Rapid safety testing system and method for transceiver components based on multi-state process reconstruction

Abstract

The present invention provides a system and method for rapid and safe testing of transceiver components based on multi-state process reconstruction, and relates to the technical field of phased array radars. The present invention includes a main controller for generating a first control signal of a test system and controlling the test system according to an indicator to be tested; a data acquisition and control unit for performing signal acquisition and analysis and generating a second control signal according to the first control signal; a switch matrix for performing link switching according to the first control signal and the second control signal, and a test instrument group for testing and displaying the indicator to be tested by selecting different test instruments according to the link switching. The present invention can realize the one-time delivery of all states and processes of the test indicators and instrument scanning settings according to different working states of the transceiver components, and then the overall reading technology can minimize the time of state switching and data reading during the test process, and improve the test efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of phased array radars, and in particular to a system and method for rapid safety testing of transceiver components based on multi-state process reconstruction. Background Art

[0002] With the rapid development of phased array radar equipment, higher and higher requirements are placed on the testing technology of phased array radar and its core units. The core component of phased array radar is the transceiver unit. Phased array radar achieves electronic scanning through the phase control of the transceiver unit and achieves better beam pointing through the amplitude control of the side lobes. There are tens of thousands of transceiver units on each phased array radar, which are composed of transceiver modules, and then the transceiver modules are composed of antenna subarrays. The transceiver units, transceiver modules and transceiver channels in the antenna subarray are collectively referred to as transceiver components.

[0003] Since the transceiver components are multiplexed in the transceiver channel, the current testing of the transceiver components is mainly focused on how to ensure that the signal source, noise source, vector network analyzer and other instruments and equipment are not damaged due to test link switching errors under the high-power test state of the transmission channel. However, in the existing safety testing process of transceivers, it is necessary to constantly change the hardware connection or signal flow direction, resulting in slow testing speed. Summary of the invention

[0004] 1. Technical issues to be resolved

[0005] In view of the deficiencies of the prior art, the present invention provides a system and method for rapid and safe testing of transceiver components based on multi-state process reconstruction, which solves the technical problem of slow testing speed of the prior art transceiver components.

[0006] (II) Technical solution

[0007] To achieve the above objectives, the present invention is implemented through the following technical solutions:

[0008] In a first aspect, the present invention provides a fast safety testing system for transceiver components based on multi-state process reconstruction, comprising:

[0009] A main controller, used to generate a first control signal of the test system according to the index to be tested and control the test system;

[0010] A data acquisition and control unit, used to collect and analyze signals according to the first control signal and generate a second control signal;

[0011] A switch matrix, used for performing link switching according to a first control signal and a second control signal;

[0012] The test instrument group is used to switch different test instruments according to the link to test and display the indicators to be tested;

[0013] in,

[0014] The data acquisition and control unit sends the working status of the transceiver component, the synchronization trigger signal required by the test instrument to test each working status of the transceiver component, and the working status switching delay pulse at one time according to the selected test indicators and test sequence, thereby realizing one-time control of the working status of components in any combination of multiple states and the scanning data of the test instrument, as well as one-time collection of the data of the test instrument; when the test indicators are different or the test sequence of the indicators is different, the working status of the transceiver component and the test process are reconstructed.

[0015] Preferably, the data acquisition and control unit includes a high-precision data acquisition module, a digital signal acquisition and control module and a power supply module;

[0016] When the receiving channel test of the transceiver component is performed, the switches in the switch matrix are controlled so that the high-precision data acquisition module monitors the receiving small signal output by port 2 of the power divider 1. When the excitation signal output by port 2 of the power divider 1 monitored by the high-precision data acquisition module cannot meet the test excitation requirement of the receiving channel of the transceiver component, the main controller forms a negative feedback circuit by adjusting the source output of the vector network analyzer through software until the signal level of port 2 of the power divider 1 meets the small signal receiving requirement of the transceiver component;

[0017] When the transmission channel test of the transceiver component is carried out, the switches in the switch matrix are controlled so that the high-precision data acquisition module in the acquisition and control unit monitors the output excitation level of the power amplifier through the coupling end 2 of the dual directional coupler. When the output signal power cannot meet the transmission excitation requirement of the transceiver component, the main control software in the main controller is adjusted to form a negative feedback loop to adjust the output power of the vector network signal source 1 so that the output power meets the saturation working requirement of the transmission channel of the transceiver component.

[0018] Preferably, before the data acquisition and control unit sends the working state of the transceiver component, the synchronization trigger signal required by the test instrument to measure each working state of the transceiver component, and the delay pulse for switching the working state of the transceiver component, it also includes:

[0019] Using the splicing technology, the working status of the transceiver components, the synchronization trigger signal required for testing the instrument in each working status, and the working status switching delay pulse are spliced ​​according to the reconstructed indicator execution order to form a complete test timing flow.

[0020] Preferably, the splicing technology includes:

[0021] Assume the number of test points of the transceiver component is N,

[0022] When performing initial phase and gain tests, perform splicing of the base state test state of the transceiver component and splicing of N external trigger scanning signals of the vector network;

[0023] When performing compression parameter testing, the receiving base state test state of the transceiver component is spliced, and according to the test frequency points and power scanning interval of the compression parameter, the trigger signal splicing of M test frequency points * P power scanning points is performed;

[0024] When performing attenuation and phase shift multi-state tests, splicing is performed from the first state according to the selection of the test state until all the test states are spliced. Each test state is spliced ​​in the form of first splicing the test state and then splicing N trigger signals. Each time, splicing starts from state 0, and state 0 is used as the benchmark for multi-state testing.

[0025] When performing a noise coefficient test, perform splicing of the receiving base state and splicing of the trigger signal.

[0026] Preferably, the switch matrix includes SCPI instruction controlled switches, digital signal controlled analog switches and digital circuit switches.

[0027] Preferably, the test instrument set includes a vector network analyzer;

[0028] The vector network analyzer adopts an open link design;

[0029] Case 1:

[0030] Disconnect the external jumper between the RCVR R1 IN port and the Source Out port of the vector network analyzer reference receiver, and connect the coupled terminal 1 of the dual directional coupler to the RCVR R1 IN port.

[0031] Case 2:

[0032] Disconnect the external jumper between the thru-arm output CPLR THRU port and the Source Out port of the internal source Source1 of the vector network analyzer.

[0033] Preferably, the vector network analyzer is calibrated by using a power meter to calibrate an output source and a measurement receiver of the vector network analyzer, and the calibration process includes:

[0034] The attenuation of Source 1 in the Power and Att setting of the vector network port 1 of the vector network analyzer is set to a fixed state of 0 dB, and the power of the vector network port 1 is calibrated with a power meter;

[0035] During calibration, the calibration level is set at 0dBm; after the power meter completes the calibration of port 1 of the vector network analyzer, the ports 1 and 2 of the vector network analyzer are directly calibrated, and the power calibration result of port 1 of the vector network analyzer is transmitted to the measurement receiver of port 2 of the vector network analyzer to calibrate the measurement receiver of the vector network analyzer;

[0036] Stabilize the source of port 1 of the vector network analyzer in the receiver steady-amplitude state, and set the measurement mode of the vector network analyzer to the receiver steady-amplitude state.

[0037] In a second aspect, the present invention provides a method for rapid safety testing of a transceiver component based on multi-state process reconstruction, using the rapid safety testing system for a transceiver component based on multi-state process reconstruction as described above to test the transceiver component, including:

[0038] According to different test indicators and test sequences, different test links are switched by a switch matrix. According to different test states, test frequencies, scanning powers and test points, the working state of the components is controlled by a data acquisition and control unit. The synchronous test start trigger signal and point scanning control signal of the test instrument are sent down to control the receiver synchronous measurement signal of the test instrument. At least one of the indicators of the transceiver component, including the initial phase and gain, nonlinear phase, multi-state phase shift accuracy, multi-state attenuation accuracy, input and output 1dB compression point, noise figure, transmission initial phase and gain, transmission power and transmission efficiency, is tested and displayed.

[0039] (III) Beneficial effects

[0040] The present invention provides a system and method for rapid safety testing of transceiver components based on multi-state process reconstruction. Compared with the prior art, it has the following beneficial effects:

[0041] The data acquisition and control unit of the present invention sends the working state of the transceiver component, the synchronization trigger signal required by the test instrument to test each working state of the transceiver component, and the working state switching delay pulse at one time according to the selected test index and test sequence, so as to realize the one-time control of the component working state of any combination of multiple states and the scanning data of the test instrument, and the one-time collection of the data of the test instrument; when the test index is different or the test sequence of the index is different, the working state of the transceiver component and the test process are reconstructed. The present invention can realize the one-time sending of all states and processes of the test index and instrument scanning setting according to the different working states of the transceiver component, and then the overall reading technology can minimize the time of state switching and data reading in the test process, thereby improving the test efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the embodiments of the present invention or the technical solutions in the prior art, the drawings required for use in the examples or the prior art descriptions are briefly introduced below. Obviously, the drawings described below are only some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying creative work.

[0043] Figure 1 It is an overall block diagram of a fast safety testing system for transceiver components based on multi-state process reconstruction according to an embodiment of the present invention;

[0044] Figure 2 It is a framework diagram of a fast safety testing system for transceiver components based on multi-state process reconstruction according to an embodiment of the present invention;

[0045] Figure 3 Multi-state process reconstruction flowchart;

[0046] Figure 4 Flowchart of the test method for the rapid and safe testing system of transceiver components. DETAILED DESCRIPTION

[0047] In order to make the purpose, technical solutions and advantages of the implementation of the present invention clearer, the technical solutions in the implementation of the present invention are clearly and completely described. Obviously, the described implementation mode is a part of the implementation scope of the present invention, but not the entire implementation scope. Based on the implementation mode of the present invention, all other embodiments obtained by ordinary technicians in this field without creative work are within the scope of protection of the present invention.

[0048] The example of this application solves the technical problem of slow testing of existing transceiver components by providing a fast and safe testing system for transceiver components based on multi-state process reconstruction. By utilizing multi-state process reconstruction technology, the test status of the transceiver components and the scanning control of the instrument can be sent at one time without changing the hardware connection and signal flow, thereby realizing one-time collection of test data and greatly improving test efficiency.

[0049] The technical solution in this application example is to solve the above technical problems, and the overall idea is as follows:

[0050] The example of the present invention adopts a fast and safe testing technology for transceiver components based on multi-state process reconstruction, which can realize the one-time delivery of all states and processes of test indicators and instrument scanning settings according to different working states of the transceiver components, and then the overall reading technology can minimize the time of state switching and data reading during the test process, thereby improving the test efficiency. At the same time, on the basis of not increasing the hardware cost, with the help of software processing algorithms and existing hardware output and control, a combination of software + hardware is adopted to realize the power supply voltage, power-on sequence, temperature detection, current detection, excitation signal detection, pulse width detection and other functions of the radar transceiver component. During the entire test process, the correctness of the test signal and the test process, the safety of the test equipment and the tested device are guaranteed, and a safe and fast test of the transceiver component is formed. A good theoretical foundation has been accumulated for the index test of the transceiver component of the phased array radar.

[0051] In order to better understand the above technical solution, the above technical solution will be described in detail below in conjunction with the accompanying drawings and specific implementation methods.

[0052] The present invention provides a fast safety testing system for transceiver components based on multi-state process reconstruction, such as Figure 1 As shown, including:

[0053] A main controller, used to generate a first control signal of the test system according to the index to be tested and control the test system;

[0054] A data acquisition and control unit, used for acquiring digital signals and generating a second control signal according to the first control signal;

[0055] A switch matrix, used for performing link switching according to a first control signal and a second control signal;

[0056] The test instrument group is used to switch different test instruments according to the link to test and display the indicators to be tested;

[0057] in,

[0058] The data acquisition and control unit sends the working status of the transceiver component, the synchronization trigger signal required by the test instrument to test each working status of the transceiver component, and the working status switching delay pulse at one time according to the selected test indicators and test sequence, thereby realizing one-time control of the working status of components in any combination of multiple states and the scanning data of the test instrument, as well as one-time collection of the data of the test instrument; when the test indicators are different or the test sequence of the indicators is different, the working status of the transceiver component and the test process are reconstructed.

[0059] It should be noted that the first control signal in the example of the present invention generally refers to a signal generated by a main controller, and the second control signal generally refers to a signal generated by a data acquisition and control unit.

[0060] The example of the present invention can realize the one-time delivery of all states and processes of test indicators and instrument scanning settings according to the different working states of the transceiver components, and then the overall reading technology can minimize the time of state switching and data reading during the test process, thereby improving the test efficiency.

[0061] The test system is described in detail below:

[0062] like Figure 2 As shown, the system includes: a main controller that generates a first control signal of the test system according to the indicator to be tested and controls the test system; a switch matrix for switching the test link of the transceiver component; a data acquisition and control unit for realizing analog signal detection, component power supply, and digital signal acquisition; a test instrument group; an isolator for preventing signal reverse; an attenuator for realizing signal attenuation in the transmission channel; a matching load switch for realizing signal matching; an excitation generating device, etc.

[0063] The switch matrix includes three types of switches: SCPI command controlled switches, digital signal controlled analog switches, and digital circuit switches.

[0064] The data acquisition and control unit includes module 211, module 212 and module 213, among which module 211 is a digital signal acquisition and control module; module 212 is a power supply module that meets the three-way power supply of 30V (6A), 30V (6A) and 5V (3A); module 213 is a PXIe series high-precision data acquisition module.

[0065] In the example of the present invention, each output end of the switch matrix SW1 and SW6 is connected to a dual-channel switch with a matching load to ensure that there is no leakage of redundant excitation signals and signal crosstalk in other working channels in the link during each test. The receiving excitation loading circuit of the switch matrix uses the switch matrix SW29 controlled by digital signals and the SW8 controlled by SCPI instructions to achieve software + hardware dual guarantees for the correctness of link opening. The transmission excitation signal loading uses the digital AND gate switch SW29 and the SW28 controlled by SCPI instructions to achieve software + hardware dual guarantees for the correctness of link opening. The SW29 AND gate digital control switch is the control link opening by the transmission excitation signal detection digital feedback signal and the component TTL pulse width detection digital feedback signal.

[0066] The present invention embodiment designs a software+hardware+detection receiving power-on, receiving power-off, transmitting power-on, transmitting power-off process. The 213 module compares the detected static voltage value with the set threshold value, and controls the comparison result through the FPGA program to control the digital signal acquisition and control module (211 module) to output a digital signal, and the digital output signal controls SW23 to turn on. At the same time, when the main control program controls the static power supply parameter setting of the power supply module, the SCPI instruction is used to control the switch SW22 to turn on through the GPIB bus. Similarly, the voltage detection result of the 213 module and the digital signal output of the 211 module simultaneously control the opening of the receiving switch SW24 and the transmitting switch SW26. After the receiving voltage parameter is successfully set, the main control program controls the opening of SW25; after the transmitting power supply parameter is successfully set, the switch SW27 is controlled to turn on. When the receiving power-on is controlled by the main control software, the receiving power supply can only be powered on after the static power supply is successfully powered on. When the transmitting power-on, the receiving power supply can only be powered on after the static power supply is successfully powered on, and the transmitting power-on can only be performed after the receiving power supply is successfully powered on. If any link fails to power on, stop powering on directly, set the component to load state, turn off all power supplies, and turn off the excitation output. The order of receiving power off is opposite to that of receiving power on. First, the receiving power is turned off, then the static power is turned off. The order of transmitting power off is opposite to that of transmitting power on. First, the transmitting power is turned off, then the receiving power is turned off, and finally the static power is turned off.

[0067] The 211 module, pulse modulator, and two dual-way switching switches in the data acquisition and control unit are used to construct a peripheral excitation link between the SOURCE OUT port and the CPLRTHRU port of the vector network analyzer source 1, so that the continuous wave vector network analyzer can also meet the S parameter test of the transmitting component and the continuous wave excitation test of the receiving channel. When the transmitting channel S parameter design is performed, the digital signal acquisition and control module (211 module) provides the pulse modulator with a modulation pulse with the same period as the component TRT signal, the pulse leading edge lags behind the TRT pulse, and the pulse trailing edge is ahead of the TRT pulse. The SW33 switch is switched to the 1-3 link, and the SW34 switch is switched to the 1-3 link. After the vector network analyzer source 1 is output through the SOURCE OUT port, it passes through an external jumper, the SW34 switch, the pulse modulator, and the SW33, and is connected to the CPLRTHRU port, and the pulse modulation signal is output from the Port1 port. The component TRT signal generated by the 211 module is synchronized with the measurement receiver pulse rising edge measurement of the vector network analyzer port 2, and the transmitting channel pulse test is performed. When the receiving channel is tested, the SW33 switch is switched to the 1-2 link, the SW34 switch is switched to the 1-2 link, the SOURCE OUT port of the vector network analyzer port 1 is directly connected to the CPLRTHRU port, and the vector network analyzer port 1 outputs a continuous wave signal to meet the receiving channel excitation requirements.

[0068] The voltage and current values ​​of the static power supply, receiving power supply and transmitting power supply of the transceiver component are monitored through the 213 module in the data acquisition and control unit, and the detection results are used to generate a digital trigger signal through the 211 module in the data acquisition and control unit to control the opening and closing of switches SW23, SW24 and SW26 to ensure the safety of the power-on and power-off process of the transceiver component and realize the safety test of the component.

[0069] The software negative feedback technology described therein refers to the use of port 1 of switch SW16, port 1 of SW1, and path 1-2 of SW6 to enable module 213 in the data acquisition and control unit to monitor the small received signal output from port 2 of power divider 1. When the excitation signal output from port 2 of power divider 1 monitored by module 213 cannot meet the test excitation requirement of the receiving channel of the transceiver component, the main control software will form a negative feedback circuit by adjusting the source output of the vector network analyzer through software until the signal level of port 2 of power divider 1 meets the small received signal requirement of the transceiver component; when the transmitting channel of the transceiver component is tested, through port 1 of switch SW16, port 1 of SW1, path 1-3 of SW6, and port 2 of SW3, module 213 in the acquisition and control unit monitors the output excitation level of the power amplifier through the coupling end 2 of the dual directional coupler. When the output signal power cannot meet the transmitting excitation requirement of the transceiver component, a negative feedback loop is formed through the main control software to adjust the output power of the vector network signal source 1 so that it can meet the saturated working requirement of the transmitting channel of the transceiver component.

[0070] Vector network analyzer adopts open link design features:

[0071] Case 1:

[0072] Disconnect the external jumper between the RCVR R1 IN port and the Source Out port of the vector network analyzer reference receiver, and connect the coupling terminal 1 of the dual directional coupler to the RCVR R1 IN port;

[0073] When performing a transmit S parameter test on a transceiver component, the Port1 Reference Mixer Switch of the vector network analyzer is switched to External, and port 1 of the vector network analyzer is connected to the reference receiver REF RECEIVER via port 1 of the single-pole double-throw switch SW16, port 1 of the single-pole six-throw switch SW1, link 1-3 of the double-pole double-throw switch SW6, port 2 of the single-pole double-throw switch SW3, the power amplifier, the coupling end 1 of the dual directional coupler, and port 3 of the single-pole double-throw switch SW31; when performing a receive channel test on the transceiver component, the Port1 Reference Mixer Switch of the vector network analyzer is switched to Internal, and the reference receiver Refreceiver of the vector network analyzer is connected to the internal output source Source1 of the vector network analyzer via port 2 of the single-pole double-throw switch SW31 and port 2 of the single-pole double-throw switch SW32.

[0074] Case 2:

[0075] Disconnect the external jumper between the thru-arm output CPLR THRU port and the Source Out port of the internal source Source1 of the vector network analyzer;

[0076] When performing a transmission S parameter test on a transceiver component, the digital signal acquisition and control module (module 211) provides a modulated pulse for the pulse modulator, which has the same period as the component TRT signal, with the leading edge of the pulse lagging behind the TRT pulse and the trailing edge of the pulse preceding the TRT pulse. The Source1 signal of the vector network analyzer passes through the Source Out port of the through-arm, through port 3 of SW33, through the pulse modulator, through port 3 of SW34, and is connected to the CPLR THRU port of the vector network analyzer, so that the vector network port 1 of the vector network analyzer outputs a pulse modulation signal.

[0077] Design a calibration method of source calibration + receiver calibration + reference source stabilization to achieve accurate measurement of transmit power using a vector network analyzer. Set the source attenuation of port 1 of the vector network analyzer to a fixed state, use a power meter to calibrate port 1 to 0dBm, pass the power calibration result of source 1 to the receiver, and calibrate the vector network analyzer to measure receiver B. Stabilize the source of port 1 of the vector network analyzer in the receiver stabilization state, and set the measurement mode of the vector network analyzer to B, 1. This method can be used to accurately measure the transmit power using a vector network analyzer.

[0078] The high-crystal oscillator and high-precision data acquisition modules based on PXIe (including 211 modules and 213 modules) are used to replace the complex detection, detection, digital signal generation and control circuits to realize the detection functions such as the static voltage and current of the transceiver component, the receiving voltage and current, the transmitting voltage and current, the transceiver channel excitation signal, and the component primary latch BIT information. It also realizes the generation of digital signals such as component wave control output, instrument synchronization pulse signal, modulator modulation pulse, SW23, SW24, SW26, SW29, SW30 and other digitally controlled analog switches. The control is simple and reliable with high stability.

[0079] During the specific implementation process, the reconstruction of the test status and test process is as follows:

[0080] In step S1, the test instrument in the transceiver component is initialized, specifically including:

[0081] Put all test instruments in the trigger reset stage.

[0082] In step S2, the digital signal acquisition and control module in the transceiver component splices the working state of the transceiver component, the synchronous trigger signal of the test instrument in each working state, and the working state switching delay pulse at one time according to the selected test indicators and test sequence, and sends them all down to achieve one-time control of the component working state and instrument scanning data of any combination of multiple states, and collect the instrument data at one time; when the test indicators are different or the test sequence of the indicators is different, the working state and test process are reconstructed, and S1 to S2 are repeated. Specifically including:

[0083] The embodiment of the present invention is described by taking the initial phase and gain, multi-state attenuation and phase shift test, and noise coefficient test of the receiving channel as examples. Figure 3 As shown,

[0084] Assuming the number of test points of the component is N, the splicing of the component receiving base state test state is first performed, and then the splicing of N external trigger scanning signals of the vector network analyzer is performed; then, according to the test frequency points and power scanning interval of the compression parameters, the trigger signal splicing of M test frequency points * P power scanning points is performed.

[0085] When performing attenuation and phase shift multi-state tests, splicing is performed from the first state according to the selection of the test state until all the test states are spliced. Each test state is spliced ​​in the form of first splicing the test state and then splicing N trigger signals. Each time, splicing starts from state 0, and state 0 is used as the benchmark for multi-state testing.

[0086] When performing the noise figure test, first perform the splicing of the receiving base state, and then perform the splicing of the trigger signal. The indicators of all base state tests are the same as the splicing process of the noise figure.

[0087] When the test indicators are different or the test order of the indicators is different, the test status and test flow are reconstructed again and the above process is repeated.

[0088] In the specific implementation process, the digital signal acquisition and control module (module 211) sends the splicing status and selects the trigger signal, so as to test all the receiving indicators at one time.

[0089] During the multi-state attenuation and multi-state phase shift test, the basic state test of the M-bit attenuator is to test that the control code values ​​sent by the digital signal acquisition and control module in the transceiver component of the basic state test are 20, 2 1 , 2 2 ……(2 M -1), the control code value sent by the digital signal acquisition and control module in the transceiver component during the full-state test is 0, 1, 2...(2 M -1); When the attenuator with M-bit base state control bits all set to 1, during the basic state test, the control code value sent by the digital signal acquisition and control module in the transceiver component is (2 M -1)、(2 M-1 -1)、(2 M-2 -1)…0. During the M phase shifter polymorphic test, the control code value sent by the digital signal acquisition and control module in the transceiver component is the same as that of the attenuator.

[0090] Figure 3In the multi-state process reconstruction flow chart, the two-dimensional scanning of the frequency sweep and amplitude sweep functions of the compression test of the transceiver component can be realized, and the input and output 1dB compression points of the transceiver component can be obtained at one time by using the software processing algorithm. The number of test frequency points of the receiving channel compression index is M, the measurement start frequency is f1, and the end frequency is f2, then the measurement frequency step is f3 = (f2-f1) / (M-1); the starting scanning power of each frequency point is p1 (in dBm), the end scanning power is P2 (in dBm), and the number of power scanning points is N. Then the power scanning step is p3 = (p2-p1) / (N-1). Using the segment scanning function of the vector network analyzer, set the working state of the vector network analyzer to segment scanning, and the frequency and power of each segment are independent. Perform M*N segment scanning on the vector network analyzer. The scanning frequency of the first segment is f1, and the power is p1; the scanning frequency of the second segment is f1+f3, and the power is p1; the scanning frequency of the Mth segment is f2, and the power is p1; the scanning frequency of the M+1th segment is f1, and the power is p1+p3... The scanning frequency of the M*Nth segment is f2, and the power is p2. The digital signal acquisition and control module in the transceiver component is used to splice and send the component base state working timing and the M*N trigger synchronization signals of the vector network analyzer at one time. After the measurement is completed, the input and component output power values ​​corresponding to the input P_1 and output P-1 are analyzed based on the multiple power scanning data of each frequency point.

[0091] The embodiment of the present invention further provides a method for rapid safety testing of a transceiver component based on multi-state process reconstruction, which uses the aforementioned rapid safety testing system for a transceiver component based on multi-state process reconstruction to test the transceiver component, including:

[0092] According to different test indicators and test sequences, different test links are switched with a switch matrix. According to different test states, test frequencies, scanning powers and test points, the working state of the components is controlled with a data acquisition and control unit. The synchronous test start trigger signal and point scanning control signal of the test instrument are sent down to control the synchronous measurement signal of the receiver of the test instrument. The initial phase and gain, nonlinear phase, multi-state phase shift accuracy, multi-state attenuation accuracy, input and output 1dB compression point, noise figure, transmission initial phase and gain, transmission power and transmission efficiency of the transceiver components are tested and displayed.

[0093] Combine the following Figure 4 The test method of the test system shown is described in detail.

[0094] When testing the receiving indicators of the transceiver component, first of all, different stimulus sources should be selected according to the test indicators. The receiving channel mainly tests the noise coefficient and S parameters. The test steps are as follows:

[0095] S100 and SW6 are turned on at 1 and 2, and at 3 and 4, and SW8 is turned on at 1 and 2 and at 3 and 4. When measuring the noise coefficient, the switch is switched to SW1-6, SW16-2, SW17-2, SW18-2, SW19-2, SW20-2, SW21-1, and SW2-1. When testing the S parameters, the switch is switched to SW1-1, SW16-1, SW17-2, SW18-2, SW19-2, SW20-2, SW21-2, and SW2-4. Ensure that only the required signal is currently connected to the system, and other excitation instruments are connected to the matching load state to prevent inaccurate testing caused by interference signals. The reception is a small signal test, and the test excitation signal is sampled after power division by a power divider to ensure the correctness of the excitation signal and prevent measurement deviations and damage to the device under test caused by large signals. When the excitation source is a noise source, the signal is correct if it is less than the threshold. When the excitation source is a vector network analyzer, the software adjustment method is used instead of the hardware negative feedback loop to ensure that the power level of the excitation signal meets the design requirements. After the detection is correct, the data acquisition module sends a control signal to close the normally open switch SW29, and the main controller controls the programmable switch SW9-1. SW3-3, SW4-3, and SW5-2 are used for H polarization testing. The V polarization test is SW5-3.

[0096] S101, the main controller controls the digital signal acquisition and control module (module 211), reconstructs the test state and process according to the order of the collected indicators, the number of test states, and the setting order of the channels of the test instrument, traverses the number of channels of the transceiver component, and makes each channel of the transceiver component work in the load state.

[0097] S102, the main controller loads the static power supply, receives the power supply, turns on the overvoltage and overcurrent protection functions of the power supply, and at the same time uses the analog quantity acquisition and analysis module to determine whether the output power amplitude is within the working range. If all are correct, the program control software controls switches SW22-1 and SW25-1 in turn, and controls the normally open switches SW23 and SW24 to close through the hardware of the digital acquisition module to complete the power-on of the components.

[0098] S103, the main controller controls the digital signal acquisition and control module (module 211), sends the test status and test process reconstructed in S101, turns on the synchronous trigger signal, ensures that the working sequence can be sent to the transceiver component, controls the current test channel of the component to be in the receiving state, and the other channels are in the load state, ensuring that only one channel is currently in the working state, and completes the data scanning of all indicators to be measured.

[0099] S104: Collect and display data.

[0100] S105. During the test, the current, temperature, and remote sensing feedback data are monitored in real time. If any abnormality is found, the test is stopped immediately.

[0101] S106. Change the test indicators and test sequence, perform the next process reconstruction, and complete the test of the corresponding indicators.

[0102] S107. After all indicators are tested, the main controller controls the power module to cut off the power in the reverse order of the power-on order, and performs corresponding power supply voltage detection at the same time to ensure that the static power can be cut off only after the receiving power is cut off. When the receiving power is cut off, the main controller switches SW25-2, and the digital signal acquisition and control module (211 module) hardware opens SW24. When the static power is cut off, the main controller switches SW22-2, and the digital signal acquisition and control module (211 module) hardware opens SW23. The receiving power is cut off.

[0103] When testing the transmission index of the transceiver component, first of all, different excitation sources should be selected according to the test index. The receiving channel mainly tests the power parameters and S parameters. The test steps are as follows:

[0104] S200 and SW6 are turned on at 1 and 3, and turned on at 2 and 4. The SW8 switch is turned on at 1 and 3 and turned on at 2 and 4. When measuring power, the switch is switched to SW1-2, SW16-2, SW17-1, SW18-2, SW19-2, SW20-2, SW21-2, and SW2-3. When testing S parameters, the switch is switched to SW1-1, SW16-1, SW17-2, SW18-2, SW19-2, SW20-2, SW21-2, and SW2-4. Ensure that only the required signal is currently connected to the system, and other excitation instruments are connected to the matching load state to prevent inaccurate testing caused by interference signals. The transmission signal works in a high-power saturation state. The excitation signal must be large enough to ensure that the component can work in a saturated state, but it cannot be greater than the set value, otherwise it will cause excessive compression of the component, resulting in inaccurate index testing or even damage to the component. Turn on the excitation link SW3-2 and SW4-2 switches, and input the high-power input signal to the analog signal acquisition unit through a coupler to ensure that the signal power level meets the design requirements. If the signal does not meet the requirements, use software + analog signal acquisition to replace the negative feedback loop, and continuously adjust the output signal power of the signal source and the vector network analyzer until the design requirements are met. If the requirements are not met after multiple adjustments, a link fault prompt will be issued. When measuring S parameters, due to the saturated working state, the S parameter test must be sufficient to ensure the consistency of the source excitation output signal and the signal arriving at the port of the device under test. Therefore, a part of the other end of the dual directional coupler is coupled to the reference receiver of the vector network analyzer to eliminate the transmission S parameter measurement error caused by input power jitter. SW5-2 is used for H polarization testing. The V polarization test is SW5-3.

[0105] S201, the main controller controls the digital signal acquisition and control module (module 211), reconstructs the test state and process according to the order of the collected indicators, the number of test states, and the setting order of the channels of the test instrument, traverses the number of channels of the transceiver component, and makes each channel of the transceiver component work in the load state.

[0106] S202, the main controller performs transmitting power-on in the order of static power supply, receiving power supply, and transmitting power supply, and turns on the overvoltage and overcurrent protection functions of the power supply. At the same time, through the analog quantity acquisition and analysis module, it determines whether the output power amplitude is within the working range. If all are correct, the program-controlled software controls switches SW22-1, SW25-1, and SW27-1 in turn, and controls the normally open switches SW23, SW24, and SW26 through the hardware of the digital acquisition module to close, completing the power-on of the components.

[0107] S203, the main controller controls the digital signal acquisition and control module (module 211), sends down the test state and test process reconstructed in S201, ensures that the working sequence can be sent down to the transceiver component, controls the current test channel of the component to be in the transmitting state, and other channels are in the load state, ensuring that only one channel is currently in the working state. The signal acquisition module collects the emission pulse of the component, and determines whether to disconnect the emission excitation signal based on parameters such as duty cycle and pulse width. Turn on the synchronous start signal, and send down the instrument control and scanning process according to the reconstructed test process to complete the data scanning of all indicators to be measured.

[0108] S204: Collect and display data.

[0109] S205. During the test, the current, temperature, and remote sensing feedback data are monitored in real time. If any abnormality is found, the test is stopped immediately.

[0110] S206: Change the test indicators and test sequence, perform the next process reconstruction, and complete the test of the corresponding indicators.

[0111] S207. After all indicators are tested, the main controller controls the power module to cut off the power in the reverse order of the power-on order, and performs corresponding power supply voltage detection at the same time to ensure that the power is cut off in the order of transmission power off, reception power off, and static power off. When the transmission power is cut off, the main controller switches SW27-2, and the digital signal acquisition and control module (211 module) hardware opens SW26. When the reception power is cut off, the main controller switches SW25-2, and the digital signal acquisition and control module (211 module) hardware opens SW24. When the static power is cut off, the main controller switches SW22-2, and the digital signal acquisition and control module (211 module) hardware opens SW23. Transmission power off is completed.

[0112] The above receiving and transmitting channels only introduce the test process of typical indicators. The tests of compression point, spurious and other parameter indicators can be performed for reference.

[0113] In summary, compared with the prior art, the present invention has the following beneficial effects:

[0114] 1. The embodiment of the present invention can realize the one-time delivery of all states and processes of test indicators and instrument scanning settings according to the different working states of the transceiver components, and then the overall reading technology can minimize the time of state switching and data reading during the test process, thereby improving the test efficiency.

[0115] 2. The embodiment of the present invention utilizes software negative feedback detection and compensation technology to combine the receiving detection function, signal acquisition and analysis function, and software test compensation technology of the test instrument itself, and realizes the negative feedback detection and compensation function without adding a negative feedback hardware link. It can realize the detection of the excitation signal of the receiving and transmitting channel test to meet the excitation signal requirements of the component; compensate for the signal instability and jitter error of the transmitting excitation signal link, and improve the accuracy of the test of indicators such as the transmitting channel test gain and flatness.

[0116] 3. The embodiment of the present invention utilizes software + hardware double locking technology, combining switches controlled by software SCPI instructions and analog signal switches controlled by digital signals, using the main control software to set the instructions according to the voltage and excitation parameter instrument feedback information to control the opening of the switch matrix through the SCPI instruction software, and using the voltage, current and excitation signal detection feedback digital signal to control the opening of the digitally controlled analog signal, double locking to ensure the safety of the transceiver components during the test and prevent the components from burning out.

[0117] 4. The embodiment of the present invention utilizes link matching technology to ensure that when the multi-polarization multi-channel transceiver component is working, during the single-index single-link test, only one excitation and channel are in working state, and other links and test instruments are in link matching state, thereby reducing the leakage of excitation signals during the test and the measurement errors of indicators such as standing waves, amplitudes, and nonlinearity caused by component mismatch, which affect the design and repair of the component.

[0118] 5. The embodiment of the present invention uses the 213 module in the high-precision data acquisition module (211 module and 213 module) based on PXIe to realize all the excitation signals, voltage and current, and TRT signal pulse width detection of the test system, and uses the 211 module to realize the distribution of component control status, the feedback of various analog signal detection signals and the control of digital control switches, and the detection of component primary latch BIT information. The circuit is simple, reliable, and low cost.

[0119] It should be noted that, in this article, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Moreover, the terms "include", "comprise" or any other variants thereof are intended to cover non-exclusive inclusion, so that a process, method, article or device including a series of elements includes not only those elements, but also other elements not explicitly listed, or also includes elements inherent to such process, method, article or device. In the absence of further restrictions, the elements defined by the sentence "comprise a ..." do not exclude the existence of other identical elements in the process, method, article or device including the elements.

[0120] The above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit the same. Although the present invention has been described in detail with reference to the aforementioned embodiments, those skilled in the art should understand that the technical solutions described in the aforementioned embodiments may still be modified, or some of the technical features may be replaced by equivalents. However, these modifications or replacements do not deviate the essence of the corresponding technical solutions from the spirit and scope of the technical solutions of the embodiments of the present invention.

Claims

1. A fast safety test system for transceiver components based on multi-state process reconstruction, characterized in that: include: A main controller, used to generate a first control signal of the test system according to the index to be tested and control the test system; A data acquisition and control unit, used to collect and analyze signals according to the first control signal and generate a second control signal; A switch matrix, used for performing link switching according to a first control signal and a second control signal; The test instrument group is used to switch different test instruments according to the link to test and display the indicators to be tested; in, The data acquisition and control unit sends the working state of the transceiver component, the synchronization trigger signal required by the test instrument to test each working state of the transceiver component, and the working state switching delay pulse at one time according to the selected test indicators and test sequence, so as to realize the one-time control of the working state of the component in any combination of multiple states and the scanning data of the test instrument, and the one-time collection of the data of the test instrument; when the test indicators are different or the test sequence of the indicators is different, the working state of the transceiver component and the test process are reconstructed; Before the data acquisition and control unit sends the working state of the transceiver component, the synchronous trigger signal required by the test instrument to measure each working state of the transceiver component, and the delay pulse for switching the working state of the transceiver component, it also includes: Using the splicing technology, the working state of the transceiver components, the synchronization trigger signal required by the test instrument for each working state, and the working state switching delay pulse are spliced ​​according to the reconstructed indicator execution order to form a complete test timing flow; The splicing technology includes: Assume the number of test points of the transceiver component is N, When performing initial phase and gain tests, perform splicing of the base state test state of the transceiver component and splicing of N external trigger scanning signals of the vector network; When performing compression parameter testing, the receiving base state test state of the transceiver component is spliced, and according to the test frequency points and power scanning interval of the compression parameter, the trigger signal splicing of M test frequency points * P power scanning points is performed; When performing attenuation and phase shift multi-state tests, splicing is performed from the first state according to the selection of the test state until all the test states are spliced. Each test state is spliced ​​in the form of first splicing the test state and then splicing N trigger signals. Each time, splicing starts from state 0, and state 0 is used as the benchmark for multi-state testing. When performing a noise coefficient test, perform splicing of the receiving base state and splicing of the trigger signal.

2. The fast safety testing system for transceiver components based on multi-state process reconstruction as claimed in claim 1, characterized in that: The data acquisition and control unit includes a high-precision data acquisition module, a digital signal acquisition and control module and a power supply module; When the receiving channel test of the transceiver component is performed, the switches in the switch matrix are controlled so that the high-precision data acquisition module monitors the small receiving signal output by port 2 of the power divider. When the high-precision data acquisition module detects that the excitation signal output by port 2 of the power divider cannot meet the test excitation requirement of the receiving channel of the transceiver component, the main controller forms a negative feedback circuit by adjusting the source output of the vector network analyzer through software until the signal level of port 2 of the power divider meets the small receiving signal requirement of the transceiver component. When the transmitting channel test of the transceiver component is carried out, the switches in the switch matrix are controlled so that the high-precision data acquisition module in the acquisition and control unit monitors the output excitation level of the power amplifier through the coupling end 2 of the dual directional coupler. When the output signal power cannot meet the transmitting excitation requirement of the transceiver component, the main control software in the main controller is adjusted to form a negative feedback loop to adjust the output power of the vector network signal source so that the output power meets the saturated working requirement of the transmitting channel of the transceiver component.

3. The fast safety testing system for transceiver components based on multi-state process reconstruction as claimed in claim 1, characterized in that: The switch matrix includes switches controlled by SCPI instructions, analog switches controlled by digital signals, and digital circuit switches.

4. The fast safety testing system for transceiver components based on multi-state process reconstruction according to any one of claims 1 to 3, characterized in that: The test instrument set includes vector network analyzer; The vector network analyzer adopts an open link design; Case 1: Disconnect the external jumper between the RCVR R1 IN port and the Source Out port of the vector network analyzer reference receiver, and connect the coupled terminal 1 of the dual directional coupler to the RCVR R1 IN port. Case 2: Disconnect the external jumper between the thru-arm output CPLR THRU port and the Source Out port of the internal source Source of the vector network analyzer.

5. The fast safety testing system for transceiver components based on multi-state process reconstruction as claimed in claim 4, characterized in that: The vector network analyzer is calibrated by using a power meter to calibrate the output source and the measurement receiver of the vector network analyzer, and the calibration process includes: The attenuation of Source 1 in the Power and Att setting of the vector network analyzer's vector network port 1 is set to a fixed state of 0dB, and the power of the vector network port 1 is calibrated using a power meter; During calibration, the calibration level is set at 0dBm; after the power meter completes the calibration of port 1 of the vector network analyzer, the ports 1 and 2 of the vector network analyzer are directly calibrated, and the power calibration result of port 1 of the vector network analyzer is transmitted to the measurement receiver of port 2 of the vector network analyzer to calibrate the measurement receiver of the vector network analyzer; Stabilize the source of port 1 of the vector network analyzer in the receiver steady-amplitude state, and set the measurement mode of the vector network analyzer to the receiver steady-amplitude state.

6. A fast security testing method for transceiver components based on multi-state process reconstruction, characterized in that: The transceiver component is tested by using the transceiver component rapid safety testing system based on multi-state process reconstruction as described in any one of claims 1 to 5, comprising: According to different test indicators and test sequences, different test links are switched by a switch matrix. According to different test states, test frequencies, scanning powers and test points, the working state of the components is controlled by a data acquisition and control unit. The synchronous test start trigger signal and point scanning control signal of the test instrument are sent down to control the receiver synchronous measurement signal of the test instrument. At least one of the indicators of the transceiver component, including the initial phase and gain, nonlinear phase, multi-state phase shift accuracy, multi-state attenuation accuracy, input and output 1dB compression point, noise figure, transmission initial phase and gain, transmission power and transmission efficiency, is tested and displayed.

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