A method for detecting quality defects of cold storage insulation walls

Abstract

The present invention relates to the field of thermal insulation wall health monitoring and discloses a device for detecting quality defects in thermal insulation walls of a freezer, comprising a wall fixedly connected to a mounting base, the mounting base consisting of a fast conduction zone and a slow conduction zone, the surfaces of which are provided with temperature sensing optical fibers. This method for detecting quality defects in thermal insulation walls of a freezer uses the fast conduction zone and the slow conduction zone to regularly change the temperature within each detection unit, dividing the unit into multiple independent detection groups based on the temperature change pattern, and further dividing the data into a number of rows. Abnormal temperature points are located using the detection unit-row number-numeric serial number. Compared to directly determining the position based on the optical fiber length and marking, this detection method is less affected by factors such as changes in the physical length of the optical fiber, coordinate marking errors, and the accumulation of positioning errors of the signal demodulator, and thus has higher positioning accuracy.

Description

Technical Field

[0001] The present invention relates to the technical field of thermal insulation wall health detection, and in particular to a method for detecting quality defects of thermal insulation walls of a freezer. Background Art

[0002] With the development of modern logistics, large-scale cold storage facilities are widely used as important storage facilities for food, fruits and vegetables, medicine, and other industrial materials that require refrigeration. In the early stages of operation, large cold storage facilities typically have low energy consumption. However, as they age, the function of the cold storage walls weakens, and the cold storage energy consumption increases year by year, leading to increased operating costs and reduced corporate profits. Limited by the lack of means to detect abnormalities in the insulation walls, timely "minimally invasive" maintenance of these abnormalities is impossible. Allowing abnormalities to spread significantly shortens the lifespan of the insulation walls and the service life of the cold storage. Traditional cold storage renovations typically involve completely replacing the insulation walls when energy consumption increases to the point where operation is no longer economical. However, this approach often severely impacts the cold storage's daily operations and is costly. Currently, there is an urgent need for tools and methods to monitor abnormalities in cold storage walls to enable minimally invasive maintenance. Summary of the Invention

[0003] In response to the shortcomings of the above-mentioned background technology, the present invention provides a technical solution for a method for detecting quality defects of the insulation wall of a cold storage. The temperature in each detection unit is changed regularly through the fast conduction zone and the slow conduction zone. According to the temperature change law, it is divided into multiple independent detection groups, and the data on one side is further located to a specific row number, and the data is further divided into several rows. The abnormal temperature point is located through the detection unit-row number-numerical number, which solves the problems raised by the background technology.

[0004] The present invention provides the following technical solution: a method for detecting quality defects in the insulation wall of a frozen storage, comprising a wall, wherein the wall is fixedly connected to a mounting base, the mounting base comprising a fast conduction zone and a slow conduction zone, temperature sensing optical fibers laid on the surfaces of the fast conduction zone and the slow conduction zone, temperature conduction in the fast conduction zone is faster than that in the slow conduction zone, a thermal insulation pad is mounted on the fast conduction zone via fixing bolts, the temperature sensing optical fibers are connected to a data processing unit, fast conduction zones are provided on both sides of each slow conduction zone, a slow conduction zone and the fast conduction zones on both sides thereof constitute a detection group, the temperature sensing optical fibers within the same group of fast conduction zones and slow conduction zones are distributed in an S-shape, the lengths of the slow conduction zones of every other group are the same, and the lengths of adjacent slow conduction zones differ by 2-3 times, and the temperature sensing optical fibers are closely attached to the insulation layer.

[0005] Preferably, the fast conduction area forms a depression toward the wall, and the slow conduction area forms a protrusion toward the insulation layer.

[0006] Preferably, a leveling cover plate is provided between the installation base and the thermal insulation layer, and the leveling cover plate presses the temperature sensing optical fiber.

[0007] Preferably, the fast conduction zone is connected to a thermal insulation pad, the thermal insulation pad and the fast conduction zone form a closed space, and the ends of the thermal insulation pad and the leveling cover plate are both inlaid with independent heat conduction blocks.

[0008] Preferably, each detection group is provided with an odd number of rows of temperature sensing optical fibers.

[0009] A method for detecting quality defects of a cold storage insulation wall, using the above-mentioned detection device to detect the insulation wall, comprises the following steps:

[0010] S1. As described above, place the mounting base, thermal insulation pad, temperature sensing optical fiber, and leveling cover in the cold storage and connect them to a data processing unit.

[0011] S2. Extract the temperature data in each detection group, and organize the values in each row of each detection group into an array a;

[0012] S3. Add array a of the same detection group to array A. The detection groups are numbered along the length of the optical fiber, and the numbers also serve as the sequence number of array A.

[0013] S4. When an abnormal temperature is detected, locate the ordinal number of array A where the abnormal temperature is located and the ordinal number of the value in array A, then locate the ordinal number of array a, and finally locate the ordinal number of value a;

[0014] S5. Locate the detection group where the abnormality occurs according to the sequence number of array A, determine the row of optical fibers where the abnormality occurs according to the sequence number of array a, locate the abnormal detection point according to the sequence number of value a, and finally locate the abnormal position.

[0015] Preferably, in step S2, the array a includes an array T and an array t, and the array T and the array t are obtained as follows:

[0016] Add the first temperature value to array t, and starting from the second temperature value, subtract the previous temperature value from the current temperature to obtain the temperature difference. When the temperature difference is less than the set value, add the value to array t. When the temperature difference is greater than the set value an odd number of times, add the value to array T of the current array s. When the temperature difference is greater than the set value an even number of times, add the value to array t in the next array a.

[0017] Preferably, in step S3, array A is obtained as follows:

[0018] After obtaining each array a, the number of elements in array T is compared with the number of elements in array T in the previous array a. If the ratio is less than the preset threshold, array a is added to the array A of the current sequence number. If it is an approximate integer multiple, it is added to the array A of the next sequence number. If it is another relationship, a temperature abnormality prompt is issued.

[0019] The present invention has the following beneficial effects:

[0020] 1. This method for detecting quality defects in the insulation walls of frozen storage facilities uses fast and slow conduction zones to regularly change the temperature within each detection unit. This method then divides the temperature into multiple independent detection groups based on the temperature variation pattern. The data is further divided into several rows, and the abnormal temperature point is located using the detection unit-row number-numeric sequence. Compared to directly determining the position based on the fiber length and marking, this detection method is less affected by factors such as changes in the physical length of the fiber, coordinate marking errors, and the accumulation of positioning errors of the signal demodulator, resulting in higher positioning accuracy.

[0021] 2. Compared with detecting abnormal temperature points through temperature sensors, this method of detecting quality defects of the cold storage insulation wall can directly find the approximate range of the defect area, and has higher positioning efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a structural schematic diagram of the present invention;

[0023] Figure 2 It is a side structural schematic diagram of the present invention;

[0024] Figure 3 This is a diagram showing the effect of the temperature sensing optical fiber after laying in the present invention.

[0025] In the figure: 1. Mounting base; 2. Fast conduction area; 3. Slow conduction area; 4. Thermal insulation pad; 5. Temperature sensing optical fiber; 6. Wall; 7. Insulation layer; 8. Leveling cover. DETAILED DESCRIPTION

[0026] The following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0027] See also Figure 1 and Figure 2A method for detecting quality defects of insulation walls of a cold storage, including a device for detecting quality defects of insulation walls of a cold storage, a device for detecting quality defects of insulation walls of a cold storage including a wall 6, which can be a wall, floor or ceiling of a cold storage, a mounting base 1 fixedly connected to the wall 6, the mounting base 1 can be fixed to the wall 6 by pasting or pinning, the mounting base 1 consists of a fast conduction area 2 and a slow conduction area 3, the length of the slow conduction area 3 is 2-5 times the length of the fast conduction area 2, temperature sensing optical fibers 5 are laid on the surfaces of the fast conduction area 2 and the slow conduction area 3, the temperature sensing optical fibers 5 can be fixed on the surfaces of the fast conduction area 2 and the slow conduction area 3 by fixing buckles, structural adhesive or durable tape, the temperature of the fast conduction area 2 is conducted faster than that of the slow conduction area 3, and the fast conduction area 2 is more affected by external factors. The temperature sensing optical fiber 5 located on the fast conduction zone 2 measures a higher temperature, while the temperature sensing optical fiber 5 located on the surface of the slow conduction zone 3 measures a relatively lower temperature. The thermal insulation pad 4 is mounted on the fast conduction zone 2 using fixing bolts to ensure the necessary compression to achieve thermal insulation. The temperature sensing optical fiber 5 is connected to a data processing unit. Fast conduction zones 2 are provided on both sides of each slow conduction zone 3. A slow conduction zone 3 and the fast conduction zones 2 on both sides of it constitute a detection group. The temperature sensing optical fibers 5 within the same group of fast conduction zones 2 and slow conduction zones 3 are distributed in an S-shape. The lengths of every other group of slow conduction zones 3 are the same, while the lengths of adjacent slow conduction zones 3 differ by 2-3 times. The temperature sensing optical fibers 5 are closely attached to the thermal insulation layer 7. When the thermal insulation layer 7 has defects, the temperature sensing optical fibers 5 closely attached to the thermal insulation layer 7 detect low temperatures.

[0028] The fast conduction zone 2 is recessed toward the wall 6, and the slow conduction zone 3 is raised toward the insulation layer 7. The fast conduction zone 2 and the slow conduction zone 3 are made of the same material. However, since the fast conduction zone 2 is relatively thin and the temperature transfer is relatively fast, the fast conduction zone 2 is greatly affected by the external environment, resulting in a significant temperature difference between the fast conduction zone 2 and the slow conduction zone 3.

[0029] A leveling cover plate 8 is provided between the mounting base 1 and the thermal insulation layer 7 , and the leveling cover plate 8 presses the temperature sensing optical fiber 5 to ensure that the contact surface with the thermal insulation layer 7 is flat.

[0030] Among them, the fast conduction zone 2 is connected to the thermal insulation pad 4, and the thermal insulation pad 4 and the fast conduction zone 2 form a closed space to reduce the temperature in the fast conduction zone 2 from leaking into the slow conduction zone 3. The ends of the thermal insulation pad 4 and the leveling cover plate 8 are both inlaid with independent heat-conducting blocks. On the one hand, the temperature of the insulation layer 7 can be quickly transferred to the temperature sensing optical fiber 5, while at the same time avoiding mutual heat leakage and affecting the detection accuracy.

[0031] See also Figure 3 , wherein, each detection group is provided with an odd number of rows of temperature sensing optical fibers 5 to ensure entry from one side and exit from the other side.

[0032] A method for detecting quality defects of a cold storage insulation wall, using the above-mentioned detection device to detect the insulation wall, comprises the following steps:

[0033] S1. As described above, the mounting base 1, thermal insulation pad 4, temperature sensing optical fiber 5, and leveling cover plate 8 are arranged in the cold storage and connected to the data processing unit. Temperature data between the wall 6 and the insulation layer 7 are obtained at equal intervals along the length of the temperature sensing optical fiber 5 and transmitted to the data processing unit.

[0034] S2. Extract the temperature data in each detection group and organize the values of each row in each detection group into an array a; determine the approximate location of the abnormal detection point by the row number and ordinal number of the data;

[0035] S3. Add the array a of each detection group to array A. The detection groups are numbered along the length of the optical fiber, and the numbers also serve as the sequence numbers of array A.

[0036] S4. When an abnormal temperature is detected, locate the ordinal number of array A where the abnormal temperature is located and the ordinal number of the value in array A, locate the ordinal number of array a, and finally locate the ordinal number of value a;

[0037] S5. Locate the detection group where the abnormality occurs according to the sequence number of array A, determine the row of optical fibers where the abnormality occurs according to the sequence number of array a, locate the abnormal detection point according to the sequence number of value a, and finally locate the abnormal position.

[0038] In step S3, array a includes array T and array t, and array T and array t are obtained as follows:

[0039] Add the first temperature value to array t, and starting from the second temperature value, subtract the previous temperature value from the current temperature to obtain the temperature difference. When the temperature difference is less than the set value, add the value to array t. When the temperature difference is greater than the set value an odd number of times, add the value to array T of the current array s. When the temperature difference is greater than the set value an even number of times, add the value to array t in the next array a.

[0040] See also Figure 3 , along the length of the fiber and collecting temperature changes, obtain the array:

[0041] a1:[{t11},{t12},{T11},{T12},{T13},{T14},{T15},{T16}];

[0042] a2:

[0043] [{t21},{t22},{t23},{t24},{T11},{T12},{T13},{T14},{T15},{T16}];

[0044] …….

[0045] Repeat the above process to obtain array a and each temperature value of array a.

[0046] In step S3, array A is obtained as follows:

[0047] After obtaining each array a, compare the number of elements in array T with the number of elements in array T in the previous array a. If they are similar, add array a to the array A of the current sequence number. If they are approximately integer multiples, add them to the array A of the next sequence number. If they are other relationships, the temperature is abnormal.

[0048] Since the lengths of adjacent slow conduction regions 3 are integer multiples, whether to enter the next sequence detection group is determined by the number s of data in the array a.

[0049] It should be noted that, in this document, relational terms such as first and second, etc., are used only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any actual relationship or order between these entities or operations. Moreover, the terms "comprises," "comprising," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that includes a list of elements includes not only those elements but also other elements not explicitly listed, or elements inherent to such process, method, article, or apparatus.

[0050] While embodiments of the present invention have been shown and described, it will be appreciated by those skilled in the art that various changes, modifications, substitutions, and variations may be made to these embodiments without departing from the principles and spirit of the invention, and that the scope of the invention is defined by the appended claims and their equivalents.

Claims

1. A method for detecting quality defects of a cold storage insulation wall, comprising a cold storage insulation wall quality defect detection device, the cold storage insulation wall quality defect detection device comprising a wall (6), the wall (6) being fixedly connected to a mounting base (1), the mounting base (1) being composed of a fast conduction area (2) and a slow conduction area (3), the surfaces of the fast conduction area (2) and the slow conduction area (3) being paved with temperature sensing optical fibers (5), the temperature of the fast conduction area (2) being conducted faster than that of the slow conduction area (3), and a heat insulation pad (4) being mounted by fixing bolts. On the fast conduction zone (2), the temperature sensing optical fiber (5) is connected to a data processing unit. Fast conduction zones (2) are provided on both sides of each slow conduction zone (3). One slow conduction zone (3) and the fast conduction zones (2) on both sides thereof constitute a detection group. The temperature sensing optical fibers (5) in the same group of fast conduction zones (2) and slow conduction zones (3) are distributed in an S-shape. The lengths of the slow conduction zones (3) of every other group are the same, and the lengths of adjacent slow conduction zones (3) differ by 2-3 times. The temperature sensing optical fibers (5) are closely attached to a thermal insulation layer (7). When testing the insulation wall, the following steps are included: S1, arranging the mounting base (1), the thermal insulation pad (4), and the temperature sensing optical fiber (5) in a cold storage, and connecting them to a data processing unit; S2. Extract the temperature data in each detection group, and organize the values in each row of each detection group into an array a; S3. Add array a of the same detection group to array A. The detection groups are numbered along the length of the optical fiber, and the numbers also serve as the sequence number of array A. S4. When an abnormal temperature is detected, locate the ordinal number of array A where the abnormal temperature is located and the ordinal number of the value in array A, then locate the ordinal number of array a, and finally locate the ordinal number of value a; S5. Locate the detection group where the abnormality occurs according to the sequence number of array A, determine the row of optical fibers where the abnormality occurs according to the sequence number of array a, locate the abnormal detection point according to the sequence number of value a, and finally locate the abnormal position.

2. A method for detecting quality defects of a cold storage insulation wall according to claim 1, characterized in that: The fast conduction area (2) forms a depression toward the wall (6), and the slow conduction area (3) forms a protrusion toward the insulation layer (7).

3. A method for detecting quality defects of a cold storage insulation wall according to claim 2, characterized in that: A leveling cover plate (8) is provided between the installation base (1) and the thermal insulation layer (7), and the leveling cover plate (8) presses the temperature sensing optical fiber (5).

4. A method for detecting quality defects of a cold storage insulation wall according to claim 3, characterized in that: The fast conduction zone (2) is connected to a heat insulating pad (4), the heat insulating pad (4) and the fast conduction zone (2) form a closed space, and the ends of the heat insulating pad (4) and the leveling cover plate (8) are both inlaid with mutually independent heat conducting blocks.

5. The method for detecting quality defects of a cold storage insulation wall according to claim 1, characterized in that: An odd number of rows of temperature sensing optical fibers (5) are provided in each detection group.

6. The method for detecting quality defects of a cold storage insulation wall according to claim 1, characterized in that: In step S2, the array a includes array T and array t, and the array T and array t are obtained as follows: Add the first temperature value to array t, and starting from the second temperature value, subtract the previous temperature value from the current temperature to obtain the temperature difference. When the temperature difference is less than the set value, add the value to array t. When the temperature difference is greater than the set value an odd number of times, add the value to array T of the current array s. When the temperature difference is greater than the set value an even number of times, add the value to array t in the next array a.

7. A method for detecting quality defects of a cold storage insulation wall according to claim 6, characterized in that: In step S3, array A is obtained as follows: After obtaining each array a, the number of elements in array T is compared with the number of elements in array T in the previous array a. If the ratio is less than the preset threshold, array a is added to the array A of the current sequence number. If it is an approximate integer multiple, it is added to the array A of the next sequence number. If it is another relationship, a temperature abnormality prompt is issued.

Images