Infrared detector correction method, device, equipment and readable storage medium

Abstract

The application discloses an infrared detector correction method, device, equipment and readable storage medium. The method comprises the following steps: determining a target pixel value corresponding to a pixel point of an infrared detector; acquiring a current pixel value output by the pixel point of the infrared detector; judging whether a difference between the current pixel value and the target pixel value is less than a preset threshold; if the difference is not less than the preset threshold, calculating an average pixel value of the current pixel value and the target pixel value, correcting an OCC parameter in the infrared detector by using the average pixel value, so that a difference between a pixel value output by a pixel point corresponding to the OCC parameter and the target pixel value is smaller, acquiring a new current pixel value output by the pixel point of the infrared detector, and judging whether a difference between the new current pixel value and the target pixel value is less than the preset threshold until the difference between the current pixel value and the target pixel value is less than the threshold. It can be seen that the infrared detector correction method improves the convergence speed and saves the correction time.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of detectors, and more particularly to an infrared detector correction method, device, equipment and readable storage medium. BACKGROUND

[0002] Due to the preparation process, manufacturing method, manufacturing material and manufacturing cost of the infrared detector, the pixel values output by each pixel point in the pixel point array of the infrared detector are quite different. In the infrared imaging system, the infrared image is generated according to the pixel values output by each pixel point. Therefore, the difference between the pixel values output by each pixel point in the pixel point array of the infrared detector seriously affects the imaging quality of the infrared image. In order to solve the above problem, the prior art attempts to adjust the OCC parameter (correction parameter) of the infrared detector to adjust the resistance corresponding to each pixel point in the infrared detector. The pixel value output by each pixel point will change with the change of the resistance, so as to adjust the pixel value output by each pixel point in the pixel point array of the infrared detector.

[0003] However, in the process of correcting the OCC parameter in the prior art, the OCC parameter is constantly increased by 1. The convergence time is long, and the time is long, so as to reduce the production efficiency of the infrared detector.

[0004] In summary, there is an urgent need for an infrared detector correction method to solve the problem of long convergence time and long time in the correction process of the prior art, which reduces the production efficiency of the infrared detector. SUMMARY

[0005] Therefore, the present application provides an infrared detector correction method, device, equipment and readable storage medium to solve the problem of long convergence time and long time in the correction process of the prior art, which reduces the production efficiency of the infrared detector.

[0006] In order to achieve the above purpose, the present application is as follows:

[0007] An infrared detector correction method comprises:

[0008] determining a target pixel value corresponding to a pixel point of an infrared detector;

[0009] obtaining a current pixel value output by the pixel point of the infrared detector;

[0010] determining whether the difference between the current pixel value and the target pixel value is less than a preset threshold value;

[0011] If the difference is not less than the preset threshold, an average pixel value of the current pixel value and the target pixel value is calculated, and the OCC parameter in the infrared detector is corrected by using the average pixel value, so that the difference between the pixel value output by the OCC parameter corresponding pixel point and the target pixel value is reduced, a new current pixel value output by the pixel point of the infrared detector is obtained, and whether the difference between the new current pixel value and the target pixel value is less than a preset threshold is determined until the difference between the current pixel value and the target pixel value is less than the threshold.

[0012] Optionally, the calculating the average pixel value of the current pixel value and the target pixel value and the correcting the OCC parameter in the infrared detector by using the average pixel value comprise:

[0013] The calculating the average pixel value of the current pixel value and the target pixel value and the correcting the OCC parameter in the infrared detector by using the average pixel value comprise:

[0014] Optionally, the number of bits of the pixel value output by the pixel point is the same as the number of bits of the OCC parameter of the infrared detector.

[0015] The calculating the average pixel value of the current pixel value and the target pixel value and the correcting the OCC parameter in the infrared detector by using the average pixel value comprise:

[0016] The calculating the average pixel value of the current pixel value and the target pixel value and the correcting the OCC parameter in the infrared detector by using the average pixel value comprise:

[0017] Optionally, the number of bits of the pixel value output by the pixel point is not the same as the number of bits of the OCC parameter of the infrared detector.

[0018] The calculating the average pixel value of the current pixel value and the target pixel value and the correcting the OCC parameter in the infrared detector by using the average pixel value comprise:

[0019] The calculating the average pixel value of the current pixel value and the target pixel value and the correcting the OCC parameter in the infrared detector by using the average pixel value comprise:

[0020] The calculating the average pixel value of the current pixel value and the target pixel value and the correcting the OCC parameter in the infrared detector by using the average pixel value comprise:

[0021] Optionally, the obtaining the current pixel value output by the pixel point of the infrared detector comprises:

[0022] calculating and obtaining a total pixel mean value of current outputs of the pixel point array of the infrared detector;

[0023] judging whether a difference between the current pixel value and the target pixel value is less than a preset threshold value, comprising:

[0024] judging whether a difference between the total pixel mean value and the target pixel value is less than a preset threshold value;

[0025] calculating a mean pixel value of the current pixel value and the target pixel value, and correcting an OCC parameter in the infrared detector by using the mean pixel value, comprising:

[0026] calculating a total mean value of the total pixel mean value and the target pixel value, and correcting an OCC parameter related to the total pixel mean value in the entire OCC array of the infrared detector by using the total mean value.

[0027] Optionally, the current pixel value of the output of the pixel point of the infrared detector is obtained, comprising:

[0028] calculating and obtaining a pixel column mean value of current outputs of each column of pixel points in the pixel point array of the infrared detector;

[0029] judging whether a difference between the current pixel value and the target pixel value is less than a preset threshold value, comprising:

[0030] judging whether a difference between each pixel column mean value and the target pixel value is less than a preset threshold value;

[0031] calculating a mean pixel value of the current pixel value and the target pixel value, and correcting an OCC parameter in the infrared detector by using the mean pixel value, comprising:

[0032] calculating a column mean value of the pixel column mean value and the target pixel value, and correcting an OCC parameter related to the pixel column mean value in the entire OCC array of the infrared detector by using the column mean value corresponding to the pixel column mean value.

[0033] Optionally, the current pixel value of the output of the pixel point of the infrared detector is obtained, comprising:

[0034] obtaining a pixel value of a current output of each pixel point in the pixel point array of the infrared detector;

[0035] judging whether a difference between the current pixel value and the target pixel value is less than a preset threshold value, comprising:

[0036] judging whether a difference between a pixel value of a current output of each pixel point and the target pixel value is less than a preset threshold value;

[0037] calculating an average pixel value of the current pixel value and the target pixel value, and correcting the OCC parameter in the infrared detector by using the average pixel value, including:

[0038] calculating an average value of the pixel value output by the pixel point and the target pixel value, and correcting the OCC parameter related to the pixel point in the entire OCC array of the infrared detector by using the average value corresponding to the pixel point.

[0039] Optionally, the current pixel value output by the pixel point of the infrared detector is obtained, including:

[0040] obtaining the current pixel value output by the pixel point of the infrared detector at the current temperature;

[0041] After the OCC parameter in the infrared detector is corrected by using the average pixel value, the method further includes:

[0042] establishing a corresponding relationship between the temperature value of the current temperature and the corrected OCC parameter, and storing the corresponding relationship in the infrared detector.

[0043] An infrared detector correction device, including:

[0044] A determining unit is configured to determine a target pixel value corresponding to a pixel point of an infrared detector;

[0045] An obtaining unit is configured to obtain a current pixel value output by the pixel point of the infrared detector;

[0046] A judging unit is configured to judge whether a difference between the current pixel value and the target pixel value is less than a preset threshold value;

[0047] A correcting unit is configured to, if the difference is not less than the preset threshold value, calculate an average pixel value of the current pixel value and the target pixel value, and correct the OCC parameter in the infrared detector by using the average pixel value, so that a difference between a pixel value output by a pixel point corresponding to the OCC parameter and the target pixel value is reduced, obtain a new current pixel value output by the pixel point of the infrared detector, and judge whether a difference between the new current pixel value and the target pixel value is less than the preset threshold value, until the difference between the current pixel value and the target pixel value is less than the threshold value.

[0048] An infrared detector correction device, including a memory and a processor;

[0049] The memory is configured to store a program;

[0050] The processor is configured to execute the program, and implement each step of the infrared detector correction method.

[0051] A readable storage medium, which stores a computer program, the computer program is executed by a processor to realize each step of the voice input method.

[0052] From the above technical solution can be seen, the correction is to let the same infrared detector each pixel output data is basically the same, thus, the infrared detector correction method provided by the present application, first by determining the infrared detector pixel point corresponding to the target pixel value, so, can determine the target after the correction to be achieved; can obtain the pixel value of the pixel point output by the infrared detector, so, can determine the current pixel value of the infrared detector; At this time, can determine whether the difference between the current output pixel value and the target pixel value is too large, that is, whether the difference between the pixel value and the target pixel value is less than the preset threshold; If the difference is not less than the preset threshold, calculate the average pixel value of the pixel value and the target pixel value, and correct the OCC parameter in the infrared detector using the average pixel value, so that the pixel value output by the pixel point corresponding to the OCC parameter is close to the target pixel value, return to execute the acquisition of the pixel value output by the pixel point of the infrared detector, until the difference between the pixel value and the target pixel value is less than the threshold, so, in the present application, the OCC parameter does not need to be corrected step by step, but directly corrected according to the average value, which improves the convergence speed and saves the correction time.

[0053] In addition, the OCC parameter is continuously corrected using the average value of the real output pixel value of the infrared detector and the target pixel value, which realizes that the OCC parameter is continuously corrected based on the output data of the infrared detector in the correction process, so that the correction result is more accurate. BRIEF DESCRIPTION OF DRAWINGS

[0054] In order to more clearly illustrate the technical solutions in the embodiments of the present application or the prior art, the drawings needed in the embodiment or prior art description will be briefly introduced below. Obviously, the drawings in the following description are only embodiments of the present application, and those skilled in the art can obtain other drawings according to the provided drawings without creating any creative labor.

[0055] Figure 1 A flow chart of the infrared detector correction method disclosed by the present application;

[0056] Figures 2a-2b A comparison chart before and after correction disclosed by the present application;

[0057] Figure 3 A structure block diagram of the infrared detector correction device disclosed by the present application;

[0058] Figure 4A hardware structure block diagram of an infrared detector correction device disclosed in the application. DETAILED DESCRIPTION

[0059] The technical solutions in the embodiments of the application will be clearly and completely described in connection with the drawings in the embodiments of the application. Obviously, the described embodiments are only part of the embodiments of the application, rather than all the embodiments of the application. Based on the embodiments in the application, all other embodiments obtained by a person of ordinary skill in the art without creative effort belong to the protection scope of the application.

[0060] Next, the hardware structure of the infrared detector correction device disclosed in the application will be described in detail. Figure 1 The infrared detector correction method disclosed in the application will be described in detail, including the following steps.

[0061] Step S1, determining a target pixel value corresponding to a pixel point of an infrared detector.

[0062] Specifically, the brightness of an infrared image formed by an infrared imaging system is affected by the pixel value output by each pixel point of the infrared detector. Generally, the brightness is moderate, and the imaging quality of the infrared image is better. Therefore, the target pixel value corresponding to each pixel point of the infrared detector is generally the middle value of the pixel value range. For example, if the number of bits of the pixel value output by the pixel point is 8 bits, the target pixel value is generally 128.

[0063] However, different use scenarios have different requirements for the brightness of the infrared image, so the pixel value corresponding to the pixel point of the infrared detector can be determined according to the actual use scenario requirement. For example, if the brightness of the infrared image needs to be improved under the requirement of some use scenarios, if the number of bits of the pixel value output by the pixel point is 8 bits, the target pixel value can be determined as 255.

[0064] The target pixel values corresponding to the pixel points of the same infrared detector are the same.

[0065] Step S2, acquiring a current pixel value output by the pixel point of the infrared detector.

[0066] Specifically, there is an array of pixel points in the infrared detector, for example, there are 650*520 pixel points in a certain infrared detector. The current pixel value output by each pixel point in the array of the infrared detector can be acquired.

[0067] The pixel value output by the pixel point of the infrared detector equipped with the baffle at the current time can be acquired.

[0068] The number of bits of the pixel value output by each pixel point in the same infrared detector is the same.

[0069] Step S3, judging whether the difference between the current pixel value and the target pixel value is less than a preset threshold value.

[0070] Specifically, the specific size of the threshold value can be set in advance according to the requirements of the actual application scene, for example, if the actual application scene has low requirements, the size of the threshold value can be large, and for the same reason, if the actual application scene has high requirements for accuracy, the size of the threshold value can be small.

[0071] The difference between the pixel value obtained at the current time and the target pixel value can be calculated, and the difference is compared with the preset threshold value. When the difference is not less than the preset threshold value, it is considered that the OCC parameter in the current infrared detector needs to be corrected, and the infrared detector is not suitable for use in the actual application scene at this time.

[0072] Step S4, if the difference is not less than the preset threshold value, the average pixel value of the current pixel value and the target pixel value is calculated, and the OCC parameter in the infrared detector is corrected by using the average pixel value, so that the difference between the pixel value output by the pixel point corresponding to the OCC parameter and the target pixel value is reduced, and step S2 is returned.

[0073] Specifically, on-chip non-uniform correction (OCC), which is used for on-chip non-uniform correction when imaging the detector in the embodiment, and the OCC parameter is generally in binary form.

[0074] The average of the current pixel value and the target pixel value can be calculated, and the average is used as the average pixel value. The average pixel value is used as the basis to correct the OCC parameter in the infrared detector, so that the resistance value in the infrared detector changes, and the size of the output pixel value also changes with the change of the resistance value. In this way, the size of the pixel value can be adjusted, so that the difference between the pixel value output by the pixel point corresponding to the OCC parameter and the target pixel value is reduced.

[0075] Step S2 can be returned to obtain the new current pixel value output by the pixel point of the infrared detector, and judge whether the difference between the new current pixel value and the target pixel value is less than the preset threshold value, until the difference between the current pixel value and the target pixel value is less than the threshold value.

[0076] From the above technical solution can be seen, the correction is to let the same infrared detector each pixel output data is basically the same, thus, the embodiment provides an infrared detector correction method, first by determining the infrared detector pixel point corresponding to the target pixel value, so, can determine the target to be achieved after correction; can obtain the pixel value output by the pixel point of the infrared detector, so, can determine the current pixel value of the infrared detector; At this time, it can be determined whether the difference between the current output pixel value and the target pixel value is too large, that is, whether the difference between the pixel value and the target pixel value is less than the preset threshold; If the difference is not less than the preset threshold, calculate the average pixel value of the pixel value and the target pixel value, and correct the OCC parameter in the infrared detector using the average pixel value, so that the pixel value output by the pixel point corresponding to the OCC parameter is close to the target pixel value, return to execute the acquisition of the pixel value output by the pixel point of the infrared detector, until the difference between the pixel value and the target pixel value is less than the threshold, so, in this application, the OCC parameter does not need to be corrected by gradually adding 1, but directly corrects the OCC parameter according to the average value, which improves the convergence speed and saves the correction time.

[0077] In addition, the average of the real output pixel value of the infrared detector and the target pixel value is used to correct the OCC parameter, which realizes that the OCC parameter is corrected based on the output data of the infrared detector during the correction process, so that the correction result is more accurate.

[0078] When the bit number of the OCC parameter and the pixel value of the infrared detector is 8 bits, the target pixel value can be set to 255. If the OCC parameter is corrected by gradually adding 1, the longest time consumption is that the OCC parameter needs to be gradually added from 0 to 1 until the OCC parameter is updated to 255. When the frame rate is 60HZ, at least 4.25 seconds are needed; If the infrared detector correction method provided by the present application is used, the longest time consumption is that the OCC parameter needs to be updated to 128, 192, 224, 240, 248, 252, 254, 255 respectively. When the frame rate is 60HZ, about 0.13s is needed. Compared with the above, the speed of the infrared detector correction method provided by the present application is improved by 33 times.

[0079] Referring to Figure 2a , Figure 2a The original image obtained when the infrared detector is not corrected. It can be found that when not corrected, the original image has irregular color blocks and poor uniformity, which is caused by the large difference between the pixel values output by each pixel point of the infrared detector when not corrected.

[0080] Figure 2bAfter the infrared detector is corrected using the infrared detector correction method provided in the present application, an image output by the corrected infrared detector can be obtained. It can be found that Figure 2b There is no color block in the middle, and the uniformity is good, indicating that the pixel values output by each pixel point of the corrected infrared detector are relatively uniform, and the imaging quality is good.

[0081] In some embodiments of the present application, the process of calculating the average pixel value of the current pixel value and the target pixel value in step S4 and correcting the OCC parameter in the infrared detector using the average pixel value is described in detail, and the specific steps are as follows:

[0082] S40, calculate the average pixel value of the current pixel value and the target pixel value, and determine and correct the OCC parameter using FPGA technology and the average pixel value.

[0083] Specifically, field programmable logic array (FPGA) technology can be used for correction of the infrared detector.

[0084] Based on FPGA technology and the average pixel value, the specific value of the OCC parameter can be determined, and the value of the OCC parameter in the infrared detector is updated to the determined specific value.

[0085] As can be seen from the above technical solution, compared with the previous embodiment, the present embodiment provides an optional way of determining and correcting the OCC parameter using FPGA technology and the average pixel value. FPGA technology has the characteristics of static reprogrammability and online dynamic reconfiguration, and the use of FPGA technology greatly improves the flexibility of the correction process.

[0086] Considering that there are various types of infrared detectors on the market, the specific correction process may not be the same for different types of infrared detectors. In some embodiments of the present application, existing infrared detectors are mainly divided into two categories. In the first category of infrared detectors, the number of bits of the pixel value output by the pixel point is the same as the number of bits of the OCC parameter of the infrared detector. In the second category of infrared detectors, the number of bits of the pixel value output by the pixel point is not the same as the number of bits of the OCC parameter of the infrared detector. Based on this, the process of determining and correcting the OCC parameter using FPGA technology and the average pixel value in step S40 is described in detail.

[0087] For the first type of infrared detector, the specific steps of step S40 are as follows:

[0088] S400, using FPGA technology, taking the average pixel value as the OCC parameter to adjust the resistance value of the infrared detector, so that the difference between the pixel value output by the OCC parameter corresponding pixel point and the target pixel value is smaller.

[0089] Specifically, the calculated average pixel value can be directly taken as the OCC parameter by using FPGA technology, and the resistance value corresponding to the pixel value in the infrared detector is adjusted by the OCC parameter, so that the pixel value output by the OCC parameter corresponding pixel point is close to the target pixel value.

[0090] For example, if the bit number of the pixel value and the OCC parameter in such infrared detector is 8 bits, the value range of the pixel value and the OCC parameter is consistent, so the average pixel value can be directly taken as the OCC parameter.

[0091] For the second type of infrared detector, the specific steps of step S40 are as follows:

[0092] S401, processing the average pixel value to make the bit number of the processed average pixel value same as the bit number of the OCC parameter.

[0093] Specifically, the average pixel value can be converted in bit number to obtain a converted average pixel value, and the bit number of the converted average pixel value is consistent with the bit number of the OCC parameter, for example, if the OCC parameter is 16 bits and the average pixel value is 8 bits, the 8-bit average pixel value can be converted to a 16-bit average pixel value.

[0094] S402, using FPGA technology, taking the processed average pixel value as the OCC parameter to adjust the resistance value of the infrared detector, so that the difference between the pixel value output by the OCC parameter corresponding pixel point and the target pixel value is smaller.

[0095] Specifically, the processed average pixel value can be directly taken as the OCC parameter by using FPGA technology, and the resistance value corresponding to the pixel value in the infrared detector is adjusted by the OCC parameter, so that the pixel value output by the OCC parameter corresponding pixel point is close to the target pixel value.

[0096] In addition, a corresponding relationship table between the pixel value and the OCC parameter can be established in advance, the OCC parameter corresponding to the average pixel value is found in the table, and the OCC parameter corresponding to the current pixel value is updated to the found OCC parameter.

[0097] No matter the bit number of the OCC parameter, the OCC parameter can adjust the size of the resistance value, and in the case that the resistance value range is determined, the OCC parameter with 16 bits can be used to adjust the size of the resistance value, and the OCC parameter with 8 bits can be used to adjust the size of the resistance value.

[0098] It can be seen from the above technical solution that the embodiment provides two optional ways of determining the OCC parameter, and specifically, different types of infrared detectors correspond to different ways of determining the OCC parameter. It can be seen that, by the embodiment, the specific size of the OCC parameter of the infrared detector can be determined for different types of infrared detectors, and the OCC parameter of the infrared detector can be better corrected.

[0099] It is considered that in the correction process, the average of each pixel value output by the pixel point array in the infrared detector can be controlled to achieve simple correction of the OCC parameter of the infrared detector, the average of each column of pixel values output by the pixel point array in the infrared detector can be controlled to achieve further correction of the OCC parameter of the infrared detector, and each pixel value output by the pixel point array in the infrared detector can be controlled to achieve accurate correction of the OCC parameter of the infrared detector. Based on this, in some embodiments of the present application, three different correction methods are proposed, and the specific process of the three methods will be described in detail.

[0100] Firstly, the average of each pixel value output by the pixel point array in the infrared detector is controlled to achieve simple correction of the OCC parameter of the infrared detector, and the specific process is as follows:

[0101] The process of step S2, obtaining the current pixel value output by the pixel point of the infrared detector, is described in detail, and the steps are as follows:

[0102] S20, the total pixel average value currently output by the pixel point array of the infrared detector is calculated and obtained.

[0103] Specifically, the current pixel value output by each pixel point in the pixel point array of the infrared detector can be obtained, the average of each current pixel value is calculated, and the average value calculated is taken as the total pixel average value.

[0104] On this basis, the process of step S3, judging whether the difference between the current pixel value and the target pixel value is less than the preset threshold, is described in detail, and the steps are as follows:

[0105] S30, judging whether the difference between the total pixel average value and the target pixel value is less than the preset threshold.

[0106] Specifically, the size of the threshold can be determined in advance according to the requirement of accuracy.

[0107] The difference between the total pixel mean value and the target pixel value can be calculated, and the size relationship between the difference and a preset threshold value is determined.

[0108] Based on this, the process of calculating the average pixel value of the current pixel value and the target pixel value in step S4 and correcting the OCC parameter in the infrared detector using the average pixel value is described in detail as follows:

[0109] S41, the total average value of the total pixel mean value and the target pixel value is calculated, and the OCC parameter related to the total pixel mean value in the entire OCC array of the infrared detector is corrected using the total average value.

[0110] Specifically, the average value of the total pixel mean value and the target pixel value can be calculated and used as the total average value, and the OCC parameter that can affect the size of the total pixel mean value in the entire OCC array is corrected based on the total average value.

[0111] If the number of bits of the pixel value output by each pixel point is the same as the number of bits of the OCC parameter, the total average value is directly used as the OCC parameter.

[0112] When the size relationship between the difference and the preset threshold value does not meet the stop correction condition, that is, the difference is not less than the threshold value, after step S41 is executed, step S20 can be returned to obtain a new total pixel mean value until the stop correction condition is met, that is, until the difference between the total pixel mean value and the target pixel value is not greater than the threshold value.

[0113] Secondly, the average value of each column of pixel values output by the pixel point array in the infrared detector is controlled to further correct the OCC parameter of the infrared detector, specifically as follows:

[0114] The process of obtaining the current pixel value output by the pixel point of the infrared detector in step S2 is described in detail as follows:

[0115] S21, the pixel column mean value of the current output of each column of pixel points in the pixel point array of the infrared detector is calculated.

[0116] Specifically, the current pixel value output by each column of pixel points in the pixel point array of the infrared detector is obtained, the average value of each current pixel value of each column is calculated, and the average value is used as the pixel column mean value corresponding to the column of pixel points.

[0117] Based on this, the process of determining whether the difference between the current pixel value and the target pixel value is less than a preset threshold value in step S3 is described in detail as follows:

[0118] S31, judging whether the difference between each pixel column mean value and the target pixel value is less than a preset threshold value.

[0119] Specifically, the difference between each pixel column mean value and the target pixel value is calculated, and the size relationship between the difference and the preset threshold value is judged, so as to determine whether the OCC parameter corresponding to each column pixel point needs to be corrected.

[0120] Based on this, the process of calculating the average pixel value of the current pixel value and the target pixel value in step S4, and correcting the OCC parameter in the infrared detector by using the average pixel value is described in detail, and the steps are as follows:

[0121] S42, calculating the column average value of the pixel column mean value and the target pixel value, and correcting the OCC parameter related to the pixel column mean value in the entire OCC array of the infrared detector by using the column average value corresponding to the pixel column mean value.

[0122] Specifically, if there is a pixel column mean value not less than the threshold value, the average value of the pixel column mean value and the target pixel value is calculated, the average value is taken as the column average value, and the OCC parameter is corrected based on the column average value, the OCC parameter being the parameter in the OCC array that can affect the size of the pixel column mean value.

[0123] When the size relationship between the difference and the preset threshold value does not meet the stop correction condition, i.e., the difference is not less than the threshold value, after step S42 is executed, new pixel column mean values are obtained, until the stop correction condition is met, i.e., until the difference between the pixel column mean value and the target pixel value is not greater than the threshold value.

[0124] When the difference corresponding to any pixel column mean value is not greater than the threshold value, the OCC parameter corresponding to the pixel column mean value can not be corrected, and only the OCC parameter corresponding to the pixel column mean value whose difference is greater than the threshold value is corrected.

[0125] The third is to control each pixel value output in the pixel point array of the infrared detector, so as to realize accurate correction of the OCC parameter of the infrared detector, and the specific steps are as follows:

[0126] The process of step S2, obtaining the current pixel value output by the pixel point of the infrared detector, is described in detail, and the steps are as follows:

[0127] S22, obtaining the current pixel value output by each pixel point in the pixel point array of the infrared detector.

[0128] Specifically, the current pixel value output by each pixel point in the pixel point array of the infrared detector is obtained, and the current pixel value is taken as the pixel value.

[0129] On this basis, the process of step S3, judging whether the difference between the current pixel value and the target pixel value is less than a preset threshold, is described in detail as follows:

[0130] S32, judging whether the difference between the current pixel value output by each pixel point and the target pixel value is less than a preset threshold.

[0131] Specifically, it is judged whether the OCC parameter corresponding to each pixel point needs to be corrected, and it is calculated whether the difference between each pixel point and the target pixel value is less than a threshold.

[0132] It should be noted that the thresholds in steps S30, S31 and S32 in the present application can be the same or different.

[0133] Based on this, the process of step S4, calculating the average pixel value of the current pixel value and the target pixel value, and correcting the OCC parameter in the infrared detector using the average pixel value, is described in detail as follows:

[0134] S43, calculating the average value of the pixel value output by the pixel point and the target pixel value, and correcting the OCC parameter related to the pixel point in the entire OCC array of the infrared detector using the average value corresponding to the pixel point.

[0135] When the difference between the pixel value and the target pixel value is not less than the threshold, the average value between the pixel value and the target pixel value is calculated, and the OCC parameter corresponding to the pixel point outputting the pixel value is corrected using the average value.

[0136] When the difference between any pixel value and the target pixel value is less than or equal to the threshold, the OCC parameter corresponding to the pixel value can not be corrected.

[0137] In addition, in some embodiments of the present application, the three correction methods described above can also be used simultaneously to correct the OCC parameter, that is, first, the first method is used to control the average value of each pixel value output by the pixel point array in the infrared detector, to achieve simple correction of the OCC parameter of the infrared detector, then the second method is used to control the average value of each column of pixel values output by the pixel point array in the infrared detector, to achieve further correction of the OCC parameter of the infrared detector, and finally the third method is used to control each pixel value output by the pixel point array in the infrared detector, to achieve accurate correction of the OCC parameter of the infrared detector, to perfect the entire correction process and further achieve correction of the infrared detector.

[0138] In some embodiments of the present application, the corrected OCC parameters are different in consideration of the non-use of the ambient temperature of the infrared detector, and thus the process of step S2 of acquiring the current pixel value of the pixel point output of the infrared detector is described in detail as follows:

[0139] S23, acquiring the current pixel value of the pixel point output of the infrared detector at the current temperature.

[0140] Specifically, the current pixel value of the pixel point output of the infrared detector at the current ambient temperature can be acquired without changing the ambient temperature.

[0141] And the OCC parameters in the infrared detector are corrected based on the current pixel value without changing the ambient temperature until the difference between the pixel value of the pixel point output of the infrared detector and the target pixel value is less than a threshold.

[0142] In the case that the ambient temperature has been corrected, the user can adjust the ambient temperature and repeat the correction process to obtain the OCC parameters corresponding to another ambient temperature.

[0143] The range of the ambient temperature can be determined according to the use environment of the infrared detector, and the adjusted ambient temperature value can be determined according to the accuracy requirement of the pixel value output by the pixel point array in the infrared detector. For example, if the use environment of the infrared detector is 35-37 degrees Celsius, the range of the ambient temperature is determined to be 35-37 degrees Celsius, and if the accuracy requirement of the pixel value output by the pixel point array in the infrared detector is high, the correction of the OCC parameters can be completed every one degree Celsius, i.e., the ambient temperature is adjusted to 35 degrees Celsius, the corresponding OCC parameters of 35 degrees Celsius are obtained after the correction is completed, the ambient temperature is adjusted to 36 degrees Celsius, the corresponding OCC parameters of 36 degrees Celsius are obtained after the correction is completed, the ambient temperature is adjusted to 37 degrees Celsius, and the corresponding OCC parameters of 37 degrees Celsius are obtained after the correction is completed.

[0144] If the requirement for the ambient temperature is not high, the correction can be completed every 10 degrees Celsius, or even only once when the requirement for the ambient temperature is low.

[0145] Therefore, in order to use the infrared detector directly at the ambient temperature after the correction is completed without re-correction, the corresponding relationship between the temperature value of the current temperature and the corrected OCC parameters can be established after the correction of step S4 is completed and stored in the infrared detector.

[0146] Specifically, the OCC parameter corresponding to each environment temperature can be stored in the infrared detector, and in subsequent use, the environment temperature can be determined first, and the OCC parameter matched with the environment temperature is called to realize one-time correction and multiple applications.

[0147] As can be seen from the above technical solutions, the infrared detector correction method provided by the embodiment can realize one-time correction and multiple applications, can improve efficiency and user experience. After one-time correction, the infrared detector can be applied multiple times, and in the application process, no baffle needs to be added in the infrared detector. Therefore, if the infrared detector has been corrected by using the infrared detector correction method provided by the present application before leaving the factory, the infrared detector leaving the factory can not contain a baffle, and cost can be saved.

[0148] The infrared detector correction device provided by the embodiment of the present application is described below, and the infrared detector correction device described below can be correspondingly referred to the infrared detector correction method described above.

[0149] Referring to Figure 3 , Figure 3 A structure block diagram of an infrared detector correction device disclosed by the embodiment of the present application is shown in the figure.

[0150] As Figure 3 shown, the device can include:

[0151] A determination unit 1 configured to determine a target pixel value corresponding to a pixel point of an infrared detector;

[0152] An acquisition unit 2 configured to acquire a current pixel value output by the pixel point of the infrared detector;

[0153] A judgment unit 3 configured to judge whether a difference between the current pixel value and the target pixel value is less than a preset threshold value;

[0154] A correction unit 4 configured to, if the difference is not less than the preset threshold value, calculate an average pixel value of the current pixel value and the target pixel value, correct an OCC parameter in the infrared detector by using the average pixel value, so that a difference between a pixel value output by a pixel point corresponding to the OCC parameter and the target pixel value becomes smaller, acquire a new current pixel value output by the pixel point of the infrared detector, and judge whether a difference between the new current pixel value and the target pixel value is less than a preset threshold value, until the difference between the current pixel value and the target pixel value is less than the threshold value.

[0155] Further, the correction unit can include:

[0156] The FPGA technology utilizes a subunit to calculate an average pixel value of the current pixel value and the target pixel value, and utilizes the FPGA technology and the average pixel value to determine and correct the OCC parameter.

[0157] Further, when the bit number of the pixel value output by the pixel point is the same as the bit number of the OCC parameter of the infrared detector, the FPGA technology utilizing subunit can include:

[0158] An OCC parameter determining subunit utilizes the FPGA technology to take the average pixel value as the OCC parameter, so as to adjust the resistance value of the infrared detector, and make the difference between the pixel value output by the pixel point corresponding to the OCC parameter and the target pixel value smaller.

[0159] Further, when the bit number of the pixel value output by the pixel point is not the same as the bit number of the OCC parameter of the infrared detector, the FPGA technology utilizing subunit can include:

[0160] A bit number processing subunit processes the average pixel value, so that the bit number of the processed average pixel value is the same as the bit number of the OCC parameter.

[0161] An OCC parameter correcting subunit utilizes the FPGA technology to take the processed average pixel value as the OCC parameter, so as to adjust the resistance value of the infrared detector, and make the difference between the pixel value output by the pixel point corresponding to the OCC parameter and the target pixel value smaller.

[0162] Further, the acquisition unit can include:

[0163] A total pixel mean calculating subunit calculates and obtains a total pixel mean output by the pixel point array of the infrared detector.

[0164] Based on this, the judging unit can include:

[0165] A difference calculating subunit judges whether the difference between the total pixel mean and the target pixel value is less than a preset threshold.

[0166] Based on this, the correcting unit can include:

[0167] A total average calculating subunit calculates a total average of the total pixel mean and the target pixel value, and utilizes the total average to correct the OCC parameter related to the total pixel mean in the entire OCC array of the infrared detector.

[0168] Further, the acquisition unit can include:

[0169] A pixel column mean value calculation subunit is configured to calculate a pixel column mean value of current output of each pixel column in the pixel array of the infrared detector.

[0170] Based on this, the judging unit can include:

[0171] A difference judging subunit is configured to judge whether a difference between each pixel column mean value and the target pixel value is less than a preset threshold value.

[0172] Based on this, the correcting unit can include:

[0173] A column mean value calculation subunit is configured to calculate a column mean value of the pixel column mean value and the target pixel value, and correct the OCC parameter related to the pixel column mean value in the entire OCC array of the infrared detector by using the column mean value corresponding to the pixel column mean value.

[0174] Further, the obtaining unit can include:

[0175] A pixel value obtaining subunit is configured to obtain a pixel value of current output of each pixel in the pixel array of the infrared detector.

[0176] Based on this, the judging unit can include:

[0177] A threshold value judging subunit is configured to judge whether a difference between the pixel value of current output of each pixel and the target pixel value is less than a preset threshold value.

[0178] Based on this, the correcting unit can include:

[0179] An average value calculation subunit is configured to calculate an average value of the pixel value of output of the pixel and the target pixel value, and correct the OCC parameter related to the pixel in the entire OCC array of the infrared detector by using the average value corresponding to the pixel.

[0180] Further, the obtaining unit can include:

[0181] A current pixel value collecting subunit is configured to obtain a current pixel value of output of the pixel in the infrared detector at a current temperature.

[0182] The infrared detector correcting device can further include:

[0183] An OCC parameter storage subunit is configured to establish a corresponding relationship between the temperature value of the current temperature and the corrected OCC parameter, and store the corresponding relationship in the infrared detector.

[0184] The infrared detector correcting device provided by the embodiments of the present application can be applied to an infrared detector correcting equipment. Optionally, Figure 4A hardware structure block diagram of the infrared detector correction device is shown with reference to Figure 4 The hardware structure of the infrared detector correction device can include at least one processor 1, at least one communication interface 2, at least one memory 3, and at least one communication bus 4.

[0185] In the embodiments of the present application, the number of the processor 1, the communication interface 2, the memory 3, and the communication bus 4 is at least one, and the processor 1, the communication interface 2, and the memory 3 complete communication with each other through the communication bus 4.

[0186] The processor 1 can be a central processing unit (CPU), or an application specific integrated circuit (ASIC), or one or more integrated circuits configured to implement the embodiments of the present application, etc.

[0187] The memory 3 can include a high-speed RAM memory, and can also include a non-volatile memory, such as at least one disk memory.

[0188] The memory stores a program, and the processor can call the program stored in the memory, and the program is used to:

[0189] Determine a target pixel value corresponding to a pixel point of an infrared detector;

[0190] Obtain a current pixel value output by the pixel point of the infrared detector;

[0191] Determine whether a difference between the current pixel value and the target pixel value is less than a preset threshold value;

[0192] If the difference is not less than the preset threshold value, calculate an average pixel value of the current pixel value and the target pixel value, correct an OCC parameter in the infrared detector by using the average pixel value, so that a difference between a pixel value output by a pixel point corresponding to the OCC parameter and the target pixel value is smaller, obtain a new current pixel value output by the pixel point of the infrared detector, and determine whether a difference between the new current pixel value and the target pixel value is less than the preset threshold value, until the difference between the current pixel value and the target pixel value is less than the threshold value.

[0193] Optionally, the detailed functions and extended functions of the program can refer to the description above.

[0194] The embodiments of the present application also provide a readable storage medium, which can store a program suitable for execution by a processor, and the program is used to:

[0195] determining a target pixel value corresponding to a pixel point of the infrared detector;

[0196] acquiring a current pixel value output by the pixel point of the infrared detector;

[0197] judging whether a difference between the current pixel value and the target pixel value is less than a preset threshold value;

[0198] if the difference is not less than the preset threshold value, calculating an average pixel value of the current pixel value and the target pixel value, correcting an OCC parameter in the infrared detector by using the average pixel value, so that a difference between a pixel value output by a pixel point corresponding to the OCC parameter and the target pixel value is smaller, acquiring a new current pixel value output by the pixel point of the infrared detector, and judging whether a difference between the new current pixel value and the target pixel value is less than a preset threshold value, until the difference between the current pixel value and the target pixel value is less than the threshold value.

[0199] Optionally, the refinement function and the extension function of the program can refer to the above description.

[0200] Finally, it should be noted that the terms such as first and second are used herein only to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply that there is any such actual relationship or order between these entities or operations. Moreover, the terms "include", "contain" or any other variants thereof are intended to cover non-exclusive inclusion, so that the process, method, article or device including a series of elements not only includes those elements, but also includes other elements not explicitly listed or inherent to such process, method, article or device. Without more limitations, the element defined by the statement "including a" does not exclude the presence of other identical elements in the process, method, article or device including the element.

[0201] The various embodiments in the specification are described in a progressive manner, and each embodiment focuses on the difference from other embodiments. The same or similar parts between various embodiments can be referred to each other.

[0202] The above description of the disclosed embodiments enables a person skilled in the art to implement or use the present application. Various modifications to these embodiments will be apparent to those skilled in the art, and the general principles defined herein can be implemented in other embodiments without departing from the spirit or scope of the present application. Various embodiments of the present application can be combined with each other. Therefore, the present application will not be limited to these embodiments shown herein, but will conform to the widest scope consistent with the principles and novel features disclosed herein.

Claims

1. An infrared detector correction method, characterized by, The method comprises the following steps: determining a target pixel value corresponding to a pixel point of an infrared detector; acquiring a current pixel value output by the pixel point of the infrared detector; judging whether a difference between the current pixel value and the target pixel value is less than a preset threshold value; if the difference is not less than the preset threshold value, calculating an average pixel value of the current pixel value and the target pixel value; when a bit number of the pixel value output by the pixel point is the same as a bit number of an OCC parameter of the infrared detector, using FPGA technology to take the average pixel value as the OCC parameter to realize adjustment of a resistance value of the infrared detector; when the bit number of the pixel value output by the pixel point is not the same as the bit number of the OCC parameter of the infrared detector, processing the average pixel value to make a bit number of the average pixel value after processing the same as the bit number of the OCC parameter; using FPGA technology to take the average pixel value after processing as the OCC parameter; so that a difference between a pixel value output by a pixel point corresponding to the OCC parameter and the target pixel value becomes smaller, a new current pixel value output by the pixel point of the infrared detector is acquired, and whether a difference between the new current pixel value and the target pixel value is less than a preset threshold value is judged, until the difference between the current pixel value and the target pixel value is less than the threshold value.

2. The infrared detector correction method of claim 1, wherein, The method for acquiring the current pixel value output by the pixel point of the infrared detector comprises the following steps: calculating and obtaining a total pixel mean value of current outputs of a pixel point array of the infrared detector; the step of judging whether the difference between the current pixel value and the target pixel value is less than the preset threshold value comprises the following steps: judging whether a difference between the total pixel mean value and the target pixel value is less than the preset threshold value; the step of calculating the average pixel value of the current pixel value and the target pixel value and using the average pixel value to correct an OCC parameter in the infrared detector comprises the following steps: calculating a total average value of the total pixel mean value and the target pixel value, and using the total average value to correct the OCC parameter related to the total pixel mean value in the entire OCC array of the infrared detector.

3. The infrared detector correction method of claim 1, wherein, The method for acquiring the current pixel value output by the pixel point of the infrared detector comprises the following steps: calculating and obtaining a pixel column mean value of current outputs of each column of pixel points in the pixel point array of the infrared detector; the step of judging whether the difference between the current pixel value and the target pixel value is less than the preset threshold value comprises the following steps: judging whether a difference between each pixel column mean value and the target pixel value is less than the preset threshold value; the step of calculating the average pixel value of the current pixel value and the target pixel value and using the average pixel value to correct the OCC parameter in the infrared detector comprises the following steps: calculating a column average value of the pixel column mean value and the target pixel value, and using the column average value corresponding to the pixel column mean value to correct the OCC parameter related to the pixel column mean value in the entire OCC array of the infrared detector.

4. The infrared detector correction method of claim 1, wherein, The method for acquiring the current pixel value output by the pixel point of the infrared detector comprises the following steps: acquiring a pixel value of a current output of each pixel point in the pixel point array of the infrared detector; judging whether the difference between the current pixel value and the target pixel value is less than a preset threshold value, comprising: judging whether the difference between the current pixel value and the target pixel value is less than a preset threshold value, comprising: calculating the average pixel value of the current pixel value and the target pixel value, and correcting the OCC parameter in the infrared detector by using the average pixel value, comprising: calculating the average value of the pixel value output by the pixel point and the target pixel value, and correcting the OCC parameter related to the pixel point in the entire OCC array of the infrared detector by using the average value corresponding to the pixel point.

5. The method of claim 1, wherein, acquiring the current pixel value output by the pixel point of the infrared detector, comprising: acquiring the current pixel value output by the pixel point of the infrared detector at the current temperature; after correcting the OCC parameter in the infrared detector by using the average pixel value, further comprising: establishing the correspondence between the temperature value of the current temperature and the corrected OCC parameter, and storing in the infrared detector.

6. An infrared detector correction device, characterized by comprising: determining unit, for determining the target pixel value corresponding to the pixel point of the infrared detector; acquiring unit, for acquiring the current pixel value output by the pixel point of the infrared detector; judging unit, for judging whether the difference between the current pixel value and the target pixel value is less than a preset threshold value; correcting unit, for calculating the average pixel value of the current pixel value and the target pixel value if the difference is not less than the preset threshold value; when the number of bits of the pixel value output by the pixel point is the same as the number of bits of the OCC parameter of the infrared detector, using FPGA technology to take the average pixel value as the OCC parameter to realize the adjustment of the resistance value of the infrared detector; when the number of bits of the pixel value output by the pixel point is not the same as the number of bits of the OCC parameter of the infrared detector, processing the average pixel value to realize that the number of bits of the processed average pixel value is the same as the number of bits of the OCC parameter; using FPGA technology to take the processed average pixel value as the OCC parameter; so that the difference between the pixel value output by the pixel point corresponding to the OCC parameter and the target pixel value becomes smaller, acquiring the new current pixel value output by the pixel point of the infrared detector, and judging whether the difference between the new current pixel value and the target pixel value is less than a preset threshold value, until the difference between the current pixel value and the target pixel value is less than the threshold value.

7. An infrared detector correction device, characterized by comprising a memory and a processor; the memory, for storing programs; the processor, for executing the programs, realizing the steps of the infrared detector correction method in any one of claims 1-5.

Images