Multi-channel switching HI-POT test device and contact self-test method thereof

Abstract

The present invention relates to a multi-channel switching HI-POT test device and a contact self-test method thereof. The device includes a tester, a signal transmission element, a test element, a controller, a first control switch, and a wiring self-test module. The signal transmission element is connected to the test element, the controller is connected to the tester, the tester is connected to the input end of the first control switch, the first control switch is respectively connected to the wiring self-test module and the signal transmission element, and the tester is respectively connected to the wiring self-test module and the signal transmission element. The device realizes contact self-test of the signal transmission element through the mutual cooperation of the controller, the first control switch, and the wiring self-test module, thereby preventing misjudgment of test results and improving the test accuracy of the tester on the test element; an interlocking circuit is formed by the first control switch and the wiring self-test module, which can prevent the test and contact self-test circuits from working simultaneously, thereby causing various electronic components in the device to be burned out, thereby improving the safety of the test.

Description

Technical Field

[0001] The present invention relates to the technical field of battery cell testing, and in particular to a multi-channel switching HI-POT testing device and a contact self-test method thereof. Background Art

[0002] HI-pot testers are primarily used for high-voltage testing, AC withstand voltage and leakage testing, and DC withstand voltage and leakage testing of battery cells. HI-POT testers directly connect the positive and negative terminals of a battery cell via probes, applying a high voltage to both sides. While this allows for quick and simple testing of a single cell, testing large quantities of cells requires numerous relays to connect the HI-POT tester to the cells, which is labor-intensive and inefficient. Furthermore, proper contact between the probes and the cells cannot be determined, leading to a high rate of error in test results. Summary of the Invention

[0003] The embodiment of the present invention provides a multi-channel switching HI-POT test device and a contact self-test method thereof, which are used to solve the technical problem that when using the existing HI-POT test to detect battery cells, it is impossible to determine whether the contact between the probe and the battery cell is normal, resulting in a high error rate in the test results.

[0004] In order to achieve the above objectives, the embodiments of the present invention provide the following technical solutions:

[0005] A multi-channel switching HI-POT test device includes a tester, a signal transmission element, and a test element. The signal transmission element is used to connect to the test element. The multi-channel switching HI-POT test device also includes a controller, a first control switch, and a wiring self-test module. The controller is connected to the input end of the tester, the positive output end of the tester is connected to the input end of the first control switch, the output end of the first control switch is respectively connected to the wiring self-test module and the signal transmission element, and the negative output end of the tester is respectively connected to the wiring self-test module and the signal transmission element.

[0006] The controller is used to control the operation of the tester, the first control switch and the wiring self-test module, so that the tester tests the component under test;

[0007] The wiring self-check module is used to detect whether the signal transmission element corresponding to the wiring self-check module is in normal contact according to whether the input end of the controller receives a feedback signal.

[0008] Preferably, the multi-channel switching HI-POT test device includes a second control switch, which is used to turn on or off the connection between the controller and the tester, the input end of the second control switch is connected to the controller, and the output end of the second control switch is connected to the tester.

[0009] Preferably, the multi-channel switching HI-POT test device includes a serial port module for storing and recording test data of the tester, and the serial port module is connected to the controller and the tester respectively.

[0010] Preferably, the wiring self-test module includes a switching element having at least two groups of normally open contacts, one group of normally open contacts of the switching element is connected to the positive pole or negative pole of the measured element through the signal transmission element, and the other group of normally open contacts of the switching element is connected to the positive pole or negative pole of the measured element through the signal transmission element and then connected to the input end of the controller.

[0011] Preferably, the controller is a PLC.

[0012] Preferably, the signal transmission element is a double probe.

[0013] Preferably, the multi-channel switching HI-POT test device includes a channel wiring module, the output end of the tester is connected to the input end of the channel wiring module, and the output end of the channel wiring module is respectively connected to the wiring self-test module and the first control switch; the channel wiring module is used to automatically switch the connection circuit between the component under test and the tester corresponding to the pulse signal according to the pulse signal output by the controller, and several positive wiring channels and several negative wiring channels are set on the output end of the channel wiring module. Each positive wiring channel of the channel wiring module is connected to the positive pole of one of the component under test through the first control switch and the signal transmission element, and each negative wiring channel of the channel wiring module is connected to the negative pole of the component under test through the signal transmission element.

[0014] Preferably, the channel wiring module includes a positive channel wiring sub-module and a negative channel wiring sub-module, and the positive channel wiring sub-module and the negative channel wiring sub-module are both provided with input wiring channels connected to the tester, and the output end of the positive channel wiring sub-module is provided with several positive wiring channels, and the output end of the negative channel wiring sub-module is provided with several negative wiring channels, each of the positive wiring channels is connected to the input end of the first control switch, and each of the negative wiring channels is respectively connected to the signal transmission element and the wiring self-test module.

[0015] The present invention also provides a contact self-test method for a multi-channel switching HI-POT test device, comprising the following steps:

[0016] Connect the test circuit according to the multi-channel switching HI-POT test device described above;

[0017] A 0V power supply is input to a set of normally open contacts of the wiring self-test module, and a first control switch corresponding to the wiring self-test module is controlled to be closed, and it is determined whether the input end of the controller corresponding to the first control switch receives a signal fed back by the 0V power supply;

[0018] If so, the contact between the tested component and the signal transmission component is normal;

[0019] If not, the contact between the component under test and the signal transmission component is abnormal or the test circuit is abnormal.

[0020] The present invention also provides a terminal device, comprising a processor and a memory;

[0021] The memory is used to store program code and transmit the program code to the processor;

[0022] The processor is configured to execute the contact self-test method of the multi-channel switching HI-POT test device according to the instructions in the program code.

[0023] It can be seen from the above technical solution that the embodiments of the present invention have the following advantages: the multi-channel switching HI-POT test device and the contact self-test method thereof, the multi-channel switching HI-POT test device includes a tester, a signal transmission element, a measured element, a controller, a first control switch and a wiring self-test module, the signal transmission element is used to connect to the measured element, the controller is connected to the input end of the tester, the positive output end of the tester is connected to the input end of the first control switch, the output end of the first control switch is respectively connected to the wiring self-test module and the signal transmission element, and the negative output end of the tester is respectively connected to the wiring self-test module and the signal transmission element. The multi-channel switching HI-POT test device realizes contact self-test of the signal transmission element through the cooperation of the controller, the first control switch and the wiring self-test module, thereby preventing misjudgment of the test result and improving the test accuracy of the tester on the tested component; the interlock circuit is formed by the first control switch and the wiring self-test module, which can prevent the test and contact self-test circuits from operating at the same time, thereby preventing the various electronic components in the multi-channel switching HI-POT test device from being burned out, thereby improving the safety of the test; and solves the technical problem that when using the existing HI-POT test to detect battery cells, it is impossible to determine whether the contact between the probe and the battery cell is normal, resulting in a high error rate in the test results. BRIEF DESCRIPTION OF THE DRAWINGS

[0024] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the embodiments or the description of the prior art. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0025] Figure 1 A framework diagram of a multi-channel switching HI-POT test device according to an embodiment of the present invention;

[0026] Figure 2 A framework diagram of a multi-channel switching HI-POT test device according to another embodiment of the present invention;

[0027] Figure 3 A framework diagram of a multi-channel switching HI-POT test device according to another embodiment of the present invention;

[0028] Figure 4 This is a framework diagram of a multi-channel switching HI-POT test device according to another embodiment of the present invention. DETAILED DESCRIPTION

[0029] In order to make the purpose, features, and advantages of the present invention more obvious and easy to understand, the technical solutions in the embodiments of the present invention will be clearly and completely described below in conjunction with the drawings in the embodiments of the present invention. Obviously, the embodiments described below are only part of the embodiments of the present invention, not all of the embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative work are within the scope of protection of the present invention.

[0030] The embodiment of the present application provides a multi-channel switching HI-POT test device and its contact self-test method, which is used to solve the technical problem that when using the existing HI-POT test to detect battery cells, it is impossible to determine whether the contact between the probe and the battery cell is normal, resulting in a high error rate in the test results.

[0031] Example 1:

[0032] Figure 1 This is a framework diagram of a multi-channel switching HI-POT test device according to an embodiment of the present invention.

[0033] like Figure 1As shown, an embodiment of the present invention provides a multi-channel switching HI-POT test device, including a tester 10, a signal transmission element 20 and a test element 30, the signal transmission element 20 is used to connect to the test element 30, and the multi-channel switching HI-POT test device also includes a controller 40, a first control switch 50 and a wiring self-test module 60, the controller 40 is connected to the input end of the tester 10, the positive output end of the tester 10 is connected to the input end of the first control switch 50, the output end of the first control switch 50 is respectively connected to the wiring self-test module 60 and the signal transmission element 20, and the negative output end of the tester 10 is respectively connected to the wiring self-test module 60 and the signal transmission element 20.

[0034] In this embodiment of the present invention, the tester 10 is primarily used to perform insulation resistance, short circuit, and withstand voltage tests on a component under test 30 to determine if the component under test 30 is qualified. The signal transmission element 20 can be an electronic component capable of conducting signals, such as a probe. The component under test 30 can be a battery cell or other product requiring performance testing.

[0035] In the embodiment of the present invention, the controller 40 can control the operation of the tester 10 , the first control switch 50 and the wiring self-test module 60 , so that the tester 10 tests the component under test 30 .

[0036] It should be noted that the controller 40 may be a PLC. In this embodiment, the PLC controls the operation of the first control switch 50 and the wiring self-test module 60 to perform contact self-test and instrument calibration on the signal transmission components in the multi-channel switching HI-POT test device, thereby ensuring test accuracy.

[0037] In the embodiment of the present invention, the first control switch 50 can be used to connect or disconnect the connection loop between the tester 10 and the device under test 30 .

[0038] It should be noted that the first control switch 50 may be a relay.

[0039] In the embodiment of the present invention, the wiring self-checking module 60 can be used to detect whether the signal transmission element 20 corresponding to the wiring self-checking module 60 is in normal contact according to whether the input end of the controller 10 receives a feedback signal.

[0040] It should be noted that since the signal transmission element 20 is a dual-probe device, each signal transmission element 20 is connected to a wiring self-test module 60. That is, each wiring self-test module 60 is provided with at least two connection terminals, which are respectively connected to the first terminals of the two probes in the signal transmission element 20, the second terminals of the two probes in the signal transmission element 20 are connected to the device under test, and the first terminal of the first control switch 50 is connected to the first terminal of one probe in the signal transmission element 20. The wiring self-test module 60 can be composed of a relay, a contactor, or a circuit breaker. In this embodiment, the wiring self-test module 60 is a relay as an example. The multi-channel switching HI-POT test device automatically detects whether the signal transmission element is in normal contact by loading a 0V voltage signal to the normally open contact of the relay to a probe in the signal transmission element 20, and the other probe in the signal transmission element 20 is connected to another set of normally open contacts of the relay to the first input terminal of the PLC; the PLC automatically detects whether the signal transmission element is in normal contact, and controls the first control switch 50 to connect the circuit by outputting a high level through the output terminal corresponding to the first input terminal. The two probes in the signal transmission element 20 are pressed down and contacted with the tested element 30. At this time, the two probes in the signal transmission element 20 contact the tested element 30 to form a conductive test circuit, which can feed back a 0V voltage signal to the first input terminal of the PLC, thereby judging whether the contact is normal; if the first input terminal of the PLC receives a feedback signal of a 0V voltage signal, it indicates that the signal transmission element 20 is in normal contact; otherwise, the signal transmission element 20 has poor contact or the test circuit of the multi-channel switching HI-POT test device is abnormal, thereby realizing the contact self-test of the multi-channel switching HI-POT test device. The normally closed contacts of the relay in the wiring self-test module 60 are connected in series with the coil of the first control switch 50, forming an interlock circuit. This prevents the test and contact self-test circuits from operating simultaneously, potentially damaging the electronic components in the multi-channel HI-POT test device. The contact self-test in the multi-channel HI-POT test device can determine whether the probe in the signal transmission element 20 is in contact with the device under test 30, preventing false positives.

[0041] The present invention provides a multi-channel switching HI-POT test device, comprising a tester, a signal transmission element, a test element, a controller, a first control switch, and a wiring self-test module, wherein the signal transmission element is connected to the test element, the controller is connected to the input end of the tester, the positive output end of the tester is connected to the input end of the first control switch, the output end of the first control switch is respectively connected to the wiring self-test module and the signal transmission element, and the negative output end of the tester is respectively connected to the wiring self-test module and the signal transmission element. The multi-channel switching HI-POT test device realizes contact self-test of the signal transmission element through the mutual cooperation of the controller, the first control switch, and the wiring self-test module, thereby preventing misjudgment of test results and improving the test accuracy of the tester on the test element; an interlock circuit is formed by the first control switch and the wiring self-test module, which can prevent the test and contact self-test circuits from working at the same time, thereby causing various electronic components in the multi-channel switching HI-POT test device to be burned, thereby improving the safety of the test; and solves the technical problem that when using the existing HI-POT test to detect battery cells, it is impossible to determine whether the probe is in normal contact with the battery cell, resulting in a high error rate in the test results.

[0042] Figure 2 This is a framework diagram of a multi-channel switching HI-POT test device according to another embodiment of the present invention.

[0043] like Figure 2 As shown, in one embodiment of the present invention, the multi-channel switching HI-POT test device includes a second control switch 70, which is used to turn on or off the connection between the controller 40 and the tester 10, the input end of the second control switch 70 is connected to the controller 40, and the output end of the second control switch 70 is connected to the tester 10.

[0044] It should be noted that the second control switch 70 may be a relay. In the embodiment of the present application, the second control switch 70 serves as a relay control between the controller 40 and the tester 10, facilitating the multi-channel switching HI-POT test device to control the tester 10, enabling the multi-channel switching HI-POT test device to achieve automatic or manual operation.

[0045] Figure 3 This is a framework diagram of a multi-channel switching HI-POT test device according to another embodiment of the present invention.

[0046] like Figure 3 As shown, in the embodiment of the present invention, the multi-channel switching HI-POT test device includes a serial port module 80 for storing and recording test data of the tester, and the serial port module 80 is connected to the controller 40 and the tester 10 respectively.

[0047] It should be noted that the serial port module 80 may be a serial port server. In this embodiment, the multi-channel switching HI-POT test device records and collects the test data of the tester 10 on the device under test 30 through the serial port module 80, and the serial port module 80 can also be used to achieve remote control of the serial port module 80.

[0048] like Figure 1 As shown, in one embodiment of the present invention, the wiring self-test module 60 includes a switch element having at least two groups of normally open contacts, one group of normally open contacts of the switch element is connected to the positive pole or negative pole of the measured element 30 through the signal transmission element 20, and the other group of normally open contacts of the switch element is connected to the positive pole or negative pole of the measured element 30 through the signal transmission element 20 and then connected to the input end of the controller 10.

[0049] It should be noted that the switching element may be a relay.

[0050] Figure 4 This is a framework diagram of a multi-channel switching HI-POT test device according to another embodiment of the present invention.

[0051] like Figure 4 As shown, in one embodiment of the present invention, the multi-channel switching HI-POT test device includes a channel wiring module 90, the output end of the tester 10 is connected to the input end of the channel wiring module 90, and the output end of the channel wiring module 90 is respectively connected to the wiring self-test module 60 and the first control switch 50; the channel wiring module 90 is used to automatically switch the connection circuit between the component under test 30 corresponding to the pulse signal and the tester 10 according to the pulse signal output by the controller 40, and a plurality of positive wiring channels and a plurality of negative wiring channels are set on the output end of the channel wiring module 90. Each positive wiring channel of the channel wiring module 90 is connected to the positive pole of a component under test 30 through the first control switch 50 and the signal transmission element 20, and each negative wiring channel of the channel wiring module 90 is connected to the negative pole of the component under test 30 through the signal transmission element 20. Among them, the channel wiring module 90 includes a positive channel wiring sub-module and a negative channel wiring sub-module. Both the positive channel wiring sub-module and the negative channel wiring sub-module are provided with input wiring channels connected to the tester 10. Several positive wiring channels are provided on the output end of the positive channel wiring sub-module, and several negative wiring channels are provided on the output end of the negative channel wiring sub-module. Each positive wiring channel is connected to the input end of the first control switch 50, and each negative wiring channel is respectively connected to the signal transmission element 20 and the wiring self-test module 60.

[0052] In this embodiment, the multi-channel switching HI-POT test device uses the controller 40 to select the DUT 30 and switches the channel through the channel wiring module 90 to connect the test circuit corresponding to the DUT 30 .

[0053] In an embodiment of the present invention, the multi-channel switching HI-POT test device adopts a controller 40 to control the output of the tester 10 through the second control switch 70, and the channel wiring module 90 switches to multiple channels to the probes in each signal transmission element 20 according to the output of the tester 10 and the controller 40. When testing is required, the controller 40 controls the attraction of the first switch element 50 so that the probe in the corresponding signal transmission element 20 is pressed down and contacts the measured element 30, and the controller 40 outputs test-related parameters to both ends of the measured element 30 to realize the test of the measured element 30; the multi-channel switching HI-POT test device can connect the test circuit of the measured element 30 in sequence through the channel wiring module 90 according to the control program in the controller 40, thereby realizing automated testing of a large number of test elements 30 and improving test efficiency.

[0054] Example 2:

[0055] An embodiment of the present invention further provides a contact self-test method of a multi-channel switching HI-POT test device, comprising the following steps:

[0056] Connect the test circuit according to the multi-channel switching HI-POT test device mentioned above;

[0057] A 0V power supply is input to a set of normally open contacts of the wiring self-test module, and a first control switch corresponding to the wiring self-test module is controlled to be closed, and it is determined whether the input end of the controller corresponding to the first control switch receives a signal fed back by the 0V power supply;

[0058] If so, the contact between the tested component and the signal transmission component is normal;

[0059] If not, the contact between the component under test and the signal transmission component is abnormal or the test circuit is abnormal.

[0060] It should be noted that, since a group of normally open contacts of the wiring self-test module is connected to a probe in the signal transmission element, and another probe in the signal transmission element is connected to another group of normally open contacts of the wiring self-test module, by loading a 0V voltage signal to the normally open contact of the wiring self-test module to a probe in the signal transmission element, the other probe in the signal transmission element is connected to another group of normally open contacts of the relay to the first input end of the controller; thereafter, the first control switch is controlled to connect the circuit by outputting a high level at the output end of the controller corresponding to the first input end, and the double probes in the signal transmission element are pressed down to contact and connect with the tested element. At this time, the double probes in the signal transmission element contact the tested element to form a conductive test circuit, which can feed back a 0V voltage signal to the first input end of the controller, thereby judging whether the contact is normal; if the first input end of the controller's PLC receives a feedback signal of a 0V voltage signal, it indicates that the contact of the signal transmission element is normal; otherwise, the signal transmission element has poor contact or the test circuit of the multi-channel switching HI-POT test device is abnormal, thereby realizing contact self-test of the multi-channel switching HI-POT test device. The content of the multi-channel switching HI-POT test device in the method of the second embodiment has been described in detail in the first embodiment, and will not be described in detail in this second embodiment.

[0061] Example 3:

[0062] The present invention also provides a terminal device, comprising a processor and a memory;

[0063] A memory, configured to store program codes and transmit the program codes to a processor;

[0064] The processor is configured to execute the contact self-test method of the multi-channel switching HI-POT test device according to the instructions in the program code.

[0065] For example, a computer program may be divided into one or more modules / units, one or more of which are stored in a memory and executed by a processor to complete the present application. One or more modules / units may be a series of computer program instruction segments capable of performing specific functions, and the instruction segments are used to describe the execution process of the computer program in a terminal device.

[0066] Terminal devices can be computing devices such as desktop computers, laptops, PDAs, and cloud servers. Terminal devices may include, but are not limited to, processors and memory. Those skilled in the art will appreciate that this does not constitute a limitation on terminal devices and may include more or fewer components than shown, or a combination of certain components, or different components. For example, terminal devices may also include input / output devices, network access devices, buses, and the like.

[0067] The processor may be a central processing unit (CPU), other general-purpose processors, digital signal processors (DSP), application-specific integrated circuits (ASIC), field-programmable gate arrays (FPGA), other programmable logic devices, discrete gate or transistor logic devices, discrete hardware components, etc. A general-purpose processor may be a microprocessor or any conventional processor.

[0068] Memory can be an internal storage unit of a terminal device, such as a hard drive or memory. It can also be an external storage device, such as a plug-in hard drive, a SmartMedia Card (SMC), a Secure Digital (SD) card, or a flash memory card. Furthermore, memory can include both internal and external storage units. Memory is used to store computer programs and other programs and data required by the terminal device. Memory can also be used to temporarily store data that has been output or is about to be output.

[0069] Those skilled in the art will clearly understand that, for the convenience and brevity of description, the specific working processes of the systems, devices and units described above can refer to the corresponding processes in the aforementioned method embodiments and will not be repeated here.

[0070] In the several embodiments provided in this application, it should be understood that the disclosed systems, devices and methods can be implemented in other ways. For example, the device embodiments described above are merely schematic. For example, the division of the units is merely a logical function division. In actual implementation, there may be other division methods, such as multiple units or components can be combined or integrated into another system, or some features can be ignored or not executed. Another point is that the mutual coupling or direct coupling or communication connection shown or discussed can be an indirect coupling or communication connection through some interfaces, devices or units, which can be electrical, mechanical or other forms.

[0071] The units described as separate components may or may not be physically separate, and the components shown as units may or may not be physical units, that is, they may be located in one place or distributed across multiple network units. Some or all of these units may be selected to achieve the purpose of this embodiment according to actual needs.

[0072] In addition, the functional units in the various embodiments of the present invention may be integrated into a single processing unit, each unit may exist physically separately, or two or more units may be integrated into a single unit. The aforementioned integrated units may be implemented in the form of hardware or software functional units.

[0073] If the integrated unit is implemented in the form of a software functional unit and sold or used as an independent product, it can be stored in a computer-readable storage medium. Based on this understanding, the technical solution of the present invention, or the part that contributes to the prior art, or all or part of the technical solution can be embodied in the form of a software product. The computer software product is stored in a storage medium and includes several instructions for enabling a computer device (which can be a personal computer, server, or network device, etc.) to execute all or part of the steps of the method described in each embodiment of the present invention. The aforementioned storage medium includes: various media that can store program codes, such as a USB flash drive, a mobile hard disk, a read-only memory (ROM), a random access memory (RAM), a magnetic disk or an optical disk.

[0074] As described above, the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that the technical solutions described in the above embodiments can still be modified, or some of the technical features thereof can be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A multi-channel switching HI-POT test device, comprising a tester, a signal transmission element and a device under test, wherein the signal transmission element is used to connect to the device under test, and is characterized in that: The multi-channel switching HI-POT test device also includes a controller, a first control switch and a wiring self-test module, wherein the controller is connected to the input end of the tester, the positive output end of the tester is connected to the input end of the first control switch, the output end of the first control switch is connected to the wiring self-test module and the signal transmission element respectively, and the negative output end of the tester is connected to the wiring self-test module and the signal transmission element respectively; The controller is used to control the operation of the tester, the first control switch and the wiring self-test module, so that the tester tests the component under test; The wiring self-test module is used to detect whether the signal transmission element corresponding to the wiring self-test module is in normal contact according to whether the input end of the controller receives a feedback signal; The wiring self-test module includes a switching element having at least two groups of normally open contacts, one group of normally open contacts of the switching element is connected to the positive pole or negative pole of the component under test through the signal transmission element, and the other group of normally open contacts of the switching element is connected to the positive pole or negative pole of the component under test through the signal transmission element and then connected to the input end of the controller.

2. The multi-channel switching HI-POT test device according to claim 1, characterized in that: A second control switch is included, which is used to turn on or off the connection between the controller and the tester. The input end of the second control switch is connected to the controller, and the output end of the second control switch is connected to the tester.

3. The multi-channel switching HI-POT test device according to claim 1, characterized in that: It comprises a serial port module for storing and recording test data of the tester, and the serial port module is connected to the controller and the tester respectively.

4. The multi-channel switching HI-POT test device according to claim 1, characterized in that: The controller is a PLC.

5. The multi-channel switching HI-POT test device according to claim 1, characterized in that: The signal transmission element is a double probe.

6. The multi-channel switching HI-POT test device according to claim 1, characterized in that: It includes a channel wiring module, the output end of the tester is connected to the input end of the channel wiring module, and the output end of the channel wiring module is respectively connected to the wiring self-test module and the first control switch; the channel wiring module is used to automatically switch the connection circuit between the component under test and the tester corresponding to the pulse signal according to the pulse signal output by the controller, and several positive wiring channels and several negative wiring channels are set on the output end of the channel wiring module. Each positive wiring channel of the channel wiring module is connected to the positive pole of one of the component under test through the first control switch and the signal transmission element, and each negative wiring channel of the channel wiring module is connected to the negative pole of the component under test through the signal transmission element.

7. The multi-channel switching HI-POT test device according to claim 6, characterized in that: The channel wiring module includes a positive channel wiring sub-module and a negative channel wiring sub-module. Both the positive channel wiring sub-module and the negative channel wiring sub-module are provided with input wiring channels connected to the tester. The output end of the positive channel wiring sub-module is provided with several positive wiring channels, and the output end of the negative channel wiring sub-module is provided with several negative wiring channels. Each of the positive wiring channels is connected to the input end of the first control switch, and each of the negative wiring channels is respectively connected to the signal transmission element and the wiring self-test module.

8. A contact self-test method for a multi-channel switching HI-POT test device, characterized in that: The following steps are involved: Connecting a test loop according to the multi-channel switching HI-POT test device according to any one of claims 1 to 7; A 0V power supply is input to a set of normally open contacts of the wiring self-test module, and a first control switch corresponding to the wiring self-test module is controlled to be closed, and it is determined whether the input end of the controller corresponding to the first control switch receives a signal fed back by the 0V power supply; If so, the contact between the tested component and the signal transmission component is normal; If not, the contact between the tested component and the signal transmission component is abnormal or the test circuit is abnormal.

9. A terminal device, characterized in that: including a processor and a memory; The memory is used to store program code and transmit the program code to the processor; The processor is configured to execute the contact self-test method of the multi-channel switching HI-POT test device according to claim 8 according to the instructions in the program code.

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