SSD Performance Testing and Analysis Method, Device, Computer Equipment, and Storage Medium

Abstract

The present invention relates to an SSD performance test analysis method, device, computer equipment and storage medium. The method includes: determining whether the SSD performance test is a functional test; if so, randomly selecting several blocks of the NAND medium for erase-read-write tests and recording the running time of erase-read-write for each block; comparing the running time of erase-read-write for each block with the standard value in the NAND specification, and intercepting the blocks with a running time lower than the standard value; if not, the SSD performance test is an aging test, and erase-read-write tests are performed on all blocks in the NAND medium; comparing the erase running time, write average running time and read average running time of each block with the standard value in the NAND specification, and marking the blocks with a running time lower than the standard value as bad blocks. The present invention improves the SSD test coverage and analysis efficiency, and effectively performs SSD performance screening and interception work.

Description

Technical Field

[0001] The present invention relates to the technical field of SSD performance testing, in particular to an SSD performance testing and analysis method, device, computer device and storage medium. Background Art

[0002] In the existing SSD test system, SSD performance, as a key indicator, is related to the quality of the NAND medium, the SSD main control logic circuit, and the FW (firmware) design quality. Currently, system testing and screening are often required before leaving the factory, resulting in low test coverage and easy test leakage in terms of test efficiency, leading to unqualified SSD performance. Summary of the Invention

[0003] The purpose of the present invention is to overcome the deficiencies of the prior art and provide an SSD performance testing and analysis method, device, computer device and storage medium.

[0004] To solve the above technical problems, the present invention adopts the following technical solutions:

[0005] In the first aspect, this embodiment provides an SSD performance testing and analysis method, including the following steps:

[0006] Judge whether the SSD performance test is a function test;

[0007] If the SSD performance test is a function test, randomly select several blocks for erase-write-read tests on the NAND medium, and record the running time of erase-write-read for each block;

[0008] Compare the running time of erase-write-read for each block with the standard value in the NAND specification book, and intercept the blocks with a running time lower than the standard value;

[0009] If the SSD performance test is not a function test, then the SSD performance test is an aging test. Conduct erase-write-read tests on all blocks in the NAND medium. Among them, the running time of the erase test is recorded in units of blocks, and the running time of the write test and read test is recorded in units of pages. Average the running time of all pages under the same block to obtain the average write running time and average read running time for each block;

[0010] Compare the erase running time, average write running time, and average read running time for each block with the standard value in the NAND specification book, and mark the blocks with a running time lower than the standard value as bad blocks.

[0011] Its further technical solution is as follows: If the SSD performance test is a functional test, then several blocks are randomly selected from the NAND medium for erase-write-read tests, and the running time of erase-write-read for each block is recorded. In the step of random selection, random selection means randomly selecting test blocks by using the random function; the erase-write-read test specifically refers to issuing erase, write, and read instructions to the NAND particles respectively to perform erase-write-read operations.

[0012] Its further technical solution is as follows: In the step of comparing the running time of erase-write-read of each block with the standard value in the NAND specification book and intercepting the blocks with running time lower than the standard value, the NAND specification book refers to the specification guidance manual of NAND, which records the standard value; the blocks with running time lower than the standard value are intercepted and directly determined as defective blocks.

[0013] Its further technical solution is as follows: In the step of comparing the erase running time, write average running time, and read average running time of each block with the standard value in the NAND specification book and marking the blocks with running time lower than the standard value as bad blocks, comparison means making a size comparison between the erase running time, write average running time, read average running time and the standard value specified in the NAND specification book.

[0014] In the second aspect, this embodiment provides an SSD performance test analysis device, including: a judgment unit, a selection test recording unit, a comparison and interception unit, a test record processing unit, and a comparison and marking unit;

[0015] The judgment unit is used to judge whether the SSD performance test is a functional test;

[0016] The selection test recording unit is used to, if the SSD performance test is a functional test, randomly select several blocks from the NAND medium for erase-write-read tests and record the running time of erase-write-read for each block;

[0017] The comparison and interception unit is used to compare the running time of erase-write-read of each block with the standard value in the NAND specification book and intercept the blocks with running time lower than the standard value;

[0018] The test record processing unit is used to, if the SSD performance test is not a functional test, that is, the SSD performance test is an aging test, perform erase-write-read tests on all blocks in the NAND medium. Among them, the erase test records the running time in units of blocks, the write test and the read test record the running time in units of pages, and the running time of all pages under the same block is averaged to obtain the write average running time and the read average running time of each block;

[0019] The comparison and marking unit is used to compare the erase running time, write average running time, and read average running time of each block with the standard value in the NAND specification book and mark the blocks with running time lower than the standard value as bad blocks.

[0020] Its further technical solution is as follows: In the selection test recording unit, random selection means randomly selecting test blocks by using the random function; the erase-write-read test specifically refers to issuing erase, write, and read instructions to NAND particles respectively to perform erase-write-read operations.

[0021] Its further technical solution is as follows: In the comparison and interception unit, the NAND specification refers to the NAND specification guidance manual, which records standard values; blocks with values lower than the standard values are intercepted and directly determined to be defective blocks.

[0022] Its further technical solution is as follows: In the comparison and marking unit, comparison means comparing the erase running time, write average running time, read average running time with the standard values specified in the NAND specification book for size.

[0023] In a third aspect, this embodiment provides a computer device, which includes a memory and a processor. A computer program is stored on the memory, and when the processor executes the computer program, the SSD performance test and analysis method as described above is implemented.

[0024] In a fourth aspect, this embodiment provides a storage medium, which stores a computer program. The computer program includes program instructions, and when the program instructions are executed by a processor, the SSD performance test and analysis method as described above can be implemented.

[0025] The beneficial effects of the present invention compared with the prior art are as follows: By adding NAND media performance tests in the functional test and aging test stages, the SSD performance test is advanced and the coverage is improved. In the functional test, the erase-write-read test is performed on NAND random blocks to measure the block erase-write-read performance indicators, and abnormal NAND media samples are intercepted in advance. In the aging test stage, the coverage is improved, and the erase-write-read performance test is performed on all blocks, and blocks with lower performance are screened and marked as bad blocks to improve the overall performance of the SSD.

[0026] The present invention will be further described below with reference to the accompanying drawings and specific embodiments. Description of the Drawings

[0027] In order to more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the accompanying drawings required for use in the embodiments or the description of the prior art. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, other accompanying drawings can be obtained based on these drawings without creative efforts.

[0028] Figure 1 It is a flowchart of the SSD performance test and analysis method provided by the embodiment of the present invention;

[0029] Figure 2 Schematic block diagram of the SSD performance test and analysis device provided by the embodiment of the present invention;

[0030] Figure 3 Schematic block diagram of the computer device provided by the embodiment of the present invention. Detailed implementation manners

[0031] Next, the technical solutions in the embodiments of the present invention will be clearly and completely described in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are part of the embodiments of the present invention, rather than all the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0032] It should be understood that when used in this specification and the appended claims, the terms "comprises" and "comprising" indicate the presence of the described features, wholes, steps, operations, elements, and / or components, but do not exclude the presence or addition of one or more other features, wholes, steps, operations, elements, components, and / or their combinations.

[0033] It should also be understood that the terms used in this specification of the present invention are only for the purpose of describing specific embodiments and are not intended to limit the present invention. As used in this specification of the present invention and the appended claims, unless the context clearly indicates otherwise, the singular forms "a", "an", and "the" are intended to include the plural forms.

[0034] It should be further understood that the term " / and / " used in this specification of the present invention and the appended claims refers to any combination and all possible combinations of one or more of the associated listed items, and includes these combinations.

[0035] Please refer to Figure 1 In the specific embodiment shown, the present invention discloses an SSD performance test and analysis method, including the following steps:

[0036] S1, determine whether the SSD performance test is a functional test;

[0037] Specifically, the functional test is the first process after SMT, and the electrical performance function of the device is tested at room temperature to see if it is normal; the aging test is a reliability test of the device at high temperature after the functional test.

[0038] S2, if the SSD performance test is a functional test, randomly select several blocks for erase, write, and read tests for the NAND medium, and record the running time of erase, write, and read for each block;

[0039] Specifically, in step S2, random selection means randomly selecting test blocks by using the random function; the erase-write-read test specifically refers to issuing erase, write, and read commands to NAND flash memory particles respectively to perform erase-write-read operations.

[0040] S3. Compare the running time of erase-write-read for each block with the standard value in the NAND specification book, and intercept the blocks with a running time lower than the standard value.

[0041] Specifically, in step S3, the NAND specification book refers to the NAND specification instruction manual, which records the standard value; intercept the blocks with a running time lower than the standard value and directly determine them as bad blocks.

[0042] Specifically, the standard value can be set according to actual needs, for example: 100us, 190us, or 300us, etc.

[0043] Specifically, after being determined as bad blocks, these bad blocks will be skipped in subsequent tests.

[0044] Specifically, in the functional test, for each CH, CE, and DIE of the SSD, select 6 blocks for the TLC mode EPR (erase-write-read) test, record the output Busytime (running time) of erase-write-read, output it to the Log log, and intercept the SSD with low performance by comparing and verifying the Busytime and the standard value in the NAND Spec (NAND specification book).

[0045] S4. If the SSD performance test is not a functional test, then the SSD performance test is an aging test. Perform erase-write-read tests on all blocks in the NAND medium. Among them, record the running time in units of blocks for the erase test, record the running time in units of pages for the write test and the read test, and average the running time of all pages under the same block to obtain the average write running time and the average read running time for each block.

[0046] Specifically, the average running time = the running time of the same block / the number of pages.

[0047] S5. Compare the erase running time, the average write running time, and the average read running time of each block with the standard value in the NAND specification book, and mark the blocks with a running time lower than the standard value as bad blocks.

[0048] Specifically, in step S5, the comparison means comparing the erase running time, the average write running time, and the average read running time with the standard value specified in the NAND specification book. If the erase running time, the average write running time, and the average read running time are less than the standard value, they will be marked as bad blocks.

[0049] Specifically, the standard value can be set according to actual needs, for example: 100us, 190us, or 300us, etc.

[0050] Specifically, after marking the blocks below the standard value as bad blocks, these bad blocks will be skipped in subsequent tests.

[0051] Specifically, in the aging test, SLC-mode EPR is performed on all CH, CE, DIE, and Block of the SSD. Among them, for Erase (erase), the Busytime is recorded in units of Block, and for Program (write) and Read (read), the Busytime is recorded in units of Page (page). However, the amount of Busytime record data for each Page will be very large. Therefore, during the test process, the Busytime of all Pages under the same Block is averaged to calculate the Program and Read Busytime of a single Block. If the Busytime of a certain Block does not meet the standard, the corresponding Block will be marked as a bad block, thereby improving the overall performance of the SSD.

[0052] The present invention also designs different strategies for different SSD firmware, such as dynamic SLC or static SLC. There will also be different strategy calculations for performance prediction in the BIST stage. If it is a static SLC design, BIST will perform SLC performance prediction on the static SLC area, and predict the performance indicators of the SSD through Busytime.

[0053] The present invention realizes the forward movement and coverage improvement of SSD performance testing by adding NAND media performance testing in the functional test and aging test stages. In the functional test, random blocks of NAND are subjected to erase, write, and read tests to measure the block erase, write, and read performance indicators, and abnormal NAND media samples are intercepted in advance. In the aging test stage, the coverage is improved, and all blocks are subjected to erase, write, and read performance tests. Blocks with lower performance are screened and marked as bad blocks to improve the overall performance of the SSD.

[0054] Please refer to Figure 2 As shown, the present invention also discloses an SSD performance test and analysis device, including: a judgment unit 10, a selection test record unit 20, a comparison and interception unit 30, a test record processing unit 40, and a comparison and marking unit 50;

[0055] The judgment unit 10 is used to judge whether the SSD performance test is a functional test;

[0056] The selection test record unit 20 is used to, if the SSD performance test is a functional test, randomly select several blocks of the NAND medium for erase, write, and read tests, and record the running time of erase, write, and read for each block;

[0057] The comparison and interception unit 30 is configured to compare the running time of erasing, writing, and reading of each block with the standard value in the NAND specification book, and intercept the blocks with a running time lower than the standard value.

[0058] The test record processing unit 40 is configured to, if the SSD performance test is not a functional test, then the SSD performance test is an aging test. Perform erasing, writing, and reading tests on all blocks in the NAND medium. Among them, the running time of the erasing test is recorded in units of blocks, and the running time of the writing test and the reading test is recorded in units of pages. The running time of all pages under the same block is averaged to obtain the average running time of writing and the average running time of reading for each block.

[0059] The comparison and marking unit 50 is configured to compare the erasing running time, the average running time of writing, and the average running time of reading of each block with the standard value in the NAND specification book, and mark the blocks with a running time lower than the standard value as bad blocks.

[0060] Among them, in the selection test record unit 20, random selection refers to randomly selecting test blocks by using the random function; the erasing, writing, and reading test specifically refers to issuing erasing, writing, and reading instructions to the NAND particles respectively to perform erasing, writing, and reading operations.

[0061] Among them, in the comparison and interception unit 30, the NAND specification book refers to the NAND specification guidance manual, which records the standard value; intercept the blocks with a running time lower than the standard value and directly determine them as bad blocks.

[0062] Among them, in the comparison and marking unit 50, comparison refers to comparing the erasing running time, the average running time of writing, and the average running time of reading with the standard value specified in the NAND specification book to make a size comparison.

[0063] It should be noted that those skilled in the art can clearly understand that the specific implementation processes of the above SSD performance test analysis device and each unit can refer to the corresponding descriptions in the foregoing method embodiments. For the sake of convenience and brevity of description, they will not be elaborated here.

[0064] The above SSD performance test analysis device can be implemented in the form of a computer program, and this computer program can run on a computer device as shown in Figure 3 shown.

[0065] Please refer to Figure 3 , Figure 3 which is a schematic block diagram of a computer device provided by an embodiment of the present application; the computer device 500 can be a terminal or a server. Among them, the terminal can be an electronic device with a communication function such as a smart phone, a tablet computer, a notebook computer, a desktop computer, a personal digital assistant, and a wearable device. The server can be an independent server or a server cluster composed of multiple servers.

[0066] Refer to Figure 3 , the computer device 500 includes a processor 502, a memory, and a network interface 505 connected via a system bus 501. Among them, the memory may include a non-volatile storage medium 503 and an internal memory 504.

[0067] The non-volatile storage medium 503 can store an operating system 5031 and a computer program 5032. The computer program 5032 includes program instructions that, when executed, can cause the processor 502 to execute an SSD performance test analysis method.

[0068] The processor 502 is used to provide computing and control capabilities to support the operation of the entire computer device 500.

[0069] The internal memory 504 provides an environment for the operation of the computer program 5032 in the non-volatile storage medium 503. When the computer program 5032 is executed by the processor 502, it can cause the processor 502 to execute an SSD performance test analysis method.

[0070] The network interface 505 is used for network communication with other devices. Those skilled in the art can understand that Figure 3 the structure shown in

[0071] is only a block diagram of a part of the structure related to the solution of this application, and does not constitute a limitation on the computer device 500 to which the solution of this application is applied. The specific computer device 500 may include more or fewer components than those shown in the figure, or combine certain components, or have a different component layout.

[0072] Step S1, determine whether the SSD performance test is a functional test;

[0073] Step S2, if the SSD performance test is a functional test, randomly select several blocks for erase-write-read tests on the NAND medium, and record the running time of erase-write-read for each block;

[0074] Step S3, compare the running time of erase-write-read for each block with the standard value in the NAND specification book, and intercept the blocks with a running time lower than the standard value;

[0075] Step S4, if the SSD performance test is not a functional test, then the SSD performance test is an aging test. Perform read / write / erase tests on all blocks in the NAND medium. Among them, the erase test records the running time in units of blocks, and the write test and read test record the running time in units of pages. Average the running time of all pages under the same block to obtain the average write running time and average read running time of each block;

[0076] Step S5, compare the erase running time, average write running time, and average read running time of each block with the standard values in the NAND specification book, and mark the blocks with running times lower than the standard values as bad blocks.

[0077] It should be understood that in the embodiments of the present application, the processor 502 may be a central processing unit (CPU), and the processor 502 may also be other general-purpose processors, digital signal processors (DSPs), application specific integrated circuits (ASICs), field-programmable gate arrays (FPGAs) or other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. Among them, the general-purpose processor may be a microprocessor or the processor may also be any conventional processor, etc.

[0078] Those of ordinary skill in the art can understand that all or part of the processes in the methods of the above embodiments can be completed by instructing relevant hardware through a computer program. The computer program includes program instructions, and the computer program can be stored in a storage medium, and the storage medium is a computer-readable storage medium. The program instructions are executed by at least one processor in the computer system to implement the process steps of the embodiments of the above methods.

[0079] Therefore, the present invention also provides a storage medium. The storage medium may be a computer-readable storage medium. The storage medium stores a computer program, where the computer program includes program instructions, and the program instructions can implement the above SSD performance test analysis method when executed by a processor. The storage medium stores a computer program, the computer program includes program instructions, and the program instructions can implement the above method when executed by a processor. The program instructions include the following steps:

[0080] Step S1, determine whether the SSD performance test is a functional test;

[0081] Step S2, if the SSD performance test is a functional test, randomly select several blocks of the NAND medium for read-write-erase tests, and record the running time of read-write-erase for each block.

[0082] Step S3, compare the running time of read-write-erase for each block with the standard value in the NAND specification, and intercept the blocks with running time lower than the standard value.

[0083] Step S4, if the SSD performance test is not a functional test, then the SSD performance test is an aging test. Conduct read-write-erase tests on all blocks of the NAND medium. Among them, record the running time in units of blocks for the erase test, and record the running time in units of pages for the write test and the read test. Average the running time of all pages under the same block to obtain the average write running time and the average read running time for each block.

[0084] Step S5, compare the erase running time, the average write running time, and the average read running time for each block with the standard value in the NAND specification, and mark the blocks with running time lower than the standard value as bad blocks.

[0085] The storage medium may be various computer-readable storage media such as a USB flash drive, a portable hard disk, a read-only memory (ROM), a magnetic disk, or an optical disc, etc., which can store program codes.

[0086] Those of ordinary skill in the art can realize that the units and algorithm steps of each example described in combination with the embodiments disclosed herein can be implemented by electronic hardware, computer software, or a combination of the two. To clearly illustrate the interchangeability of hardware and software, the composition and steps of each example have been generally described according to functions in the above description. Whether these functions are executed in a hardware or software manner depends on the specific application and design constraints of the technical solution. Professional technicians can use different methods to implement the described functions for each specific application, but such implementation should not be considered to exceed the scope of the present invention.

[0087] In several embodiments provided by the present invention, it should be understood that the disclosed devices and methods can be implemented in other ways. For example, the device embodiments described above are merely illustrative. For example, the division of each unit is only a logical function division, and there may be other division methods in actual implementation. For example, multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed.

[0088] The steps in the method of the embodiments of the present invention can be adjusted in sequence, combined, and deleted according to actual needs. The units in the device of the embodiments of the present invention can be combined, divided, and deleted according to actual needs. In addition, the functional units in each embodiment of the present invention can be integrated into one processing unit, or each unit can exist physically alone, or two or more units can be integrated into one unit.

[0089] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a storage medium. Based on such an understanding, the technical solution of the present invention, in essence, or the part that makes contributions to the prior art, or all or part of the technical solution, can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for causing a computer device (which can be a personal computer, a terminal, or a network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present invention.

[0090] The above embodiments are preferred implementation solutions of the present invention. In addition, the present invention can also be implemented in other ways. Any obvious replacement without departing from the concept of the technical solution of the present invention is within the protection scope of the present invention.

Claims

1. SSD performance test analysis method, Characterized in that, Comprising the following steps: Judge whether the SSD performance test is a function test; If the SSD performance test is a function test, randomly select several blocks for erase-write-read test on the NAND medium, and record the running time of erase-write-read for each block; Compare the running time of erase-write-read for each block with the standard value in the NAND specification book, and intercept the blocks with running time lower than the standard value; If the SSD performance test is not a function test, then the SSD performance test is an aging test, perform erase-write-read test on all blocks in the NAND medium, where the running time of the erase test is recorded in units of blocks, and the running time of the write test and read test is recorded in units of pages. Average the running time of all pages under the same block to obtain the average running time of write and the average running time of read for each block; Compare the running time of erase, the average running time of write and the average running time of read for each block with the standard value in the NAND specification book, and mark the blocks with running time lower than the standard value as bad blocks; Wherein, the average running time = the running time of the same block / the number of pages.

2. The SSD performance test analysis method according to claim 1, Characterized in that, In the step that if the SSD performance test is a function test, randomly select several blocks for erase-write-read test on the NAND medium, and record the running time of erase-write-read for each block, random selection means randomly selecting test blocks by using the random function; the erase-write-read test specifically refers to issuing erase, write, and read instructions to the NAND particles respectively to perform erase-write-read operations.

3. The SSD performance test analysis method according to claim 1, Characterized in that, In the step of comparing the running time of erase-write-read for each block with the standard value in the NAND specification book, and intercepting the blocks with running time lower than the standard value, the NAND specification book refers to the NAND specification guidance manual, which records the standard value; intercept the blocks with running time lower than the standard value and directly determine them as defective blocks.

4. The SSD performance test analysis method according to claim 1, Characterized in that, In the step of comparing the running time of erase, the average running time of write and the average running time of read for each block with the standard value in the NAND specification book, and marking the blocks with running time lower than the standard value as bad blocks, comparison means comparing the running time of erase, the average running time of write and the average running time of read with the standard value specified in the NAND specification book for size comparison.

5. SSD performance test analysis device, Characterized in that, Comprising: Judgment unit, selection test recording unit, comparison and interception unit, test record processing unit and comparison and marking unit; The judgment unit is used to judge whether the SSD performance test is a function test; The selection test recording unit is used to, if the SSD performance test is a function test, randomly select several blocks for erase-write-read test on the NAND medium, and record the running time of erase-write-read for each block; The comparison and interception unit is used to compare the running time of erase-write-read for each block with the standard value in the NAND specification book, and intercept the blocks with running time lower than the standard value; The test record processing unit is configured to perform a write-read test on all blocks in the NAND medium if the SSD performance test is not a functional test but an aging test. Among them, the running time of the erase test is recorded in units of blocks, and the running times of the write test and the read test are recorded in units of pages. The running times of all pages under the same block are averaged to obtain the average write running time and the average read running time of each block; The comparison and marking unit is configured to compare the erase running time, the average write running time, and the average read running time of each block with the standard values in the NAND specification book, and mark the blocks with running times lower than the standard values as bad blocks; Among them, the average running time = the running time of the same block / the number of pages.

6. The SSD performance test analysis device according to claim 5, wherein, In the selection test record unit, random selection refers to randomly selecting test blocks by using the random function; the write-read test specifically refers to issuing erase, write, and read instructions to the NAND particles respectively to perform write-read operations.

7. The SSD performance test analysis device according to claim 5, wherein, In the comparison and interception unit, the NAND specification book refers to the NAND specification guide manual, which records the standard values; the blocks with running times lower than the standard values are intercepted and directly determined as defective blocks.

8. The SSD performance test analysis device according to claim 5, wherein, In the comparison and marking unit, comparison refers to comparing the erase running time, the average write running time, and the average read running time with the standard values specified in the NAND specification book.

9. A computer device, wherein, The computer device includes a memory and a processor. A computer program is stored on the memory. When the processor executes the computer program, the SSD performance test analysis method according to any one of claims 1-4 is implemented.

10. A storage medium, wherein, The storage medium stores a computer program. The computer program includes program instructions. When the program instructions are executed by a processor, the SSD performance test analysis method according to any one of claims 1-4 can be implemented.

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