A three-lens scanning microscope device

Abstract

The present invention discloses a three-lens scanning microscope device comprising: first, second, and third sampling systems, a sample stage, and a linear displacement system that controls the three sampling systems to perform synchronous, line-by-line scanning on three orthogonal focal planes. The sample stage is disposed on the linear displacement system. The first sampling system comprises a first digital image processing device and a first optical microscope lens; the second sampling system comprises a second digital image processing device and a second optical microscope lens; and the third sampling system comprises a third digital image processing device and a third optical microscope lens. The present invention enables holistic analysis of meltblown fabric fibers. By using a high-resolution microscopic sampling system to synchronously scan and observe in three dimensions on two mutually orthogonal focal planes, the device solves the problem of observing ultrafine fibers at the submicron scale and meltblown fabric at the centimeter scale over a large span. Furthermore, the device can further analyze the fiber distribution in the meltblown fabric and the unique capillary structure formed by mutual buckling and bonding.

Description

Technical Field

[0001] The present invention belongs to the field of textile machinery, and in particular relates to a three-lens scanning microscope device. Background Art

[0002] Meltblown fabric is the core material for face masks. Made primarily of polypropylene, its fibers can range in diameter from 1 to 5 microns. These microfibers, characterized by numerous voids, a fluffy structure, and excellent wrinkle resistance, possess a unique capillary structure that increases the number of fibers per unit area and their surface area, resulting in excellent filtration, shielding, thermal insulation, and oil absorption properties. They can be used in a variety of applications, including air and liquid filtration, insulation, absorption, face mask materials, thermal insulation, oil absorption, and even as wipes.

[0003] Meltblown fabrics are produced by drawing a fine stream of polymer melt extruded from a die spinneret using a high-speed hot air stream, forming ultrafine fibers that are collected on a screen or roller and then bonded together to form a meltblown nonwoven. The performance of meltblown fabrics depends entirely on the fibers and their distribution. Therefore, analyzing meltblown fabrics requires analyzing the fibers themselves, including their thickness and the three-dimensional structure formed by the intertwining and bonding of the fibers.

[0004] Current fiber analysis instruments are designed to analyze fiber bundles, such as cotton, wool, linen, chemical filament, and silk. Meltblown fabrics are made of fibers that are bonded together and cannot be separated into individual fiber bundles. Therefore, existing fiber analysis instruments are not suitable for analyzing meltblown fabrics.

[0005] Meltblown fabric fibers are ultrafine, with many measuring micrometers and a few submicrometers. Therefore, microscopes with sufficiently high magnification are required for observation. Meltblown fabric fibers are approximately decimeters long, and their intertwined, capillary structures form a unique structure. Analysis of this capillary structure requires a centimeter-scale field of view, necessitating scanning techniques to achieve a wide field of view. This unique capillary structure, formed by the intertwined, intertwined fibers, is three-dimensional, making it difficult to obtain three-dimensional information from single-axis planar observation. Therefore, simultaneous scanning in multiple directions is required to maximize the information available about the fiber structure. Summary of the Invention

[0006] In order to overcome the deficiencies in the prior art, the object of the present invention is to provide a three-lens scanning microscope device that can realize the overall analysis of meltblown fabric fibers.

[0007] In order to achieve the above technical objectives and the above technical effects, the present invention is implemented through the following technical solutions:

[0008] A three-lens scanning microscope device includes a first sampling system, a second sampling system, a third sampling system, a sample stage, and a linear displacement system that controls the first, second, and third sampling systems to perform synchronous line-by-line scanning in pairs on three orthogonal focal planes. The sample stage is arranged on the linear displacement system, and the meltblown fabric sample to be observed is placed on the sample stage and moves accordingly; the first sampling system includes a first digital image processing device and a first optical microscope lens; the second sampling system includes a second digital image processing device and a second optical microscope lens; and the third sampling system includes a third digital image processing device and a third optical microscope lens.

[0009] The linear displacement system includes a plurality of linear slides composed of a drive motor, a ball screw, a linear slide rail, a slide and a dustproof shell.

[0010] Furthermore, the three-lens scanning microscope device also includes a computer control system, the drive motor is connected to the computer control system, the synchronous line-by-line scanning movement of the linear displacement system is controlled by the computer control system, and the first, second, and third digital image processing devices are also connected to the computer control system to process image information, and can output large-scene still images synthesized from multiple frames of images, and can also output dynamic video images of the scanning process.

[0011] Preferably, the first, second and third digital image processing devices may be industrial digital image processing devices or electronic eyepieces, including a CCD / CMOS image sensor, a DSP image information processor, and a computer interface; the computer interface may be a wired interface or a wireless interface.

[0012] Preferably, the sample platform includes a main frame, the sample-carrying surface of the main frame being a light-transmitting plate, and a reflector disposed within the main frame. The light source is crucial for microscope observation. Light emitted by the light source is reflected by the reflector onto the light-transmitting plate, illuminating the bottom of the meltblown fabric sample. Multi-angle illumination from multiple light sources is beneficial for fiber analysis of meltblown fabric samples. Light sources are not limited to ordinary visible light; shorter wavelengths can improve observation resolution.

[0013] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0014] The technical solution of the present invention realizes the overall analysis of meltblown fabric fibers. Through the synchronous line-by-line scanning of two mutually orthogonal focusing planes by the high-resolution microscopic sampling system, it solves the problem of large-span observation of ultrafine fibers at the submicron scale and the meltblown fabric at the centimeter scale. At the same time, it can further analyze the fiber distribution in the meltblown fabric and the special capillary structure formed by mutual bending and bonding.

[0015] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention and to implement it according to the contents of the description, the following preferred embodiments of the present invention are described in detail with reference to the accompanying drawings. The specific implementation methods of the present invention are given in detail by the following embodiments and the accompanying drawings. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0017] Figure 1 Schematic diagram of the structure of the three-lens scanning microscope embodiment 1 of the present invention.

[0018] Figure 2 This is a schematic structural diagram of the second and third linear displacement systems in Example 1.

[0019] Figure 3 This is a schematic structural diagram of the first linear displacement system in Example 1.

[0020] Figure 4 Schematic diagram of the structure of the second embodiment of the three-lens scanning microscope device of the present invention.

[0021] Figure 5 This is a schematic structural diagram of the first linear displacement system in Example 2.

[0022] Figure 6 This is a schematic structural diagram of the fourth linear displacement system in Example 2.

[0023] Figure 7 Schematic diagram of the sample stage in this three-lens scanning microscope device that can receive bottom light source. DETAILED DESCRIPTION

[0024] The present invention will be described in detail below with reference to the accompanying drawings and in combination with embodiments.

[0025] Example 1:

[0026] See also Figure 1As shown, a three-lens scanning microscope device includes: a first sampling system 1, a second sampling system 2, a third sampling system 3, a sample stage 4, and a linear displacement system for controlling the first, second, and third sampling systems 1, 2, and 3 to perform synchronous line-by-line scanning in pairs on three orthogonal focal planes. The sample stage 4 is set on the linear displacement system, and the meltblown fabric sample 13 to be observed is placed on the sample stage 4 and moves accordingly; the first sampling system 1 includes a first digital image processing device 101 and a first optical microscope lens 102; the second sampling system 2 includes a second digital image processing device 201 and a second optical microscope lens 202; and the third sampling system 3 includes a third digital image processing device 301 and a third optical microscope lens 302.

[0027] For further information, see Figure 2 、 Figure 3As shown, the linear displacement system includes a first linear displacement system 5, a second linear displacement system 6 and a third linear displacement system 7; the first linear displacement system 5 is a four-axis linear displacement system, and the four-axis linear displacement system includes a first linear slide 501, a second linear slide 502, a third linear slide 503 and a fourth linear slide 504, and the first, second, third and fourth linear slides 501, 502, 503, 504 are orthogonal to each other; the first sampling system 1 is arranged on the slide of the fourth linear slide 504, and the first optical The optical axis of the microscope head 102 is parallel to the translation line of the fourth linear slide 504. The fourth linear slide 504 is arranged on the slide of the third linear slide 503. The third linear slide 503 is arranged on the slide of the second linear slide 502. The second linear slide 502 is arranged on the slide of the first linear slide 501. The sample stage 4 is fixed to the housing of the second linear slide 502. The optical axis of the first optical microscope head 102 is perpendicular to one side of the sample stage 4. The second linear displacement system 6 is a first two-axis linear displacement system, which includes a fifth linear slide 601 and a sixth linear slide 602, and the fifth and sixth linear slides 601 and 602 are orthogonal; the second sampling system 2 is arranged on the slide of the sixth linear slide 602, the optical axis of the second optical microscope head 202 is parallel to the translation line of the sixth linear slide 602, the sixth linear slide 602 is arranged on the slide of the fifth linear slide 601, and the optical axis of the second optical microscope head 202 is perpendicular to the sample stage 4 the front side; the third linear displacement system 7 is a second two-axis linear displacement system, the second two-axis linear displacement system includes a seventh linear slide 701 and an eighth linear slide 702, the third sampling system 3 is arranged on the slide of the eighth linear slide 702, the optical axis of the third optical microscope head 302 is parallel to the translation line of the eighth linear slide 702, the eighth linear slide 702 is arranged on the slide of the seventh linear slide 701, and the optical axis of the third optical microscope head 302 is perpendicular to the other side of the sample stage 4.

[0028] Furthermore, the first, second, third, fourth, fifth, sixth, seventh and eighth linear slides 501, 502, 503, 504, 601, 602, 701 and 702 are respectively mainly composed of a driving motor, a ball screw, a linear slide rail, a slide and a dustproof shell connected in sequence.

[0029] Furthermore, the three-lens scanning microscope device also includes a computer control system. The drive motor is connected to the computer control system, and the synchronous line-by-line scanning movement of the linear displacement system is controlled by the computer control system. The first, second, and third digital image processing devices 101, 201, and 301 are also connected to the computer control system to process image information. They can output large-scene still images synthesized from multiple frames of images, and can also output dynamic video images of the scanning process.

[0030] Preferably, the first, second and third digital image processing devices 101, 201, 301 are industrial digital image processing devices or electronic eyepieces, including a CCD / CMOS image sensor, a DSP image information processor, and a computer interface; the computer interface is a wired interface or a wireless interface.

[0031] Preferably, see Figure 7 As shown, the sample stage 4 comprises a main frame, the sample-carrying surface 11 of which is a light-transmitting plate 11, and a reflector 12 disposed within the main frame. The light source is crucial for microscope observation. Light emitted by the light source is reflected by the reflector onto the light-transmitting plate 11, illuminating the bottom of the meltblown fabric sample 13. Multi-angle illumination from multiple light sources is beneficial for fiber analysis of meltblown fabric samples. Light sources are not limited to ordinary visible light; shorter wavelengths can improve observation resolution.

[0032] The working principle of this embodiment is as follows:

[0033] The solution of this embodiment constitutes a three-lens scanning system. The optical axes of the lenses of the three sampling systems are orthogonal to each other and are respectively perpendicular to the three surfaces of the sample stage 4. Driven by the eight-axis linear displacement system, the three surfaces can be synchronously scanned line by line. For the two orthogonal planes formed by the second sampling system 2 and the third sampling system 3, synchronous scanning can be achieved by simply translating the sample stage 4, and only one motor movement is required. We call this synchronization method single-motion synchronization. The synchronous scanning between the two orthogonal planes formed between the first sampling system 1 and the second sampling system 2 or between the first sampling system 1 and the third sampling system 3 requires the synchronous action of two motors. From the perspective of synchronization effect, it is obvious that single-motion synchronization is better than dual-motor synchronization.

[0034] Example 2:

[0035] See also Figure 4As shown, a three-lens scanning microscope device includes: a first sampling system 1, a second sampling system 2, a third sampling system 3, a sample stage 4, and a linear displacement system for controlling the first, second, and third sampling systems 1, 2, 3 to perform synchronous line-by-line scanning in pairs on three orthogonal focal planes, wherein the sample stage 4 is arranged on the linear displacement system; the first sampling system 1 includes a first digital image processing device 101 and a first optical microscope lens 102; the second sampling system 2 includes a first digital image processing device 201 and a second optical microscope lens 202; and the third sampling system 3 includes a third digital image processing device 301 and a third optical microscope lens 302.

[0036] For further information, see Figure 5 、 Figure 6 As shown, the linear displacement system includes a first linear displacement system 5, a second linear displacement system 6, a third linear displacement system 7 and a fourth linear displacement system 8; the first, second, third and fourth linear displacement systems 5, 6, 7 and 8 are respectively three-axis linear displacement systems, and the three-axis linear displacement systems are mainly composed of a ninth, tenth and eleventh linear slides 801, 802 and 803 arranged orthogonally in pairs, the eleventh linear slide 803 is arranged on the slide of the tenth linear slide 802, and the tenth linear slide 802 is arranged on the slide of the ninth linear slide 801; the slide of the eleventh linear slide 803 in the fourth linear displacement system 8 The sample stage 4 is arranged on the platform; the first sampling system 1 is arranged on the slide of the eleventh linear slide 803 in the first linear displacement system 5, and the optical axis of the first optical microscope head 102 is perpendicular to one side of the sample stage 4; the second sampling system 2 is arranged on the slide of the eleventh linear slide 803 in the second linear displacement system 6, and the optical axis of the second optical microscope head 202 is perpendicular to the front of the sample stage 4; the third sampling system 3 is arranged on the slide of the eleventh linear slide 803 in the third linear displacement system 7, and the optical axis of the third optical microscope head 302 is perpendicular to the other side of the sample stage 4.

[0037] Furthermore, the ninth, tenth and eleventh linear slides 801, 802 and 803 are respectively mainly composed of a driving motor, a ball screw, a linear slide rail, a slide and a dustproof shell connected in sequence.

[0038] Furthermore, the three-lens scanning microscope device also includes a computer control system. The drive motor is connected to the computer control system, and the synchronous line-by-line scanning movement of the linear displacement system is controlled by the computer control system. The first, second, and third digital image processing devices 101, 201, and 301 are also connected to the computer control system to process image information. They can output large-scene still images synthesized from multiple frames of images, and can also output dynamic video images of the scanning process.

[0039] Preferably, the first, second and third digital image processing devices 101, 201, 301 are industrial digital image processing devices or electronic eyepieces, including a CCD / CMOS image sensor, a DSP image information processor, and a computer interface; the computer interface is a wired interface or a wireless interface.

[0040] Preferably, see Figure 7 As shown, the sample stage 4 comprises a main frame, the sample-carrying surface 11 of which is a light-transmitting plate 11, and a reflector 12 disposed within the main frame. The light source is crucial for microscope observation. Light emitted by the light source is reflected by the reflector onto the light-transmitting plate 11, illuminating the bottom of the meltblown fabric sample 13. Multi-angle illumination from multiple light sources is beneficial for fiber analysis of meltblown fabric samples. Light sources are not limited to ordinary visible light; shorter wavelengths can improve observation resolution.

[0041] Assuming that the image sensors of the first, second, and third digital image processing devices 101, 201, and 301 are 8000*6000 pixels, in order to clearly see the submicron meltblown fibers, 20 pixels are allocated per micron, and the field of view of the image is 400*300 microns, or 0.4*0.3 mm. By two-dimensionally shifting 50*7 frames of images in a line-by-line scanning manner, a large field of view of approximately 20*2.1 mm can be obtained, which is sufficient for analyzing the distribution and structure of the meltblown fibers.

[0042] This is why fiber analysis requires simultaneous displacement scanning of two-dimensional orthogonal planes.

[0043] Since the sample stage 4 is very light, while the optical microscope head is relatively heavy, the heavier the drive load of the linear slide, the higher the cost. Therefore, the implementation cost of the 8-axis displacement system of Example 1 is lower than that of the 12-axis displacement system of Example 2. However, the system of Example 2 can achieve single-motion synchronous progressive scanning of any two orthogonal surfaces, which is superior to Example 1.

[0044] Assuming that the optical microscope lens is a fixed-focus lens, if a zoom optical microscope lens is used, such an 8-axis or 13-axis linear displacement system is still required to achieve two-by-two synchronous line-by-line scanning of three orthogonal planes to obtain the overall analysis information of the ultrafine fibers in a large field of view.

[0045] The foregoing description is merely a preferred embodiment of the present invention and is not intended to limit the present invention. Those skilled in the art will readily appreciate that various modifications and variations of the present invention are possible. Any modifications, equivalent substitutions, or improvements made within the spirit and principles of the present invention are intended to be within the scope of protection of the present invention.

Claims

1. A three-lens scanning microscope device, characterized in that: include: A first sampling system (1), a second sampling system (2), a third sampling system (3), a sample stage (4), and a linear displacement system for controlling the first, second, and third sampling systems (1, 2, 3) to perform synchronous line-by-line scanning on three orthogonal focal planes, wherein the sample stage (4) is arranged on the linear displacement system; the first sampling system, the second sampling system, and the third sampling system are microscopic image acquisition systems, wherein the first sampling system (1) includes a first digital image processing device (101) and a first optical microscope head (102); the second sampling system (2) includes a second digital image processing device ( 201) and a second optical microscope head (202); the third sampling system (3) includes a third digital image processing device (301) and a third optical microscope head (302); the linear displacement system includes a first linear displacement system (5), a second linear displacement system (6), a third linear displacement system (7) and a fourth linear displacement system (8); the first, second, third and fourth linear displacement systems (5, 6, 7, 8) are respectively a three-axis linear displacement system, and the three-axis linear displacement system mainly consists of a ninth, tenth and eleventh linear slides (801, 802, 803) arranged orthogonally in pairs, The eleventh linear slide (803) is arranged on the slide of the tenth linear slide (802), and the tenth linear slide (802) is arranged on the slide of the ninth linear slide (801); the sample stage (4) is arranged on the slide of the eleventh linear slide (803) in the fourth linear displacement system (8); the first sampling system (1) is arranged on the slide of the eleventh linear slide (803) in the first linear displacement system (5), and the optical axis of the first optical microscope head (102) is perpendicular to one side of the sample stage (4); the second linear displacement system (6) The slide of the eleventh linear slide (803) is provided with a second sampling system (2), and the optical axis of the second optical microscope head (202) is perpendicular to the front side of the sample table (4); the slide of the eleventh linear slide (803) in the third linear displacement system (7) is provided with a third sampling system (3), and the optical axis of the third optical microscope head (302) is perpendicular to the other side of the sample table (4); the ninth, tenth and eleventh linear slides (801, 802, 803) are respectively mainly composed of a driving motor, a ball screw, a linear slide rail, a slide and a dustproof shell connected in sequence; The first, second and third digital image processing devices (101, 201, 301) are industrial digital image processing devices or electronic eyepieces, comprising a CCD / CMOS image sensor, a DSP image information processor and a computer interface; the computer interface is a wired interface or a wireless interface; The sample table (4) comprises a main body frame, the sample carrying surface (11) of the main body frame is a light-transmitting plate, and a reflective plate (12) is further provided in the main body frame.

2. The three-lens scanning microscope device according to claim 1, characterized in that: It also includes a computer control system, the drive motor is connected to the computer control system, the synchronous line-by-line scanning movement of the linear displacement system is controlled by the computer control system, and the first, second and third digital image processing devices (101, 201, 301) are also connected to the computer control system to process image information.

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