A test device for fuse type lightning arrester group

Abstract

A fuse type lightning arrester group test device can be used to verify the reliability of multi-column parallel lightning arresters and reduce the failure rate of lightning arresters. It includes a current source is, an inductor L, an insulated gate bipolar transistor IGBT, a capacitor C, a fuse FU, a switch K1, and a multi-column parallel lightning arrester; the current source is and the inductor L are connected in series and then connected in parallel at both ends of the insulated gate bipolar transistor IGBT; the capacitor C is connected in parallel at both ends of the insulated gate bipolar transistor IGBT; the fuse FU and the switch K1 are connected in series and then connected in parallel at both ends of the capacitor C; the multi-column parallel lightning arrester is connected in parallel at both ends of the capacitor C. The test device provided by the present invention has the advantages of simple structure, safety and reliability. By simulating a breakdown fault of a single-column lightning arrester, it is verified that when a breakdown fault occurs in a single-column lightning arrester when the multi-column parallel lightning arrester is in action load, the fault can be automatically and quickly isolated, and the remaining lightning arrester group can still ensure the stable operation of the system.

Description

Technical Field

[0001] The invention relates to the technical field of lightning arrester testing, and in particular to a testing device for a fuse type lightning arrester group. Background Art

[0002] With the updating and development of technology, the voltage level of DC transmission in my country has gradually increased. At present, many ±1100kV UHV DC projects have been started and put into operation. The higher the voltage level, the greater the transmission power, and the neutral busbar arrester, metal transfer switch arrester and other arresters with multi-column parallel structure need to absorb more energy. In order to ensure the insulation coordination with the system and maintain a sufficiently low residual pressure, the arrester group needs to use more parallel branches for shunting. If the characteristics of a column arrester in the entire group are reduced due to damp insulation or valve plate deterioration, the column shunting will increase sharply under high energy impact. The accumulated energy in the process of voltage limiting energy absorption exceeds its own heat capacity, which will cause the column to break down and explode, and the entire group of arresters will fail. The forced shutdown of the system will not only affect the operation of the system, but also cause a lot of economic losses to the power grid, power plants and users.

[0003] At present, the research on lightning arresters at home and abroad mainly focuses on optimizing the parameter configuration of lightning arresters by studying the insulation coordination between lightning arresters and systems; studying the material properties of zinc oxide resistors to improve the overall performance of lightning arresters; and studying the potential distribution, current unevenness coefficient and resistor grouping method of multi-column parallel lightning arrester groups to improve the reliability of lightning arresters. However, lightning arrester failures in DC converter stations still occur frequently. Summary of the invention

[0004] The invention provides a fuse type lightning arrester group test device, which can be used to verify the reliability of multi-column parallel lightning arresters and reduce the failure rate of the lightning arresters.

[0005] To achieve the above object, the present invention adopts the following technical solutions:

[0006] A fuse type lightning arrester group test device, comprising a current source is, an inductor L, an insulated gate bipolar transistor IGBT, a capacitor C, a fuse FU, a switch K1, and a multi-column parallel lightning arrester;

[0007] The current source is and the inductor L are connected in series and then connected in parallel at both ends of the insulated gate bipolar transistor IGBT; the capacitor C is connected in parallel at both ends of the insulated gate bipolar transistor IGBT;

[0008] The fuse FU and the switch K1 are connected in series and then connected in parallel to the two ends of the capacitor C;

[0009] The multi-column parallel arrester is connected in parallel at both ends of the capacitor C.

[0010] It can be seen from the above technical scheme that a fuse-type lightning arrester group test device of the present invention can perform a 1:1 true-type test on the multi-column parallel lightning arrester according to the on-site working conditions of the multi-column parallel lightning arrester. By simulating a breakdown failure of a single-column lightning arrester, it is verified that when a breakdown failure occurs in a single-column lightning arrester when the multi-column parallel lightning arrester is under load, the fault can be automatically and quickly isolated, and the remaining lightning arrester groups can still ensure stable operation of the system.

[0011] The test device provided by the present invention has the advantages of simple structure, safety and reliability. By simulating the breakdown failure of a single-pole lightning arrester, it is verified that when a single-pole lightning arrester of a multi-pole parallel lightning arrester breaks down during load operation, the fault can be automatically and quickly isolated, and the remaining lightning arrester groups can still ensure stable operation of the system. BRIEF DESCRIPTION OF THE DRAWINGS

[0012] Figure 1 It is the electrical schematic diagram of the present invention. DETAILED DESCRIPTION

[0013] In order to make the purpose, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments.

[0014] like Figure 1 As shown, the fuse-type lightning arrester group test device described in this embodiment includes a current source is, an inductor L, an insulated gate bipolar transistor IGBT, a capacitor C, a fuse FU, a switch K1, and a multi-column parallel lightning arrester; the current source is and the inductor L are connected in series and then connected in parallel at both ends of the insulated gate bipolar transistor IGBT; the capacitor C is connected in parallel at both ends of the insulated gate bipolar transistor IGBT; the fuse FU and the switch K1 are connected in series and then connected in parallel at both ends of the capacitor C; the multi-column parallel lightning arrester is connected in parallel at both ends of the capacitor C.

[0015] The current source is and the inductor L are connected in series and then connected in parallel to the two ends of the insulated gate bipolar transistor IGBT; the current source is is used to provide the current required for the test; and the insulated gate bipolar transistor IGBT is used to cut off the test current.

[0016] The capacitor C is connected in parallel at both ends of the insulated gate bipolar transistor IGBT; the capacitor C is used to provide a working voltage for the multi-column parallel lightning arrester during the test process.

[0017] The fuse FU and the switch K1 are connected in series and then connected in parallel at both ends of the capacitor C. The fuse FU is used to quickly isolate the fault when the switch K1 simulates a breakdown fault of a single-pole arrester. The switch K1 is used to simulate a breakdown fault of a single-pole arrester.

[0018] The multi-column parallel lightning arrester is connected in parallel at both ends of the capacitor C; the multi-column parallel lightning arrester branch is used to limit the overvoltage at both ends of the capacitor C and absorb the energy stored in the inductor L.

[0019] The working principle of the present invention is as follows:

[0020] Initial state of the test: the insulated gate bipolar transistor IGBT is in the on state, and the switch K1 is in the off state; according to the on-site working conditions of the multi-column parallel lightning arrester, the output parameters of the current source is are adjusted.

[0021] Test process: When the test current output by the current source is reaches its peak value, the insulated gate bipolar transistor IGBT is commanded to disconnect quickly, and the test current charges the capacitor C until the voltage across the capacitor C reaches the operating voltage of the multi-column parallel arrester branch. When the multi-column parallel arrester is detected to be working, the switch K1 is commanded to turn on quickly to simulate a breakdown fault in a single-column arrester. At this time, the current flows through the fuse FU, and the fuse FU blows at the us level to quickly isolate the fault. The energy stored in the inductor L continues to charge the capacitor C until the multi-column parallel arrester branch is reopened, absorbing energy and limiting the voltage across the capacitor C1.

[0022] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A test device for a fuse type lightning arrester group, characterized in that: It includes a current source is, an inductor L, an insulated gate bipolar transistor IGBT, a capacitor C, a fuse FU, a switch K1, and a multi-column parallel lightning arrester; The current source is and the inductor L are connected in series and then connected in parallel at both ends of the insulated gate bipolar transistor IGBT; the capacitor C is connected in parallel at both ends of the insulated gate bipolar transistor IGBT; The current source is is used to provide the current required for the test; the insulated gate bipolar transistor IGBT is used to interrupt the test current; the capacitor C is used to provide the working voltage of the multi-column parallel lightning arrester during the test; The fuse FU and the switch K1 are connected in series and then connected in parallel at both ends of the capacitor C; the multi-column parallel arrester is connected in parallel at both ends of the capacitor C; The fuse FU is used to quickly isolate the fault when the switch K1 simulates a breakdown fault of a single-column arrester; the switch K1 is used to simulate a breakdown fault of a single-column arrester; When the test current output by the current source is reaches its peak value, the insulated gate bipolar transistor IGBT is commanded to disconnect quickly, and the test current charges the capacitor C until the voltage across the capacitor C reaches the operating voltage of the multi-column parallel lightning arrester branch. When the multi-column parallel lightning arrester is detected to be working, the switch K1 is commanded to turn on quickly to simulate a breakdown fault in a single-column lightning arrester. At this time, the current flows through the fuse FU, and the fuse FU blows at the us level to quickly isolate the fault. The energy stored in the inductor L continues to charge the capacitor C until the multi-column parallel lightning arrester branch is reopened, absorbing energy and limiting the voltage across the capacitor C1.

Images