Optical fiber communication module single event effect test system and method
By designing a single-particle effect testing system for optical fiber communication modules, using vacuum radiation and heavy ion guns to monitor the single-particle effect of optical fiber communication modules, the problem of single-particle flip and latch effect of optical fiber communication modules in spatial radiation environment is solved, and the problem of single-particle flip and latch effect of optical fiber communication modules is realized. Evaluation and reinforcement design of radiation resistance of fiber optic communication modules.
Patent Information
- Application Number
- CN202111512529.8
- Authority / Receiving Office
- CN · China
- Patent Type
- Patents(China)
- Current Assignee / Owner
- Filing Date
- 2021-12-11
- Publication Date
- 2024-12-31
- Estimated Expiration
- 2041-12-11
AI Technical Summary
Optical fiber communication modules are prone to single-particle flips and single-particle latch effects in spatial radiation environments, resulting in communication abnormalities and lack of mature testing systems and methods for testing.
A single-particle effect testing system for optical fiber communication modules is designed, including vacuum irradiation system, code error instrument, main control computer, power supply and data acquisition computer, irradiation of optical fiber communication modules through heavy ion guns, monitoring and recording power supply current and the logic state changes, judge the single-particle latch effect, and perform power-off restart and data statistics to achieve testing of the single-particle effect.
It can accurately detect and evaluate the single-particle effect of the fiber optic communication module, guide the device's radiation-resistant reinforcement design and aerospace reliability application, and realize the evaluation of the single-particle ability of the fiber optic communication module.
Smart Images
Figure CN114355228B_ABST
Abstract
Description
Technical Field
[0001] The present invention relates to a single particle effect testing technology, and in particular to a single particle effect testing system and method for an optical fiber communication module. Background Art
[0002] With the current on-orbit application of high-throughput satellites, high-resolution cameras, and Internet satellites, the data generated is as high as Gbit per second. Currently, data transmission based on copper wires can only reach hundreds of Mbps, and the transmission distance is severely limited, which cannot meet the demand for high speed and bandwidth. Therefore, optical wave communication technology is increasingly showing a momentum to adapt to the needs of aerospace communications, and high-speed communication networks based on optical modules have received widespread attention. Optical modules concentrate optical power in a very narrow beam, with low electromagnetic interference between communication links and strong confidentiality. The size, weight, and power consumption of the device are significantly reduced, and the transmission rate can reach several Gbps to tens of Gbps. It has the potential to be widely used in space vehicles, especially micro-satellites. However, charged particles in the space radiation environment can induce single effect upset (SEU) and single effect latchup (SEL) effects in optical fiber communication modules, resulting in communication errors, latchup, and other phenomena, causing communication anomalies.
[0003] Since the fiber-optic communication module has not yet experienced space stress and lacks mature single-particle testing systems and testing methods, it is necessary to carry out design optimization based on the heavy ion accelerator test device environment of the China Institute of Atomic Energy in order to achieve the test capability of single-particle flip, single-particle latch and other effects on the fiber-optic communication module. Summary of the invention
[0004] The purpose of the present invention is to provide a single particle effect test system and method for an optical fiber communication module, so as to solve the single particle effect test problem of the optical fiber communication module.
[0005] In order to achieve the above-mentioned purpose, the present invention provides a single particle effect test system for an optical fiber communication module, comprising a power supply control and test system; the power supply control and test system comprises a vacuum irradiation system, a bit error meter, a main control computer, a power supply, a communication board, a first repeater and a data acquisition computer; the vacuum irradiation system comprises a vacuum irradiation chamber, a mobile target, a heavy ion gun, an SMA connector, an FPGA, a second repeater and an SMA connector; the mobile target, the heavy ion gun, the FPGA and the second repeater are all placed in the vacuum irradiation chamber; the optical fiber communication module to be tested is installed on the mobile target; the SMA connector is arranged on the wall of the vacuum irradiation chamber; one channel of the optical fiber communication module to be tested is connected to the SMA connector, and the SMA connector is connected to the bit error meter; the remaining channels of the optical fiber communication module to be tested are connected to the FPGA, and the FPGA is connected to the data acquisition computer through the DB9 serial port; the power supply provides a DC stable voltage for the optical fiber communication module to be tested and the FPGA; the main control computer is connected to the power supply; the main control computer, the communication board and the first repeater are connected in sequence, and the first repeater is connected to the register configured inside the optical fiber communication module to be tested through the DB9 serial port second repeater.
[0006] The above-mentioned optical fiber communication module single particle effect test system, wherein the optical fiber communication module single particle effect test system also includes a remote monitoring system, and the remote monitoring system includes a remote monitoring computer; the remote monitoring computer is respectively connected to the main control computer, the bit error meter and the data acquisition computer through a network cable and a network switch, and the test personnel control the main control computer through the remote monitoring computer and display the interface of the main control computer, thereby achieving the purpose of remote monitoring.
[0007] In the above-mentioned single-particle effect test system for optical fiber communication module, the bit error meter sends a pseudo-random code to the optical fiber communication module under test through an SMA connector, and then receives information processed by the optical fiber communication module under test. The bit error meter calculates the bit error rate by comparing the transmitted data and the received data and displays it on the main control computer. The bit error rate is the bit error rate of one channel connecting the optical fiber communication module under test and the bit error meter; the data acquisition computer reads the internal data of the FPGA and counts the bit error rates of the remaining channels of the optical fiber communication module under test.
[0008] In the above-mentioned single-particle effect test system for optical fiber communication module, the main control computer is connected to the power supply via USB to achieve access, and is used to control the power supply voltage and detect the power supply current.
[0009] In the above-mentioned single particle effect test system for optical fiber communication module, during the irradiation process, the main control computer cyclically reads the storage data of the internal register of the optical fiber communication module under test through the communication board, and compares it, counts and displays the logic state flipping of the internal storage data of the optical fiber communication module under test, and the flipping situation includes the flipping bit number, flipping bit address and flipping time.
[0010] In the above-mentioned single-particle effect test system for the optical fiber communication module, if the main control computer detects that the power supply current of the pin of the optical fiber communication module under test suddenly increases to 1.5 times of the normal state, the main control computer controls the power supply to pull down the pin voltage of the optical fiber communication module under test, so that the optical fiber communication module under test is in a functional abnormality state. Along with the functional abnormality, the optical fiber communication module under test needs to be powered off and restarted to restore the normal working state, then it is considered that a single-particle latch occurs at this time.
[0011] The above-mentioned single-particle effect test system for optical fiber communication modules, wherein the main control computer includes a temperature monitoring module, a power control module, a bit error rate monitoring module, a current monitoring module, a flip monitoring module and a latch monitoring module; the power control module is used to remotely control the power supply to achieve real-time voltage control of the optical fiber communication module under test; the current monitoring module is used to monitor and record the change of power supply current as an important basis for judging whether latching occurs; the flip monitoring module and the latch monitoring module are used to monitor the working state of the optical fiber communication module under test, observe the experimental phenomenon of the single-particle effect, and record the experimental data in real time; the bit error rate monitoring module monitors the bit error rate change law caused by the single-particle effect according to the bit error rate statistics of the bit error meter and the data acquisition computer.
[0012] Another technical solution provided by the present invention is a method for testing single-particle effects of an optical fiber communication module, using the above-mentioned single-particle effects testing system for an optical fiber communication module, the method comprising the following steps:
[0013] S1. Preparation before the test;
[0014] S2, set the heavy ion gun parameters;
[0015] S3. Start the test software, start irradiating the optical fiber communication module under test, monitor and record abnormal phenomena in real time, and record the test start time, end time, incident heavy ion type, LET energy value, incident depth in silicon, total injection, injection rate and other information;
[0016] During the irradiation process, the main control computer cyclically reads the stored data of the internal register of the optical fiber communication module under test through the communication board, compares it, and counts and displays the logic state flipping of the stored data inside the optical fiber communication module under test;
[0017] The main control computer monitors the power supply current. If it is detected that the power supply current of the optical fiber communication module pin under test suddenly increases to 1.5 times of the normal state, the main control computer controls the power supply to pull down the pin voltage of the optical fiber communication module under test, so that the optical fiber communication module under test is in a functional abnormality state. With the functional abnormality, the optical fiber communication module under test needs to be powered off and restarted to restore the normal working state. It is considered that a single particle latch occurs at this time, and the number of single particle latch effects increases by 1. After the single particle latch occurs, the heavy ion gun is turned off to stop irradiation, and the optical fiber communication module under test is powered off and restarted, and then the heavy ion gun is turned on for irradiation. The main control computer monitors the power supply current change again until the number of single particle latch effects reaches 3 times or the injection amount reaches 10 7 ions / cm 2 ;
[0018] S4. When the test meets the requirements, turn off the heavy ion gun to stop irradiation, and repeat the power-off and power-on of the optical fiber communication module under test 5 times to detect whether the optical fiber communication module under test functions normally;
[0019] S5, calculating the number of flips and latches at the LET energy value;
[0020] S6. Change the LET energy value, return to step S2, and perform heavy ion irradiation at the next LET energy value until the irradiation test at all LET energy values is completed.
[0021] Compared with the prior art, the beneficial technical effects of the present invention are:
[0022] The optical fiber communication module single particle effect testing system and method of the present invention can test the single particle effect of the optical fiber communication module, can simultaneously detect up to 12 channels of channel communication data, obtain the single particle effect phenomenon and law of the optical fiber communication module, realize accurate evaluation of the optical fiber communication module's anti-single particle capability, and guide the device's radiation resistance reinforcement design and aerospace reliability application. BRIEF DESCRIPTION OF THE DRAWINGS
[0023] The optical fiber communication module single particle effect testing system and method of the present invention are provided by the following embodiments and drawings.
[0024] Figure 1 FIG. 1 is a schematic diagram of a single-particle effect testing system for an optical fiber communication module according to an embodiment of the present invention.
[0025] Figure 2 Shown is a schematic diagram of a remote monitoring computer interface in an embodiment of the present invention.
[0026] Figure 3 Shown is a schematic diagram of a data acquisition computer interface in an embodiment of the present invention.
[0027] Figure 4The figure shows a schematic diagram of bit error rate statistics of the main control computer interface in an embodiment of the present invention.
[0028] Figure 5 It is a flow chart of a single event effect testing method for an optical fiber communication module according to an embodiment of the present invention. DETAILED DESCRIPTION
[0029] The following will be combined Figure 1 to Figure 5 The optical fiber communication module single particle effect testing system and method of the present invention are further described in detail.
[0030] Figure 1 FIG. 1 is a schematic diagram of a single-particle effect testing system for an optical fiber communication module according to an embodiment of the present invention.
[0031] See also Figure 1 , the optical fiber communication module single particle effect test system of this embodiment includes a power supply control and test system and a remote monitoring system;
[0032] The remote monitoring system includes a remote monitoring computer;
[0033] The power supply control and test system includes a vacuum irradiation system, a bit error meter, a main control computer, a power supply, a communication board, a first repeater and a data acquisition computer;
[0034] The vacuum irradiation system comprises a vacuum irradiation chamber, a mobile target, a heavy ion gun, an SMA connector, an FPGA, a second repeater and an SMA connector; the mobile target, the heavy ion gun, the FPGA and the second repeater are all placed in the vacuum irradiation chamber; the SMA connector is arranged on the wall of the vacuum irradiation chamber;
[0035] The bit error meter, the main control computer, the power supply, the communication board, the first repeater and the data acquisition computer are all placed on a test bench.
[0036] The remote monitoring computer of the remote monitoring system is connected to the main control computer, bit error meter and data acquisition computer through network cables and network switches (routers). The test personnel control the main control computer through the remote monitoring computer and display the interface of the main control computer, thereby achieving the purpose of remote monitoring. Figure 2 The figure shows a schematic diagram of a remote monitoring computer interface in an embodiment of the present invention, and the displayed information includes the temperature, voltage, register flip number and other information of the optical fiber communication module under test.
[0037] The vacuum irradiation system irradiates the optical fiber communication module under test; the optical fiber communication module under test is installed on the mobile target; in this embodiment, the optical fiber communication module under test has 12 channels, one of which is connected to the SMA connector through a radio frequency line, the SMA connector is connected to the bit error meter through a radio frequency line, and the remaining 11 channels are connected to the FPGA, the FPGA is connected to the data acquisition computer through the DB9 serial port, and the data acquisition computer performs statistics on the bit error rate of the channel under test. Figure 3 Shown is a schematic diagram of a data acquisition computer interface in an embodiment of the present invention.
[0038] The power control and test system is the core of the entire fiber optic communication module single particle effect test system. It is located outside the vacuum irradiation chamber and realizes power supply voltage control, current monitoring, data acquisition and other functions. The power supply of the power control and test system is used to provide DC stable voltage for the devices in the vacuum irradiation chamber. The fiber optic communication module and FPGA under test are connected to the power supply through the DB9 serial port; the main control computer is connected to the power supply through USB to achieve access, and the main control computer is used to control the power supply voltage and detect the power supply current.
[0039] The main control computer, the communication board and the first repeater are connected in sequence, and the first repeater is connected to the register configured inside the optical fiber communication module under test through the DB9 serial port second repeater.
[0040] The bit error meter sends pseudo-random codes to the optical fiber communication module under test through the RF line and SMA connector, and then receives the information processed by the optical fiber communication module under test. The bit error meter compares the transmitted data with the received data, calculates the bit error rate according to the difference in data, and displays it on the main control computer, such as Figure 4 As shown, the bit error rate is the bit error rate of a channel connecting the optical fiber communication module under test and the bit error tester.
[0041] The data acquisition computer uses RS-232 protocol to connect to the FPGA in the vacuum irradiation room, read the internal data of the FPGA, and collect statistics on the bit error rates of the remaining 11 channels of the tested optical fiber communication module.
[0042] like Figure 4 As shown, the main control computer includes functional modules such as temperature monitoring module, power control module, bit error rate monitoring module, current monitoring module, flip monitoring module, latch monitoring module, etc. The power control module is used to remotely control the power supply to achieve real-time voltage control of the optical fiber communication module under test; the current monitoring module is used to monitor and record the change of power supply current as an important basis for judging whether latch occurs; the flip monitoring module and latch monitoring module are used to monitor the working state of the optical fiber communication module under test, observe the experimental phenomenon of single particle effect, and record the experimental data in real time; the bit error rate monitoring module monitors the bit error rate change law caused by single particle effect according to the bit error rate statistically calculated by the bit error meter and the data acquisition computer.
[0043] Figure 5 It is a flow chart of a single event effect testing method for an optical fiber communication module according to an embodiment of the present invention.
[0044] The single event effect testing method of the optical fiber communication module of this embodiment includes:
[0045] S1. Preparation before testing
[0046] To ensure that heavy ions can penetrate into the sensitive area of the optical fiber communication module under test during irradiation, the optical fiber communication module under test needs to be uncapped before irradiation; after uncapping, function and performance tests are performed to ensure that the optical fiber communication module under test can remain normal;
[0047] Fix the optical fiber communication module under test on the moving target in the vacuum irradiation chamber. Ensure the consistency of movement between the optical fiber communication module under test and the moving target. Ensure that the incident heavy ions irradiate the sensitive area surface of the optical fiber communication module under test without any obstruction at any angle.
[0048] according to Figure 1 Build the entire test system, place the FPGA in the vacuum irradiation room, and the power supply and bit error meter outside the vacuum irradiation room. Use the DB9 connector and SMA connector on the wall of the vacuum irradiation room to connect the indoor and outdoor devices. After the connection is completed, check the communication of the single-particle effect test system of the optical fiber communication module to ensure that all functions are normal.
[0049] Set the IP and time of the BER tester, main control computer and monitoring computer so that all devices are in the same LAN segment and the time is completely consistent, accurate to the second. After all preparations are completed, the vacuum irradiation chamber is evacuated;
[0050] S2. Set the heavy ion gun parameters
[0051] Adjust the LET energy value of the heavy ion of the heavy ion gun, select a suitable light spot according to the size of the optical fiber communication module under test, and calibrate the center point of irradiation (i.e. the position of the center of the optical fiber communication module under test) to ensure that the irradiated area meets the test requirements and does not affect other devices;
[0052] S3. Open the screen recording software on the monitoring computer (i.e., start the test software), start irradiating the optical fiber communication module under test, monitor and record abnormal phenomena in real time, and record the test start time, end time, incident heavy ion type, LET energy value, incident depth in silicon, total injection, injection rate and other information;
[0053] During the irradiation process, the main control computer cyclically reads the stored data of the internal register of the optical fiber communication module under test through the communication board, and compares and counts the logic state flipping of the internal stored data of the optical fiber communication module under test, and displays the flip bit number, flip bit address, flip time, etc.
[0054] The main control computer monitors the power supply current. If it is detected that the power supply current of the optical fiber communication module pin under test suddenly increases to 1.5 times of the normal state, the main control computer controls the power supply to pull down the pin voltage of the optical fiber communication module under test, so that the optical fiber communication module under test is in a functional abnormality state. With the functional abnormality, the optical fiber communication module under test needs to be powered off and restarted to restore the normal working state. It is considered that a single particle latch occurs at this time, and the number of single particle latch effects increases by 1. After the single particle latch occurs, the heavy ion gun is turned off to stop irradiation, and the optical fiber communication module under test is powered off and restarted, and then the heavy ion gun is turned on for irradiation. The main control computer monitors the power supply current change again until the number of single particle latch effects reaches 3 times or the injection amount reaches 10 7 ions / cm 2 ;
[0055] S4. The test meets the requirements (i.e. the number of single event latch effects reaches 3 times or the injection reaches 10 7 ions / cm 2 ), turn off the heavy ion gun to stop irradiation, and repeat the power-off and power-on of the optical fiber communication module under test 5 times to detect whether the optical fiber communication module under test functions normally;
[0056] S5, calculating the number of flips and latches at the LET energy value;
[0057] S6. Change the LET energy value, return to step S2, and perform heavy ion irradiation at the next LET energy value until the irradiation test at all LET energy values is completed.
[0058] The contents not described in detail in the specification of the present invention belong to the common knowledge of the professionals in this field.
Claims
1. Optical fiber communication module single event effect test system, characterized in that: It includes a power supply control and test system; the power supply control and test system includes a vacuum irradiation system, a bit error meter, a main control computer, a power supply, a communication board, a first repeater and a data acquisition computer; The vacuum irradiation system comprises a vacuum irradiation chamber, a mobile target, a heavy ion gun, an SMA connector, an FPGA, a second repeater and an SMA connector; the mobile target, the heavy ion gun, the FPGA and the second repeater are all placed in the vacuum irradiation chamber; The optical fiber communication module to be tested is installed on the moving target; the SMA connector is arranged on the wall of the vacuum irradiation chamber; One channel of the optical fiber communication module under test is connected to the SMA connector, and the SMA connector is connected to the bit error tester; the remaining channels of the optical fiber communication module under test are connected to the FPGA, and the FPGA is connected to the data acquisition computer through the DB9 serial port; The power supply provides a DC stable voltage for the optical fiber communication module and FPGA under test; the main control computer is connected to the power supply; The main control computer, the communication board and the first repeater are connected in sequence, and the first repeater is connected to the register configured inside the optical fiber communication module under test through the DB9 serial port second repeater.
2. The optical fiber communication module single event effect test system according to claim 1, characterized in that: The optical fiber communication module single particle effect test system also includes a remote monitoring system, which includes a remote monitoring computer; the remote monitoring computer is connected to the main control computer, the bit error meter and the data acquisition computer through a network cable and a network switch respectively, and the test personnel control the main control computer through the remote monitoring computer and display the interface of the main control computer, thereby achieving the purpose of remote monitoring.
3. The optical fiber communication module single event effect test system according to claim 1, characterized in that: The bit error meter sends a pseudo-random code to the optical fiber communication module under test through the SMA connector, and then receives the information processed by the optical fiber communication module under test. The bit error meter calculates the bit error rate by comparing the transmitted data and the received data and displays it on the main control computer. The bit error rate is the bit error rate of one channel connecting the optical fiber communication module under test and the bit error meter; the data acquisition computer reads the internal data of the FPGA and counts the bit error rates of the remaining channels of the optical fiber communication module under test.
4. The optical fiber communication module single event effect test system according to claim 1, characterized in that: The host computer is connected to the power supply via USB to access the power supply voltage and detect the power supply current.
5. The optical fiber communication module single event effect test system according to claim 1, characterized in that: During the irradiation process, the main control computer cyclically reads the stored data of the internal register of the optical fiber communication module under test through the communication board, compares it, and counts and displays the logical state flipping of the internal stored data of the optical fiber communication module under test. The flipping situation includes the flipping bit number, flipping bit address and flipping time.
6. The optical fiber communication module single event effect test system according to claim 1, characterized in that: If the main control computer detects that the power supply current of the pin of the optical fiber communication module under test suddenly increases to 1.5 times of the normal state, the main control computer controls the power supply to pull down the pin voltage of the optical fiber communication module under test, causing the optical fiber communication module under test to be in a functional abnormality state. Along with the functional abnormality, the optical fiber communication module under test needs to be powered off and restarted to restore to normal working state, then it is considered that single-particle latch occurs at this time.
7. The optical fiber communication module single event effect test system according to claim 1, characterized in that: The main control computer includes a temperature monitoring module, a power control module, a bit error rate monitoring module, a current monitoring module, a flip monitoring module and a latch monitoring module; the power control module is used to remotely control the power supply to achieve real-time control of the voltage of the optical fiber communication module under test; the current monitoring module is used to monitor and record the change of the power supply current as an important basis for judging whether latching occurs; the flip monitoring module and the latch monitoring module are used to monitor the working state of the optical fiber communication module under test, observe the experimental phenomenon of the single particle effect, and record the experimental data in real time; the bit error rate monitoring module monitors the bit error rate change law caused by the single particle effect according to the bit error rate statistics of the bit error meter and the data acquisition computer.
8. A method for testing single-particle effects of an optical fiber communication module, characterized in that: Using the optical fiber communication module single event effect test system as claimed in claim 1, the method comprises the following steps: S1. Preparation before the test; S2, set the heavy ion gun parameters; S3. Start the test software, start irradiating the optical fiber communication module under test, monitor and record abnormal phenomena in real time, and record the test start time, end time, incident heavy ion type, LET energy value, incident depth in silicon, total injection, injection rate and other information; During the irradiation process, the main control computer cyclically reads the stored data of the internal register of the optical fiber communication module under test through the communication board, compares it, and counts and displays the logic state flipping of the stored data inside the optical fiber communication module under test; The main control computer monitors the power supply current. If it is detected that the power supply current of the optical fiber communication module pin under test suddenly increases to 1.5 times of the normal state, the main control computer controls the power supply to pull down the pin voltage of the optical fiber communication module under test, so that the optical fiber communication module under test is in a functional abnormality state. With the functional abnormality, the optical fiber communication module under test needs to be powered off and restarted to restore the normal working state. It is considered that a single particle latch occurs at this time, and the number of single particle latch effects increases by 1. After the single particle latch occurs, the heavy ion gun is turned off to stop irradiation, and the optical fiber communication module under test is powered off and restarted, and then the heavy ion gun is turned on for irradiation. The main control computer monitors the power supply current change again until the number of single particle latch effects reaches 3 times or the injection amount reaches 10 7 ions / cm 2 ; S4. When the test meets the requirements, turn off the heavy ion gun to stop irradiation, and repeat the power-off and power-on of the optical fiber communication module under test 5 times to detect whether the optical fiber communication module under test functions normally; S5, calculating the number of flips and latches at the LET energy value; S6. Change the LET energy value, return to step S2, and perform heavy ion irradiation at the next LET energy value until the irradiation test at all LET energy values is completed.
9. The single-event effect testing method for an optical fiber communication module according to claim 8, characterized in that: In the step S1, the preparation includes uncapping the optical fiber communication module under test; after uncapping, function and performance tests are performed to ensure that the optical fiber communication module under test can remain normal; Fix the optical fiber communication module under test on the moving target in the vacuum irradiation chamber to ensure the consistency of movement between the optical fiber communication module under test and the moving target, and ensure that the incident heavy ions irradiate the sensitive area surface of the optical fiber communication module under test without any obstruction at any angle; Build the entire test system, check the test system communication, and ensure that all functions are normal; Set the IP and time of the bit error meter, main control computer and monitoring computer so that all devices are in the same LAN segment and the time is completely consistent, accurate to the second. After all preparations are completed, evacuate the vacuum irradiation chamber.
10. The single event effect testing method of optical fiber communication module according to claim 8, characterized in that: In step S2, the LET energy value of the heavy ions of the heavy ion gun is adjusted, a suitable light spot is selected according to the size of the optical fiber communication module to be tested, and the center point of the irradiation is calibrated to ensure that the irradiated area meets the test requirements without affecting other devices.