Antenna automatic testing system and method

Abstract

The present invention discloses an antenna automatic test system and method, including: a rotation drive module, respectively connected to a first rotation mechanism and each second rotation mechanism, for driving the first rotation mechanism and the second rotation mechanism to rotate according to a driving instruction, so that the probe antenna faces the antenna to be tested; the probe antenna sends a pulse radio frequency signal to the antenna to be tested according to a transmission signal, and the antenna to be tested generates a near-field radiation signal according to the pulse radio frequency signal; a waveform transceiver module generates a transmission signal according to a waveform transmission instruction, and generates near-field test data according to the near-field radiation signal; a control module generates a driving instruction according to a detection priority, generates a waveform transmission instruction according to a preset program, and inputs the near-field test data into a preset conversion model, and the conversion model performs near-field to far-field conversion processing on the near-field test data to obtain far-field test data. The present invention improves the accuracy of the antenna far-field radiation parameters and the efficiency of antenna testing.

Description

Technical Field

[0001] The invention relates to the technical field of antenna measurement, and in particular to an antenna automatic testing system. Background Art

[0002] Antennas are an important part of applications such as communications and radars. The testing and verification of antenna parameters is an indispensable process in the antenna design process. The main content of antenna testing is to measure the electrical parameters and radiation parameters of the antenna to evaluate the performance of the antenna. Antenna testing methods include far-field testing, compact field testing, and planar near-field testing. Antenna far-field testing technology was the first to appear and mature, but it has special requirements for the test site and electromagnetic environment, so far-field testing is very inconvenient, and the antenna radiation parameters directly obtained through far-field testing are easily affected by the external environment. Therefore, the accuracy of the antenna radiation parameters obtained by far-field testing is not high enough. Summary of the invention

[0003] In view of the deficiencies in the prior art, an object of the present invention is to provide an antenna automatic testing system and method for simultaneously improving the accuracy of antenna far-field radiation parameters and the efficiency of antenna testing.

[0004] To achieve the above object, the present invention provides the following technical solution: an antenna automatic testing system, comprising:

[0005] A first rotating mechanism, wherein a probe antenna is mounted on an upper end of the first rotating mechanism;

[0006] A plurality of second rotating mechanisms, each of which is equipped with an antenna to be tested at its upper end, each of which has the same polarization state as the probe antenna, each of which is located in a near field region, each of which maintains a preset distance from the probe antenna, and each of which is configured with a device address, each of which is associated with a corresponding detection priority;

[0007] A rotation driving module, connected to the first rotating mechanism and each of the second rotating mechanisms, respectively, for driving the first rotating mechanism and the second rotating mechanism corresponding to the device address to rotate according to a driving instruction, so that the front of the probe antenna faces the antenna to be tested;

[0008] The probe antenna is used to send a pulsed radio frequency signal to the antenna to be tested according to a transmission signal, and the antenna to be tested is used to generate a near-field radiation signal according to the pulsed radio frequency signal;

[0009] A waveform transceiver module, connected to the probe antenna and each of the antennas to be tested, for generating the transmission signal according to a waveform transmission instruction, and generating near-field test data according to the near-field radiation signal;

[0010] A control module is respectively connected to the rotation drive module and the waveform transceiver module, and is used to generate the drive instruction according to the detection priority, generate the waveform transmission instruction according to a preset program, and input the near-field test data into a preset conversion model. The conversion model performs near-field to far-field conversion processing on the near-field test data to obtain far-field test data.

[0011] Furthermore, the waveform transceiver module includes a signal processing unit for extracting data of a near-field amplitude and a near-field phase in the near-field radiation signal, and generating the near-field test data according to the near-field amplitude and the near-field phase.

[0012] Furthermore, the control module comprises:

[0013] A drive generating unit, used for sorting each of the detection priorities according to a preset priority sorting method, obtaining a priority sorting result, and generating the drive instruction according to the priority sorting result;

[0014] A data conversion unit, configured to input the near-field test data into the conversion model, wherein the conversion model performs a fast Fourier transform on the near-field data to obtain the far-field test data;

[0015] An image generating unit, connected to the data converting unit, and configured to obtain an antenna pattern according to the antenna near-field data processing;

[0016] The image processing unit is connected to the directional pattern generating unit and is used to perform image normalization processing on the antenna directional pattern to obtain a normalized directional pattern.

[0017] Furthermore, it also includes a device switching module, which is respectively connected to the waveform transceiver module and the control module, and is used to generate a switching instruction according to the detection priority of the second rotating mechanism where the antenna to be tested is located after the waveform transceiver module generates the near-field test data, and send it to the control module. The control module generates the drive instruction according to the switching instruction and the priority sorting result.

[0018] Furthermore, the preset distance is calculated by a distance calculation formula, and the distance calculation formula is configured as:

[0019] R=2D 2 / λ;

[0020] S = kλ, 3≤k≤5;

[0021] Wherein, R is used to represent the distance between the antenna to be tested and the boundary of the near field area;

[0022] D is used to represent the maximum aperture of the antenna to be tested;

[0023] λ is used to represent the wavelength of the pulsed radio frequency signal;

[0024] k is used to represent a preset constant;

[0025] S is used to represent the preset distance.

[0026] Furthermore, an analysis module is included, connected to the control module, including:

[0027] A data analysis unit, used for performing data analysis on the far-field test data to obtain a data analysis graph, wherein the data analysis graph includes a rectangular coordinate graph, a polar coordinate graph, a list graph and a 3D spherical graph;

[0028] A report generating unit is connected to the data analyzing unit and is used to generate a data testing report according to the far-field testing data and the data analysis graph.

[0029] Furthermore, it also includes a signal amplification module, which is respectively connected to the waveform transceiver module, the probe antenna and each of the antennas to be tested, including:

[0030] a first amplifying unit, used to amplify the pulsed radio frequency signal sent by the probe antenna, so as to send the pulsed radio frequency signal to the antenna to be tested;

[0031] The second amplifying unit is used to amplify the near-field radiation signal generated by the antenna to be tested, so as to send the amplified signal to the waveform transceiver module.

[0032] Furthermore, the far-field test data includes antenna gain, antenna bandwidth, cross-polarization, antenna axial ratio and antenna efficiency of the antenna to be tested.

[0033] An antenna automatic testing method, applied to the above-mentioned antenna automatic testing system, comprises:

[0034] Step S1, the control module generates the driving instruction according to the detection priority, and the rotation driving module drives the first rotating mechanism and the second rotating mechanism corresponding to the device address to rotate according to the driving instruction, so that the front of the probe antenna faces the antenna to be tested corresponding to the detection priority;

[0035] Step S2, the control module generates the waveform transmission instruction according to a preset program, the waveform transceiver module generates the transmission signal according to the waveform transmission instruction, the probe antenna sends a pulsed radio frequency signal to the antenna to be tested according to the transmission signal, and the antenna to be tested generates a near-field radiation signal according to the pulsed radio frequency signal;

[0036] Step S3, the waveform transceiver module generates near-field test data according to the near-field radiation signal, and the control module inputs the near-field test data into a preset conversion model, and the conversion model performs near-field to far-field conversion processing on the near-field test data to obtain far-field test data.

[0037] Furthermore, the step S3 comprises:

[0038] Step S31, the control module inputs the near-field test data into the conversion model, and the conversion model performs fast Fourier transform on the near-field data to obtain the far-field test data;

[0039] Step S32, the control module obtains an antenna pattern according to the antenna near-field data processing;

[0040] Step S33: The control module performs image normalization processing on the antenna pattern to obtain a normalized pattern.

[0041] Beneficial effects of the present invention:

[0042] The present invention measures the near-field radiation signals on the corresponding antennas to be tested in sequence according to the detection priority of each second rotating mechanism, so that the waveform transceiver module obtains the corresponding near-field test data according to the near-field radiation signal processing, and finally the control module uses the conversion model to perform near-field to far-field conversion on the near-field test data to obtain the corresponding far-field test data. Compared with the far-field radiation parameters of the antenna obtained by direct measurement, the far-field test data is less affected by the environment, so the accuracy is effectively improved. At the same time, the present invention can measure the parameters of several antennas to be tested in sequence according to the detection priority, which effectively improves the efficiency of antenna testing. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 It is a structural schematic diagram of the antenna automatic testing system in the present invention;

[0044] Figure 2 is a flowchart of the steps of the antenna automatic testing method of the present invention;

[0045] Figure 3 It is a sub-flow chart of the steps of the antenna automatic testing method in the present invention;

[0046] Figure 4 It is a structural schematic diagram of the signal amplification module in the present invention.

[0047] Figure numerals: 1. first rotating mechanism; 2. second rotating mechanism; 3. rotation driving module; 4. waveform transceiver module; 41. signal processing unit; 5. probe antenna; 6. antenna to be tested; 7. control module; 71. drive generating unit; 72. data conversion unit; 73. image generating unit; 74. image processing unit; 8. analysis module; 81. data analysis unit; 82. report generating unit; 9. signal amplification module; 91. first amplification unit; 92. second amplification unit; 10. device switching module. DETAILED DESCRIPTION

[0048] The present invention is further described in detail below in conjunction with the accompanying drawings and embodiments. The same parts are represented by the same reference numerals. It should be noted that the words "front", "rear", "left", "right", "upper" and "lower" used in the following description refer to directions in the accompanying drawings, and the words "bottom surface" and "top surface", "inner" and "outer" refer to directions toward or away from the geometric center of a specific component, respectively.

[0049] like Figure 1 As shown, an antenna automatic testing system of this embodiment includes:

[0050] A first rotating mechanism 1, wherein a probe antenna 5 is mounted on the upper end of the first rotating mechanism 1;

[0051] A plurality of second rotating mechanisms 2, each of which is provided with an antenna to be tested 6 at its upper end, each of which has the same polarization state as the probe antenna 5, each of which is located in a near field region, each of which maintains a preset distance from the probe antenna 5, and each of which is configured with a device address, and the device address is associated with a corresponding detection priority;

[0052] The rotation driving module 3 is connected to the first rotating mechanism 1 and each second rotating mechanism 2 respectively, and is used to drive the first rotating mechanism 1 and the second rotating mechanism 2 corresponding to the device address to rotate according to a driving instruction, so that the probe antenna 5 faces the antenna to be tested 6;

[0053] The probe antenna 5 is used to send a pulsed radio frequency signal to the antenna to be tested 6 according to a transmission signal, and the antenna to be tested 6 is used to generate a near-field radiation signal according to the pulsed radio frequency signal;

[0054] The waveform transceiver module 4 is connected to the probe antenna 5 and each antenna to be tested 6, and is used to generate a transmission signal according to a waveform transmission instruction, and to generate near-field test data according to the near-field radiation signal;

[0055] The control module 7 is respectively connected to the rotation drive module 3 and the waveform transceiver module 4, and is used to generate a drive instruction according to the detection priority, generate a waveform transmission instruction according to a preset program, and input the near-field test data into a preset conversion model. The conversion model performs near-field to far-field conversion processing on the near-field test data to obtain far-field test data.

[0056] The present technical solution measures the near-field radiation signals on the corresponding antennas 6 to be tested in sequence according to the detection priority of each second rotating mechanism 2, so that the waveform transceiver module 4 obtains the corresponding near-field test data according to the near-field radiation signal processing, and finally the control module 7 uses the conversion model to perform near-field to far-field conversion on the near-field test data to obtain the corresponding far-field test data. Compared with the far-field radiation parameters of the antenna obtained by direct measurement, the far-field test data is less affected by the environment, so the accuracy is effectively improved. At the same time, the present technical solution can measure the parameters of several antennas 6 to be tested in sequence according to the detection priority, which effectively improves the efficiency of antenna testing.

[0057] Specifically, in this embodiment, two second rotating mechanisms 2 are provided, the first rotating mechanism 1 and each second rotating mechanism 2 are turntables, the rotation drive module 3 is a turntable control box, the probe antenna 5 can be a waveguide antenna, the waveform transceiver module 4 can be a vector network analyzer, the control module 7 can be a control program on the main control computer, and two antennas to be tested 6 are provided, namely the first antenna to be tested 6 and the second antenna to be tested 6. The first antenna to be tested 6 is located on the first turntable, the second antenna to be tested 6 is located on the second turntable, and the waveguide antenna is located on the third turntable.

[0058] Working principle:

[0059] The detection priority corresponding to the first turntable is the first priority, and the detection priority corresponding to the second turntable is the second priority. The first priority is higher than the second priority, so the control program generates a first drive instruction to drive the first turntable and the third turntable to rotate so that the front of the waveguide antenna faces the first antenna to be tested 6. The control program generates a first waveform transmission instruction and sends it to the vector network analyzer, so that the vector network analyzer generates a first transmission signal and sends it to the waveguide antenna, so that the waveguide antenna sends a first pulsed RF signal to the first antenna to be tested 6 according to the first transmission signal, and the first antenna to be tested 6 generates a first near-field radiation signal according to the first pulsed RF signal. The vector network analyzer performs offline sampling of the sampling surface near the first antenna to be tested 6 at preset intervals by plane scanning to obtain the first near-field radiation signal, and then obtains the first near-field test data according to the first near-field radiation signal. The first near-field test data includes a group of first horizontally polarized waves and first vertically polarized waves; after obtaining the first near-field test data, the control program generates a second drive instruction, The second turntable and the third turntable are driven to rotate so that the front of the waveguide antenna faces the second antenna to be tested 6, and then the control program generates a second waveform transmission instruction and sends it to the vector network analyzer, so that the vector network analyzer generates a second transmission signal and sends it to the waveguide antenna, so that the waveguide antenna sends a second pulsed radio frequency signal to the second antenna to be tested 6 according to the second transmission signal, and the second antenna to be tested 6 generates a second near-field radiation signal according to the second pulsed radio frequency signal. The vector network analyzer performs offline sampling on the sampling surface of the second antenna to be tested 6 by plane scanning to obtain the second near-field radiation signal, and then obtains the second near-field test data according to the second near-field radiation signal processing, and the second near-field test data includes a group of second horizontal polarization waves and second vertical polarization waves. The control inputs the first near-field test data and the second near-field test data obtained by sequentially detecting the first antenna to be tested 6 and the second antenna to be tested 6 into the conversion model, performs near-field data conversion, and obtains the first far-field test data and the second far-field test data to reflect the antenna far-field radiation parameters of the first antenna to be tested 6 and the second antenna to be tested 6.

[0060] Preferably, the waveform transceiver module 4 includes a signal processing unit 41 for extracting data on the near-field amplitude and near-field phase in the near-field radiation signal, and generating near-field test data according to the near-field amplitude and near-field phase.

[0061] Specifically, in this embodiment, the signal processing unit 41 first performs waveform analysis on the near-field radiation signal to obtain the near-field amplitude and near-field phase in the near-field radiation waveform, so as to form near-field test data according to the near-field amplitude and near-field phase.

[0062] Preferably, the control module 7 includes:

[0063] The drive generating unit 71 is used to sort each detection priority according to a preset priority sorting method, obtain a priority sorting result, and generate a drive instruction according to the priority sorting result;

[0064] A data conversion unit 72 is used to input the near-field test data into a conversion model, and the conversion model performs a fast Fourier transform on the near-field data to obtain far-field test data;

[0065] An image generating unit 73, connected to the data converting unit 72, is used to obtain an antenna pattern according to antenna near-field data processing;

[0066] The image processing unit 74 is connected to the pattern generating unit and is used to perform image normalization processing on the antenna pattern to obtain a normalized pattern.

[0067] Preferably, it also includes a device switching module 10, which is respectively connected to the waveform transceiver module 4 and the control module 7, and is used to generate a switching instruction according to the detection priority of the second rotating mechanism 2 where the antenna 6 to be tested is located after the waveform transceiver module 4 generates near-field test data, and send it to the control module 7. The control module 7 generates a driving instruction according to the switching instruction and the priority sorting result.

[0068] Specifically, in this embodiment, the device switching module 10 can be a device switching box, which is used to generate a first switching instruction when the vector network analyzer has not processed the first near-field test data, and the control program generates a first drive instruction according to the first switching instruction; and generate a second switching instruction after the vector network analyzer processes the first near-field test data, so that the control program generates a second drive instruction according to the second switching instruction.

[0069] Preferably, the preset distance is calculated by a distance calculation formula, and the distance calculation formula is configured as:

[0070] R=2D 2 / λ;

[0071] S = kλ, 3≤k≤5;

[0072] Wherein, R is used to represent the distance between the antenna 6 to be tested and the boundary of the near field area;

[0073] D is used to represent the maximum aperture of the antenna 6 to be tested;

[0074] λ is used to represent the wavelength of the pulsed RF signal;

[0075] k is used to represent a preset constant;

[0076] S is used to indicate a preset distance.

[0077] Specifically, in this embodiment, the value is 4, so in this embodiment, S=4λ.

[0078] Preferably, it also includes an analysis module 8 and a connection control module 7, including:

[0079] The data analysis unit 81 is used to perform data analysis on the far-field test data to obtain data analysis graphs, which include rectangular coordinate graphs, polar coordinate graphs, list graphs and 3D spherical graphs;

[0080] The report generating unit 82 is connected to the data analyzing unit 81 and is used to generate a data testing report according to the far-field testing data and the data analysis diagram.

[0081] Specifically, in this embodiment, the report generation unit 82 can obtain the data test report by manually integrating the far-field test data and the data analysis chart, or by performing data analysis and processing based on the far-field test data and the data analysis chart through a preset computer program to obtain the data test report.

[0082] Preferably, it also includes a signal amplification module 9, which is respectively connected to the waveform transceiver module 4, the probe antenna 5 and each antenna to be tested 6, including:

[0083] The first amplifying unit 91 is used to amplify the pulsed radio frequency signal sent by the probe antenna 5 to send it to the antenna to be tested 6;

[0084] The second amplifying unit 92 is used to amplify the near-field radiation signal generated by the antenna 6 to be tested, so as to send the amplified signal to the waveform transceiver module 4 .

[0085] Specifically, in this embodiment, the first amplifying unit 91 and the second amplifying unit 92 are amplifiers, which are respectively used to amplify the pulsed radio frequency signal and the near-field radiation signal to improve the test quality.

[0086] Furthermore, each amplifier is connected to an amplifier control box, which is connected to a main control computer. The main control computer controls the amplifier control box, which in turn controls each amplifier. Under different test frequency bands, the main control computer inputs different control instructions to the amplifier control box, so that the amplifier control box controls each amplifier to amplify different signals under different frequency bands.

[0087] Preferably, the far-field test data includes antenna gain, antenna bandwidth, cross polarization, antenna axial ratio and antenna efficiency of the antenna 6 to be tested.

[0088] An antenna automatic testing method is applied to the above-mentioned antenna automatic testing system, such as Figure 2 As shown, including:

[0089] Step S1, the control module 7 generates a driving instruction according to the detection priority, and the rotation driving module 3 drives the first rotating mechanism and the second rotating mechanism corresponding to the device address to rotate according to the driving instruction, so that the probe antenna 5 faces the antenna to be tested 6 corresponding to the detection priority;

[0090] Step S2, the control module 7 generates a waveform transmission instruction according to a preset program, the waveform transceiver module 4 generates a transmission signal according to the waveform transmission instruction, the probe antenna 5 sends a pulsed radio frequency signal to the antenna to be tested 6 according to the transmission signal, and the antenna to be tested 6 generates a near-field radiation signal according to the pulsed radio frequency signal;

[0091] In step S3, the waveform transceiver module 4 generates near-field test data according to the near-field radiation signal, and the control module 7 inputs the near-field test data into a preset conversion model. The conversion model performs near-field to far-field conversion processing on the near-field test data to obtain far-field test data.

[0092] Preferably, Figure 3 As shown, step S3 includes:

[0093] Step S31, the control module 7 inputs the near-field test data into the conversion model, and the conversion model performs a fast Fourier transform on the near-field data to obtain far-field test data;

[0094] Step S32, the control module 7 obtains the antenna pattern according to the antenna near-field data processing;

[0095] Step S33: the control module 7 performs image normalization processing on the antenna pattern to obtain a normalized pattern.

[0096] The above are only preferred embodiments of the present invention. The protection scope of the present invention is not limited to the above embodiments. All technical solutions under the concept of the present invention belong to the protection scope of the present invention. It should be pointed out that for ordinary technicians in this technical field, some improvements and modifications without departing from the principle of the present invention should also be regarded as the protection scope of the present invention.

Claims

1. An antenna automatic testing system, characterized in that ,include: A first rotating mechanism (1), wherein a probe antenna (5) is mounted on the upper end of the first rotating mechanism (1); A plurality of second rotating mechanisms (2), each of the second rotating mechanisms (2) being provided with an antenna to be tested (6) at its upper end, each of the antennas to be tested (6) having the same polarization state as the probe antenna (5), each of the antennas to be tested (6) and the probe antenna (5) being located in a near field region, each of the antennas to be tested (6) maintaining a preset distance from the probe antenna (5), each of the second rotating mechanisms (2) being provided with a device address, and each of the device addresses being associated with a corresponding detection priority; a rotation drive module (3), connected to the first rotation mechanism (1) and each of the second rotation mechanisms (2), and used to drive the first rotation mechanism (1) and the second rotation mechanism (2) corresponding to the device address to rotate according to a drive instruction, so that the probe antenna (5) faces the antenna to be tested (6); The probe antenna (5) is used to send a pulsed radio frequency signal to the antenna to be tested (6) according to a transmission signal, and the antenna to be tested (6) is used to generate a near-field radiation signal according to the pulsed radio frequency signal; A waveform transceiver module (4), connected to the probe antenna (5) and each of the antennas to be tested (6), respectively, for generating the transmission signal according to a waveform transmission instruction, and generating near-field test data according to the near-field radiation signal; A control module (7) is respectively connected to the rotation drive module (3) and the waveform transceiver module (4), and is used to generate the drive instruction according to the detection priority, and to generate the waveform transmission instruction according to a preset program, and to input the near-field test data into a preset conversion model, wherein the conversion model performs near-field to far-field conversion processing on the near-field test data to obtain far-field test data.

2. The antenna automatic testing system according to claim 1, characterized in that: The waveform transceiver module (4) comprises a signal processing unit (41) for extracting data of a near-field amplitude and a near-field phase in the near-field radiation signal, and generating the near-field test data according to the near-field amplitude and the near-field phase.

3. The antenna automatic testing system according to claim 1, characterized in that: The control module (7) comprises: A drive generating unit (71) is used to sort each of the detection priorities according to a preset priority sorting method, obtain a priority sorting result, and generate the drive instruction according to the priority sorting result; A data conversion unit (72) is used to input the near-field test data into the conversion model, and the conversion model performs a fast Fourier transform on the near-field test data to obtain the far-field test data; An image generating unit (73), connected to the data converting unit (72), and used for processing the antenna near-field test data to obtain an antenna directivity diagram; An image processing unit (74) is connected to the directional pattern generating unit and is used to perform image normalization processing on the antenna directional pattern to obtain a normalized directional pattern.

4. The antenna automatic testing system according to claim 1, characterized in that: It also includes a device switching module (10), which is respectively connected to the waveform transceiver module (4) and the control module (7), and is used to generate a switching instruction according to the detection priority of the second rotating mechanism (2) where the antenna (6) to be tested is located after the waveform transceiver module (4) generates the near-field test data, and send it to the control module (7), and the control module (7) generates the driving instruction according to the switching instruction and the priority sorting result.

5. The antenna automatic testing system according to claim 1, characterized in that: The preset distance is calculated by a distance calculation formula, and the distance calculation formula is configured as: R=2D 2 / λ; S = kλ, 3≤k≤5; Wherein, R is used to represent the distance between the antenna to be tested (6) and the boundary of the near-field area; D is used to represent the maximum aperture of the antenna (6) to be tested; λ is used to represent the wavelength of the pulsed radio frequency signal; k is used to represent a preset constant; S is used to represent the preset distance.

6. The antenna automatic testing system according to claim 1, characterized in that: It also includes an analysis module (8), connected to the control module (7), including: A data analysis unit (81) is used to perform data analysis processing on the far-field test data to obtain a data analysis graph, wherein the data analysis graph includes a rectangular coordinate graph, a polar coordinate graph, a list graph and a 3D spherical graph; A report generating unit (82) is connected to the data analyzing unit (81) and is used to generate a data testing report according to the far-field testing data and the data analysis graph.

7. The antenna automatic testing system according to claim 1, characterized in that: It also includes a signal amplification module (9), which is respectively connected to the waveform transceiver module (4), the probe antenna (5) and each of the antennas to be tested (6), and includes: A first amplifying unit (91) is used to amplify the pulsed radio frequency signal sent by the probe antenna (5) so as to send the pulsed radio frequency signal to the antenna to be tested (6); The second amplifying unit (92) is used to amplify the near-field radiation signal generated by the antenna to be tested (6) so as to send the signal to the waveform transceiver module (4).

8. The antenna automatic testing system according to claim 1, characterized in that: The far-field test data includes the antenna gain, antenna bandwidth, cross polarization, antenna axial ratio and antenna efficiency of the antenna (6) to be tested.

9. An automatic antenna testing method, applied to the automatic antenna testing system according to any one of claims 1 to 8, characterized in that: include: Step S1, the control module (7) generates the driving instruction according to the detection priority, and the rotation driving module (3) drives the first rotating mechanism (1) and the second rotating mechanism (2) corresponding to the device address to rotate according to the driving instruction, so that the probe antenna (5) faces the antenna to be tested (6) corresponding to the detection priority. Step S2, the control module (7) generates the waveform transmission instruction according to a preset program, the waveform transceiver module (4) generates the transmission signal according to the waveform transmission instruction, the probe antenna (5) sends a pulsed radio frequency signal to the antenna to be tested (6) according to the transmission signal, and the antenna to be tested (6) generates a near-field radiation signal according to the pulsed radio frequency signal; Step S3, the waveform transceiver module (4) generates near-field test data according to the near-field radiation signal, and the control module (7) inputs the near-field test data into a preset conversion model, and the conversion model performs near-field to far-field conversion processing on the near-field test data to obtain far-field test data.

10. The antenna automatic testing method according to claim 9, characterized in that: The step S3 comprises: Step S31, the control module (7) inputs the near-field test data into the conversion model, and the conversion model performs a fast Fourier transform on the near-field test data to obtain the far-field test data; Step S32, the control module (7) obtains an antenna pattern according to the antenna near-field test data processing; Step S33: the control module (7) performs image normalization processing on the antenna pattern to obtain a normalized pattern.

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