Sorting machine for electronic component testing

Abstract

The present invention is designed to be a sorting machine for testing electronic components. The present invention is a sorting machine for testing electronic components, characterized in that it includes: a vibration-proof frame, which is separated from the base and moves relatively with respect to the base to suppress the influence of the vibration of the base on the electrical connection between the electronic components and the test socket; a vibration absorber, which is clamped between the vibration-proof frame and the base, thereby minimizing the transmission of the vibration of the base to the vibration-proof frame; a connector, which is arranged on the vibration-proof frame and electrically connects the electronic components and the test socket; a receiver, which supplies the electronic components to be tested to the test socket, or recovers the electronic components that have been tested; and a controller, which controls the connector and the receiver, wherein the test socket is arranged on the vibration-proof frame. According to the present invention, the transmission of vibration can be minimized, so the electrical connection between the electronic components and the tester and the precision of the connection can be maintained, and ultimately the reliability of the test results can be improved.

Description

[0001] This application is a divisional application of the invention patent application with the application date of April 12, 2019, application number 201910292031.1, and invention name “Sorting machine for electronic component testing”. Technical Field

[0002] The invention relates to a sorting machine for testing electronic components. Background Art

[0003] The produced electronic components will be divided into good and defective products after being tested by the tester, and only good products will be shipped out.

[0004] The electrical connection between the tester and the electronic components is achieved by a sorting machine, and the sorting machine is manufactured in various forms according to the type of electronic components to be tested.

[0005] Generally, when testing electronic components, the most important thing is the precision of the electrical connection between the electronic components and the tester and the continuity of the connection state. In other words, it is important to precisely connect the electronic components and the tester in the sorting machine and maintain their precise connection state.

[0006] However, during operation, the sorting machine vibrates due to the impact of the operation of various internal devices, and this vibration affects the precise connection between the electronic components and the tester or the connection state. For example, due to vibration, the terminals of the electronic components and the terminals of the test socket on the tester may not be in precise contact with each other.

[0007] Furthermore, after the electronic component and the test socket are in contact, vibration may still have an adverse effect on the connection between the electronic component and the test socket, so that the electrical connection between the electronic component and the test socket becomes intermittently unstable, resulting in incorrect test results. That is, the test needs to be performed while the contact area and contact force between the terminals of the electronic component and the terminals of the test socket are maintained at a certain state, but vibration may cause intermittent changes.

[0008] The vibration of a general sorting machine is generated by the concurrent operation of various built-in machines during the process of moving electronic components, sorting electronic components according to test results, etc. In particular, vibration occurring near the electrical connection between the electronic components and the tester may be more dangerous.

[0009] In particular, as disclosed in the applicant's prior application No. 10-2016-0007710 (hereinafter collectively referred to as "prior applications"), in a sorting machine in which multiple test stations are arranged in a multi-layer and adjacent rows, vibrations caused by independent operation of connectors that electrically connect electronic components and test machines may have a significant impact on adjacent test stations.

[0010] In addition, the continuous development of the information industry has been requiring the development of electronic components that can sense vibration, pressure, and orientation, and has also reached the development of special electronic components that conform to this. However, the existing sorting machines do not take into account the vibration mentioned above, so it can be predicted that using the existing sorting machines to test the special electronic components mentioned above may cause damage to the electronic components or incorrect test results. Summary of the invention

[0011] An object of the present invention is to provide a technology capable of suppressing or attenuating vibrations generated by the operation of various built-in devices in a handler for testing electronic components, or minimizing the transmission thereof, thereby stabilizing the electrical connection between electronic components and test sockets.

[0012] According to the present invention, a sorting machine for testing electronic components is characterized in that it includes: a vibration-proof frame, which is separated from a base and moves relatively with respect to the base to suppress the influence of the vibration of the base on the electrical connection between the electronic components and the test sockets; a vibration absorber, which is clamped between the vibration-proof frame and the base to minimize the transmission of the vibration of the base to the vibration-proof frame; a connector, which is arranged on the vibration-proof frame and electrically connects the electronic components and the test sockets; a receiver, which supplies the electronic components to be tested to the test sockets, or recovers the electronic components after the test; and a controller, which controls the connector and the receiver, wherein the test socket is arranged on the vibration-proof frame.

[0013] The electronic component test sorting machine further includes a fixture for fixing the vibration-proof frame, wherein the controller controls the fixture to fix the vibration-proof frame or release the fixing state.

[0014] The controller fixes the vibration-proof frame by the holder when the electronic component is supplied to or collected from the test socket by the feeder, and releases the state where the vibration-proof frame is fixed by the holder during testing.

[0015] The fixer includes a fixing pin that fixes the vibration-proof frame; and a moving source that moves the fixing pin and is fixed to the base side, wherein a fixing hole is formed in the vibration-proof frame for inserting or removing the fixing pin so that the vibration-proof frame is in a fixed state or an unfixed state.

[0016] The fixer includes: a fixing pin that fixes the vibration-proof frame; and a moving source that moves the fixing pin and fixes it to the base side, wherein a fixing hole is formed on the base side for inserting or removing the fixing pin so that the vibration-proof frame is in a fixed state or a released state.

[0017] The vibration-proof frame has a movement restriction element for restricting excessive movement of the vibration-proof frame when the vibration-proof frame is fixed to the base.

[0018] The movement limiting element is provided in a plate shape and is in surface contact with the base.

[0019] The movement restricting element has a correction pin for correcting the position of the vibration-proof frame when the vibration-proof frame is fixed to the base side, and a correction hole into which the correction pin can be inserted is formed on the base side.

[0020] The vibration-proof frame has a disassembly rail for disassembly and assembly of the socket board with the test socket.

[0021] The attachment and detachment rail is disposed at a height such that, when the vibration-proof frame is fixed to the base side, a gap is formed between the socket board and the base through which various wirings can pass.

[0022] The vibration-proof frame and the connector are provided in plural numbers, and the plural connectors operate independently.

[0023] According to the present invention, the vibration generated by the operation of the peripheral built-in machine can be minimized from being transmitted to the electronic components and test sockets electrically connected to each other. Since the operation impact generated during the electrical connection between the electronic components and the test sockets in the corresponding parts can be minimized from being transmitted to the periphery, the electrical connection between the electronic components and the tester and the precision of the connection can be maintained, and ultimately the reliability of the test results can be improved.

[0024] Also, according to the present invention, damage to the electronic component or the test socket that may occur due to unstable electrical connection between the electronic component and the test socket can be prevented. BRIEF DESCRIPTION OF THE DRAWINGS

[0025] Figure 1 FIG. 1 is a schematic plan view of a handler for testing electronic components according to an embodiment of the present invention.

[0026] Figure 2 About application Figure 1 Test station for sorting machines.

[0027] Figure 3 About application Figure 1A perspective view of characteristic parts of a sorting machine according to a first embodiment.

[0028] Figure 4 It is intercepted Figure 3 A screenshot of the local feature area.

[0029] Figure 5 It is used to illustrate Figure 3 Refer to the reference diagram for the role of the characteristic parts.

[0030] Figures 6 to 8 About application Figure 1 A stereoscopic view of the characteristic parts of the sorting machine according to the second embodiment.

[0031] Figures 9 and 10 About application Figure 1 A stereoscopic view of the characteristic parts of the sorting machine according to the third embodiment.

[0032] Description of reference numerals:

[0033] 100: Sorting machine for electronic component testing 130: Loading station

[0034] 141 to 144: mover 150: first picker

[0035] 160: Second pick and place device 170: Connector

[0036] 180: Vibration-proof frame FH: Fixing hole

[0037] 190: Fixer FP: Fixing pin

[0038] 192: Mobile source VA: Vibration absorber

[0039] CA: Controller DETAILED DESCRIPTION

[0040] Preferred embodiments according to the present invention are described with reference to the accompanying drawings. For the sake of brevity, descriptions of repeated or substantially identical configurations are omitted or compressed as much as possible.

[0041] <Brief description of the sorting machine>

[0042] Figure 1 1 is a schematic plan view of a sorting machine (100, hereinafter referred to as 'sorting machine') for testing electronic components according to a most preferred embodiment of the present invention.

[0043] like Figure 1As shown, the sorting machine according to the present invention includes: three loading stackers LS, two loading plates 110, four unloading plates 120, four loading platforms 130, four movers 141~144, a first picker 150, four second pickers 160, sixteen connectors 170, three unloading stackers US, a conveyor TA and a controller CA.

[0044] Before explaining the above configuration, the test station TS of the sorting machine will be explained first. Figure 1 There are four test stations TS behind the sorting machine.

[0045] Four test stations TS are located side by side in the left-right direction at the rear and have the same structure. Figure 2 The following is a brief description of the structure of a test station TS. Figure 2 As shown, the test station TS has four test positions TP configured in two layers, upper and lower, and two columns, left and right. To this end, each test station TS is constructed by a setting frame IF and a base BP of upper and lower layers. In addition, each test position TP is provided with a test socket S for electrically connecting the electronic component to the tester. Therefore, a total of four electronic components can be tested in one test station TS. That is, the electronic components can be placed in the four test sockets S set in the test position TP respectively by the second pick and place device 160, and the four connectors 170 pressurize the electronic components they are responsible for toward the test socket S side so that the electronic components and the tester are electrically connected. Of course, due to different implementation methods, it can also be fully considered that there are multiple test sockets S in one test position TP, and one connector electrically connects multiple electronic components to multiple test sockets S at one time.

[0046] Next, each of the above-mentioned components will be described.

[0047] Three loading stackers LS are arranged at the front left side and receive customer trays CT loaded with electronic components to be tested.

[0048] The two loading plates 110 are arranged side by side in the left-right direction on the right side of the loading stacker LS, and the customer pallets CT transferred from the loading stacker LS are placed thereon.

[0049] Four unloading plates 120 are arranged side by side in the left-right direction on the right side of the loading plate 110 and place customer trays CT for loading tested electronic components.

[0050] The four loading stations 130 are configured to move loaded electronic components and are located between the two loading plates 110 and the four unloading plates 120 at the front and the four test stations TS at the rear.

[0051] The four movers 141 to 144 respectively move the loading station 130 they are responsible for between a first position P1 adjacent to the loading plate 110 or the unloading plate 120 and a second position P2 adjacent to the test station TS.

[0052] The first picker 150 moves the electronic components to be tested from the customer tray CT placed on the loading plate 110 to the loading station 130 located at the first position P1, or sorts the tested electronic components from the loading station 130 located at the first position P1 according to the test results and moves them to the customer tray CT placed on the unloading plate 120.

[0053] The four second pickers and places 160 move the electronic components to be tested from the loading station 130 located at the second position P2 to the test station TS, or move the electronic components after testing from the test station TS to the loading station 130 located at the second position P2. That is, the electronic components are finally supplied to the test socket S located at the test station TS, or the electronic components are recovered from the test socket S, by the second pickers and places 160.

[0054] The movement of the electronic components between one test station TS and one loading station 130 is exclusively handled by one second picker and placer 160. Therefore, in order to move the electronic components individually, the four second pickers and placers 160 can be operated independently of each other.

[0055] Sixteen connectors 170 are arranged in a 2×2 pattern in each test station TS in such a way that one connector 170 can correspond to one test position TP in the vertical direction. Each connector 170 applies pressure to the electronic component located at the test position TP relative to the test socket S, so that the electronic component can be electrically connected to the tester. This will be described in detail in a separate catalog.

[0056] The three unloading stackers US receive customer trays CT loaded with tested electronic components transferred from the unloading plate 120 located on the left side.

[0057] The conveyor TA is responsible for moving the customer pallets CT between the loading stacker TA, the transfer plate 110, the unloading plate 120 and the unloading stacker US.

[0058] The controller CA controls the operations of the four movers 141 to 144 , the first picker 150 , the four second pickers 160 , the sixteen connectors 170 , the conveyor TA, and the fixer described in the separate directory.

[0059] The operation of the sorting machine having the above structure is briefly described. Here, each test station TS, each loading station 130, and each second pick-and-place device 160 have the same structure. For the sake of simplicity, only one test station TS, one loading station 130, and one second pick-and-place device 160 are described, and the description of other parts is omitted.

[0060] First, when the customer tray CT is moved from the loading stacker LS to the loading plate 110 by the conveyor TA, the first picker 150 moves the electronic component to be tested from the customer tray CT placed on the loading plate 110 to the loading station 130 located at the first position P1. Then the movers 141-144 move the loading station 130 to the second position P2, and the second picker 160 picks up the electronic component from the loading station 130 and supplies it to any one of the vacant test sockets S among the four test sockets S located at the test station TS. At that time, the connector 170 stably electrically connects the electronic component to the test socket S, and then when the test of the electronic component is completed, the second picker 160 recovers the electronic component from the test socket S and moves it to the loading station 130. Then, the movers 141-144 move the loading station 130 to the first position P1, and the first picker 150 picks up the electronic component that has completed the test from the loading station 130 located at the first position P1 and moves it to the customer tray CT located at the unloading plate 120.

[0061] In addition, when the customer pallet CT located at the unloading 120 is filled, the conveyor TA moves the customer pallet CT to the unloading stacker US.

[0062] The four loading stations 130, the four movers 141-144, the first picker 150, the four second pickers 160 and the conveyor TA may be included and collectively referred to as a receiver for supplying the electronic components to be tested to the test sockets S and then recovering the tested electronic components, and may have a variety of structures or shapes depending on the type of sorting machine.

[0063] <Description of the First Embodiment with Respect to Characteristic Parts>

[0064] Figure 3 Shown according to the above Figure 1 The characteristic part of the sorting machine 100. For reference, Figure 3 There are four characteristic parts in one test station TS.

[0065] like Figure 3 As shown, the sorting machine 100 according to the present embodiment further includes a vibration-proof frame 180, a fixture 190, and four vibration absorbers VA.

[0066] The vibration-proof frame 180 is not directly fixed to the setting frame IF, but is fixed to the base BP at intervals by sandwiching four vibration absorbers VA. Therefore, the vibration-proof frame 180 moves relative to the base BP, and finally can suppress the influence of the vibration of the setting frame IF and the base BP on the electrical connection between the electronic component and the test socket S. Here, two fixing holes FH are formed in the setting plate 181 constituting the bottom plate of the vibration-proof frame 180 (refer to Figure 4 ), the lower side of which has symmetrical A pair of engaging parts JP bent in the shape of a letter "JP".

[0067] Furthermore, corresponding to the engaging portion JP, the upper side of the bottom plate BP has two symmetrical portions in the left-right direction. Although described later, the engaging portion JP and the stopper portion SP function as movement restriction elements for preventing the vibration-proof frame 180 from moving excessively.

[0068] The connector 170 is fixed to the vibration-proof frame 180. Thus, unlike the prior art, the connector 70 is not coupled to the installation frame IF but is integrally coupled only to the vibration-proof frame 180, and moves relatively with the vibration-proof frame 180 relative to the base BP.

[0069] Furthermore, unlike the conventional technique, since the test socket S is fixedly installed on the installation plate 181 , the test socket S also moves relatively with respect to the base BP together with the vibration-proof frame 180 .

[0070] The fixing device 190 is fixedly installed on the base BP and is used to fix the vibration-proof frame 180 to the base BP or release the fixing state. Figure 4 Similarly, it includes a fixing member 191 having a fixing pin FP and a moving source 192.

[0071] The fixing member 191 having the fixing pins FP is provided to pressurize or release the setting plate 181 upward. Here, the two fixing pins FP are respectively inserted into or removed from the fixing holes FH of the setting plate 181, so that the vibration-proof frame 180 is fixed or released in the front-back and left-right positions. That is, when the fixing member 191 rises, the fixing member 191 is in a state of pressurizing the setting plate 181, thereby fixing the up-down position of the setting plate 181, and at the same time, the fixing pins FP are inserted into the fixing holes FH, thereby fixing the front-back and left-right positions of the setting plate 181. In addition, when the fixing member 191 rises and thus lifts up the setting plate 181 to some extent, as shown in FIG. Figure 5As shown, the engaging portion JP is engaged with the stop portion SP, thereby preventing the fixing member 191 and the setting plate 181 from excessively rising. At the same time, due to the mutual compression between the fixing member 191 and the setting plate 181 and the mutual compression between the engaging portion JP and the stop portion SP, the setting plate 181 can be tightly fixed to the base BP, so that the setting plate 181 is in a state where it cannot move in the front, back, left, and right directions or rise and swim.

[0072] The moving source 192 raises the fixing member 191, thereby moving the fixing member 191 toward or away from the setting plate 181. Although such a moving source 192 is preferably provided as an air cylinder in terms of production cost, it may be provided as a motor according to the embodiment.

[0073] As an additional note, in this example, the fixture 190 is fixedly disposed on the base BP, and the fixing hole FH is formed in the setting plate 181. However, according to the embodiment, it is also conceivable to implement the fixture 190 as fixedly disposed on the setting plate 181, and the fixing hole FH is formed in the base BP.

[0074] The vibration absorber VA is sandwiched between the vibration-proof frame 180 and the base BP, thereby supporting the vibration-proof frame 180 relative to the base BP and suppressing the vibration of the base BP from being transmitted to the vibration-proof frame 180, thereby minimizing the vibration transmitted by the operation of the peripheral machine. This vibration absorber VA can be equipped with a spring-damping type base with a structure equipped with a spring on the market. However, according to the embodiment, the vibration absorber VA can also be equipped with a pneumatic cylinder that can be driven by itself and can elastically support the vibration-proof frame 180. Similarly, as long as the vibration absorber VA can be elastically compressed and expanded, it is not limited to its driving method or form and can be equipped with any elastic body. In addition, the following means can also be considered: the vibration absorber VA can minimize the transmission of vibrations generated by the operation of the connector 170 to the periphery, thereby eliminating the vibrations locally generated in the connector 170 by itself, thereby minimizing the vibrations transmitted to the side, so it can be considered to suppress the vibration of the sorting machine 100 as a whole.

[0075] For reference, Figure 3 The symbol C in the middle is a camera for checking the flatness of the setting plate 181, whether the electronic components are supplied to the test sockets S, and the loading state of the electronic components.

[0076] The functions and characteristic operations of the above-mentioned characteristic parts are further explained.

[0077] When the electronic components are supplied to the test socket S by the second pick and place device 160, the position of the vibration-proof frame 180 needs to be fixed, so the controller CA operates the fixture 190 to move the fixing member 191 upward. Accordingly, when the fixing member 191 contacts the setting plate 181 and presses the setting plate 181 upward to raise the setting plate 181, the clamping portion JP contacts and clamps with the stopper portion SP, and the upper and lower positions of the setting plate 181 can be fixed relative to the base BP. At the same time, the fixing pin FP is inserted into the fixing hole FH, and the front and rear and left rear positions of the setting plate 181 are also corrected and fixed. Here, the rising of the setting plate 181 is equivalent to the rising of the vibration-proof frame 180 having the setting plate 181.

[0078] In the same Figure 5 In the state, when the electronic component is supplied to the test socket S by the second pick and place device 160, the connector 170 will operate and pressurize the electronic component toward the test socket S side, so that the electronic component and the test socket S are electrically connected to each other. And, when the electrical connection operation between the electronic component and the test socket S is completed by the connector 170, the controller CA operates the fixture 190 to move the fixing component 191 downward, thereby releasing the fixing state of the vibration-proof frame 180 by the fixture 190, and testing the electronic component in this state. In this way, the vibration generated from the peripheral equipment and transmitted to the electronic component and the test socket S through the setting frame IP and the base BP during the test can be minimized.

[0079] In addition, since it is important to correctly grab the electronic components when the second pick-and-place device 170 recovers the electronic components from the test socket S after the test is completed, Figure 5 As shown, the operation of collecting the electronic components by the second picker 170 is performed in a state where the position of the vibration-proof frame 180 is fixed.

[0080] <Description of the Second Embodiment with Respect to Characteristic Parts>

[0081] In the above-described first embodiment, the movement source of the fixer 190 is directly provided on the base BP, thereby realizing that the vibration-isolating frame 180 is raised when the vibration-isolating frame 180 is fixed to the base BP.

[0082] However, referring to Figure 6 In the second embodiment, the vibration-proof frame 280 is fixed to the base BP so that the vibration-proof frame 280 is lowered. To this end, the mobile source 292 is loaded with the equipment frame IF and fixedly set on the upper plate UP integrated with the base BP, such as Figure 7As shown in the cutout of , the fixing pin FP protrudes downward. Furthermore, the fixing hole FH is formed in the coupling plate CP for coupling the connector 270 to the vibration-proof frame 280, and thus is finally formed on the base BP side. Of course, according to the embodiment, the fixing hole FH may also be formed in the fixing member 291, and the coupling plate CP may have the fixing pin FP.

[0083] Furthermore, in the present embodiment, the setting plate 281 for setting the socket board SB having four test sockets S forms a surface contact with the base BP when the vibration-proof frame 280 is lowered, thereby limiting the excessive downward movement of the vibration-proof frame 280. That is, in the present embodiment, in order to fix the vibration-proof frame 280 on the base BP and the vibration-proof frame 280 is lowered, the plate-shaped setting plate 281 forms a surface contact with the base BP, thereby playing a function as a movement limiting element for limiting the excessive downward movement of the vibration-proof frame 280.

[0084] In addition, refer to Figure 8 The lower surface of the setting plate 281 has a fixing pin RP protruding downward, and a correction hole RH into which the correction pin RP can be inserted is formed in the base BP. Therefore, when the vibration-proof frame 280 is lowered, the correction pin RP is inserted into the correction hole RH, thereby performing a correction operation to accurately correct the position of the vibration-proof frame 280, and at the same time, it is possible to prevent the horizontal movement of the vibration-proof frame 280 in the front, back, left, and right directions. That is, in this example, the fixing pin RP and the fixing hole RH are formed in pairs, thereby performing the role of fixing the vibration-proof frame 280 or the position.

[0085] For reference, Figure 6 and Figure 7 As can be seen from the figure, in this embodiment, there can be a structure with four test sockets S and four push rods PS that can pressurize at the same time.

[0086] <Description of the Third Embodiment with Respect to Characteristic Parts>

[0087] The third embodiment differs from the second embodiment in that a pair of mounting and disassembling rails 381R and 381L are provided separately.

[0088] According to this embodiment Fig. 9As shown, two disassembly rails 381R and 381L are fixedly arranged on both sides of the vibration-proof frame 380, and are formed by protruding inwardly and spaced apart from each other, and have a track groove RG facing inwardly. Therefore, the two ends of the socket board SB having four test sockets S are assembled on the disassembly rails 381R and 381L in a manner of moving and sliding in the track groove RG in the front-back direction, and sliding in the opposite direction thereof, and detaching from the disassembly rails 381R and 381L. That is, the disassembly rails 381R and 381L in this embodiment replace the function of the setting plates 181 and 281 in the first embodiment or the second embodiment. In addition, when the vibration-proof frame 380 is lowered and fixed to the base BP side, such disassembly rails 381R and 381L are also provided at a height that can form a gap between the socket board SB and the base BP so that various wiring can pass. Due to the thus formed mounting and dismounting rails 381R and 381L, according to the present embodiment, the mounting and dismounting operation of the socket board SB can be easily performed, and various wirings connected to the socket board SB can be easily handled.

[0089] Furthermore, in this embodiment, Fig.10 As shown, unlike the second embodiment, the moving source 392 is fixedly installed on the coupling plate CP, and finally the fixing hole FH is formed in the additional component AE additionally attached to the setting frame IF on the side of the base BP. Therefore, according to this example, by the operation of the moving source 392, the fixing pin FP of the fixing component 391 is inserted into the fixing hole FH, so that the fixing component 391 is connected to the additional component AE, and by the continuous operation of the moving source 392, the coupling plate CP is pressed downward, so that the vibration-proof frame 380 is lowered.

[0090] The downward movement of the vibration-proof frame 380 is terminated when the movement limiting plate ML of the lower plate constituting the vibration-proof frame 380 comes into contact with the surface of the base BP. That is, in this example, the movement limiting plate ML functions as a movement limiting element. Here, the movement limiting plate ML is the same as the setting plate 281 in the second embodiment, and has a correction pin on its lower surface, and a correction hole is formed in the base BP according to this.

[0091] For reference, in the second and third embodiments described above, in order to prevent surface damage caused by contact, between the setting plate 281 and the base BP, and between the movement limiting plate ML and the base BP, it is also preferable to attach a relatively thin gasket made of synthetic resin or rubber to the lower surface of the setting plate 281 and the movement limiting plate ML and the upper surface of the base BP. In addition, according to the embodiment, the setting plate 281 and the movement limiting plate ML may be formed with correction holes, and the base BP may have correction protrusions.

[0092] As described above, the present invention is characterized in that a separate vibration-proof frame that can move relatively is provided in the setting frame forming the basic structure of the sorting machine. If a structure having such a feature is required, the present invention can be appropriately applied to any sorting machine. In particular, the present invention can be preferably applied to a sorting machine having the following structure: having a plurality of mutually adjacent connectors 170, 270, 370, each connector 170, 270, 370 is independently operated, and thus is affected by mutual vibration due to the operation shock generated from each connector 170, 270, 370 at different times.

[0093] As described above, a specific description of the present invention has been made based on the embodiments illustrated with reference to the accompanying drawings. However, the above embodiments only illustrate the preferred embodiments of the present invention as an example. Therefore, the present invention should not be understood as being limited to the above embodiments, and the scope of rights of the present invention should be understood as the scope of the claims and the scope equivalent thereto.

Claims

1. A sorting machine for electronic component testing, characterized in that: include: A vibration-proof frame is provided at a distance from the base and moves relative to the base to suppress the influence of the vibration of the base on the electrical connection between the electronic component and the test socket; a vibration absorber, sandwiched between the vibration-proof frame and the base, so as to minimize the transmission of vibration of the base to the vibration-proof frame; A connector, which is provided on the vibration-proof frame and electrically connects the electronic component and the test socket; A receiver, supplying the electronic components to be tested to the test socket, or collecting the electronic components after the test; A controller, controlling the connector and the receiver; and a fixer for fixing the anti-vibration frame, Wherein, the test socket is arranged on the vibration-proof frame, Wherein, the fixer comprises: retaining pin; and Move the source, move the fixed pin, The fixer inserts or removes the fixing pin into or from a fixing hole formed on the vibration-proof frame side or the base side, so that the vibration-proof frame is in a fixed state or a released state.

2. The electronic component testing sorting machine according to claim 1, wherein: The controller controls the fixer to fix the vibration-proof frame or release the fixed state.

3. The electronic component testing sorting machine according to claim 2, wherein: The controller fixes the vibration-proof frame by the fixture when the electronic component is supplied to or collected from the test socket by the feeder, and releases the state where the vibration-proof frame is fixed by the fixture during testing.

4. The electronic component testing sorting machine according to claim 2, wherein: The moving source configured as a cylinder or a motor is fixed to the base side, Wherein, the fixing hole is formed in the vibration-proof frame.

5. The electronic component testing sorting machine according to claim 2, wherein: The moving source configured as an air cylinder or a motor is fixed to the vibration-proof frame side, Wherein, the fixing hole is formed on the base side.

6. The electronic component testing sorting machine according to claim 1, wherein: The vibration-proof frame has a movement restriction element for restricting excessive movement of the vibration-proof frame when the vibration-proof frame is fixed to the base.

7. The electronic component testing sorting machine according to claim 6, wherein: The movement limiting element is provided in a plate shape and is in surface contact with the base.

8. The electronic component testing sorting machine according to claim 7, wherein: The movement restricting element has a correction pin for correcting the position of the vibration-proof frame when the vibration-proof frame is fixed to the base side. Furthermore, a correction hole into which the correction pin can be inserted is formed on the base side.

9. The electronic component testing sorting machine according to claim 1, wherein: The vibration-proof frame has a disassembly rail for disassembly and assembly of the socket board with the test socket.

10. The electronic component testing sorting machine according to claim 9, wherein: The attachment and detachment rail is disposed at a height such that, when the vibration-proof frame is fixed to the base side, a gap is formed between the socket plate and the base through which various wirings can pass.

11. The electronic component testing sorting machine according to claim 1, wherein: The vibration-proof frame and the connector are provided in plural numbers, Furthermore, the plurality of connectors operate independently.

12. The electronic component testing sorting machine according to claim 1, wherein: The fixture further comprises: a fixing member having the fixing pin for fixing the vibration-proof frame; and an additional component fixedly coupled to the base side and having the fixing hole into which the fixing pin can be inserted, The mobile source lifts the fixed component and fixes it to a connecting plate connected to the vibration-proof frame. The controller controls the moving source to raise and lower the fixing member so that the fixing pin is inserted into or removed from the fixing hole, thereby fixing the vibration-proof frame or releasing the fixing state.

Images