Bearing device positioning mechanism and operating equipment thereof

Abstract

The present invention provides a position adjustment mechanism for a holder and operating equipment using the same. The holder is used to hold electronic components, and a reference position is defined in a holding area based on the distance between the two sides of the electronic component and a reference contact point. The position adjustment mechanism uses a first driver to drive a first positioner to the reference position, and uses a second driver to drive a second positioner to move toward the first positioner, thereby pushing the electronic component against the first positioner for positioning. This adjusts the electronic component to a correct position and improves the operating quality.

Description

Technical Field

[0001] The invention relates to a support position adjustment mechanism for adjusting the correct placement of electronic components to improve operation quality. Background Art

[0002] Nowadays, an electronic component with multiple contacts undergoes processes such as die bonding, wire bonding, and sealing, and is then cut into individual electronic components using a cutting and molding process. However, to ensure the quality of electronic components, the industry uses testing equipment to perform testing operations on electronic components to eliminate defective products; please refer to Figure 1 The test device is provided with an electrically connected circuit board 11 and a test socket 12. The test socket 12 has a receiving groove 121 and a plurality of probes. The receiving groove 121 is for receiving an electronic component, and a probe is used as a reference probe 122. A conveyor (not shown) moves the electronic component 21 into the receiving groove 121 of the test socket 12, and aligns the reference contact 211 of the electronic component 21 with the reference probe 122 of the test socket 12, so that the electronic component 21 performs an electrical test operation. However, the size of the receiving groove 121 of the test socket 12 is configured according to the standard size of a batch of electronic components 21. The first distance L1 from the side 212 of the electronic component 21 to the reference contact 211 should be the same as the distance L1 between the side 212 of the electronic component 21 and the reference contact 211. However, the side edges 212 of some electronic components 21 may be overcut during the cutting and forming process, resulting in a shortening of the first distance L1 between the side edges 212 of the electronic component 21 and the reference contacts 211. When the electronic component 21 is moved into the receiving groove 121 of the test socket 12, the reference contacts 211 of the electronic component 21 cannot be aligned to contact the reference probes 122 of the test socket 12, thereby affecting the test quality and causing the electronic component 21 to be mistakenly judged as defective. In particular, for a precision electronic component having dozens of contacts, the accuracy of the alignment of the reference contacts of the precision electronic component with the reference probes 122 of the test socket 12 is even more important. Summary of the Invention

[0003] The purpose of the present invention is to provide a support device positioning mechanism and an operating equipment used therefor to solve the above-mentioned technical problems existing in the prior art.

[0004] To achieve the above object, the technical solution adopted by the present invention is:

[0005] A positioning mechanism for a holder is provided. The holder is used to hold electronic components and defines a reference position in a holding area. The positioning mechanism comprises:

[0006] First drive: It is provided with at least one first driving tool;

[0007] Second drive: It is provided with at least one third drive;

[0008] A first positioner is provided with a first bearing member and a second bearing member, so as to be driven by the first driver to move to the reference position of the bearing;

[0009] The second positioner is provided with a first pusher and a second pusher, so as to be driven by the second driver to move toward the first positioner, so as to push the electronic component against the first positioner for positioning.

[0010] The described support device positioning mechanism, wherein the first driver of the positioning mechanism includes the first driving device and the second driving device, the first driving device is used to drive the first bearing member to move along the first path, and the second driving device is used to drive the second bearing member to move along the second path.

[0011] The described support device positioning mechanism, wherein one side of the first bearing member of the positioning mechanism is a first connecting surface, the first connecting surface is connected and assembled with the first driving device, and the other side of the first bearing member is a first supporting surface for the first side corresponding to the electronic component to lean against, and one side of the second bearing member serves as a second connecting surface, the second connecting surface is connected and assembled with the second driving device, and the other side of the second bearing member is a second supporting surface for the second side corresponding to the electronic component to lean against.

[0012] The described support device positioning mechanism, wherein one side of the first pushing member of the positioning mechanism serves as a first pushing surface for contacting the third side corresponding to the electronic component, and one side of the second pushing member serves as a second pushing surface for contacting the fourth side corresponding to the electronic component.

[0013] The positioning mechanism of the support device further includes at least one supporting component, and the supporting component is used to mount the first driver and the second driver.

[0014] In the aforementioned support device positioning mechanism, the supporting component is an independent frame plate, which is mounted on the machine platform and is used to assemble the first driver and the second driver.

[0015] In the aforementioned support adjusting mechanism, the supporting component is a component of the support or the machine platform for assembling the first driver and the second driver.

[0016] In the aforementioned support adjusting mechanism, the supporting component is an independent frame plate, and a third driver is provided to drive the independent frame plate to rotate at a horizontal angle.

[0017] The described support device positioning mechanism, wherein the support device is a tester, the tester includes an electrically connected circuit board, a reference probe and a plurality of first probes, the area above the reference probe and the plurality of first probes is defined as the support area, and the support device defines the reference position in the support area according to the distance from the two sides of the electronic component to the reference contact.

[0018] An operating device using a support adjustment mechanism, comprising:

[0019] Machine;

[0020] Feeding device: It is arranged on the machine and is provided with at least one feeding receiving device for accommodating electronic components to be processed;

[0021] A receiving device is arranged on the machine and is provided with at least one receiving receiving device for accommodating processed electronic components;

[0022] An operating device is configured on the machine and is provided with at least one holder for holding electronic components and performing predetermined operations on the electronic components;

[0023] At least one of the aforementioned holder positioning mechanisms is used to adjust the placement position of the electronic component of the holder;

[0024] Central control device: used to control and integrate the operations of various devices and mechanisms.

[0025] Advantage 1 of the present invention is that it provides a position adjustment mechanism for a holder, wherein the holder is used to hold an electronic component and defines a reference position in a holding area according to the distance between the two sides of the electronic component and the reference contact. The position adjustment mechanism includes a first driver, a second driver, a first positioner, and a second positioner. The first driver drives the first positioner to be located at the reference position, and the second driver drives the second positioner to move toward the first positioner and push the electronic component against the first positioner for positioning, thereby adjusting the electronic component for correct placement to improve operation quality.

[0026] The second advantage of the present invention is to provide a support device positioning mechanism, in which the first positioner of the positioning mechanism is provided with a first bearing member and a second bearing member. The first driver uses the first and second driving tools to drive the first and second bearing members of the first positioner to independently displace. During positioning, the position of the first bearing member or the second bearing member can be changed separately according to the cutting error value of the two sides of the electronic component to make an adjustment compensation, so that the electronic component is located in the correct position, thereby improving the convenience of positioning.

[0027] The third advantage of the present invention is that it provides a support adjustment mechanism, in which a support component is set on the machine platform for assembling the first driver and the second driver, so as to facilitate the replacement of different types of supports separately without replacing the entire set of adjustment mechanism and support, thereby saving costs and improving replacement convenience.

[0028] Advantage four of the present invention provides an operating equipment using a holder positioning mechanism, comprising a machine, a feeding device, a receiving device, an operating device, an adjusting mechanism and a central control device; the feeding device is arranged on the machine and is provided with at least one feeding holder for accommodating electronic components to be operated; the receiving device is arranged on the machine and is provided with at least one receiving holder for accommodating electronic components that have been operated; the operating device is arranged on the machine and is provided with at least one holder for accommodating electronic components and performing preset operations on the electronic components; at least one positioning mechanism of the present invention is used to adjust the electronic components held by the holder to the correct position, and the central control device is used to control and integrate the actions of various devices and mechanisms to perform automated operations, thereby achieving practical benefits of improving operating efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0029] Figure 1 It is a schematic diagram of the use of the existing testing device.

[0030] Figure 2 It is a top view of the first embodiment of the support and adjustment mechanism of the present invention.

[0031] Figure 3 It is an assembly cross-sectional view of the first embodiment of the retainer and the positioning mechanism of the present invention.

[0032] Figure 4 Schematic diagram of the first embodiment of the positioning mechanism of the present invention applied to a testing device.

[0033] Figure 5 1 is a schematic diagram of the use of the positioning mechanism of the present invention (1).

[0034] Figure 6 2 is a schematic diagram of the use of the positioning mechanism of the present invention.

[0035] Figure 7 Schematic diagram of the use of the positioning mechanism of the present invention (3).

[0036] Figure 8 2 is a schematic diagram of a second embodiment of the positioning mechanism of the present invention.

[0037] Figure 9 2 is a schematic diagram of a third embodiment of the positioning mechanism of the present invention.

[0038] Figure 10 This is a configuration diagram of the first embodiment of the positioning mechanism of the present invention applied to operating equipment.

[0039] Explanation of the accompanying drawings: [Prior art] circuit board 11; test socket 12; accommodating groove 121; side wall 1211; reference probe 122; electronic component 21; reference contact 211; side edge 212; first spacing L1; second spacing L2; [present invention] circuit board 31; reference probe 321; first probe 322; test substrate 33; through hole 331; positioning mechanism 40; first driving tool 411; second driving tool 412; third driving tool 421; first bearing member 431; first connecting surface 4311; first bearing surface 4312; second bearing member 432; second connecting surface 4321; second bearing surface 4322; first push member 441; second A pushing surface 4411; a second pushing member 442; a second pushing surface 4421; a connecting portion 443; a support plate 45; a first path A1; a second path A2; a third path A3; a first position B1; a second position B2; a machine 50; a hollow hole 501; a material mover 51; an electronic component 52; a reference contact 521; a first contact 522; a first side 523; a second side 524; a third side 525; a fourth side 526; a feeding device 60; a feeding holder 61; a receiving device 70; a receiving holder 71; a testing device 80; a first material mover 81; an infeed platform 82; a second material mover 83; an outfeed platform 84; a third material mover 85. DETAILED DESCRIPTION

[0040] In order to provide a further understanding of the present invention, a preferred embodiment is given below with reference to the accompanying drawings.

[0041] See also Figure 2 、 3 The positioning mechanism 40 of the present invention is applied to a holder, which can be a platform, a tester, a carrier, a material mover or a preheater, etc., to perform preset operations on electronic components (such as testing operations, carrying operations or material moving operations, etc.); for example, a holder that is a platform can simply hold electronic components; for example, a holder that is a tester can hold and test electronic components; for example, a holder that is a material mover can move and place electronic components; the aforementioned different types of holders are used according to the operational requirements to hold electronic components in the correct position, which is beneficial for the holder itself or the next related device to accurately perform the preset operation.

[0042] In this embodiment, the holder is a tester, which includes a circuit board 31, a reference probe 321, a plurality of first probes 322 and a test substrate 33. One end of the reference probe 321 and the plurality of first probes 322 are electrically connected to the circuit board 31. The reference probe 321 serves as a reference part, and the other end is used to provide a reference contact for an electronic component (not shown) for determining whether the electronic component is correctly electrically contacting the tester. The other end of the plurality of first probes 322 is used to provide a first contact for the electronic component. The tester uses a probe located on the outermost side as the reference probe 321. The area above the reference probe 321 and the plurality of first probes 322 is defined as a holding area for accommodating the electronic component. The test substrate 33 is assembled on the circuit board 31 and has a through hole 331 to expose the reference probe 321 and the plurality of first probes 322 to the outside.

[0043] The positioning mechanism 40 of the present invention includes a first driver, a second driver, a first positioner and a second positioner, and further includes at least one supporting component, the supporting component is used to mount the first driver and the second driver, the supporting component can be an independent frame, or a component of a support or a machine; for example, the supporting component can be a supporting plate, which is mounted on a machine (not shown) and is used to assemble the first driver and the second driver, so that the first driver and the second driver are separated from the support, so as to facilitate the separate replacement of the support; for example, the supporting component can be a substrate of the support, which is used to assemble the first driver and the second driver, and can facilitate the disassembly and repair of the support and the positioning mechanism 40 at one time; in this embodiment, the supporting component is a test substrate 33 of the tester.

[0044] The first driver is provided with at least one first driving tool, which can be a pressure cylinder, a linear motor, or a motor and a transmission group. The first driving tool can be fixedly arranged or moved with the support. For example, the first driving tool can be fixedly arranged on the machine (not shown), and the support carries the first positioner to be opposite to the first driving tool. The first driving tool can push the first positioner to move. For example, the first driving tool can be assembled on the support and can be synchronously moved with the support and drive the first positioner to move. In this embodiment, the first driver includes a first driving tool 411 and a second driving tool 412. The first driving tool 411 is a pressure cylinder and is arranged in the X direction on the test substrate 33 of the tester. The piston rod of the first driving tool 411 moves along the first path A1. The second driving tool 412 is also a pressure cylinder and is arranged in the Y direction on the test substrate 33 of the tester and is arranged at 90 degrees to the first driving tool 411. The piston rod of the second driving tool 412 moves along the second path A2.

[0045] The second driver is provided with at least one third driver, which may be a pressure cylinder, a linear motor, or a motor and a transmission group; the third driver may be fixedly configured or displaced with the support, for example, the third driver may be fixedly configured on the machine, and the support carries the second positioner to be opposite to the third driver, and the third driver may push the second positioner to displace, for example, the third driver may be assembled on the support for synchronous displacement, and drive the second positioner to displace; in this embodiment, the second driver is provided with a third driver 421, which is a pressure cylinder and is configured at an oblique angle (such as 45 degrees) to the test substrate 33 of the tester, and is located away from the first driver 411 and the second driver 412, and the piston rod of the third driver 421 displaces along the third path A3, and the angle of the third path A3 is 45 degrees.

[0046] However, in some embodiments, if the supporting component is an independent frame, the adjustment mechanism 40 can be provided with a third driver (not shown) to drive the independent frame to rotate horizontally. The independent frame is used to mount the first driver and the second driver, and the first driver and the second driver are respectively connected to the first positioner and the second positioner, so that the third driver can adjust the configuration angle of the first positioner and the second positioner to improve the adjustment efficiency.

[0047] However, in some embodiments, the first driver and the second driver may also independently adjust the configuration angles of the first positioner and the second positioner, which is also acceptable.

[0048] The first positioner is provided with a first bearing member and a second bearing member, and is driven by the first driver to move to the reference position of the support. Furthermore, the first bearing member and the second bearing member can be independent components or connected together. In addition, the first positioner and the first driver can be configured separately or in combination, for example as described above. In addition, the reference position is a reference that allows the electronic component to be placed in the correct position. For example, the reference position is the correct position that allows the reference contact of the electronic component to align with the reference probe of the tester. The reference position is divided into a first quantile (such as the Y direction) and a second quantile (such as the X direction). The first quantile and the second quantile change according to the different types and sizes of electronic components or according to the cutting error values of different sides of the electronic component. For example, if the cutting error value of the first side of the electronic component in the Y direction is larger, the compensation value of the first quantile will also increase. In this embodiment, according to the distance from the first and second sides of the electronic component to the reference contact, the reference position is defined in the support area of the tester, including the first quantile B1 and the second quantile B2.

[0049] In this embodiment, the first positioner is provided with a first bearing member 431 and a second bearing member 432, which are two independent components. The first bearing member 431 is arranged in the Y direction and has one surface as a first connecting surface 4311. The first connecting surface 4311 is connected to the piston rod of the first driving device 411 of the first actuator. The other surface of the first bearing member 431 serves as a first bearing surface 4312 for the first side edge corresponding to the electronic component to lean against. The first bearing member 431 is driven by the first driving device 411 to move along the first path A1 so that the first bearing surface 4312 of the first bearing member 431 is located at the first position B1. The two bearing members 432 are arranged in the X direction, and one side serves as a second connecting surface 4321. The second connecting surface 4321 is connected to the piston rod of the second driving device 412 assembled with the first driver. The other side of the second bearing member 432 serves as a second bearing surface 4322 for the second side edge corresponding to the electronic component to lean against. The second bearing member 432 is driven by the second driving device 412 to move along the second path A2 so that the second bearing surface 4322 of the second bearing member 432 is located at the second position B2. Therefore, the adjustment mechanism 40 uses the first bearing member 431 and the second bearing member 432 as the two adjustable side walls of the tester.

[0050] The second positioner comprises a first pusher and a second pusher, and is driven by a second driver to move toward the first positioner, thereby pushing the electronic component against the first positioner for positioning, thereby adjusting the electronic component to the correct position. Furthermore, the first pusher and the second pusher can be separate components or integrally connected. Furthermore, the second positioner and the second driver can be configured separately or in a combined, connected configuration, as described above.

[0051] In this embodiment, the second positioner includes a first push member 441 and a second push member 442. The first push member 441 and the second push member 442 are integrally formed. The first push member 441 is arranged in the Y direction, and relative to the first bearing member 431, the first push member 441 uses a side relative to the first bearing surface 4312 as a first push surface 4411 for contacting the third side corresponding to the electronic component; the second push member 442 is arranged in the X direction, and relative to the second bearing member 432, the second push member 442 uses a side relative to the first bearing surface 4312 as a first push surface 4411. One side of the second supporting surface 4322 serves as a second pushing surface 4421 for contacting the fourth side edge corresponding to the electronic component. Furthermore, the connecting portion 443 where the first pusher 441 and the second pusher 442 are connected is assembled to the piston rod of the third driving device 421. The third driving device 421 drives the first pusher 441 and the second pusher 442 of the second positioner to perform synchronous oblique displacement along the third path A3. Therefore, the position adjustment mechanism 40 uses the first pusher 441 and the second pusher 442 as the other two adjustable side walls of the tester.

[0052] See also Figure 2 、 4In this embodiment, the support device is a tester, which is locked and assembled on the machine 50 with a test substrate 33, so that the first supporting member 431, the second supporting member 432, the first push member 441, the second push member 442, the reference probe 321 and the plurality of first probes 322 are located in the hollow hole 501 of the machine 50. The material mover 51 moves the electronic component 52 to the top of the tester. The electronic component 52 is provided with a reference contact 521 and a plurality of first contacts 522. However, depending on the requirements of the test operation, the electronic component 52 can be placed before the tester and can be imaged by a detector (not shown) to determine the distance from the first side 523 and the second side of the electronic component 52 to the reference contact 521, and analyze the cutting error value and the compensation value to define the first and second quantiles B1 and B2 of the reference position.

[0053] See also Figure 5 The positioning mechanism 40 drives the first bearing member 431 to move along the first path A1 with the first driving device 411, so that the first bearing surface 4312 of the first bearing member 431 is located at the first position B1, that is, the distance between the first bearing surface 4312 of the first bearing member 431 and the reference probe 321 is the distance from the first side of the electronic component to the reference contact; the second driving device 412 drives the second bearing member 432 to move along the second path A2, so that the second bearing surface 4322 of the second bearing member 432 is located at the second position B2, that is, the distance between the second bearing surface 4322 of the second bearing member 432 and the reference probe 321 is the distance from the second side of the electronic component to the reference contact.

[0054] See also Figure 6 、 7The material mover places the electronic component 52 on the reference probe 321 and the plurality of first probes 322 of the tester, and is located in the supporting area, so that the electronic component 52 is located between the first supporting member 431, the second supporting member 432, the first push member 441 and the second push member 442, the first side 523 of the electronic component 52 is relative to the first supporting surface 4312 of the first supporting member 431, and the second side 524 is relative to the second supporting surface 4322 of the second supporting member 432, and the third side 525 is relative to the first pushing surface 4411 of the first push member 441, and the fourth side 526 is relative to the second pushing surface 4421 of the second push member 442; because the reference contact 521 of the electronic component 52 is not aligned with the reference probe 321 of the tester 321, the third driving device 421 drives the first pushing member 441 and the second pushing member 442 to perform synchronous oblique displacement along the third path A3. The first pushing surface 4411 of the first pushing member 441 and the second pushing surface 4421 of the second pushing member 442 respectively contact the third side 525 and the fourth side 526 of the electronic component 52, thereby pushing the electronic component 52 so that the first side 523 of the electronic component 52 abuts against the first supporting surface 4312 of the first supporting member 431, and the second side 524 abuts against the second supporting surface 4322 of the second supporting member 432. The electronic component 52 is adjusted and placed in the correct position so that the reference contact 521 of the electronic component 52 is accurately aligned with the reference probe 321 of the tester for electrical contact, thereby improving the test quality.

[0055] However, in some embodiments, if the first driver has a first driving device and the second driver has a third driving device, the first driving device and the third driving device can be arranged diagonally, so that the first driving device and the third driving device respectively drive the first positioner and the second positioner to move in a diagonal path.

[0056] See also Figure 8 The second embodiment of the positioning mechanism 40 of the present invention has a generally similar structure to or similar to the first embodiment. The difference between the second embodiment and the first embodiment is that the first bearing member 431 and the second bearing member 432 of the first positioner are connected as a whole and assembled on a first driving device 411 that is arranged diagonally. The first driving device 411 and the third driving device 421 can be arranged diagonally, so that the first driving device 411 drives the first bearing member 431 and the second bearing member 432 to synchronously perform an oblique displacement to the reference position. The third driving device 421 drives the first pushing member 441 and the second pushing member 442 to synchronously perform an oblique displacement and push the electronic component against the first bearing member 431 and the second bearing member 432, thereby adjusting the electronic component to the correct position.

[0057] See also Figure 9The third embodiment of the positioning mechanism 40 of the present invention has a generally identical or similar structure to the first embodiment. The difference between the third embodiment and the first embodiment is that the positioning mechanism 40 is provided with an independent supporting component, namely a supporting plate 45. The supporting plate 45 is mounted on the machine 50 and is used to assemble the first driver and the second driver. In this embodiment, the supporting plate 45 is used to assemble the first driving device 411, the second driving device 412 and the third driving device 421, so that the first bearing member 431, the second bearing member 432, the first pushing member 441 and the second pushing member 442 are located in the supporting area of the tester. When replacing a different type of tester, there is no need to replace the entire positioning mechanism 40, but the tester can be replaced separately, thereby saving costs and improving replacement convenience.

[0058] See also Figure 2 、 3 10. An operating device using a support positioning mechanism comprises a machine 50, a feeding device 60, a receiving device 70, the positioning mechanism 40 of the present invention, an operating device and a central control device (not shown); the feeding device 60 is mounted on the machine 50 and is provided with at least one feeding support 61 to accommodate at least one electronic component to be operated; the receiving device 70 is mounted on the machine 50 and is provided with at least one receiving support 71 to accommodate at least one electronic component that has been operated; the operating device is mounted on the machine 50 and is provided with At least one holder for holding electronic components and performing preset operations on the electronic components; in this embodiment, the operating device is a testing device 80, which uses a first holder as a first material mover 81 to take out the electronic components to be tested from the feeding holder 61 of the feeding device 60, and transfers them to a second holder as a feeding platform 82, and the feeding platform 82 carries the electronic components to be tested to the side of a third holder as a tester, and the tester includes a circuit board 31, a reference probe 321, a plurality of first probes 322 and a test base At least one positioning mechanism 40 of the present invention is provided for adjusting the electronic component held by the holder to be placed in the correct position. In this embodiment, the positioning mechanism 40 is configured on the test substrate 33 of the tester. The test device 80 uses a fourth holder as a second material mover 83 to take out the electronic component to be tested from the feed carrier 82 and transfer it to the holding area of the tester so that the positioning mechanism 40 can adjust the electronic component to the correct position, so that the reference contact of the electronic component is accurately aligned with the reference probe 321 of the tester to perform the test operation. In the industry, the second material transfer device 83 transfers the tested electronic components to the fifth support device which is the discharge platform 84, and the discharge platform 84 carries out the tested electronic components. The testing device 80 uses the sixth support device which is the third material transfer device 85 to take out the tested electronic components from the discharge platform 84, and according to the test results, transports the tested electronic components to the receiving support device 71 of the receiving device 70 for classification and storage; the central control device is used to control and integrate the actuation of each device to perform automated operations, so as to achieve the practical benefit of improving operating efficiency.

Claims

1. A positioning mechanism for a holder, wherein the holder is used to hold electronic components and defines a reference position in a holding area, characterized in that: The positioning mechanism includes: First drive: It is provided with at least one first driving tool; Second drive: It is provided with at least one third drive; A first positioner is provided with a first bearing member and a second bearing member, so as to be driven by the first driver to move to the reference position of the bearing; The second positioner is provided with a first pusher and a second pusher, so as to be driven by the second driver to move toward the first positioner, so as to push the electronic component against the first positioner that has been driven by the first driver to move to the reference position for positioning. The first driver and the second driver are independent of each other and independently drive the first positioner and the second positioner to move.

2. The positioning mechanism of the support according to claim 1, wherein: The first driver of the positioning mechanism includes a first driver and a second driver. The first driver is used to drive the first bearing member to move along a first path, and the second driver is used to drive the second bearing member to move along a second path.

3. The positioning mechanism of the support according to claim 2, wherein: One side of the first bearing member of the positioning mechanism is a first connecting surface, which is connected and assembled with the first driving device. The other side of the first bearing member is a first supporting surface, for the first side corresponding to the electronic component to lean against. One side of the second bearing member serves as a second connecting surface, which is connected and assembled with the second driving device. The other side of the second bearing member is a second supporting surface, for the second side corresponding to the electronic component to lean against.

4. The retainer positioning mechanism according to claim 1, wherein: One side of the first push member of the positioning mechanism is a first pushing surface for contacting the third side corresponding to the electronic component, and one side of the second push member is a second pushing surface for contacting the fourth side corresponding to the electronic component.

5. The holder positioning mechanism according to any one of claims 1 to 4, characterized in that: The positioning mechanism further includes at least one supporting component, and the supporting component is used to mount the first driver and the second driver.

6. The holder positioning mechanism according to claim 5, wherein: The supporting component is an independent frame plate, which is mounted on the machine platform and used for assembling the first driver and the second driver.

7. The holder positioning mechanism according to claim 5, wherein: The supporting component is a component of the support or the machine for assembling the first driver and the second driver.

8. The holder positioning mechanism according to claim 5, wherein: The supporting component is an independent frame plate, and a third driver is provided to drive the independent frame plate to rotate at a horizontal angle.

9. The holder positioning mechanism according to any one of claims 1 to 4, characterized in that: The holder is a tester, which includes an electrically connected circuit board, a reference probe and a plurality of first probes. The area above the reference probe and the plurality of first probes is defined as the holding area. The holder defines the reference position in the holding area according to the distance from the two sides of the electronic component to the reference contact.

10. An operating device using a support adjustment mechanism, characterized in that: Include: Machine; Feeding device: It is arranged on the machine and is provided with at least one feeding receiving device for accommodating electronic components to be processed; A receiving device is arranged on the machine and is provided with at least one receiving receiving device for accommodating processed electronic components; An operating device is configured on the machine and is provided with at least one holder for holding electronic components and performing predetermined operations on the electronic components; At least one holder adjustment mechanism as claimed in claim 1, for adjusting the placement position of the electronic component of the holder; Central control device: used to control and integrate the operations of various devices and mechanisms.

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