A guiding and locking mechanism for an integrated circuit automatic test machine

Through the fitting of the positioning guide rod and sleeve, combined with the locking mechanism of the handle and the L-shaped opening, the problems of easy jamming and motor assistance in the prior art are solved, and the reliable positioning of the bearing fixture and the level guarantee of the PCB board are achieved, which improves the reliability and practicality of the test.

CN114487775BActive Publication Date: 2025-06-24SHANGHAI NCATEST TECH CO LTD
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Patent Information

Application Number
CN202210043582.6
Authority / Receiving Office
CN · China
Patent Type
Patents(China)
Current Assignee / Owner
Filing Date
2022-01-14
Publication Date
2025-06-24
Estimated Expiration
2042-01-14

AI Technical Summary

Technical Problem

The guide locking structure of existing integrated circuit automatic testing equipment is easily stuck and requires motor assistance, which leads to the locking position being easily offset and affects the use of the test.

Method used

The positioning guide rod and sleeve are equipped with a set fit, and the guide positioning and locking of the load-bearing fixture is achieved through the coordination of the handle and the L-shaped opening, avoiding the motor driving, making the structure simple and easy to maintain.

Benefits of technology

Reliable positioning and locking of the load bearing fixture, ensuring the level of the PCB board, providing reliable guarantees for subsequent tests, and no electronic components are required, with simple structure and high practicality.

✦ Generated by Eureka AI based on patent content.

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Abstract

The present invention relates to the technical field of mechanical manufacturing, and discloses a guiding and locking mechanism for an integrated circuit automatic tester, which is characterized in that: it includes a plurality of positioning and guiding columns arranged on the periphery of the test platform, and a plurality of sleeves are arranged on the periphery of the loading fixture cooperating with the test platform. The loading fixture is used to carry the PCB board to be tested. The sleeves are sleeved and cooperated with the positioning and guiding columns, and a handle is arranged on the positioning and guiding columns. An L-shaped opening is arranged on the sleeve. By rotating the handle, the locking cooperation or unlocking cooperation with the L-shaped opening is realized, so as to lock the loading fixture on the test platform or unlock it. The overall structure of the present invention is simple, convenient for maintenance, highly practical, and convenient for popularization and application.
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Description

Technical Field

[0001] The present invention relates to the technical field of machinery manufacturing, and particularly relates to a guiding and locking mechanism for an integrated circuit automatic tester. Background Art

[0002] At present, the development of integrated circuit automatic test equipment at home and abroad has become more and more mature, and the types are also becoming more and more diverse. There are also various guiding and locking structural methods. In many cases, according to the actual test requirements, it is necessary to move the LB component on the test equipment at different heights for use. However, in the prior art, it is easy to get stuck during guiding and locking, and motor assistance is required. The locked position of the motor is prone to shift, which will affect subsequent test use. Summary of the Invention

[0003] The present invention provides a guiding and locking mechanism for an integrated circuit automatic tester. Through a positioning guiding rod and a sleeve that are sleeved and matched, the guiding and positioning function between the carrying fixture and the test platform is realized. At the same time, a handle is provided on the positioning guiding rod, and an L-shaped opening that matches the handle is provided on the sleeve, which can conveniently fix the carrying fixture on the same horizontal plane, providing a reliable guarantee for subsequent PCB board testing. And the entire structure does not require any electronic device drive, has a simple structure, is convenient for maintenance, has high practicability, and is convenient for popularization and application.

[0004] The present invention can be realized through the following technical solutions:

[0005] A guiding and locking mechanism for an integrated circuit automatic tester includes a plurality of positioning guiding columns arranged on the periphery of the test platform. A plurality of sleeves are arranged on the periphery of the carrying fixture that cooperates with the test platform. The carrying fixture is used to carry the PCB board to be tested. The sleeves are sleeved and matched with the positioning guiding columns. And a handle is provided on the positioning guiding column, and an L-shaped opening is provided on the sleeve. By rotating the handle, the locking cooperation or unlocking cooperation with the L-shaped opening is realized, so as to lock the carrying fixture on the test platform or unlock it.

[0006] Further, the positioning guiding column includes a positioning rod and a housing that are sleeved and matched. The positioning rod includes a first-stage rod and a second-stage rod that are connected together. The outer diameter of the first-stage rod is smaller than that of the second-stage rod, and a step is formed at the connection between the two. A channel that cooperates with the positioning rod is provided inside the housing. A spring is sleeved on the surface of the first-stage rod. One end of the spring abuts against the step of the positioning rod, and the other end abuts against the step of the channel.

[0007] A square opening is formed on the surface of the housing. A handle is vertically arranged on the surface of the second-stage rod. The free end of the handle passes through the square opening and cooperates with the L-shaped opening.

[0008] Grip the handle and drive the handle to move upward along the vertical channel of the L-shaped opening. Rotate the handle horizontally so that the handle is stuck on the horizontal channel of the L-shaped opening, realizing the locking fit between the positioning guide post and the sleeve.

[0009] Rotate the handle horizontally, drive the handle to move along the horizontal channel of the L-shaped opening, and make the handle enter the vertical channel to release the locking fit between the positioning guide post and the sleeve.

[0010] Furthermore, one side of the square opening and the L-shaped opening is arranged along the axial direction of the positioning rod and has the same length. The outer diameter of the handle is consistent with the inner diameters of the vertical channel and the horizontal channel of the L-shaped opening, and the vertical channel extends to the bottom surface of the sleeve.

[0011] Furthermore, a notch cooperating with the handle is provided at the bottom edge of the square opening.

[0012] Furthermore, the housing is in a bullet-shaped structure with its pointed head facing upward.

[0013] The beneficial technical effects of the present invention are as follows:

[0014] Through the cooperation between the handle and the L-shaped opening, in addition to realizing the guiding and positioning of the carrying jig, the locking fit between the positioning guide post and the sleeve can also be realized, so that the carrying jig can be positioned and locked on the test platform. At the same time, since the L-shaped opening can uniformly limit the handle at the same height, the levelness of the carrying jig and the PCB board thereon is ensured, providing a reliable guarantee for subsequent tests. The whole structure has no electronic devices, is simple in structure, convenient to repair, high in practicability, and convenient for popularization and application. Description of the Drawings

[0015] Figure 1 It is a schematic diagram of the state where the guiding and locking mechanism of the present invention is arranged on the test platform;

[0016] Figure 2 It is a schematic diagram of the structure of the guiding and locking mechanism of the present invention in the locked state;

[0017] Figure 3 It is a schematic diagram of the structure of the upper guiding and locking mechanism of the present invention in the unlocked state;

[0018] Figure 4 It is a schematic diagram of the overall structure of the guiding and locking mechanism of the present invention;

[0019] Figure 5 It is a schematic diagram of the structure of the positioning guide post of the present invention;

[0020] Among them, 1 - positioning guide post, 11 - positioning rod, 12 - housing, 13 - spring, 14 - square opening, 2 - sleeve, 21 - L-shaped opening, 3 - handle, 4 - test platform, 5 - carrying jig. Detailed implementation manners

[0021] The following will describe in detail the specific implementation manners of the present invention in conjunction with the accompanying drawings and preferred embodiments.

[0022] As Figures 1 - 3 shown, the present invention provides a guiding and locking mechanism for an integrated circuit automatic tester, including a plurality of positioning and guiding columns 1 arranged on the periphery of a test platform 4. A plurality of sleeves 2 are arranged on the periphery of a carrier fixture 5 that cooperates with the test platform 4. The carrier fixture 5 is used to carry a PCB board to be tested. The sleeve 2 is sleeved and cooperated with the positioning and guiding column 1. A handle 3 is arranged on the positioning and guiding column 1, and an L-shaped opening 21 is arranged on the sleeve 2. By rotating the handle 3, the locking cooperation or unlocking cooperation with the L-shaped opening 21 is realized, so as to lock the carrier fixture 5 on the test platform or unlock it. In this way, the cooperation between the handle 3 and the L-shaped opening 21 can not only realize the guiding and positioning of the carrier fixture 5, but also realize the locking cooperation between the positioning and guiding column 1 and the sleeve 2, that is, the carrier fixture 5 can be positioned and locked on the test platform 4. At the same time, since the L-shaped opening 21 can uniformly limit the handle at the same height, the levelness of the carrier fixture 5 and the PCB board thereon is ensured, providing a reliable guarantee for subsequent tests.

[0023] Specifically, as Figures 3 - 5 shown, the positioning and guiding column 1 includes a positioning rod 11 and a housing 12 that are sleeved and cooperated. The housing 12 can be designed in a bullet shape with its pointed head facing upward, which is convenient for its cooperation with the sleeve 2. The positioning rod 1 includes a first-stage rod and a second-stage rod connected together. The outer diameter of the first-stage rod is smaller than that of the second-stage rod, so that a step is formed at the connection between the two. A channel cooperating with the positioning rod is arranged inside the housing, and there is also a step inside the channel. A spring 13 is sleeved on the surface of the first-stage rod. One end of the spring 13 abuts against the step of the positioning rod, and the other end abuts against the step of the channel, so that the positioning rod can move "elastically" inside the channel;

[0024] For the convenience of locking, a handle 3 is vertically arranged on the surface of the second-stage rod, and a square opening 14 is formed on the surface of the housing 12. The square opening 14 can not only limit the moving distance of the handle, but also limit the positioning rod 11 inside the housing 12. The free end of the handle 3 passes through the square opening 14 and cooperates with the L-shaped opening 21. In this way, hold the handle 3 and drive the handle 3 to move upward along the vertical channel of the L-shaped opening 21, and horizontally rotate the handle so that the handle 3 is stuck on the horizontal channel of the L-shaped opening 21 to realize the locking cooperation between the positioning and guiding column 1 and the sleeve 2; horizontally rotate the handle 3, drive the handle 3 to move along the horizontal channel of the L-shaped opening 21, so that the handle 3 enters the vertical channel of the L-shaped opening 21 to release the locking cooperation between the positioning and guiding column 1 and the sleeve 2.

[0025] To facilitate clamping the handle 3, one side of the square opening 14 and the L-shaped opening 21 is arranged along the axial direction of the positioning rod 11 and has the same length. The outer diameter of the handle 3 is consistent with the inner diameters of the vertical channel and the horizontal channel of the L-shaped opening 21, so that the handle 3 can be clamped inside the vertical channel and the horizontal channel, and the handle will not move due to accidental conditions such as vibration, resulting in misoperation. In addition, a notch matching a part of the outer shape of the handle 3 can be provided at the bottom edge of the square opening 14 to further limit the accidental movement of the handle 3 when it is not locked.

[0026] To facilitate detaching the carrying jig from the test platform, the vertical channel of the L-shaped opening 21 extends to the bottom surface of the sleeve. In this way, as long as the locking is released, the carrying jig can be detached by moving it vertically upward, and it is also convenient for installation.

[0027] Although the specific embodiments of the present invention have been described above, those skilled in the art should understand that these are only examples. Without departing from the principles and essence of the present invention, various changes or modifications can be made to these embodiments. Therefore, the protection scope of the present invention is defined by the appended claims.

Claims

1. A guiding and locking mechanism for an integrated circuit automatic test machine, characterized in that: It includes a plurality of positioning and guiding columns arranged on the periphery of the test platform. A plurality of sleeves are arranged on the periphery of the carrier fixture that cooperates with the test platform. The carrier fixture is used to carry the PCB board to be tested. The sleeves are sleeved and cooperated with the positioning and guiding columns. And a handle is arranged on the positioning and guiding column. An L-shaped opening is arranged on the sleeve. By rotating the handle, the locking cooperation or unlocking cooperation with the L-shaped opening is realized, so as to lock the carrier fixture on the test platform or unlock it; The positioning and guiding column includes a positioning rod and a housing that are sleeved and cooperated. The positioning rod includes a first-stage rod and a second-stage rod connected together. The outer diameter of the first-stage rod is smaller than that of the second-stage rod, and a step is formed at the connection of the two. A channel that cooperates with the positioning rod is arranged inside the housing. A spring is sleeved on the surface of the first-stage rod. One end of the spring abuts against the step of the positioning rod, and the other end abuts against the step of the channel. A square opening is formed on the surface of the housing. A handle is vertically arranged on the surface of the second-stage rod. The free end of the handle passes through the square opening and cooperates with the L-shaped opening. Hold the handle and drive the handle to move upward along the vertical channel of the L-shaped opening. Horizontally rotate the handle so that the handle is stuck on the horizontal channel of the L-shaped opening to realize the locking cooperation between the positioning and guiding column and the sleeve. Horizontally rotate the handle and drive the handle to move along the horizontal channel of the L-shaped opening so that the handle enters the vertical channel to release the locking cooperation between the positioning and guiding column and the sleeve.

2. The guiding and locking mechanism for an integrated circuit automatic tester according to claim 1, characterized in that: One side of the square opening and the L-shaped opening are both arranged along the axial direction of the positioning rod and have the same length. The outer diameter of the handle is consistent with the inner diameters of the vertical channel and the horizontal channel of the L-shaped opening. The vertical channel extends to the bottom surface of the sleeve.

3. The guiding and locking mechanism for an integrated circuit automatic test machine according to claim 1, characterized in that: A notch that cooperates with the handle is arranged at the bottom edge of the square opening.

4. The guiding and locking mechanism for an integrated circuit automatic tester according to claim 1, characterized in that: The housing has a bullet-shaped structure with its pointed head facing upward.

Citation Information

Patent Citations

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    CN201284770Y

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