A high-speed and high-precision probe electrical measurement mechanism

Abstract

The present invention discloses a high-speed and high-precision probe electrical testing mechanism, including a feeding mechanism, a receiving mechanism placed below the feeding mechanism, a clamping and tensioning mechanism placed on the side of the receiving mechanism, and a testing mechanism placed beside the two clamping and tensioning mechanisms; after the FPC received by the receiving mechanism is clamped and tensioned by the clamping and tensioning mechanism, the feeding mechanism transports the clamped and tensioned FPC to the position to be tested to the testing mechanism for testing. The present invention has a wide compatibility range, and the FPC product size L: 120 ~ 500mm, W: 80 ~ 270mm can be compatible with testing; no customized fixtures are required, reducing production and testing costs; used in conjunction with manual / automatic machines, it can match mass production, eliminate false testing of the machine, and improve yield.

Description

Technical Field

[0001] The invention relates to the technical field of FPC soft board circuit testing, and in particular to a high-speed and high-precision probe electrical testing mechanism. Background Art

[0002] FPC: Flexible Printed Circuit, which means flexible printed circuit board in Chinese, or FPC for short. FPC has the characteristics of short assembly time, high wiring density, small size, light weight, thin thickness and good bending performance. Due to its high density, small pad and certain expansion and contraction, there is a certain probability of false test (i.e. detecting a good product as defective) during electrical testing.

[0003] The common electrical testing method for FPC is to customize the jig, use the jig to perform manual / automatic testing on the machine, and mark the defective products. The use of jigs for measurement does not require high technical skills of workers, and a large number of points (hundreds or thousands of points) can be tested simultaneously, with high testing efficiency, so it is suitable for large-scale testing. For diverse and small-volume production modes, customized jigs are required, resulting in increased production costs; due to the expansion and contraction characteristics of FPC, the jig cannot move the test position by itself after being fixed, and the position accuracy must be ensured by mechanism / manually, so there is a possibility that the jig probe cannot accurately contact the pad, resulting in false tests. Summary of the invention

[0004] In view of the problems existing in the prior art, the present invention provides a high-speed and high-precision probe electrical measurement mechanism.

[0005] In order to achieve the above object, the technical solution of the present invention is as follows:

[0006] A high-speed and high-precision probe electrical measurement mechanism comprises a feeding mechanism, a receiving mechanism arranged below the feeding mechanism, a clamping and tensioning mechanism arranged on both sides of the receiving mechanism and slidably connected to the feeding mechanism, and a testing mechanism arranged next to the clamping and tensioning mechanism; after the FPC received by the receiving mechanism is clamped and tensioned by the clamping and tensioning mechanism, the feeding mechanism transports the clamped and tensioned FPC to a position to be tested to the testing mechanism for testing.

[0007] Preferably, the testing mechanism includes a plurality of oppositely disposed X-axis sliding mechanisms, a plurality of oppositely disposed Y-axis sliding mechanisms slidably connected to the plurality of oppositely disposed X-axis sliding mechanisms, and a probe assembly disposed on each Y-axis sliding mechanism and slidably connected thereto.

[0008] Preferably, each of the X-axis sliding mechanisms includes a gantry base, a first driving mechanism and a first slide rail arranged on the gantry base, a first screw connected to the output end of the first driving mechanism, and a first slider slidably connected to the first slide rail.

[0009] Preferably, each of the Y-axis sliding mechanisms includes a slide plate, a second driving mechanism arranged on the slide plate, a second screw rod connected to the output end of the second driving mechanism, and a first guide rail placed on the slide plate and next to the second driving mechanism; each end of the slide plate is connected to the first screw rod and the first slider in sequence.

[0010] Preferably, each of the probe assemblies includes a connecting plate, a third driving mechanism arranged on the connecting plate, a synchronous belt connected to the output end of the third driving mechanism, a second guide rail placed next to the synchronous belt, a probe connector placed on the synchronous belt and slidably connected to the second guide rail, a probe arranged on the probe connector, and a photographing mechanism placed next to the probe and on the connecting plate; the photographing mechanism includes a camera, a lens, and an LED light source; one end of the lens is connected to the camera, and the other end passes through the LED light source.

[0011] Preferably, the high-speed and high-precision probe electrical measurement mechanism further includes a working platform, and the feeding mechanism and the receiving mechanism are placed on the working platform; the working platform includes a high-precision marble platform and two support frames arranged on both sides of the marble platform.

[0012] Preferably, the feeding mechanism includes a third guide rail placed on two support frames, a fourth driving mechanism placed on a support frame and next to the corresponding third guide rail, and a synchronous toothed belt connected to the output end of the fourth driving mechanism; the material receiving mechanism includes a support member, a lifting mechanism arranged on the support member, and a material receiving plate connected to the output end of the lifting mechanism.

[0013] Preferably, the clamping and tensioning mechanisms include two oppositely arranged clamping mechanisms, locking mechanisms arranged on both sides of the clamping mechanisms, and two tensioning mechanisms that pass through both ends of the two clamping mechanisms and cooperate with the locking mechanisms; the high-speed and high-precision probe electrical measurement mechanism also includes a plurality of locking mechanisms that cooperate with the tensioning mechanisms, and the locking mechanisms are placed on both sides of the clamping mechanisms.

[0014] Preferably, each of the clamping mechanisms includes a support plate, a plurality of sixth drive mechanisms arranged on the support plate, a plurality of upper clips, a lower clip cooperating with the plurality of upper clips, and a first freely rotating shaft passing through the heads of the plurality of upper clips in sequence; the output end of the sixth drive mechanism is connected to the upper clip via the first freely rotating shaft.

[0015] Preferably, each of the locking mechanisms includes a seventh driving mechanism, a locking block connected to the output end of the seventh driving mechanism, and a fourth guide rail placed under the locking block and slidably connected thereto; each of the tensioning mechanisms includes an eighth driving mechanism, and a rack connected to the output end of the eighth driving mechanism; the rack passes through the support plate and is placed next to the locking block that cooperates therewith.

[0016] The technical solution of the present invention has the following beneficial effects: the present invention can test different FPCs without customizing jigs, thereby reducing production and testing costs; after the clamping mechanism clamps the FPC, four probes respectively contact the pads and vias to be tested, thereby testing a single component of the unit under test, and connecting to the test system through the probes to detect short circuits, open circuits and component values ​​as needed; two probes are distributed above and below the four probes, so that single-sided boards can be tested, as well as double-sided boards; the technology can achieve precise pitch, is not restricted by the FPC grid, has flexible testing, extremely high speed and a wide compatibility range; in conjunction with a manual / automatic electrical side machine, it can match mass production, eliminate false testing of the machine, improve the yield rate, and improve the electrical test yield rate, thereby reducing waste. BRIEF DESCRIPTION OF THE DRAWINGS

[0017] Figure 1 It is a schematic diagram of the structure of the present invention;

[0018] Figure 2 Schematic diagram of the test mechanism of the present invention Figure 1 ;

[0019] Figure 3 Schematic diagram of the test mechanism of the present invention Figure 2 ;

[0020] Figure 4 It is a schematic diagram of the probe assembly of the present invention;

[0021] Figure 5 It is a schematic diagram of the structure of the feeding mechanism of the present invention;

[0022] Figure 6 It is a schematic diagram of the structure of the material receiving mechanism and the clamping and tensioning mechanism of the present invention;

[0023] Figure 7 It is a schematic diagram of the locking mechanism structure of the present invention. DETAILED DESCRIPTION

[0024] The present invention is further described below in conjunction with the accompanying drawings and specific embodiments.

[0025] Reference Figures 1 to 7 The present invention provides a high-speed and high-precision probe electrical measurement mechanism, which is characterized in that it includes a feeding mechanism 2, a receiving mechanism 1 placed below the feeding mechanism 2, a clamping and tensioning mechanism 3 placed on both sides of the receiving mechanism 1 and slidably connected to the feeding mechanism 2, and a testing mechanism placed next to the clamping and tensioning mechanism 3; after the FPC received by the receiving mechanism 1 is clamped and tensioned by the clamping and tensioning mechanism 3, the feeding mechanism 2 transports the clamped and tensioned FPC to a position to be tested to the testing mechanism for testing.

[0026] The testing mechanism includes a plurality of oppositely disposed X-axis sliding mechanisms 5, a plurality of oppositely disposed Y-axis sliding mechanisms 6 slidably connected to the plurality of oppositely disposed X-axis sliding mechanisms 5, and a probe assembly 7 disposed on each Y-axis sliding mechanism 6 and slidably connected thereto; the Y-axis sliding mechanism 6 can slide along the X-axis sliding mechanism 5; and the probe assembly 7 can slide along the Y-axis sliding mechanism 6.

[0027] Each of the X-axis sliding mechanisms 5 includes a gantry base 501 , a first driving mechanism 502 and a first slide rail 504 arranged on the gantry base 501 , a first screw rod 503 connected to the output end of the first driving mechanism 502 , and a first slider 505 slidably connected to the first slide rail 504 .

[0028] Each of the Y-axis sliding mechanisms 6 includes a slide plate 601, a second driving mechanism 603 arranged on the slide plate 601, a second screw rod 604 connected to the output end of the second driving mechanism 603, and a first guide rail 602 placed on the slide plate 601 and next to the second driving mechanism 603; each end of the slide plate 601 is connected to the first screw rod 503 and the first slider 505 in sequence.

[0029] The probe measuring assembly is placed on the first guide rail 602 and connected to the second lead screw 604 at the output end of the second driving mechanism 603 .

[0030] Each of the probe assemblies 7 includes a connecting plate 708, a third driving mechanism 701 arranged on the connecting plate 708, a synchronous belt 702 connected to the output end of the third driving mechanism 701, a second guide rail 703 placed next to the synchronous belt 702, a probe connector placed on the synchronous belt 702 and slidably connected to the second guide rail 703, a probe 707 arranged on the probe connector, and a photographing mechanism placed next to the probe 707 and on the connecting plate 708; the photographing mechanism includes a camera 704, a lens 705, and an LED light source 706; one end of the lens 704 is connected to the camera 704, and the other end passes through the LED light source 706.

[0031] When the third driving mechanism 701 drives the synchronous belt 702, the synchronous belt 702 with the probe 707 extends for detection, and retracts to return to a safe position for avoidance.

[0032] The probe assemblies include two upper probe assemblies and two lower probe assemblies placed below the two upper probe assemblies; the two upper probe assemblies include an upper left probe assembly and an upper right probe assembly; the two lower probe assemblies include a lower left probe assembly and a lower right probe assembly.

[0033] The camera 704 can identify the mark holes on the FPC, and the probe 707 converts the unified coordinate system through the camera 704, and locates the XYZ axis at high speed and high precision according to the pad position of the FPC data, and tests the FPC points; the upper and lower four probes 707 can convert the position relationship into absolute position according to the layout shape of the FPC product, the characteristics of the single-sided and double-sided panels, and any two probes can be intelligently combined with high efficiency and high precision to perform electrical testing on the FPC.

[0034] The high-speed and high-precision probe electrical measurement mechanism also includes a working platform, and the feeding mechanism 2 and the receiving mechanism 1 are placed on the working platform; the working platform includes a high-precision marble platform 201 and two support frames 203 arranged on both sides of the marble platform 201; the feeding mechanism 2 includes a third guide rail 204 placed on the two support frames 203, a fourth drive mechanism 202 placed on a support frame 203 and placed next to the corresponding third guide rail 204, and a synchronous toothed belt 205 connected to the output end of the fourth drive mechanism 202.

[0035] The feeding mechanism 2 can transport the clamped and tensioned FPC to the position to be measured through the fourth driving mechanism 202, so as to facilitate the visual positioning and electrical measurement of the probe.

[0036] The material receiving mechanism 1 is placed on the marble platform 201 and below the third guide rails 204 on both sides of the marble platform 201 .

[0037] The receiving mechanism 1 includes a support member 101, a lifting mechanism 102 arranged on the support member 101, and a receiving plate 103 connected to the output end of the lifting mechanism 102; when the output end of the lifting mechanism is extended, the receiving plate 103 can receive the FPC, making it convenient for the clamping mechanism 30 to clamp the FPC.

[0038] The clamping and tensioning mechanisms include two clamping mechanisms 30 arranged opposite to each other and two tensioning mechanisms passing through the two ends of the two clamping mechanisms 30 ; the high-speed and high-precision probe electrical measurement mechanism also includes a plurality of locking mechanisms 4 cooperating with the tensioning mechanisms, and the locking mechanisms 4 are placed on both sides of the clamping mechanisms 30 .

[0039] Each of the clamping mechanisms 30 includes a support plate 303, a plurality of sixth drive mechanisms 304 arranged on the support plate 303, a plurality of upper clips 305, a lower clip 306 cooperating with the plurality of upper clips 305, a first free-rotating shaft 307 passing through the heads of the plurality of upper clips 305 in sequence, and a second free-rotating shaft (hidden in the plurality of upper clips, not shown in the figure) passing through the clamping parts of the plurality of upper clips; the output end of the sixth drive mechanism 304 is connected to the upper clip 305 through the first free-rotating shaft 307; when the output end of the sixth drive mechanism 304 is retracted, the upper clip 305 and the lower clip 606 are opened, and when the output end of the sixth drive mechanism 304 is extended, the upper clip 305 and the lower clip 606 are clamped; the upper and lower clips are in contact with the FPC with adhesive to ensure insulation from the FPC.

[0040] Each of the tensioning mechanisms includes a seventh drive mechanism 301 and a rack 302 connected to the output end of the seventh drive mechanism 301; the rack 302 passes through the support plate 303 and is placed next to a locking mechanism that cooperates with it; when the output end of the seventh drive mechanism 301 extends out, it cooperates with the material receiving mechanism 1 to receive the FPC, and when the FPC is clamped, the output end of the seventh drive mechanism 301 retracts to tension the FPC.

[0041] The high-speed and high-precision probe electrical measurement mechanism also includes a plurality of locking mechanisms 4; each of the locking mechanisms 4 includes an eighth drive mechanism 401, a locking block 403 connected to the output end of the eighth drive mechanism 401, and a fourth guide rail 402 placed under the locking block 403 and slidably connected thereto; the locking block 403 is also provided with a tooth opening that matches the rack 302; when the eighth drive mechanism 401 is extended, the locking block 403 engages with the rack 302 to ensure that the freedom of the clamping and tensioning mechanism in the left and right directions is fixed.

[0042] The first drive mechanism 502, the second drive mechanism 603, and the fourth drive mechanism 202 are all servo motors; the third drive mechanism 701 is selected from a progressive motor; the lifting mechanism 102 is selected from a lifting cylinder; the sixth drive mechanism 304, the seventh drive mechanism 301, and the eighth drive mechanism 401 are all cylinders.

[0043] The FPC product dimensions are L: 120-500 mm, W: 80-270 mm.

[0044] Working principle of the present invention:

[0045] During operation, first, the input end of the lifting mechanism 102 of the receiving mechanism 1 is extended to control the receiving plate 103 to catch the FPC, and at the same time, the output end of the seventh driving mechanism 301 of the tensioning mechanism is extended, and the output end of the sixth driving mechanism 304 of the clamping mechanism is extended to clamp the FPC. After the FPC is clamped, the output end of the seventh driving mechanism 301 is retracted, and at the same time, the eighth driving mechanism 401 of the locking mechanism 4 is extended to make the locking block 403 engage with the rack 302 to tension the FPC; then, the clamped and tensioned FPC is transported to the position to be measured through the fourth driving mechanism 202 of the feeding mechanism 2; finally, the mark hole on the FPC is identified by the camera 704 of the testing mechanism 7, and the probe 707 converts the unified coordinate system through the camera 704, and the XYZ axis is positioned at high speed and high precision according to the pad position of the FPC data, and the FPC point is tested.

[0046] Therefore, the above is only a preferred embodiment of the present invention, and does not limit the patent scope of the present invention. All equivalent structural changes made by using the contents of the present invention specification and drawings under the inventive concept of the present invention, or directly / indirectly used in other related technical fields are included in the patent protection scope of the present invention.

Claims

1. A high-speed and high-precision probe electrical measurement mechanism, characterized in that: It includes a feeding mechanism, a receiving mechanism placed below the feeding mechanism, a clamping and tensioning mechanism placed on both sides of the receiving mechanism and slidably connected to the feeding mechanism, and a testing mechanism placed next to the clamping and tensioning mechanism; after the FPC received by the receiving mechanism is clamped and tensioned by the clamping and tensioning mechanism, the feeding mechanism transports the clamped and tensioned FPC to the position to be tested to the testing mechanism for testing; The testing mechanism comprises a plurality of two oppositely disposed X-axis sliding mechanisms, a plurality of two oppositely disposed Y-axis sliding mechanisms slidably connected to the plurality of two oppositely disposed X-axis sliding mechanisms, and a probe assembly disposed on each Y-axis sliding mechanism and slidably connected thereto; Each of the probe assemblies comprises a connecting plate, a third driving mechanism arranged on the connecting plate, a synchronous belt connected to the output end of the third driving mechanism, a second guide rail arranged beside the synchronous belt, a probe connecting member arranged on the synchronous belt and slidably connected to the second guide rail, a probe arranged on the probe connecting member, and a photographing mechanism arranged beside the probe and arranged on the connecting plate; the photographing mechanism comprises a camera, a lens, and an LED light source; one end of the lens is connected to the camera, and the other end passes through the LED light source; The feeding mechanism includes a third guide rail placed on two support frames, a fourth driving mechanism placed on a support frame and next to the corresponding third guide rail, and a synchronous toothed belt connected to the output end of the fourth driving mechanism; the receiving mechanism includes a support member, a lifting mechanism arranged on the support member, and a receiving plate connected to the output end of the lifting mechanism; The clamping and tensioning mechanisms each include two clamping mechanisms arranged opposite to each other, locking mechanisms arranged on both sides of the clamping mechanisms, and two tensioning mechanisms that pass through both ends of the two clamping mechanisms and cooperate with the locking mechanisms; the high-speed and high-precision probe electrical measurement mechanism also includes a plurality of locking mechanisms that cooperate with the tensioning mechanisms, and the locking mechanisms are arranged on both sides of the clamping mechanisms; Each of the clamping mechanisms comprises a support plate, a plurality of sixth drive mechanisms arranged on the support plate, a plurality of upper clips, a lower clip matched with the plurality of upper clips, and a first freely rotating shaft passing through the heads of the plurality of upper clips in sequence; the output end of the sixth drive mechanism is connected to the upper clip via the first freely rotating shaft; Each of the locking mechanisms includes a seventh driving mechanism, a locking block connected to the output end of the seventh driving mechanism, and a fourth guide rail placed under the locking block and slidably connected to the locking block; each of the tensioning mechanisms includes an eighth driving mechanism, and a rack connected to the output end of the eighth driving mechanism; the rack passes through the support plate and is placed next to the locking block that cooperates with it.

2. The high-speed and high-precision probe electrical measurement mechanism according to claim 1, characterized in that: Each of the X-axis sliding mechanisms comprises a gantry base, a first driving mechanism and a first slide rail arranged on the gantry base, a first screw rod connected to the output end of the first driving mechanism, and a first sliding block slidably connected to the first slide rail.

3. The high-speed and high-precision probe electrical measurement mechanism according to claim 1, characterized in that: Each of the Y-axis sliding mechanisms includes a slide plate, a second driving mechanism arranged on the slide plate, a second screw rod connected to the output end of the second driving mechanism, and a first guide rail placed on the slide plate and next to the second driving mechanism; each end of the slide plate is connected to the first screw rod and the first slider in sequence.

4. The high-speed and high-precision probe electrical measurement mechanism according to claim 1, characterized in that: The high-speed and high-precision probe electrical measurement mechanism also includes a working platform, and the feeding mechanism and the receiving mechanism are placed on the working platform; the working platform includes a high-precision marble platform and two support frames arranged on both sides of the marble platform.

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