UPS device life prediction method, device and computer-readable storage medium

Abstract

The present invention provides a method, device, and computer-readable storage medium for predicting the lifespan of a UPS device component. The device is powered on during operation of the UPS device. The method comprises: obtaining electrical stress parameters and temperature parameters of the device using a first sampling cycle during operation of the UPS device; sequentially calculating the average maintenance time of the device in corresponding time periods using the electrical stress parameters and temperature parameters at n consecutive sampling moments, where n is an integer greater than or equal to 3; and calculating and outputting an operating status index of the device based on the average maintenance time across all time periods and the average maintenance time of the device under rated load. The operating status index corresponds to the lifespan of the device. By obtaining and outputting the operating status index of the device based on the average maintenance time of the device in each time period, the present invention accurately determines the health status of the device and facilitates maintenance of the UPS device.

Description

Technical Field

[0001] The present invention relates to the field of uninterruptible power supplies, and more particularly to a method and device for predicting the life of components of a UPS device, and a computer-readable storage medium. Background Art

[0002] UPS (Uninterruptible Power Supply) is widely used in critical power-consuming applications such as banks, government agencies, hospitals, and rail transit. To further enhance UPS reliability, parallel systems or LBS control systems are typically employed. Regular inspections and checks are also conducted during UPS operation to proactively detect problems and ensure UPS reliability. However, as UPSs age, the aging of internal components can pose significant risks. Therefore, it's crucial to estimate the UPS's lifespan and develop a maintenance plan to ensure stable operation and reliability.

[0003] Currently, users generally estimate the lifespan of a UPS based on the manufacturer's stated lifespan. Manufacturers comprehensively consider the lifespan of all internal UPS components and estimate the lifespan based on the lifespan of key consumable parts. The lifespan of UPS components varies depending on the operating environment, operating time, and operating conditions. The actual lifespan of a UPS may differ from the manufacturer's stated lifespan. Therefore, users can only increase the frequency and intensity of UPS inspections or replace all consumable components as the manufacturer's stated lifespan approaches. The timing for inspections and component replacements is generally determined based on the engineer's experience, but human judgment is inherently inaccurate. Replacing consumable parts too early results in a waste of resources; replacing them too late can cause the UPS to malfunction and cease operation, resulting in significant losses for the department using the motor. Summary of the Invention

[0004] The technical problem to be solved by the present invention is to provide a UPS device component life prediction method, device and computer-readable storage medium to address the above-mentioned problem of not being able to intuitively determine whether the components in the UPS device need maintenance or replacement.

[0005] The present invention solves the above-mentioned technical problem by providing a method for predicting the life of a component of a UPS device, wherein the component is powered on during the operation of the UPS device, and the method comprises:

[0006] During the operation of the UPS device, obtaining electrical stress parameters and temperature parameters of the device by sampling in a first cycle;

[0007] Calculating the real-time average maintenance time of the device in the corresponding time period using the electrical stress parameter and the temperature parameter at n consecutive sampling moments, where n is an integer greater than or equal to 3;

[0008] According to the average maintenance time of all time periods and the average maintenance time of the device under rated load, an operating status index of the device is calculated and output, where the operating status index corresponds to the life status of the device.

[0009] As a further improvement of the present invention, the method calculates and outputs the operating status index of the device in a second period or according to a trigger command, and the duration of the second period is greater than the duration of the first period.

[0010] As a further improvement of the present invention, the operating status index is proportional to the life of the device, and the operating status index λ is calculated according to the following formula:

[0011]

[0012] MTi is the real-time average maintenance time calculated based on the operating status of the UPS equipment in the i-th time period.

[0013] As a further improvement of the present invention, the average maintenance time of the device in the corresponding time period is calculated in sequence based on the electrical stress parameters and temperature parameters at n consecutive sampling moments, including:

[0014] Generate an electric stress factor for a corresponding time period according to the electric stress parameters at n consecutive sampling moments;

[0015] Generate a temperature factor for a corresponding time period based on the temperature parameters at n consecutive sampling moments;

[0016] The average maintenance time of the device in the corresponding time period is calculated based on the electrical stress factor and the temperature factor in the same time period.

[0017] As a further improvement of the present invention, the average maintenance time is calculated according to the following formula:

[0018] MTi=μ×Si×Ri

[0019] Where μ is a fixed coefficient, Si is the electrical stress factor of the i-th time period, and Ri is the temperature factor of the i-th time period.

[0020] As a further improvement of the present invention, the electrical stress factor Si is calculated by the following formula:

[0021]

[0022] Wherein m is the fitting parameter, qi is the applied stress percentage of the device in the i-th time period, and q0 is the reference stress percentage.

[0023] As a further improvement of the present invention, the temperature factor Ri is calculated by the following formula:

[0024]

[0025] Wherein Ea is the activation energy, k is the Boltzmann constant, T0 is the temperature rise of the device under rated load, Ti is the actual temperature rise of the device in the i-th time period, and Ti = T0 × Pi / P0, P0 is the power loss of the device under rated load, and Pi is the power loss of the device in the i-th time period.

[0026] As a further improvement of the present invention, the method further comprises:

[0027] When the operating status index is less than a first preset value, a replacement prompt message is output.

[0028] The present invention also provides a UPS device component life prediction device, comprising a processor and a memory communicatively connected to the processor; wherein the memory stores instructions executable by the processor, and the instructions are executed by the processor so that the processor can execute the UPS device component life prediction method as described above.

[0029] The present invention also provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer-executable instructions, and the computer-executable instructions are used to enable a computer to execute the UPS device component life prediction method as described above.

[0030] The present invention has the following beneficial effects: according to the average maintenance time of the device in each time period, the operating status index of the device is obtained and output, thereby accurately obtaining the health status of the device and facilitating the maintenance of the UPS equipment. BRIEF DESCRIPTION OF THE DRAWINGS

[0031] Figure 1 1 is a flow chart of a method for predicting the life of a UPS device component provided by an embodiment of the present invention;

[0032] Figure 2 This is a flow chart of obtaining the average maintenance time for each time period in the UPS device component life prediction method provided by an embodiment of the present invention;

[0033] Figure 3 Schematic diagram of a UPS device component life prediction device provided by an embodiment of the present invention. DETAILED DESCRIPTION

[0034] In order to make the purpose, technical solutions and advantages of the present invention more clearly understood, the present invention will be further described in detail below with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described herein are only used to explain the present invention and are not intended to limit the present invention.

[0035] A UPS device includes many components, such as rectifiers, inverters, electrolytic capacitors, static switches, AC filters, and input and output EMI boards. During UPS operation, the service life of each component changes continuously, and each component's service life varies. To ensure the proper functioning of the UPS, it is necessary to monitor and correct the service life of each component within the UPS, allowing users to monitor the health of the UPS device in real time. Therefore, an embodiment of the present invention proposes a method for predicting the lifespan of UPS components.

[0036] like Figure 1 FIG2 is a flow chart of a method for predicting the lifespan of a UPS device component, provided in an embodiment of the present invention. This method can be used to predict the health status of each component (powered device) in a UPS device and obtain the health status of each component in the UPS device. The method of this embodiment is executed directly by a controller within the UPS device or can be executed in conjunction with the controller within the UPS device (e.g., by the controller and a computer device connected to the controller). The method specifically includes the following steps S11-S13.

[0037] Step S11: During the operation of the UPS device, electrical stress parameters and temperature parameters of the device are sampled in a first cycle. The first cycle can be set as needed. Generally, the shorter the first cycle, the more accurate the health status of the device.

[0038] Electrical stress parameters include current stress parameters and / or voltage stress parameters. The current stress parameter is the ratio of the current flowing through the device during UPS operation to the device's specification value (i.e., rated current), and the voltage stress parameter is the ratio of the voltage applied to the device during UPS operation to the device's specification value (i.e., rated voltage). For devices without voltage or current sampling (such as static switches and electrolytic capacitors), the corresponding voltage and current, and thus the corresponding electrical stress parameters, can be obtained by converting the sampled values ​​of adjacent devices with voltage or current sampling (such as inverters and rectifiers).

[0039] The temperature parameter can be directly obtained by detecting the thermistor inside the device. Similarly, for a device without an integrated thermistor, the ambient temperature inside the UPS device can be directly used as the temperature parameter.

[0040] Step S12: Calculate the average maintenance time of the device in the corresponding time period based on the electrical stress parameters and temperature parameters at n consecutive sampling moments, where n is an integer greater than or equal to 3.

[0041] For example, the electrical stress parameters and temperature parameters at all sampling moments can be divided into m groups (i.e., m time periods), each group including n consecutive electrical stress parameters and n consecutive temperature parameters, and m average maintenance times are calculated, where m is an integer not less than 1. Furthermore, the last sampling moment in a group can be used as the time period corresponding to the average maintenance time.

[0042] Specifically, the MTBF (mean time between failures) of UPS components can be calculated using test data from the UPS device development process. According to existing formulas for calculating the mean time between failures, the mean time between failures of components is related to the quality factor, environmental factor, electrical stress index, and temperature factor. Since UPS devices operate in a fixed environment and remain essentially unchanged, their quality factor and environmental factor can be considered constants, primarily depending on the initial design of the product, which can be obtained based on test data from the UPS device development process. The electrical stress index is closely related to the operating conditions of the UPS device (e.g., input voltage / current, output voltage / current, etc.), and the temperature factor is related to the operating temperature of the UPS device and the operating temperature of the components.

[0043] In one embodiment of the present invention, Figure 2 As shown, step S12 can be implemented in the following ways:

[0044] Step S121: Generate an electrical stress factor for a corresponding time period based on the electrical stress parameters at n consecutive sampling moments. Specifically, the electrical stress factor Si can be calculated using the following formula:

[0045]

[0046] Where m is the fitting parameter, qi is the applied stress percentage of the device during time period i, and q0 is the reference stress percentage. m is specifically the fitting parameter used to fit the voltage stress parameters at the corresponding n sampling moments to form a curve. The reference stress percentage can be obtained from test data during UPS device development. Of course, in actual applications, other existing methods can also be used to calculate the electrical stress factor.

[0047] Step S122: Generate corresponding temperature factors based on the temperature parameters at n consecutive sampling moments. Specifically, the temperature rise of the components of the UPS device in each time period can be estimated based on the data measured when the UPS device is running at full load. The calculation formula is as follows:

[0048] Ti=T0*Pi / P0 (2)

[0049] Where P0 is the power loss of the device at the rated full load of the UPS device, Pi is the power loss of the device in the i-th time period (for example, it can be the average power loss in n first cycles), Ti is the temperature rise of the device in the i-th time period (equivalent to the temperature rise in n first cycles), and T0 is the measured temperature rise of the device at the rated full load of the UPS device. Then, the temperature factor Ri is calculated according to the following formula:

[0050]

[0051] Where Ea is the activation energy and k is the Boltzmann constant.

[0052] Of course, in practical applications, other existing methods can also be used to calculate and obtain the temperature factor.

[0053] Step S123: Calculate and obtain the average maintenance time of the device in each time period based on the electrical stress factor and the temperature factor in each time period.

[0054] Specifically, the average maintenance time can be calculated according to the following formula:

[0055] MTi=μ×Si×Ri (4)

[0056] Where μ is a fixed coefficient, which can be obtained based on test data during the UPS equipment development process.

[0057] Step S13: Calculate and output the device's operating status index based on the average maintenance time of all time periods before the current moment and the average maintenance time of the device under rated load, where the operating status index corresponds to the device's lifespan.

[0058] Specifically, the operating status index is proportional to the life of the device, that is, the higher the operating status index, the better the health of the device; the lower the operating status index, the higher the failure rate of the device.

[0059] In one embodiment of the present invention, the operating status index λ can be calculated according to the following formula:

[0060]

[0061] MTi is the real-time average maintenance time calculated based on the UPS device operating status during the i-th time period (obtained in step S12). As the UPS device operates, the operating status index λ continuously decays. The better the device operating conditions, such as low temperature factors and low electrical stress factors, the slower the decay of the operating status index λ.

[0062] The above-mentioned UPS device component life prediction method obtains and outputs the device's operating status index based on the average maintenance time of the device in each time period, thereby accurately obtaining the device's health status and facilitating the maintenance of the UPS device.

[0063] The above step S13 can be automatically executed in a second cycle, and the duration of the second cycle can be greater than n times the duration of the first cycle to avoid repeated calculations. In addition, the above step S13 can also be triggered by an external input command, that is, step S13 is executed when a command input through a key or touch screen is received.

[0064] Accordingly, step S12 and step S13 may be executed in the same cycle. In practical applications, to avoid excessive computational effort at one time, step S12 may also be executed periodically. For example, the execution cycle of step S12 may be n times that of the first cycle.

[0065] In one embodiment of the present invention, in addition to steps S11-S13, the above-mentioned method for predicting the lifespan of a UPS device component may further include: outputting a replacement prompt when the operating status index is less than a first preset value. For example, when the maximum value of the operating status index is 1, the first preset value may be 0.5 (this value can be adjusted via software settings). That is, when the operating status index is less than 0.5, a prompt to replace the component is output, such as on a screen or by sending a text message to a maintenance personnel's mobile phone.

[0066] The present invention also provides a UPS device component life prediction device 3, which can specifically be the UPS device itself, and includes a processor 31 and a memory 32 communicatively connected to the processor 31; wherein the memory 32 stores instructions that can be executed by the processor 31, and the instructions are executed by the processor 31 so that the processor 31 can execute the UPS device component life prediction method as described above.

[0067] The UPS device life prediction device 3 in this embodiment is the same as the above Figure 1-2 The UPS device component life prediction method in the corresponding embodiment belongs to the same concept. Its specific implementation process is detailed in the corresponding method embodiment, and the technical features in the method embodiment are applicable to the device embodiment, which will not be repeated here.

[0068] The present invention also provides a computer-readable storage medium, wherein the computer-readable storage medium stores computer-executable instructions, and the computer-executable instructions are used to enable a computer to execute the UPS device component life prediction method as described above.

[0069] The computer-readable storage medium in this embodiment is the same as the above Figure 1-2The UPS device component life prediction method in the corresponding embodiment belongs to the same concept. Its specific implementation process is detailed in the corresponding method embodiment, and the technical features in the method embodiment are applicable in this storage medium embodiment, which will not be repeated here.

[0070] It should be understood that the size of the serial numbers of the steps in the above embodiments does not mean the order of execution. The execution order of each process should be determined by its function and internal logic, and should not constitute any limitation on the implementation process of the embodiments of this application.

[0071] Those skilled in the art can clearly understand that, for the convenience and brevity of description, only the division of the above-mentioned functional units and modules is used as an example for illustration. In actual applications, the above-mentioned functions can be distributed and completed by different functional units and modules as needed. The functional units and modules in the embodiment can be integrated into one processor, or each unit can exist physically alone, or two or more units can be integrated into one unit. The above-mentioned integrated units can be implemented in the form of hardware or in the form of software functional units. In addition, the specific names of the functional units and modules are only for the convenience of distinguishing each other and are not used to limit the scope of protection of this application. The specific working process of the units and modules in the above-mentioned system can refer to the corresponding process in the aforementioned method embodiment, which will not be repeated here.

[0072] In the above embodiments, the description of each embodiment has its own focus. For parts that are not described or recorded in detail in a certain embodiment, reference can be made to the relevant description of other embodiments.

[0073] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered beyond the scope of this application.

[0074] In addition, the functional units in the various embodiments of the present application may be integrated into a single processor, or each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0075] If the integrated module / unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the present application implements all or part of the process in the above-mentioned embodiment method, and can also be completed by instructing the relevant hardware through a computer program. The computer program can be stored in a computer-readable storage medium. When the computer program is executed by the processor, it can implement the steps of the above-mentioned various method embodiments. Among them, the computer program includes computer program code, and the computer program code can be in source code form, object code form, executable file or some intermediate form. The computer-readable medium may include: any entity or interface switching device that can carry the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium. It should be noted that the content contained in the computer-readable medium can be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media does not include electric carrier signals and telecommunication signals.

[0076] While the embodiments of the present invention have been described in detail above with reference to the accompanying drawings, the present invention is not limited to the embodiments described above. Various modifications may be made within the scope of knowledge possessed by a person skilled in the art without departing from the spirit of the present invention. Furthermore, the embodiments of the present invention and the features thereof may be combined with one another unless there is a conflict.

Claims

1. A method for predicting the life of a component in a UPS device, wherein the component is powered on during operation of the UPS device, characterized in that: The method comprises: During the operation of the UPS device, obtaining electrical stress parameters and temperature parameters of the device by sampling in a first cycle; Calculating the real-time average maintenance time of the device in the corresponding time period using the electrical stress parameter and the temperature parameter at n consecutive sampling moments, where n is an integer greater than or equal to 3; Calculate and output an operating status index of the device based on the average maintenance time of all time periods and the average maintenance time of the device under rated load, wherein the operating status index corresponds to the life status of the device; The step of sequentially calculating the real-time average maintenance time of the device in a corresponding time period based on the electrical stress parameters and temperature parameters at n consecutive sampling moments includes: Generate an electric stress factor for a corresponding time period according to the electric stress parameters at n consecutive sampling moments; Generate a temperature factor for a corresponding time period based on the temperature parameters at n consecutive sampling moments; Calculating an average maintenance time of the device in the corresponding time period based on the electrical stress factor and the temperature factor in the same time period; The electrical stress factor Si is calculated by the following formula: Wherein m is the fitting parameter, qi is the applied stress percentage of the device in the i-th time period, and q0 is the reference stress percentage; The temperature factor Ri is calculated by the following formula: Wherein Ea is the activation energy, k is the Boltzmann constant, T0 is the temperature rise of the device under rated load, Ti is the actual temperature rise of the device in the i-th time period, and Ti = T0 × Pi / P0, P0 is the power loss of the device under rated load, and Pi is the power loss of the device in the i-th time period.

2. The UPS device life prediction method according to claim 1, characterized in that: The method calculates and outputs the operating status index of the device in a second cycle or according to a trigger command, and the duration of the second cycle is longer than the duration of the first cycle.

3. The UPS device life prediction method according to claim 1, characterized in that: The operating status index is proportional to the life of the device, and the operating status index λ is calculated according to the following formula: MTi is the real-time average maintenance time calculated based on the operating status of the UPS equipment in the i-th time period.

4. The UPS device life prediction method according to claim 1, characterized in that: The average maintenance time is calculated according to the following formula: MTi=μ×Si×Ri Where μ is a fixed coefficient, Si is the electrical stress factor of the i-th time period, and Ri is the temperature factor of the i-th time period.

5. The method for predicting the life of a UPS device according to any one of claims 1 to 4, characterized in that: The method further comprises: When the operating status index is less than a first preset value, a replacement prompt message is output.

6. A UPS device life prediction device, characterized in that: It includes a processor and a memory in communication with the processor; wherein the memory stores instructions that can be executed by the processor, and the instructions are executed by the processor so that the processor can execute the UPS device component life prediction method according to any one of claims 1 to 5.

7. A computer-readable storage medium, characterized in that The computer-readable storage medium stores computer-executable instructions, and the computer-executable instructions are used to enable a computer to execute the UPS device component life prediction method according to any one of claims 1 to 5.

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