Multi-channel voltage acquisition board and aging test equipment

Abstract

The application discloses a kind of multichannel voltage acquisition board and aging test equipment.Therein, multichannel voltage acquisition board includes N groups of sampling circuit, N groups of data processing circuit and main control circuit;Multiple input terminals of each group of the sampling circuit are respectively connected with the output terminal of a group of the power supply equipment to be measured one by one, the output terminal of N groups of sampling circuit is connected with the input terminal of N groups of the data processing circuit one by one, and the output terminal of N groups of the data processing circuit is connected with main control circuit.N groups of sampling circuit sample the output voltage of N groups of the power supply equipment to be measured, and the output voltage sampling signal of each group of the power supply equipment to be measured is output to each group of data processing circuit one by one, so that the number of data processing circuit can be reduced, and the cost of multichannel voltage acquisition board is greatly reduced.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of power supply testing, in particular to a multi-channel voltage acquisition board and an aging test equipment. BACKGROUND

[0002] In recent years, the demand for power supply products is increasing. It is particularly important to monitor the voltage parameters of power supply products, such as voltage values, during the aging process of the power supply.

[0003] The current voltage acquisition board has a small number of acquisition channels, which cannot meet the voltage acquisition of a large number of power supply devices to be tested. Increasing the acquisition channels of the voltage acquisition board will greatly increase the cost of the aging test equipment. SUMMARY

[0004] The main purpose of the present application is to provide a multi-channel voltage acquisition board, which can meet the voltage acquisition of a large number of power supply devices to be tested.

[0005] To achieve the above purpose, the present application provides a multi-channel voltage acquisition board, which is electrically connected with a plurality of groups of power supply devices to be tested carried by a test fixture. The multi-channel voltage acquisition board comprises:

[0006] N groups of sampling circuits, a plurality of input ends of each group of the sampling circuits are connected one by one with output ends of a group of the power supply devices to be tested, each group of the sampling circuits is used for sampling output voltages of a group of the power supply devices to be tested, and outputs voltage sampling signals corresponding to each of the power supply devices to be tested in turn;

[0007] N groups of data processing circuits, input ends of the N groups of the data processing circuits are connected one by one with output ends of the N groups of the sampling circuits, and the data processing circuit is used for voltage conditioning of the voltage sampling signal connected thereto;

[0008] A main control circuit is connected with the N groups of the data processing circuits, respectively, and the main control circuit is used for receiving the voltage sampling signal and uploading to an upper computer.

[0009] In an embodiment, each group of the sampling circuits comprises:

[0010] A plurality of voltage dividing circuits, a plurality of input ends of the voltage dividing circuits are connected one by one with output ends of a group of the power supply devices to be tested, and the plurality of voltage dividing circuits are used for voltage step-down processing of output voltages of a group of the power supply devices to be tested and output a group of voltage sampling signals;

[0011] A selection switch circuit, a plurality of input ends are connected one by one with output ends of the plurality of voltage dividing circuits, and the selection switch circuit is used for sequentially conducting the plurality of input ends to the output end to sequentially output a group of the voltage sampling signals.

[0012] In an embodiment, the selection switch circuit is specifically used for:

[0013] After one input end is conducted to the output end and maintained in the conducting state for a first preset time, another input end is conducted to the output end, until the plurality of input ends are sequentially conducted to the output end.

[0014] In an embodiment, the voltage sampling signal includes a first differential sampling signal and a second differential sampling signal, and the data processing circuit includes:

[0015] a differential amplification circuit having a first input end and a second input end, the first input end being connected to the first differential sampling signal, and the second input end being connected to the second differential sampling signal, the differential amplification circuit being used for differentially amplifying the first differential sampling signal and the second differential sampling signal.

[0016] In an embodiment, the data processing circuit further includes:

[0017] a first voltage follower having an input end connected to the first differential sampling signal, and an output end connected to the first input end of the differential amplification circuit;

[0018] a second voltage follower having an input end connected to the second differential sampling signal, and an output end connected to the second input end of the differential amplification circuit.

[0019] In an embodiment, the master control circuit includes:

[0020] a communication module configured to establish a communication connection with the host computer;

[0021] a controller connected to the communication module and the data processing circuit, respectively, and configured to package and upload the voltage sampling signal to the host computer.

[0022] In an embodiment, the communication module is a 485 communication module.

[0023] In an embodiment, the test fixture is provided with a trigger circuit, and the multi-channel voltage acquisition board further includes:

[0024] an in-bay detection circuit configured to, when the test fixture is connected, connect to the trigger circuit of the test fixture to trigger an output of an in-bay detection signal to the controller.

[0025] In an embodiment, the master control circuit further includes:

[0026] A switch control circuit is connected with the controller and a power switch of the test fixture respectively, and is used for controlling the power switch of the test fixture to be turned on when working.

[0027] The controller is further used for controlling the switch control circuit to work when the bin detection signal is received.

[0028] The application further provides an aging test device, which comprises the above multi-channel voltage acquisition board and a test fixture used for carrying a plurality of to-be-tested power supply devices, and the plurality of to-be-tested power supply devices are electrically connected with the multi-channel voltage acquisition board.

[0029] The application samples output voltages of N groups of to-be-tested power supply devices through N groups of sampling circuits, and outputs voltage sampling signals, increases the number of analog sampling channels by increasing the number of sampling circuits, sequentially outputs a group of voltage sampling signals, so that one group of voltage sampling signals only needs to be matched with one data processing circuit, thereby reducing the number of data processing circuits, and reducing the cost of the multi-channel voltage acquisition board, and finally uploading the acquired voltage sampling signals to an upper computer through a master control circuit. BRIEF DESCRIPTION OF DRAWINGS

[0030] In order to more clearly illustrate the technical solutions of the embodiments of the application or the prior art, the following will briefly introduce the drawings needed to be used in the embodiments or the prior art description. Obviously, the drawings in the following description only show some embodiments of the application, and other drawings can be obtained by those skilled in the art without creative labor on the basis of the drawings shown.

[0031] Figure 1 A circuit diagram of an embodiment of the multi-channel voltage acquisition board of the application;

[0032] Figure 2 A circuit diagram of another embodiment of the multi-channel voltage acquisition board of the application;

[0033] Figure 3 A circuit diagram of an embodiment of the voltage dividing circuit of the multi-channel voltage acquisition board of the application;

[0034] Figure 4 A circuit diagram of an embodiment of the data processing circuit of the multi-channel voltage acquisition board of the application;

[0035] Figure 5 A circuit diagram of another embodiment of the multi-channel voltage acquisition board of the application;

[0036] Figure 6 A circuit diagram of an embodiment of the bin detection circuit of the multi-channel voltage acquisition board of the application;

[0037] Figure 7 Circuit diagram of another embodiment of the switch control circuit of the multi-channel voltage acquisition board of the present application.

[0038] Figure 8 Circuit diagram of another embodiment of the switch control circuit of the multi-channel voltage acquisition board of the present application.

[0039] BRIEF DESCRIPTION OF THE DRAWINGS

[0040]

[0041]

[0042] The implementation, functional features and advantages of the present application will be further described with reference to the embodiments and the accompanying drawings. DETAILED DESCRIPTION

[0043] The technical solutions in the embodiments of the present application will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present application. Obviously, the described embodiments are only part of the embodiments of the present application, rather than all the embodiments of the present application. Based on the embodiments in the present application, all the other embodiments obtained by those skilled in the art without any creative work under the premise that the application is within the protection scope of the present application.

[0044] It should be noted that all the directionality indications (such as up, down, left, right, front, back, etc.) in the embodiments of the present application are only used to explain the relative position relationship, movement condition, etc. between the components in a certain specific posture (as shown in the drawings), and if the specific posture changes, the directionality indications will also change accordingly.

[0045] In the present application, unless otherwise explicitly specified and limited, the terms “connection”, “fixation” and the like should be understood in a broad sense, for example, “fixation” can be fixed connection, or detachable connection, or integral; can be mechanical connection, or electrical connection; can be direct connection, or indirect connection through an intermediate medium; can be the internal connection of two elements or the interaction relationship between two elements, unless otherwise explicitly limited. For those skilled in the art, the specific meaning of the above terms in the present application can be understood according to the specific circumstances.

[0046] In addition, the description such as "first", "second" and the like in the present application is only for the purpose of description, and cannot be understood as indicating or implying the relative importance of the indicated technical features or implicitly indicating the number of the indicated technical features. Therefore, the features defined as "first", "second" can be explicitly or implicitly included at least one of the features. In addition, the technical solutions of various embodiments can be combined with each other, but it must be based on the realization of ordinary skilled in the art, when the combination of technical solutions appears contradictory or unachievable, it should be considered that the combination of technical solutions does not exist, also not within the protection scope required by the present application.

[0047] The present application provides a multi-channel voltage acquisition board.

[0048] It should be noted that the traditional voltage acquisition board generally adopts the combination of integrated sampling chip and single-chip microcomputer to realize multi-channel acquisition, but the number of analog sampling channels of this kind of integrated sampling chip is generally 8, and the analog sampling channel is often reused as other functions, resulting in further reduction of the number of analog sampling channels. And this kind of chip not only has high cost (single price dozens to hundreds of yuan), but also is difficult to meet the precision requirement of multi-channel acquisition.

[0049] Referring to Figure 1 , in view of the above problems, in an embodiment, the multi-channel voltage acquisition board is electrically connected with a plurality of groups of to-be-tested power supply devices carried by a test fixture, and the multi-channel voltage acquisition board comprises:

[0050] N groups of sampling circuits 10, a plurality of input ends of each group of the sampling circuits 10 are connected one by one with output ends of a group of the to-be-tested power supply devices, each group of the sampling circuits 10 is used for sampling output voltages of a group of the to-be-tested power supply devices, and sequentially outputs voltage sampling signals corresponding to each of the to-be-tested power supply devices; N groups of data processing circuits 20, input ends of the N groups of the data processing circuits 20 are connected one by one with output ends of the N groups of the sampling circuits 10, and the data processing circuit 20 is used for voltage conditioning of the voltage sampling signals connected thereto; a main control circuit 30 connected with the N groups of the data processing circuits 20, respectively, and the main control circuit 30 is used for receiving the voltage sampling signals and uploading to an upper computer.

[0051] Among them, the number of groups of sampling circuits 10 can be selected according to actual needs, and the embodiment can be selected as 2 groups. The number of input ends (i.e. the number of analog sampling channels) of each group of sampling circuits 10 can be selected according to actual needs, and the embodiment can be selected as 8, so that the 2 groups of sampling circuits 10 of the embodiment can build 16 analog sampling channels.

[0052] In practical applications, the sampling circuit 10 can be built with discrete components, so that the number of analog sampling channels of the sampling circuit 10 can be set according to actual needs. Compared with using an integrated sampling chip, the number of channels of the acquisition board can be set to be more, and the cost is also lower. Specifically, the sampling circuit 10 can include a multi-channel voltage dividing circuit 11 and a selection switch circuit 12. The multi-channel voltage dividing circuit 11 reduces the output voltage of the power supply device under test to a voltage value acceptable by the data processing circuit 20 in the rear stage, that is, converts the output voltage of the power supply device under test to a voltage sampling signal, and then the selection switch circuit 12 sequentially outputs the voltage sampling signal output by the multi-channel voltage dividing circuit 11. Of course, the sampling circuit 10 can also use other schemes as long as it can sequentially output a group of voltage sampling signals corresponding to the power supply device under test.

[0053] The data processing circuit 20 can be a differential amplification circuit, or other types of data processing circuits 20, as long as it can condition the voltage sampling signal to a voltage value acceptable by the host circuit 30. Since the sampling circuit 10 sequentially outputs voltage sampling signals, that is, only outputs one voltage sampling signal at each moment, a group of voltage sampling signals only needs one data processing circuit 20 to be sequentially processed. Compared with the scheme that the sampling circuit 10 simultaneously outputs multiple voltage sampling signals and then cooperates with multiple data processing circuits 20 for parallel processing, the present embodiment can reuse the data processing circuit 20, greatly reducing the cost of the multi-channel voltage acquisition board.

[0054] The host circuit 30 can use a microcontroller 32, a DSP or other control circuit, combined with a corresponding communication module 31, such as a 485 communication module 31, a 232 communication module 31, a wifi communication module 31, etc. This is not limited here.

[0055] The present application samples the output voltages of N groups of power supply devices under test through N groups of sampling circuits 10, and outputs voltage sampling signals. By increasing the number of sampling circuits 10, the number of analog sampling channels can be increased. A group of voltage sampling signals is sequentially output, so that a group of voltage sampling signals only needs to match one data processing circuit 20, thereby reducing the number of data processing circuits 20 to reduce the cost of the multi-channel voltage acquisition board. Finally, the host circuit 30 uploads the collected voltage sampling signals to the upper computer.

[0056] Reference Figure 2 and Figure 3In an embodiment, each of the sampling circuits 10 comprises: a plurality of voltage dividing circuits 11, each of the plurality of voltage dividing circuits is connected to an output terminal of a corresponding one of the power supply devices to be tested, and the plurality of voltage dividing circuits are configured to perform voltage step-down processing on the output voltage of the corresponding one of the power supply devices to be tested and output a plurality of voltage sampling signals; and a selection switch circuit 12, a plurality of input terminals of the selection switch circuit 12 are connected to a plurality of output terminals of the plurality of voltage dividing circuits respectively, and the selection switch circuit 12 is configured to sequentially turn on the plurality of input terminals to the output terminal to sequentially output the plurality of voltage sampling signals.

[0057] The number of the voltage dividing circuits matches the number of the output terminals of the power supply devices to be tested. Specifically, the output terminal of each power supply device to be tested can include a positive output terminal and a negative output terminal, and accordingly, the number of the voltage dividing circuits is twice the number of the power supply devices to be tested, so as to sample the positive output voltage and the negative output voltage respectively. For reference Figure 3 In the embodiment, the voltage dividing circuit is composed of a first resistor R1 and a second resistor R2 in series. The number of the first resistors R1 is multiple, and the multiple first resistors R1 are connected in series to form a larger resistance value. When the first resistors R1 and the second resistor R2 are connected to form a voltage dividing circuit, a required voltage dividing ratio, for example, a voltage dividing ratio of 100:1, can be obtained.

[0058] The selection switch circuit 12 can be an integrated analog selection switch chip, for example, a 74LS151, to improve the integration of the multi-channel voltage acquisition board. The selection switch circuit 12 can turn on the corresponding input terminal and the output terminal according to a corresponding control signal, and the control signal can be sent by the control circuit. In some embodiments, since the selection switch circuit 12 does not need to be closed-loop controlled, it only needs to be turned on sequentially. The embodiment can also configure a corresponding clock circuit to provide a clock signal for the gate pin of the 74LS151, so that the 74LS151 automatically cycles and sequentially turns on each input terminal to the output terminal. This greatly relieves the control resources of the main control circuit 30.

[0059] The embodiment realizes the purpose of serially outputting the plurality of voltage sampling signals to the data processing circuit 20 through the voltage dividing circuit and the selection switch circuit 12, thereby reducing the amount of data processing and reducing the cost.

[0060] For reference Figure 2 In an embodiment, the selection switch circuit 12 is specifically configured to: turn on one input terminal to the output terminal and maintain the on state for a first preset time, then turn on another input terminal to the output terminal, and sequentially turn on the plurality of input terminals to the output terminal.

[0061] The first preset time can be 0.5-5 seconds. In the embodiment, the first preset time is controlled by the selection switch circuit 12 to ensure that the data processing circuit 20 and the main control circuit 30 can obtain a voltage sampling signal with a sufficient duration, thereby improving the voltage sampling precision. Compared with an integrated sampling chip with an uncontrollable conduction time, the selection switch circuit in the embodiment can control the conduction time, and the controller 32 can control the conduction duration, thereby improving the voltage sampling precision.

[0062] With reference to Figure 4 In an embodiment, the voltage sampling signal includes a first differential sampling signal and a second differential sampling signal, and the data processing circuit 20 includes a differential amplification circuit having a first input end and a second input end. The first input end is connected to the first differential sampling signal, and the second input end is connected to the second differential sampling signal. The differential amplification circuit is configured to differentially amplify the first differential sampling signal and the second differential sampling signal.

[0063] In the embodiment, the amplification factor of the differential amplification circuit can be 6.6 times, and can also be other factors. The differential amplification circuit differentially amplifies the voltage sampling signal output by the sampling circuit 10 and outputs a voltage interval recognizable by the main control circuit 30. The main control circuit 30 converts the differentially amplified voltage into an analog-to-digital signal to obtain the voltage value of the power supply device to be measured.

[0064] With reference to Figure 4 In an embodiment, the differential amplification circuit can include a third resistor R3, a fourth resistor R4, a fifth resistor R5, a sixth resistor R6, a seventh resistor R7, and a first operational amplifier U1. One end of the third resistor R3 is the first input end of the differential amplification circuit, and the other end of the third resistor R3 is connected to the non-inverting input end of the first operational amplifier U1. The inverting input end of the first operational amplifier U1 is connected to one end of the fourth resistor R4, and the other end of the fourth resistor R4 is the second input end of the differential amplification circuit. The output end of the first operational amplifier U1 is connected to one end of the fifth resistor R5, and the other end of the fifth resistor R5 is the output end of the differential amplification circuit. One end of the sixth resistor R6 is connected to the non-inverting input end of the first operational amplifier U1, and the other end of the sixth resistor R6 is grounded. The seventh resistor R7 is connected to the inverting input end and the output end of the first operational amplifier U1.

[0065] With reference to Figure 4In an embodiment, the data processing circuit 20 further comprises: a first voltage follower, an input end of which is connected to the first differential sampling signal, and an output end of which is connected to a first input end of the differential amplification circuit; and a second voltage follower, an input end of which is connected to the second differential sampling signal, and an output end of which is connected to a second input end of the differential amplification circuit.

[0066] The first voltage follower and the second voltage follower are arranged in the embodiment, so that the impedance matching between the differential amplification circuit and the sampling circuit 10 is achieved, the load capacity of the differential amplification circuit is improved, and the problem of insufficient input current of the differential amplification circuit is solved. Meanwhile, the waveform and amplitude of the first differential sampling signal and the second differential signal are ensured to be constant. Figure 4 In the embodiment, the first voltage follower comprises a second operational amplifier U2, and the second voltage follower comprises a third operational amplifier U3. For specific connection relationship, refer to Figure 4 Details are not described herein.

[0067] For details, refer to Figure 2 In an embodiment, the main control circuit 30 comprises: a communication module 31, configured to establish a communication connection with the host computer; and a controller 32, connected to the communication module 31 and the data processing circuit 20 respectively, and configured to package and upload the voltage sampling signal to the host computer.

[0068] In actual application, one host computer is connected to multiple multi-channel voltage acquisition boards. In the embodiment, the communication module 31 is arranged for each multi-channel voltage acquisition board, and the corresponding address value is set for each multi-channel voltage acquisition board, so that the multi-channel voltage acquisition board can send the voltage of the to-be-tested power supply device after acquisition to the host computer in a packaged manner, and the host computer can determine the aging condition of each to-be-tested power supply device according to the acquired voltage data.

[0069] Further, the communication module 31 is a 485 communication module.

[0070] In actual application, the multi-channel voltage acquisition board is arranged in a test factory, and there are many noise interference sources in the test factory. The metal interferes with the transmission of wireless signals, resulting in difficult data transmission.

[0071] In the embodiment, the 485 communication module, i.e., the RS-485 transceiver, is selected. The RS-485 transceiver has enhanced anti-common-mode interference capability, i.e., good anti-noise interference, and ensures data transmission. Meanwhile, the maximum communication distance of the RS-485 is about 1219 m, which meets the requirement of the application scenario in the factory for the communication distance. That is, the cost is reduced, and the data transmission is ensured to be stable.

[0072] For details, refer to Figure 5 and Figure 6In an embodiment, the test fixture is provided with a trigger circuit 41, and the multi-channel voltage acquisition board further comprises a bin detection circuit 33, which is used to connect with the trigger circuit 41 of the test fixture when the test fixture is connected, so as to trigger the bin detection signal to the controller 32.

[0073] In actual application, the trigger circuit 41 can be a resistor, a diode or other circuit structure, and the bin detection circuit 33 can be a loop and an optical coupler, the loop is connected with the light emitter of the optical coupler, but the loop has a breakpoint, the breakpoint is matched with the trigger circuit 41, and when the trigger circuit 41 is connected, the loop is turned on, and then the light emitter of the optical coupler emits light, so that the light receiver of the optical coupler is turned on, and then the bin detection signal is triggered to the controller 32.

[0074] Specifically, referring to Figure 6 The bin detection circuit 33 comprises an eighth resistor R8, a first optical coupler OC1, a ninth resistor R9 and a tenth resistor R10; one end of the eighth resistor R8 is connected with the trigger circuit 41, the other end of the eighth resistor R8 is connected with the input end of the light emitter of the first optical coupler OC1, the output end of the light emitter of the second optical coupler OC2 is grounded, the input end of the light receiver of the first optical coupler OC1 is connected with a power supply; the output end of the light receiver of the second optical coupler OC2, one end of the ninth resistor R9 and one end of the tenth resistor R10 are interconnected, the other end of the ninth resistor R9 is grounded, and the other end of the tenth resistor R10 is connected with the controller 32, so as to output the bin detection signal.

[0075] Referring to Figure 7 In an embodiment, the main control circuit 30 further comprises a switch control circuit 34, which is connected with the controller 32 and the power switch 42 of the test fixture respectively, and is used to control the power switch 42 of the test fixture to be turned on when working; and the controller 32 is further used to control the switch control circuit 34 to work when receiving the bin detection signal.

[0076] In the embodiment, the power supply device to be tested is a power adapter, and therefore, in the aging test of the power adapter, 220V power supply needs to be provided; when the operator installs the power adapter into the test fixture, if the 220V power supply is in the turned-on state, it may cause danger to the operator.

[0077] In view of this, the embodiment sets a switch control circuit 34, before the test fixture connects the multi-channel voltage acquisition board, the power switch 42 of the test fixture is cut off, that is, 220V is not connected to the power adapter, to ensure personnel safety. Only after the power adapter is completely installed in the test fixture to ensure safety, the test fixture is connected with the multi-channel voltage acquisition board, and then the controller 32 controls the power switch 42 of the test fixture to be turned on through the switch control circuit 34. The embodiment improves the safety performance of the multi-channel voltage acquisition board.

[0078] Referring to Figure 8 In an embodiment, the power switch 42 of the test fixture is a relay.

[0079] The switch control circuit 34 includes an eleventh resistor R11, a second optocoupler OC2, and an electronic switch 341, one end of the eleventh resistor R11 is connected with the controller 32, the other end of the eleventh resistor R11 is connected with the light-emitting device of the optocoupler, the light-receiving device of the optocoupler is connected with the controlled end of the electronic switch 341, the input end of the electronic switch 341 is connected with the control coil of the relay, and the output end of the electronic switch 341 is grounded. The control circuit controls the light-emitting device of the optocoupler to emit light, and then the controller 32 controls the light-receiving device to be turned on, so as to control the electronic switch 341 to be turned on, so that the control coil of the relay has current passing through, and the relay is turned on.

[0080] The electronic switch 341 can adopt any electronic switch 341 that can realize automatic switching by controlling a large voltage circuit with a small voltage. In the embodiment, the relay can include a twelfth electronic switch 341, a thirteenth electronic switch 341, and a first switch tube Q1, and the specific connection relationship is referred to Figure 8 , which will not be described here.

[0081] The application also provides an aging test device, which comprises the multi-channel voltage acquisition board and the test fixture. The specific structure of the multi-channel voltage acquisition board is referred to the above embodiments. Since the power supply product adopts all the technical solutions of the above embodiments, it at least has all the beneficial effects brought by the technical solutions of the above embodiments, which will not be described here. The test fixture is used to carry multiple power supply devices to be tested, and the multiple power supply devices to be tested are electrically connected with the multi-channel voltage acquisition board.

[0082] The above is only an optional embodiment of the application, and does not limit the patent scope of the application. Any equivalent structural transformation made by referring to the content of the specification and drawings, or direct / indirect application in other related technical fields under the inventive concept of the application is included in the patent protection scope of the application.

Claims

1. A multi-channel voltage acquisition board, characterized by, The multi-channel voltage acquisition board is electrically connected with multiple groups of to-be-tested power supply devices carried by the test fixture, and the multi-channel voltage acquisition board comprises: N groups of sampling circuits, a plurality of input ends of each group of the sampling circuits are connected one by one with output ends of a group of the to-be-tested power supply devices, and each group of the sampling circuits is used for sampling output voltages of a group of the to-be-tested power supply devices and sequentially outputting voltage sampling signals corresponding to each to-be-tested power supply device; Each group of the sampling circuits comprises: A plurality of voltage dividing circuits, input ends of the plurality of voltage dividing circuits are connected one by one with output ends of a group of the to-be-tested power supply devices, and the plurality of voltage dividing circuits are used for performing voltage step-down processing on the output voltages of a group of the to-be-tested power supply devices and outputting a group of voltage sampling signals; A selection switch circuit, a plurality of input ends of the selection switch circuit are connected one by one with output ends of the plurality of voltage dividing circuits, and the selection switch circuit is used for sequentially conducting the plurality of input ends to the output end, so as to sequentially output the group of voltage sampling signals; Each group of the sampling circuits outputs only one voltage sampling signal at each moment; N groups of data processing circuits, input ends of the N groups of data processing circuits are connected one by one with output ends of the N groups of sampling circuits, and each data processing circuit is used for sequentially performing voltage conditioning on a group of the voltage sampling signals sequentially connected thereto; A main control circuit connected with the N groups of data processing circuits, the main control circuit is used for receiving the voltage sampling signals and uploading the voltage sampling signals to an upper computer.

2. The multi-channel voltage acquisition board of claim 1, wherein, The selection switch circuit is specifically used for: Conducting one input end to the output end and maintaining the conducting state for a first preset time, and then conducting another input end to the output end, until sequentially conducting the plurality of input ends to the output end.

3. The multi-channel voltage acquisition board of claim 2, wherein, The voltage sampling signals comprise first differential sampling signals and second differential sampling signals, and the data processing circuit comprises: A differential amplification circuit having a first input end and a second input end, the first input end is connected with the first differential sampling signal, and the second input end is connected with the second differential sampling signal, and the differential amplification circuit is used for differentially amplifying the first differential sampling signal and the second differential sampling signal.

4. The multi-channel voltage acquisition board of claim 3, wherein, The data processing circuit further comprises: A first voltage follower, an input end of the first voltage follower is connected with the first differential sampling signal, and an output end of the first voltage follower is connected with the first input end of the differential amplification circuit; A second voltage follower, an input end of the second voltage follower is connected with the second differential sampling signal, and an output end of the second voltage follower is connected with the second input end of the differential amplification circuit.

5. The multi-channel voltage acquisition board of claim 1, wherein, The main control circuit comprises: A communication module, used for establishing a communication connection with the upper computer; A controller connected with the communication module and the data processing circuit, and the controller is used for packaging and uploading the voltage sampling signals to the upper computer.

6. The multi-channel voltage acquisition board of claim 5, wherein, The communication module is a 485 communication module.

7. The multi-channel voltage acquisition board of claim 6, wherein, The test fixture is provided with a trigger circuit, and the multi-channel voltage acquisition board further comprises: An in-cabinet detection circuit, used for connecting with the trigger circuit of the test fixture when the test fixture is connected, so as to trigger an in-cabinet detection signal to the controller.

8. The multi-channel voltage acquisition board of claim 7, wherein, The main control circuit further comprises: A switch control circuit is connected with the controller and a power switch of the test fixture respectively, and is configured to control the power switch of the test fixture to be turned on when working. The controller is further configured to control the switch control circuit to work when the bin detection signal is received.

9. An aging test apparatus characterized by comprising: The application further provides a test fixture, comprising: The multi-channel voltage acquisition board according to any one of claims 1-8; And The test fixture is configured to carry a plurality of to-be-tested power supply devices, and the plurality of to-be-tested power supply devices are electrically connected with the multi-channel voltage acquisition board.

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