A metallized separator film, a metallized separator film set and a metallized separator film capacitor

Abstract

The application discloses a metalized isolation film and a capacitor, wherein the metalized isolation film comprises a dielectric film and a metalized electrode; the metalized electrode is covered on the dielectric film, and the metalized electrode is divided into a non-divided electrode and metalized isolation units which are continuously repeated along the longitudinal direction by a first longitudinal insulating gap; each metalized isolation unit is connected with the non-divided electrode through a first-level fuse, and adjacent metalized isolation units are separated by a first transverse insulating gap; the metalized isolation units are divided into N-level divided electrodes by a second longitudinal insulating gap, and N is a natural number greater than or equal to 2; the equivalent resistance of a single mesh electrode of an N-level divided electrode after the corresponding N-level fuse is connected in parallel is greater than the equivalent resistance of a single mesh electrode of an N-1-level divided electrode after the corresponding N-1-level fuse is connected in parallel. The application can effectively isolate the metalized electrode when a part of the metalized electrode in the metalized isolation film is weakly clicked.

Description

Technical Field

[0001] This invention relates to the field of capacitor technology, and particularly to a metallized separator, a metallized separator assembly, and a metallized separator capacitor. Background Technology

[0002] With the rapid development of power electronics technology, metallized film capacitors are being used more and more widely in fields such as industrial control, new energy, automotive electronics, rail transportation, and power grids. At the same time, the failure safety issues of metallized film capacitors are becoming more and more prominent.

[0003] In related technologies, to ensure the safety of metallized film capacitors, various metallized separator film technologies with different grid shapes and sizes have been developed, such as using T-shaped large grid separator films or diamond-shaped or rectangular small grid separator film designs. However, these technologies typically cannot simultaneously balance the performance or requirements of various aspects of metallized film capacitors, including:

[0004] First, when the area of ​​the isolation grid unit is large, although the metallization coating design has little impact on the utilization rate of the metallization film and the equivalent series resistance, the large area of ​​the isolation grid unit requires a large current to pass through, and the corresponding fuse size is also large. When the isolation grid unit experiences electrical weak point breakdown, the fuse is not easy to disconnect, resulting in insufficient safety factor of the metallized film capacitor.

[0005] Second, when the area of ​​the isolation grid unit is small, the area of ​​the insulation gap between the isolation grids accounts for a large proportion, the utilization rate of the effective area of ​​the metallized film decreases significantly, and the equivalent series resistance increases significantly compared with the metallized film capacitor designed without isolation film.

[0006] Third, improper fuse size design between the grid units of the isolation membrane causes the capacitor to be too sensitive to voltage fluctuations, resulting in excessively rapid capacitance loss during normal use and reduced normal operating life. Summary of the Invention

[0007] The present invention aims to at least partially solve one of the technical problems in the aforementioned technologies. Therefore, one objective of the present invention is to provide a metallized separator that, when a portion of the metallized electrodes in the metallized separator experiences electrical weak point breakdown, reduces the area of ​​the metallized electrodes that need to be isolated. This effectively isolates the affected portion of the metallized electrodes without affecting the normal operation of the metallized separator, thereby improving its service life while ensuring its safety.

[0008] The second objective of this invention is to propose a metallized separator assembly that reduces the area of ​​the metallized electrode that needs to be isolated when a portion of the metallized electrode in the metallized separator experiences electrical weak point breakdown. This effectively isolates the portion of the metallized electrode without affecting the normal operation of the metallized separator capacitor, thereby improving the service life while ensuring the safety of the metallized separator capacitor.

[0009] The third objective of this invention is to provide a metallized isolation film capacitor.

[0010] To achieve the above objectives, a first aspect of the present invention provides a metallized separator, comprising:

[0011] Dielectric thin film;

[0012] A metallized electrode is provided, covering the dielectric film and having an insulating edge pre-reserved on the dielectric film. The metallized electrode is divided into a non-segmented electrode and a series of repeating metallized isolation units along the longitudinal direction by a first longitudinal insulating gap. Each metallized isolation unit is connected to the non-segmented electrode via a first-stage fuse. Adjacent metallized isolation units are separated by a first transverse insulating gap. The metallized isolation units are divided into N-stage segmented electrodes by a second longitudinal insulating gap, where N is a natural number ≥ 2. The first-stage segmented electrode is connected to the non-segmented electrode via the first-stage fuse. The first-stage segmented electrode is connected to the second-stage segmented electrode... The electrodes are connected by a second-stage fuse, and the second-stage segmented electrode is connected to the third-stage segmented electrode by a third-stage fuse. Similarly, the (N-1)th stage segmented electrode is connected to the Nth stage segmented electrode by an Nth-stage fuse. The electrode adjacent to the non-segmented electrode is the first-stage segmented electrode, and the electrode adjacent to the insulating edge is the Nth-stage segmented electrode. Each of the first-stage to Nth-stage segmented electrodes is formed by at least one individual grid electrode. The equivalent resistance of the Nth-stage fuse connected in parallel to the individual grid electrodes of the Nth-stage segmented electrode is greater than the equivalent resistance of the N-1th stage fuse connected in parallel to the individual grid electrodes of the (N-1)th-stage segmented electrode.

[0013] According to an embodiment of the present invention, a metallized isolation film is provided, wherein the metallized isolation unit is divided into N-level segmented electrodes by a second longitudinal insulating gap, where N is a natural number ≥ 2. The first-level segmented electrode is connected to the non-segmented electrode through a first-level fuse, the first-level segmented electrode is connected to the second-level segmented electrode through a second-level fuse, the second-level segmented electrode is connected to the third-level segmented electrode through a third-level fuse, and so on, the (N-1)th-level segmented electrode is connected to the Nth-level segmented electrode through an Nth-level fuse. The first-level segmented electrode to the Nth-level segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the single grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the single grid electrode of the (N-1)th-level segmented electrode.

[0014] When a weak electrical breakdown occurs, the fuse connected to the individual grid electrode at the breakdown point melts, and the corresponding individual grid electrode is insulated and isolated. Since the equivalent resistance of the fuses connected in parallel to the individual grid electrode farther from the non-segmented electrode is larger, they are more likely to melt. Therefore, when the breakdown point occurs on an individual grid electrode farther from the non-segmented electrode, the safety of the metallized isolation film capacitor is ensured. Simultaneously, since adjacent metallized isolation units are separated by a first transverse insulating gap, even if one metallized isolation unit experiences a weak electrical breakdown and is isolated, it does not affect the normal operation of other metallized isolation units. Therefore, this invention reduces the area of ​​the metallized electrodes that need to be isolated when a portion of the metallized electrodes in the metallized isolation film experiences a weak electrical breakdown. This effectively isolates that portion of the metallized electrodes without affecting the normal operation of the metallized isolation film, thus improving its service life while ensuring its safety.

[0015] In addition, the metallized separator proposed in the above embodiments of the present invention may also have the following additional technical features:

[0016] Optionally, the area of ​​a single grid electrode corresponding to a segmented electrode decreases progressively from the first-level segmented electrode to the Nth-level segmented electrode. When the breakdown point occurs in a single grid electrode farther away from the non-segmented electrode, the capacity loss is smaller because the area of ​​the single grid electrode farther away from the non-segmented electrode is smaller.

[0017] Optionally, the second-level segmentation electrode to the Nth-level segmentation electrode are separated by a transverse second insulating gap, and the number of individual grid electrodes increases sequentially from the second-level segmentation electrode to the Nth-level segmentation electrode.

[0018] Optionally, the ratio of the width of the non-segmented electrode in the lateral direction to the width of the metallized separator is less than or equal to 1 / 2.

[0019] Optionally, the ratio of the width of the first-stage segmented electrode in the lateral direction to the width of the metallized isolation unit is less than or equal to 1 / 2.

[0020] Optionally, the metallized isolation unit is divided into two levels of segmented electrodes by a longitudinal second insulating gap. The number of individual grid electrodes in the second level segmented electrode is greater than the number of individual grid electrodes in the first level segmented electrode. The equivalent resistance of the second-level fuses connected in parallel to the individual grid electrodes of the second level segmented electrode is greater than the equivalent resistance of the first-level fuses connected in parallel to the individual grid electrodes of the first level segmented electrode.

[0021] Optionally, the metallized isolation unit is divided into three levels of segmented electrodes by a longitudinal second insulating gap. The number of individual grid electrodes in the third level segmented electrode is greater than the number of individual grid electrodes in the second level segmented electrode, and the number of individual grid electrodes in the second level segmented electrode is greater than the number of individual grid electrodes in the first level segmented electrode. The equivalent resistance of the third-level fuse connected in parallel to the individual grid electrodes of the third level segmented electrode is greater than the equivalent resistance of the second-level fuse connected in parallel to the individual grid electrodes of the second level segmented electrode, and the equivalent resistance of the second-level fuse connected in parallel to the individual grid electrodes of the second level segmented electrode is greater than the equivalent resistance of the first-level fuse connected in parallel to the individual grid electrodes of the first level segmented electrode.

[0022] To achieve the above objectives, a second aspect of the present invention provides a metallized separator assembly, comprising:

[0023] A first metallized insulating film is formed by covering a first metallized electrode onto a first surface of a dielectric film, with a first insulating edge pre-reserved on the first surface of the dielectric film. The first metallized electrode is divided into a non-segmented electrode and a continuously repeating metallized insulating unit along the longitudinal direction by a first longitudinal insulating gap. Each metallized insulating unit is connected to the non-segmented electrode via a first-stage fuse, and adjacent metallized insulating units are separated by a transverse first insulating gap. The metallized insulating unit is divided into N-stage segmented electrodes by a second longitudinal insulating gap, where N is a natural number ≥ 2. The first-stage segmented electrode is connected to the non-segmented electrode via the first-stage fuse. The first-level segmented electrode and the second-level segmented electrode are connected by a second-level fuse, the second-level segmented electrode and the third-level segmented electrode are connected by a third-level fuse, and so on, the (N-1)th-level segmented electrode and the Nth-level segmented electrode are connected by an Nth-level fuse. The electrode adjacent to the non-segmented electrode is the first-level segmented electrode, and the electrode adjacent to the first insulating edge is the Nth-level segmented electrode. The first-level segmented electrode to the Nth-level segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the single grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the single grid electrode of the (N-1)th-level segmented electrode.

[0024] The second metallized isolation film is formed by covering the second film surface of the dielectric film with the second metallized electrode, and a second insulating edge is reserved on the second film surface of the dielectric film. The second metallized isolation film is stacked and staggered with the first metallized isolation film to form a staggered edge. The projections of the non-segmented electrode of the second metallized isolation film and the non-segmented electrode of the first metallized isolation film in the top view are independent of each other.

[0025] According to an embodiment of the present invention, a metallized isolation membrane assembly is provided, wherein the metallized isolation unit is divided into N-level segmented electrodes by a second longitudinal insulating gap, where N is a natural number ≥ 2. The first-level segmented electrode is connected to the non-segmented electrode through a first-level fuse, the first-level segmented electrode is connected to the second-level segmented electrode through a second-level fuse, the second-level segmented electrode is connected to the third-level segmented electrode through a third-level fuse, and so on, the (N-1)th-level segmented electrode is connected to the Nth-level segmented electrode through an Nth-level fuse. The first-level segmented electrode to the Nth-level segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the single grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the single grid electrode of the (N-1)th-level segmented electrode.

[0026] When a weak electrical breakdown occurs, the fuse connected to the individual grid electrode at the breakdown point melts, and the corresponding individual grid electrode is insulated and isolated. Since the equivalent resistance of the fuses connected in parallel to the individual grid electrode farther from the non-segmented electrode is larger, they are more likely to melt. Therefore, when the breakdown point occurs on an individual grid electrode farther from the non-segmented electrode, the safety of the metallized isolation film capacitor is ensured. Simultaneously, since adjacent metallized isolation units are separated by a first transverse insulating gap, even if one metallized isolation unit experiences a weak electrical breakdown and is isolated, it does not affect the normal operation of other metallized isolation units. Therefore, this invention reduces the area of ​​the metallized electrodes that need to be isolated when a portion of the metallized electrodes in the metallized isolation film experiences a weak electrical breakdown. This effectively isolates that portion of the metallized electrodes without affecting the normal operation of the metallized isolation film, thus improving its service life while ensuring its safety.

[0027] In addition, the metallized separator assembly proposed in the above embodiments of the present invention may also have the following additional technical features:

[0028] Optionally, the area of ​​a single grid electrode corresponding to a segmented electrode decreases progressively from the first-level segmented electrode to the Nth-level segmented electrode. When the breakdown point occurs in a single grid electrode farther away from the non-segmented electrode, the capacity loss is smaller because the area of ​​the single grid electrode farther away from the non-segmented electrode is smaller.

[0029] Optionally, the second-stage dividing electrode to the Nth-stage dividing electrode are separated by a transverse second insulating gap.

[0030] Optionally, the second metallized electrode has the same structure as the first metallized electrode. The second metallized electrode is divided into a non-segmented electrode and a series of repeating metallized isolation units along the longitudinal direction by a first longitudinal insulating gap. Each metallized isolation unit is connected to the non-segmented electrode via a first-stage fuse, and adjacent metallized isolation units are separated by a first transverse insulating gap. The metallized isolation units are divided into N-stage segmented electrodes by a second longitudinal insulating gap, where N is a natural number ≥ 2. The first-stage segmented electrode is connected to the non-segmented electrode via the first-stage fuse, and the first-stage segmented electrode is separated from the second-stage segmented electrode by a first-stage fuse. The second-level fuse is connected to the third-level segmented electrode via a third-level fuse. Similarly, the (N-1)th and Nth-level segmented electrodes are connected via an Nth-level fuse. The electrode adjacent to the non-segmented electrode is the first-level segmented electrode, and the electrode adjacent to the second insulating edge is the Nth-level segmented electrode. Each of the first to Nth-level segmented electrodes is formed by at least one individual grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the individual grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the individual grid electrode of the (N-1)th-level segmented electrode.

[0031] Specifically, the second metallized isolation film is stacked in a mirror image with the first metallized isolation film; when the second metallized isolation film is sequentially arranged with a non-segmented electrode, a first-level segmented electrode to an Nth-level segmented electrode, and a second insulating edge, the corresponding first metallized isolation film is sequentially arranged with a first insulating edge, an Nth-level segmented electrode to a first-level segmented electrode, and a non-segmented electrode in the same direction.

[0032] Furthermore, the Nth-level segmented electrode of the second metallized electrode and the first-level segmented electrode of the first metallized electrode, the (N-1)th-level segmented electrode of the second metallized electrode and the second-level segmented electrode of the first metallized electrode, and so on, until the first-level segmented electrode of the second metallized electrode and the Nth-level segmented electrode of the first metallized electrode at least partially overlap in a top-view state.

[0033] Specifically, the metallization isolation unit of the first metallized isolation film is divided into two levels of segmented electrodes by a longitudinal second insulating gap. Correspondingly, the metallization isolation unit of the second metallized isolation film is divided into two levels of segmented electrodes by a longitudinal second insulating gap. When the second metallized isolation film is arranged in sequence as a non-segmented electrode, a first-level segmented electrode, a second-level segmented electrode, and a second insulating edge, the corresponding first metallized isolation film is arranged in the same direction as a first insulating edge, a second-level segmented electrode, a first-level segmented electrode, and a non-segmented electrode. The first-level segmented electrode of the second metallized isolation film and the second-level segmented electrode of the first metallized isolation film, and the second-level segmented electrode of the second metallized isolation film and the first-level segmented electrode of the first metallized isolation film, at least partially overlap in a top view.

[0034] Furthermore, in the first metallized isolation film and the second metallized isolation film, the number of individual grid electrodes of the second-level segmented electrode is greater than the number of individual grid electrodes of the first-level segmented electrode, and the equivalent resistance of the second-level fuses connected in parallel to the individual grid electrodes of the second-level segmented electrode is greater than the equivalent resistance of the first-level fuses connected in parallel to the individual grid electrodes of the first-level segmented electrode.

[0035] Specifically, the metallization isolation unit of the first metallized isolation film is divided into three levels of segmented electrodes by a longitudinal second insulating gap. Correspondingly, the metallization isolation unit of the second metallized isolation film is divided into three levels of segmented electrodes by a longitudinal second insulating gap. When the second metallized isolation film is arranged in sequence as a non-segmented electrode, a first-level segmented electrode, a second-level segmented electrode, a third-level segmented electrode, and a second insulating edge, the corresponding first metallized isolation film is arranged in the same direction as a first insulating edge, a third-level segmented electrode, a second-level segmented electrode, a first-level segmented electrode, and a non-segmented electrode. The first-level segmented electrode of the second metallized isolation film and the third-level segmented electrode of the first metallized isolation film, the second-level segmented electrode of the second metallized isolation film and the second-level segmented electrode of the first metallized isolation film, and the third-level segmented electrode of the second metallized isolation film and the first-level segmented electrode of the first metallized isolation film, at least partially overlap in a top view.

[0036] Furthermore, in the first metallized separator and the second metallized separator, the number of individual grid electrodes in the third-level segmented electrode is greater than the number of individual grid electrodes in the second-level segmented electrode, and the number of individual grid electrodes in the second-level segmented electrode is greater than the number of individual grid electrodes in the first-level segmented electrode; the equivalent resistance of the third-level fuse connected in parallel to the individual grid electrodes of the third-level segmented electrode is greater than the equivalent resistance of the second-level fuse connected in parallel to the individual grid electrodes of the second-level segmented electrode, and the equivalent resistance of the second-level fuse connected in parallel to the individual grid electrodes of the second-level segmented electrode is greater than the equivalent resistance of the first-level fuse connected in parallel to the individual grid electrodes of the first-level segmented electrode.

[0037] Specifically, the width of the non-segmented electrode of the first metallized separator in the lateral direction is less than or equal to the sum of the width of the insulating edge of the second metallized separator in the lateral direction and the width of the misaligned edge in the lateral direction; correspondingly, the width of the non-segmented electrode of the second metallized separator in the lateral direction is less than or equal to the sum of the width of the insulating edge of the first metallized separator in the lateral direction and the width of the misaligned edge in the lateral direction.

[0038] Specifically, the ratio of the width of the first-level segmented electrode of the first metallized isolation film and the second metallized isolation film in the lateral direction to the width of the metallized isolation unit is less than or equal to 1 / 2.

[0039] Specifically, the width of the non-segmented electrode of the first metallized separator in the lateral direction is greater than the sum of the widths of the insulating edge and the misaligned edge of the second metallized separator in the lateral direction, and the ratio of the width of the non-segmented electrode of the first metallized separator in the lateral direction to the width of the first metallized separator in the lateral direction is less than 1 / 2; correspondingly, the width of the non-segmented electrode of the second metallized separator in the lateral direction is greater than the sum of the widths of the insulating edge and the misaligned edge of the first metallized separator in the lateral direction, and the ratio of the width of the non-segmented electrode of the second metallized separator in the lateral direction to the width of the second metallized separator in the lateral direction is less than 1 / 2.

[0040] Optionally, the second metallized electrode of the second metallized separator is a non-segmented electrode. When the first metallized separator is sequentially arranged with a non-segmented electrode, a first-level segmented electrode to an Nth-level segmented electrode, and a first insulating edge, the corresponding second metallized separator is sequentially arranged with a second insulating edge and a non-segmented electrode in the same direction.

[0041] Optionally, at least two sets of the first metallized electrodes are covered on the first film surface of the dielectric film; at least two sets of the second metallized electrodes are covered on the second film surface of the dielectric film; when the second metallized isolation film is arranged with the second insulating edge, the Nth level segmented electrode to the first level segmented electrode, and the non-segmented electrode in sequence, the corresponding first metallized isolation film is arranged with the non-segmented electrode, the first level segmented electrode to the Nth level segmented electrode, and the first insulating edge in the same direction.

[0042] Specifically, the Nth-level segmented electrode of the second metallized electrode and the first-level segmented electrode of the first metallized electrode, the (N-1)th-level segmented electrode of the second metallized electrode and the second-level segmented electrode of the first metallized electrode, and so on, until the first-level segmented electrode of the second metallized electrode and the Nth-level segmented electrode of the first metallized electrode at least partially overlap in a top-view state.

[0043] Specifically, two sets of the first metallized electrodes are covered on the first film surface of the dielectric film; two sets of the second metallized electrodes are covered on the second film surface of the dielectric film; the two sets of the first metallized electrodes are arranged in a mirror-symmetrical manner, and the two sets of the second metallized electrodes are arranged in a mirror-symmetrical manner.

[0044] To achieve the above objectives, a third aspect of the present invention provides a metallized isolation film capacitor, comprising the aforementioned metallized isolation film assembly. Attached Figure Description

[0045] Figure 1 This is a cross-sectional view according to Embodiment 1 of the present invention;

[0046] Figure 2 This is a plan view according to Embodiment 1 of the present invention;

[0047] Figure 3 for Figure 2 A magnified view of a portion of the image;

[0048] Figure 4 This is a plan view of another structure according to Embodiment 1 of the present invention;

[0049] Figure 5 for Figure 4 A magnified view of a portion of the image;

[0050] Figure 6 This is a plan view of a three-level structure according to Embodiment 1 of the present invention;

[0051] Figure 7 for Figure 6 A magnified view of a portion of the image;

[0052] Figure 8 This is a plan view according to Embodiment 2 of the present invention;

[0053] Figure 9 for Figure 8 A magnified view of a portion of the image;

[0054] Figure 10 This is a plan view according to Embodiment 3 of the present invention;

[0055] Figure 11 for Figure 10 A magnified view of a portion of the image;

[0056] Figure 12 This is a cross-sectional view according to Embodiment 4 of the present invention;

[0057] Figure 13 This is a plan view according to Embodiment 4 of the present invention;

[0058] Figure 14 This is a cross-sectional view of another structure according to Embodiment 4 of the present invention.

[0059] Label Explanation

[0060] First metallized separator 1 First metallized electrode 11

[0061] Longitudinal first insulating gap 111 Non-segmented electrode 112

[0062] Metallized isolation unit 113 First segmented electrode 1131

[0063] Second segmented electrode 1132 Third segmented electrode 1133

[0064] First insulation edge 114 First-stage fuse 115

[0065] Horizontal first insulation gap 116, longitudinal second insulation gap 117

[0066] Second-stage fuse 1181 Third-stage fuse 1182

[0067] Lateral second insulating gap 119 Dielectric film 12

[0068] Second metallized separator 2 Second metallized electrode 21

[0069] Non-segmented electrode 211 Second insulating edge 212

[0070] Misaligned edge L. Detailed Implementation

[0071] Embodiments of the present invention are described in detail below, examples of which are illustrated in the accompanying drawings, wherein the same or similar reference numerals denote the same or similar elements or elements having the same or similar functions throughout. The embodiments described below with reference to the accompanying drawings are exemplary and intended to explain the present invention, and should not be construed as limiting the present invention.

[0072] This invention defines the longitudinal direction along the length of the metallized separator as the longitudinal direction and the transverse direction along the width of the metallized separator as the transverse direction.

[0073] This invention proposes a metallized isolation film, comprising a dielectric film and metallized electrodes; the metallized electrodes cover the dielectric film and have a first insulating edge pre-reserved on the dielectric film, the first insulating edge being adjacent to the metallized isolation unit; the metallized electrodes are divided into non-segmented electrodes and continuously repeating metallized isolation units along the longitudinal direction by a longitudinal first insulating gap; each metallized isolation unit is connected to the non-segmented electrode through a first-stage fuse; adjacent metallized isolation units are separated by a transverse first insulating gap; the metallized isolation units are divided into N-stage segmented electrodes by a longitudinal second insulating gap, where N is a natural number ≥ 2; the first-stage segmented electrodes are connected to... The first-stage fuse is connected to the non-segmented electrode, the first-stage segmented electrode and the second-stage segmented electrode are connected through the second-stage fuse, the second-stage segmented electrode and the third-stage segmented electrode are connected through the third-stage fuse, and so on, the (N-1)th stage segmented electrode and the Nth stage segmented electrode are connected through the Nth stage fuse. The first-stage segmented electrode to the Nth stage segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth stage fuse connected in parallel to the single grid electrode of the Nth stage segmented electrode is greater than the equivalent resistance of the N-1th stage fuse connected in parallel to the single grid electrode of the (N-1)th stage segmented electrode.

[0074] When a weak electrical breakdown occurs, the fuse connected to the individual grid electrode at the breakdown point melts, and the corresponding individual grid electrode is insulated and isolated. Since the equivalent resistance of the fuses connected in parallel to the individual grid electrode farther from the non-segmented electrode is larger, they are more likely to melt. Therefore, when the breakdown point occurs on an individual grid electrode farther from the non-segmented electrode, the safety of the metallized isolation film capacitor is ensured. Simultaneously, since adjacent metallized isolation units are separated by a first transverse insulating gap, even if one metallized isolation unit experiences a weak electrical breakdown and is isolated, it does not affect the normal operation of other metallized isolation units. Therefore, this invention reduces the area of ​​the metallized electrodes that need to be isolated when a portion of the metallized electrodes in the metallized isolation film experiences a weak electrical breakdown. This effectively isolates that portion of the metallized electrodes without affecting the normal operation of the metallized isolation film, thus improving its service life while ensuring its safety.

[0075] To better understand the above technical solutions, exemplary embodiments of the present invention will be described in more detail below with reference to the accompanying drawings. Although exemplary embodiments of the present invention are shown in the drawings, it should be understood that the present invention can be implemented in various forms and should not be limited to the embodiments set forth herein. Rather, these embodiments are provided to enable a more thorough understanding of the present invention and to fully convey the scope of the invention to those skilled in the art.

[0076] To better understand the above technical solutions, the following will provide a detailed explanation of the technical solutions in conjunction with the accompanying drawings and specific implementation methods.

[0077] Example 1

[0078] Figures 1 to 7 The diagram below shows the structure of a metallized separator capacitor according to Embodiment 1 of the present invention. The metallized separator capacitor is formed by rolling a first metallized separator 1 and a second metallized separator 2 in a staggered manner. The first metallized separator 1 and the second metallized separator 2 are staggered in a top view to form a staggered edge L.

[0079] The first metallized isolation film 1 is formed by covering the first metallized electrode 11 on the first film surface of the dielectric film 12, and a first insulating edge 114 is reserved on the first film surface of the dielectric film 12. The first metallized electrode 11 is divided into a non-segmented electrode 112 and a continuously repeating metallized isolation unit 113 along the longitudinal direction by a longitudinal first insulating gap 111. The first insulating edge 114 is adjacent to the metallized isolation unit 113 and is located on the side opposite to the non-segmented electrode 112. Each metallized isolation unit 113 is connected to the non-segmented electrode 112 by a first-stage fuse 115. Adjacent metallized isolation units 113 are separated by a transverse first insulating gap 116. The metallized isolation unit 113 is divided into N-stage segmented electrodes by a longitudinal second insulating gap 117, where N is a natural number ≥2. The first-level segmented electrode is connected to the non-segmented electrode 112 via a first-level fuse 115. The first-level segmented electrode is connected to the second-level segmented electrode via a second-level fuse. The second-level segmented electrode is connected to the third-level segmented electrode via a third-level fuse. In sequence, the (N-1)th-level segmented electrode is connected to the Nth-level segmented electrode via an Nth-level fuse. The electrode adjacent to the non-segmented electrode 112 is the first-level segmented electrode, and the electrode adjacent to the first insulating edge 114 is the Nth-level segmented electrode. The first-level segmented electrode to the Nth-level segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the single grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the single grid electrode of the (N-1)th-level segmented electrode.

[0080] The second metallized separator 2 is formed by covering the second film surface of the dielectric film 12 with the second metallized electrode 21, and a second insulating edge 212 is reserved on the second film surface of the dielectric film 12. The second metallized separator 2 is stacked and staggered with the first metallized separator 1 to form a staggered edge L. The projections of the non-segmented electrode 211 of the second metallized separator 2 and the non-segmented electrode 112 of the first metallized separator 1 in the top view are independent of each other, that is, in the top view, the non-segmented electrode 211 of the second metallized separator 2 and the non-segmented electrode 112 of the first metallized separator 1 do not intersect.

[0081] Optionally, the second metallized electrode 21 has the same structure as the first metallized electrode 11. The second metallized electrode is divided into a non-segmented electrode 112 and a series of repeating metallized isolation units 113 along the longitudinal direction by a longitudinal first insulating gap 111. Each metallized isolation unit 113 is connected to the non-segmented electrode 112 through a first-stage fuse 115. Adjacent metallized isolation units 113 are separated by a transverse first insulating gap 116. The metallized isolation units 113 are divided into N-stage segmented electrodes by a longitudinal second insulating gap 117, where N is a natural number ≥ 2. The first-stage segmented electrodes are connected to the non-segmented electrode 112 through the first-stage fuse 115. The first-level segmented electrode and the second-level segmented electrode are connected by a second-level fuse, and the second-level segmented electrode and the third-level segmented electrode are connected by a third-level fuse. Similarly, the (N-1)th-level segmented electrode and the Nth-level segmented electrode are connected by an Nth-level fuse. The first-level segmented electrode is adjacent to the non-segmented electrode 112. Each of the first-level to Nth-level segmented electrodes is formed by at least one single grid electrode. The equivalent resistance of the parallel connection of the Nth-level fuses corresponding to the single grid electrodes of the Nth-level segmented electrode is greater than the equivalent resistance of the parallel connection of the N-1th-level fuses corresponding to the single grid electrodes of the (N-1)th-level segmented electrode. The Nth-level segmented electrode of the second metallized electrode 21 at least partially overlaps with the first-level segmented electrode of the first metallized electrode 11, the (N-1)th-level segmented electrode of the second metallized electrode 21 with the second-level segmented electrode of the second metallized electrode 21, and so on, up to the first-level segmented electrode of the second metallized electrode 21 and the Nth-level segmented electrode of the second metallized electrode 21 in a top-view configuration.

[0082] like Figure 2 , Figure 3As shown, the metallization isolation unit 113 of the first metallized isolation film 1 is divided into two levels of segmented electrodes by a longitudinal second insulating gap 117, namely, a first segmented electrode 1131 and a second segmented electrode 1132. The area of ​​a single grid electrode of the second segmented electrode 1132 is smaller than the area of ​​a single grid electrode of the first segmented electrode 1131. Correspondingly, the metallization isolation unit of the second metallized isolation film 2 is divided into two levels of segmented electrodes by a longitudinal second insulating gap. When the second metallized isolation film 2 is arranged in sequence as a non-segmented electrode 211, a first-level segmented electrode, a second-level segmented electrode, and a second insulating edge 212, the corresponding first metallized isolation film 1 is arranged in the same direction as a first insulating edge 114, a second-level segmented electrode, a first-level segmented electrode, and a non-segmented electrode 112. The second-level segmented electrode of the second metallized electrode 21 and the first-level segmented electrode of the first metallized electrode 11, and the first-level segmented electrode of the second metallized electrode 21 and the second-level segmented electrode of the second metallized electrode 21, at least partially overlap in a top view.

[0083] The first dividing electrode 1131 and the second dividing electrode 1132 are connected by a second-stage fuse 1181. The first-stage dividing electrode 1131 is adjacent to the non-dividing electrode 112, and the second-stage dividing electrode 1132 is adjacent to the first insulating edge 114. The second-stage dividing electrode 1132 is separated by a transverse second insulating gap 119.

[0084] In the first metallized isolation film 1 and the second metallized isolation film 2, the number of individual grid electrodes of the second-level segmented electrode is greater than the number of individual grid electrodes of the first-level segmented electrode, and the equivalent resistance of the second-level fuses 1181 connected in parallel to the individual grid electrodes of the second-level segmented electrode is greater than the equivalent resistance of the first-level fuses 115 connected in parallel to the individual grid electrodes of the first-level segmented electrode.

[0085] When the first metallized isolation film 1 and the second metallized isolation film 2 are configured as two-stage segmented electrodes, the ratio of the width of the first-stage segmented electrode 1131 in the lateral direction to the width of the metallized isolation unit 113 in the lateral direction does not exceed 1 / 2, and there is a misalignment L between the two metallized films.

[0086] When the first metallized separator 1 and the second metallized separator 2 are configured as two-stage segmented electrodes, it can be ensured that the first-stage segmented electrode 1131 of the first metallized separator 1 corresponds to the second-stage segmented electrode of the second metallized separator 2. When a severe or extreme electrical weakness breakdown occurs in the area where the first-stage segmented electrode 1131 of the first metallized separator 1 is located, the current through the fuse is large. The second-stage segmented electrode of the second metallized separator 2 is more sensitive to current surges and disconnects faster, isolating the second-stage segmented electrode of the second metallized separator 2. At this time, the first-stage fuse 115 connecting the first-stage segmented electrode 1131 and the non-segmented electrode 112 of the first metallized separator 1 is no longer subjected to current surges because the electrical weakness area has been insulated and is not disconnected. The capacitor only loses the capacitance formed by the second-stage segmented electrode portion of the second metallized separator 2, while the first-stage segmented electrode 1131 of the first metallized separator 1 returns to normal operation. The capacitance loss is less than when the first-stage fuse 115 is completely disconnected. Under the premise of ensuring the safety of capacitor operation, the working life and working stability of the capacitor are further improved.

[0087] When the first-stage dividing electrode 1131 and the second-stage dividing electrode 1132 of the first metallized separator 1 undergo normal self-healing, the current through the first-stage fuse 115 or the second-stage fuse 1181 is small, and neither the first-stage fuse 115 nor the second-stage fuse 1181 will disconnect, so the normal operation of the capacitor is not affected.

[0088] When a severe electrical weakness occurs in the first-stage segmented electrode 1131, the current through the first-stage fuse 115 is large, causing the first-stage fuse 115 to trip due to the current surge. Alternatively, the fuse of the segmented electrode of the second metallized isolation film 2 corresponding to the electrical weakness may trip due to the current surge. The first-stage segmented electrode 1131 where the electrical weakness is located or the segmented electrode of the second metallized isolation film 2 corresponding to the electrical weakness is insulated and isolated, ensuring the working safety of the capacitor.

[0089] When a severe electrical weakness occurs in the second-stage segmented electrode 1132, the current through the second-stage fuse 1181 is large. Because the second-stage fuse 1181 is more sensitive to current surges, it breaks faster, and the second-stage segmented electrode 1132 where the electrical weakness is located is insulated and isolated. At this time, the first-stage fuse 115 connecting the first-stage segmented electrode 1131 and the non-segmented electrode 112 of the first metallized isolation film 1 is no longer subjected to current surges because the electrical weakness area has been insulated and isolated. Therefore, it does not break, and the capacitor only loses the capacitance of the portion formed by the second-stage segmented electrode 1132. The capacitance loss is negligible, and the working safety of the capacitor is ensured at the same time.

[0090] When the first-stage dividing electrode 1131 or the second-stage dividing electrode 1132 experiences a critical electrical breakdown, the current through the first-stage fuse 115 and the second-stage fuse 1181 is large, causing both the first-stage fuse 115 and the second-stage fuse 1181 to trip. The metallized isolation unit 113 is then insulated, ensuring the safety of the capacitor under abnormal operating conditions.

[0091] like Figure 6 , Figure 7 As shown, the metallization isolation unit 113 of the first metallized isolation film 1 is divided into three levels of segmented electrodes by a longitudinal second insulating gap 117, namely, a first segmented electrode 1131, a second segmented electrode 1132, and a third segmented electrode 1133. The area of ​​a single grid electrode of the second segmented electrode 1132 is smaller than that of the first segmented electrode 1131, and the area of ​​a single grid electrode of the third segmented electrode 1133 is smaller than that of the second segmented electrode 1132. Correspondingly, the metallization isolation unit 21 of the second metallized isolation film 2 is divided into three levels of segmented electrodes by a longitudinal second insulating gap. When the second metallized isolation film 2 is arranged in sequence as a non-segmented electrode 211, a first segmented electrode, a second segmented electrode, a third segmented electrode, a second segmented electrode, and a second insulating edge 212, the corresponding first metallized isolation film 1 is arranged in the same direction as a first insulating edge 114, a third segmented electrode, a second segmented electrode, a first segmented electrode, and a non-segmented electrode 112. The third-level segmented electrode of the second metallized electrode 21 and the first-level segmented electrode of the first metallized electrode 11, the second-level segmented electrode of the second metallized electrode 21 and the third-level segmented electrode of the second metallized electrode 21, in a top-view state, at least partially overlap.

[0092] The first segmented electrode 1131 and the second segmented electrode 1132 are connected by a second-stage fuse 1181, and the second segmented electrode 1132 and the third segmented electrode 1133 are connected by a third-stage fuse 1182. The first-stage segmented electrode 1131 is adjacent to the non-segmented electrode 112, and the third-stage segmented electrode 1132 is adjacent to the first insulating edge 114. The second-stage segmented electrode 1132 and the third-stage segmented electrode 1133 are separated by a transverse second insulating gap 119. In the first metallized isolation film 1 and the second metallized isolation film 2, the number of individual grid electrodes in the third-stage segmented electrode 1133 is greater than the number of individual grid electrodes in the second-stage segmented electrode 1132, and the number of individual grid electrodes in the second-stage segmented electrode 1132 is greater than the number of individual grid electrodes in the first-stage segmented electrode 1131.

[0093] The equivalent resistance of the third-stage fuse 1182 connected in parallel to the single grid electrode of the third-stage segmentation electrode 1133 is greater than the equivalent resistance of the second-stage fuse 1181 connected in parallel to the single grid electrode of the second-stage segmentation electrode 1132. The equivalent resistance of the second-stage fuse 1181 connected in parallel to the single grid electrode of the second-stage segmentation electrode 1132 is greater than the equivalent resistance of the first-stage fuse 115 connected in parallel to the single grid electrode of the first-stage segmentation electrode 1131.

[0094] When a severe or extreme electrical weakness occurs in the region where the first-stage segmented electrode 1131 of the first metallized separator 1 is located, the current through the fuse is large. The third-stage segmented electrode of the second metallized separator 2, being more sensitive to current surges, disconnects more quickly, isolating the third-stage segmented electrode of the second metallized separator 2. At this time, the first-stage fuse 115, which connects the first-stage segmented electrode 1131 and the non-segmented electrode 112 of the first metallized separator 1, is no longer subjected to current surges because the electrical weakness region has been insulated and is not disconnected. The capacitor only loses the capacitance formed by the third-stage segmented electrode portion of the second metallized separator 2, while the first-stage segmented electrode 1131 of the first metallized separator 1 returns to normal operation. Under the premise of ensuring the safety of capacitor operation, the working life and working stability of the capacitor are further improved.

[0095] The individual grid electrodes of the first-stage segmented electrode 1131 and the second-stage segmented electrode 1132 can be configured as parallelograms or rectangles, or other shapes such as triangles. The first metallized electrode 11 and the second metallized electrode 21 can be made of aluminum or zinc-aluminum composite materials, or other metal materials.

[0096] The first metallized separator 1 and the second metallized separator 2 are staggered in a top view to form a staggered edge. The width of the non-segmented electrode 112 of the first metallized electrode 11 in the lateral direction does not exceed the sum of the width of the second insulating edge 212 of the second metallized separator 2 in the lateral direction and the width of the staggered edge in the lateral direction, which is usually ≤5mm. That is, the non-segmented electrode 112 does not participate in the formation of capacitance, ensuring that the area of ​​the non-segmented electrode of the second metallized separator 2 that participates in the formation of capacitance completely corresponds to the segmented electrode of the first metallized separator 1.

[0097] The equivalent resistance of the first-stage fuse 115 connected in parallel between the metallized isolation unit 113 and the non-segmented electrode 112 is less than the equivalent resistance of the second-stage fuse 1181 connected in parallel between the first segmented electrode and the second segmented electrode. The second-stage fuse 1181 is more sensitive to current surges than the first-stage fuse 115. When the surge current reaches a certain value, the fuse heats up and vaporizes instantly, causing it to disconnect.

[0098] The second-stage segmented electrode 1132 is separated by a transverse second insulating gap 119 to form different numbers of grid electrodes, such as Figure 2 and Figure 3 As shown, the number of grid electrodes can be two, that is, the ratio of the number of grid electrodes in the first-stage segmentation electrode 1131 to the number of grid electrodes in the second-stage segmentation electrode 1132 is 1:2; as Figure 4 and Figure 5 As shown, the number of grid electrodes can be three, meaning the ratio of the number of grid electrodes in the first-stage segmentation electrode 1131 to the number of grid electrodes in the second-stage segmentation electrode 1132 is 1:3. This ratio is determined by the operating voltage.

[0099] Example 2

[0100] Figure 1 , Figure 8 and Figure 9 The diagram below shows the structure of a metallized separator capacitor according to Embodiment 2 of the present invention. The metallized separator capacitor is formed by rolling a first metallized separator 1 and a second metallized separator 2 in a staggered manner. The first metallized separator 1 and the second metallized separator 2 are staggered in a top view to form a staggered edge L.

[0101] The first metallized isolation film 1 is formed by covering the first metallized electrode 11 on the first film surface of the dielectric film 12, and a first insulating edge 114 is reserved on the first film surface of the dielectric film 12. The first metallized electrode 11 is divided into a non-segmented electrode 112 and a continuously repeating metallized isolation unit 113 along the longitudinal direction by a longitudinal first insulating gap 111. The first insulating edge 114 is adjacent to the metallized isolation unit 113 and is located on the side opposite to the non-segmented electrode 112. Each metallized isolation unit 113 is connected to the non-segmented electrode 112 by a first-stage fuse 115. Adjacent metallized isolation units 113 are separated by a transverse first insulating gap 116. The metallized isolation unit 113 is divided into N-stage segmented electrodes by a longitudinal second insulating gap 117, where N is a natural number ≥2. The first-level segmented electrode is connected to the non-segmented electrode 112 via a first-level fuse 115. The first-level segmented electrode is connected to the second-level segmented electrode via a second-level fuse. The second-level segmented electrode is connected to the third-level segmented electrode via a third-level fuse. In sequence, the (N-1)th-level segmented electrode is connected to the Nth-level segmented electrode via an Nth-level fuse. The electrode adjacent to the non-segmented electrode 112 is the first-level segmented electrode, and the electrode adjacent to the first insulating edge 114 is the Nth-level segmented electrode. The first-level segmented electrode to the Nth-level segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the single grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the single grid electrode of the (N-1)th-level segmented electrode.

[0102] In this embodiment, the metallized isolation unit 113 is divided into two levels of segmented electrodes by a longitudinal second insulating gap 117, namely a first segmented electrode 1131 and a second segmented electrode 1132. The area of ​​a single grid electrode of the second-level segmented electrode 1132 is smaller than the area of ​​a single grid electrode of the first-level segmented electrode 1131. The first segmented electrode 1131 and the second segmented electrode 1132 are connected by a second-level fuse 1181. The first-level segmented electrode 1131 is adjacent to the non-segmented electrode 112, and the second-level segmented electrode 1132 is adjacent to the first insulating edge 114. The second-level segmented electrodes 1132 are separated by a transverse second insulating gap 119. The equivalent resistance of the second-level fuses 1181 connected in parallel to the single grid electrodes of the second-level segmented electrode is greater than the equivalent resistance of the first-level fuses 115 connected in parallel to the single grid electrodes of the first-level segmented electrode.

[0103] The second metallized separator 2 is formed by covering the second surface of the dielectric film 12 with the second metallized electrode 21, and a second insulating edge 212 is reserved on the second surface of the dielectric film 12. In this embodiment, the second metallized electrode 21 is a non-segmented electrode 211, without dividing the electrodes into different levels. When the first metallized separator 1 is sequentially arranged with a non-segmented electrode 112, a first-level segmented electrode to an Nth-level segmented electrode, and a first insulating edge 114, the corresponding second metallized separator 2 is sequentially arranged with a second insulating edge 212 and a non-segmented electrode 211 in the same direction. The width of the second metallized separator 2 is the same as the width of the first metallized separator 1, and the width of the second insulating edge 212 of the second metallized electrode 21 is the same as the width of the first insulating edge 114 of the first metallized electrode 11. The second metallized separator 2 and the first metallized separator 1 partially overlap in a top view.

[0104] In this embodiment, the first metallized separator 1 is configured as a two-stage segmented electrode. When a severe or extreme electrical weak point breakdown occurs in the area where the second-stage segmented electrode 1132 of the first metallized separator 1 is located, the current through the fuse is large, the fuse connected to the individual grid electrode of the second-stage segmented electrode 1132 is melted, and the second-stage segmented electrode 1132 is insulated and isolated, so that the capacitance loss is small, while ensuring the safety of the metallized separator capacitor.

[0105] The individual grid electrodes of the first-stage segmented electrode 1131 and the second-stage segmented electrode 1132 can be configured as parallelograms or rectangles, or other shapes such as triangles. The first metallized electrode 11 and the second metallized electrode 21 can be made of aluminum or zinc-aluminum composite materials, or other metal materials.

[0106] The first metallized separator 1 and the second metallized separator 2 are staggered in a top view to form a staggered edge. The width of the non-segmented electrode 112 of the first metallized electrode 11 in the lateral direction does not exceed the sum of the width of the second insulating edge 212 of the second metallized separator 2 in the lateral direction and the width of the staggered edge in the lateral direction, which is usually ≤5mm. That is, the non-segmented electrode 112 does not participate in the formation of capacitance, ensuring that the area of ​​the non-segmented electrode 211 of the second metallized separator 2 that participates in the formation of capacitance completely corresponds to the segmented electrode of the first metallized separator 1.

[0107] The equivalent resistance value of the first-stage fuse 115 connected in parallel between the metallized isolation unit 113 and the non-segmented electrode 112 is less than the equivalent resistance value of the second-stage fuse 1181 connected in parallel between the individual grid electrodes of the first segmented electrode and the second segmented electrode. The second-stage fuse 1181 is more sensitive to current surges than the first-stage fuse 115. When the surge current reaches a certain value, the fuse heats up and vaporizes instantly, thus breaking the circuit.

[0108] When the first-stage segmented electrode 1131, the second-stage segmented electrode 1132, or the non-segmented electrode 211 of the first metallized separator 1 undergoes normal self-healing, the current through the first-stage fuse 115 or the second-stage fuse 1181 is small, and neither the first-stage fuse 115 nor the second-stage fuse 1181 will disconnect, so the normal operation of the capacitor is not affected.

[0109] When the first-stage segmented electrode 1131 experiences a severe or extreme electrical weakness breakdown, the current through the first-stage fuse 115 is large, causing the first-stage fuse 115 to trip due to the current surge. The first-stage segmented electrode 1131, where the electrical weakness is located, is then insulated and isolated, ensuring the working safety of the capacitor.

[0110] When the second-stage segmented electrode 1132 experiences a severe or extreme electrical weakness breakdown, the current through the second-stage fuse 1181 is large, causing the second-stage fuse 1181 to trip due to the current surge. The second-stage segmented electrode 1132, where the electrical weakness is located, is then insulated and isolated. At this time, the first-stage fuse 115, which connects the first-stage segmented electrode 1131 and the non-segmented electrode 112 of the first metallized isolation film 1, is no longer subjected to current surges because the electrical weakness area has been insulated and isolated. Therefore, it does not trip, and the capacitor only loses the capacitance formed by the second-stage segmented electrode 1132. The capacitance loss is negligible, and the working safety of the capacitor is ensured.

[0111] When the non-segmented electrode 211 of the second metallized separator 2 experiences a severe or extreme electrical weakness breakdown, the current through the first-stage fuse 115 and the second-stage fuse 1181 is large. Regardless of whether the non-segmented electrode 211 of the second metallized separator 2 corresponds to the first-stage segmented electrode 1131 or the second-stage segmented electrode 1132 of the first metallized separator 1, the corresponding first-stage fuse 115 and second-stage fuse 1181 will be broken by the current surge. The first-stage segmented electrode 1131 or the second-stage segmented electrode 1132 of the first metallized separator 1 corresponding to the area where the electrical weakness is located will be insulated and isolated, ensuring the working safety of the capacitor.

[0112] The difference between Embodiment 2 and Embodiment 1 is that the second metallized electrode 21 is a non-segmented electrode 211, without any segmentation into different levels of electrodes. The width of the second metallized separator 2 is the same as the width of the first metallized separator 1, and the width of the second insulating edge 212 of the second metallized electrode 21 is the same as the width of the first insulating edge 114 of the first metallized electrode 11. The second metallized separator 2 and the first metallized separator 1 partially overlap in a top view.

[0113] Example 3

[0114] Figure 1 , Figures 10 to 11The diagram below shows the structure of a metallized isolation film capacitor according to Embodiment 3 of the present invention. The metallized isolation film capacitor is formed by rolling a first metallized isolation film 1 and a second metallized isolation film 2 in a staggered manner. The first metallized isolation film 1 and the second metallized isolation film 2 are staggered in a top view to form a staggered edge L.

[0115] The first metallized isolation film 1 is formed by covering the first metallized electrode 11 on the first film surface of the dielectric film 12, and a first insulating edge 114 is reserved on the first film surface of the dielectric film 12. The first metallized electrode 11 is divided into a non-segmented electrode 112 and a continuously repeating metallized isolation unit 113 along the longitudinal direction by a longitudinal first insulating gap 111. The first insulating edge 114 is adjacent to the metallized isolation unit 113 and is located on the side opposite to the non-segmented electrode 112. Each metallized isolation unit 113 is connected to the non-segmented electrode 112 by a first-stage fuse 115. Adjacent metallized isolation units 113 are separated by a transverse first insulating gap 116. The metallized isolation unit 113 is divided into N-stage segmented electrodes by a longitudinal second insulating gap 117, where N is a natural number ≥2. The first-level segmented electrode is connected to the non-segmented electrode 112 via a first-level fuse 115. The first-level segmented electrode is connected to the second-level segmented electrode via a second-level fuse. The second-level segmented electrode is connected to the third-level segmented electrode via a third-level fuse. In sequence, the (N-1)th-level segmented electrode is connected to the Nth-level segmented electrode via an Nth-level fuse. The electrode adjacent to the non-segmented electrode 112 is the first-level segmented electrode, and the electrode adjacent to the first insulating edge 114 is the Nth-level segmented electrode. The first-level segmented electrode to the Nth-level segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the single grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the single grid electrode of the (N-1)th-level segmented electrode.

[0116] The second metallized separator 2 is formed by covering the second film surface of the dielectric film 12 with the second metallized electrode 21, and a second insulating edge 212 is reserved on the second film surface of the dielectric film 12. The second metallized separator 2 is stacked and staggered with the first metallized separator 1 to form a staggered edge L. The projections of the non-segmented electrode 211 of the second metallized separator 2 and the non-segmented electrode 112 of the first metallized separator 1 in the top view are independent of each other, that is, in the top view, the non-segmented electrode 211 of the second metallized separator 2 and the non-segmented electrode 112 of the first metallized separator 1 do not intersect. The second metallized electrode 21 has the same structure as the first metallized electrode 11. The width of the non-segmented electrode 112 of the first metallized separator 1 in the lateral direction is greater than the sum of the width of the second insulating edge 212 of the second metallized separator 2 in the lateral direction and the width of the misaligned edge in the lateral direction, which is usually greater than 5 mm. That is, the non-segmented electrode 112 of the first metallized separator 1 participates in the formation of capacitance. Moreover, the ratio of the width of the non-segmented electrode 112 of the first metallized separator 1 in the lateral direction to the width of the first metallized separator 1 in the lateral direction is less than 1 / 2, ensuring that the area of ​​the non-segmented electrode of one film participating in the formation of capacitance completely corresponds to the segmented electrode of the other film. When the ratio is equal to 1 / 2, the non-segmented electrodes of the two metallized films will not correspond to each other because the two films are rolled out in a staggered manner to form a misaligned edge.

[0117] When the first-stage dividing electrode 1131 and the second-stage dividing electrode 1132 of the first metallized separator 1 undergo normal self-healing, the current through the first-stage fuse 115 or the second-stage fuse 1181 is small, and neither the first-stage fuse 115 nor the second-stage fuse 1181 will disconnect, so the normal operation of the capacitor is not affected.

[0118] When the first-stage segmented electrode 1131 experiences a severe or extreme electrical weakness breakdown, the current through the first-stage fuse 115 is large, causing the first-stage fuse 115 to trip due to the current surge. Alternatively, the fuse of the segmented electrode of the second metallized isolation film 2 corresponding to the electrical weakness may trip due to the current surge. The first-stage segmented electrode 1131 where the electrical weakness is located or the segmented electrode of the second metallized isolation film 2 corresponding to the electrical weakness is insulated and isolated, ensuring the working safety of the capacitor.

[0119] When the second-stage segmented electrode 1132 experiences a severe or extreme electrical weakness breakdown, the current through the second-stage fuse 1181 is relatively large. Because the second-stage fuse 1181 is more sensitive to current surges, it breaks faster, and the second-stage segmented electrode 1132 where the electrical weakness is located is insulated and isolated. At this time, the first-stage fuse 115 connecting the first-stage segmented electrode 1131 and the non-segmented electrode 112 of the first metallized isolation film 1 is no longer subjected to current surges because the electrical weakness area has been insulated and isolated, and therefore does not break. The capacitor only loses the capacitance of the portion formed by the second-stage segmented electrode 1132, and the capacitance loss is negligible, while ensuring the working safety of the capacitor.

[0120] The individual grid electrodes of the first-stage segmented electrode 1131 and the second-stage segmented electrode 1132 can be configured as parallelograms or rectangles, or other shapes such as triangles. The first metallized electrode 11 and the second metallized electrode 21 can be made of aluminum or zinc-aluminum composite materials, or other metal materials.

[0121] The equivalent resistance value of the first-stage fuse 115 connected in parallel between the single grid electrode of the metallized isolation unit 113 and the non-segmented electrode 112 is less than the equivalent resistance value of the second-stage fuse 1181 connected in parallel between the single grid electrode of the first segmented electrode and the second segmented electrode. The second-stage fuse 1181 is more sensitive to current surges than the first-stage fuse 115. When the surge current reaches a certain value, the fuse heats up and vaporizes instantly, thus breaking the circuit.

[0122] Example 4

[0123] Figures 12 to 14 The diagram below shows the structure of a metallized separator capacitor according to Embodiment 4 of the present invention. The metallized separator capacitor is formed by rolling a first metallized separator 1 and a second metallized separator 2 in a staggered manner. The first metallized separator 1 and the second metallized separator 2 are staggered in a top view to form a staggered edge L.

[0124] The first metallized isolation film 1 is formed by covering the first metallized electrode 11 on the first film surface of the dielectric film 12, and a first insulating edge 114 is reserved on the first film surface of the dielectric film 12. The first metallized electrode 11 is divided into a non-segmented electrode 112 and a continuously repeating metallized isolation unit 113 along the longitudinal direction by a longitudinal first insulating gap 111. The first insulating edge 114 is adjacent to the metallized isolation unit 113 and is located on the side opposite to the non-segmented electrode 112. Each metallized isolation unit 113 is connected to the non-segmented electrode 112 by a first-stage fuse 115. Adjacent metallized isolation units 113 are separated by a transverse first insulating gap 116. The metallized isolation unit 113 is divided into N-stage segmented electrodes by a longitudinal second insulating gap 117, where N is a natural number ≥2. The first-level segmented electrode is connected to the non-segmented electrode 112 via a first-level fuse 115. The first-level segmented electrode is connected to the second-level segmented electrode via a second-level fuse. The second-level segmented electrode is connected to the third-level segmented electrode via a third-level fuse. In sequence, the (N-1)th-level segmented electrode is connected to the Nth-level segmented electrode via an Nth-level fuse. The electrode adjacent to the non-segmented electrode 112 is the first-level segmented electrode, and the electrode adjacent to the first insulating edge 114 is the Nth-level segmented electrode. The first-level segmented electrode to the Nth-level segmented electrode are each formed by at least one single grid electrode. The equivalent resistance of the Nth-level fuse connected in parallel to the single grid electrode of the Nth-level segmented electrode is greater than the equivalent resistance of the N-1th-level fuse connected in parallel to the single grid electrode of the (N-1)th-level segmented electrode.

[0125] The second metallized separator 2 is formed by covering the second film surface of the dielectric film 12 with the second metallized electrode 21, and a second insulating edge 212 is reserved on the second film surface of the dielectric film 12. The second metallized separator 2 is stacked and staggered with the first metallized separator 1 to form a staggered edge L. The projections of the non-segmented electrode 211 of the second metallized separator 2 and the non-segmented electrode 112 of the first metallized separator 1 in the top view are independent of each other, that is, in the top view, the non-segmented electrode 211 of the second metallized separator 2 and the non-segmented electrode 112 of the first metallized separator 1 do not intersect.

[0126] In this embodiment, at least two sets of the first metallized electrodes 11 are covered on the first film surface of the dielectric film 12; at least two sets of the second metallized electrodes 21 are covered on the second film surface of the dielectric film 12; when the second metallized isolation film 2 is arranged with the second insulating edge 212, the Nth level segmented electrode to the first level segmented electrode, and the non-segmented electrode 211 in sequence, the corresponding first metallized isolation film 1 is arranged with the non-segmented electrode 112, the first level segmented electrode to the Nth level segmented electrode, and the first insulating edge 114 in the same direction.

[0127] Specifically, the Nth-level segmented electrode of the second metallized electrode 21 and the first-level segmented electrode of the first metallized electrode 11, the (N-1)th-level segmented electrode of the second metallized electrode 21 and the second-level segmented electrode of the first metallized electrode 11, and so on, until the first-level segmented electrode of the second metallized electrode 21 and the Nth-level segmented electrode of the first metallized electrode 11 at least partially overlap in a top view.

[0128] like Figure 12 and Figure 13 As shown, two sets of first metallized electrodes 11 are covered on the first film surface of the dielectric film 12; two sets of second metallized electrodes 21 are covered on the second film surface of the dielectric film 12; the two sets of first metallized electrodes 11 are arranged in a mirror symmetrical manner, and the two sets of second metallized electrodes 21 are arranged in a mirror symmetrical manner.

[0129] Of course, such as Figure 14 As shown, three sets of first metallized electrodes 11 can be covered on the first film surface of the dielectric film 12; correspondingly, three sets of second metallized electrodes 21 can be covered on the second film surface of the dielectric film 12.

[0130] The ratio of the total width of the non-segmented electrode 112 of the first metallized separator 1 in the lateral direction to the width of the first metallized separator 1 in the lateral direction does not exceed 1 / 2. Similarly, the ratio of the total width of the non-segmented electrode of the second metallized separator 2 in the lateral direction to the width of the second metallized separator 2 in the lateral direction does not exceed 1 / 2, ensuring that the area of ​​the non-segmented electrode of one film involved in capacitance formation does not correspond to the non-segmented electrode of the other film. When the non-segmented electrode does not participate in capacitance formation, the segmented electrodes of the two films correspond to each other; when the non-segmented electrode participates in capacitance formation but its width ratio in the lateral direction is less than 1 / 2, the non-segmented electrode of one film corresponds to the segmented electrode of the other film; when the width ratio of the non-segmented electrodes of the two films in the lateral direction reaches 1 / 2, due to the staggered winding of the two films forming misaligned edges, the non-segmented electrode of one film corresponds to the segmented electrode of the other film, and the non-segmented electrodes of the two metallized films do not correspond to each other.

[0131] The equivalent resistance value of the first-stage fuse 115 connected in parallel between the single grid electrode of the metallized isolation unit 113 and the non-segmented electrode 112 is less than the equivalent resistance value of the second-stage fuse 1181 connected in parallel between the single grid electrodes of the first segmented electrode and the second segmented electrode. The second-stage fuse 1181 is more sensitive to current surges than the first-stage fuse 115. When the surge current reaches a certain value, the fuse heats up and vaporizes instantly, thus breaking the circuit.

[0132] When the first-stage dividing electrode 1131 and the second-stage dividing electrode 1132 of the first metallized separator 1 undergo normal self-healing, the current through the first-stage fuse 115 or the second-stage fuse 1181 is small, and neither the first-stage fuse 115 nor the second-stage fuse 1181 will trip, thus the normal operation of the capacitor is unaffected. Similarly, when the first-stage dividing electrode and the second-stage dividing electrode of the second metallized separator 2 undergo normal self-healing, the current through the first-stage fuse or the second-stage fuse is small, and neither the first-stage fuse nor the second-stage fuse will trip, thus the normal operation of the capacitor is unaffected.

[0133] When the non-segmented electrode 112 of the first metallized separator 1 or the second metallized separator 2 experiences a severe or extreme electrical weakness breakdown, the current through the fuse is large. Although the non-segmented electrode participates in the capacitance composition, since the area where the electrical weakness is located corresponds to the segmented electrode of another membrane, the fuse of each unit is broken by the current surge. The segmented electrode of the other membrane corresponding to the area where the electrical weakness is located is insulated and isolated, ensuring the working safety of the capacitor.

[0134] When the first-stage segmented electrode 1131 of the first metallized separator 1 or the second metallized separator 2 experiences a severe or extreme electrical weakness breakdown, the current through the first-stage fuse 115 is large, and the first-stage fuse 115 is broken by the current surge. The first-stage segmented electrode 1131 where the electrical weakness is located is insulated and isolated, ensuring the working safety of the capacitor.

[0135] When the second-stage segmented electrode 1132 of the first metallized separator 1 or the second metallized separator 2 experiences a severe or extreme electrical weakness breakdown, the current through the second-stage fuse 1181 is relatively large. Because the second-stage fuse 1181 is more sensitive to current surges, it breaks faster, and the second-stage segmented electrode 1132 where the electrical weakness is located is insulated and isolated. At this time, the first-stage fuse 115 connecting the first-stage segmented electrode 1131 and the non-segmented electrode 112 is no longer subjected to current surges because the electrical weakness area has been insulated and isolated, and it does not break. The capacitor only loses the capacitance formed by the second-stage segmented electrode 1132, and the capacitance loss is negligible, while ensuring the working safety of the capacitor.

[0136] When the non-segmented electrode does not participate in the capacitance formation, and the width ratio of the first-stage segmented electrode to the corresponding metallized isolation unit in the lateral direction does not exceed 1 / 2, due to the misalignment of the two metallized films, the first-stage segmented electrode of one metallized film corresponds to the second-stage segmented electrode of the other metallized film. When a severe or extreme electrical weakness breakdown occurs in the area where the first-stage segmented electrode is located, the current through the fuse is large. The second-stage segmented electrode of the other metallized film, being more sensitive to current surges, breaks off faster, isolating the second-stage segmented electrode. At this time, the first-stage fuse 115 connecting the first-stage segmented electrode and the non-segmented electrode is no longer subjected to current surges because the electrical weakness area has been insulated and isolated, and therefore does not break off. The capacitor only loses the capacitance formed by the second-stage segmented electrode, while the first-stage segmented electrode resumes normal operation. The capacitance loss is less than when the first-stage fuse 115 is completely disconnected. This further improves the capacitor's working life and stability while ensuring the capacitor's operational safety.

[0137] Although preferred embodiments of the invention have been described, those skilled in the art, upon learning the basic inventive concept, can make other changes and modifications to these embodiments. Therefore, the appended claims are intended to be interpreted as including both the preferred embodiments and all changes and modifications falling within the scope of the invention.

[0138] Obviously, those skilled in the art can make various modifications and variations to this invention without departing from its spirit and scope. Therefore, if these modifications and variations fall within the scope of the claims of this invention and their equivalents, this invention also intends to include these modifications and variations.

[0139] In the description of this invention, it should be understood that the terms "first" and "second" are used for descriptive purposes only and should not be construed as indicating or implying relative importance or implicitly specifying the number of indicated technical features. Therefore, a feature defined as "first" or "second" may explicitly or implicitly include one or more of that feature. In the description of this invention, "a plurality of" means two or more, unless otherwise explicitly specified.

[0140] In this invention, unless otherwise explicitly specified and limited, the terms "installation," "connection," "linking," and "fixing," etc., should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral part; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; they can refer to the internal communication of two components or the interaction between two components. Those skilled in the art can understand the specific meaning of the above terms in this invention according to the specific circumstances.

[0141] In this invention, unless otherwise explicitly specified and limited, "above" or "below" the second feature can mean that the first feature is in direct contact with the second feature, or that the first feature is in indirect contact with the second feature through an intermediate medium. Furthermore, "above," "over," and "on top" of the second feature can mean that the first feature is directly above or diagonally above the second feature, or simply that the first feature is at a higher horizontal level than the second feature. "Below," "below," and "under" the second feature can mean that the first feature is directly below or diagonally below the second feature, or simply that the first feature is at a lower horizontal level than the second feature.

[0142] In the description of this specification, the references to terms such as "one embodiment," "some embodiments," "example," "specific example," or "some examples," etc., indicate that a specific feature, structure, material, or characteristic described in connection with that embodiment or example is included in at least one embodiment or example of the present invention. In this specification, the illustrative expressions of the above terms should not be construed as necessarily referring to the same embodiment or example. Furthermore, the specific features, structures, materials, or characteristics described may be combined in any suitable manner in one or more embodiments or examples. Moreover, without contradiction, those skilled in the art can combine and integrate the different embodiments or examples described in this specification, as well as the features of different embodiments or examples.

[0143] Although embodiments of the present invention have been shown and described above, it is understood that the above embodiments are exemplary and should not be construed as limiting the present invention. Those skilled in the art can make changes, modifications, substitutions and variations to the above embodiments within the scope of the present invention.

Claims

1. A metallized separator, characterized in that, include: Dielectric thin film; A metallized electrode is provided, covering the dielectric film and having an insulating edge pre-reserved on the dielectric film. The metallized electrode is divided into a non-segmented electrode and a series of repeating metallized isolation units along the longitudinal direction by a first longitudinal insulating gap. Each metallized isolation unit is connected to the non-segmented electrode via a first-stage fuse. Adjacent metallized isolation units are separated by a first transverse insulating gap. The metallized isolation units are divided into N-stage segmented electrodes by a second longitudinal insulating gap, where N is a natural number ≥ 2. The first-stage segmented electrode is connected to the non-segmented electrode via the first-stage fuse. The first-stage segmented electrode is connected to the second-stage segmented electrode... The electrodes are connected by a second-stage fuse, and the second-stage segmented electrode is connected to the third-stage segmented electrode by a third-stage fuse. Similarly, the (N-1)th stage segmented electrode is connected to the Nth stage segmented electrode by an Nth-stage fuse. The electrode adjacent to the non-segmented electrode is the first-stage segmented electrode, and the electrode adjacent to the insulating edge is the Nth-stage segmented electrode. Each of the first-stage to Nth-stage segmented electrodes is formed by at least one single grid electrode. The equivalent resistance of the Nth-stage fuses connected in parallel to the single grid electrode of the Nth-stage segmented electrode is greater than the equivalent resistance of the N-1th stage fuses connected in parallel to the single grid electrode of the (N-1)th stage segmented electrode. The area of ​​a single grid electrode corresponding to a segmented electrode decreases progressively from the first-level segmented electrode to the Nth-level segmented electrode.

2. The metallized separator as described in claim 1, characterized in that, The second-level dividing electrode to the Nth-level dividing electrode are separated by a transverse second insulating gap, and the number of individual grid electrodes increases sequentially from the second-level dividing electrode to the Nth-level dividing electrode.

3. The metallized separator as described in claim 1, characterized in that, The ratio of the width of the non-segmented electrode in the lateral direction to the width of the metallized separator is less than or equal to 1 / 2.

4. The metallized separator as described in claim 1, characterized in that, The ratio of the width of the first-stage segmented electrode in the lateral direction to the width of the metallized isolation unit is less than or equal to 1 / 2.

5. The metallized separator as described in claim 1, characterized in that, The metallized isolation unit is divided into two levels of segmented electrodes by a longitudinal second insulating gap. The number of individual grid electrodes in the second level segmented electrode is greater than the number of individual grid electrodes in the first level segmented electrode. The equivalent resistance of the second level fuse connected in parallel to the individual grid electrodes of the second level segmented electrode is greater than the equivalent resistance of the first level fuse connected in parallel to the individual grid electrodes of the first level segmented electrode.

6. The metallized separator as described in claim 1, characterized in that, The metallized isolation unit is divided into three levels of segmented electrodes by a longitudinal second insulating gap. The number of individual grid electrodes in the third level segmented electrode is greater than the number of individual grid electrodes in the second level segmented electrode, and the number of individual grid electrodes in the second level segmented electrode is greater than the number of individual grid electrodes in the first level segmented electrode. The equivalent resistance of the third-level fuse connected in parallel to the individual grid electrodes of the third level segmented electrode is greater than the equivalent resistance of the second-level fuse connected in parallel to the individual grid electrodes of the second level segmented electrode, and the equivalent resistance of the second-level fuse connected in parallel to the individual grid electrodes of the second level segmented electrode is greater than the equivalent resistance of the first-level fuse connected in parallel to the individual grid electrodes of the first level segmented electrode.

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