Calculation Method, Device and Related Equipment for Equivalent Low-Temperature Chronology Test Ages

Abstract

The present application discloses a calculation method, device and related equipment for the equivalent low-temperature chronology test age. The method includes: performing random search by using the Monte Carlo method to obtain a set of thermal history curves for each sample on the target vertical section; for each set of thermal history curves, performing screening, sampling, and taking the mean value to obtain a target thermal history curve; calculating the first simulated age corresponding to the first low-temperature chronology method for each target thermal history curve, and calculating the second simulated age corresponding to the second low-temperature chronology method for each target thermal history curve; for each target thermal history curve, calculating the equivalent test age of the target thermal history curve according to the first simulated age, the second simulated age, and the age test value. By applying the test values and simulated values of different low-temperature chronology methods to the same set of thermal history curves, the test equivalent value is calculated, reducing the experimental cost.

Description

Technical Field

[0001] The present application relates to the field of geological technologies, and more specifically, to a method, device and related equipment for calculating the equivalent low-temperature chronology test age. Background Art

[0002] Low-temperature thermochronology methods (such as fission track, U-Th / He, Ar-Ar, etc.) have been widely applied in geological research, energy exploration, etc., and have become a new discipline that has developed vigorously in recent decades. Among them, compared with the low-temperature chronology research based on single samples, the low-temperature chronology research based on vertical profiles is more favored in specific applications due to its higher accuracy and stronger reliability. However, many new problems have emerged in the sampling and analysis of vertical profiles. One of them is that multiple low-temperature chronology methods are simultaneously applied to the same vertical profile, making it difficult to perform equivalent calculations between various low-temperature chronology methods. Summary of the Invention

[0003] In view of this, the present application provides a method, device and related equipment for calculating the equivalent low-temperature chronology test age to achieve equivalent calculations between various low-temperature chronology methods.

[0004] To achieve the above object, the first aspect of the present application provides a method for calculating the equivalent low-temperature chronology test age, including:

[0005] Performing random search using the Monte Carlo method to obtain N1 sets of thermal history curves of N1 samples on a target vertical profile, each set of thermal history curves including N2 thermal history curves, where N1 and N2 are preset quantities;

[0006] Based on each target low-temperature chronology method, calculating the simulated age of each thermal history curve to obtain the simulated age of each thermal history curve corresponding to each target low-temperature chronology method;

[0007] For each set of thermal history curves, screening the thermal history curves according to the simulated age of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve to obtain a set of screened thermal history curves;

[0008] Sampling and taking the mean value of each thermal history curve in each set of screened thermal history curves to obtain a target thermal history curve;

[0009] Based on the first low-temperature chronology method, calculating the simulated age of each target thermal history curve to obtain the first simulated age of each target thermal history curve corresponding to the first low-temperature chronology method, and based on the second low-temperature chronology method, calculating the simulated age of each target thermal history curve to obtain the second simulated age of each target thermal history curve corresponding to the second low-temperature chronology method;

[0010] For each target thermal history curve, based on the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method, the equivalent test age of the target thermal history curve with respect to the second low-temperature chronology method is calculated.

[0011] Preferably, the process of using the Monte Carlo method for random search to obtain N1 sets of thermal history curves of N1 samples on the target vertical section includes:

[0012] Taking one of the samples on the target vertical section as a reference sample, and using the Monte Carlo method for random search to obtain N2 thermal history curves of the reference sample;

[0013] For each of the other samples on the target vertical section:

[0014] Based on the height difference relationship between each of the other samples and the reference sample, and combining with the N2 thermal history curves of the reference sample according to the paleogeothermal gradient function, N2 thermal history curves of each of the other samples are calculated.

[0015] Preferably, each target low-temperature chronology method includes a U-Th / He age simulation method and a fission track age simulation method. The process of calculating the simulated ages of each thermal history curve based on each target low-temperature chronology method to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method includes:

[0016] Based on the U-Th / He age simulation method and the fission track age simulation method respectively, the simulated ages of each thermal history curve are calculated to obtain the U-Th / He simulated ages and fission track simulated ages of each thermal history curve.

[0017] Preferably, for each group of thermal history curves, the process of screening the thermal history curves according to the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve includes:

[0018] For each thermal history curve in each group of thermal history curves:

[0019] Based on the simulated ages of the thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve, the goodness of fit between the simulated age and the age test value is calculated;

[0020] The goodness of fit is compared with a preset goodness-of-fit value, and whether to retain the thermal history curve is determined according to the comparison result.

[0021] Preferably, the process of calculating the goodness of fit between the simulated age corresponding to each target low-temperature chronology method according to the thermal history curve and the age test value of the sample corresponding to the thermal history curve includes:

[0022] The goodness of fit GOF of each thermal history curve of the sample is calculated using the following equation:

[0023]

[0024] where age is the simulated age corresponding to each thermal history curve, is the average error of the age test value of the sample on the target vertical section, is the average difference between the simulated age and the age test value of the sample on the target vertical section.

[0025] Preferably, the process of sampling and averaging each thermal history curve in each group of filtered thermal history curves to obtain a target thermal history curve includes:

[0026] For each group of filtered thermal history curves:

[0027] Determine N3 time sampling points, and average the values of each thermal history curve at each time sampling point to obtain the average temperature at each time sampling point;

[0028] According to the time values of each time sampling point and the average temperature corresponding to each time sampling point, determine a target thermal history curve corresponding to the group.

[0029] Preferably, for each target thermal history curve, according to the first simulated age corresponding to the first low-temperature chronology method of the target thermal history curve, the second simulated age corresponding to the second low-temperature chronology method of the target thermal history curve, and the age test value corresponding to the first low-temperature chronology method of the target thermal history curve, the process of calculating the equivalent test age of the target thermal history curve with respect to the second low-temperature chronology method includes:

[0030] The equivalent test age B1 of the target thermal history curve with respect to the second low-temperature chronology method is calculated according to the following equation:

[0031]

[0032] where A m and B m are the first simulated age and the second simulated age respectively, A1 is the age test value, σ A is the preset first test error, and σ B is the second test error.

[0033] The second aspect of the present application provides a calculation device for equivalent low-temperature chronology test ages, including:

[0034] A random search unit for performing random search using the Monte Carlo method to obtain N1 sets of thermal history curves for N1 samples on a target vertical section, where each set of thermal history curves includes N2 thermal history curves, and N1 and N2 are preset quantities;

[0035] A first simulation unit for calculating the simulated ages of each thermal history curve based on each target low-temperature chronology method to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method;

[0036] A comparison and screening unit for screening each set of thermal history curves according to the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method in the set and the age test value of the sample corresponding to the thermal history curve to obtain a set of screened thermal history curves;

[0037] A thermal history determination unit for sampling and taking the average value of each thermal history curve in each set of screened thermal history curves to obtain a target thermal history curve;

[0038] A second simulation unit for calculating the first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method based on the first low-temperature chronology method, and calculating the second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method based on the second low-temperature chronology method;

[0039] An equivalent calculation unit for calculating the equivalent test age of each target thermal history curve relative to the second low-temperature chronology method according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method.

[0040] The third aspect of the present application provides a calculation device for equivalent low-temperature chronology test ages, including: a memory and a processor;

[0041] The memory is used for storing programs;

[0042] The processor is used for executing the programs to implement each step of the calculation method for equivalent low-temperature chronology test ages as described above.

[0043] A fourth aspect of the present application provides a storage medium, on which a computer program is stored. When the computer program is executed by a processor, each step of the method for calculating the equivalent low-temperature chronology test age as described above is implemented.

[0044] As can be seen from the above technical solutions, the present application first uses the Monte Carlo method for random search to obtain N1 sets of thermal history curves of N1 samples on the target vertical section. Each set of thermal history curves includes N2 thermal history curves, where N1 and N2 are preset quantities. It can be understood that the more thermal history curves are randomly searched, the easier it is to find a thermal history curve closer to the true one. Then, based on each target low-temperature chronology method, the simulated ages of each thermal history curve are calculated to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method. Next, for each thermal history curve, according to the simulated age of the thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve, the thermal history curve is screened to obtain a set of candidate thermal history curves, and the set of candidate thermal history curves includes N1 sets of thermal history curves. Through the above screening, some thermal history curves with more serious distortion can be discarded. Then, each set of thermal history curves in the set of candidate thermal history curves is sampled and averaged to obtain N1 target thermal history curves. Then, based on the first low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method, and based on the second low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method. Finally, for each target thermal history curve, according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method, the equivalent test age of the target thermal history curve relative to the second low-temperature chronology method is calculated. By applying the test values and simulated values of different low-temperature chronology methods to the same set of thermal history curves, the present application realizes the data comparison between various low-temperature chronology methods, and calculates the test equivalent value without the need to perform the test of the second low-temperature chronology method, reducing the experimental cost. Description of the Drawings

[0045] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the following will briefly introduce the drawings required for the description of the embodiments or the prior art. Obviously, the drawings in the following description are only the embodiments of the present application. For those of ordinary skill in the art, other drawings can be obtained according to the provided drawings without creative efforts.

[0046] Figure 1 Schematic diagram of the calculation method for the equivalent low-temperature chronology test age disclosed in the embodiments of the present application;

[0047] Figure 2 Schematic diagram exemplifying the thermal history curve disclosed in the embodiments of the present application;

[0048] Figure 3 Schematic diagram exemplifying the specific parameters of various samples disclosed in the embodiments of the present application;

[0049] Figure 4 Another schematic diagram of the calculation device for the equivalent low-temperature chronology test age disclosed in the embodiments of the present application;

[0050] Figure 5 Schematic diagram of the calculation device for the equivalent low-temperature chronology test age disclosed in the embodiments of the present application. Detailed implementation manners

[0051] Next, the technical solutions in the embodiments of the present application will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only a part of the embodiments of the present application, rather than all the embodiments. All other embodiments obtained by those of ordinary skill in the art based on the embodiments of the present application without creative efforts shall fall within the protection scope of the present application.

[0052] Next, the calculation method for the equivalent low-temperature chronology test age provided in the embodiments of the present application is introduced. Please refer to Figure 1 , the calculation method for the equivalent low-temperature chronology test age provided in the embodiments of the present application may include the following steps:

[0053] Step S101, determine the thermal history curves of various samples on the target vertical section.

[0054] Specifically, use the Monte Carlo method for random search to obtain N1 groups of thermal history curves of N1 samples on the target vertical section, and each group of thermal history curves includes N2 thermal history curves. That is, each sample corresponds to a group of thermal history curves, where N1 and N2 are preset quantities.

[0055] Among them, the Monte Carlo algorithm (Monte Carlo method), also known as the statistical simulation method, is a very important numerical calculation method guided by probability and statistics theory. It refers to a method of using random numbers (or pseudo-random numbers) to solve various calculation problems. In the embodiments of the present application, the Monte Carlo algorithm is used to obtain a number of random numbers, and then the points of these random numbers are connected to draw the thermal history curve; the number of points of the obtained random numbers is relatively large, and the number of thermal history curves obtained is also relatively large, and the quantity size can be adjusted according to the actual situation.

[0056] It is understandable that the target vertical section is a vertical section in geological research. Each sample on the target vertical section can be obtained by drilling wells on the target vertical section and sampling at different depths of the wells.

[0057] For the number N2 of thermal history curves of each sample, when the computing power of the computer permits, the larger the value of N2, the higher the possibility that the searched thermal history curve is close to the actual thermal history situation. Generally, the value of N2 is taken to be not less than 10,000.

[0058] Step S102, based on each target low-temperature chronology method, calculate the simulated ages of each thermal history curve to obtain the simulated ages corresponding to each thermal history curve for each target low-temperature chronology method.

[0059] Since each sample corresponds to N2 thermal history curves, according to the low-temperature chronology method, each thermal history curve corresponds to a simulated age. Therefore, for each sample and each target low-temperature chronology method, N2 simulated ages can be simulated and calculated.

[0060] Step S103, screen each group of thermal history curves to obtain a group of screened thermal history curves.

[0061] Specifically, for each group of thermal history curves, according to the simulated age corresponding to each thermal history curve for each target low-temperature chronology method and the age test value of the sample corresponding to this thermal history curve, screen this thermal history curve to determine whether to keep or discard this thermal history curve, and finally obtain a group of screened thermal history curves.

[0062] Among them, the screening process can be carried out according to the fitting degree between the simulated age and the age test value. Keep the thermal history curves with higher fitting degrees and eliminate the thermal history curves with lower fitting degrees. Screen each group of thermal history curves in the N1 groups of thermal history curves separately, and finally obtain N1 groups of screened thermal history curves.

[0063] Step S104, sample and take the mean value of each thermal history curve in each group of screened thermal history curves to obtain a target thermal history curve.

[0064] Since the thermal history curve is continuous, discrete points on the thermal history curve can be obtained through sampling, and then the average operation is performed to obtain the target thermal history curve after combining each group of thermal history curves.

[0065] Step S105, calculate the simulated ages of each target thermal history curve using different low-temperature chronology methods.

[0066] Specifically, based on the first low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method. And, based on the second low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method.

[0067] Among them, the first low-temperature chronology method and the second low-temperature chronology method are different low-temperature chronology methods. By using the first low-temperature chronology method to calculate the simulated ages of each target thermal history curve, the first simulated age corresponding to each target thermal history curve can be obtained. By using the second low-temperature chronology method to calculate the simulated ages of each target thermal history curve, the second simulated age corresponding to each target thermal history curve can be obtained.

[0068] Step S106, according to the first simulated age, the second simulated age, and the first age test value of each target thermal history curve, an equivalent test age is calculated.

[0069] Specifically, for each target thermal history curve, according to the first simulated age of this target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of this target thermal history curve corresponding to the second low-temperature chronology method, and the age test value (the first age test value) of this target thermal history curve corresponding to the first low-temperature chronology method, the equivalent test age of this target thermal history curve relative to the second low-temperature chronology method is calculated.

[0070] The present application first uses the Monte Carlo method for random search to obtain N1 sets of thermal history curves of N1 samples on the target vertical section. Each set of thermal history curves includes N2 thermal history curves, where N1 and N2 are preset quantities. It can be understood that the more thermal history curves obtained by random search, the easier it is to find thermal history curves closer to the real ones. Then, based on each target low-temperature chronology method, the simulated ages of each thermal history curve are calculated to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method. Next, for each thermal history curve, according to the simulated age of the thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve, the thermal history curve is screened to obtain a set of candidate thermal history curves, and the set of candidate thermal history curves includes N1 sets of thermal history curves. Through the above screening, some thermal history curves with relatively serious distortion can be discarded. Then, each set of thermal history curves in the set of candidate thermal history curves is sampled and averaged to obtain N1 target thermal history curves. Then, based on the first low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method, and based on the second low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method. Finally, for each target thermal history curve, according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method, the equivalent test age of the target thermal history curve relative to the second low-temperature chronology method is calculated. By applying the test values and simulated values of different low-temperature chronology methods to the same set of thermal history curves, the present application realizes the data comparison between various low-temperature chronology methods, and calculates the test equivalent value without the need to conduct tests using the second low-temperature chronology method, reducing the experimental cost. Further, the test equivalent value can vividly and quickly predict the possible measured value and measurement error of the sample under the untested method, which is conducive to comparing the measured values and errors obtained by different low-temperature chronology methods in the same data form.

[0071] It can be understood that the thermal history curve is essentially a temperature-time curve, which characterizes the evolution of the temperature value of the sample over time, and there must be maximum and minimum values in the temperature change during a certain period of time. Based on this, in some embodiments of the present application, the process of using the Monte Carlo method for random search to obtain a set of thermal history curves for one of the samples on the target vertical section in step S101 may include:

[0072] S1. Preset the start value and end value of the time. Among them, the start value of the time represents the start moment of the thermal history curve of the sample, the end value of the time represents the end moment of the thermal history curve of the sample, and the time period between the start value and the end value of the time constitutes the entire time interval of the thermal history curve of the sample.

[0073] S2. Preset the minimum value and maximum value of the temperature. Among them, the minimum value of the temperature represents the minimum temperature value of the thermal history curve of the sample within the entire time interval, and the maximum value of the temperature represents the maximum temperature value of the thermal history curve of the sample within the entire time interval.

[0074] S3. Take the time interval composed of the start value of the time and the end value of the time as the time range of the thermal history curve of the sample, and take the temperature interval composed of the minimum value of the temperature and the maximum value of the temperature as the temperature range of the thermal history curve of the sample. Use the Monte Carlo method to perform random search within this time range and temperature range to obtain a set of thermal history curves of the sample.

[0075] Among them, the number of thermal history curves in this set of thermal history curves can be preset in advance, and generally can be set to 10,000.

[0076] In some embodiments of the present application, the process of using the Monte Carlo method to perform random search in step S101 to obtain N1 sets of thermal history curves of N1 samples on the target vertical section may include:

[0077] S1. Take one of the samples on the target vertical section as a reference sample, and use the Monte Carlo method to perform random search to obtain N2 thermal history curves of the reference sample.

[0078] S2. For each of the other samples on the target vertical section: According to the height difference relationship between each of the other samples and the reference sample, based on the paleogeothermal gradient function, and combined with the N2 thermal history curves of the reference sample, calculate to obtain N2 thermal history curves of each of the other samples.

[0079] For example, the topmost sample on the target vertical section can be used as the reference sample, and then the Monte Carlo method is used to perform random search to obtain N2 thermal history curves of the reference sample. Then, for each of the other samples on the target vertical section, for example, taking the second sample 1000 meters below the reference sample as an example, according to the height difference relationship between the second sample and the reference sample (i.e., 1000), based on the paleogeothermal gradient function, and combined with the N2 thermal history curves of the reference sample, move down respectively on the basis of these N2 thermal history curves to calculate N2 thermal history curves of the second sample.

[0080] It can also be understood as, according to:

[0081] Temperature interval = paleogeothermal gradient * height interval

[0082] And

[0083] Temperature interval function = paleogeothermal gradient function * height interval

[0084] Once the thermal history curve of the first sample is determined, the thermal history curves of other samples can be obtained by shifting up, shifting down or slightly deforming on this basis to obtain the corresponding thermal history curves.

[0085] In some embodiments of the present application, the target low-temperature chronology methods mentioned in the above step S102 include the U-Th / He age simulation method and the fission track age simulation method. Based on each target low-temperature chronology method, the process of calculating the simulated ages of each thermal history curve and obtaining the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method may include:

[0086] Based on the U-Th / He age simulation method and the fission track age simulation method respectively, calculate the simulated ages of each thermal history curve to obtain the U-Th / He simulated ages and fission track simulated ages of each thermal history curve.

[0087] It should be noted that one thermal history curve and one low-temperature chronology method correspond to one simulated age, and N2 thermal history curves and one low-temperature chronology method correspond to N2 simulated ages.

[0088] In some embodiments of the present application, the process of the above step S103 for screening each thermal history curve according to the simulated age of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve may include:

[0089] For each thermal history curve in each group of thermal history curves:

[0090] S1. Calculate the goodness of fit between the simulated age and the age test value according to the simulated age of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve.

[0091] S2. Compare the goodness of fit with a preset goodness of fit value, and determine whether to retain the thermal history curve according to the comparison result.

[0092] In some embodiments of the present application, the process of the above S1 for calculating the goodness of fit between the simulated age and the age test value according to the simulated age of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve may include:

[0093] Calculate the goodness of fit GOF of each thermal history curve of the sample using the following equation:

[0094]

[0095] Among them, age is the simulated age corresponding to each thermal history curve, is the average error of the age test values of the samples on the target vertical section, is the average difference between the simulated age and the age test value of the samples on the target vertical section.

[0096] In some embodiments of the present application, the process of sampling and averaging each thermal history curve in each group of screened thermal history curves in step S104 to obtain a target thermal history curve may include:

[0097] For each group of screened thermal history curves:

[0098] S1. Determine N3 time sampling points, and average the values of each thermal history curve at each time sampling point to obtain the average temperature at each time sampling point.

[0099] S2. Determine a target thermal history curve corresponding to the group according to the time values of each time sampling point and the average temperature corresponding to each time sampling point.

[0100] In some embodiments of the present application, the process of calculating the equivalent test age of the target thermal history curve with respect to the second low-temperature chronology method according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method in step S106 may include:

[0101] Calculate the equivalent test age B1 of the target thermal history curve with respect to the second low-temperature chronology method according to the following equation:

[0102]

[0103] Among them, A m and B m are the first simulated age and the second simulated age respectively, A1 is the age test value, and σ A is the preset first test error, and σ B is the second test error.

[0104] For ease of understanding, the calculation method of the equivalent low-temperature chronology test age of an embodiment of the present application is described below with specific data. First, the specific data of 4 samples of a certain well and the measured apatite U-Th / He ages (Ma) and errors of these samples are shown in Table 1.

[0105] Table 1: Samples and Their Data

[0106]

[0107] Based on these data, the thermal history curve is determined by using the above steps S101 to S105, as Figure 2 shown. Then, the simulated fission track age is calculated based on the average thermal history. Finally, the equivalent measured fission track age and error are calculated according to the above step S106, as Figure 3 shown. Among them, please refer to Figure 3 , the circles are the simulated U-Th / He ages, and the squares are the simulated fission track ages; the lower lines on the same time coordinate are the measured U-Th / He ages and errors, and the upper lines are marked as the equivalent measured fission track ages and errors.

[0108] It can be understood that when statistical analysis of data in a large range of a planar region is required, the solution of the embodiment of the present application can be further simplified. That is, when only one sample is collected on the vertical section, it actually means that a single sample is collected at this position point. Then, there is no need to select the top sample and translation to construct a group of hypothetical thermal history curves, but only need to assume several thermal history curves (for example, 10,000 curves are randomly searched through Monte Carlo), and then perform subsequent steps such as calculating the simulated age.

[0109] For example, there are a large number of samples distributed on the plane of a certain area of thousands of kilometers. Some samples have been tested for apatite U-Th / He, and some samples have been tested for apatite fission tracks. Then, how can all the data be compared in the form of results obtained by one method? We can perform thermal history simulation on all the samples that have been tested for fission tracks, and then, taking the average thermal history simulation as a benchmark, calculate the equivalent measured apatite U-Th / He age of the sample. Then, all the samples on the plane of this area will have apatite U-Th / He ages (some are measured ages and some are equivalent ages), which will form a large dataset, facilitating our geological statistical analysis, analyzing the data change trend and distribution law, and at the same time reducing the experimental cost.

[0110] Next, the calculation device for the equivalent low-temperature chronology test age provided by the embodiment of the present application will be described. The calculation device for the equivalent low-temperature chronology test age described below can be correspondingly referred to the calculation method for the equivalent low-temperature chronology test age described above.

[0111] Please refer to Figure 4 , the calculation device for the equivalent low-temperature chronology test age provided by the embodiment of the present application may include:

[0112] A random search unit 21, configured to perform a random search by using the Monte Carlo method to obtain N1 sets of thermal history curves of N1 samples on a target vertical section, where each set of thermal history curves includes N2 thermal history curves, and N1 and N2 are preset quantities;

[0113] A first simulation unit 22, configured to calculate the simulated ages of each thermal history curve based on each target low-temperature chronology method, so as to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method;

[0114] A comparison and screening unit 23, configured to, for each set of thermal history curves, screen the thermal history curves according to the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve, so as to obtain a set of screened thermal history curves;

[0115] A thermal history determination unit 24, configured to sample and take the average value of each thermal history curve in each set of screened thermal history curves to obtain a target thermal history curve;

[0116] A second simulation unit 25, configured to calculate the simulated ages of each target thermal history curve based on a first low-temperature chronology method to obtain first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method, and calculate the simulated ages of each target thermal history curve based on a second low-temperature chronology method to obtain second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method;

[0117] An equivalent calculation unit 26, configured to, for each target thermal history curve, calculate an equivalent test age of the target thermal history curve with respect to the second low-temperature chronology method according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method.

[0118] The calculation device for the equivalent low-temperature chronology test age provided by the embodiment of the present application can be applied to a calculation device for the equivalent low-temperature chronology test age, such as an intelligent device such as a computer. Optionally, Figure 5 The hardware structure block diagram of the calculation device for the equivalent low-temperature chronology test age is shown. Referring to Figure 5 , the hardware structure for the calculation of the equivalent low-temperature chronology test age may include: at least one processor 31, at least one communication interface 32, at least one memory 33, and at least one communication bus 34.

[0119] In the embodiments of the present application, the number of the processor 31, the communication interface 32, the memory 33, and the communication bus 34 is at least one, and the processor 31, the communication interface 32, and the memory 33 complete the communication with each other through the communication bus 34;

[0120] The processor 31 may be a central processing unit CPU, or a specific integrated circuit ASIC (Application Specific Integrated Circuit), or one or more integrated circuits configured to implement the embodiments of the present application, etc.;

[0121] The memory 33 may include a high-speed RAM memory, and may also include a non-volatile memory, etc., such as at least one disk memory;

[0122] Among them, the memory 33 stores a program, and the processor 31 can call the program stored in the memory 33. The program is used for:

[0123] Performing a random search using the Monte Carlo method to obtain N1 sets of thermal history curves of N1 samples on the target vertical section. Each set of thermal history curves includes N2 thermal history curves, where N1 and N2 are preset quantities;

[0124] Based on each target low-temperature chronology method, calculating the simulated ages of the thermal history curves to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method;

[0125] For each set of thermal history curves, screening the thermal history curves according to the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method and the age test values of the samples corresponding to the thermal history curves to obtain a set of screened thermal history curves;

[0126] Sampling and taking the mean value of each thermal history curve in each set of screened thermal history curves to obtain a target thermal history curve;

[0127] Based on the first low-temperature chronology method, calculating the simulated ages of the target thermal history curves to obtain the first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method, and based on the second low-temperature chronology method, calculating the simulated ages of the target thermal history curves to obtain the second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method;

[0128] For each target thermal history curve, an equivalent test age of the target thermal history curve with respect to the second low-temperature chronology method is calculated based on the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method.

[0129] Optionally, the refinement function and the extension function of the program can be referred to the above description.

[0130] The embodiment of the present application further provides a storage medium, which can store a program suitable for execution by a processor, and the program is used for:

[0131] Using the Monte Carlo method for random search to obtain N1 sets of thermal history curves of N1 samples on the target vertical section, each set of thermal history curves includes N2 thermal history curves, and N1 and N2 are preset quantities;

[0132] Based on each target low-temperature chronology method, calculate the simulated ages of each thermal history curve to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method;

[0133] For each set of thermal history curves, according to the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve, screen the thermal history curves to obtain a set of screened thermal history curves;

[0134] Sample and take the average value of each thermal history curve in each set of screened thermal history curves to obtain a target thermal history curve;

[0135] Based on the first low-temperature chronology method, calculate the simulated ages of each target thermal history curve to obtain the first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method, and based on the second low-temperature chronology method, calculate the simulated ages of each target thermal history curve to obtain the second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method;

[0136] For each target thermal history curve, an equivalent test age of the target thermal history curve with respect to the second low-temperature chronology method is calculated based on the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method.

[0137] Optionally, the refinement function and the extension function of the program can be referred to the above description.

[0138] In summary:

[0139] In this application, the Monte Carlo method is first used for random search to obtain N1 sets of thermal history curves of N1 samples on the target vertical section. Each set of thermal history curves includes N2 thermal history curves, where N1 and N2 are preset quantities. It can be understood that the more thermal history curves obtained by random search, the easier it is to find thermal history curves closer to the real ones. Then, based on each target low-temperature chronology method, the simulated ages of each thermal history curve are calculated to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method. Next, for each thermal history curve, according to the simulated age of the thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve, the thermal history curve is screened to obtain a set of candidate thermal history curves, and the set of candidate thermal history curves includes N1 sets of thermal history curves. Through the above screening, some thermal history curves with more serious distortion can be discarded. Then, each set of thermal history curves in the set of candidate thermal history curves is sampled and averaged to obtain N1 target thermal history curves. Then, based on the first low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the first simulated ages of each target thermal history curve corresponding to the first low-temperature chronology method, and based on the second low-temperature chronology method, the simulated ages of each target thermal history curve are calculated to obtain the second simulated ages of each target thermal history curve corresponding to the second low-temperature chronology method. Finally, for each target thermal history curve, according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method, the equivalent test age of the target thermal history curve relative to the second low-temperature chronology method is calculated. By applying the test values and simulated values of different low-temperature chronology methods to the same set of thermal history curves, this application realizes data comparison between various low-temperature chronology methods, and calculates the test equivalent value without the need to conduct tests using the second low-temperature chronology method, reducing the experimental cost.

[0140] Finally, it should also be noted that in this text, relational terms such as first and second are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the term "comprising", "including" or any other variant thereof is intended to cover non-exclusive inclusion, so that a process, method, article or device comprising a series of elements not only includes those elements but also includes other elements not expressly listed, or also includes elements inherent to such process, method, article or device. Without further limitation, an element defined by the statement "comprising an..." does not exclude the presence of additional identical elements in the process, method, article or device comprising said element.

[0141] The various embodiments in this specification are described in a progressive manner. Each embodiment focuses on the differences from other embodiments. The various embodiments can be combined as needed, and the same or similar parts can be referred to each other.

[0142] The above description of the disclosed embodiments enables those skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Therefore, the present application will not be limited to these embodiments shown herein, but will be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. A calculation method for the equivalent low-temperature chronology test age, characterized in that, Including: Using the Monte Carlo method for random search to obtain N1 sets of thermal history curves of N1 samples on the target vertical section, each set of thermal history curves including N2 thermal history curves, where N1 and N2 are preset quantities; Based on each target low-temperature chronology method, calculating the simulated ages of the thermal history curves to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method; For each set of thermal history curves, screening the thermal history curves according to the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method and the age test values of the samples corresponding to the thermal history curves to obtain a set of screened thermal history curves; Sampling and taking the average of each thermal history curve in each set of screened thermal history curves to obtain a target thermal history curve; Based on the first low-temperature chronology method, calculating the simulated ages of the target thermal history curves to obtain the first simulated ages of the target thermal history curves corresponding to the first low-temperature chronology method, and based on the second low-temperature chronology method, calculating the simulated ages of the target thermal history curves to obtain the second simulated ages of the target thermal history curves corresponding to the second low-temperature chronology method; wherein, the first low-temperature chronology method and the second low-temperature chronology method are different low-temperature chronology methods among the target low-temperature chronology methods, and each target low-temperature chronology method includes the U-Th / He age simulation method and the fission track age simulation method; For each target thermal history curve, calculating the equivalent test age of the target thermal history curve relative to the second low-temperature chronology method according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method.

2. The method according to claim 1, characterized in that, The process of using the Monte Carlo method for random search to obtain N1 sets of thermal history curves of N1 samples on the target vertical section includes: Taking one of the samples on the target vertical section as a reference sample and using the Monte Carlo method for random search to obtain N2 thermal history curves of the reference sample; For each of the other samples on the target vertical section: According to the height difference relationship between each of the other samples and the reference sample, based on the paleogeothermal gradient function and combining the N2 thermal history curves of the reference sample, calculating N2 thermal history curves of each of the other samples.

3. The method according to claim 1, wherein The process of calculating the simulated ages of the thermal history curves based on each target low-temperature chronology method to obtain the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method includes: Respectively based on the U-Th / He age simulation method and the fission track age simulation method, calculating the simulated ages of the thermal history curves to obtain the U-Th / He simulated ages and fission track simulated ages of the thermal history curves.

4. The method according to claim 1, wherein The process of screening the thermal history curves for each set of thermal history curves according to the simulated ages of each thermal history curve corresponding to each target low-temperature chronology method and the age test values of the samples corresponding to the thermal history curves includes: For each thermal history curve in each set of thermal history curves: Calculate the goodness of fit between the simulated age corresponding to each target low-temperature chronology method of the thermal history curve and the age test value of the sample corresponding to the thermal history curve; Compare the goodness of fit with a preset goodness-of-fit value, and determine whether to retain the thermal history curve according to the comparison result.

5. The method according to claim 4, wherein The process of calculating the goodness of fit between the simulated age corresponding to each target low-temperature chronology method of the thermal history curve and the age test value of the sample corresponding to the thermal history curve includes: Use the following equation to calculate the goodness of fit GOF of each thermal history curve of the sample: where age is the simulated age corresponding to each thermal history curve, is the average error of the age test values of the samples on the target vertical section, is the average difference between the simulated age and the age test values of the samples on the target vertical section.

6. The method according to claim 1, characterized in that The process of sampling and averaging each thermal history curve in each set of filtered thermal history curves to obtain a target thermal history curve includes: For each set of filtered thermal history curves: Determine N3 time sampling points, and average the values of each thermal history curve at each time sampling point to obtain the average temperature at each time sampling point; Based on the time values of each time sampling point and the average temperature corresponding to each time sampling point, determine a target thermal history curve corresponding to the set.

7. The method according to claim 1, characterized in that For each target thermal history curve, the process of calculating the equivalent test age of the target thermal history curve relative to the second low-temperature chronology method according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method includes: Calculate the equivalent test age B1 of the target thermal history curve relative to the second low-temperature chronology method according to the following equation: Among them, A m and B m are the first simulated age and the second simulated age respectively, A1 is the age test value, and σ A is the preset first test error, and σ B is the second test error.

8. A calculation device for the equivalent low-temperature chronology test age, characterized in that, Includes: A random search unit for using the Monte Carlo method to perform random search to obtain N1 sets of thermal history curves of N1 samples on a target vertical section, each set of thermal history curves including N2 thermal history curves, where N1 and N2 are preset quantities; A first simulation unit for calculating the simulated age of each thermal history curve based on each target low-temperature chronology method to obtain the simulated age of each thermal history curve corresponding to each target low-temperature chronology method; A comparison and screening unit for screening each thermal history curve in each set of thermal history curves according to the simulated age of each thermal history curve corresponding to each target low-temperature chronology method and the age test value of the sample corresponding to the thermal history curve to obtain a set of filtered thermal history curves; A thermal history determination unit for sampling and averaging each thermal history curve in each set of filtered thermal history curves to obtain a target thermal history curve; A second simulation unit, configured to calculate the simulated ages of each target thermal history curve based on a first low-temperature chronology method, so as to obtain a first simulated age of each target thermal history curve corresponding to the first low-temperature chronology method, and calculate the simulated ages of each target thermal history curve based on a second low-temperature chronology method, so as to obtain a second simulated age of each target thermal history curve corresponding to the second low-temperature chronology method; wherein, the first low-temperature chronology method and the second low-temperature chronology method are different low-temperature chronology methods among each target low-temperature chronology method, and each target low-temperature chronology method includes a U-Th / He age simulation method and a fission track age simulation method; An equivalent calculation unit, configured to calculate, for each target thermal history curve, an equivalent test age of the target thermal history curve relative to the second low-temperature chronology method according to the first simulated age of the target thermal history curve corresponding to the first low-temperature chronology method, the second simulated age of the target thermal history curve corresponding to the second low-temperature chronology method, and the age test value of the target thermal history curve corresponding to the first low-temperature chronology method.

9. A calculation device for the equivalent low-temperature chronology test age, characterized in that, Comprising: A memory and a processor; The memory is configured to store a program; The processor is configured to execute the program to implement each step of the calculation method for the equivalent low-temperature chronology test age as described in any one of claims 1 to 7.

10. A storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, each step of the calculation method for the equivalent low-temperature chronology test age as described in any one of claims 1 to 7 is implemented.

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