Integrated circuit internal voltage detection circuit, detection method, and integrated circuit

Abstract

The embodiments of the present disclosure disclose an internal voltage detection circuit, a detection method and an integrated circuit. The circuit comprises a first current source, a first branch and a second branch. The first branch and the second branch are used to shunt the current signal output by the first current source. The first branch comprises a first voltage-controlled current element and a first load connected in series. The second branch comprises a current signal detection element and a second load connected in series. The control signal input end of the first voltage-controlled current element inputs a voltage signal to be detected. The current signal detection element is used to output a preset signal representing a second current flowing through the second branch in real time, so that the change of the voltage signal to be detected can be determined based on the preset signal, and a more accurate detection result of the voltage signal to be detected can be obtained.

Description

TECHNICAL FIELD

[0001] The present disclosure relates to the field of integrated circuits, and in particular, to an integrated circuit internal voltage detection circuit, a detection method and an integrated circuit. BACKGROUND

[0002] For an integrated circuit, a stable voltage signal can enable the integrated circuit to operate stably. If the voltage fluctuation is large, it will have a great impact on the integrated circuit. On the one hand, the operating point of the integrated circuit is unstable, and the performance is reduced. On the other hand, the service life of the integrated circuit is affected. SUMMARY

[0003] This part of the disclosure is provided to briefly introduce the concepts, which will be described in detail in the specific embodiments part. This part of the disclosure is not intended to identify key features or essential features of the claimed technical solutions, nor is it intended to limit the scope of the claimed technical solutions.

[0004] The embodiments of the present disclosure provide an integrated circuit internal point voltage detection circuit, a detection method and an integrated circuit.

[0005] In a first aspect, the embodiments of the present disclosure provide an integrated circuit internal voltage detection circuit, comprising: a first current source, a first branch, a second branch; a signal input end of the first branch and a signal input end of the second branch are connected with an output end of the first current source; the first branch comprises a first voltage control current element and a first load connected in series; the second branch comprises a current signal detection element and a second load connected in series; a control signal input end of the first voltage control current element inputs a to-be-detected voltage signal; the first voltage control current element is configured to adjust a first current flowing through the first branch according to a size of the to-be-detected voltage signal; the current signal detection element is configured to output a preset signal representing a second current flowing through the second branch in real time, so as to determine a change of the to-be-detected voltage signal based on the preset signal.

[0006] In a second aspect, the embodiments of the present disclosure provide an integrated circuit, comprising: a power supply part, an integrated circuit internal voltage detection circuit as described in the first aspect, and a signal processing unit, wherein the power supply part is configured to supply power to a data processing unit on the integrated circuit; the integrated circuit internal voltage detection circuit is configured to detect a fluctuation of a voltage signal output by the power supply part to the data processing unit; and the signal processing unit is configured to analyze the fluctuation based on the integrated circuit internal voltage detection circuit and analyze a result.

[0007] In a third aspect, the embodiments of the present disclosure provide a method for detecting an internal voltage of an integrated circuit, applied to the integrated circuit internal voltage detection circuit as described in the first aspect. The method comprises: inputting a to-be-detected voltage signal to a control terminal of a first voltage-controlled current element of the integrated circuit internal voltage detection circuit; determining a change of the to-be-detected voltage signal according to a preset signal output by a current signal detection element of the second branch and a pre-determined correlation between the to-be-detected voltage signal and the preset signal.

[0008] The integrated circuit internal voltage detection circuit, the detection method and the integrated circuit provided by the embodiments of the present disclosure can detect the current change on the second branch by using the current signal detection element on the second branch, thereby inferring the change of the current on the first branch, and further determining the change of the to-be-detected voltage signal. A more accurate detection result of the to-be-detected voltage signal can be obtained. BRIEF DESCRIPTION OF DRAWINGS

[0009] The above and other features, advantages, and aspects of the embodiments of the present disclosure will become more apparent as various embodiments of the present disclosure are described in detail with reference to the drawings, in which like reference numerals refer to like elements throughout the various figures. The drawings provided herein are for illustration purposes only and, therefore, the elements in the drawings are not necessarily to scale. It should be understood that the drawings and detailed description are not intended to limit the spirit of the present disclosure.

[0010] Figure 1A , Figure 1B FIG. 1 is a structural schematic diagram of some embodiments of an integrated circuit internal voltage detection circuit according to the present disclosure;

[0011] Figure 2 FIG. 2 is a structural schematic diagram of other embodiments of an integrated circuit internal voltage detection circuit according to the present disclosure;

[0012] Figure 3 FIG. 3 is a structural schematic diagram of still other embodiments of an integrated circuit internal voltage detection circuit according to the present disclosure;

[0013] Figure 4 FIG. 4 is a structural schematic diagram of some embodiments of an integrated circuit according to the present disclosure;

[0014] Figure 5 FIG. 5 is a flow schematic diagram of a method for detecting an internal voltage of an integrated circuit according to the present disclosure. DETAILED DESCRIPTION

[0015] Embodiments of the present disclosure will be described below in greater detail with reference to the accompanying drawings. While certain embodiments of the present disclosure are shown in the drawings, it is understood that the present disclosure can be embodied in various forms and should not be interpreted as being limited to the embodiments set forth herein; rather, these embodiments are provided so as to more completely and thoroughly understand the present disclosure. It is understood that the drawings and embodiments of the present disclosure are for exemplary purposes only and are not intended to limit the scope of protection of the present disclosure.

[0016] It should be understood that each of the steps recited in the method embodiments of the present disclosure can be performed in different orders and / or in parallel. In addition, the method embodiments can include additional steps and / or omit the steps shown. The scope of the present disclosure is not limited in this respect.

[0017] The term "comprising" and variations thereof as used herein are open-ended, that is, "comprising but not limited to." The term "based on" is "based, at least in part, on." The term "one embodiment" means "at least one embodiment"; the term "another embodiment" means "at least one additional embodiment"; the term "some embodiments" means "at least some embodiments." Related terms are defined in the description that follows.

[0018] It should be noted that the terms "first", "second", and the like in the present disclosure are merely used to distinguish different devices, modules or units, and do not imply the order or interdependence of the functions performed by these devices, modules or units.

[0019] It should be noted that the terms "one", "multiple" in the present disclosure are illustrative and not limiting, and those skilled in the art should understand that "one or more" should be understood unless otherwise explicitly indicated in the context.

[0020] The names of the messages or information exchanged between the plurality of devices in the embodiments of the present disclosure are merely for illustrative purposes and are not intended to limit the scope of the messages or information.

[0021] Please refer to FIG. 1, which shows a schematic structural diagram of an integrated circuit internal voltage detection circuit provided by the present disclosure. As shown in FIG. 1, the integrated circuit internal voltage detection circuit includes a first current source 10, a first branch 12, and a second branch 13.

[0022] The signal input end of the first branch 12 and the signal input end of the second branch 13 are respectively connected with the output end of the first current source 10.

[0023] The first branch 12 comprises a first voltage-controlled current element 121 and a first load 122 connected in series. The control signal input end 1211 of the first voltage-controlled current element 121 inputs a voltage signal to be detected. The first voltage-controlled current element 121 is configured to adjust the size of the first current flowing through the first branch 12 according to the size of the voltage signal to be detected.

[0024] The second branch 13 comprises a current signal detection element 131 and a second load 132 connected in series. The current signal detection element 131 is configured to detect and output a preset signal representing the second current flowing through the second branch 13 in real time, so as to determine the change of the voltage signal to be detected based on the preset signal.

[0025] The preset signal herein is related to the current signal detection element used. When the current signal detection element is a galvanometer, the preset signal can be a current signal.

[0026] The output end of the first branch 12 and the output end of the second branch 13 are connected to a preset reference point.

[0027] In some application scenarios, the preset reference point can be a ground point.

[0028] The first branch 12 and the second branch 13 can share the total current output by the first current source 10. The size of the first current I1 flowing through the first branch 12 is related to the voltage signal to be detected input to the control end 1211 of the first voltage-controlled current element 121. The first voltage-controlled current element 121 can control the size of the first current I1 flowing through the first branch 12 according to the size of the voltage signal to be detected input to the control end 1211 thereof. For example, when the voltage signal to be detected increases, the first voltage-controlled current element 121 controls the first current I1 flowing through the first branch 12 to decrease.

[0029] Since the sum of the first current I1 and the second current I2 is equal to the size of the total current I s output by the first current source 10, when the size of the first current I1 changes, the size of the second current I2 will also change accordingly. For example, the first voltage-controlled current element 121 can control the first current I1 flowing through the first branch 12 to decrease according to the increase of the voltage signal to be detected input to the control end 1211 thereof. Since the sum of the first current I1 and the second current I2 is equal to the size of the total current I s output by the current source, when the first current I1 decreases, the second current I2 flowing through the second branch 13 will increase accordingly. In turn, the change of the voltage signal to be detected can be determined according to the change of the second current I2.

[0030] In the embodiment, the current signal detecting element 131 detects the current change on the second branch 13, so as to infer the current change on the first branch 12, and further determine the change of the voltage signal to be detected. The detection result of the voltage signal to be detected can be more accurate.

[0031] In some embodiments, as shown in Figure 2 The first voltage-controlled current element 121 can be a first MOS transistor. The gate of the first MOS transistor is connected to the control terminal of the first voltage-controlled current element 121 and inputs the voltage signal to be detected. The source of the first MOS transistor is connected to the output terminal of the first current source 10 and serves as the input terminal of the first voltage-controlled current element 121. The drain of the first MOS transistor is connected to the input terminal of the first load 122 and serves as the output terminal of the first voltage-controlled current element 121.

[0032] The first MOS transistor can be various types of MOS transistors. Preferably, the first MOS transistor is a P-MOS transistor. The first MOS transistor can work in a linear region.

[0033] When the first MOS transistor is a P-MOS transistor, when the voltage signal to be detected input by the gate of the first MOS transistor increases, the first current I1 flowing between the source and the drain of the first MOS transistor will decrease. Thus, the first MOS transistor achieves the purpose of adjusting the first current flowing through the first branch according to the change of the voltage signal to be detected input by the control terminal.

[0034] In some alternative implementations, the first load includes a second MOS transistor. The drain of the second MOS transistor is connected to the output terminal of the first voltage-controlled current element 121 and serves as the input terminal of the first load. The gate of the second MOS transistor is connected to the drain. The source of the second MOS transistor is connected to a preset reference point potential and serves as the output terminal of the first load.

[0035] The current signal detecting element 131 can include a first output terminal 1311 and a second output terminal. The first output terminal 1311 is used to output the preset signal, and the second output terminal is used to be connected to the input terminal of the second load.

[0036] Alternatively, the second load includes a third MOS transistor. The drain of the third MOS transistor is connected to the second output terminal of the current signal detecting element 131 and serves as the input terminal of the second load. The gate of the third MOS transistor is connected to the drain. The source of the third MOS transistor is connected to a preset reference point potential and serves as the output terminal of the second load.

[0037] Please continue to refer to Figure 2 which shows another schematic structural diagram of the internal voltage detection circuit of the integrated circuit. As shown in Figure 1ASimilarly, the voltage detection circuit inside this integrated circuit includes... Figure 1A The same first current source 21 and first branch 22 are not described in detail here. Furthermore, the voltage detection circuit inside this integrated circuit includes a second branch 23. The second branch 23 includes a current signal detection element and a second load 232.

[0038] The first branch 22 may include a first voltage-controlled current element 221 and a first load 222 connected in series. The control signal input terminal of the first voltage-controlled current element 221 receives the voltage signal to be detected. The first voltage-controlled current element 221 is used to adjust the magnitude of the first current flowing through the first branch 22 according to the magnitude of the voltage signal to be detected.

[0039] and Figure 1B Similarly, the first voltage-controlled current element 221 can be a first MOSFET M1'. The first MOSFET M1' can be a P-MOSFET. The first load can be a second MOSFET M2'. The connection relationship of the first MOSFET in the first branch can be referenced. Figure 1B The description of the illustrated embodiments is omitted here.

[0040] and Figure 1A and Figure 1B The difference between the embodiments shown is that, Figure 2 The current signal detection element in the second branch 23 of the voltage detection circuit inside the integrated circuit shown includes a ring oscillator 231.

[0041] The ring oscillator 231 may include an odd number of inverters connected end-to-end. The ring oscillator 231 may include an input terminal, a first output terminal 2311, and a second output terminal.

[0042] The ring oscillator 231 can adjust the input current signal into a periodic oscillation signal. The frequency of the periodic oscillation can be determined based on the output signal of the ring oscillator 231. The frequency of the periodic oscillation signal output by the ring oscillator 231 is related to the magnitude of the input current (i.e., the second current flowing through the second branch). For example, the frequency of the periodic oscillation signal is proportional to the magnitude of the current flowing through the ring oscillator 231.

[0043] The first output terminal 2311 of the ring oscillator 231 outputs a periodically oscillating current signal. The second output terminal, serving as the output terminal of a current signal detection element, is connected to the input terminal of a second load.

[0044] In this embodiment, the preset signal output by the current signal detection element can be a periodic oscillating current signal. The oscillation frequency can be determined based on the aforementioned periodic oscillating current signal.

[0045] The second load 232 can be a third MOS transistor. The connection relationship of the third MOS transistor in the second branch can refer to the connection relationship of the first MOS transistor in the first branch of the embodiment shown in Figure 1B The description of the above-mentioned embodiment part is not repeated here.

[0046] In the embodiment, the parameters of the first load 222 and the parameters of the second load 232 can be the same.

[0047] In the embodiment, the ring oscillator 231 is used as a current signal detection element to convert the current signal flowing through the second branch 23 into a periodic oscillation signal, so as to convert the detection of the current signal into the detection of the periodic signal of the periodic oscillation signal. The influence of noise on the detection result of the current signal can be reduced, and the detection accuracy of the voltage signal to be detected can be improved.

[0048] Please further refer to Figure 3 which shows the structural schematic diagram of still another embodiment of the internal voltage detection circuit of the integrated circuit provided by the present disclosure. As shown in Figure 3 The internal voltage detection circuit of the integrated circuit includes a first current source 31, a first branch 32, and a second branch 33.

[0049] The first current source 31 and the first branch 32 can include a first voltage-controlled current element 321 and a first load 322. The first voltage-controlled current element can be a first MOS transistor M1”. The first load 322 can be a second MOS transistor M2”. The connection mode of each element in the first branch 32 is the same as that of the embodiment shown in Figure 1A 、 Figure 1B The description of the above-mentioned embodiment part is not repeated here.

[0050] The second branch 33 of the embodiment can include a second load 332 and a current signal detection element, such as a ring oscillator 331, which are the same as those of the embodiment shown in Figure 2

[0051] Unlike the embodiment shown in Figure 2 The internal voltage detection circuit of the integrated circuit provided by the embodiment further includes a potential adjustment sub-circuit. The potential adjustment sub-circuit is used to adjust the potentials of the signal input end of the first load and the signal input end of the second load to be the same. The above-mentioned potential adjustment sub-circuit makes the current output by the first current source 31 approximately divided into a first current and a second current with the same size. The first current flows through the first branch, and the second current flows through the second branch. The problem that the first current and the second current are greatly different in the proportion of the current division caused by the asymmetry of the first branch and the second branch in the embodiment can be overcome. Figure 2

[0052] ​​As an implementation, the potential adjusting sub-circuit comprises a second current source 350, a second voltage-controlled current element 351, a third load 352, an operational amplifier 353, and a fourth MOS transistor M4.

[0053] The second current source 350 outputs a current signal with a magnitude of half of that of the first current source 31. The control terminal of the second voltage-controlled current element 351 inputs a reference detection voltage signal. The input terminal of the second voltage-controlled current element 351 is connected to the output terminal of the second current source 350, the output terminal of the second voltage-controlled current element 351 is connected to the first signal input terminal of the operational amplifier 353, and is also connected to the input terminal of the third load 352. The second signal input terminal of the operational amplifier 353 is connected to the input terminal of the second load 332. The gate of the fourth MOS transistor M4 is connected to the output terminal of the operational amplifier 353. The drain of the fourth MOS transistor M4 is connected to the signal input terminal of the second load 332, and is also connected to the second signal input terminal of the operational amplifier 353. The source of the fourth MOS transistor M4 is connected to the output terminal of the third load 352, the input terminal of the third load 352 is connected to the first signal input terminal of the operational amplifier 353, and the output terminal of the third load 352 is connected to a reference potential.

[0054] The reference potential can be, for example, a ground potential.

[0055] The reference detection voltage signal can have a magnitude of a desired value of the to-be-detected voltage signal. For example, if the desired value of the to-be-detected voltage signal is 12V, the reference detection voltage signal can be a 12V reference detection voltage signal.

[0056] The third load 352 has the same parameters as the first load 322 and the second load 332. In the embodiment, the first load 322, the second load 332, and the third load 352 can be MOS transistors with the same parameters. For example, N-MOS transistors.

[0057] The first load 322 is a second MOS transistor M2”, and the second load 332 is a third MOS transistor M3”. The manner in which each of them is arranged in the circuit can refer to the description of the example part shown in Figure 1B The description of the example part shown in

[0058] The third load 352 can be a sixth MOS transistor M6. The drain of the sixth MOS transistor M6 is connected to the gate of the sixth MOS transistor M6. The drain of the sixth MOS transistor M6 is connected to the output of the second voltage-controlled current element 351 and the first signal input of the operational amplifier 353 as the input of the third load 352. The source of the sixth MOS transistor M6 is connected to a preset reference potential as the output of the third load 352. The fourth MOS transistor M4 can be a MOS transistor with the same parameters as the third MOS transistor M3".

[0059] The second voltage-controlled current element 351 can be a MOS transistor (fifth MOS transistor M5). The gate of the fifth MOS transistor M5 is connected to the control terminal of the second voltage-controlled current element 351 and inputs a reference detection voltage signal. The fifth MOS transistor M5 can be a P-MOS transistor.

[0060] The current signal output by the second current source 350 can be Ib / 2, for example. Ib is the current signal output by the first current source 31.

[0061] In the embodiment, the operational amplifier and the fourth MOS transistor M4 form a negative feedback circuit for adjusting the potential at point b, the input of the second load 332, to be close to the potential at point c, the input of the third load 352.

[0062] Let the change of the to-be-detected voltage signal be ΔV in For example, the current I1 on the first branch 32 changes by ΔI1; ΔI1 = -ΔV in × g m g m g is the transconductance of the first MOS transistor M1".

[0063] For example, if the first MOS transistor M1" is a P-MOS transistor, if ΔV in is positive, that is, the to-be-detected voltage signal increases by ΔV in compared to the expected value Vin, the first current signal flowing through the first branch 32 will decrease by ΔI1 accordingly.

[0064] Correspondingly, the second current I2 flowing through the second branch 33 will increase by ΔI2. That is, ΔI2 = -ΔI1. Accordingly, the frequency of the ring oscillator will also change according to ΔI2. Generally, the oscillation frequency of the oscillation signal of the ring oscillator will change linearly according to ΔI2. Specifically, the change Δf of the oscillation frequency can be represented as Δf = k x ΔI2, k being a constant. The oscillation frequency can be represented as f = c x f0 + d x Δf. Here, c and d can be constants. f0 is the oscillation frequency of the periodic oscillation signal output by the ring oscillator when the to-be-detected voltage is the expected value.

[0065] A correlation between the voltage signal to be detected and the oscillation frequency of the ring oscillator 331 can be established in advance. Then, based on the above... Figure 3 In the circuit shown, the preset signal (oscillation frequency of the periodic oscillation signal) output by the ring oscillator 331 determines the magnitude of the voltage signal to be detected.

[0066] The working process of the potential adjustment sub-circuit is explained below.

[0067] The first signal input terminal of the operational amplifier 353 can be the inverting input terminal of the operational amplifier 353. The second signal input terminal can be the non-inverting input terminal of the operational amplifier 353.

[0068] like Figure 3 As shown, if the potential at point b is greater than the potential at point c, that is, Vb is greater than Vc, the voltage signal input to the non-inverting input terminal of operational amplifier 353 is Vb, and the voltage signal input to the inverting input terminal of operational amplifier 353 is Vc. Since Vb is greater than Vc, the output signal of operational amplifier increases. At this time, the gate voltage of the fourth transistor M4 increases, causing the current Ia flowing through the fourth transistor M4 to increase. The current Ia flowing through the fourth transistor M4... a The sum of the current flowing through the second load 332 and the current flowing through the second branch 33 is the current flowing through the second branch 33. Since the current I flowing through the fourth transistor M4... a The increase causes the current I flowing through the second load to increase. 21 Decrease. I 21 Decreasing the voltage will lower the potential at point b, causing the potential Vb at point b to converge with the potential Vc at point c. Since the structure of the first branch 32 is the same as the sub-circuit consisting of the second voltage-controlled current element and the third load, and the magnitude of the reference detection voltage signal input to the control terminal of the second voltage-controlled current element is the expected value of the voltage signal to be detected, and the magnitude of the current signal output by the second current source is half the magnitude of the current signal output by the first current source, the potential Va at point a is approximately equal to the potential Vc at point c.

[0069] Since Vc and Va are approximately the same, Vc, Va, and Vb are also approximately the same. Therefore, the first branch 32 and the second branch 33 can approximately bisect the current source, allowing M1 to operate at the expected operating point.

[0070] and Figure 2Compared with the embodiments shown in the drawings, the embodiment uses a potential adjusting sub-circuit in the second branch, and adjusts the potential of the second load through the potential adjusting sub-circuit, so that the currents flowing through the first branch and the second branch can be approximately equal. Thus, on the basis of being able to detect the to-be-detected voltage signal, the first current flowing through the first branch and the second current flowing through the second branch are approximately equal. The problem of deviation of the detection result of the to-be-detected voltage signal caused by the first current flowing through the first branch and the second current flowing through the second branch being too large is avoided.

[0071] Please refer to Figure 4 which shows the structural schematic diagram of some embodiments of the integrated circuit provided by the present disclosure.

[0072] As Figure 4 shown, the integrated circuit 40 includes a power supply part 41, an integrated circuit internal voltage detection circuit 42 provided by any one of the embodiments of FIG. 1-FIG. Figure 3 and a signal processing unit 43.

[0073] The power supply part 41 is configured to supply power to the signal processing unit in the integrated circuit.

[0074] The integrated circuit internal voltage detection circuit 42 is configured to detect the size of the voltage signal output by the power supply part 41 to the signal processing unit 43.

[0075] The signal processing unit 43 is configured to analyze the fluctuation of the voltage signal output by the integrated circuit internal voltage detection circuit 42 and analyze the analysis result.

[0076] Please continue to refer to Figure 5 which shows the flowchart of some embodiments of the integrated circuit internal voltage detection method provided by the present disclosure.

[0077] The integrated circuit internal voltage detection circuit includes a first current source, a first branch and a second branch; the signal input end of the first branch and the signal input end of the second branch are respectively connected with the output end of the first current source; the first branch includes a first voltage control current element and a first load connected in series; the second branch includes a current signal detection element and a second load connected in series; the control signal input end of the first voltage control current element inputs the to-be-detected voltage signal; the first voltage control current element is configured to adjust the first current flowing through the first branch according to the size of the to-be-detected voltage signal; the current signal detection element is configured to output a preset signal representing the second current flowing through the second branch in real time, so as to determine the change of the to-be-detected voltage signal based on the preset signal. Specifically, the integrated circuit internal voltage detection circuit can be the integrated circuit internal voltage detection circuit provided by any one of the embodiments of FIG. 1-FIG. Figure 3

[0078] As​Figure 5 The integrated circuit internal voltage detection method can include the following steps as shown in the figure:

[0079] Step 503, input the voltage signal to be detected to the control end of the first voltage-controlled current element of the integrated circuit internal voltage detection circuit.

[0080] In some application scenarios, the output end of the power supply part outputting the voltage signal to be detected can be connected to the control end of the first voltage-controlled current element through a switching element. When it is necessary to detect the voltage signal to be detected, the switching element can be turned on by a control signal, so as to input the voltage signal to be detected to the control end of the first voltage-controlled current element.

[0081] In some other application scenarios, the output end of the power supply part outputting the voltage signal to be detected can be directly connected to the control end of the first voltage-controlled current element, so that the integrated circuit internal voltage detection circuit detects the voltage signal to be detected in real time.

[0082] Step 504, determine the change of the voltage signal to be detected according to the preset signal output by the current signal detection element of the second branch and the preset parameter between the voltage signal to be detected and the preset signal.

[0083] The preset signal herein is different according to the current signal detection element. When the current signal detection element is a current meter, the preset signal can be the second current signal flowing through the second branch.

[0084] The correlation between the voltage signal to be detected and the size of the second current signal can be established in advance. The preset parameter of the preset signal can be the current size.

[0085] In actual detection, the size of the voltage signal to be detected is determined according to the second current signal output by the current signal detection element.

[0086] In some application scenarios, the current signal detection element can be a ring oscillator. When the current signal detection element is a ring oscillator, the preset signal can be a periodic oscillation current signal.

[0087] The oscillation frequency can be determined according to the periodic oscillation current signal. The preset parameter of the preset signal can be the oscillation frequency of the periodic oscillation current signal.

[0088] The correlation between the voltage signal to be detected and the frequency of the oscillation signal output by the ring oscillator can be established in advance.

[0089] In actual detection, the size of the voltage signal to be detected is determined according to the frequency of the oscillation signal output by the ring oscillator and the correlation.

[0090] For further details, reference can be made to the description of the embodiments as illustrated in the accompanying drawings and described in the following paragraphs. Figure 2 、 Figure 3 For further details, reference can be made to the description of the embodiments as illustrated in the accompanying drawings and described in the following paragraphs.

[0091] In some optional implementations of the present embodiments, before the step 503, the integrated circuit internal voltage detection method further includes the following steps:

[0092] In step 501, a preset signal corresponding to each known voltage signal is obtained from the current signal detection element by inputting at least one known voltage signal to the control signal input end of the first voltage-controlled current element.

[0093] In step 502, the correlation between the voltage signal and the preset parameter of the preset signal is determined according to the size of the at least one known voltage signal and the preset signal.

[0094] The preset signal can be a second current flowing through the second branch.

[0095] The preset parameter here can be the size of the second current flowing through the second branch.

[0096] In some application scenarios, the preset signal can be a periodic oscillation signal of a ring oscillator in the second branch. The preset parameter can be the oscillation frequency of the ring oscillator in the second branch.

[0097] In these optional implementations, the integrated circuit internal voltage detection circuit can be calibrated in specific application scenarios through the steps 501 and 502. According to the calibration process, the correlation between the to-be-detected voltage signal and the preset parameter of the preset signal is re-established, and then the re-established correlation is used to detect the to-be-detected voltage signal through the steps 503 and 504. The problem of inaccurate detection results caused by the influence of temperature on the integrated circuit internal voltage detection circuit can be avoided.

[0098] In some optional implementations, at least two integrated circuit internal voltage detection circuits can be provided in the integrated circuit. The integrated circuit internal voltage detection circuit inputting the to-be-detected voltage signal is switched once every preset time period. The to-be-detected voltage signal is continuously detected using the switched integrated circuit internal voltage detection circuit. The integrated circuit internal voltage detection circuit disconnected from the to-be-detected voltage signal is calibrated using the method of steps 501-502.

[0099] The above description merely illustrates the preferred embodiments of the disclosure and a principle for applying the technologies. It is understood by those skilled in the art that the disclosed scope of the disclosure is not limited to the technical solutions formed by the specific combinations of the technical features described above, and should also cover other technical solutions formed by the combinations of the technical features described above or their equivalent features without departing from the disclosed concept. For example, the technical solutions formed by the mutual replacement of the above-described features and the technical features with similar functions disclosed in the disclosure (but not limited to) can be formed.

[0100] Further, although operations are depicted in a particular, sequential order, this should not be understood as requiring or implying that the operations are performed in the order illustrated or sequentially. In certain circumstances, multitasking and parallel processing can be advantageous. Likewise, although specific implementation details are included for the purpose of providing a thorough disclosure, these should not be construed as limitations on the scope of the disclosure. Certain features that are described in the context of separate embodiments can also be implemented in combination in a single embodiment. Conversely, various features that are described in the context of a single embodiment can also be implemented in multiple embodiments separately or in any suitable sub-combination.

[0101] Although the subject matter has been described in language specific to structural features and / or methodological acts, it is to be understood that the subject defined in the appended claims is not necessarily limited to the specific features or acts described above. Rather, the specific features and acts described above are disclosed as example forms of implementing the claims.

Claims

1. An integrated circuit internal voltage detection circuit, comprising: The first current source, the first branch, the second branch; the signal input end of the first branch and the signal input end of the second branch are connected with the output end of the first current source respectively; The first branch comprises a first voltage-controlled current element and a first load connected in series; the second branch comprises a current signal detection element and a second load connected in series; The control signal input end of the first voltage-controlled current element inputs a voltage signal to be detected; the first voltage-controlled current element is used for adjusting the first current flowing through the first branch according to the size of the voltage signal to be detected; The current signal detection element is used for outputting a preset signal in real time, which represents the second current flowing through the second branch, so that the change of the voltage signal to be detected is determined based on the preset signal; The voltage detection circuit further comprises a potential adjustment sub-circuit, which is used for adjusting the potentials of the signal input end of the first load and the signal input end of the second load to be the same.

2. The voltage detection circuit according to claim 1, wherein The first voltage-controlled current element is a first MOS tube. The gate of the first MOS tube inputs the voltage signal to be detected; The source of the first MOS tube is connected with the output end of the first current source; The drain of the first MOS tube is connected with the first load.

3. The voltage detection circuit of claim 2, wherein, The first MOS tube is a P-MOS tube.

4. The voltage detection circuit of claim 1, wherein, The current signal detection element comprises a ring oscillator. The preset signal is an oscillation frequency output by the ring oscillator, and the oscillation frequency is related to the second current flowing through the second branch.

5. The voltage detection circuit of claim 1, wherein, The first load comprises a second MOS tube, the drain of the second MOS tube is connected with the output end of the first voltage-controlled current element, the gate of the second MOS tube is connected with the drain, and the source of the second MOS tube is connected with a reference potential.

6. The voltage detection circuit of claim 5, wherein, The second load comprises a third MOS tube, the drain of the third MOS tube is connected with the second output end of the current signal detection element, the gate of the third MOS tube is connected with the drain, the source of the third MOS tube is connected with a reference potential, and the first output end of the current signal detection element outputs the preset signal.

7. The voltage detection circuit of claim 1, wherein, The potential adjustment sub-circuit comprises a second current source, a second voltage-controlled current element, a third load, an operational amplifier and a fourth MOS tube. The size of the current signal output by the second current source is half of the size of the current signal output by the first current source. The control end of the second voltage-controlled current element inputs a reference detection voltage signal; the signal input end of the second voltage-controlled current element is connected with the output end of the second current source, the signal output end of the second voltage-controlled current element is connected with the first signal input end of the operational amplifier, and the second signal input end of the operational amplifier is connected with the signal input end of the second load. The gate of the fourth MOS transistor is connected with the signal output end of the operational amplifier; the drain of the fourth MOS transistor is connected with the signal input end of the second load and the second signal input end of the operational amplifier; the source of the fourth MOS transistor is connected with the output end of the third load, the input end of the third load is connected with the first signal input end of the operational amplifier, and the output end of the third load is connected with a reference potential.

8. The voltage detection circuit of claim 7, wherein, The second voltage-controlled current element comprises a fifth MOS transistor, and the gate of the fifth MOS transistor is the control end of the second voltage-controlled current element. The source of the fifth MOS transistor is the signal input end of the second voltage-controlled current element, and the drain of the fifth MOS transistor is the signal output end of the second voltage-controlled current element.

9. The voltage detection circuit of claim 7, wherein, The third load comprises a sixth MOS transistor, the drain of the sixth MOS transistor is connected with the output end of the second voltage-controlled current element, and the gate of the sixth MOS transistor is connected with the drain. The source of the sixth MOS transistor is connected with a reference voltage.

10. An integrated circuit comprising a power supply, an integrated circuit internal voltage detection circuit according to any one of claims 1-9, and a signal processing unit, wherein the power supply is configured to supply power to the signal processing unit on the integrated circuit; the voltage detection circuit is configured to detect fluctuations in a voltage signal output by the power supply to the signal processing unit; and the signal processing unit is configured to analyze the fluctuations based on the voltage detection circuit and output the analysis results. A first current source, a first branch, and a second branch; the signal input end of the first branch and the signal input end of the second branch are respectively connected with the output end of the first current source; the first branch comprises a first voltage-controlled current element and a first load connected in series; the second branch comprises a current signal detection element and a second load connected in series; the control signal input end of the first voltage-controlled current element inputs a voltage signal to be detected; the first voltage-controlled current element is configured to adjust a first current flowing through the first branch according to the size of the voltage signal to be detected; the current signal detection element is configured to output a preset signal representing a second current flowing through the second branch in real time, so that the change of the voltage signal to be detected is determined based on the preset signal; and the method comprises: inputting the voltage signal to be detected to the control end of the first voltage-controlled current element of the voltage detection circuit; determining the change of the voltage signal to be detected according to the preset signal output by the current signal detection element of the second branch read in real time and the predetermined correlation between the voltage signal to be detected and the preset signal.

11. An integrated circuit internal voltage detection method applied to the integrated circuit internal voltage detection circuit according to any one of claims 1 to 9, the voltage detection circuit comprising: Before the voltage signal to be detected is input to the control signal input end of the first voltage-controlled current element, the method further comprises: inputting at least one known voltage signal to the control signal input end of the first voltage-controlled current element to obtain the second current signal size corresponding to each known voltage signal; determining the correlation between the voltage signal and the second current signal according to the at least one known voltage signal and the second current signal size.

12. The method of claim 11, wherein, ​ ​ ​

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