A method for detecting abnormality of a treatment head of a magnetic stimulation device

Abstract

A method for detecting abnormality of a treatment head of a magnetic stimulation device, using a temperature detection circuit to detect the temperature of the treatment head, and using the following method to determine whether the treatment head is abnormal: S1: At the beginning of each treatment, read the digital temperature T of LM35 d0 and simulated temperature T a0 , compare digital temperature T d0 Whether it is within the range of analog temperature and whether it is logical; S2: During the operation of the treatment head, the analog temperature and digital temperature are collected once every fixed period T, where T=0.5s, and the data that does not meet the requirements are discarded; S3: Get the mean temperature; S4: Compensate and correct the mean temperature to get the temperature value Tci; S4: Set the low temperature threshold of the device to 10℃; the high temperature threshold to 40℃; compare Tci with the threshold. This method can not only ensure timely discovery of frequent abnormalities, but also ensure that occasional data abnormalities caused by instantaneous interference do not generate frequent alarms.

Description

Technical Field

[0001] The invention relates to magnetic stimulation treatment equipment, in particular to a method for detecting abnormalities caused by a magnetic stimulation treatment head after a fault occurs during operation, and belongs to the technical field of medical devices. Background Art

[0002] Magnetic stimulation equipment (industry recommended standard YY / T0994-2015) is a device that uses high-voltage energy storage capacitors to instantly discharge magnetic field coils to generate pulsed magnetic fields that act on the nervous system to stimulate the nervous system. The principle is based on the law of electromagnetic induction. By charging the high-voltage energy storage capacitor, it discharges to the stimulation coil in a very short time. The strong current generates an instantaneous magnetic field around the coil, inducing the induced electric field and current of the human peripheral nerves, achieving painless, lossless, and non-invasive induction stimulation. This magnetic field can pass through the surface of the limbs without hindrance and shielding, and control the nerves inside the limbs to induce induced electric fields and currents, so as to achieve the purpose of stimulating and exciting the nerves inside the limbs. The laser magnetic therapy devices currently on the market have high output intensity and complex equipment. As they age over time or are not properly maintained, if the treatment head is abnormal and cannot be detected in time, it will cause equipment damage and endanger the safety of users. At present, the abnormalities of the treatment head are mainly the following: First, when the high-voltage pulse discharge occurs, the coil of the treatment head will generate a lot of heat, which generally requires a refrigeration device to cool it down. It is necessary to detect the temperature of the treatment head to ensure that the treatment head works within the normal temperature range. If the refrigeration device fails to dissipate heat, it will damage the coil and even burn the medical staff if it fails to detect or prompt in time. Second, the coil of the treatment head and the discharge capacitor in the magnetic stimulation device are not directly connected, and need to be fixed by a special connector. Due to equipment aging or environmental factors, the connector becomes loose and rusted, causing the coil of the treatment head to fail to work properly, which will lead to treatment failure and electrical accidents in severe cases. Third, the abnormality of the treatment head caused by other hardware such as circuit abnormalities. According to industry standards, the temperature of the treatment head cannot exceed 41°C during treatment. It is a common temperature control method to install a temperature sensor on the treatment head to detect the temperature of the device and then transmit it to the MCU for identification and control. However, since the treatment head generates a strong magnetic field during operation and is affected by some environmental factors (such as the influence of other related equipment in the medical room, environmental magnetic field, environmental electric field, etc.), this will cause great interference to the temperature monitoring of the treatment head, making the temperature detection appear to be very "false". For example, when the temperature over-temperature alarm is sounded, the actual temperature is not high. Another example is that there is no alarm prompt when the temperature over-temperature occurs. These phenomena cannot guarantee the safety of the equipment and treatment personnel. The reliability is poor. Therefore, there should be a more reliable method for this type of equipment. Summary of the invention

[0003] The purpose of the present invention is to provide a method for detecting abnormalities in the treatment head of a magnetic stimulation device in response to the above-mentioned abnormal problems occurring in existing magnetic stimulation treatment devices.

[0004] To achieve the purpose of the present invention, the following technical solutions are adopted: a method for detecting abnormalities of a treatment head of a magnetic stimulation device, using a temperature detection circuit to detect the temperature of the treatment head, the temperature detection circuit comprising an LM35 temperature sensor, the output end of the LM35 temperature sensor is connected to an MCU through a resistor R40 for analog-to-digital conversion, The output end of LM35 is connected to resistor R15, which is connected to ground after being connected in series with resistor R13. The 8-pin input end of LA2284 driver circuit board is connected between resistor R15 and resistor R13. The 5 output ends PD10, PD11, PD12, PD13, and PD14 of LA2284 driver circuit board are connected to MCU. The 5 output ends PD10, PD11, PD12, PD13, and PD14 of LA2284 driver circuit board are connected to +5V power supply through a 10K resistor. The output end of LM35 temperature sensor is connected to +3.3V power supply through resistor R39. The 9-pin of LA2284 driver circuit board is connected to +5V power supply. The 9-pin of LA2284 driver circuit board is connected to capacitor C32 and resistor R16 connected in parallel and then grounded. A primary filter capacitor C23 is connected between the output end of LM35 and grounding. A secondary filter capacitor C31 is connected between the input end of LA2284 driver circuit board and grounding.

[0005] Use the following methods to determine whether the treatment head is abnormal:

[0006] S1: At the beginning of each treatment, read the digital temperature T of LM35 d0 and simulated temperature T a0 , compare digital temperature T d0 Is it within the range of analog temperature? If the digital temperature T d0 and simulated temperature T a0 The absolute value of the difference is less than or equal to 10, and the digital temperature T d0 If the digital temperature T is within the range of the analog temperature, the hardware connection is considered normal and the process goes to step S2. d0 and simulated temperature T a0 If the absolute value of the difference is greater than 10, the digital temperature T d If the simulated temperature is not within the range, it is considered that the hardware has failed;

[0007] S2: During the operation of the treatment head, the analog temperature and digital temperature are collected once every fixed period T, where T = 0.5s. The analog temperature and digital temperature values ​​obtained at the i-th time are T ai and T di , i>2, determine whether the data conforms to the following relationship (1) and (2):

[0008] |Tdi-Tai|≤10 Formula (1)

[0009] ∣Tdi-Td(i-1)∣≤3 Formula (2)

[0010] If all the conditions meet the relationship between equation (1) and equation (2), continue to collect temperature;

[0011] If it does not meet any of the relationships in formula (1) and formula (2), the collected data will be discarded as an abnormal point, and the number N and sequence number N of the discarded abnormal point data will be recorded. i , when the number of discarded abnormal point data N=6, calculate the discard rate Va=6 / (N1+N2+N3+N4+N5-5N0-9); if Va>1 / 2, it is considered that the hardware is abnormal and a fault is prompted; if Va<1 / 2, the 6 abnormal point data of this time are discarded, and Va is recalculated when the next abnormal point data reaches 6; if Va<1 / 2, proceed to step S3;

[0012] S3: Perform mean processing on the temperature data and average the temperature value T di The first two temperature values ​​T d（i-2） and T d（i-1） Perform mean processing to obtain the mean temperature T i =(T di + T d（i-2） + T d（i-1） ) / 3;

[0013] S4: The mean temperature is compensated and corrected to obtain the temperature value Tci; the compensation correction process is as follows: Temperature T i-3 , T i-2 T i-1、 are the digital temperatures recorded at the i-3rd, i-2nd, and i-1st times, △V i-2 , △V i-1 are the rates of change of temperature at these two times;

[0014] △V i-2 = (T i-2 -T i-3 ) / T; △V i-1 = (T i-1 -T i-2 ) / T; speed of change a0=(△V i-2 -△V i-1 ) / T;

[0015] The current temperature change rate is △V i , the current theoretical temperature value is T i ';△V i = (T i '- T i-1 ) / T;

[0016] The current speed of change is a, a= a0+ a t , where a t The temperature change compensation value is: 0.1-0.25 for a temperature greater than or equal to 10°C and less than 20°C, 0.2-0.35 for a temperature greater than or equal to 20°C and less than 30°C, and 0.3-0.45 for a temperature greater than or equal to 30°C and less than 40°C;

[0017] a=(△V i -△V i-1 ) / T; then T i '=aT+△V i-1 + T i-1 ;

[0018] Tci=(T i '+ T i ) / 2;

[0019] S5: Set the low temperature threshold of the device to 10℃ and the high temperature threshold to 40℃; if Tci is higher than the high temperature threshold, it is considered an over-temperature abnormality; if Tci is lower than the low temperature threshold, it is considered a hardware connection failure of the device; if Tci is between the low temperature threshold and the high temperature threshold, the treatment head is normal.

[0020] Further; in step S4, wherein a t The temperature change compensation value is: 0.15 for a temperature greater than or equal to 10°C and less than 20°C, 0.25 for a temperature greater than or equal to 20°C and less than 30°C, and 0.4 for a temperature greater than or equal to 30°C and less than 40°C.

[0021] The positive and beneficial technical effect of the present invention is that the method can accurately obtain the temperature data of the treatment head, and accurately identify the abnormality of the treatment head by processing the temperature data, so that the treatment head will neither overheat nor treat under abnormal conditions during operation. Since the treatment head is subject to relatively large interference during operation, data will become abnormal under interference. The method can ensure timely discovery in the case of frequent abnormalities, and can also ensure that occasional data abnormalities caused by momentary interference do not generate frequent alarms, thereby ensuring equipment safety and not affecting treatment. BRIEF DESCRIPTION OF THE DRAWINGS

[0022] Figure 1 It is a schematic diagram of the detection circuit of the present invention.

[0023] Figure 2 It is a schematic diagram of the invention detection circuit single chip microcomputer and peripheral circuit.

[0024] Figure 3 is a schematic diagram of a treatment head. DETAILED DESCRIPTION

[0025] In order to more fully explain the implementation of the present invention, implementation examples of the present invention are provided. These implementation examples are merely elaborations of the present invention and do not limit the scope of the present invention.

[0026] The treatment head consists of three parts: the treatment head coil, the temperature sensor and the shell. The coil is located inside the shell, and the temperature sensor is located on the surface of the shell. 4 and 5 are the two ends of the coil of the treatment head, which are connected to a special connector and connected to the discharge capacitor. 1, 2 and 3 are the ports of the LM35 temperature sensor. The temperature sensor is close to the coil shell and connected to the circuit board.

[0027] The detection circuit of the present invention is composed of an LM35 temperature sensor, an LA2284 driving circuit board (LA2284 driver), an ADC conversion unit and an MCU processing unit. The temperature sensor LM35 is located at the treatment head coil and is far away from the circuit board. The capacitor C23 is an input filter capacitor, which can filter out the magnetic field interference and high-frequency fluctuations and interference on the wire of the temperature sensor LM35. The capacitor C31 is a secondary filter capacitor to ensure the stability of the input signal of LA2284. Figure 1 In the figure, TEMP is the analog signal output by the LM35 temperature sensor, and the voltage divider circuit composed of resistors R15 and R13 adjusts the temperature measurement range. At the same time, the analog signal is input to the MCU through resistor R40, and analog-to-digital conversion is performed to obtain a digital signal. PD10~PD14 are the output signals of the driver circuit board LA2284. These five signals are connected to the MCU. The MCU determines the approximate temperature range based on the high and low levels of these five signals.

[0028] The temperature sensor uses the LM35 temperature sensor with a linear forward coefficient. When the host is powered on, the sensor continuously collects the surface temperature of the treatment head coil and converts it into an analog signal. The linear proportional factor of LM35 is +10mV / ℃, that is, when the temperature is T0, the analog signal converted and transmitted to the circuit is: V0=T0×10mV; the analog signal is transmitted to resistor R15 through the circuit, and resistors R15 and R13 form a voltage divider circuit. After the signal V0 is divided, it is finally transmitted to the LA2284 driver circuit board. LA2284 is a monolithic integrated circuit designed for 5-point LED level meter drivers with a built-in rectifier amplifier. The input is an analog signal, and pins 1-5 output digital signals. The signal strength of the 8th pin input of LA2284 is:

[0029] V1=(R 13 ×V0) / (R 13 +R 15 );

[0030] The LA2284 driver obtains the analog signal V1 and compares the analog signal V1 with the reference voltage V through the five comparators inside the driver. refThe five built-in comparators of LA2284 have opening levels of -10dB, -5dB, 0dB, 3dB, and 6dB.

[0031] According to the formula: dB = 20lg (V1 / V ref ) we can get, V1 = V ref ×10 (dB / 20) , the opening levels of the five comparators are brought in respectively, when V1 reaches 0.32V ref , 0.56V ref 、V ref , 1.41V ref , 2V ref When the LA2284 driver pulls down the corresponding comparator output level, converts the analog model into a digital signal and transmits it to the MCU's PD10-PD14 port. The MCU obtains the current temperature range by detecting the status of the PD10-PD14 port. The signal strength range that the LA2284 driver can compare is 0.32V ref – 2V ref , V ref = V1 / 10 (dB / 20) V1 = (R 13 ×V0) / (R 13 +R 15 ) is brought in:

[0032] V ref =((R 13 ×V0 ) / (R 13 +R 15 )) / 10 (dB / 20) ; Substitute V0=T0×10mV to get:

[0033] V ref =((R 13 ×T0×10mV ) / (R 13 +R 15 )) / 10 (dB / 20) ;

[0034] Let R 13 / (R 13 +R 15 ) = k; let 10 / 10 (dB / 20) =b,;

[0035] Then V ref = bkT0, the detectable temperature range is 0.32 bkT0~ 2 bkT0, b is a constant, and different temperature ranges can be obtained by changing the value of k, that is, by changing the voltage divider ratio of different voltage divider circuits, different temperature alarm ranges can be obtained.

[0036] Read the digital temperature and analog temperature of the LM35 temperature sensor. The 5 range thresholds of the analog temperature are T from low to high. ah0 ,T ah1 ,T ah2 ,T ah3 ,T ah4 , these 5 temperature levels correspond to 0.32Vref, 0.56Vref, Vref, 1.41Vref, and 2Vref respectively. The relationship between these 5 temperature levels and PD10~PD14 is as follows:

[0037]

[0038] The method for detecting abnormality of the treatment head of the stimulation device adopts a temperature detection circuit to detect the temperature of the treatment head. The temperature detection circuit includes an LM35 temperature sensor. The output end of the LM35 temperature sensor is connected to the MCU through a resistor R40 for analog-to-digital conversion. The output end of LM35 is connected to resistor R15, which is connected to resistor R13 in series and then to ground. The 8-pin input end of LA2284 driver circuit board is connected between resistor R15 and resistor R13. The 5 output ends PD10, PD11, PD12, PD13, and PD14 of LA2284 driver circuit board are connected to MCU. The 5 output ends PD10, PD11, PD12, PD13, and PD14 of LA2284 driver circuit board are connected to +5V power supply through a 10K resistor. The output end of LM35 temperature sensor is connected to +3.3V power supply through resistor R39. The 9-pin of LA2284 driver circuit board is connected to +5V power supply. The 9-pin of LA2284 driver circuit board is connected to capacitor C32 and resistor R16 connected in parallel and then to ground. A primary filter capacitor C23 is connected between the output end of LM35 and ground. A secondary filter capacitor C31 is connected between the input end of LA2284 driver circuit board and ground.

[0039] Use the following methods to determine whether the treatment head is abnormal:

[0040] S1: When the power is turned on, read the digital temperature T of LM35 d0 and simulated temperature T a0 , compare digital temperature T d0 Is it within the range of analog temperature? If the digital temperature T d0 and simulated temperature T a0 The absolute value of the difference is less than or equal to 10, and the digital temperature T d0 If the digital temperature T is within the range of the analog temperature, the hardware connection is considered normal and the process goes to step S2. d0 and simulated temperature T a0 If the absolute value of the difference is greater than 10, the digital temperature T dIf the simulated temperature is not within the range, it is considered that the hardware has failed;

[0041] S2: During the operation of the treatment head, the analog temperature and digital temperature are collected once every fixed period T, where T = 0.5s. The analog temperature and digital temperature values ​​obtained at the i-th time are T ai and T di , i>2, determine whether the data conforms to the following relationship (1) and (2):

[0042] |Tdi-Tai|≤10 Formula (1)

[0043] ∣Tdi-Td(i-1)∣≤3 Formula (2)

[0044] If all the conditions meet the relationship between formula (1) and formula (2), then continue to collect temperature. Because the analog temperature has 5 levels and the temperature of the treatment head is between 10°C and 40°C, the difference between the digital temperature and the analog temperature should be within 10 under normal circumstances.

[0045] If it does not meet any of the relationships in formula (1) and formula (2), the collected data will be discarded as an abnormal point, and the number N and sequence number N of the discarded abnormal point data will be recorded. i ,When the number of abnormal point data to be discarded is N=6, N=6, indicating that 6 abnormalities are to be detected, and N0, N1, N2, N3, N4, N5 represent the periodic numbers of the 1st, 2nd, 3rd, 4th, 5th, and 6th abnormal points. When the number of abnormal points is less than 6, no judgment is made. When N=6, the discarding rate Va of abnormal temperature points is calculated, and the discarding rate is compared with the threshold Vt. Vt=1 / 2, Va>Vt, and the treatment head is considered abnormal if it exceeds the range. The discarding rate Va<Vt, , indicates that the discarding rate of abnormal points has not reached the abnormal level, and these 6 points are discarded. When 6 abnormal points are reached again, Va is recalculated.,,

[0046] After expansion:

[0047] The discard rate Va=6 / (N1+N2+N3+N4+N5-5N0-9); if Va>1 / 2, it is considered that the hardware is abnormal and a fault is prompted; if Va<1 / 2, the 6 abnormal point data of this time are discarded, and Va is recalculated when the next abnormal point data reaches 6; if Va<1 / 2, step S3 is performed; this step of discarding can prevent the device from frequently alarming due to data abnormalities after being disturbed, and can also detect the abnormality of the device in the shortest time. When the device is abnormal, it can generally be discovered in 6 seconds at most;

[0048] S3: Perform mean processing on the temperature data and average the temperature value T di The first two temperature values ​​Td（i-2） and T d（i-1） Perform mean processing to obtain the mean temperature T i =(T di + T d（i-2） + T d（i-1） ) / 3;

[0049] S4: The mean temperature is compensated and corrected to obtain the temperature value Tci; the compensation correction process is as follows: Temperature T i-3 , T i-2 T i-1、 are the digital temperatures recorded at the i-3rd, i-2nd, and i-1st times, △V i-2 , △V i-1 are the rates of change of temperature at these two times;

[0050] △V i-2 = (T i-2 -T i-3 ) / T;

[0051] △V i-1 = (T i-1 -T i-2 ) / T;

[0052] Change speed a0=(△V i-2 -△V i-1 ) / T;

[0053] The current temperature change rate is △V i ;

[0054] The current theoretical temperature value is T i ';△V i = (T i '- T i-1 ) / T;

[0055] The current speed of change is a, a= a0+ a t ;

[0056] where a t The temperature change compensation value is: 0.1-0.25 for a temperature greater than or equal to 10°C and less than 20°C, 0.2-0.35 for a temperature greater than or equal to 20°C and less than 30°C, and 0.3-0.45 for a temperature greater than or equal to 30°C and less than 40°C;

[0057] Specifically in this embodiment, a t The temperature change compensation value is: 0.15 for a temperature greater than or equal to 10°C and less than 20°C, 0.25 for a temperature greater than or equal to 20°C and less than 30°C, and 0.4 for a temperature greater than or equal to 30°C and less than 40°C.

[0058] a=(△V i -△Vi-1 ) / T;

[0059] Then T i '=aT+△V i-1 + T i-1 ;

[0060] Tci=(T i '+ T i ) / 2; The temperature processed in this step is more accurate;

[0061] S5: Set the low temperature threshold of the device to 10℃ and the high temperature threshold to 40℃. If the high temperature threshold is lower than the standard of 41℃, the device is safer. If Tci is higher than the high temperature threshold, it is considered to be an over-temperature abnormality. If Tci is lower than the low temperature threshold, it is considered to be a hardware connection failure of the device. If Tci is between the low temperature threshold and the high temperature threshold, the treatment head is normal.

[0062] The method obtains a more accurate temperature by discarding, averaging and compensating during processing, and can prevent data artifacts caused by magnetic field interference with temperature data.

[0063] After describing the implementation mode of the present invention in detail, people familiar with the technology can clearly understand that various changes and modifications can be made without departing from the scope and spirit of the above-mentioned patent application. Any simple modifications, equivalent changes and modifications made to the above embodiments based on the technical essence of the present invention are within the scope of the technical solution of the present invention, and the present invention is not limited to the implementation mode of the examples given in the specification.

Claims

1. A method for detecting abnormality of a treatment head of a magnetic stimulation device, using a temperature detection circuit to detect the temperature of the treatment head, characterized in that: The temperature detection circuit includes an LM35 temperature sensor, the output end of which is connected to the MCU through a resistor R40 for analog-to-digital conversion. The output end of LM35 is connected to resistor R15, which is connected to ground after being connected in series with resistor R13. The 8-pin input end of LA2284 driver circuit board is connected between resistor R15 and resistor R13. The 5 output ends PD10, PD11, PD12, PD13, and PD14 of LA2284 driver circuit board are connected to MCU. The 5 output ends PD10, PD11, PD12, PD13, and PD14 of LA2284 driver circuit board are connected to +5V power supply through a 10K resistor. The output end of LM35 temperature sensor is connected to +3.3V power supply through resistor R39. The 9-pin of LA2284 driver circuit board is connected to +5V power supply. The 9-pin of LA2284 driver circuit board is connected to capacitor C32 and resistor R16 connected in parallel and then grounded. A primary filter capacitor C23 is connected between the output end of LM35 and grounding. A secondary filter capacitor C31 is connected between the input end of LA2284 driver circuit board and grounding. Use the following methods to determine whether the treatment head is abnormal: S1: At the beginning of each treatment, read the digital temperature T of LM35 d0 and simulated temperature T a0 , compare digital temperature T d0 Is it within the range of analog temperature? If the digital temperature T d0 and simulated temperature T a0 The absolute value of the difference is less than or equal to 10, and the digital temperature T d0 If the digital temperature T is within the range of the analog temperature, the hardware connection is considered normal and the process goes to step S2. d0 and simulated temperature T a0 If the absolute value of the difference is greater than 10, the digital temperature T d If the simulated temperature is not within the range, it is considered that the hardware has failed; S2: During the operation of the treatment head, the analog temperature and digital temperature are collected once every fixed period T, where T = 0.5s. The analog temperature and digital temperature values ​​obtained at the i-th time are T ai and T di , i>2, judge data T di 、T ai 、T d(i-1) Whether it conforms to the following relationship (1) and (2): ∣T di -T ai ∣≤10 Formula (1) ∣T di -T d(i-1) ∣≤3 Formula (2) If all the conditions meet the relationship between equation (1) and equation (2), continue to collect temperature; If it does not meet any of the relationships in formula (1) and formula (2), the collected data will be discarded as an abnormal point, and the number N and sequence number N of the discarded abnormal point data will be recorded. i , when the number of discarded outlier data N=6, calculate the discard rate: Va=6 / (N1+N2+N3+N4+N5-5N0-9); if Va>1 / 2, it is considered that the hardware is abnormal and a fault is prompted; if Va<1 / 2, the 6 abnormal point data of this time are discarded, and Va is recalculated when the next abnormal point data reaches 6; When Va<1 / 2, proceed to step S3; S3: Perform mean processing on the temperature data and average the temperature value T di The first two temperature values ​​T d（i-2） and T d（i-1） Perform mean processing to obtain the mean temperature T i =(T di + T d（i-2） + T d（i-1） ) / 3; S4: The mean temperature is compensated and corrected to obtain the temperature value Tci; the compensation correction process is as follows: Temperature T i-3 、T i-2 T i-1、 are the digital temperatures recorded for the i-3rd, i-2nd, and i-1st times, △V i-2 , △V i-1 are the rates of change of temperature at these two times; △V i-2 = (T i-2 -T i-3 ) / T; △V i-1 = (T i-1 -T i-2 ) / T; speed of change a0=(△V i-2 -△V i-1 ) / T; The current temperature change rate is △V i , the current theoretical temperature value is T i ';△V i = (T i '- T i-1 ) / T; The current speed of change is a, a= a0+ a t , where a t The temperature change compensation value is: when the temperature of the treatment head is greater than or equal to 10℃ and less than 20℃, a t The value is 0.1-0.

25. When the temperature of the treatment head is greater than or equal to 20℃ and less than 30℃, a t The value is 0.2-0.

35. When the temperature of the treatment head is greater than or equal to 30℃ and less than 40℃, a t The value is 0.3-0.45; a = (△V i - △V i-1 ) / T; Then T i ' = aT + △V i-1 + T i-1 ; Tci=(T i ’+ T i ) / 2; S5: Set the low temperature threshold of the device to 10℃ and the high temperature threshold to 40℃; if Tci is higher than the high temperature threshold, it is considered an over-temperature abnormality; if Tci is lower than the low temperature threshold, it is considered a hardware connection failure of the device; if Tci is between the low temperature threshold and the high temperature threshold, the treatment head is normal.

2. A method for detecting abnormality of a treatment head of a magnetic stimulation device according to claim 1, characterized in that: In step S4, a t The temperature change compensation value is: when the temperature of the treatment head is greater than or equal to 10℃ and less than 20℃, a t The value is 0.

15. When the temperature of the treatment head is greater than or equal to 20℃ and less than 30℃, a t The value is 0.

25. When the temperature of the treatment head is greater than or equal to 30℃ and less than 40℃, a t The value is 0.4.

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