Ion source imaging device

Abstract

The invention discloses an ion source imaging device. The ion source imaging device comprises an ion source cavity, an ion source power-on module, a reflector, a light-transmitting seal, an imaging lens, a lens support and an image acquisition mechanism. The ion source cavity has a sample window and a light reflection window. The ion source power-on module is arranged in the ion source cavity and close to the sample window. The light-transmitting seal seals the light reflection window. The lens support is located outside the ion source cavity and connected to the ion source cavity. The lens support has a reflection channel, one end of the reflection channel is opposite to the sample window. The imaging lens is rotatably connected to the lens support and communicates with the other end of the reflection channel. The image acquisition mechanism is connected to the imaging lens. The ion source cavity and the reflection channel are both provided with reflectors. The reflectors in the ion source cavity and the reflection channel can emit the image of the target plate into the imaging lens. The ion source imaging device has a simple structure and is easy to operate.

Description

Technical Field

[0001] The present invention relates to the field of detection, and particularly to an ion source imaging device. Background Art

[0002] Matrix-assisted laser desorption / ionization time-of-flight mass spectrometer (MALDI-TOF MS) is a type of bio-mass spectrometer commonly used for the analysis of macromolecular samples. When analyzing a sample, the sample is usually formed into a solid on the sample target, and then the sample target in the sample introduction chamber is transferred to a moving platform in a vacuum state through a lifting device. The ions with initial dispersion are accelerated, focused, and deflected by the electric field generated by the combination of the pole piece and the electrical system and introduced into the field-free flight region. After separating ions of different masses, they are successively sent into the detector for detection. In this process, first, the sample target needs to be moved to the focal position of the laser focus, and then the deposition situation of the sample is observed. During the process of observing the sample target point, the imaging optical path of the sample needs to meet the imaging requirements of being fast, accurate, and clear. At this time, the imaging optical path of the ion source is particularly important, and factors such as the shape of the imaging lens, the fixing method, the working distance and imaging angle of the imaging camera will all affect the final imaging effect. The existing imaging optical path structure has the disadvantages of complex structure, inconvenient adjustment, and blurred imaging. Summary of the Invention

[0003] Based on this, it is necessary to provide an ion source imaging device with a simple structure, small volume, convenient adjustment, and improved imaging effect for the imaging optical path device.

[0004] An ion source imaging device includes an ion source cavity, an ion source power supply module, a mirror, a light-transmitting seal, an imaging lens, a lens support, and an image acquisition mechanism. The ion source cavity has a sample window and a light reflection window. The ion source power supply module is arranged in the ion source cavity and close to the sample window. The light-transmitting seal is installed in the light reflection window to seal the light reflection window. The lens support is located outside the ion source cavity and connected to the ion source cavity. The lens support has a reflection channel. One end of the reflection channel faces the sample window. The imaging lens is rotatably connected to the lens support and communicates with the other end of the reflection channel. The image acquisition mechanism is connected to the imaging lens. Mirrors are arranged both in the ion source cavity and in the reflection channel. The mirror in the ion source cavity and the mirror in the reflection channel can emit the image at the sample window into the imaging lens.

[0005] In one embodiment, the reflection channel is bent at a right angle, and the mirror in the reflection channel is used to reflect the light from the mirror in the ion source cavity at a right angle into the imaging lens.

[0006] In one embodiment, the mirror in the reflection channel is disposed at a right-angle corner of the reflection channel.

[0007] In one embodiment, the ion source imaging device further includes a mirror fixing member. The lens support member has a support member channel communicating with the reflection channel. The mirror fixing member has a placement platform for placing the mirror. The placement platform extends into the reflection channel through the support member channel. The mirror fixing member is connected to the lens support member.

[0008] In one embodiment, the mirror fixing member is detachably connected to the lens support member.

[0009] In one embodiment, the ion source imaging device further includes a screw. The mirror fixing member and the lens support member are detachably connected by the screw.

[0010] In one embodiment, the ion source imaging device further includes a lens nut. One end of the lens support member facing the imaging lens has a boss. The outer peripheral wall of the boss has a thread. The outer peripheral wall of one end of the imaging lens facing the lens support member has a thread. The imaging lens abuts against the boss. The lens nut is threadedly connected to the imaging lens and the lens support member to connect the imaging lens and the lens support member.

[0011] In one embodiment, the image acquisition mechanism is an industrial camera.

[0012] In one embodiment, the mirror is a right-angled triangular prism.

[0013] In one embodiment, the image acquisition mechanism is threadedly connected to the imaging lens.

[0014] The imaging optical path device of the above ion source imaging device has a simple structure, small volume, convenient adjustment, and can display the sample target quickly, accurately, and clearly to improve the imaging effect. During the test, the sample points on the target plate can be reflected by two reflectors to the imaging lens and then acquired by the image acquisition mechanism, so that the actual situation of the sample target on the target plate can be viewed on the computer display screen. During installation, first connect the imaging lens and the image acquisition mechanism together, and then connect the imaging lens to the lens support. Since the imaging lens and the lens support can rotate, it is possible to ensure that the position of the image acquisition mechanism is in the direction required for the test, improving the imaging effect of the target. For example, during installation, after the image acquisition mechanism is connected to the imaging lens at one angle, the image acquisition mechanism may not be precisely at the predetermined angle. At this time, only the position between the imaging lens and the lens support needs to be adjusted, and the image acquisition mechanism can reach the predetermined angle by rotating the imaging lens. The adjustment is convenient, time-saving, and can improve the imaging effect.

[0015] The above ion source imaging device is provided with a reflection channel that is bent at a right angle. The reflector in the reflection channel is used to reflect the light from the reflector in the ion source cavity at a right angle into the imaging lens, so that the volume of the entire ion source imaging device can be reduced.

[0016] The above ion source imaging device is provided with a lens nut. During installation, first connect the imaging lens and the image acquisition mechanism together, and then connect the imaging lens to the lens support. After ensuring that the position of the image acquisition mechanism is in the required direction, the lens nut can be tightened; during the test, when it is found that the position of the industrial camera has deviated from the set position, the lens nut can also be loosened and then the image acquisition mechanism can be adjusted to the set position and then the lens nut can be tightened. It is convenient to operate, and at the same time, the image acquisition mechanism can be fixed arbitrarily within 360°, improving the imaging effect of the target.

[0017] The above ion source imaging device is provided with a right-angled prism as the reflector and the distance between the imaging lens and the sample target on the target plate is very short. The right-angled prism is not easily deformed and has a high reflectivity, which can improve the imaging effect. Description of the Drawings

[0018] Figure 1 It is a side schematic view of the ion source imaging device described in an embodiment;

[0019] Figure 2 For Figure 1 The schematic diagram of the component structure of the ion source imaging device shown;

[0020] Figure 3 For Figure 2 The side schematic diagram of the component structure of the ion source imaging device shown;

[0021] Figure 4Crystallization imaging diagram of ACTH sample obtained by a traditional imaging device;

[0022] Figure 5 Crystallization imaging diagram of SNP site gene sample obtained by a traditional imaging device;

[0023] Figure 6 For Figure 1 Crystallization imaging diagram of ACTH sample obtained by the ion source imaging device shown;

[0024] Figure 7 For Figure 1 Crystallization imaging diagram of SNP site gene sample obtained by the ion source imaging device shown.

[0025] Explanation of reference numerals

[0026] 10: Ion source imaging device; 100: Ion source cavity; 110: Sample window; 120: Light reflection window; 200: Ion source power supply module; 300: Reflector; 400: Transparent seal; 500: Imaging lens; 600: Lens support; 610: Reflection channel; 620: Boss; 700: Image acquisition mechanism; 800: Reflector fixing member; 900: Lens nut; 20: Target plate. Detailed implementation manners

[0027] For ease of understanding of the present invention, the present invention will be described more comprehensively below with reference to the relevant drawings. Preferred embodiments of the present invention are shown in the drawings. However, the present invention can be implemented in many different forms and is not limited to the embodiments described herein. On the contrary, these embodiments are provided so that the understanding of the disclosure of the present invention is more thorough and comprehensive.

[0028] It should be noted that when an element is referred to as being "fixed to" another element, it can be directly fixed to the other element or there may also be an intermediate element. When an element is considered to be "connected to" another element, it can be directly connected to the other element or there may be an intermediate element at the same time. When an element is considered to be "mounted on" another element, it can be directly mounted on the other element or there may be an intermediate element at the same time. When an element is considered to be "provided in" another element, it can be directly provided in the other element or there may be an intermediate element at the same time.

[0029] Unless otherwise defined, all technical and scientific terms used herein have the same meaning as commonly understood by those skilled in the technical field to which the present invention belongs. The terms used herein in the specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. The term "and / or" used herein includes any and all combinations of one or more of the related listed items.

[0030] See Figure 1 As shown, an embodiment of the present invention provides an ion source imaging device 10, which includes an ion source cavity 100, an ion source power supply module 200, a mirror 300, a light-transmitting seal 400, an imaging lens 500, a lens support 600, and an image acquisition mechanism 700.

[0031] The ion source cavity 100 has a sample window 110 and a light reflection window 120. Among them, see Figure 1 and Figure 2 As shown, the sample window 110 is located at the bottom surface of the ion source cavity 100, and the light reflection window 120 is located on the side surface of the ion source cavity 100. The outside of the sample window 110 is used to place the target plate 20. The ion source power supply module 200 is arranged in the ion source cavity 100 and close to the sample window 110. The ion source power supply module 200 is used to accelerate the sample from the target plate 20.

[0032] The light-transmitting seal 400 is installed in the light reflection window 120 to seal the light reflection window 120. The light-transmitting seal 400 is used to seal the light reflection window 120.

[0033] The lens support 600 is located outside the ion source cavity 100 and connected to the ion source cavity 100. The lens support 600 has a reflection channel 610. One end of the reflection channel 610 faces the sample window 110. The imaging lens 500 is rotatably connected to the lens support 600 and communicates with the other end of the reflection channel 610.

[0034] The image acquisition mechanism 700 is connected to the imaging lens 500. Mirrors 300 are provided both in the ion source cavity 100 and in the reflection channel 610. The mirror 300 in the ion source cavity 100 and the mirror 300 in the reflection channel 610 can emit the image at the sample window 110 into the imaging lens 500.

[0035] Preferably, the reflection channel 610 is bent at a right angle. The mirror 300 in the reflection channel 610 is used to reflect the light from the mirror 300 in the ion source cavity 100 at a right angle into the imaging lens 500. The above ion source imaging device 10 is provided with the reflection channel 610 bent at a right angle. See Figure 1 and Figure 3 As shown, the mirror 300 in the reflection channel 610 is used to reflect the light from the mirror 300 in the ion source cavity 100 at a right angle into the imaging lens 500, so that the volume of the entire ion source imaging device 10 can be reduced. The above setting can make the imaging lens 500 close to the outer wall of the ion source cavity 100, reduce the volume of the entire ion source imaging device 10, and the reflection channel 610 bent at a right angle can also shorten the light reflection distance and improve the imaging quality.

[0036] Furthermore, the mirror 300 in the reflection channel 610 is disposed at the right-angle corner of the reflection channel 610. In this way, the mirror 300 is set at an angle of 45°, so that the light at one end of the reflection channel 610 with a right-angle bend can be reflected to the other end, that is, the light on the mirror 300 in the ion source cavity 100 can be reflected at a right angle into the imaging lens 500, realizing the right-angle bending reflection of the light.

[0037] Furthermore, the ion source imaging device 10 further includes a mirror fixing member 800. The lens support member 600 has a support member channel communicating with the reflection channel 610. The mirror fixing member 800 has a placement platform for placing the mirror 300. The platform of the mirror 300 extends into the reflection channel 610 through the support member channel, and the mirror fixing member 800 is connected to the lens support member 600.

[0038] Optionally, the mirror fixing member 800 is detachably connected to the lens support member 600.

[0039] Furthermore, the ion source imaging device 10 further includes a screw. The mirror fixing member 800 and the lens support member 600 are detachably connected by the screw. Specifically, both the mirror fixing member 800 and the lens support member 600 have threaded holes, the screw has an external thread, and the screw is inserted into the threaded holes of the mirror fixing member 800 and the lens support member 600 to fix the mirror fixing member 800 and the lens support member 600.

[0040] In one embodiment, the ion source imaging device 10 further includes a lens nut 900. One end of the lens support member 600 facing the imaging lens 500 has a boss 620, the outer peripheral wall of the boss 620 has a thread, the outer peripheral wall of one end of the imaging lens 500 facing the lens support member 600 has a thread, the imaging lens 500 abuts against the boss 620, and the lens nut 900 is threadedly connected to the imaging lens 500 and the lens support member 600 to connect the imaging lens 500 and the lens support member 600. The above ion source imaging device 10 is provided with the lens nut 900. During installation, first connect the imaging lens 500 and the image acquisition mechanism 700 together, then connect the imaging lens 500 and the lens support member 600, and after ensuring that the position of the image acquisition mechanism 700 is in the required direction, the lens nut 900 can be tightened; during the test, when it is found that the position of the industrial camera has deviated from the set position, the lens nut 900 can also be loosened and then the image acquisition mechanism 700 can be adjusted to the set position and then the lens nut 900 can be tightened, which is convenient for operation, and at the same time can ensure that the image acquisition mechanism 700 can be arbitrarily fixed within 360°, improving the imaging effect of the target point.

[0041] In one embodiment, the image acquisition mechanism 700 is an industrial camera.

[0042] In one embodiment, the mirror 300 is a right-angled triangular prism. The size of the mirror 300 of the right-angled triangular prism is 10 mm × 10 mm × 10 mm. The above ion source imaging device 10 is provided with a right-angled triangular prism as the mirror 300 and the distance between the imaging lens 500 and the sample target point on the target plate 20 is very short. Since the right-angled triangular prism is not easily deformed and has a high reflectivity, the imaging effect can be improved.

[0043] In one embodiment, the image acquisition mechanism 700 is threadedly connected to the imaging lens 500. With such a setting, the stability of the connection between the image acquisition mechanism 700 and the imaging lens 500 can be achieved.

[0044] When the ion source imaging device 10 of the present invention is installed, after the image acquisition mechanism 700 is connected to the imaging lens 500 at one angle, the image acquisition mechanism 700 may not be precisely at the predetermined angle. At this time, only the position between the imaging lens 500 and the lens support 600 needs to be adjusted. By rotating the imaging lens 500, the image acquisition mechanism 700 can reach the predetermined angle, or by rotating the lens nut 900 to loosen, the lens support 600 and the imaging lens 500 are loosened, and rotating the imaging lens 500 can also make the image acquisition mechanism 700 in the predetermined position. Then, by tightening the lens nut 900, the fixation between the lens support 600 and the imaging lens 500 is achieved. The adjustment is convenient, time-saving, and can improve the imaging effect.

[0045] Comparative Example 1

[0046] In this comparative example, on the basis of the above embodiment, the mirrors 300 are all replaced with thin mirrors, and the size of the thin mirrors is 10 mm × 10 mm × 0.5 mm. The crystal imaging diagrams obtained when the mirror 300 is a right-angled triangular prism with a size of 10 mm × 10 mm × 10 mm are as Figure 4 shown, where Figure 4 , Figure 5 in, Figure 4 is the crystal imaging diagram of the ACTH sample, Figure 5 is the crystal imaging diagram of the SNP site gene sample. The crystal imaging diagrams obtained when the mirror 300 is a right-angled triangular prism with a size of 10 mm × 10 mm × 0.5 mm are as Figure 6 , 7 shown, where Figure 6 in, the left side is the crystal imaging diagram of the ACTH sample, Figure 7 is the crystal imaging diagram of the SNP site gene sample. Comparing Figure 4 and Figure 6 , comparing Figure 5 and Figure 7It can be seen that the ion source imaging device 10 using a right-angled triangular prism as a reflector has a significantly better crystallization imaging effect than an ordinary thin reflector.

[0047] The imaging optical path device of the above ion source imaging device 10 has a simple structure, a small volume, is convenient to adjust, and can quickly, accurately, and clearly display the sample target to improve the imaging effect. During the test, the sample point on the target plate 20 can be reflected by two reflectors 300 to the imaging lens 500 and then acquired by the image acquisition mechanism 700, so that the actual situation of the sample target on the target plate 20 can be viewed on the computer display screen. During installation, first connect the imaging lens 500 and the image acquisition mechanism 700 together, and then connect the imaging lens 500 to the lens support 600. Since the imaging lens 500 and the lens support 600 can rotate, the position of the image acquisition mechanism 700 can be ensured to be in the direction required for the test, improving the imaging effect of the target.

[0048] The technical features of the above-described embodiments can be combined arbitrarily. For the sake of brevity of description, not all possible combinations of the technical features in the above-described embodiments are described. However, as long as there is no contradiction in the combination of these technical features, it should be considered as the scope described in this specification.

[0049] The above-described embodiments only represent several implementation manners of the present invention, and their descriptions are relatively specific and detailed, but they should not be construed as limiting the scope of the patent of the present invention. It should be noted that for those of ordinary skill in the art, without departing from the concept of the present invention, several modifications and improvements can still be made, and these all belong to the protection scope of the present invention. Therefore, the protection scope of the patent of the present invention should be subject to the appended claims.

Claims

1. An ion source imaging device, characterized in that: The invention comprises an ion source chamber, an ion source power-on module, a reflector, a light-transmitting seal, an imaging lens, a lens support and an image acquisition mechanism, wherein the ion source chamber has a sample window and a light reflection window, the ion source power-on module is arranged in the ion source chamber and close to the sample window, the light-transmitting seal is installed in the light reflection window to seal the light reflection window, the lens support is located outside the ion source chamber and connected to the ion source chamber, the lens support has a reflection channel, one end of the reflection channel is opposite to the sample window, the imaging lens is rotatably connected to the lens support and communicates with the other end of the reflection channel, the image acquisition mechanism is connected to the imaging lens, the reflector is arranged in the ion source chamber and in the reflection channel, the reflector in the ion source chamber and the reflector in the reflection channel can emit the image at the sample window to the imaging lens.

2. The ion source imaging device according to claim 1, characterized in that: The reflection channel is bent at a right angle, and the reflection mirror in the reflection channel is used to reflect the light from the reflection mirror in the ion source cavity at a right angle to the imaging lens.

3. The ion source imaging device according to claim 1, characterized in that: The reflector in the reflective channel is arranged at a right-angle corner of the reflective channel.

4. The ion source imaging device according to claim 3, characterized in that: The ion source imaging device also includes a reflector fixing member, the lens support member has a support member channel connected to the reflection channel, the reflector fixing member has a placement platform for placing the reflector, the placement platform extends into the reflection channel through the support member channel, and the reflector fixing member is connected to the lens support member.

5. The ion source imaging device according to claim 4, characterized in that: The reflector fixing member is detachably connected to the lens supporting member.

6. The ion source imaging device according to claim 5, characterized in that: The ion source imaging device further comprises a screw rod, and the reflector fixing member and the lens supporting member are detachably connected via the screw rod.

7. The ion source imaging device according to any one of claims 1 to 6, characterized in that: The ion source imaging device also includes a lens nut, the lens support has a boss at one end facing the imaging lens, the outer peripheral wall of the boss has a thread, the outer peripheral wall of the imaging lens at one end facing the lens support has a thread, the imaging lens abuts against the boss, and the lens nut is threadedly connected to the imaging lens and the lens support to achieve the connection between the imaging lens and the lens support.

8. The ion source imaging device according to any one of claims 1 to 6, characterized in that: The image acquisition mechanism is an industrial camera.

9. The ion source imaging device according to any one of claims 1 to 6, characterized in that: The reflecting mirror is a right-angle prism.

10. The ion source imaging device according to any one of claims 1 to 6, characterized in that: The image acquisition mechanism is threadedly connected to the imaging lens.

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