Light strip aging test fixture

CN111948523BActive Publication Date: 2025-12-19惠州市欣上科技有限公司
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Patent Information

Application Number
CN202010980918.2
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2020-09-17
Publication Date
2025-12-19
Estimated Expiration
2040-09-17

AI Technical Summary

Technical Problem

此种LED灯带老化测试方式存在如下缺点:1、LED灯带占地面积大,严重浪费生产空间,老化桌需占较大面积,由于LED灯带的长度较长,一个老化桌的桌面也仅能放置有限数量的LED灯带

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Abstract

The application discloses a lamp strip aging test fixture used for aging test of lamp strips, which comprises a first hinge disc, a second hinge disc, a connecting rod, lamp strip aging test rods, a fixing rod, power supply sockets and a power supply assembly. The first hinge disc is used for stretching and retracting the first hinge belt, the second hinge disc is used for stretching and retracting the second hinge belt, the two ends of the connecting rod are connected with the first hinge disc and the second hinge disc respectively, the lamp strip aging test rods are fixed on the connecting rod and located between the first hinge belt and the second hinge belt to support the lamp strips, the opposite ends of the fixing rod are fixed on the first hinge belt and the second hinge belt respectively and connected with the lamp strip aging test rods, the power supply sockets are arranged on one end of the lamp strip aging test rods to be electrically connected with the lamp strips, and the power supply assembly is electrically connected with the power supply sockets to provide power. The first hinge belt and the second hinge belt are stretched and retracted in the same direction. Therefore, the production space can be effectively saved and the energy consumption can be reduced.
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Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of lamp testing, in particular to a lamp strip aging test fixture. BACKGROUND

[0002] LED lamp strip refers to welding LED lamp beads on a strip-shaped FPCB (flexible circuit board), or directly bonding LED chips on the FPCB (flexible circuit board), and is named because its product shape is like a belt. Because of long service life, energy saving, green environmental protection and other advantages, it gradually emerges in various decoration industries.

[0003] The existing LED lamp strip needs to be tested for aging to test whether its quality is qualified, such as testing whether the power supply is stable in a high temperature environment, and whether the LED is damaged in the assembly process. Generally, the lamp strip aging test is to horizontally place the LED lamp strip on the aging table. This kind of LED lamp strip aging test has the following disadvantages: 1. The LED lamp strip occupies a large area, which seriously wastes the production space. The aging table needs to occupy a large area. Because the length of the LED lamp strip is relatively long, only a limited number of LED lamp strips can be placed on the desktop of one aging table. 2. The back of the LED lamp strip is tightly attached to the aging table, and the heat dissipation is poor, which greatly affects the aging result of the LED lamp strip. 3. An independent cooling system needs to be configured, and the energy consumption is high. That is, the LED lamp strip aging test generally needs to be carried out in a special space with a temperature of 20℃-35℃ and a humidity of 55%-95%, so an independent cooling system needs to be configured, thereby increasing the power loss.

[0004] Therefore, how to overcome the various shortcomings of the prior art has become a difficult problem to be solved in the industry at present. SUMMARY

[0005] In view of the shortcomings of the prior art, the present application provides a lamp strip aging test fixture for aging test of the lamp strip, which comprises a first hinge disc, a second hinge disc, a connecting rod, a plurality of lamp strip aging test rods, a fixing rod, a plurality of power supply sockets and a power supply assembly. The first hinge disc is used to make the first hinge belt stretch and retract, the second hinge disc is used to make the second hinge belt stretch and retract, the opposite ends of the connecting rod are connected with the first hinge disc and the second hinge disc respectively, the plurality of lamp strip aging test rods are fixed to the connecting rod and located between the first hinge belt and the second hinge belt to carry the lamp strip, the opposite ends of the fixing rod are fixed to the first hinge belt and the second hinge belt respectively and connected with the plurality of lamp strip aging test rods, the plurality of power supply sockets are arranged at one end of the plurality of lamp strip aging test rods to be electrically connected with the lamp strip, and the power supply assembly is electrically connected with the plurality of power supply sockets to provide power. The first hinge belt and the second hinge belt stretch and retract in the same direction.

[0006] In some embodiments, the first hinge belt and the second hinge belt are synchronously retracted and extended.

[0007] In some embodiments, the direction in which the first hinge belt and the second hinge belt are retracted and extended is a vertical direction. In other words, the vertical direction is perpendicular to a horizontal plane.

[0008] In some embodiments, the lamp strip aging test fixture further comprises a control unit electrically connected to the power supply assembly, for controlling the first hinge disc and the second hinge disc to retract and extend the first hinge belt and the second hinge belt.

[0009] In some embodiments, the control unit comprises a control panel having a plurality of control buttons electrically connected to the plurality of power supply sockets one-to-one.

[0010] In some embodiments, the lamp strip aging test fixture further comprises an upper limit sensor and a lower limit sensor for sensing the position of the first hinge belt and the position of the second hinge belt, and generating a sensing signal transmitted to the control unit, the control unit controlling the first hinge disc and the second hinge disc to retract and extend the first hinge belt and the second hinge belt according to the sensing signal. Further, the sensing signal is generated by the upper limit sensor and the lower limit sensor according to the positions of the first hinge belt and the second hinge belt sensed by the upper limit sensor and the lower limit sensor.

[0011] In some embodiments, the plurality of lamp strip aging test rods are made of flexible material.

[0012] In some embodiments, the distance between two adjacent lamp strip aging test rods is equal.

[0013] In some embodiments, the plurality of lamp strip aging test rods are made of metal material.

[0014] In some embodiments, the surface of the plurality of lamp strip aging test rods is provided with heat-conducting insulation material.

[0015] As can be seen from the above, when the lamp strip is to be tested for aging, the lamp strip aging test fixture of the present application forms a frame for placing the lamp strip by the outward extension of the first hinge belt and the second hinge belt, and then places the lamp strip on the lamp strip aging test rod for aging test. After the test is completed, the hinge belts are retracted. In this way, the production space can be effectively saved. In addition, the lamp strip aging test rod can be made of metal material, and the surface thereof is provided with heat-conducting insulation material, thereby improving the heat dissipation problem. Based on this, gaps can be left between the plurality of lamp strip aging test rods. When the lamp strip is tested for aging, the plurality of lamp strip aging test rods are vertically arranged and have gaps, which facilitates air circulation, thereby effectively reducing the temperature during the aging test, and a separate cooling system is not needed, thereby saving energy consumption.

[0016] The above description is only a summary of the technical solutions of the present application. In order to make the technical solutions of the present application more clearly understood and implemented, and to make the above and other purposes, features and advantages of the present application more apparent and easy to understand, the following preferred embodiments are listed and described in detail below with reference to the accompanying drawings. BRIEF DESCRIPTION OF DRAWINGS

[0017] The accompanying drawings, which are included to provide a further understanding of the embodiments of the application and constitute a part of this specification, illustrate the embodiments of the application and together with the description serve to explain the principles of the application. It is apparent that the accompanying drawings are only some embodiments of the present application and are not intended to limit the embodiments of the present application to only these accompanying drawings. For those skilled in the art, other drawings can be derived from the accompanying drawings without creative labor. The drawings include:

[0018] Figure 1 is a structural schematic view of the first embodiment of the lamp strip aging test fixture in the retracted state;

[0019] Figure 2 is a structural schematic view of the first embodiment of the lamp strip aging test fixture in the extended state;

[0020] Figure 3 is a structural schematic view of the second embodiment of the lamp strip aging test fixture in the retracted state; and

[0021] Figure 4 is a structural schematic view of the second embodiment of the lamp strip aging test fixture in the extended state.

[0022] FIG. 10, 30- lamp strip aging test fixture; 11- lamp strip; 12- first hinge disc; 121- first hinge belt; 13- second hinge disc; 131- second hinge belt; 14- connecting rod; 15, 35- lamp strip aging test rod; 16- fixed rod; 17- power supply socket; 18- power supply assembly; 20- control unit; 201- control board; 202- control button; 21- upper limit sensor; 22- lower limit sensor; Z- direction. DETAILED DESCRIPTION

[0023] The specific structures and functional details disclosed herein are merely representative and are for the purpose of describing exemplary embodiments of the present application. However, the present application can be embodied in many alternative forms and should not be interpreted as being limited to only the embodiments set forth herein.

[0024] In the description of the present application, it needs to be understood that the terms "center", "transverse", "upper", "lower", "left", "right", "vertical", "horizontal", "top", "bottom", "inner", "outer" and the like indicate the orientation or positional relationship based on the orientation or positional relationship shown in the drawings, and are only for the convenience of describing the present application and simplifying the description, and do not indicate or imply that the device or component referred to must have a particular orientation or be constructed and operated in a particular orientation, and therefore cannot be understood as a limitation on the present application. In addition, the terms "first", "second" are only for the purpose of description, and cannot be understood as indicating or implying relative importance or implicitly indicating the number of the technical features indicated. Therefore, the features defined as "first", "second" can be explicitly or implicitly included one or more of the features. In the description of the present application, unless otherwise specified, the meaning of "a plurality of" is two or more. In addition, the term "comprising" and any variations thereof mean "at least including".

[0025] In the description of the present application, it needs to be understood that unless otherwise explicitly specified and limited, the terms "mounting", "connecting", "connecting" should be understood broadly, for example, it can be fixedly connected, or it can be detachably connected, or it can be integrally connected; it can be mechanically connected, or it can be electrically connected; it can be directly connected, or it can be indirectly connected through an intermediate medium, or it can be connected inside two components. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0026] The terms used herein are only used to describe specific embodiments and are not intended to limit the exemplary embodiments. Unless the context clearly indicates otherwise, as used herein, the singular form "a", "an" and "the" is also intended to include the plural. It should also be understood that the terms "including" and / or "containing" as used herein specify the existence of the stated features, integers, steps, operations, units and / or components, and do not exclude the existence or addition of one or more other features, integers, steps, operations, units, components and / or combinations thereof.

[0027] The following describes the embodiments of the present application by specific specific embodiments, and those skilled in the art can easily understand other advantages and effects of the present application from the content disclosed in the specification.

[0028] Please also refer to Figure 1 and Figure 2 , Figure 1 is a structural schematic view of the first embodiment of the lamp strip aging test fixture 10 in the retracted state, Figure 2is a structural schematic view of a first embodiment of the present application when the lamp strip aging test fixture 10 is extended. To achieve at least one of the above advantages or other advantages, the first embodiment of the present application provides a lamp strip aging test fixture 10 for aging test of a lamp strip 11. As shown in the figure, the lamp strip aging test fixture 10 includes a first hinge disc 12, a second hinge disc 13, a connecting rod 14, a lamp strip aging test rod 15, a fixing rod 16, a power supply socket 17 and a power supply assembly 18.

[0029] The first hinge disc 12 and the second hinge disc 13 respectively make the first hinge belt 121 and the second hinge belt 131 on the discs extend in the same direction Z. Specifically, when the lamp strip 11 is to be subjected to aging test, the first hinge disc 12 and the second hinge disc 13 will extend the first hinge belt 121 and the second hinge belt 131 outward to form a frame for accommodating the lamp strip 11; when the aging test of the lamp strip 11 is completed, the first hinge disc 12 and the second hinge disc 13 will retract the first hinge belt 121 and the second hinge belt 131 inward to save production space.

[0030] The left and right ends of the connecting rod 14 are respectively connected to the first hinge disc 12 and the second hinge disc 13 transversely. The left and right ends of the fixing rod 16 are respectively fixed to the first hinge belt 121 and the second hinge belt 131. In this embodiment, the lamp strip aging test rod 15 is made of metal.

[0031] Further, when the lamp strip 11 is to be subjected to aging test, the first hinge disc 12 and the second hinge disc 13 will extend the first hinge belt 121 and the second hinge belt 131 downward, thereby moving the fixing rod 16 downward. The first hinge belt 121, the second hinge belt 131, the connecting rod 14 and the fixing rod 16 form a frame for accommodating the lamp strip 11, and the lamp strip aging test rod 15 is installed in the frame. In other words, one end of the lamp strip aging test rod 15 is fixed to the connecting rod 14, the other end is connected to the fixing rod 16 and is located between the first hinge belt 121 and the second hinge belt 131 to bear the lamp strip 11. When the aging test of the lamp strip 11 is completed, after the lamp strip aging test rod 15 made of metal is removed, the first hinge disc 12 and the second hinge disc 13 will retract the first hinge belt 121 and the second hinge belt 131 upward to save production space.

[0032] One end of each lamp strip aging test rod 15 is provided with a power supply socket 17 for electrical connection with the lamp strip 11 to perform aging test of the lamp strip 11. The power supply assembly 18 is electrically connected to each power supply socket 17 to provide power.

[0033] In the embodiment, the stretching direction Z of the first hinge belt 121 and the second hinge belt 131 is vertical direction, that is, the vertical direction perpendicular to the horizontal plane. However, the present application is not limited thereto, and the stretching direction Z can be selected according to actual needs, such as the direction inclined to the horizontal plane or the horizontal direction.

[0034] In an embodiment, the first hinge belt 121 and the second hinge belt 131 are stretched synchronously, which is beneficial to manufacturing and control. In addition, the operation of stretching the first hinge belt 121 and the second hinge belt 131 on the first hinge disc 12 and the second hinge disc 13 in the same direction Z can be completed by manpower, such as manually rotating the hinge disc to control the stretching of the hinge belt.

[0035] In an embodiment, as shown in Figure 2 The lamp strip aging test jig 10 can further include a control unit 20. The control unit 20 is electrically connected to the power supply assembly 18 to obtain power. The control unit 20 controls the first hinge disc 12 and the second hinge disc 13 to stretch the first hinge belt 121 and the second hinge belt 131. Further, the control unit 20 includes a control panel 201 having a plurality of control buttons 202, which are electrically connected to the plurality of power supply sockets 17 one by one, that is, one control button 202 corresponds to one power supply socket 17 to control the corresponding lamp strip 11 to perform aging test. When only part of the lamp strip 11 needs to be subjected to aging test, the corresponding control button 202 can be pressed to perform aging test, thereby saving energy consumption.

[0036] Further, the lamp strip aging test jig 10 can further include an upper limit sensor 21 and a lower limit sensor 22. The upper limit sensor 21 and the lower limit sensor 22 are used to sense the position of the first hinge belt 121 and the second hinge belt 131 and generate a sensing signal transmitted to the control unit 20. The control unit 20 controls the first hinge disc 12 and the second hinge disc 13 to stretch the first hinge belt 121 and the second hinge belt 131 according to the sensing signal. That is, by sensing the first hinge belt 121 and the second hinge belt 131 through the upper limit sensor 21 and the lower limit sensor 22, the stretching length of the first hinge belt 121 and the second hinge belt 131 is controlled.

[0037] Further, the sensing signal is generated by the upper limit sensor 21 and the lower limit sensor 22 according to the position of the first hinge belt 121 and the second hinge belt 131 sensed thereby. The upper limit sensor 21 and the lower limit sensor 22 can be arranged on the wall, or erected from the ground, or hung from the ceiling.

[0038] In an embodiment, the surface of the lamp strip aging test rod 15 is provided with heat-conducting insulating material, thereby enhancing the heat dissipation capacity of the lamp strip 11 during aging test.

[0039] In an embodiment, the interval distance between two adjacent lamp strip aging test bars 15 is equal, so as to facilitate the aging test of the lamp strip 11. In addition, when the lamp strip 11 is subjected to the aging test, the multiple lamp strip aging test bars 15 are arranged in a vertical arrangement with gaps therebetween, so as to facilitate the air circulation, thereby effectively reducing the temperature during the aging test, and thus, a separate cooling system is not required, and energy consumption is saved.

[0040] In an embodiment, the lamp strip aging test bar 15 can be designed to be widened, so as to facilitate the simultaneous test of multiple lamp strips 11 on one lamp strip aging test bar 15, and the efficiency is improved.

[0041] Please refer to Figure 3 and Figure 4 , Figure 3 is a structural schematic view of the lamp strip aging test fixture 30 of the second embodiment of the present application in the retracted state, Figure 4 is a structural schematic view of the lamp strip aging test fixture 30 of the second embodiment of the present application in the extended state. In order to achieve at least one of the above advantages or other advantages, the second embodiment of the present application further provides a lamp strip aging test fixture 30 for performing the aging test on the lamp strip 11. Compared with the lamp strip aging test fixture 10 of the first embodiment, the lamp strip aging test fixture 30 of the present embodiment is different only in that the lamp strip aging test bar 35 is made of a flexible material. Therefore, the lamp strip aging test bar 35 made of the flexible material does not need to be placed into the frame that can accommodate the lamp strip 11 after the frame is formed by the first hinge belt 121, the second hinge belt 131, the connecting rod 14 and the fixing rod 16. In other words, as shown in Figure 3 , when the lamp strip aging test fixture 30 is in the retracted state, the lamp strip aging test bar 35 made of the flexible material can be retracted into the connecting rod 14.

[0042] In combination with the arrangement of the control unit 20, the upper limit sensor 21 and the lower limit sensor 22, the automatic process of the aging test of the lamp strip 11 can be completed.

[0043] In summary, by using the lamp strip aging test fixture 10, 30 provided by the present application, when the lamp strip 11 is subjected to the aging test, the frame for placing the lamp strip 11 is formed by the outward extension of the first hinge belt 121 and the second hinge belt 131, and then the lamp strip 11 is placed on the lamp strip aging test bar 15, 35 for the aging test. After the test is completed, the hinge belt is retracted, so that the production space can be effectively saved. In addition, the lamp strip aging test bar 15 can be made of a metal material, and a heat-conducting insulating material is arranged on the surface thereof, so as to improve the heat dissipation problem. Based on this, gaps can be left between the multiple lamp strip aging test bars 15, and when the lamp strip 11 is subjected to the aging test, the multiple lamp strip aging test bars 15 are arranged in a vertical arrangement with gaps therebetween, so as to facilitate the air circulation, thereby effectively reducing the temperature during the aging test, and thus, a separate cooling system is not required, and energy consumption is saved.

[0044] The above merely describes preferred embodiments of the present application, and is not intended to limit the present application in any form. Although the present application has been disclosed with preferred embodiments as above, it is not intended to limit the present application. Any person skilled in the art can make some changes or modifications to the above disclosed methods and technical contents to make equivalent embodiments with equivalent changes, without departing from the technical solution of the present application. Any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present application, without departing from the technical solution of the present application, still belongs to the scope of the technical solution of the present application.

Claims

1. A lamp strip aging test fixture for performing an aging test on a lamp strip, the lamp strip aging test fixture comprising: The lamp strip aging test fixture comprises: a first hinge disc for enabling the first hinge belt to stretch and contract; a second hinge disc for enabling the second hinge belt to stretch and contract; a connecting rod, opposite ends of which are connected to the first hinge disc and the second hinge disc respectively; a plurality of lamp strip aging test rods, which are fixed to the connecting rod and located between the first hinge belt and the second hinge belt, for bearing the lamp strip; a fixing rod, opposite ends of which are fixed to the first hinge belt and the second hinge belt respectively and connected to the plurality of lamp strip aging test rods; a plurality of power supply sockets, which are arranged at one end of the plurality of lamp strip aging test rods respectively to be electrically connected with the lamp strip; and a power supply assembly electrically connected with the plurality of power supply sockets; wherein the first hinge belt and the second hinge belt stretch and contract in the same direction, and gaps are left between the plurality of lamp strip aging test rods; the first hinge belt, the second hinge belt, the connecting rod and the fixing rod form a frame for accommodating the lamp strip.

2. The lamp strip burn-in test fixture of claim 1, wherein, The first hinge belt and the second hinge belt stretch and contract synchronously.

3. The lamp strip burn-in test fixture of claim 1, wherein, The first hinge belt and the second hinge belt stretch and contract in the vertical direction.

4. The lamp strip burn-in test fixture of claim 1, wherein, The lamp strip aging test fixture further comprises a control unit electrically connected with the power supply assembly for controlling the first hinge disc and the second hinge disc to enable the first hinge belt and the second hinge belt to stretch and contract.

5. The lamp strip burn-in test fixture of claim 4, wherein, The control unit comprises a control panel having a plurality of control buttons electrically connected with the plurality of power supply sockets one by one.

6. The lamp strip burn-in test fixture of claim 4, wherein, The lamp strip aging test fixture further comprises an upper limit sensor and a lower limit sensor for sensing the positions of the first hinge belt and the second hinge belt and generating sensing signals to be transmitted to the control unit, and the control unit controls the first hinge disc and the second hinge disc to enable the first hinge belt and the second hinge belt to stretch and contract according to the sensing signals.

7. The lamp strip burn-in test fixture of claim 1, wherein, The plurality of lamp strip aging test rods are made of flexible material.

8. The lamp strip burn-in test fixture of claim 1, wherein, The plurality of lamp strip aging test rods are made of metal material.

9. The lamp strip burn-in test fixture of claim 8, wherein, The surfaces of the plurality of lamp strip aging test rods are provided with heat-conducting insulating material.

Citation Information

Patent Citations

  • Lamp strip aging test fixture

    CN212540632U