Transverse dislocated absorption grating-based X ray grating differential phase contrast imaging method and device
An absorption grating and lateral dislocation technology, which is applied in the field of X-ray imaging, can solve the problems of low stability, low efficiency, and the X-ray grating differential phase contrast imaging method and device that have not yet been discovered.
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- Publication Date
- 2017-09-08
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Abstract
Description
technical field
[0001] The invention relates to the technical field of X-ray imaging, in particular to an X-ray grating differential phase contrast imaging method and device based on a laterally dislocated absorption grating. Background technique
[0002] In the X-ray imaging system, the X-ray source emits X-rays and illuminates a certain area of the object to be detected. The detector placed opposite the X-ray source converts the X-ray signal attenuated by the object into a digital signal and sends it to the computer, thus forming The transillumination intensity image of an object can non-destructively characterize the medium density, composition, and structural morphology of the object in this area.
[0003] Traditional X-ray imaging can only obtain absorption contrast imaging of objects, and it is difficult to obtain high-contrast images of low atomic number material structure samples. In recent years, phase-contrast imaging techniques have been proposed to improve the...
Examples
Embodiment Construction
[0076] The present invention will be further described below in conjunction with the accompanying drawings and specific embodiments.
[0077] figure 1 The flow chart of the X-ray grating differential phase contrast imaging method based on the laterally dislocated absorption grating provided by the embodiment of the present invention; To solve the problems of large dose and low imaging efficiency, an X-ray grating differential phase contrast imaging method based on laterally dislocated absorption grating is provided. The specific steps of this method are as follows:
[0078] Step S101, placing each device according to the requirements of Talbot-Lau imaging optical path parameters.
[0079] The optical path parameters of the Talbot-Lau imaging structure should satisfy the following formulas (1)-(4):
[0080]
[0081] kg 1 = 2g 2 , (2)
[0082] g 0 =g 2 L / d, (3)
[0083] s2 · L / 2d, (4)
[0084] Among them, d represents the distance between the phase grating G1 and the...