Panel detection method, panel detection device, electronic equipment and storage medium

Abstract

Embodiments of the present invention provide a panel detection method, device, electronic device and storage medium. The method includes: acquiring an image of a panel to be detected; in the image of the panel to be detected, performing the following detection operations on the electrodes of the panel to be detected: in the image of the panel to be detected, identifying the electrodes of the panel to be detected; in the image of the panel to be detected, identifying the conductive particles in the electrodes; and determining whether the panel to be detected is qualified based on the positions of the identified electrodes and the positions of the identified conductive particles. The conductive particles identified by this technical solution are all particles with qualified indentation strength, which avoids the influence of the indentation strength of the particles on the accuracy of the detection results and improves the accuracy of the panel detection results. Based on the accurate panel detection results, unqualified materials in the panel can be discharged in time, avoiding the waste of materials and working time in subsequent work sections, and improving the yield of panel products.

Description

Technical Field

[0001] The present invention relates to the technical field of panel detection, and more specifically to a panel detection method, a panel detection device, an electronic device and a storage medium. Background Art

[0002] Chip on Glass (COG) is a technology that directly bonds a driver circuit chip (Integrated Circuit, IC) to a glass plate. It is widely used in various display products such as liquid crystal display and electroluminescent technology. The COG process aligns the electrodes of the driver circuit with the electrodes (bump) on the glass plate, and uses anisotropic conductive film (ACF) as the bonding dielectric material. The connection and conduction between the electrodes of the driver circuit and the electrodes on the glass plate are achieved through high temperature and high pressure for a certain period of time. Similarly, flexible circuit board technology on glass (FPC On Glass, FOG) is a technology that directly bonds a flexible circuit board (FPC) to a glass plate, and the process is similar to COG. Similarly, chip on film (COF) products on flexible substrates are chip packaging products formed by directly packaging semiconductor chips on flexible substrates and then bonding the flexible substrate to a glass plate. Its process is also similar to COG.

[0003] Particle indentation is a very important process in the panel binding process. Since the panel electrode material is flexible, it may expand, shrink or warp during the binding process. And each electrode may be pressed and offset, causing the panel to fail. In addition, during the panel inspection process, the particle indentation strength is also an important factor affecting the inspection results. Too strong an indentation may cause the particle to be crushed, and too weak an indentation may cause the particle to have poor conductivity.

[0004] Therefore, when inspecting a panel, there is an urgent need for a technology that can accurately inspect the binding quality between the electrodes that are joined in the panel to be inspected. Summary of the invention

[0005] The present invention is proposed in view of the above problems. The present invention provides a panel detection method, the method comprising:

[0006] Acquire an image of the panel to be inspected;

[0007] In the image of the panel to be inspected, the following inspection operations are performed on the electrodes of the panel to be inspected:

[0008] In the image of the panel to be inspected, identifying electrodes of the panel to be inspected;

[0009] In the image of the panel to be inspected, identifying the conductive particles in the electrode;

[0010] Whether the panel to be inspected is qualified is determined based on the identified positions of the electrodes and the identified positions of the conductive particles.

[0011] Exemplarily, after identifying the conductive particles in the electrode, the detection operation further includes:

[0012] generating a minimum envelope of the identified conductive particles;

[0013] Determining whether the panel to be inspected is qualified according to the identified positions of the electrodes and the identified positions of the conductive particles, including:

[0014] Whether the panel to be inspected is qualified is determined based on the identified positions of the electrodes and the position of the minimum envelope.

[0015] Exemplarily, the minimum envelope is a rectangle.

[0016] Exemplarily, determining whether the panel to be inspected is qualified according to the identified positions of the electrodes and the position of the minimum envelope frame includes:

[0017] Whether the panel to be inspected is qualified is determined according to the positions of the identified characteristic parts of the electrodes and the positions of the corresponding characteristic parts of the minimum envelope.

[0018] Exemplarily, the minimum envelope is a rectangle, and determining whether the panel to be inspected is qualified according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope includes:

[0019] Determine whether the distance between the top edge of the electrode and the top edge of the rectangle is less than a vertical threshold;

[0020] The panel to be inspected is determined to be qualified if it meets the preset conditions, wherein the preset conditions include that the distance between the top edge of the electrode and the top edge of the rectangle is less than a longitudinal threshold.

[0021] Exemplarily, the minimum envelope is a rectangle, and determining whether the panel to be inspected is qualified according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope includes:

[0022] Determine a first side of the electrode and a first side of the rectangle according to a distance between the electrode and a corresponding side of the rectangle, wherein the first side of the electrode corresponds to the first side of the rectangle, and a distance between the first side of the electrode and the first side of the rectangle is greater than a distance between another side of the electrode and a corresponding side of the rectangle;

[0023] Determine whether the distance between the first side of the electrode and the first side of the rectangle is less than a horizontal threshold;

[0024] The panel to be inspected is determined to be qualified if it meets the preset conditions, wherein the preset conditions include that the distance between the first side of the electrode and the first side of the rectangle is less than a horizontal threshold.

[0025] Exemplarily, determining whether the panel to be inspected is qualified according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope frame includes:

[0026] Determine the center of the electrode and the center of the minimum envelope;

[0027] Determine whether the distance between the center of the electrode and the center of the minimum envelope is less than a center distance threshold;

[0028] The panel to be inspected is determined to be qualified if it meets preset conditions, wherein the preset conditions include that the distance between the center of the electrode and the center of the minimum envelope is less than a center distance threshold.

[0029] Exemplarily, the method further comprises:

[0030] If the panel to be tested is unqualified, an alarm will be issued.

[0031] Exemplarily, the detection step is performed by traversing all electrodes of the panel to be detected.

[0032] According to another aspect of the present invention, there is provided a panel detection device, the device comprising:

[0033] An acquisition module, used for acquiring an image of a panel to be detected;

[0034] The detection module is used to perform the following detection operations on the electrodes of the panel to be detected in the image of the panel to be detected:

[0035] Identify the electrodes of the panel to be inspected;

[0036] In the image of the panel to be inspected, identifying the conductive particles in the electrode;

[0037] Whether the panel to be inspected is qualified is determined based on the identified positions of the electrodes and the identified positions of the conductive particles.

[0038] According to another aspect of the present invention, there is provided an electronic device, comprising an image acquisition device, a processor and a memory, wherein the image acquisition device is used to obtain an image of a panel to be inspected, and the memory stores computer program instructions, which are used to execute the above-mentioned panel inspection method when the processor runs the computer program instructions.

[0039] According to another aspect of the present invention, a storage medium is provided, on which program instructions are stored, and the program instructions are used to execute the above-mentioned panel detection method when running.

[0040] According to the above technical solution, the panel quality can be detected based on the positions of the electrodes on the panel to be detected and the positions of the conductive particles in the electrodes, that is, the distribution of the conductive particles in the electrodes. The technical solution of the present application has a wide scope of application and high generalization. And the detection results obtained based on the distribution of conductive particles in the electrode are more intuitive and convenient for users to observe. In addition, in the present application, the identified conductive particles are all particles with qualified indentation strength, which avoids the influence of the indentation strength of the particles on the accuracy of the detection results and improves the accuracy of the panel detection results. Based on the accurate panel detection results, unqualified materials in the panel can be discharged in time, avoiding the waste of materials and working hours in the subsequent work sections, and improving the yield of panel products.

[0041] The above description is only an overview of the technical solution of the present invention. In order to more clearly understand the technical means of the present invention, it can be implemented according to the contents of the specification. In order to make the above and other purposes, features and advantages of the present invention more obvious and easy to understand, the specific implementation methods of the present invention are listed below. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] The above and other purposes, features and advantages of the present invention will become more apparent by describing the embodiments of the present invention in more detail in conjunction with the accompanying drawings. The accompanying drawings are used to provide a further understanding of the embodiments of the present invention and constitute a part of the specification. Together with the embodiments of the present invention, they are used to explain the present invention and do not constitute a limitation of the present invention. In the accompanying drawings, the same reference numerals generally represent the same components or steps.

[0043] Figure 1 A schematic flow chart of a panel detection method according to an embodiment of the present invention is shown;

[0044] Figure 2 A schematic flow chart showing the detection steps for electrodes of a panel to be detected according to an embodiment of the present invention is shown;

[0045] Figure 3 A partial schematic diagram showing an image of a panel to be inspected according to an embodiment of the present invention;

[0046] Figure 4 A partial schematic diagram showing an image of a panel to be inspected in which electrodes have been identified according to an embodiment of the present invention;

[0047] Figure 5 A simplified schematic diagram of an electrode in a panel to be detected according to an embodiment of the present invention is shown;

[0048] Figure 6 shows a simplified schematic diagram of electrodes and conductive particles according to another embodiment of the present invention;

[0049] Figure 7A schematic diagram of a panel detection device according to an embodiment of the present invention is shown;

[0050] Figure 8 A schematic diagram of an electronic device according to an embodiment of the present invention is shown. DETAILED DESCRIPTION

[0051] In order to make the purpose, technical scheme and advantages of the present invention more obvious, the exemplary embodiments according to the present invention will be described in detail with reference to the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, rather than all the embodiments of the present invention, and it should be understood that the present invention is not limited to the exemplary embodiments described herein. Based on the embodiments of the present invention described in the present invention, all other embodiments obtained by those skilled in the art without creative work should fall within the protection scope of the present invention.

[0052] According to one embodiment of the present invention, a panel detection method is provided. The method determines whether the panel to be detected is qualified by identifying the position of the electrode on the panel to be detected and the position of the conductive particles in the electrode. It can be understood that it is desirable that the conductive particles on the electrode are evenly distributed, rather than biased to one side of the electrode. The more biased the position of the conductive particles on the electrode, the worse the conductivity of the electrode, and the worse the quality of the panel to be detected.

[0053] Reference below Figure 1 and Figure 2 1000 is a schematic flow chart of a panel detection method 1000 according to an embodiment of the present invention. Figure 1 As shown, the panel detection method 1000 may include the following steps.

[0054] Step S1100, acquiring an image of a panel to be inspected.

[0055] Panel detection can be achieved using a panel detection device. Exemplarily, the panel detection device may include a detection platform capable of carrying a panel to be detected and a detection component for detecting the panel to be detected carried on the detection platform. The detection component includes an image acquisition device capable of clearly capturing an image of the panel to be detected, such as a detection camera. Exemplarily, the panel to be detected may be a panel based on COG technology, a panel based on COF technology, a panel based on FOG technology, and the like. Exemplarily, a panel may include thousands or tens of thousands of electrodes, wherein the size of the conductive particles is in the micron order. In order to clearly distinguish between the electrodes and the conductive particles, a special detection camera such as a differential interference contrast (DIC) microscope camera may be used to capture the image of the panel to be detected.

[0056] Exemplarily, the image of the panel to be inspected may be an original image directly captured by an image acquisition device, or may be an image obtained after preprocessing the original image. The preprocessing operation may include all operations for more clearly performing panel detection. For example, the preprocessing operation may include denoising operations such as filtering, and may also include adjustments to image parameters such as image grayscale, contrast, brightness, etc., made to clearly identify electrodes or conductive particles in the image. The image may contain all or part of the electrodes in the panel to be inspected.

[0057] Step S1200: In the image of the panel to be inspected, the following steps are performed for the electrodes of the panel to be inspected: Figure 2 The detection operation shown: step S1210 to step S1250.

[0058] Step S1210, identifying electrodes of the panel to be detected.

[0059] As mentioned above, the panel to be inspected includes a large number of electrodes, and the electrodes to be inspected are identified from the image of the panel to be inspected that has been collected. Figure 3 A partial image of a panel to be inspected based on COF technology according to an embodiment of the present invention is shown. Figure 3 The image of the panel to be detected shown in FIG. 1 includes a plurality of electrodes 310. Figure 3 As shown, the grayscale of electrode 310 is significantly different from other areas in the image.

[0060] Exemplarily, the electrode 310 can be identified according to a preset grayscale threshold. For example, the preset grayscale threshold for identifying the electrode in the image is 65. The preset grayscale threshold 65 for image recognition can be loaded into the system program. Thus, the image of the panel to be detected can be segmented according to the grayscale threshold. The area greater than the grayscale threshold can be determined as the electrode, thereby identifying the area of ​​the electrode.

[0061] Alternatively, the electrode may be identified in the image of the panel to be detected in response to a user's operation. For example, the electrode boundary may be determined in response to a mouse event or a keyboard event initiated by the user, thereby identifying the electrode. For example, in response to an event in which a user drags a cursor on the image using a mouse, the electrode boundary may be determined according to the position of the cursor dragged.

[0062] Figure 4 A partial schematic diagram of an image of a panel to be inspected in which electrodes have been identified according to an embodiment of the present invention is shown. Optionally, the boundary of the electrode can be a rectangular frame composed of four edge lines of the electrode, namely, the top, bottom, left, and right edges, identified in the image of the panel to be inspected. Exemplarily, the rectangular frame can include a top edge, a bottom edge, a left edge, and a right edge.

[0063] Step S1230, identifying the conductive particles in the electrode in the image of the panel to be inspected.

[0064] It can be understood that in the panel to be tested, there are conductive particles in the electrode for conducting electricity. If the conductive particles have a qualified indentation strength in the electrode, they will appear in the image with a different grayscale from the area without particles. Figure 4 In the image of the panel to be detected, there are multiple conductive particles in the area of ​​each electrode, such as 410 is a conductive particle on the first electrode. Exemplarily, there is a relatively obvious grayscale difference between the indentation of each conductive particle and the electrode on which it is located. In addition, each conductive particle may include a darker first area 411 and a brighter second area 412. The grayscale of the first area 411 is usually smaller than the grayscale of the surrounding area, and the grayscale of the second area 412 is usually greater than the grayscale of the surrounding area. Therefore, conductive particles can be identified in the image of the panel to be detected based on grayscale, for example, by grayscale threshold. In addition to grayscale, conductive particles can also be identified based on other factors such as shape.

[0065] Step S1250, determining whether the panel to be inspected is qualified based on the identified positions of the electrodes and the identified positions of the conductive particles.

[0066] Exemplarily, in an image of a panel to be detected, the identified electrode can be regarded as a quadrilateral frame, such as a rectangular frame. The position of the rectangular frame can represent the position of the electrode. Optionally, the positions of the four sides of the rectangular frame can be determined, or the position of the center of the rectangular frame can be determined and used as the position of the electrode. On an electrode, several conductive particles can be included, and the positions of the several conductive particles are all within the consideration range. Optionally, the position occupied by a set of several conductive particles or the position of the center of several conductive particles can be used as the position of the identified conductive particle.

[0067] The position of the conductive particles on the identified electrode can be compared with the position of the electrode, and whether the panel to be tested is qualified can be determined based on the positional relationship between the two. Exemplary, such as determining the positional deviation of the two, such as determining the positional deviation of the two in the horizontal or vertical direction, or combining the horizontal positional deviation and the vertical positional deviation of the center point of the two. It can be understood that for the deviation in any of the above directions, if the deviation is closer to 0, it means that the two are closer to complete alignment; conversely, if the deviation deviates more from 0, it means that the misalignment of the two is more serious. By setting a certain deviation threshold, it can be determined whether the panel to be tested is qualified based on whether the determined deviation is greater than the deviation threshold.

[0068] Exemplarily, the detection step S1200 is performed by traversing all electrode pairs of the panel to be detected. The image of the panel to be detected contains multiple electrodes, and the position of each electrode and the position of the conductive particles on the electrode can be identified and determined one by one until the detection of all electrodes in the entire panel to be detected is completed to determine whether the panel to be detected is qualified. For example, based on the lateral deviation, longitudinal deviation and / or position deviation of the center point of the conductive particles on each electrode relative to the electrode on which it is located, the proportion of electrodes whose lateral deviation, longitudinal deviation and / or position deviation of the center point of the conductive particles on all electrodes are less than or equal to the deviation threshold can be determined, and when the proportion exceeds the proportion threshold, it is determined that the panel to be detected is qualified. The proportion is, for example, any value between 90% and 100%. In this technical solution, the quality of the panel to be detected is determined based on the position deviation of the conductive particles on all electrodes relative to the electrodes, and the detection result is more accurate.

[0069] According to the above technical solution, the panel quality can be detected based on the positions of the electrodes on the panel to be detected and the positions of the conductive particles in the electrodes, that is, the distribution of the conductive particles in the electrodes. The technical solution of the present application has a wide scope of application and high generalization. And the detection results obtained based on the distribution of conductive particles in the electrode are more intuitive and convenient for users to observe. In addition, in the present application, the identified conductive particles are all particles with qualified indentation strength, which avoids the influence of the indentation strength of the particles on the accuracy of the detection results and improves the accuracy of the panel detection results. Based on the accurate panel detection results, unqualified materials in the panel can be discharged in time, avoiding the waste of materials and working hours in the subsequent work sections, and improving the yield of panel products.

[0070] Exemplarily, the above method 1000 also includes: when the panel to be detected is unqualified, an alarm can be issued. For example, after executing the above detection operation S1200, when it is detected that the panel to be detected is unqualified, an alarm can be issued. The alarm can be in the form of a prompt sound that can remind the user, or it can be an alarm prompt box displayed on the interface and a button control such as "Confirm and Continue" or "Re-test". Optionally, when the user receives the alarm information, he can click the button "Confirm and Continue" to record the detection result of the panel to be detected, and mark the position of the electrode with a large deviation from the position of the identified conductive particle in the panel to be detected; or click the button "Re-test" to manually adjust the detection parameters and re-execute the detection of the panel to be detected. The detection parameters are, for example, any of the above-mentioned grayscale thresholds, deviation thresholds, etc. In this technical solution, an alarm is issued for unqualified panels to be detected, so as to facilitate the timely elimination of unqualified materials in the panel and avoid waste of materials and working hours in subsequent work sections.

[0071] For example, in the above detection operation S1200, after the conductive particles on the electrode are identified in step S1230, the detection operation further includes step S1240 of generating a minimum envelope of the identified conductive particles. Figure 5 , Figure 5 FIG. 5 shows a simplified diagram of an electrode and conductive particles in an image of a panel to be detected. The rectangular area filled with parallel vertical lines represents the identified electrode 510 (specifically, Figure 5 In the figure, 510 indicates the glass electrode of the panel to be detected, and the dotted line boundary indicates a part of the FPC or IC electrode; in this embodiment, the part of the FPC or IC electrode indicated by the dotted line boundary actually coincides with the boundary of the minimum envelope quadrilateral 530 mentioned below), and the gray circular particles 520 represent the conductive particles on the identified electrode. Exemplarily, based on the pre-set positioning mark, such as the lower left corner of the image, a rectangular coordinate system ( Figure 5 The X-axis and Y-axis in the figure are only for indicating the direction, not the rectangular coordinate system described here), and the position of the electrode and the position of the conductive particles on the electrode are determined according to the rectangular coordinate system. For example, for horizontally arranged electrodes, the arrangement direction of the electrodes (horizontally) can be set as the direction of the x-axis of the rectangular coordinate system, and then the direction perpendicular to the arrangement direction of the electrodes (vertically) can be determined as the direction of the y-axis. Figure 5 As shown, the top and bottom sides of the rectangular box representing the electrode 510 are parallel to the x-axis of the coordinate system, and its two sides are parallel to the y-axis of the coordinate system. Exemplarily and not limitingly, identifying the position of the electrode may include identifying the coordinates of the four sides of the rectangular box where the electrode is located, such as the top and bottom sides may be represented as y=b and y=a, respectively, and the two sides of the rectangular box may be represented as x=c and x=d, respectively.

[0072] For example, Figure 5 The conductive particles on the electrode shown can be regarded as a circle with a radius of r, and the position of the conductive particles can be identified by identifying the coordinate position of the circular area where the conductive particles are located. Alternatively, if the radius r of the conductive particles is much smaller than the length or width of the electrode, the coordinates of the center of the circle where the conductive particles are located can be regarded as the position coordinates of the conductive particles.

[0073] Exemplarily, based on the positions of all the conductive particles on the identified electrode, a minimum envelope of these conductive particles is generated. The minimum envelope may be the minimum area including all the particles on the electrode. Figure 5 , Figure 5 25 conductive particles are identified on the electrode shown. Based on the position coordinates of the 25 conductive particles, the minimum area that envelops the 25 points can be determined. It is understood that the minimum area that can envelop the 25 points can have multiple non-limiting forms. For example, the minimum envelope can be Figure 5 The longer dashed line in FIG. 5 shows a quadrilateral 530 that can include 25 particle regions. Optionally, the minimum envelope can also be Figure 5 The short dashed line shows an irregular shape 540 wrapped by a smooth curve. Alternatively, the minimum envelope may also be a polygon 550 formed by connecting the centers of the 12 particles located on the outside of the 25 particles.

[0074] As described above, in step S1250, whether the panel to be tested is qualified can be determined based on the positions of the identified electrodes and the positions of the identified conductive particles. Exemplarily, step S1250 includes: determining whether the panel to be tested is qualified based on the positions of the identified electrodes and the positions of the minimum envelope frame. Figure 5 , the minimum envelope of the conductive particles is taken as an example by polygon 550. Since the conductive particles are on the electrode, the minimum envelope polygon 550 of the conductive particles is included by the rectangular frame 510 of the electrode, and the position of the minimum envelope polygon 550 on the rectangular frame 510 of the electrode is used to determine whether the panel to be tested is qualified. For example, for the two areas that contain and are contained, the more the position of the relatively small area contained is consistent with the central area of ​​the other area, the more accurate the alignment relationship between the two areas is. It can be understood that in an electrode, the minimum envelope of the conductive particles is distributed in the central area of ​​the electrode, and the alignment is more accurate, which can ensure that relatively more particles are on the electrode, so the conductivity is stronger and the panel quality is better. On the contrary, if the minimum envelope of the conductive particles deviates from the central area of ​​the electrode, some of the particles may not have enough indentation strength, or even do not fall on the electrode, and the conductivity is relatively weak or even non-conductive, thereby affecting the quality of the panel.

[0075] Through the above technical solution, the position of the minimum envelope is used to represent the position of all conductive particles on the electrode, and whether the panel to be tested is qualified is confirmed based on the position of the identified electrode and the position of the minimum envelope. For electrodes with more conductive particles, it is not necessary to determine the relative position of each conductive particle and the electrode one by one. This solution can reduce the amount of calculation while ensuring accurate detection, thereby saving detection costs.

[0076] Exemplarily, the minimum envelope of the identified conductive particles may be a rectangle. Figure 5 It is shown in FIG. 5 that the minimum envelope of the identified conductive particles can be in various non-limiting forms, wherein the minimum envelope quadrilateral 530 is a rectangle.

[0077] For example, in the image of the panel to be detected, the minimum rectangular envelope of the conductive particles on the electrode can be generated by the following steps: Step S1241, determining the minimum value x of the horizontal coordinates of all the coordinate values ​​of the conductive particles. min and the maximum value xmax , the minimum value of the vertical axis y min and the maximum value y max ; Step S1242, generating a minimum rectangular envelope of the conductive particles according to the minimum and maximum values ​​of the horizontal and vertical coordinates of the conductive particles. Figure 5 First, by comparing the coordinate values ​​of all conductive particles, the minimum and maximum values ​​of the horizontal and vertical coordinates of the conductive particles are obtained in turn. For example, min =2, x max =5,y min =3,y max = 4. Then, the minimum envelope of the conductive particles on the electrode is determined to be a rectangle 2≤x≤5 and 3≤y≤4. Further, by comparing the position of the rectangular envelope with the position of the electrode, it can be confirmed whether the panel is qualified.

[0078] Through the above technical solution, the minimum envelope of all conductive particles on the electrode in the panel to be detected is determined as a rectangle, and then the qualified panel to be detected can be confirmed by comparing the position of the rectangular envelope with the position of the electrode. The position of the rectangular envelope can roughly characterize the position of all conductive particles on the electrode. Since the rectangular envelope algorithm for determining the scattered points is simple, mature and reliable, the position of the conductive particles is represented by the position of the rectangular envelope of the conductive particles in the above solution. It can not only ensure the detection accuracy of the panel, but also has low calculation cost and high speed. It has strong operability in actual panel detection.

[0079] Exemplarily, the detection step S1250 can be implemented to determine whether the panel to be detected is qualified based on the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope.

[0080] For ease of description, in the following embodiments, the minimum envelope is a rectangle. A rectangle includes four vertices and four sides. The midpoints on each side and the center point of the rectangle, diagonal and other position parameters can be obtained through the four vertices and four sides of the rectangle. By way of example and not limitation, Figure 5 One or more of the vertices, edges, midpoints of edges, diagonals, and center points of the rectangle 510 representing the electrode shown in FIG. 5 can be used as the characteristic part of the electrode, and the position of the characteristic part in the coordinate system can be further obtained. Similarly, Figure 5 The position of the corresponding feature of the minimum envelope 530 of the conductive particles on the electrode in the coordinate system is compared. Finally, the positional relationship between the two is compared, for example, the coordinate difference or distance of the feature is calculated, and whether the panel to be tested is qualified is determined based on the positional relationship and the preset judgment standard. For example, the feature of the electrode is represented by the horizontal coordinate of the midpoint of the bottom side of the rectangle where the electrode is located, and the horizontal coordinate of the midpoint of the bottom side of the electrode is x.1 The horizontal coordinate of the midpoint of the bottom edge of the minimum rectangular envelope of the conductive particles on the electrode is x 2 The preset judgment standard can be that the difference between the two horizontal coordinates is less than the threshold value x a Based on the above horizontal coordinate difference Δx=|x 1 -x 2 |With threshold x a The size relationship between them determines whether the electrode is qualified. a , the electrode is judged to be qualified, otherwise unqualified.

[0081] Through the above technical solution, by extracting the positions of the corresponding characteristic parts of the electrode and the area where the conductive particles on the electrode are located, and comparing the positional relationship of the characteristic parts of the two in the coordinate system, it is determined whether the panel to be tested is qualified. The alignment relationship between the electrode and the conductive particles in the electrode is finally simplified to the positional relationship of the characteristic parts of the two areas. This solution not only ensures the accuracy of the test results, but also reduces the technical difficulty and calculation cost of the test to a certain extent.

[0082] As mentioned above, whether the panel to be tested is qualified can be determined based on the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope; and the minimum envelope can be a rectangle. In one example, the characteristic portion of the electrode can be the top edge of the electrode. Correspondingly, the characteristic portion of the rectangular envelope of the conductive particles is the top edge of the rectangle. Exemplarily, the following steps are used to determine whether the panel to be tested is qualified: Step S1251, determine whether the distance between the top edge of the electrode and the top edge of the minimum rectangular envelope of the conductive particles is less than a longitudinal threshold. Step S1252, determine that the panel to be tested is qualified for the case of meeting the preset conditions. Exemplarily, the preset conditions include that the distance between the top edge of the electrode and the top edge of the minimum rectangular envelope of the conductive particles is less than a longitudinal threshold.

[0083] For example, reference Figure 6 To further explain step S1251 and step S1252. Figure 6 A simplified diagram of electrodes and conductive particles according to another embodiment of the present invention is shown. Figure 6 The top edge 610 of the electrode and the top edge 620 of the minimum rectangular envelope of the conductive particles on the electrode are shown in FIG. 6 , which are referred to as the top edge of the rectangle hereinafter. The top edge of the electrode in the rectangular coordinate system can be represented as y=y 1 , let the top edge of the rectangle be y=y 2 Calculating the distance between the top edges of the two is to calculate y 1 With y 2 The difference d 1 =|y 1 -y 2|. Exemplarily, the preset condition may be that the distance between the top edge of the electrode and the top edge of the rectangle is less than the longitudinal threshold value y a , compare d 1 With y a , when d 1 <y a When the panel to be tested is qualified, it is determined that the panel to be tested is qualified, otherwise, it is unqualified.

[0084] Through the above technical solution, whether the panel to be tested is qualified is determined based on the relationship between the distance between the top edge of the minimum rectangular envelope of the electrode and the conductive particles in the panel to be tested and the preset threshold. In actual operation, it is only necessary to determine the ordinate value of a point on the top edge of the electrode and the ordinate value of the point with the largest ordinate value in the conductive particle. The efficiency of the test is improved on the basis of ensuring the quality of panel testing.

[0085] As mentioned above, the minimum envelope can be a rectangle. In another example, the above determination of whether the panel to be tested is qualified according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope is achieved by the following steps. Step S1253, according to the distance between the electrode and the corresponding side of the rectangle, determine the first side of the electrode and the first side of the rectangle. That is, the characteristic portion of the electrode is the first side of the electrode. Correspondingly, the characteristic portion of the minimum rectangular envelope of the conductive particle is the first side of the rectangle. It can be understood that the corresponding side refers to the side of the same side. The first side of the electrode corresponds to the first side of the rectangle, for example, both are left sides or both are right sides. And, the distance between the first side of the electrode and the first side of the rectangle is greater than the distance between the other side of the electrode and the corresponding side of the rectangle. Assuming that the distance between the left side of the electrode and the left side of the rectangle is greater than the distance between the right side of the electrode and the right side of the rectangle, the left side of the electrode is the first side of the electrode, and the left side of the rectangle is the first side of the rectangle; otherwise, it can be determined that the right side of the electrode is the first side of the electrode, and the right side of the rectangle is the first side of the rectangle. Step S1254, determining whether the distance between the first side of the electrode and the first side of the rectangle is less than a horizontal threshold. Step S1255, determining whether the panel to be tested is qualified if the preset condition is met. Exemplarily, the preset condition includes that the distance between the first side of the electrode and the first side of the rectangle is less than the horizontal threshold.

[0086] For example, Figure 6As shown, the electrode includes a left side 630, and the minimum rectangular envelope of the conductive particles on the electrode includes a left side 640, hereinafter referred to as the left side of the rectangle. The right side of the electrode coincides with the right side of the rectangle, that is, the distance between the two is 0, while the distance from the left side 630 of the electrode to the left side 640 of the rectangle is greater than 0. Therefore, it can be determined that the left side 630 of the electrode is the first side of the electrode, and the left side 640 of the rectangle is the first side of the rectangle. The left side 630 of the electrode in the rectangular coordinate system can be expressed as x=x 1 , the left side 640 of the rectangle is represented as x=x 2 Calculating the distance between the two is to calculate x 1 With x 2 The difference d 2 =|x 1 -x 2 |. Exemplarily, the preset condition may be that the distance between the first side of the electrode and the first side of the rectangle is less than the lateral threshold x b , compare d 2 With x b , when d 2 <x b When the panel to be tested is qualified, it is determined that the panel to be tested is qualified, otherwise, it is unqualified.

[0087] Through the above technical solution, the qualified panel to be tested is determined by comparing the distance between the electrode in the panel to be tested and one of the sides of the minimum envelope of the conductive particles with the preset threshold. This solution can realize the panel quality detection without loading complex calculation programs, and the detection cost is lower than that of traditional detection methods.

[0088] In another example, whether the panel to be tested is qualified is determined based on the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope. The characteristic portion of the electrode may be the center of the electrode. Accordingly, the characteristic portion of the minimum envelope of the conductive particles may be the center of the minimum envelope. Exemplarily, whether the panel to be tested is qualified is determined by the following steps. Step S1256, determining the center of the electrode and the center of the minimum envelope; step S1257, determining whether the distance between the center of the electrode and the center of the rectangle is less than a center distance threshold; step S1258, determining that the panel to be tested is qualified for a case that meets a preset condition. Exemplarily, the preset condition includes that the distance between the center of the electrode and the center of the rectangle is less than a center distance threshold.

[0089] For example, again refer to Figure 6 To further explain steps S1256 to S1258. Point O is the center point of the electrode. 1is the center point of the smallest envelope of the conductive particle, hereinafter referred to as the center point of the rectangle. By way of example and not limitation, the coordinates of the center point of the electrode can be determined by determining the coordinates of a pair of diagonal vertices of the electrode. For example, the coordinates of one vertex of the electrode identified are (x o ,y o ), the corresponding diagonal vertex coordinates are (x o ',y o '), then the coordinates of the center point O of the electrode are Optionally, the center point of the electrode can also be determined by identifying the four sides of the electrode. For example, the four sides of the electrode identified are x=x 1 , x=x 2 , y=y 1 , y=y 2 , then the coordinates of the center point O of the electrode are Similarly, get the center point O of the rectangle 1 The coordinates of (x o1 ,y o1 ). Calculate the distance between point O and point O 1 For example, the preset condition may be that the distance between the center point of the electrode and the center point of the rectangle is less than the center distance threshold value n, and m is compared with n. When m<n, it is determined that the panel to be tested is qualified, otherwise, it is unqualified. It can be understood that although Figure 6 The minimum envelope is a rectangle, but this example does not limit the shape of the minimum envelope. The coordinates of the center point can be specifically determined according to the shape of the minimum envelope. For example, for a circular minimum envelope, the center point is the center of the circle.

[0090] Through the above technical solution, whether the panel to be tested is qualified is determined by comparing whether the distance between the electrode in the panel to be tested and the center point of the minimum envelope of the conductive particles is less than a preset threshold. This solution is simple and can accurately reflect whether the electrode in the panel and the core electrode are in a suitable alignment state, thereby ensuring the accuracy of panel detection.

[0091] It can be understood that in the above three examples, steps S1251 to S1252, steps S1253 to S1255, and steps S1256 to S1258 are respectively used to determine whether the panel is qualified based on the position of the top edge, side edge, and center of the electrode and the minimum envelope frame. In practical applications, any two or even three of the above schemes can be combined to achieve panel detection. For example, in one example, the preset conditions may include that the distance between the top edge, side edge, and / or center of the electrode and the minimum envelope frame meets the respective threshold conditions. Thus, it is confirmed that the panel to be detected is qualified. This scheme combines more conditions to detect the panel and ensures the quality of the panel.

[0092] According to another aspect of the present invention, a panel detection device is provided. Figure 7 FIG. 7 is a schematic block diagram of a panel detection device 700 according to an embodiment of the present invention. Figure 7 As shown, the device 700 includes: an acquisition module 710 and a detection module 720. The acquisition module 710 is used to acquire an image of the panel to be detected; the detection module 720 is used to perform the following detection operations on the electrodes of the panel to be detected in the image of the panel to be detected: identifying the electrodes of the panel to be detected; identifying the conductive particles in the electrodes in the image of the panel to be detected; and determining whether the panel to be detected is qualified according to the positions of the identified electrodes and the positions of the identified conductive particles.

[0093] According to yet another aspect of the present invention, an electronic device is provided. Figure 8 FIG. 8 is a schematic block diagram of an electronic device 800 according to an embodiment of the present invention. Figure 8 As shown, the electronic device 800 includes an image acquisition device 810, a processor 820 and a memory 830, wherein the image acquisition device 810 is used to obtain an image of a panel to be detected, and the memory 830 stores computer program instructions, which are used by the processor 820 to execute the panel detection method of an embodiment of the present invention when the computer program instructions are executed.

[0094] According to another aspect of the present invention, a storage medium is provided, on which program instructions are stored. When the program instructions are run, they are used to execute the panel detection method according to the embodiment of the present invention.

[0095] A person skilled in the art may understand the specific implementation scheme of the above-mentioned panel detection device, electronic device and storage medium by reading the above-mentioned description of the panel detection method, which will not be described in detail here for the sake of brevity.

[0096] Although example embodiments have been described herein with reference to the accompanying drawings, it should be understood that the above example embodiments are merely exemplary and are not intended to limit the scope of the present invention thereto. Various changes and modifications may be made therein by one of ordinary skill in the art without departing from the scope and spirit of the present invention. All such changes and modifications are intended to be included within the scope of the present invention as required by the appended claims.

[0097] Those skilled in the art will appreciate that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, or a combination of computer software and electronic hardware. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Professional and technical personnel can use different methods to implement the described functions for each specific application, but such implementation should not be considered to be beyond the scope of the present invention.

[0098] In the several embodiments provided in this application, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are only schematic, for example, the division of the units is only a logical function division, and there may be other division methods in actual implementation, such as multiple units or components can be combined or integrated into another device, or some features can be ignored or not executed.

[0099] In the description provided herein, a large number of specific details are described. However, it is understood that embodiments of the present invention can be practiced without these specific details. In some instances, well-known methods, structures and techniques are not shown in detail so as not to obscure the understanding of this description.

[0100] Similarly, it should be understood that in order to streamline the present invention and help understand one or more of the various inventive aspects, in the description of the exemplary embodiments of the present invention, the various features of the present invention are sometimes grouped together into a single embodiment, figure, or description thereof. However, the method of the present invention should not be interpreted as reflecting the following intention: the claimed invention requires more features than the features explicitly stated in each claim. More specifically, as reflected in the corresponding claims, the inventive point is that the corresponding technical problem can be solved with less than all the features of a single disclosed embodiment. Therefore, the claims following the specific embodiment are hereby expressly incorporated into the specific embodiment, wherein each claim itself serves as a separate embodiment of the present invention.

[0101] It will be understood by those skilled in the art that, except for mutually exclusive features, all features disclosed in this specification (including the accompanying claims, abstracts and drawings) and all processes or units of any method or device disclosed in this specification may be combined in any combination. Unless otherwise expressly stated, each feature disclosed in this specification (including the accompanying claims, abstracts and drawings) may be replaced by an alternative feature that provides the same, equivalent or similar purpose.

[0102] In addition, those skilled in the art will appreciate that, although some embodiments described herein include certain features included in other embodiments but not other features, the combination of features of different embodiments is meant to be within the scope of the present invention and form different embodiments. For example, in the claims, any one of the claimed embodiments may be used in any combination.

[0103] The various component embodiments of the present invention may be implemented in hardware, or in software modules running on one or more processors, or in a combination thereof. It should be understood by those skilled in the art that a microprocessor or a digital signal processor (DSP) may be used in practice to implement some or all of the functions of some modules in a panel detection device according to an embodiment of the present invention. The present invention may also be implemented as a device program (e.g., a computer program and a computer program product) for executing part or all of the methods described herein. Such a program for implementing the present invention may be stored on a computer-readable medium, or may be in the form of one or more signals. Such a signal may be downloaded from an Internet website, or provided on a carrier signal, or provided in any other form.

[0104] It should be noted that the above embodiments illustrate the present invention rather than limit it, and that those skilled in the art may devise alternative embodiments without departing from the scope of the appended claims. In the claims, any reference symbol between brackets shall not be construed as a limitation on the claims. The word "comprising" does not exclude the presence of elements or steps not listed in the claims. The word "one" or "an" preceding an element does not exclude the presence of a plurality of such elements. The present invention may be implemented by means of hardware comprising a number of different elements and by means of a suitably programmed computer. In a unit claim enumerating a number of devices, several of these devices may be embodied by the same hardware item. The use of the words first, second, and third, etc., does not indicate any order. These words may be interpreted as names.

[0105] The above is only a specific embodiment of the present invention or an explanation of a specific embodiment. The protection scope of the present invention is not limited thereto. Any person skilled in the art can easily think of changes or substitutions within the technical scope disclosed by the present invention, which should be included in the protection scope of the present invention. The protection scope of the present invention shall be based on the protection scope of the claims.

Claims

1. A panel detection method, characterized in that: The method comprises: Acquire an image of the panel to be inspected; In the image of the panel to be inspected, the following inspection operation is performed on the electrodes of the panel to be inspected: In the image of the panel to be inspected, identifying electrodes of the panel to be inspected; identifying the conductive particles in the electrode in the image of the panel to be inspected; Determine whether the panel to be inspected is qualified according to the identified positions of the electrodes and the identified positions of the conductive particles, The detection operation is performed by traversing all electrodes of the panel to be detected. When the proportion of electrodes where the deviation of the position of the conductive particles relative to the position of the electrode is less than or equal to the deviation threshold exceeds the proportion threshold, the panel to be detected is determined to be qualified.

2. The method of claim 1, wherein: After the identifying of the conductive particles in the electrode, the detecting operation further comprises: generating a minimum envelope of the identified conductive particles; The step of determining whether the panel to be inspected is qualified according to the identified positions of the electrodes and the identified positions of the conductive particles comprises: Whether the panel to be inspected is qualified is determined according to the positions of the identified electrodes and the position of the minimum envelope. The method of claim 2 , wherein the minimum envelope is a rectangle.

4. The method of claim 2, wherein: The step of determining whether the panel to be inspected is qualified according to the position of the identified electrode and the position of the minimum envelope frame comprises: Whether the panel to be inspected is qualified is determined according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope.

5. The method of claim 4, wherein: The minimum envelope is a rectangle, and determining whether the panel to be inspected is qualified according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope includes: Determining whether the distance between the top edge of the electrode and the top edge of the rectangle is less than a vertical threshold; The panel to be inspected is determined to be qualified if the preset condition is met, wherein the preset condition includes that the distance between the top edge of the electrode and the top edge of the rectangle is less than the longitudinal threshold.

6. The method of claim 4, wherein: The minimum envelope is a rectangle, and determining whether the panel to be inspected is qualified according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope includes: Determine a first side of the electrode and a first side of the rectangle according to a distance between the electrode and a corresponding side of the rectangle, wherein the first side of the electrode corresponds to the first side of the rectangle, and a distance between the first side of the electrode and the first side of the rectangle is greater than a distance between the other side of the electrode and the corresponding side of the rectangle; Determining whether a distance between a first side of the electrode and a first side of the rectangle is less than a horizontal threshold; The panel to be inspected is determined to be qualified if the preset condition is met, wherein the preset condition includes that the distance between the first side of the electrode and the first side of the rectangle is less than the horizontal threshold.

7. The method of claim 4, wherein: The step of determining whether the panel to be inspected is qualified according to the position of the identified characteristic portion of the electrode and the position of the corresponding characteristic portion of the minimum envelope frame comprises: Determining the center of the electrode and the center of the minimum envelope; Determine whether the distance between the center of the electrode and the center of the minimum envelope is less than a center distance threshold; The panel to be inspected is determined to be qualified if a preset condition is met, wherein the preset condition includes that the distance between the center of the electrode and the center of the minimum envelope is less than the center distance threshold.

8. The method according to any one of claims 1 to 7, wherein: The method further comprises: In the case that the panel to be inspected is unqualified, an alarm is sounded.

9. A panel detection device, characterized in that: The device comprises: An acquisition module, used for acquiring an image of a panel to be detected; A detection module is used to perform the following detection operations on the electrodes of the panel to be detected in the image of the panel to be detected: Identifying electrodes of the panel to be detected; identifying the conductive particles in the electrode in the image of the panel to be inspected; Determine whether the panel to be tested is qualified according to the identified positions of the electrodes and the identified positions of the conductive particles The detection operation is performed by traversing all electrodes of the panel to be detected. When the proportion of electrodes where the deviation of the position of the conductive particles relative to the position of the electrode is less than or equal to the deviation threshold exceeds the proportion threshold, the panel to be detected is determined to be qualified.

10. An electronic device comprising an image acquisition device, a processor and a memory, wherein: The image acquisition device is used to acquire an image of a panel to be inspected. The memory stores computer program instructions, and the computer program instructions are used to execute the panel inspection method according to any one of claims 1 to 8 when the processor is running the computer program instructions.

11. A storage medium having program instructions stored thereon, wherein the program instructions are used to execute the panel detection method according to any one of claims 1 to 8 when running.

Images