A stress detection probe fixture

By designing a stress detection probe fixture including a mounting base, a fixed base and a sliding bracket, the problems of complex operation and high cost in the prior art are solved, and high-precision stress detection on the surfaces of various shapes of materials is achieved, which is easy to use and Low production cost.

CN110207869BActive Publication Date: 2024-12-13HANGZHOU JIANWEI TECH CO LTD
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Patent Information

Application Number
CN201910410060.3
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2019-05-17
Publication Date
2024-12-13
Estimated Expiration
2039-05-17

AI Technical Summary

Technical Problem

The existing stress detection methods are complex in operation, high in cost and cannot be applied to material surfaces of multiple shapes, and the measurement effect is poor.

Method used

A stress detection probe fixture including a mount, a fixed base and a sliding bracket is designed to achieve full contact between the probe and the object to be measured through the tensile state of the tension spring, and to improve measurement accuracy and flexibility using the magnetic base and linear guides.

Benefits of technology

It realizes high-precision stress detection on the surfaces of materials of various shapes, which is easy to use, simple structure, low production cost and high detection accuracy.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention provides a stress detection probe fixture, which belongs to the technical field of ultrasonic stress meters. It solves the problems of complex operation and high production cost of the detection tool when the existing stress meter measures the material to be tested. The surgical curtain used for ultrasonic detection includes a mounting seat, a fixed base and a sliding bracket. The mounting seat is fixedly connected to the fixed base, and the mounting seat is slidably connected to the sliding bracket. The mounting seat can reciprocate along the length direction of the sliding bracket. The sliding bracket is provided with a probe and a tension spring. The two ends of the tension spring are respectively connected to the sliding bracket and the mounting seat. When the tension spring is in a free state, the bottom surface of the probe exceeds the bottom surface of the fixed base. The fixed base is used to fix the stress detection probe fixture on the surface of the material. The present invention has the advantages of easy use, simple structure, low difficulty in processing and assembly, low production cost and high detection accuracy.
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Description

Technical Field

[0001] The invention belongs to the technical field of ultrasonic stress meters, and in particular relates to a stress detection probe fixture. Background Art

[0002] When a material cannot be displaced under the action of an external force, its geometric shape and size will change. This deformation is called strain. When a material is deformed, an equal but opposite reaction force is generated inside the material to resist the external force. This reaction force per unit area is defined as stress. When an object is deformed due to external factors, an internal force that interacts between the parts of the object is generated to resist the action of the external factor and try to restore the object from the position after deformation to the position before deformation.

[0003] The stress measurement method based on ultrasonic acoustic elasticity theory utilizes the principle of acoustic birefringence in stressed materials. There is an inherent relationship between ultrasonic velocity and stress in the measured object, and this relationship has good linearity at the same temperature. The current stress detection methods are: blind hole method, X-ray method, magnetic measurement method and ultrasonic method. Among them, the blind hole method requires drilling and pasting strain gauges before measurement. Pasting must meet certain process requirements, causing damage to the components and cumbersome operation. The X-ray method is non-destructive, accurate and reliable, but can only measure micron-level thickness. The operation needs to pay attention to ionizing radiation, high cost, and low measurement efficiency. The magnetic measurement method is simple to operate, fast to measure, and low in accuracy. The ultrasonic method has high measurement efficiency and is non-destructive, convenient and safe to operate. With the development of modern hardware chips, the accuracy and resolution have been greatly improved. However, the existing stress meter measurement detection tools are complicated to operate and have high production costs, and cannot be applied to material surfaces of various shapes, and the measurement effect is not good. Summary of the invention

[0004] The purpose of the present invention is to provide a stress detection probe fixture which is easy to use and can be applied to material surfaces of various shapes in order to solve the above problems existing in the prior art.

[0005] The objective of the present invention can be achieved through the following technical solutions: a stress detection probe fixture, characterized in that it includes a mounting seat, a fixed base and a sliding bracket, the mounting seat is fixedly connected to the fixed base, the mounting seat is slidably connected to the sliding bracket, the mounting seat can reciprocate along the length direction of the sliding bracket, the sliding bracket is provided with a probe and a tension spring, the two ends of the tension spring are respectively connected to the sliding bracket and the mounting seat, when the tension spring is in a free state, the bottom surface of the probe exceeds the bottom surface of the fixed base, and the fixed base is used to fix the stress detection probe fixture on the surface of the material to be measured.

[0006] The working principle of the present invention is as follows: when performing stress detection, the device is fixed to the surface of the object to be measured, and the device is completely fixed to the surface of the object to be measured by a fixed base. Since the probe protrudes relative to the fixed base, the probe is pushed by the surface of the object and pushed along the length direction. Due to the tension, the tension spring is subjected to tension and changes from a natural state to a stretched state. The probe abuts against the surface of the object to be measured and is in full contact with the object to be measured. The probe works to measure data, and after use, the tension spring can return the fixed base to its initial position. The above-mentioned structure can effectively detect and analyze stress on materials, is easy to use, has a simple structure, and has low production costs.

[0007] In the above-mentioned stress detection probe fixture, a fixed base is installed at both ends of the mounting seat.

[0008] In the above-mentioned stress detection probe fixture, a spring pull plate is further provided at the top of the sliding bracket, and two ends of the spring pull plate are respectively fixedly connected with a tension spring.

[0009] In the above-mentioned stress detection probe fixture, the fixed base is a magnetic base, and a button switch is provided on the magnetic base. The magnetic on and off of the magnetic base can be controlled by toggling the button switch.

[0010] In the above-mentioned stress detection probe fixture, the sliding bracket is a linear guide rail, including a slider and a straight rail. The slider is fixed to the mounting seat by a connecting piece. A probe mounting seat is also provided at the bottom of the linear guide rail. The probe mounting seat is used to install the probe. The straight rail is respectively fixed to the probe mounting seat and the spring pull plate by connecting pieces.

[0011] In the above-mentioned stress detection probe fixture, the mounting seat is further provided with a cable clamp, and the cable clamp is provided with a wiring groove, and the wiring groove is used for wiring and fixing of the probe's wiring harness.

[0012] In the above-mentioned stress detection probe fixture, the magnetic base is provided with a groove and two inclined surfaces, and the groove is located in the middle of the inclined surfaces.

[0013] In the above-mentioned stress detection probe fixture, the probe and the groove are on the same straight line.

[0014] In the above-mentioned stress detection probe fixture, limiting grooves are also provided at both ends of the mounting seat, and the limiting grooves are used to position and fix the base.

[0015] In the above-mentioned stress detection probe fixture, a mounting groove is provided on the probe mounting seat, and the mounting groove is used to position and install the probe, and the probe is fixedly connected to the probe mounting seat through a connecting piece.

[0016] The advantages of the present invention are as follows: the present invention can effectively perform stress detection and analysis on the material to be tested, is easy to use, has a simple structure, uses a large number of connectors for fixing, has low difficulty in processing and assembly, has low production cost, and has high detection accuracy. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 is an isometric schematic diagram of the present invention;

[0018] Figure 2 It is a front view of the present invention;

[0019] Figure 3 It is a right side view of the present invention;

[0020] In the figure, 1. mounting base; 2. fixed base; 3. sliding bracket; 4. probe mounting base; 5. probe; 6. spring pull plate; 7. tension spring; 8. push button switch; 9. slider; 10. straight rail; 11. cable clamp; 12. wiring trough; 13. groove; 14. inclined surface; 15. limit groove; 16. mounting groove. DETAILED DESCRIPTION

[0021] The following are specific embodiments of the present invention and the accompanying drawings to further describe the technical solution of the present invention, but the present invention is not limited to these embodiments.

[0022] like Figure 1-3 As shown, the stress detection probe fixture includes a mounting seat 1, a fixed base 2 and a sliding bracket 3. The mounting seat 1 is fixedly connected to the fixed base 2, and the mounting seat 1 is slidably connected to the sliding bracket 3. The mounting seat 1 can reciprocate along the length direction of the sliding bracket 3. The sliding bracket 3 is provided with a probe 5 and a tension spring 7. The two ends of the tension spring 7 are respectively connected to the sliding bracket 3 and the mounting seat 1. When the tension spring 7 is in a free state, the bottom surface of the probe 5 exceeds the bottom surface of the fixed base 2. The fixed base 2 is used to fix the stress detection probe fixture on the surface of the material to be measured.

[0023] To further elaborate, in order to make the device more stable and balanced, with better fixing effect and higher detection accuracy, a fixed base 2 is installed at both ends of the mounting seat 1.

[0024] To further elaborate, in order to make the device more stable and balanced and to achieve higher detection accuracy, a spring pull plate 6 is provided at the top of the sliding bracket 3. The spring pull plate 6 is T-shaped and has a tension spring 7 fixedly connected at both ends.

[0025] To elaborate further, in order to facilitate the measurement of magnetically conductive materials, the fixed base 2 is a magnetic base, and a button switch 8 is provided on the magnetic base. By turning the button switch 8, the magnetic opening and closing of the magnetic base can be controlled. Inside the magnetic base is a cylinder, in the middle of which a strip of permanent magnet or a constant magnet is placed, and outside the base is a piece of soft magnetic material. By turning the handle, the magnet inside can be turned. When the two poles of the magnet are in the up and down direction, that is, when the N or S pole of the magnet is facing the soft magnetic material base, it is magnetized. It has strong magnetism in this direction, so it can be used to absorb the steel surface. When the two poles of the magnet are in the horizontal direction, the middle of NS will not be magnetized when facing the soft magnetic material base, so there is almost no magnetic force on the base at this time, and it can be easily removed from the surface of the magnetic conductive material.

[0026] In further detail, the sliding bracket 3 is a linear guide rail, including a slider 9 and a straight rail 10. The slider 9 is fixed to the mounting seat 1 by a connector. A probe mounting seat 4 is also provided at the bottom of the linear guide rail. The probe mounting seat 4 is used to mount the probe 5. The straight rail 10 is respectively fixed to the probe mounting seat 4 and the spring pull plate 6 by a connector. The above-mentioned structure is set up to take advantage of the high precision of the linear guide rail, and the installation is simple and the parts cost is low.

[0027] To elaborate further, in order to facilitate wiring and prevent the wires from affecting the overall appearance, the mounting base 1 is also provided with a cable clamp 11 , on which a wiring groove 12 is clamped. The wiring groove 12 is used for wiring and fixing the wiring harness of the probe 5 .

[0028] In further detail, the magnetic base is provided with a groove 13 and two inclined surfaces 14, and the groove 13 is located in the middle of the inclined surfaces 14. With the above-mentioned structure, stress analysis can be performed on magnetic conductive materials with various shapes of surfaces.

[0029] To further elaborate, in order to ensure accuracy, the probe 5 and the groove 13 are on the same straight line.

[0030] In further detail, both ends of the mounting base 1 are provided with limiting grooves 15, which are used to position the fixing base 2. With the above-mentioned structure, the fixing base 2 is more convenient to install and more firmly fixed.

[0031] To further elaborate, in order to more conveniently fix and install the probe 5 , a mounting groove 16 is provided on the probe mounting base 4 , and the mounting groove 16 is used to position and install the probe 5 . The probe 5 is fixedly connected to the probe mounting base 4 via a connector.

[0032] When performing stress detection, the device is placed horizontally on the surface of the object to be measured, and the device is pressed against the surface of the object to be measured through the fixed base 2. Since the probe 5 protrudes relative to the fixed base 2, the probe 5 is in full contact with the object to be measured at this time. Due to the tension, the tension spring 7 is subjected to tension and changes from a natural state to a stretched state. At this time, the probe 5 is subjected to the elastic force and remains in close contact with the object to be measured. The probe 5 works to measure data. After use, the tension spring 7 can return the fixed base 2 to its initial position.

[0033] The specific embodiments described herein are merely examples of the spirit of the present invention. Those skilled in the art may make various modifications or additions to the specific embodiments described or replace them in similar ways, but they will not deviate from the spirit of the present invention or exceed the scope defined by the appended claims.

[0034] Although this article uses more terms such as mounting base 1, fixed base 2, sliding bracket 3, probe mounting base 4, probe 5, spring pull plate 6, tension spring 7, button switch 8, slider 9, straight rail 10, cable clamp 11, wiring groove 12, groove 13, inclined surface 14, limit groove 15, mounting groove 16, etc., it does not exclude the possibility of using other terms. These terms are used only to more conveniently describe and explain the essence of the present invention; interpreting them as any additional restrictions is contrary to the spirit of the present invention.

Claims

1. A stress detection probe fixture, characterized in that: The invention comprises a mounting seat (1), a fixed base (2) and a sliding bracket (3), wherein the mounting seat (1) is fixedly connected to the fixed base (2), a fixed base (2) is installed at both ends of the mounting seat (1), the mounting seat (1) is slidably connected to the sliding bracket (3), the sliding bracket (3) is a linear guide rail, comprising a slider (9) and a straight rail (10), the slider (9) and the mounting seat (1) are fixed by a connecting piece, a probe mounting seat (4) is also provided at the bottom of the linear guide rail, the probe mounting seat (4) is used to install a probe (5), a spring pull plate (6) is also provided at the top of the sliding bracket (3), a tension spring (7) is respectively fixedly connected to the two ends of the spring pull plate (6), the straight rail (10) is respectively fixed to the probe mounting seat (4) and the spring pull plate (6) by a connecting piece, the mounting seat (1) can make reciprocating motion along the length direction of the sliding bracket (3), the sliding bracket (3) is provided with a probe (5) and a pull plate (7), and the two ends of the spring pull plate (6) are respectively fixed to the probe mounting seat (4) and the spring pull plate (6) by a connecting piece. The tension spring (7) has two ends connected to the sliding bracket (3) and the mounting seat (1) respectively. When the tension spring (7) is in a free state, the bottom surface of the probe (5) exceeds the bottom surface of the fixed base (2). The fixed base (2) is used to fix the stress meter probe fixture on the surface of the material to be measured. The fixed base (2) is a magnetic base. A button switch (8) is provided on the magnetic base. The magnetic opening and closing of the magnetic base can be controlled by toggling the button switch (8). The fixed base (2) presses the device against the surface of the object to be measured. Since the probe (5) protrudes relative to the fixed base (2), the probe (5) is in full contact with the object to be measured. Due to the tensile force, the tension spring (7) is subjected to the tensile force and changes from the natural state to the stretched state. At this time, the probe (5) is subjected to the elastic force to maintain a state of close contact with the object to be measured. The probe (5) works to measure data. After use, the tension spring (7) can return the fixed base (2) to its initial position.

2. A stress detection probe fixture according to claim 1, characterized in that: The mounting base (1) is further provided with a cable clamp (11), and a wiring groove (12) is clamped on the cable clamp (11), and the wiring groove (12) is used for wiring and fixing the wiring harness of the probe (5).

3. A stress detection probe fixture according to claim 1, characterized in that: The fixed base (2) is provided with a groove (13) and two inclined surfaces (14), and the groove (13) is located in the middle of the inclined surfaces (14).

4. A stress detection probe fixture according to claim 3, characterized in that: The probe (5) and the groove (13) are on the same straight line.

5. The stress detection probe fixture according to claim 1, characterized in that: Limiting grooves (15) are also provided at both ends of the mounting seat (1), and the limiting grooves (15) are used to position and fix the base (2).

6. A stress detection probe fixture according to claim 1, characterized in that: The probe mounting seat (4) is provided with a mounting groove (16), and the mounting groove (16) is used for positioning and mounting the probe (5). The probe (5) is fixedly connected to the probe mounting seat (4) via a connecting piece.