Fully automatic middle tester

Abstract

The present invention discloses a full-automatic middle tester, aiming to provide a full-automatic middle tester with reasonable design, which reduces the labor intensity of operators and improves production efficiency. The present invention includes a test bench, on which a longitudinal moving device and a lifting table located at the front end of the longitudinal moving device are provided. A rotating motor and a test carrier plate connected to the rotating motor are provided on the longitudinal moving device. A gantry is also provided on the test bench at the rear of the longitudinal moving device. A transverse moving device and a middle testing component connected to the transverse moving device are provided on the gantry. A basket is provided on the lifting table, and a number of carrier plates are provided in the basket. Installation grooves adapted to the carrier plates are provided at both the front and rear ends of the test carrier plate. A driving device and a lifter connected to the driving device are also provided at the front end of the lifting table. A support plate adapted to the carrier plate is provided on the lifter. The present invention is applied to the technical field of instruments for automatic testing of fine-tuned resonant components.

Description

Technical Field

[0001] The present invention relates to a middle tester, and particularly to a full-automatic middle tester. Background Art

[0002] At present, the testing method for the tuned resonator: tuning - manual loading - middle testing - manual unloading - manual loading - middle testing - manual unloading; after tuning, the resonator must be tested for various electrical performance parameters (such as frequency, resistance, capacitance, etc.) on the middle tester. The material plate is placed on the middle tester through manual operation, and the instrument automatically tests. After rejecting unqualified products, the operator manually takes out the material plate and then places the next material plate, and so on in a cycle.

[0003] The above testing method has the following disadvantages: for the middle tester, the operator manually places the tooling plate loaded with the resonator on the testing track and then manually takes it out after automatic testing. This manual operation method not only increases the labor intensity of the operator but also reduces the production volume; after statistics, one employee needs to operate 6 tuning machines and 3 middle testers at the same time. The time spent on loading and unloading materials per hour is about 12 minutes. With a small tuning amount, 1200 pieces are produced per hour, and 12000 pieces are accumulated less per shift. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to overcome the deficiencies of the prior art and provide a full-automatic middle tester with reasonable design, which reduces the labor intensity of the operator and improves the production efficiency.

[0005] The technical solution adopted by the present invention is as follows: the present invention includes a testing table, a longitudinal moving device is arranged on the testing table, and a lifting table is arranged at the front end of the longitudinal moving device. A rotating motor and a testing carrier plate connected to the rotating motor are arranged on the longitudinal moving device. A gantry is also arranged on the testing table at the rear of the longitudinal moving device. A transverse moving device and a middle testing component connected to the transverse moving device are arranged on the gantry. A basket is arranged on the lifting table, and a plurality of carrier plates are arranged in the basket. Installation grooves adapted to the carrier plates are arranged at both the front and rear ends of the testing carrier plate. A driving device and a lifter connected to the driving device are also arranged at the front end of the lifting table. A support plate adapted to the carrier plate is arranged on the lifter.

[0006] Further, a plurality of pairs of supporting grooves are symmetrically arranged on both inner side walls of the basket. The carrier plate is installed between each pair of supporting grooves. An electrode plate is arranged on the carrier plate, and a plurality of wafers are laid on the electrode plate.

[0007] Further, the width of the support plate is smaller than the distance between each pair of supporting grooves, and the distance between each pair of supporting grooves is equal to the groove width of the installation groove.

[0008] Further, the in-process measurement component includes a lifting cylinder installed on the lateral moving device and an in-process detector connected to the lifting cylinder.

[0009] Further, an unqualified product placement groove plate is provided on one side of the carrier plate, and a vacuum suction nozzle is provided at one end of the in-process detector.

[0010] Further, an MCU controller is also provided on the test bench. The longitudinal moving device, the lifting table, the rotating motor, the lateral moving device, the in-process measurement component, the driving device, the lifter, and the vacuum suction nozzle are all electrically connected to the MCU controller.

[0011] The beneficial effects of the present invention are as follows: Since the present invention includes a test bench, a longitudinal moving device and a lifting table located at the front end of the longitudinal moving device are provided on the test bench, a rotating motor and a test carrier plate connected to the rotating motor are provided on the longitudinal moving device, a gantry is also provided on the test bench at the rear of the longitudinal moving device, a lateral moving device and an in-process measurement component connected to the lateral moving device are provided on the gantry, a basket is provided on the lifting table, a plurality of carrier plates are provided in the basket, installation grooves adapted to the carrier plates are provided at both the front and rear ends of the test carrier plate, a driving device and a lifter connected to the driving device are further provided at the front end of the lifting table, and a support plate adapted to the carrier plate is provided on the lifter. Therefore, in the present invention, the carrier plate in the basket is dragged into the test carrier plate through the support plate, and then tested by the in-process measurement component. When the test is completed, the carrier plate is towed back into the basket through the support plate. This design can reduce the operation time of manually circulating the picking and placing of the carrier plate. Only the basket needs to be replaced, which greatly reduces the labor intensity of the operator and also greatly improves the production efficiency. Description of the Drawings

[0012] Figure 1 is a top view of the present invention;

[0013] Figure 2 is a schematic structural diagram of the basket. Detailed Embodiments

[0014] Such as Figure 1 and Figure 2As shown, in this embodiment, the present invention includes a test bench 1, on which a longitudinal moving device 2 and a lifting table 3 located at the front end of the longitudinal moving device 2 are provided. A rotating motor 21 and a test carrier plate 4 connected to the rotating motor 21 are provided on the longitudinal moving device 2. A gantry 5 is also provided on the test bench 1 at the rear of the longitudinal moving device 2. A transverse moving device 6 and a middle measurement component 7 connected to the transverse moving device 6 are provided on the gantry 5. A basket 8 is provided on the lifting table 3, and a plurality of carrier plates 81 are provided in the basket 8. Installation grooves 41 adapted to the carrier plates 81 are provided at both the front and rear ends of the test carrier plate 4. A driving device 9 and a lifter connected to the driving device 9 are further provided at the front end of the lifting table 3. A support plate 10 adapted to the carrier plate 81 is provided on the lifter.

[0015] In this embodiment, a plurality of pairs of support grooves 82 are symmetrically provided on both inner side walls of the basket 8, and the carrier plate 81 is installed between each pair of the support grooves 82. An electrode plate 83 is provided on the carrier plate 81, and a plurality of wafers 84 are arrayed and laid on the electrode plate 83.

[0016] In this embodiment, the width of the support plate 10 is less than the distance between each pair of the support grooves 82, and the distance between each pair of the support grooves 82 is equal to the groove width of the installation groove 41.

[0017] In this embodiment, the middle measurement component 7 includes a lifting cylinder installed on the transverse moving device 6 and a middle detector connected to the lifting cylinder.

[0018] In this embodiment, a non-conforming product placement groove plate 11 is provided on one side of the carrier plate 81, and a vacuum suction nozzle is provided at one end of the middle detector.

[0019] In this embodiment, an MCU controller is further provided on the test bench 1, and the longitudinal moving device 2, the lifting table 3, the rotating motor 21, the transverse moving device 6, the middle measurement component 7, the driving device 9, the lifter, and the vacuum suction nozzle are all electrically connected to the MCU controller.

[0020] In this embodiment, the working process of the present invention is as follows: The pallet 10 extends into the basket 8 through the driving device 9 and is located on the carrier plate 81. Then the lifter raises the pallet 10 so that the pallet 10 lifts the carrier plate 81. Then the driving device 9 drives the pallet 10 carrying the carrier plate 81 to move to the installation groove 41. Then the lifter drives the pallet 10 to descend so that the carrier plate 81 is placed in the installation groove 41. Then the pallet 10 resets, and the rotary motor 21 drives the test carrier plate 4 to rotate 180°, so that the carrier plate 81 is located below the middle test component 7. Then the lateral moving device 6 on the middle test component 7 drives the middle tester to detect a row of wafers in the carrier plate 81. During this process, the lifting table 3 drives the basket 8 to extend upward by one layer height. Then the pallet 10 moves like the above movement to drag the carrier plate 81 to the installation groove 41 to be detected. Then the lateral moving device 6 drives the carrier plate 81 to move laterally so that the middle tester 7 detects another row of wafers in the carrier plate 81. Until all detections are completed, the rotary motor 21 drives the test carrier plate 4 to rotate 180°, so that the carrier plate 81 to be detected enters below the middle test component 7, and the detected carrier plate 81 is towed back into the basket 8 by the pallet 10. Then the basket 8 is driven by the lifting table 3 to extend upward by one layer height. Then the pallet 10 transfers the carrier plate 81 in the basket 8 to the installation groove to be detected again. This process is repeated until all the wafers in the carrier plate 81 in the basket 8 are detected. Then the basket 8 can be manually transferred.

[0021] The present invention is applied to the technical field of an automated testing instrument for fine-tuned resonant components.

[0022] Although the embodiments of the present invention are described with actual solutions, they do not constitute a limitation to the meaning of the present invention. For those skilled in the art, modifications to its implementation solutions according to this specification and combinations with other solutions are obvious.

Claims

1. A fully automatic middle tester, characterized in that: it includes a test bench, on which a longitudinal moving device and a lifting table located at the front end of the longitudinal moving device are provided. A rotating motor and a test carrier plate connected to the rotating motor are provided on the longitudinal moving device. A gantry is also provided on the test bench at the rear of the longitudinal moving device. A transverse moving device and a middle testing component connected to the transverse moving device are provided on the gantry. A basket is provided on the lifting table, and a plurality of carrier plates are provided in the basket. Installation grooves adapted to the carrier plates are provided at both the front and rear ends of the test carrier plate. A driving device and a lifter connected to the driving device are further provided at the front end of the lifting table. A support plate adapted to the carrier plate is provided on the lifter; the middle testing component includes a lifting cylinder installed on the transverse moving device and a middle tester connected to the lifting cylinder; a non-conforming product placement groove plate is provided on one side of the carrier plate, and a vacuum suction nozzle is provided at one end of the middle tester; a plurality of pairs of support grooves are symmetrically provided on both inner side walls of the basket. The carrier plate is installed between each pair of support grooves. An electrode plate is provided on the carrier plate, and a plurality of wafers are laid on the electrode plate; the width of the support plate is smaller than the distance between each pair of support grooves, and the distance between each pair of support grooves is equal to the groove width of the installation groove.

2. The fully automatic middle tester according to claim 1, characterized in that: an MCU controller is further provided on the test bench, and the longitudinal moving device, the lifting table, the rotating motor, the transverse moving device, the middle testing component, the driving device, the lifter and the vacuum suction nozzle are all electrically connected to the MCU controller.

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