A multi-pin double-pin test device for connectors

Abstract

The present invention relates to the field of automatic detection, and discloses a multi-PIN double-pin test device for a connector, including a pressure plate mechanism, a test mechanism, and a top block mechanism. The pressure plate mechanism clamps and fixes the connector to be tested, and then the pressure plate mechanism presses the connector to be tested onto the test mechanism. The top block mechanism drives the test mechanism to move upward, driving the four groups of test pins thereon to contact the PIN pins of the connector to be tested, forming a Kelvin four-wire detection. By using separate electrodes for carrying current and voltage detection, the impedance of the PIN pins of the connector to be tested is tested. Compared with the traditional two-terminal test, the present invention eliminates the impedance of wiring and contact resistance, and the test results are more accurate. At the same time, the manual test is replaced by the machine automatic test, and the test speed is faster and the reliability is higher.

Description

Technical Field

[0001] The invention relates to the field of automatic detection, and in particular to a multi-PIN double-needle testing device for a connector. Background Art

[0002] In order to achieve the purpose of automatic control or transmission interaction, electronic devices need to use connectors as a medium for signal transmission. The most common one is the PIN connector. One end of the PIN is connected to the wiring harness, and the other end is plugged into the corresponding electronic device communication interface.

[0003] PIN connectors need to undergo strict quality testing before leaving the factory, including testing the impedance and continuity between the PIN pins.

[0004] In the prior art, the continuity test and impedance test of the PIN pin are completed manually. The worker needs to put the PIN pin connector into a special test tool, and contact the conductive probe on the test tool with the PIN pin connector. By detecting whether there is current passing through the PIN pin, it is determined whether the PIN pin can be powered, and then the impedance value of the PIN pin is measured by calculation. This test method not only cannot accurately test the impedance between the PIN pins, but also has low efficiency and is prone to test errors due to the negligence of the workers. Summary of the invention

[0005] The purpose of the present invention is to provide a multi-PIN double-pin test device for a connector to solve the problem in the prior art that the impedance between PIN pins cannot be accurately and efficiently tested.

[0006] To achieve this object, the present invention adopts the following technical solutions:

[0007] A multi-PIN double-pin test device for a connector, comprising a pressing plate mechanism, a testing mechanism and a top block mechanism;

[0008] The pressing plate mechanism is configured to be fixedly connected to the base, and the pressing plate mechanism is located above the testing mechanism, and is used to clamp the connector to be tested and press the connector to be tested onto the testing mechanism;

[0009] The testing mechanism is connected to the base, and comprises a left flat-head testing needle group, a left pointed-head testing needle group, a right flat-head testing needle group and a right pointed-head testing needle group, wherein the left flat-head testing needle group and the left pointed-head testing needle group are arranged on the left side of the testing mechanism, and the right flat-head testing needle group and the right pointed-head testing needle group are arranged on the right side of the testing mechanism;

[0010] The lifting block mechanism is configured to be fixedly connected to the base. The lifting block mechanism is located below the testing mechanism and is used to lift the testing mechanism upward so that the testing mechanism contacts the PIN pin of the connector to be tested.

[0011] Preferably, the testing mechanism further comprises a testing platform, a guide column, a spring and a testing needle fixing block;

[0012] The test bench is fixedly connected to the base;

[0013] The guide column is movably connected below the test bench;

[0014] The spring is sleeved on the outer ring of the guide column and is located between the test bench and the test needle fixing block;

[0015] The test needle fixing block is located below the guide column and is fixedly connected to the guide column and the spring. The left flat-head test needle group, the left pointed-head test needle group, the right flat-head test needle group and the right pointed-head test needle group are respectively fixed on the test needle fixing block.

[0016] Preferably, the left flat-head test needle group is located outside the left pointed-head test needle group; and the right flat-head test needle group is located outside the right pointed-head test needle group.

[0017] Preferably, the left pointed test needle group and the right pointed test needle group are at the same height, the left flat test needle group and the right flat test needle group are at the same height, and the height of the left pointed test needle group and the right pointed test needle group are not lower than the height of the left flat test needle group and the right flat test needle group.

[0018] Preferably, the multi-PIN double-needle test device of the connector further comprises a fine-tuning slide, which is fixedly connected below the test mechanism and is used for fine-tuning the pressing position of the pressure plate mechanism relative to the test mechanism.

[0019] Preferably, a multi-PIN double-needle test device for a connector comprises at least two workstations, and each of the workstations comprises the pressing plate mechanism, the testing mechanism, the ejecting block mechanism and the fine-tuning slide.

[0020] Preferably, the pressure plate mechanism includes a pressure plate, a clamp and a pressure plate driving mechanism, the pressure plate is movably connected to the base; the clamp is fixedly connected to the pressure plate for clamping the connector to be tested; the pressure plate driving mechanism is fixedly connected to the base for driving the pressure plate to rise or fall.

[0021] Preferably, the top block mechanism comprises a top block and a top block driving mechanism, and the top block driving mechanism is fixedly connected to the base and is used for driving the top block to rise or fall.

[0022] Preferably, a positioning hole is formed on the test bench, and the test bench is fixedly connected to the base via fasteners and the positioning hole.

[0023] Preferably, the material of the testing mechanism is subjected to magnetic isolation treatment.

[0024] The beneficial effects of the present invention are:

[0025] The present invention provides a multi-PIN double-pin test device for connectors. The pressure plate mechanism clamps the connector to be tested and presses it onto the test mechanism. The top block mechanism drives four test pin groups in the test mechanism to contact the PIN pins of the connector to be tested, forming a Kelvin four-wire test, also known as a four-terminal test. By using separate current-carrying and voltage-detecting electrodes, the impedance of the PIN pins of the connector to be tested is tested. Compared with the traditional two-terminal test, the present invention eliminates the impedance of wiring and contact resistance, and the test results are more accurate. At the same time, the manual test is replaced by the machine automatic test, and the test speed is faster and the reliability is higher. BRIEF DESCRIPTION OF THE DRAWINGS

[0026] Figure 1 It is a schematic diagram of the overall structure of a multi-PIN double-pin test device for a connector provided by the present invention;

[0027] Figure 2 It is a schematic diagram of a single-station structure of a multi-PIN double-needle test device for a connector provided by the present invention;

[0028] Figure 3 The schematic diagram of the local structure of the test needle group and the connector to be tested involved in the present invention is Figure 1 ;

[0029] Figure 4 The schematic diagram of the local structure of the test needle group and the connector to be tested involved in the present invention is Figure 2 .

[0030] In the figure: 1-pressing plate mechanism; 11-pressing plate; 12-clamp; 13-pressing plate driving mechanism; 2-testing mechanism; 21-left flat-head test needle group; 22-left pointed-head test needle group; 23-right flat-head test needle group; 24-right pointed-head test needle group; 25-testing table; 26-guide column; 27-test needle fixing block; 3-lifting block mechanism; 31-lifting block; 32-lifting block driving mechanism; 4-fine-tuning slide; 100-connector to be tested. DETAILED DESCRIPTION

[0031] The present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. It is to be understood that the specific embodiments described herein are only used to explain the present invention, rather than to limit the present invention. It should also be noted that, for ease of description, only the parts related to the present invention, rather than all structures, are shown in the accompanying drawings.

[0032] In the description of the present invention, unless otherwise clearly specified and limited, the terms "connected", "connected", and "fixed" should be understood in a broad sense, for example, it can be a fixed connection, a detachable connection, or an integral connection; it can be a mechanical connection or an electrical connection; it can be a direct connection or an indirect connection through an intermediate medium, it can be the internal connection of two elements or the interaction relationship between two elements. For ordinary technicians in this field, the specific meanings of the above terms in the present invention can be understood according to specific circumstances.

[0033] In the present invention, unless otherwise clearly specified and limited, a first feature being "above" or "below" a second feature may include that the first and second features are in direct contact, or may include that the first and second features are not in direct contact but are in contact through another feature between them. Moreover, a first feature being "above", "above" and "above" a second feature includes that the first feature is directly above and obliquely above the second feature, or simply indicates that the first feature is higher in level than the second feature. A first feature being "below", "below" and "below" a second feature includes that the first feature is directly below and obliquely below the second feature, or simply indicates that the first feature is lower in level than the second feature.

[0034] In the description of this embodiment, the terms "upper", "lower", "right", etc., directions or positional relationships are based on the directions or positional relationships shown in the drawings, and are only for the convenience of description and simplification of operation, rather than indicating or implying that the device or element referred to must have a specific direction, be constructed and operated in a specific direction, and therefore cannot be understood as limiting the present invention. In addition, the terms "first" and "second" are only used to distinguish in the description and have no special meaning.

[0035] like Figure 1-Figure 4 As shown, an embodiment of the present invention provides a multi-PIN double-pin test device for a connector, comprising a pressure plate mechanism 1, a test mechanism 2 and a push block mechanism 3. The pressure plate mechanism 1 is configured to be fixedly connected to a base, and the pressure plate mechanism 1 is located above the test mechanism 2, and is used to clamp the connector 100 to be tested, and press the connector 100 to be tested onto the test mechanism 2. The test mechanism 2 includes a left flat-head test needle group 21, a left pointed-head test needle group 22, a right flat-head test needle group 23 and a right pointed-head test needle group 24, and the left flat-head test needle group 21 and the left pointed-head test needle group 22 are arranged on the left side of the test mechanism 2, and the right flat-head test needle group 23 and the right pointed-head test needle group 24 are arranged on the right side of the test mechanism 2. The push block mechanism 3 is configured to be fixedly connected to a base, and the push block mechanism 3 is located below the test mechanism 2, and is used to push the test mechanism 2 upwards so that the test mechanism 2 contacts the PIN pins of the connector 100 to be tested.

[0036] The multi-PIN double-pin test device for connectors provided by the present invention has a pressure plate mechanism 1 that clamps and fixes the connector to be tested, and then the pressure plate mechanism 1 presses the connector to be tested 100 onto the test mechanism 2, and the top block mechanism 3 drives the test mechanism 2 to move upward, driving the four groups of test pins thereon to contact the PIN pins of the connector to be tested 100, forming a Kelvin four-wire test, also known as a four-terminal test, using separate electrodes for carrying current and voltage detection to achieve the test of the PIN pin impedance of the connector to be tested 100. Compared with the traditional two-terminal test, the present invention eliminates the impedance of wiring and contact resistance, and the test results are more accurate. At the same time, the manual test is replaced by the machine automatic test, and the test speed is faster and the reliability is higher.

[0037] Preferably, the left flat-head test needle group 21 is located outside the left pointed-head test needle group 22; the right flat-head test needle group 23 is located outside the right pointed-head test needle group 24. By planting flat-head needles at the PIN pins of the connector 100 to be tested and planting pointed-head needles inside to form Kelvin four-wire detection, the problem of accuracy in low resistance testing is solved. In addition, the PIN pins of the connector 100 to be tested are pointed, so the test needle group connected to the PIN pin uses a flat head to effectively increase the contact area; the main structure of the PIN pin (non-PIN pin) is a thin sheet, which has a large contact area, so the test needle group connected to the main structure of the PIN pin (non-PIN pin) uses a pointed head to ensure contact, which reduces the volume of the test needle group and reduces the equipment cost.

[0038] Preferably, the test mechanism 2 also includes a test bench 25, a guide column 26, a spring and a test needle fixing block 27. The test bench 25 is fixedly connected to the base. The guide column 26 is movably connected to the bottom of the test bench 25. The spring is sleeved on the outer ring of the guide column 26 and is located between the test bench 25 and the test needle fixing block 27. The test needle fixing block 27 is located below the guide column 26 and is fixedly connected to the guide column 26 and the spring. The left flat test needle group 21, the left pointed test needle group 22, the right flat test needle group 23 and the right pointed test needle group 24 are respectively fixed on the test needle fixing block 27.

[0039] Exemplarily, when the test needle fixing block 27 is lifted upward by the lifting block mechanism 3, the spring is compressed, and the test needle fixing block 27 approaches the test table 25 along the guide column 26. When it moves to the working position, the left flat head test needle group 21, the left pointed head test needle group 22, the right flat head test needle group 23 and the right pointed head test needle group 24 all contact the PIN needles of the connector 100 to be tested.

[0040] Preferably, the left pointed test needle group 22 and the right pointed test needle group 24 are of equal height, the left flat test needle group 21 and the right flat test needle group 23 are of equal height, and the heights of the left pointed test needle group 22 and the right pointed test needle group 24 are not lower than the heights of the left flat test needle group 21 and the right flat test needle group 23. The PIN pins of the connector 100 to be tested are usually bent structures, so the heights of the test needle groups are arranged in a non-equal height structure accordingly.

[0041] Preferably, a multi-PIN double-pin test device for a connector further includes a fine-tuning slide 4, which is fixedly connected to the bottom of the test mechanism 2 and is used to fine-tune the pressing position of the pressure plate mechanism 1 relative to the test mechanism 2. Such a setting can ensure that the connector 100 to be tested clamped by the pressure plate mechanism 1 is in precise contact with the test mechanism 2, and prevent the position deviation of the device after repeated use, causing detection errors, or even detection failures.

[0042] Preferably, the multi-PIN double-needle test device of the connector includes at least two workstations, each of which includes a pressing plate mechanism 1, a testing mechanism 2, a top block mechanism 3 and a fine-tuning slide 4. In practical applications, the number of workstations can be flexibly selected according to the layout space and processing requirements, thereby improving the detection efficiency and avoiding equipment redundancy.

[0043] Preferably, the pressing plate mechanism 1 includes a pressing plate 11, a clamp 12 and a pressing plate driving mechanism 13. The pressing plate 11 is movably connected to the base; the clamp 12 is fixedly connected to the pressing plate 11 for clamping the connector 100 to be tested; the pressing plate driving mechanism 13 is fixedly connected to the base for driving the pressing plate 11 to rise or fall. In this embodiment, a cylinder is used as the pressing plate driving mechanism 13. In other embodiments, the cylinder can also be replaced by other power devices such as a motor and a hydraulic cylinder, but it is still within the protection scope of this patent.

[0044] Furthermore, the fixture 12 can be adaptively replaced according to the different objects to be tested, thereby enhancing the adaptability of the equipment.

[0045] Preferably, the top block mechanism 3 includes a top block 31 and a top block driving mechanism 32, and the top block driving mechanism 32 is fixedly connected to the base and is used to drive the top block 31 to rise or fall. In this embodiment, a cylinder is also used as the top block driving mechanism 32. In other embodiments, the cylinder can also be replaced by other power devices such as a motor and a hydraulic cylinder. Correspondingly, the top block 31 can also be a connecting rod mechanism or a magnetic attraction mechanism, but it is still within the protection scope of this patent.

[0046] Preferably, a positioning hole is opened on the test bench 25, and the test bench 25 is fixedly connected to the base through fasteners and the positioning hole.

[0047] Preferably, the material of the test mechanism 2 is treated with magnetic isolation to make the magnetic lines deviate from the detection device. Impedance detection is a precision test. In this embodiment, the connector 100 to be tested is magnetic. In order to prevent the magnetism of the connector 100 to be tested from interfering with the detection result, the material of the test mechanism 2 needs to be treated with magnetic isolation to make the magnetic lines deviate from the detection device.

[0048] The working process of the present invention is as follows: the clamp 12 on the pressure plate mechanism 1 clamps and fixes the connector 100 to be tested, and then the pressure plate 11 presses the connector 100 to be tested onto the test table 25 of the test mechanism 2, and the top block mechanism 3 drives the test pin fixing block 27 of the test mechanism 2 to move upward, driving the 4 groups of test pin groups thereon to contact the PIN pins of the connector 100 to be tested, forming a Kelvin four-wire detection, also known as a four-terminal detection, using separate current and voltage detection electrodes to realize the measurement of the PIN pin impedance of the connector 100 to be tested.

[0049] Obviously, the above embodiments of the present invention are merely examples for clearly illustrating the present invention, and are not intended to limit the embodiments of the present invention. For those skilled in the art, various obvious changes, readjustments and substitutions can be made without departing from the protection scope of the present invention. It is not necessary and impossible to list all the embodiments here. Any modifications, equivalent substitutions and improvements made within the spirit and principles of the present invention should be included in the protection scope of the claims of the present invention.

Claims

1. A multi-pin double-pin test device for a connector, characterized in that: It comprises a pressing plate mechanism (1), a testing mechanism (2) and a top block mechanism (3); The pressing plate mechanism (1) is configured to be fixedly connected to a base, the pressing plate mechanism (1) is located above the testing mechanism (2), and is used to clamp the connector to be tested (100) and press the connector to be tested (100) onto the testing mechanism (2); The testing mechanism (2) is connected to the base, and comprises a left flat-head test needle group (21), a left pointed-head test needle group (22), a right flat-head test needle group (23) and a right pointed-head test needle group (24); the left flat-head test needle group (21) and the left pointed-head test needle group (22) are arranged on the left side of the testing mechanism (2), and the right flat-head test needle group (23) and the right pointed-head test needle group (24) are arranged on the right side of the testing mechanism (2); The lifting block mechanism (3) is configured to be fixedly connected to a base, and the lifting block mechanism (3) is located below the test mechanism (2) and is used to lift the test mechanism (2) upwards so that the test mechanism (2) contacts the PIN pin of the connector (100) to be tested.

2. A multi-PIN double-needle test device for a connector according to claim 1, characterized in that: The testing mechanism (2) further comprises a testing table (25), a guide column (26), a spring and a testing needle fixing block (27); The test bench (25) is fixedly connected to the base; The guide column (26) is movably connected below the test bench (25); The spring is sleeved on the outer ring of the guide column (26) and is located between the test bench (25) and the test needle fixing block (27); The test needle fixing block (27) is located below the guide column (26) and is fixedly connected to the guide column (26) and the spring; the left flat-head test needle group (21), the left pointed-head test needle group (22), the right flat-head test needle group (23) and the right pointed-head test needle group (24) are respectively fixed on the test needle fixing block (27).

3. A multi-PIN double-needle test device for a connector according to claim 2, characterized in that: The left flat-head test needle group (21) is located outside the left pointed-head test needle group (22); and the right flat-head test needle group (23) is located outside the right pointed-head test needle group (24).

4. A multi-PIN double-needle test device for a connector according to claim 3, characterized in that: The left pointed test needle group (22) and the right pointed test needle group (24) are of the same height, the left flat test needle group (21) and the right flat test needle group (23) are of the same height, and the heights of the left pointed test needle group (22) and the right pointed test needle group (24) are not lower than the heights of the left flat test needle group (21) and the right flat test needle group (23).

5. A multi-PIN double-needle test device for a connector according to claim 1, characterized in that: The multi-PIN double-needle test device for the connector further comprises a fine-tuning slide table (4), wherein the fine-tuning slide table (4) is fixedly connected below the test mechanism (2) and is used for fine-tuning the pressing position of the pressure plate mechanism (1) relative to the test mechanism (2).

6. A multi-PIN double-needle test device for a connector according to claim 5, characterized in that: The multi-PIN double-needle test device of the connector comprises at least two workstations, each of which comprises the pressing plate mechanism (1), the testing mechanism (2), the top block mechanism (3) and the fine-tuning slide table (4).

7. A multi-PIN double-needle test device for a connector according to claim 1, characterized in that: The pressing plate mechanism (1) comprises a pressing plate (11), a clamp (12) and a pressing plate driving mechanism (13); the pressing plate (11) is movably connected to a base; the clamp (12) is fixedly connected to the pressing plate (11) and is used to clamp the connector to be tested (100); and the pressing plate driving mechanism (13) is fixedly connected to the base and is used to drive the pressing plate (11) to rise or fall.

8. A multi-pin double-needle test device for a connector according to claim 1, characterized in that: The top block mechanism (3) comprises a top block (31) and a top block driving mechanism (32); the top block driving mechanism (32) is fixedly connected to the base and is used to drive the top block (31) to rise or fall.

9. A multi-pin double-needle test device for a connector according to claim 2, characterized in that: A positioning hole is formed on the test bench (25), and the test bench (25) is fixedly connected to the base via a fastener and the positioning hole.

10. A multi-PIN double-pin test device for a connector according to claim 2, characterized in that: The material of the testing mechanism (2) has been subjected to magnetic isolation treatment.

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