Oscilloscope Probe, Probe Detection Method, Device, Oscilloscope, System and Medium

Abstract

The present invention discloses an oscilloscope probe, a probe detection method, a device, an oscilloscope, a system, and a storage medium. Among them, the oscilloscope probe includes a signal test path and a detection circuit. The signal test path is used to connect to an oscilloscope channel of the oscilloscope and send the signal under test to the oscilloscope channel. The detection circuit includes a capacitor and a detection connector. The first end of the capacitor is grounded, the second end of the capacitor is electrically connected to the first end of the detection connector, and the second end of the detection connector is used to connect to an identification circuit in the oscilloscope. Among them, the capacitance value of the capacitor is related to the type of the oscilloscope probe. By adopting the above technical solution, power consumption can be saved while effectively ensuring measurement accuracy and reliability.

Description

Technical Field

[0001] Embodiments of the present invention relate to the field of computer technology, and in particular, to an oscilloscope probe, a probe detection method, a device, an oscilloscope, a system, and a storage medium. Background Art

[0002] The probe is an important part of the oscilloscope system and plays a crucial role in the integrity of the measured signal input into the oscilloscope. Therefore, in the oscilloscope system, a reliable method is needed to detect whether the probe is properly connected to the oscilloscope to complete the accurate measurement of the measured signal. After the oscilloscope probe is connected to the oscilloscope, for different probes, correct channel parameters such as coupling mode, attenuation ratio, and input resistance need to be set for the channel to which the probe is connected, so as to ensure the correct use of the probe, reduce the probability of test errors, and at the same time help the oscilloscope user obtain the measurement results conveniently and quickly.

[0003] Currently, the access detection scheme for oscilloscope probes generally uses the resistance voltage division method. The problem faced by this method is that if a resistor with a small resistance value is selected, it will generate a large amount of heat. Since the oscilloscope probe has a high degree of sealing, when its heat is transferred to the circuit board, it is easy to make the temperature of the analog channel rise, affecting the measured signal in the oscilloscope system, thus reducing the reliability of the measurement system, bringing unnecessary power waste to the oscilloscope system, and also bringing a certain power supply pressure to the overall power supply system. In addition, when using the resistance voltage division method to identify different types of probes connected to the oscilloscope, since there are currently many types and models of oscilloscope probes, the types of resistors used will be relatively more. If a resistor with a large resistance value is used to complete the voltage division, then the resistor with a large resistance value can be approximated as a passive antenna. When the oscilloscope measures a small signal, this noise will be superimposed on the measurement signal, thus seriously affecting the test accuracy. Summary of the Invention

[0004] Embodiments of the present invention provide an oscilloscope probe, a probe detection method, a device, an oscilloscope, a system, and a storage medium, which can optimize the existing probe detection scheme.

[0005] According to one aspect of the present invention, an oscilloscope probe is provided, including a signal test path and a detection circuit, wherein:

[0006] The signal test path is used to connect to an oscilloscope channel of an oscilloscope and send a measured signal to the oscilloscope channel;

[0007] The detection circuit includes a capacitor and a detection connector. The first end of the capacitor is grounded, the second end of the capacitor is electrically connected to the first end of the detection connector, and the second end of the detection connector is used to connect to the identification circuit in the oscilloscope. Among them, the capacitance value of the capacitor is related to the type of the oscilloscope probe.

[0008] According to another aspect of the present invention, a probe detection method is provided, which is executed by a processor in an oscilloscope. The oscilloscope also includes an identification circuit, and the identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor;

[0009] The method includes:

[0010] Obtaining multiple sets of voltage data, where each set of voltage data includes the voltage value at the first end of the resistor detected by the voltage detection unit and the detection time corresponding to this voltage value;

[0011] Determining the target capacitance value of the capacitor in the current oscilloscope probe according to the multiple sets of voltage data;

[0012] Based on a preset mapping relationship, determining the target type of the current oscilloscope probe according to the target capacitance value, where the preset mapping relationship includes the correspondence between the capacitance value and the type of the oscilloscope probe.

[0013] According to another aspect of the present invention, a probe detection device is provided, which is integrated in an oscilloscope. The oscilloscope also includes an identification circuit, and the identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor;

[0014] The device includes:

[0015] A voltage data acquisition module, configured to obtain multiple sets of voltage data, where each set of voltage data includes the voltage value at the first end of the resistor detected by the voltage detection unit and the detection time corresponding to this voltage value;

[0016] A capacitance value determination module, configured to determine the target capacitance value of the capacitor in the current oscilloscope probe according to the multiple sets of voltage data;

[0017] A type determination module, configured to determine the target type of the current oscilloscope probe based on a preset mapping relationship according to the target capacitance value, where the preset mapping relationship includes the corresponding relationship between the capacitance value and the type of the oscilloscope probe.

[0018] According to another aspect of the present invention, there is provided an oscilloscope, including an identification circuit, a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that

[0019] The identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor;

[0020] When the processor executes the computer program, it implements the probe detection method described in any embodiment of the present invention.

[0021] According to another aspect of the present invention, there is provided an oscilloscope system, including the oscilloscope probe described in any embodiment of the present invention and the oscilloscope described in any embodiment of the present invention.

[0022] According to another aspect of the present invention, there is provided a computer-readable storage medium storing computer instructions for causing a processor to implement the probe detection method described in any embodiment of the present invention when executed.

[0023] The technical solution of the embodiment of the present invention replaces the resistor in the detection circuit of the oscilloscope probe with a capacitor. The capacitance value of the capacitor is related to the type of the oscilloscope probe, that is, the probe type can be determined by detecting the capacitance value. Compared with the resistor voltage division method, there is no additional power waste, no extra heat is brought to the system to cause the system detection temperature drift, and no excessive noise is introduced to the precise probe. While saving power consumption, the measurement accuracy and reliability can be effectively guaranteed.

[0024] It should be understood that the content described in this part is not intended to identify the key or important features of the embodiments of the present invention, nor is it used to limit the scope of the present invention. Other features of the present invention will become easily understood through the following description. Description of the Drawings

[0025] To more clearly illustrate the technical solutions in the embodiments of the present invention, the following will briefly introduce the accompanying drawings required for description in the embodiments. Obviously, the accompanying drawings in the following description are only some embodiments of the present invention. For those of ordinary skill in the art, without creative efforts, other accompanying drawings can be obtained based on these drawings.

[0026] Figure 1 It is a schematic diagram of the connection between an oscilloscope probe and an oscilloscope provided by an embodiment of the present invention;

[0027] Figure 2 It is a flowchart of a probe detection method provided by an embodiment of the present invention;

[0028] Figure 3 It is a flowchart of another probe detection method provided by an embodiment of the present invention;

[0029] Figure 4 It is a schematic structural diagram of a probe detection device provided by an embodiment of the present invention. Detailed implementation manners

[0030] To enable those skilled in the art to better understand the solutions of the present invention, the following will clearly and completely describe the technical solutions in the embodiments of the present invention in conjunction with the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some of the embodiments of the present invention, rather than all of them. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

[0031] It should be noted that the terms "first", "second", etc. in the specification and claims of the present invention and the above accompanying drawings are used to distinguish similar objects, and do not necessarily need to describe a specific order or sequence. It should be understood that such used data can be interchanged under appropriate circumstances so that the embodiments of the present invention described here can be implemented in an order other than those illustrated or described here. In addition, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product, or device that includes a series of steps or units does not necessarily have to be limited to those clearly listed steps or units, but may include other steps or units not clearly listed or inherent to these processes, methods, products, or devices.

[0032] The oscilloscope probe (hereinafter referred to as the probe) provided by the embodiment of the present invention may include a passive probe and an active probe. Figure 1 It is a schematic diagram of the connection between an oscilloscope probe and an oscilloscope according to an embodiment of the present invention, Figure 1It includes the probe 10 and the oscilloscope 20 provided by the embodiments of the present invention. Among them, the probe 10 includes a signal test path 110 and a detection circuit 120.

[0033] The signal test path 110 is used to connect to the oscilloscope channel 210 of the oscilloscope 20 and send the signal to be measured to the oscilloscope channel 210. Exemplarily, for a passive probe, the signal test path may include an analog front end (such as a probe amplifier), a cable, and a probe connector. The probe connector may specifically be a Bayonet Neill-Concelman (BNC) connector; for an active probe, on the basis of an analog front end (such as a probe amplifier), a cable, and a probe connector, it may further include a digital-to-analog converter (DAC) and a probe control unit, etc.

[0034] The detection circuit 120 includes a capacitor 121 and a detection connector 122. The first end of the capacitor 121 is grounded, the second end of the capacitor 121 is electrically connected to the first end of the detection connector 122, and the second end of the detection connector 122 is used to connect to the identification circuit 220 in the oscilloscope. Among them, the capacitance value of the capacitor is related to the type of the oscilloscope probe.

[0035] There are various types of oscilloscope probes. In addition to being divided into passive probes and active probes, they may also include high-impedance probes, high-voltage probes, current probes, etc. In the embodiments of the present disclosure, in order to distinguish different types of probes, different capacitance values can be selected for the capacitor 121. For example, the capacitance value corresponding to a high-impedance probe is 1 microfarad, the capacitance value corresponding to a high-voltage probe is 100 microfarads, the capacitance value corresponding to a current probe is 10 microfarads, and so on.

[0036] In the related art, the access detection scheme of the oscilloscope probe generally uses the resistance voltage division method, that is Figure 1 the position of the capacitor 121 is a resistor. As described above, in order to distinguish different models and types of probes, it is inevitable to select resistors with larger or smaller resistance values. A smaller resistor may generate more heat, affecting the signal to be measured in the oscilloscope system, thereby reducing the reliability of the measurement system, bringing unnecessary power waste to the oscilloscope system, and also bringing a certain power supply pressure to the overall power supply system. A larger resistor may also superimpose noise on the measurement signal, seriously affecting the test accuracy.

[0037] In the embodiments of the present invention, by replacing the resistor with a capacitor, the above problems can be effectively solved. When the probe is connected to the oscilloscope, the constant voltage source in the oscilloscope will charge the capacitor. After the capacitor is fully charged, the voltage is stable. The identification circuit in the oscilloscope can detect the stable voltage, and the type of the probe can be determined by determining the capacitance value of the capacitor. The specific determination method of the capacitance value is not limited.

[0038] Exemplarily, a processor 230 may be included in the oscilloscope 20. The identification circuit 220 includes a resistor 221, a constant voltage source 222, and a voltage detection unit 223. The first end of the resistor 221 is electrically connected to the first end of the voltage detection unit 223 and is used to connect to the detection connector 122 of the probe 10. The second end of the resistor 221 is connected to the first end of the constant voltage source 222. The second end of the constant voltage source 222 is grounded. The second end of the voltage detection unit 223 is connected to the processor 230. Optionally, the voltage detection unit 223 may detect the voltage value at the first end of the resistor 221, and then calculate the capacitance value of the capacitor 121. Among them, the voltage detection unit 223 may be an analog-to-digital converter (ADC).

[0039] The charging of the capacitor is generally a step completed within a limited time period, without waste of additional power, nor will it introduce excessive heat to the system like a small-value resistor voltage division, resulting in system detection temperature drift. At the same time, it will not introduce excessive noise to the precision probe like a large-value resistor.

[0040] After accurately identifying the type of the probe, it is convenient for the oscilloscope to set correct channel parameters such as the coupling mode, attenuation ratio, and input resistance for the channel accessed by the probe, so as to ensure the correct use of the probe.

[0041] The long-term use of the oscilloscope probe is likely to cause the mechanical structure of the contact end to age, resulting in poor contact between the oscilloscope probe and the oscilloscope system. In addition, since the oscilloscope probe needs to change different test points during the measurement of the signal, it is also likely to cause a short circuit between the probe interface and the pins of the oscilloscope channel detection. If the resistor voltage division scheme is adopted, since the resistor has no voltage holding ability, when the above situation occurs, the oscilloscope system cannot detect the voltage division value of the probe resistor, and the system will determine that the probe is not connected to the oscilloscope at this time, resulting in misdetection of the oscilloscope system, blocking the test process, and affecting the entire test process. In addition, if the system determines that the probe is not connected to the oscilloscope at this time, it will clear the channel parameters previously set for the probe. When the probe is reconnected, the channel parameters need to be reset. If the probe is frequently connected and disconnected due to poor contact, a large amount of time will be wasted on setting the channel parameters, seriously affecting the test efficiency.

[0042] By adopting the technical solution of the embodiment of the present invention, when the probe is aged due to long-term use or the connection becomes loose during the measurement process, since the capacitor has a certain voltage holding ability, if the connection is disconnected due to poor contact but restored within a short time, the change law of the capacitor voltage can be determined through the detection and identification circuit to identify this phenomenon of poor contact, and then targeted processing can be carried out, such as prompting the user, which helps the user to take corresponding measures to continue the test.

[0043] In some embodiments, an oscilloscope probe is characterized by further comprising: a first indicator lamp connected in parallel with the capacitor and / or a second indicator lamp connected to the probe control unit; wherein, the first indicator lamp is configured to, when the current flowing through the first indicator lamp changes due to probe abnormality, prompt the probe abnormality by switching between an extinguished state and a lit state; the probe control unit is located inside the oscilloscope probe and is configured to, when receiving a probe abnormality indication sent by the oscilloscope, control the second indicator lamp to change to a target operating state, and the target operating state is used to prompt the probe abnormality. The advantage of such a setting is that by adding an indicator lamp to the probe, when the probe malfunctions due to poor contact or other reasons, the user can be timely reminded of the occurrence of the abnormality through the indicator lamp. Optionally, the indicator lamp can be a light emitting diode (LED), etc.

[0044] Exemplarily, for a passive probe, there is generally no probe control unit inside the probe, and the first indicator lamp connected in parallel with the capacitor in the detection circuit can be used for abnormality reminder. When the probe ages due to long-term use or the connection becomes loose during the measurement process, since the capacitor has a certain charge storage capacity, the voltage on the non-grounded side of the capacitor can be maintained stable. When the probe is loose, there is a risk of short circuit or incomplete contact in the charging path of the capacitor 121 by the constant voltage source 222 inside the oscilloscope through the detection connector 122 of the probe 10. When the charging current of the capacitor 121 is less than the discharging current of the capacitor 121, the voltage of the capacitor 121 connected to the detection connector 122 will decrease. When the connection between the oscilloscope 20 and the detection connector 122 of the probe 10 resumes normal, at this time, the charging current of the capacitor 121 will be greater than its discharging current, so the current flowing through the first indicator lamp will also change, causing the first indicator lamp to flash, thus achieving the purpose of abnormality reminder. If the probe is frequently connected and disconnected due to poor contact, the first indicator lamp will flash frequently, which can enhance the effectiveness of the reminder.

[0045] Exemplarily, for an active probe, abnormal reminder can also be performed through the second indicator light. As described above, when the charging current of capacitor 121 is less than the discharging current of capacitor 121, the voltage across capacitor 121 connected to the probe detection connector will decrease. When the detection connector 122 of oscilloscope 20 and probe 10 resumes normal connection, the charging current of capacitor 121 will be greater than its discharging current at this time. Then, the voltage of the detection connector 122 of probe 10 that can be detected by the oscilloscope system will vary repeatedly within the range calibrated inside the system (such as from 0 to the voltage value of the constant voltage source), thereby determining that the probe is abnormal, and an abnormal indication of the probe can be sent to the probe control unit. When the probe control unit receives the abnormal indication of the probe, it can control the second indicator light to change to the target working state for prompting probe abnormality. The target working state can be, for example, constantly on or flashing, etc., which is not specifically limited.

[0046] Of course, it should be noted that for an active probe, abnormal reminder can also be performed through the first indicator light, and the first indicator light and the second indicator light can also be set simultaneously to perform reminder through both types of indicator lights to further enhance the effectiveness of reminder.

[0047] Figure 2 FIG. is a flowchart of a probe detection method provided by an embodiment of the present invention. This embodiment is applicable to the situation of detecting the types of oscilloscope probes provided by the embodiments of the present invention. This method can be executed by a probe detection device, and the probe detection device can be implemented in the form of hardware and / or software. The probe detection device can be configured in an oscilloscope, specifically in the processor of the oscilloscope, and the processor executes this method. Among them, the oscilloscope also includes an identification circuit, and the identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor. The specific connection relationship can be referred to Figure 1 .

[0048] As Figure 2 shown, this method includes:

[0049] Step 201, obtain multiple groups of voltage data, where each group of voltage data includes the voltage value of the first end of the resistor detected by the voltage detection unit and the detection time corresponding to this voltage value.

[0050] Exemplarily, the voltage value at the first end of the resistor can be detected by the voltage detection unit at a preset frequency or in real time. When the voltage value is detected, the corresponding detection time is recorded, and a detected voltage value and the corresponding detection time are stored in association as a set of voltage data. After multiple detections, multiple sets of voltage data can be obtained.

[0051] Step 202: Determine the target capacitance value of the capacitor in the current oscilloscope probe according to multiple sets of voltage data.

[0052] Exemplarily, the current oscilloscope probe can be understood as the oscilloscope probe currently connected to the oscilloscope. As described above, when the probe is connected to the oscilloscope, the constant voltage source in the oscilloscope charges the capacitor. After the capacitor is fully charged and the voltage is stable, the recognition circuit in the oscilloscope can detect the stable voltage. After detecting the stable voltage, the capacitance value of the capacitor in the oscilloscope probe currently connected to the oscilloscope can be calculated.

[0053] Step 203: Based on the preset mapping relationship, determine the target type of the current oscilloscope probe according to the target capacitance value, where the preset mapping relationship includes the correspondence between the capacitance value and the type of the oscilloscope probe.

[0054] Exemplarily, when designing each oscilloscope probe, the correspondence between the capacitance value of the capacitor in the probe and the probe type can be recorded to form a preset mapping relationship, and the preset mapping relationship is written into the oscilloscope. For example, a separate configuration file can be generated in the oscilloscope to store the preset mapping relationship. When it is necessary to determine the probe type according to the capacitance value, the preset mapping relationship is read from it. Optionally, after the preset mapping relationship is written into the oscilloscope, it supports modification, such as adding the correspondence between the capacitance value corresponding to a new type of probe and the type of the oscilloscope probe, or modifying the stored correspondence, etc., to improve scalability.

[0055] In the probe detection method of the embodiment of the present invention, the resistor in the detection circuit of the oscilloscope probe is replaced with a capacitor. The capacitance value of the capacitor is related to the type of the oscilloscope probe. The oscilloscope can continuously detect the voltage value at the resistor end connected to the detection connector of the probe inside the oscilloscope through the voltage detection unit, calculate the capacitance value of the capacitor in the currently connected probe according to the voltage value and the corresponding detection time, and then quickly determine the current probe type according to the preset mapping relationship including the correspondence between the capacitance value and the probe type. Compared with the resistor voltage division method, there is no additional power waste, no extra heat is brought to the system to cause the occurrence of system detection temperature drift, and no excessive noise is introduced to the precise probe. While saving power consumption, the measurement accuracy and reliability can be effectively guaranteed.

[0056] Optionally, after determining the target type of the current oscilloscope probe, it may further include: setting channel parameters for the channels accessed by the current oscilloscope probe according to the target type, where the channel parameters may include coupling mode, attenuation ratio, input resistance, etc. Optionally, lock the parameter values of the preset channel parameters that have been set to prevent the user from setting incorrect channel parameters and damaging the probe and the oscilloscope measurement system.

[0057] Optionally, for an active probe, the target serial number of the current oscilloscope probe can also be obtained through the control data line connected to the probe control unit, and the channel parameters can be set for the channels accessed by the current oscilloscope probe according to the target type and the target serial number, so that the channel parameters can be set more accurately.

[0058] In some embodiments, determining the target capacitance value of the capacitor in the current oscilloscope probe according to the multiple sets of voltage data includes: determining the target capacitance value of the capacitor in the current oscilloscope probe according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data; where the voltage value in the previous set of voltage data of the first voltage data is the voltage value of the constant voltage source; the voltage value of the constant voltage source is greater than the voltage value in the first voltage data; the second voltage data is the first set of voltage data in the multiple sets of target voltage data; the absolute difference between each voltage value in the multiple sets of target voltage data and the target voltage value is less than a first preset threshold; the number of sets of the target voltage data is greater than a second preset threshold. The advantage of such a setting is that the target capacitance value of the capacitor in the current oscilloscope probe can be accurately calculated, and then the type of the probe can be accurately detected. Among them, the first preset threshold can be set according to actual needs (such as detection accuracy, etc.), and the second preset threshold can be set according to actual situations (such as the charging duration of the capacitor and the detection frequency of the voltage detection unit, etc.). Exemplarily, the target capacitance value can be determined based on the capacitor charging formula.

[0059] Exemplarily, when the probe 10 is not connected to the oscilloscope 20, the voltage detected by the voltage detection unit 223 in the oscilloscope 20 is the voltage (denoted as V) of the constant voltage source 222 on the resistor 221 (for ease of description, its resistance value is denoted as R). When the probe 10 is not connected to the oscilloscope 20, the capacitor 121 (for ease of description, its capacitance value is denoted as C) in the probe 10 needs to be charged, and the voltage detected by the voltage detection unit 223 starts to drop. At this time, the detection time is denoted as t1 (which can be understood as the first detection time). When the voltage detected by the voltage detection unit 223 stabilizes at V t (which can be understood as the target voltage value), the voltage on the resistor 221 becoming V in the data record stored internally can be searched tThe earliest time t2 (which can be understood as the second detection time) can be used to calculate the capacitance value C of the capacitor 121 according to the capacitor charging formula:

[0060] t2 - t1 = R * C * ln[V / (V - V t )]

[0061] In some embodiments, after determining the target type of the current oscilloscope probe according to the target capacitance value based on the preset mapping relationship, the method further includes: setting the corresponding channel parameters in the oscilloscope to target parameter values that match the target type; continuously acquiring multiple sets of voltage data, and if the change in the voltage values in the acquired multiple sets of voltage data satisfies a preset change rule, maintaining the parameter values of the channel parameters as the target parameter values. Wherein, the preset change rule includes: rising from a first voltage value to a peak and then decreasing to a second voltage value within a preset time period; and the absolute differences between the first voltage value and the second voltage value and the target voltage value are both less than the first preset threshold. The advantage of this setting is that if it is detected that the probe has poor contact or other situations, the previously set channel parameters can be kept unchanged, avoiding wasting a large amount of time in setting the channel parameters when the probe is frequently connected and disconnected due to poor contact, and improving the test efficiency.

[0062] As described above, when the probe has poor contact, the detected voltage will rise slowly, rather than directly returning to the voltage in the unconnected state as in the resistor voltage division detection scheme. If the connection is restored within a certain time period, the voltage will drop slowly. According to this rule, the situation of poor contact can be identified. The preset time period can be set according to actual needs.

[0063] In some embodiments, the method may further include: continuously acquiring multiple sets of voltage data, and if the change in the voltage values in the acquired multiple sets of voltage data satisfies a preset change rule, outputting a preset abnormal prompt message through the display device of the oscilloscope and / or sending a probe abnormality indication to the probe control unit in the current oscilloscope probe. The probe abnormality indication is used to instruct the probe control unit to control the indicator light in the current oscilloscope probe to change to a target working state, and the target working state is used to prompt probe abnormality; wherein, the preset change rule includes: rising from a first voltage value to a peak and then decreasing to a second voltage value within a preset time period; and the absolute differences between the first voltage value and the second voltage value and the target voltage value are both less than the first preset threshold. The advantage of this setting is that if it is detected that the probe has poor contact or other situations, an abnormal prompt can be output in time on the display device of the oscilloscope, or the probe is instructed to give an abnormal prompt through the indicator light, which helps the user to take corresponding measures to continue the test.

[0064] The detection method in the embodiments of the present invention is different from the resistance voltage division detection method. After the probe connector ages and becomes loose, in the resistance detection method, at this time, the pin voltage detected by the oscilloscope system is the same as the voltage value detected when the oscilloscope probe is not connected to this channel, which is likely to cause misjudgment of the oscilloscope. In the embodiments of the present invention, the situation of poor contact and the situation of true disconnection can be accurately distinguished by the change law of the detected voltage. If it is determined that there is poor contact, the oscilloscope will remind the user that the oscilloscope probe in use has a risk of poor contact and needs to be repaired or replaced in time, and at the same time, the set channel parameters remain unchanged, improving the test efficiency.

[0065] Figure 3 FIG. 4 is a flowchart of another probe detection method provided by the embodiments of the present invention, which is optimized based on the above optional embodiments. Taking the active probe as an example. As Figure 3 shown, the method includes:

[0066] Step 301, obtain multiple groups of voltage data, where each group of voltage data includes the voltage value at the first end of the resistor detected by the voltage detection unit and the detection time corresponding to this voltage value.

[0067] Step 302, based on the capacitor charging formula, determine the target capacitance value of the capacitor in the current oscilloscope probe according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data.

[0068] Step 303, based on the preset mapping relationship, determine the target type of the current oscilloscope probe according to the target capacitance value, where the preset mapping relationship includes the corresponding relationship between the capacitance value and the type of the oscilloscope probe.

[0069] Step 304, set the corresponding channel parameters in the oscilloscope to the target parameter values matching the target type.

[0070] Step 305, continue to obtain multiple groups of voltage data. If the change of the voltage values in the obtained multiple groups of voltage data satisfies the preset change law, then keep the parameter values of the channel parameters as the target parameter values, output the preset abnormal prompt information through the display device of the oscilloscope, and send a probe abnormal indication to the probe control unit in the current oscilloscope probe.

[0071] Exemplarily, the preset abnormal prompt information can be, for example, text information displayed on the display screen of the oscilloscope, such as "There may be a problem with the current probe's contact. Please pay attention to repair or replacement", etc.

[0072] The probe detection method provided by the embodiment of the present invention replaces the resistor in the detection circuit of the oscilloscope probe with a capacitor. The capacitance value of the capacitor has a corresponding relationship with the type of the oscilloscope probe. Based on this corresponding relationship, the current probe type can be quickly determined according to the calculated capacitance value, which can effectively ensure the measurement accuracy and reliability, and can detect the aging of the probe mechanical structure. Through the oscilloscope display device and the probe indicator light, etc., the user can be reminded in time, the set channel parameters can be maintained, the user experience can be improved, and the test efficiency can be effectively improved.

[0073] The embodiment of the present invention further provides a probe detection device integrated in an oscilloscope. The oscilloscope further includes an identification circuit. The identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor. Figure 4 is a schematic structural diagram of a probe detection device provided by an embodiment of the present invention. The probe detection device, as Figure 4 shown, the device includes:

[0074] A voltage data acquisition module 401, configured to acquire multiple sets of voltage data, where each set of voltage data includes the voltage value of the first end of the resistor detected by the voltage detection unit and the detection time corresponding to the voltage value;

[0075] A capacitance value determination module 402, configured to determine the target capacitance value of the capacitor in the current oscilloscope probe according to the multiple sets of voltage data;

[0076] A type determination module 403, configured to determine the target type of the current oscilloscope probe based on a preset mapping relationship according to the target capacitance value, where the preset mapping relationship includes the corresponding relationship between the capacitance value and the type of the oscilloscope probe.

[0077] The probe detection device provided by the embodiment of the present invention replaces the resistor in the detection circuit of the oscilloscope probe with a capacitor. The capacitance value of the capacitor is related to the type of the oscilloscope probe. The oscilloscope can continuously detect the voltage value of the resistor end connected to the detection connector of the probe inside the oscilloscope through the voltage detection unit. According to the voltage value and the corresponding detection time, the capacitance value of the capacitor in the currently connected probe is calculated, and then according to the preset mapping relationship including the corresponding relationship between the capacitance value and the probe type, the current probe type is quickly determined. Compared with the resistor voltage division method, there is no additional power waste, no extra heat is brought to the system to cause the occurrence of system detection temperature drift, and no excessive noise is introduced to the precise probe. While saving power consumption, the measurement accuracy and reliability can be effectively guaranteed.

[0078] Optionally, the capacitance value determination module is specifically configured to:

[0079] Determine the target capacitance value of the capacitor in the current oscilloscope probe according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data; wherein, the voltage value in the previous set of voltage data of the first voltage data is the voltage value of the constant voltage source; the voltage value of the constant voltage source is greater than the voltage value in the first voltage data; the second voltage data is the first set of voltage data in a continuous plurality of sets of target voltage data; the absolute difference between each voltage value in the plurality of sets of target voltage data and the target voltage value is less than a first preset threshold; the number of sets of the target voltage data is greater than a second preset threshold.

[0080] Optionally, the device further includes:

[0081] A parameter setting module, configured to, after determining the target type of the current oscilloscope probe according to the target capacitance value based on the preset mapping relationship, set the corresponding channel parameter in the oscilloscope to a target parameter value matching the target type;

[0082] A parameter value holding module, configured to continue to obtain a plurality of sets of voltage data, and if the change in the voltage value in the obtained plurality of sets of voltage data satisfies a preset change rule, hold the parameter value of the channel parameter as the target parameter value;

[0083] Wherein, the preset change rule includes: rising from a first voltage value to a peak value and then dropping to a second voltage value within a preset time period; and, the absolute difference between the first voltage value and the second voltage value and the target voltage value is less than the first preset threshold.

[0084] Optionally, the device further includes:

[0085] An abnormal prompt module, configured to continue to obtain a plurality of sets of voltage data, and if the change in the voltage value in the obtained plurality of sets of voltage data satisfies a preset change rule, output a preset abnormal prompt message through the display device of the oscilloscope and / or send a probe abnormal indication to the probe control unit in the current oscilloscope probe;

[0086] Wherein, the probe abnormal indication is used to instruct the probe control unit to control the indicator light in the current oscilloscope probe to change to a target working state, and the target working state is used to prompt probe abnormality;

[0087] Among them, the preset variation rule includes: after rising from the first voltage value to the peak value, it drops to the second voltage value within a preset time duration; and the absolute differences between the first voltage value and the second voltage value and the target voltage value are both less than the first preset threshold.

[0088] An embodiment of the present invention further provides an oscilloscope, in which the probe detection device provided by the embodiment of the present invention can be integrated. The oscilloscope includes an identification circuit, a memory, a processor, and a computer program stored on the memory and executable on the processor. The identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor; when the processor executes the computer program, it implements the probe detection method provided by the embodiment of the present invention. For the specific structure of the oscilloscope, reference can be made to Figure 1 and the relevant content in the above text.

[0089] An embodiment of the present invention further provides an oscilloscope system, including the oscilloscope probe as described in any embodiment of the present invention and the oscilloscope as described in any embodiment of the present invention.

[0090] An embodiment of the present invention further provides a computer-readable storage medium, which stores a computer program for causing a processor to implement the probe detection method described in any embodiment of the present invention when executed.

[0091] In the context of the present invention, a computer-readable storage medium may be a tangible medium that can contain or store a computer program for use by or in connection with an instruction execution system, apparatus, or device. A computer-readable storage medium may include, but is not limited to, electronic, magnetic, optical, electromagnetic, infrared, or semiconductor systems, apparatus, or devices, or any suitable combination of the foregoing. Alternatively, a computer-readable storage medium may be a machine-readable signal medium. More specific examples of a machine-readable storage medium would include an electrical connection based on one or more wires, a portable computer diskette, a hard disk, a random access memory (RAM), a read-only memory (ROM), an erasable programmable read-only memory (EPROM or Flash memory), an optical fiber, a portable compact disc read-only memory (CD-ROM), an optical storage device, a magnetic storage device, or any suitable combination of the foregoing.

[0092] To provide interaction with a user, the systems and techniques described herein can be implemented on an oscilloscope that has: a display device (e.g., a CRT (cathode ray tube) or LCD (liquid crystal display) monitor) for displaying information to the user; and a keyboard and a pointing device (e.g., a mouse or a trackball) by which the user can provide input to the oscilloscope. Other kinds of devices can also be used to provide interaction with the user; for example, the feedback provided to the user can be any form of sensory feedback (e.g., visual feedback, auditory feedback, or tactile feedback); and input from the user can be received in any form (including acoustic input, voice input, or tactile input).

[0093] It should be understood that the various forms of processes shown above can be used, with steps reordered, added, or deleted. For example, the steps recited in this invention can be executed in parallel, sequentially, or in a different order, as long as the desired results of the technical solution of this invention can be achieved, and this is not limited herein.

[0094] The probe detection device, oscilloscope, and storage medium provided in the above embodiments can execute the probe detection method provided in any embodiment of this invention, and have the corresponding functional modules and beneficial effects for executing this method. For technical details not described in detail in the above embodiments, reference can be made to the probe detection method provided in any embodiment of this invention.

[0095] The above specific embodiments do not constitute a limitation on the protection scope of this invention. Those skilled in the art should understand that various modifications, combinations, sub - combinations, and substitutions can be made according to design requirements and other factors. Any modifications, equivalent substitutions, and improvements made within the spirit and principle of this invention shall be included within the protection scope of this invention.

Claims

1. A probe detection method, characterized in that, It is executed by a processor in an oscilloscope. The oscilloscope further includes an identification circuit. The identification circuit includes a resistor, a constant voltage source, and a voltage detection unit. The first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to a detection connector of an oscilloscope probe. The second end of the resistor is connected to the first end of the constant voltage source. The second end of the constant voltage source is grounded. The second end of the voltage detection unit is connected to the processor; The method includes: Obtaining multiple sets of voltage data. Each set of voltage data includes the voltage value of the first end of the resistor detected by the voltage detection unit and the detection time corresponding to this voltage value; Determining a target capacitance value of a capacitor in the current oscilloscope probe according to the multiple sets of voltage data; Based on a preset mapping relationship, determining a target type of the current oscilloscope probe according to the target capacitance value. The preset mapping relationship includes the corresponding relationship between the capacitance value and the type of the oscilloscope probe; Among them, the determining the target capacitance value of the capacitor in the current oscilloscope probe according to the multiple sets of voltage data includes: Determining the target capacitance value of the capacitor in the current oscilloscope probe according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data. The voltage value in the previous set of voltage data of the first voltage data is the voltage value of the constant voltage source. The voltage value of the constant voltage source is greater than the voltage value in the first voltage data. The second voltage data is the first set of voltage data in multiple consecutive sets of target voltage data. The absolute difference between each voltage value in the multiple sets of target voltage data and the target voltage value is less than a first preset threshold. The number of sets of the target voltage data is greater than a second preset threshold.

2. The method according to claim 1, characterized in that, After determining the target type of the current oscilloscope probe according to the target capacitance value based on the preset mapping relationship, it further includes: Setting the corresponding channel parameters in the oscilloscope to target parameter values matching the target type; Continuing to obtain multiple sets of voltage data. If the change in the voltage values in the obtained multiple sets of voltage data satisfies a preset change rule, then maintaining the parameter value of the channel parameter as the target parameter value; Among them, the preset change rule includes: rising from a first voltage value to a peak and then dropping to a second voltage value within a preset time period. And the absolute differences between the first voltage value and the second voltage value and the target voltage value are both less than the first preset threshold.

3. The method according to claim 1, characterized in that, It further includes: Continuing to obtain multiple sets of voltage data. If the change in the voltage values in the obtained multiple sets of voltage data satisfies a preset change rule, then outputting a preset abnormal prompt message through the display device of the oscilloscope and / or sending a probe abnormal indication to a probe control unit in the current oscilloscope probe; Among them, the probe abnormal indication is used to instruct the probe control unit to control the indicator light in the current oscilloscope probe to change to a target working state, and the target working state is used to prompt probe abnormality; Among them, the preset variation rule includes: after rising from the first voltage value to the peak value, it drops to the second voltage value within a preset time period; and, the absolute differences between the first voltage value and the second voltage value and the target voltage value are both less than the first preset threshold.

4. A probe detection device, characterized in that, Integrated in an oscilloscope, the oscilloscope further includes an identification circuit, the identification circuit includes a resistor, a constant voltage source and a voltage detection unit, the first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe, the second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor; The device includes: A voltage data acquisition module, configured to acquire multiple sets of voltage data, where each set of voltage data includes the voltage value at the first end of the resistor detected by the voltage detection unit and the detection time corresponding to the voltage value; A capacitance value determination module, configured to determine the target capacitance value of the capacitor in the current oscilloscope probe according to the multiple sets of voltage data; A type determination module, configured to determine the target type of the current oscilloscope probe based on a preset mapping relationship according to the target capacitance value, where the preset mapping relationship includes the correspondence between the capacitance value and the type of the oscilloscope probe; Among them, the capacitance value determination module is configured to determine the target capacitance value of the capacitor in the current oscilloscope probe according to the voltage value of the constant voltage source, the first detection time in the first voltage data, the target voltage value in the second voltage data, and the second detection time in the second voltage data; where the voltage value in the previous set of voltage data of the first voltage data is the voltage value of the constant voltage source; the voltage value of the constant voltage source is greater than the voltage value in the first voltage data; the second voltage data is the first set of voltage data in multiple consecutive sets of target voltage data; the absolute differences between the voltage values in the multiple sets of target voltage data and the target voltage value are both less than the first preset threshold; the number of sets of the target voltage data is greater than the second preset threshold.

5. An oscilloscope, including an identification circuit, a memory, a processor, and a computer program stored on the memory and executable on the processor, characterized in that The identification circuit includes a resistor, a constant voltage source and a voltage detection unit, the first end of the resistor is electrically connected to the first end of the voltage detection unit and is used to connect to the detection connector of the oscilloscope probe, the second end of the resistor is connected to the first end of the constant voltage source, the second end of the constant voltage source is grounded, and the second end of the voltage detection unit is connected to the processor; When the processor executes the computer program, it implements the method according to any one of claims 1-3.

6. An oscilloscope system, characterized in that, Including the oscilloscope according to claim 5.

7. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the program is executed by the processor, it implements the method according to any one of claims 1-3.

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