embodiment, two spring pieces 3 are provided, arranged opposite each other. The symmetrical arrangement of the spring pieces 3 on both sides can evenly distribute the load, avoiding localized stress concentration caused by excessive force on one side, and improving the overall structural stability and lifespan. Both spring pieces 3 are V-shaped; in the compressed state, the two arms of the V-shaped spring piece 3 can completely fit together, further reducing the occupied height space. In other embodiments, both spring pieces 3 can also be set as arc-shaped. The arc-shaped spring piece 3 has a smaller initial elastic force, providing a gentler elastic force.

[0033] Please see Figure 2 The voltage needle 42 is provided with a number of spikes 421, which are connected in a serrated shape. The serrated structure can form multiple contact points at the same time during crimping, and the multiple contact points can ensure good contact and more stable current during testing.

[0034] The above is a detailed description of the preferred embodiments of the present utility model. However, the present utility model is not limited to the described embodiments. Those skilled in the art can make various equivalent modifications or substitutions without departing from the spirit of the present utility model. All such equivalent modifications or substitutions are included within the scope defined by the claims of this application.

Claims

1. A current testing probe, characterized in that: The device includes a first fixing block, a second fixing block, a spring, an adapter cable, and a current testing assembly. The two ends of the spring are connected to the first fixing block and the second fixing block, respectively. The current testing assembly includes a voltage needle and a probe head connected to the adapter cable. The probe head is fixedly mounted on the second fixing block. The voltage needle and the probe head are slidably connected, and the relative sliding direction of the two is the same as the extension and bending direction of the spring. One end of the voltage needle is provided with a spike. When the spring is in its natural state, the spike extends towards the side of the probe head away from the first fixing block.

2. The current testing probe according to claim 1, characterized in that: The second fixing block is provided with a through hole. The probe head includes a head and a column. One end of the column is connected to the head, and the other end passes through the through hole. Two nuts are threadedly connected to the column, and the second fixing block is clamped between the two nuts.

3. The current testing probe according to claim 2, characterized in that: An anti-loosening washer is provided between the second fixing block and the nut.

4. The current testing probe according to claim 1, characterized in that: The probe head has a first guide groove inside, and a guide tube is provided inside the first guide groove. The length direction of the guide tube is the same as the extension and retraction direction of the spring. The voltage needle is disposed inside the guide tube, and a compression spring is sleeved on the outer wall of the voltage needle. One end of the compression spring is connected to the bottom of the first guide groove, and the other end is connected to the end of the voltage needle with a spike.

5. The current testing probe according to claim 4, characterized in that: The voltage needle includes a fixing tube, a snap-fit ​​post, and a connecting part. The fixing tube is slidably connected inside the guide tube. One end of the snap-fit ​​post is fixed inside the fixing tube, and the other end is connected to the connecting part. The probe head is provided with a limiting groove on the side facing the spike. The limiting groove is connected to the first guide groove in a stepped shape. The connecting part is located in the limiting groove and abuts against one end of the compression spring. The cross-sectional area of ​​the connecting part is larger than the cross-sectional area of ​​the first guide groove.

6. The current testing probe according to claim 5, characterized in that: A limiting block is provided in the limiting groove, and a second guide groove is provided on the side of the limiting block facing the spike. A connecting hole is provided at the bottom of the second guide groove, and the connecting hole connects the first guide groove and the second guide groove. The fixing tube passes through the connecting hole and is slidably connected to the inner wall of the connecting hole. The connecting part is located in the second guide groove, and the cross-sectional area of ​​the connecting part is larger than the cross-sectional area of ​​the connecting hole.

7. The current testing probe according to claim 5, characterized in that: One end of the fixed tube is provided with a snap-fit ​​groove, and the snap-fit ​​post is interference-fitted into the snap-fit ​​groove.

8. The current testing probe according to claim 1, characterized in that: Both ends of the adapter cable are provided with lugs, one of which is connected to the probe head.

9. The current testing probe according to claim 1, characterized in that: There are two spring clips, which are arranged opposite to each other.

10. The current testing probe according to claim 1, characterized in that: The voltage needle is provided with a number of spikes, and the number of spikes are connected in a serrated shape.

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