Specimen analyzer and specimen analysis method

a specimen analyzer and specimen technology, applied in the direction of material analysis, instruments, etc., can solve problems such as failure to evaluate outpu

Inactive Publication Date: 2022-05-19
SYSMEX CORP
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Benefits of technology

Enables users without expertise to reliably evaluate analysis results by ensuring attribute information is inputted, providing complete and valid analysis outputs with reference values for validation, thus improving user confidence and diagnostic accuracy.

Problems solved by technology

If the attribute information of the subject is not inputted, however, the analysis apparatus in Japanese Patent Application Publication No. 2001-124781 may output only analysis results and fail to output evaluation results because the analysis apparatus does not evaluate the analysis results.

Method used

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  • Specimen analyzer and specimen analysis method
  • Specimen analyzer and specimen analysis method
  • Specimen analyzer and specimen analysis method

Examples

Experimental program
Comparison scheme
Effect test

embodiment

[0336](Modified Example of Printing Embodiment)

[0337]The example of FIG. 50 and the example of FIG. 56 illustrate examples of substituting numerical information 102a falling within second determination ranges 360 for substitute indication 313 and printing the symbol. However, the configuration may be such that numerical information 102a falling within second determination ranges 360 is not displayed, for example. The example of FIG. 57 illustrates an example where numerical information 102a falling within second determination ranges 360 is not displayed when both erroneously low values and an erroneously high value are set as second determination ranges 360. In FIG. 57, from the content to be printed, controller 140 excludes numerical information 102a falling within second determination ranges 360 together with the item names of the analysis items. Thus, information 316 indicating that the numerical information falls within second determination ranges 360 is not printed either. For ...

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PUM

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Abstract

The specimen analyzer includes: an input unit which receives an input of subject attribute information; an analysis unit which performs measurement of a specimen collected from a subject, and which performs analysis of the specimen based on a measurement result and the subject attribute information received by the input unit; and a controller which causes the analysis unit to be incapable of analyzing the specimen unless the input of the subject attribute information is performed with the input uni.

Description

BACKGROUNDField of Invention[0001]The invention relates to a specimen analyzer and a specimen analysis method.Technical Background[0002]An analysis apparatus intended to be used by a user with insufficient expertise and test skills is desirably configured not only to be operated simply while preventing mistakes and the like, but also to provide analysis results not requiring expertise and judgment based on the expertise. Also, it is known that a normal value range differs depending on a subject attribute, and that the analysis results are evaluated by use of normal value range information corresponding to the attribute.[0003]Japanese Patent Application Publication No. 2001-124781 discloses an analysis apparatus which analyzes specimens with normal value ranges different depending on attribute information of subjects. This analysis apparatus is configured such that when attribute information of a subject is inputted and then a specimen is measured, the analysis apparatus refers to a ...

Claims

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Application Information

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Patent Type & AuthorityApplications(United States)
IPC IPC(8): G01N35/00
CPCG01N35/00623G01N2035/00653G01N2035/00891G01N35/00722
InventorTAKEMOTO, SEIJIKOMOTO, TAKESHIHIRAYAMA, HIDEKIYOSHIDA, TAKASHIAUSDENMOORE, JAMES
OwnerSYSMEX CORP