Unlock instant, AI-driven research and patent intelligence for your innovation.

Antenna Near-Field Probe Station Scanner

a scanner and near-field technology, applied in the field of scanners, can solve the problems of adversely affecting the characterization, time-consuming and expensive procedures, and conventionally tested results that do not always produce the true radiation pattern of the antenna, so as to achieve the effect of boosting signal strength and gaining amplification factor

Inactive Publication Date: 2011-02-10
ZAMAN AFROZ J +5
View PDF2 Cites 8 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Conventionally the antennas must be separated using a procedure that is very time consuming and expensive.
The antenna must be isolated from the fixture, or the fixture will adversely effect the characterization.
Accordingly, the conventionally tested results do not always produce the true radiation pattern of the antenna.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Antenna Near-Field Probe Station Scanner
  • Antenna Near-Field Probe Station Scanner
  • Antenna Near-Field Probe Station Scanner

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0031]The present invention relates to antenna metrology hardware for non-destructive characterization of miniaturized passive or active antennas fabricated on substrates (e.g., Gallium Arsenide (GaAs), Silicon (Si), Lanthanum Aluminate (LaAlO3, etc.) which are difficult to measure in traditional ranges because of their smaller size, fragility, and non-trivial DC biasing or complicated fixturing requirements. For the purposes of the present invention, miniaturized antennas are those having a dimension of about 1 cm or less, down to 1 mm or even smaller. Stated differently, these small antennas have a cross sectional size of about ⅕ to about ½ lambda, whereas large antennas have a size greater than ½ lambda. The scanner consists of a precision mechanical slide system, software analysis features, a probe station, and an automatic network analyzer. The turn-key antenna near-field data acquisition system in this scanner is extremely fast, automated, and user friendly. It only requires u...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

A miniaturized antenna system is characterized non-destructively through the use of a scanner that measures its near-field radiated power performance. When taking measurements, the scanner can be moved linearly along the x, y and z axis, as well as rotationally relative to the antenna. The data obtained from the characterization are processed to determine the far-field properties of the system and to optimize the system. Each antenna is excited using a probe station system while a scanning probe scans the space above the antenna to measure the near field signals. Upon completion of the scan, the near-field patterns are transformed into far-field patterns. Along with taking data, this system also allows for extensive graphing and analysis of both the near-field and far-field data. The details of the probe station as well as the procedures for setting up a test, conducting a test, and analyzing the resulting data are also described.

Description

CROSS-REFERENCE TO RELATED APPLICATIONS[0001]This application is a divisional of U.S. patent application Ser. No. 11 / 499,982, filed Aug. 2, 2006, the entire disclosure of which is hereby incorporated by reference herein.STATEMENT OF GOVERNMENT INTEREST[0002]The invention described herein was made by civil servant employees of the United States Government, and a non-civil servant employee working under a NASA contract, and is subject to the provisions of Section 305 of the National Aeronautics and Space Act of 1958, Public Law 85-568 (72 Stat. 435; 42 U.S.C. 2457).FIELD OF THE INVENTION[0003]The present invention relates generally to a scanner device for the measurement of miniaturized antennas using near-field signals. More particularly, it relates to a probe station scanner for measuring near-field radiated power performance of a miniaturized antenna, and for transforming the measurements into far-field characteristics.RELATED ART[0004]Before an antenna can be used for a particular...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(United States)
IPC IPC(8): G06T17/00
CPCH01Q3/08G01R29/105
Inventor ZAMAN, AFROZ J.LEE, RICHARD Q.DARBY, WILLIAM G.BARR, PHILIP J.LAMBERT, KEVIN M.MIRANDA, FELIX A.
Owner ZAMAN AFROZ J