Y capacitor test method, test equipment, storage medium and processor

Abstract

The present invention discloses a test method, test equipment, storage medium and processor of a Y capacitor. The test method of the Y capacitor includes controlling the first switch on the discharge circuit to close, detecting the first output voltage of the discharge resistor on the discharge circuit and the second output voltage of the programmable power supply, judging whether the first output voltage and the second output voltage meet the preset conditions, and if so, generating a test instruction, wherein the test instruction is used to measure and record multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor on the charging circuit, and based on the multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor, the capacitance value of the Y capacitor is determined. By adopting the technical solution of the present application, the voltage at both ends of the Y capacitor in the initial state is ensured to be zero through the discharge circuit, and the voltage value of the charging resistor is used to replace the voltage of the Y capacitor, so that the value of the Y capacitor can be calculated more accurately.

Description

Technical Field

[0001] The present invention relates to the technical field of fuel cell air supply equipment, and in particular to a Y capacitor testing method, testing equipment, storage medium and processor. Background Art

[0002] With the continuous strengthening of environmental protection awareness, electric vehicles have been rapidly developed. As one of the symbols of electric vehicles, the safety and reliability of high-voltage systems have received more and more attention. In order to avoid high-voltage electric shock and protect personnel safety, most electric vehicles use an isolated design for the high-voltage system and low-voltage system. However, due to electromagnetic interference, objective environment and other factors, there will be capacitance between the high-voltage system and the low-voltage system, namely Y capacitance. Therefore, effective means are needed to detect Y capacitance to ensure that the energy stored in Y capacitance does not cause the risk of electric shock to personnel.

[0003] The Y capacitor test method is divided into two categories: RESS and non-RESS. The non-RESS test method is mainly aimed at the non-RESS high-voltage assembly inside the electric vehicle and the high-voltage system inside the electric vehicle that does not include RESS. The existing non-RESS Y capacitor test mainly builds a circuit including an external power supply, a switch, a resistor and a Y capacitor, uses the external power supply to output a jump voltage signal, observes and records the voltage change characteristics of the Y capacitor, and analyzes and calculates the specific value of the Y capacitor. This test method has two defects: First, it does not take into account the initial state of the test, that is, the voltage state of the Y capacitor at the beginning of the test. The voltage change of the Y capacitor cannot reflect the true characteristics, and the analyzed and calculated Y capacitor value is too small; second, the resistance value of the entire measurement circuit is not considered during the test, which will affect the Y capacitor value. Summary of the invention

[0004] The embodiments of the present invention provide a Y capacitor test method, a test device, a storage medium and a processor to at least solve the technical problem of inaccurate Y capacitor value measurement results in non-RESS type Y capacitor tests.

[0005] According to one aspect of an embodiment of the present invention, a method for testing a Y capacitor is provided, comprising: controlling a first switch on a discharge circuit to close; detecting a first output voltage of a discharge resistor on the discharge circuit and a second output voltage of a programmable power supply; determining whether the first output voltage and the second output voltage meet a preset condition; if so, generating a test instruction, wherein the test instruction is used to measure and record a plurality of voltage values ​​of the programmable power supply in different operating modes and a voltage value of a charging resistor on a charging circuit; and determining a capacitance value of the Y capacitor based on the plurality of voltage values ​​of the programmable power supply in different operating modes and the voltage value of the charging resistor.

[0006] Optionally, generating a test instruction includes: controlling the first switch to be disconnected, and the second switch and the third switch to be closed; detecting the working status of the first switch, the second switch, and the third switch; and generating a first test instruction in the test instruction when the first switch is normally disconnected and the second switch and the third switch are both normally closed, the first test instruction being used to measure and record a first voltage value of the programmable power supply in the first working mode and a third voltage value of the first charging resistor in the first charging circuit on the charging circuit.

[0007] Optionally, the testing method of the Y capacitor also includes: controlling the second switch and the third switch to be disconnected and the first switch to be closed; detecting the first output voltage of the discharge resistor and the second output voltage of the programmable power supply; judging whether the first output voltage and the second output voltage meet preset conditions; if so, generating a second test instruction in the test instruction, and the second test instruction is used to measure and record the second voltage value of the programmable power supply in the second working mode and the fourth voltage value of the second charging resistor in the second charging circuit on the charging circuit.

[0008] Optionally, generating a second test instruction in the test instruction includes: controlling the first switch to be disconnected, and the third switch and the fourth switch to be closed; detecting the working status of the first switch, the third switch, and the fourth switch; and generating the second test instruction when the first switch is normally disconnected, and the third switch and the fourth switch are both normally closed.

[0009] Optionally, the testing method of the Y capacitor also includes: controlling the third switch and the fourth switch to be disconnected and the first switch to be closed, detecting the first output voltage of the discharge resistor and the second output voltage of the programmable power supply; judging whether the first output voltage and the second output voltage meet preset conditions; when the first output voltage and the second output voltage meet the preset conditions, controlling the first switch to be disconnected and generating stop test information.

[0010] Optionally, the Y capacitor test method further includes: generating a test stop message and an error message when the first output voltage and the second output voltage do not satisfy a preset condition.

[0011] Optionally, the capacitance value of the Y capacitor is determined based on multiple voltage values ​​of the programmable power supply in different operating modes and the voltage value of the charging resistor, including: determining a first charging current of the first charging circuit based on a third voltage value and a first resistance value of the first charging resistor; determining a second charging current of the second charging circuit based on a fourth voltage value and a second resistance value of the second charging resistor; and determining the capacitance value of the Y capacitor based on the first charging current, the first resistance value, the first voltage value, the second charging current, the second resistance value and the second voltage value.

[0012] According to another aspect of an embodiment of the present invention, a test device for a Y capacitor is provided, comprising: a control unit, used to control the closing of a first switch on a discharge circuit; a detection unit, used to detect a first output voltage of a discharge resistor on the discharge circuit and a second output voltage of a programmable power supply; a judgment unit, used to judge whether the first output voltage and the second output voltage meet a preset condition; a generation unit, used to generate a test instruction, wherein the test instruction is used to measure and record multiple voltage values ​​of the programmable power supply in different working modes and a voltage value of a charging resistor on a charging circuit; and a determination unit, used to determine the capacitance value of the Y capacitor based on the multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor.

[0013] According to another aspect of an embodiment of the present invention, a computer-readable storage medium is provided, the computer-readable storage medium comprising a stored program, wherein the computer program is configured to control the execution of the above control method when running.

[0014] According to another aspect of an embodiment of the present invention, a processor is provided, and the processor is used to run a program, wherein the processor executes the above control method through a computer program.

[0015] In an embodiment of the present invention, a method for testing a Y capacitor includes controlling a first switch on a discharge circuit to close, detecting a first output voltage of a discharge resistor on the discharge circuit and a second output voltage of a programmable power supply, determining whether the first output voltage and the second output voltage meet a preset condition, and if so, generating a test instruction, wherein the test instruction is used to measure and record a plurality of voltage values ​​of the programmable power supply in different working modes and a voltage value of a charging resistor on a charging circuit, and determining the capacitance value of the Y capacitor based on the plurality of voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor. By adopting the technical solution of the present application, in the testing process of the Y capacitor, the voltage across the Y capacitor in the initial state is ensured to be zero through the discharge circuit, and the voltage value of the charging resistor is used to replace the voltage of the Y capacitor, and the resistance of the entire charging circuit and the discharge circuit is estimated, so that the value of the Y capacitor can be calculated more accurately, and the technical problem of inaccurate measurement results of the Y capacitor value in the non-RESS type Y capacitor test is solved. BRIEF DESCRIPTION OF THE DRAWINGS

[0016] The drawings described herein are used to provide a further understanding of the present invention and constitute a part of this application. The exemplary embodiments of the present invention and their descriptions are used to explain the present invention and do not constitute an improper limitation of the present invention. In the drawings:

[0017] Figure 1 is a flow chart of a method for testing a Y capacitor according to one optional embodiment of the present invention;

[0018] Figure 2is a circuit diagram between a programmable power supply, a Y capacitor testing device and a high voltage assembly to be tested according to one optional embodiment of the present invention;

[0019] Figure 3 is a structural block diagram of a Y capacitor testing system according to one optional embodiment of the present invention;

[0020] Figure 4 4 is a structural block diagram of a Y capacitor testing device according to one optional embodiment of the present invention. DETAILED DESCRIPTION

[0021] In order to enable those skilled in the art to better understand the scheme of the present invention, the technical scheme in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the described embodiments are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work should fall within the scope of protection of the present invention.

[0022] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above-mentioned drawings are used to distinguish similar objects, and are not necessarily used to describe a specific order or sequence. It should be understood that the data used in this way can be interchanged where appropriate, so that the embodiments of the present invention described herein can be implemented in an order other than those illustrated or described herein. In addition, the terms "including" and "having" and any variations thereof are intended to cover non-exclusive inclusions, for example, a process, method, system, product or device that includes a series of steps or units is not necessarily limited to those steps or units that are clearly listed, but may include other steps or units that are not clearly listed or inherent to these processes, methods, products or devices.

[0023] According to an embodiment of the present invention, a method embodiment of a Y capacitor testing method is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0024] like Figure 1 FIG. 1 is a flow chart of a method for testing a Y capacitor according to one embodiment of the present application. Figure 1 As shown, the testing method of the Y capacitor includes the following steps:

[0025] S101, controlling the first switch on the discharge circuit to close;

[0026] S102, detecting a first output voltage of a discharge resistor on a discharge circuit and a second output voltage of a programmable power supply;

[0027] S103, determining whether the first output voltage and the second output voltage meet a preset condition;

[0028] S104, if yes, generate a test instruction, wherein the test instruction is used to measure and record multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor on the charging circuit;

[0029] S105, determining the capacitance value of the Y capacitor based on multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor.

[0030] Through the above steps, in the test process of the Y capacitor, the discharge circuit ensures that the voltage across the Y capacitor in the initial state is zero, and the voltage value of the charging resistor is used to replace the voltage of the Y capacitor, and the resistance of the entire charging circuit and the discharge circuit is estimated, so that the value of the Y capacitor can be more accurately calculated, and the technical problem of inaccurate measurement results of the Y capacitor value in the non-RESS type Y capacitor test is solved. In this embodiment, the preset condition is set to be within the time threshold, and the voltage of the first output voltage and the second output voltage are both less than the voltage threshold 1, and the voltage threshold 1 is set according to the actual situation. Specifically, when the first output voltage and the second output voltage meet the preset condition, the values ​​of the first output voltage and the second output voltage should be infinitely close to 0, so as to ensure that the discharge circuit releases the voltage that may exist in the Y capacitor, thereby ensuring that the voltage across the Y capacitor in the initial state is zero.

[0031] Optionally, generating a test instruction includes: controlling the first switch to be disconnected, the second switch and the third switch to be closed, detecting the working states of the first switch, the second switch and the third switch, and generating a first test instruction in the test instruction when the first switch is normally disconnected and the second switch and the third switch are all normally closed, and the first test instruction is used to measure and record the first voltage value of the programmable power supply in the first working mode and the third voltage value of the first charging resistor in the first charging circuit on the charging circuit. In this embodiment, the first switch is arranged in series with the third switch, and the second switch is arranged in series with the third switch. When the first switch is disconnected and the second switch and the third switch are closed, the first charging circuit is in the working state and the programmable power supply is in the first working mode. When the first switch is normally disconnected and the second switch and the third switch are all normally closed, the first voltage value of the programmable power supply in the first working mode and the third voltage value of the first charging resistor in the first charging circuit are measured and recorded, so as to ensure the accuracy of the Y capacitor test result.

[0032] Optionally, the test method of the Y capacitor also includes: controlling the second switch and the third switch to be disconnected and the first switch to be closed, detecting the first output voltage of the discharge resistor and the second output voltage of the programmable power supply, judging whether the first output voltage and the second output voltage meet the preset conditions, and if so, generating a second test instruction in the test instruction, the second test instruction is used to measure and record the second voltage value of the programmable power supply in the second working mode and the fourth voltage value of the second charging resistor in the second charging circuit on the charging circuit. In this embodiment, after completing the measurement and recording of the first voltage value and the third voltage value, the second switch and the third switch are controlled to be disconnected and the first switch is closed, and the voltage that may exist in the Y capacitor is released again through the discharge circuit, thereby ensuring that when the second test instruction is executed, the voltage across the Y capacitor in the initial state is zero, further ensuring the accuracy of the Y capacitor test result.

[0033] Optionally, generating a second test instruction in the test instruction includes: controlling the first switch to be disconnected, the third switch and the fourth switch to be closed, detecting the working states of the first switch, the third switch and the fourth switch, and generating a second test instruction when the first switch is normally disconnected and the third switch and the fourth switch are both normally closed. Wherein, the fourth switch is arranged in parallel with the second switch. When the first switch is disconnected and the third switch and the fourth switch are closed, the second charging circuit is in a working state and the programmable power supply is in a second working mode. When the first switch is normally disconnected and the third switch and the fourth switch are both normally closed, the second voltage value of the programmable power supply in the second working mode and the fourth voltage value of the second charging resistor in the second charging circuit are measured and recorded, thereby further ensuring the accuracy of the Y capacitor test result.

[0034] Optionally, the test method of the Y capacitor also includes: controlling the fourth switch to be disconnected and the first switch to be closed, detecting the first output voltage of the discharge resistor and the second output voltage of the programmable power supply, judging whether the first output voltage and the second output voltage meet the preset conditions, and controlling the first switch to be disconnected when the first output voltage and the second output voltage meet the preset conditions, and generating a stop test message. After completing the measurement and recording of the second voltage value and the fourth voltage value, the third switch and the fourth switch are controlled to be disconnected and the first switch is closed. At this time, the discharge circuit is in a working state, and the voltage that may exist in the Y capacitor is released again through the discharge circuit, which can prevent the voltage that may exist in the Y capacitor from causing a risk of electric shock to personnel, thereby ensuring the safety of the test process.

[0035] Optionally, the Y capacitor test method further includes: generating a test stop message and an error message when the first output voltage and the second output voltage do not meet a preset condition, so as to ensure the accuracy and reliability of the test result.

[0036] Optionally, based on multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor, the capacitance value of the Y capacitor is determined, including: based on the third voltage value and the first resistance value of the first charging resistor, determining the first charging current of the first charging circuit, based on the fourth voltage value and the second resistance value of the second charging resistor, determining the second charging current of the second charging circuit; based on the first charging current, the first resistance value, the first voltage value, the second charging current, the second resistance value and the second voltage value, determining the capacitance value of the Y capacitor. In this embodiment, the first resistance value and the second resistance value are both known values. When the first charging circuit is in a working state, the current flowing through the first charging resistor and the Y capacitor is the first charging current, and when the second charging circuit is in a working state, the current flowing through the second charging resistor and the Y capacitor is the second charging current. The capacitance value of the Y capacitor is determined based on the first charging current, the first resistance value, the first voltage value, the second charging current, the second resistance value and the second voltage value, rather than directly measuring the voltage across the Y capacitor to determine the capacitance value of the Y capacitor, which fully considers the influence of the resistance value of the entire Y capacitor measurement circuit on the capacitance value of the Y capacitor, thereby ensuring that the result of the value of the Y capacitor obtained by the test is more accurate.

[0037] According to another specific embodiment of the present application, a Y capacitor testing device is also provided. Figure 4 As shown, the test device includes a control unit 41, a detection unit 42, a judgment unit 43, a generation unit 44 and a determination unit 45, wherein the control unit 41 is used to control the closing of the first switch on the discharge circuit, the detection unit 42 is used to detect the first output voltage of the discharge resistor on the discharge circuit and the second output voltage of the programmable power supply, the judgment unit 43 is used to determine whether the first output voltage and the second output voltage meet the preset conditions, and the generation unit 44 is used to generate a test instruction, wherein the test instruction is used to measure and record multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor on the charging circuit. The determination unit 45 determines the capacitance value of the Y capacitor based on the multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor.

[0038] In this embodiment, the discharge circuit ensures that the voltage across the Y capacitor is zero in the initial state, and the voltage value of the charging resistor is used to replace the voltage of the Y capacitor, and the resistance of the entire charging circuit and the discharge circuit is estimated. The value of the Y capacitor can be calculated more accurately, solving the technical problem of inaccurate measurement results of the Y capacitor value in non-RESS Y capacitor tests.

[0039] According to another specific embodiment of the present application, a computer-readable storage medium is also provided, and the computer-readable storage medium includes a stored program, wherein when the program is running, the device where the computer-readable storage medium is located is controlled to execute the steps of the test method in the above embodiment.

[0040] According to another specific embodiment of the present application, a processor is further provided, and the processor is used to run a program, wherein the steps of the testing method in the above embodiment are executed when the program is running.

[0041] According to another specific embodiment of the present application, a Y capacitor testing system is also provided. Figure 3 The figure shows a block diagram of the Y capacitor test system. The Y capacitor test system includes a host computer, a programmable power supply, a Y capacitor test device and a high-voltage assembly to be tested. Among them, the host computer is used to control the entire Y capacitor test process, and the host computer is connected to the communication interface of the programmable power supply and exchanges information, and is connected to the communication interface of the Y capacitor test device and exchanges information. The programmable power supply is used to output energy to the outside, connected to the host computer through the communication interface, and connected to the Y capacitor test device through the power output interface. The Y capacitor test device is used to implement the Y capacitor test process, and is respectively connected to the host computer, the programmable power supply and the high-voltage assembly to be tested. The high-voltage assembly to be tested is connected to the Y capacitor test device as a Y capacitor test object.

[0042] In one specific embodiment of the present application, a Y capacitor is formed between the high voltage assembly and the low voltage system, and the capacitance value of the Y capacitor is measured by testing the high voltage assembly, such as Figure 2Shown is a circuit diagram between a program-controlled power supply, a Y capacitor test device, and a high-voltage assembly to be tested. Wherein Uc represents the voltage at both ends of the high-voltage assembly to be tested, and Us represents the voltage at both ends of the program-controlled power supply. The Y capacitor test device includes an input power positive, an input power ground, a switch S1, a resistor R1, a switch S2, a resistor R2, a switch S3, a resistor R3, an output positive, an output ground, and a communication interface. The input power positive is used to connect the auxiliary power supply (the auxiliary power supply in this application is a program-controlled power supply) to the Y capacitor test device. The input power ground is used to connect the auxiliary power ground to the Y capacitor test device. Switch S1 and resistor R1 together connect the input power positive to the output positive, and the host computer controls switch S1 to be closed or disconnected to achieve the on-off between the input power positive and the output positive. Switch S2 and resistor R2 together connect the input power positive to the output positive, and the host computer controls switch S2 to be closed or disconnected to achieve the on-off between the input power positive and the output positive. The switch S3 and the resistor R3 together connect the input power positive to the output positive, and the upper computer controls the switch S3 to be closed or disconnected to realize the on-off between the output positive and the output ground. The switch S4 is used to connect the input power ground to the output ground, and the upper computer controls the switch S4 to be closed or disconnected to realize the on-off between the input power ground and the output ground. The output positive is used to connect the Y capacitor test device to the high-voltage live part of the high-voltage assembly under test. The output ground is used to connect the Y capacitor test device to the housing of the high-voltage assembly under test. The communication interface is used to exchange information between the upper computer and the Y capacitor test device. Specifically, the communication interface includes a low-voltage power supply interface, a switch S1 drive interface, a switch S2 drive interface, a switch S3 drive interface, a switch S4 drive interface, a resistor R1 voltage signal interface, a resistor R2 voltage signal interface, and a resistor R3 voltage signal interface. The low-voltage power supply interface is used for switch control power supply, including a 12V power supply and GND. The switch S1 drive interface is used to drive the switch S1, including two pins of the switch S1. The switch S2 drive interface is used to drive the switch S2, including two pins of the switch S2. The switch S3 driving interface is used to drive the switch S3, including two pins of the switch S3. The switch S4 driving interface is used to drive the switch S4, including two pins of the switch S4. The resistor R1 voltage signal interface is used to collect the voltage of the resistor R1, including two pins of the resistor R1. The resistor R2 voltage signal interface is used to collect the voltage of the resistor R2, including two pins of the resistor R2. The resistor R3 voltage signal interface is used to collect the voltage of the resistor R3, including two pins of the resistor R3.

[0043] The above-mentioned Y capacitor test system is used to test the capacitance value of the Y capacitor, and the Y capacitor test system adopts the test method of the Y capacitor in the above-mentioned method embodiment during the test process. The steps of testing the capacitance value of the Y capacitor with the Y capacitor test system can be summarized as follows: control the closing switch S3 to discharge the Y capacitor, disconnect the switch S3 when the Y capacitor voltage is less than the voltage threshold 1, pull the switch S1 and the switch S4, record the voltage value after the program-controlled power supply outputs, the program-controlled power supply stops outputting and disconnects the switch S1 and the switch S4, close the switch S3 to discharge the Y capacitor, disconnect the switch S3 when the Y capacitor voltage is less than the voltage threshold 1, pull the switch S2 and the switch S4, record the voltage value after the program-controlled power supply outputs, the program-controlled power supply stops outputting and disconnects the switch S2 and the switch S4, close the switch S3 to discharge the Y capacitor, and disconnect the switch S3 when the Y capacitor voltage is less than the voltage threshold 1, and the Y capacitor test process ends. Calculate the Y capacitor value according to the corresponding recorded value.

[0044] Specifically, in the process of testing the capacitance value of the Y capacitor by the above Y capacitor testing system, the detailed process steps of the Y capacitor testing method in the above method embodiment are as follows:

[0045] Step S1, start the Y capacitor test;

[0046] Step S2, detecting the state of the program-controlled power supply,

[0047] Step S3, detecting the states of switch S1, switch S2, switch S3, and switch S4;

[0048] Step S4, detecting the input voltage of the Y capacitor testing device;

[0049] Step S5, detecting the voltage of resistor R1, the voltage of resistor R2, and the voltage of resistor R3;

[0050] Step S6, detecting the output voltage of the Y capacitor testing device;

[0051] Step S7, close the switch S3 and check the state of the switch S3. If the switch S3 is normally closed, continue the test; otherwise, end the test process and report an error.

[0052] Step S8, continuously detecting the voltage of the resistor R3 and the output voltage of the Y capacitor test device. If the voltage of the resistor R3 and the output voltage of the Y capacitor test device are less than the voltage threshold 1 within the time threshold, the switch S3 is disconnected. Otherwise, after a period of time, the test process is terminated and an error is reported. If the switch S3 is normally disconnected, the test process continues. Otherwise, the test process is terminated and an error is reported.

[0053] Step S9, close the switch S1 and check the state of the switch S1. If the switch S1 is closed normally, continue the test; otherwise, end the test process and report an error.

[0054] Step S10, close switch S4 and check the state of switch S1. If switch S4 is closed normally, continue the test, otherwise end the test process and report an error.

[0055] Step S11, issuing a program-controlled power supply output jump voltage command, recording the input voltage of the Y capacitor test device and the voltage across R1;

[0056] Step S12, issuing a program-controlled power supply output stop command;

[0057] Step S13, disconnect the switch S1 and check the state of the switch S1. If the switch S1 is disconnected normally, continue the test. Otherwise, terminate the test process and report an error.

[0058] Step S14, disconnect the switch S4 and check the state of the switch S1. If the switch S4 is disconnected normally, continue the test. Otherwise, terminate the test process and report an error.

[0059] Step S15, close the switch S3 and check the state of the switch S3. If the switch S3 is normally closed, continue the test; otherwise, end the test process and report an error.

[0060] Step S16, continuously detecting the voltage of the resistor R3 and the output voltage of the Y capacitor test device. If the voltage of the resistor R3 and the output voltage of the Y capacitor test device are less than the voltage threshold 1 within the time threshold, the switch S3 is disconnected. Otherwise, after a period of time, the test process is terminated and an error is reported. If the switch S3 is normally disconnected, the test process continues. Otherwise, the test process is terminated and an error is reported.

[0061] Step S17, close the switch S2 and check the state of the switch S2. If the switch S2 is closed normally, continue the test; otherwise, end the test process and report an error.

[0062] Step S18, close switch S4 and check the state of switch S1. If switch S4 is closed normally, continue the test, otherwise terminate the test process and report an error.

[0063] Step S19, issuing a program-controlled power supply output jump voltage command, recording the input voltage of the Y capacitor test device and the voltage across R1;

[0064] Step S20, issuing a program-controlled power supply output stop command;

[0065] Step S21, disconnect the switch S2 and check the state of the switch S2. If the switch S2 is disconnected normally, continue the test. Otherwise, terminate the test process and report an error.

[0066] Step S22, disconnect the switch S4 and check the state of the switch S1. If the switch S4 is disconnected normally, continue the test; otherwise, terminate the test process and report an error.

[0067] Step S23, close the switch S3 and check the state of the switch S3. If the switch S3 is normally closed, continue the test; otherwise, end the test process and report an error.

[0068] Step S24, continuously detect the voltage of resistor R3 and the output voltage of the Y capacitor test device, if within the time threshold, the voltage of resistor R3 and the output voltage of the Y capacitor test device are less than the voltage threshold 1, then disconnect the switch S3, otherwise after a period of time, end the test process and report an error. At this point, the test process is completed.

[0069] Among them, switch S3 is the first switch in the above embodiment, switch S1 is the second switch in the above embodiment, switch S2 is the fourth switch in the above embodiment, and switch S4 is the third switch in the above embodiment. Resistor R1 is the first charging resistor in the above embodiment, resistor R2 is the second charging resistor in the above embodiment, and resistor R3 is the discharge resistor in the above embodiment. The specific calculation of the capacitance value of the Y capacitor is as follows:

[0070] 1) The voltage value across the charging resistor at a certain moment:

[0071] U R (t) = U R1 (t)

[0072] 2) Charging resistor current at a certain moment:

[0073] I(t)=(U R (t)) / (R1)=U R1 (t) / R1

[0074] 3) The voltage across the capacitor at a certain moment:

[0075] U c (t) = U S (1-e -t / RC )

[0076] 4) Charging current of capacitor Y at a certain moment:

[0077] I(t)=C(du) / (dt)=CU S d(1-e -t / RC ) / dt=CU S e -t / RC

[0078] 5) At a certain moment, switch S1 and switch S4 are closed:

[0079] I(t)=U R1 (t) / R1=CU S1 e -t / RC =CU S1 e -t / (R1+Ri)C

[0080] 6) At a certain moment, switch S2 and switch S4 are closed:

[0081] I(t)=U R2 (t) / R2=CU S2 e -t / RC =CU S2 e -t / (R2+Ri)C

[0082] Where: R1, R2 are known resistances, a certain moment t is a known time, U S1 and U S2 are the output voltage values ​​of the two sets of programmable power supplies at time t, U S1 That is, the first voltage value of the programmable power supply in the first working mode, U S2 That is, it is the third voltage value of the programmable power supply in the second working mode. R1 (t) is the voltage value of the resistor R1 at time t, that is, the third voltage value of the first charging resistor when the first charging circuit is in the working state. R2 (t) is the voltage value of resistor R2 at time t, U R2 (t) is also the fourth voltage value of the second charging resistor when the second charging circuit is in the working state. S1 and U S2 , U R1 (t) and U R2 (t) are all known values. The specific value of the capacitor can be calculated from the formulas in 5) and 6), which is the capacitance value of the Y capacitor.

[0083] The serial numbers of the above embodiments of the present invention are only for description and do not represent the advantages or disadvantages of the embodiments.

[0084] In the above embodiments of the present invention, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0085] In the several embodiments provided in this application, it should be understood that the disclosed technical content can be implemented in other ways. Among them, the device embodiments described above are only schematic. For example, the division of the units can be a logical function division. There may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be through some interfaces, indirect coupling or communication connection of units or modules, which can be electrical or other forms.

[0086] The units described as separate components may or may not be physically separated, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed on multiple units. Some or all of the units may be selected according to actual needs to achieve the purpose of the present embodiment.

[0087] In addition, each functional unit in each embodiment of the present invention may be integrated into one processing unit, or each unit may exist physically separately, or two or more units may be integrated into one unit. The above-mentioned integrated unit may be implemented in the form of hardware or in the form of software functional units.

[0088] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, in essence, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product, and the computer software product is stored in a storage medium, including a number of instructions for a computer device (which can be a personal computer, a server or a network device, etc.) to perform all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: U disk, read-only memory (ROM, Read-Only Memory), random access memory (RAM, Random Access Memory), mobile hard disk, magnetic disk or optical disk and other media that can store program codes.

[0089] The above is only a preferred embodiment of the present invention. It should be pointed out that for ordinary technicians in this technical field, several improvements and modifications can be made without departing from the principle of the present invention. These improvements and modifications should also be regarded as the scope of protection of the present invention.

Claims

1. A method for testing a Y capacitor, characterized in that: include: Controlling the first switch on the discharge circuit to close; Detecting a first output voltage of a discharge resistor on the discharge circuit and a second output voltage of a programmable power supply; Determining whether the first output voltage and the second output voltage meet a preset condition; If yes, generate a test instruction, wherein the test instruction is used to measure and record multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor on the charging circuit; Determine the capacitance value of the Y capacitor based on the multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor; The programmable power supply is arranged in series with the first charging circuit, the Y capacitor, and the third switch on the charging circuit; the second charging circuit on the charging circuit is arranged in parallel with the first charging circuit; the discharge circuit is arranged in parallel with the Y capacitor; the first charging circuit is arranged in series with the second switch and the first charging resistor; the second charging circuit is arranged in series with the fourth switch and the second charging resistor; and the discharge circuit is arranged in series with the first switch and the discharge resistor; Generating the test instruction includes: Controlling the first switch to be opened, and the second switch and the third switch to be closed; Detecting the working states of the first switch, the second switch, and the third switch; When the first switch is normally opened and the second switch and the third switch are both normally closed, a first test instruction in the test instructions is generated, wherein the first test instruction is used to measure and record a first voltage value of the programmable power supply in the first working mode and a third voltage value of the first charging resistor in the first charging circuit; The Y capacitor testing method further includes: Control the second switch and the third switch to be opened and the first switch to be closed; detecting the first output voltage of the discharge resistor and the second output voltage of the programmable power supply; Determining whether the first output voltage and the second output voltage meet a preset condition; If yes, generate a second test instruction in the test instruction, wherein the second test instruction is used to measure and record a second voltage value of the programmable power supply in the second working mode and a fourth voltage value of the second charging resistor in the second charging circuit; Generating the second test instruction in the test instructions includes: Controlling the first switch to be opened, and the third switch and the fourth switch to be closed; Detecting the working states of the first switch, the third switch, and the fourth switch; When the first switch is normally opened, and the third switch and the fourth switch are both normally closed, generating the second test instruction; Determining the capacitance value of the Y capacitor based on the multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor includes: determining a first charging current of the first charging circuit based on the third voltage value and a first resistance value of the first charging resistor; determining a second charging current of the second charging circuit based on the fourth voltage value and a second resistance value of the second charging resistor; The capacitance value of the Y capacitor is determined based on the first charging current, the first resistance value, the first voltage value, the second charging current, the second resistance value, and the second voltage value.

2. The method for testing a Y capacitor according to claim 1, characterized in that: The Y capacitor testing method further includes: Control the third switch and the fourth switch to be opened and the first switch to be closed, detecting the first output voltage of the discharge resistor and the second output voltage of the programmable power supply; Determining whether the first output voltage and the second output voltage meet the preset condition; When the first output voltage and the second output voltage meet the preset condition, the first switch is controlled to be disconnected, and test stop information is generated.

3. The Y capacitor testing method according to claim 2, characterized in that: The Y capacitor testing method further includes: When the first output voltage and the second output voltage do not satisfy the preset condition, the test stop information and the error information are generated.

4. A Y capacitor test device, characterized in that: The Y capacitor test device is tested by using the Y capacitor test method according to any one of claims 1 to 3, and the Y capacitor test device comprises: A control unit, used for controlling the first switch on the discharge circuit to close; A detection unit, used for detecting a first output voltage of a discharge resistor on the discharge circuit and a second output voltage of a programmable power supply; A judging unit, used to judge whether the first output voltage and the second output voltage meet a preset condition; A generating unit, used to generate a test instruction, wherein the test instruction is used to measure and record a plurality of voltage values ​​of the programmable power supply in different working modes and a voltage value of a charging resistor on a charging circuit; The determining unit determines the capacitance value of the Y capacitor based on the multiple voltage values ​​of the programmable power supply in different working modes and the voltage value of the charging resistor.

5. A computer-readable storage medium, characterized in that: The computer-readable storage medium includes a stored program, wherein when the program is executed, the device where the computer-readable storage medium is located is controlled to execute the test method according to any one of claims 1 to 3.

6. A processor, characterized in that: The processor is used to run a program, wherein the program executes the testing method according to any one of claims 1 to 3 when running.

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