A multi-station chip tester

Abstract

The application provides a multi-station chip testing machine, which comprises a general substrate, a conveying device, a feeding device and a testing device are installed on the general substrate, the testing device comprises a testing base plate and a testing lifting plate, the testing base plate is installed with an automatic turntable, a testing slide rail, a testing guide column and a lifting motor, the automatic turntable is provided with a plurality of chip carriers which are symmetrically arranged at the center, the chip carriers are provided with testing holes, the testing slide rail is provided with a sliding block plate, the sliding block plate is provided with a fixed upper inclined pusher, a testing horizontal movement nut, the lifting motor is provided with a testing horizontal movement screw rod which is matched with the testing horizontal movement nut, the bottom of the testing lifting plate is installed with a testing lifting guide sleeve and a lower inclined pusher, the testing lifting guide sleeve is matched with the testing guide column, the lower inclined pusher is symmetrically and obliquely arranged with the upper inclined pusher, the top of the testing lifting plate is installed with testers which are symmetrically arranged at the center and matched with the chip carriers, and the testers are provided with testing needles; the chip testing machine can simultaneously perform multiple tests on multiple chips; and the application belongs to the technical field of testing equipment.

Description

TECHNICAL FIELD

[0001] The present application belongs to the technical field of testing equipment, and particularly relates to a multi-station chip testing machine. BACKGROUND

[0002] In the manufacturing process of chips, the performance of the chips is tested before production to ensure the quality of the products. In the existing testing process, the chips are taken from the conveying belt by manual or mechanical hand and placed in a certain testing device for testing. After the testing is completed, the chip is taken from the testing device and placed on the conveying belt, and then the chip is conveyed to another testing device for testing by the conveying belt. Therefore, in the existing testing process, a large amount of time is consumed to wait for each testing item to complete the testing, and a worker or a mechanical hand is arranged at each station of the testing device to place the chip in the testing device for testing. SUMMARY

[0003] The present application aims to provide a multi-station chip testing machine, which can simultaneously perform multiple tests on multiple chips, thereby solving the above technical problems.

[0004] The present application comprises a general substrate, which is provided with a conveying device, a feeding device and a testing device. The testing device comprises a testing base plate and a testing lifting plate. The testing base plate is provided with an automatic turntable, a testing slide rail, a testing guide column and a lifting motor. The automatic turntable is provided with a plurality of chip carriers which are symmetrically arranged at the center. The chip carriers are provided with testing holes. The testing slide rail is provided with a sliding block plate. The sliding block plate is provided with a fixed upper inclined push seat, a testing horizontal movement nut and a chip information sensor. The lifting motor is provided with a testing horizontal movement screw rod which cooperates with the testing horizontal movement nut. The testing lifting plate is provided at the bottom with a testing lifting guide sleeve and a lower inclined push seat. The testing lifting guide sleeve cooperates with the testing guide column. The lower inclined push seat is symmetrically inclined with the upper inclined push seat. The testing lifting plate is provided at the top with testing devices which are symmetrically arranged at the center and cooperate with the chip carriers. The testing devices are provided with testing needles which cooperate with the testing holes. The testing lifting plate is provided with sensing windows which are symmetrically arranged at the center of the testing devices and correspond to the chip information sensor.

[0005] More preferably, the testing device further comprises a testing top plate, which is provided with burners which are symmetrically arranged at the center and cooperate with the chip carriers.

[0006] More specifically, the feeding device comprises a left feeding seat, a right feeding seat and a feeding horizontal movement plate. The left feeding seat is provided at the top with a feeding vertical movement slide rail. The right feeding seat is provided with a feeding vertical movement slide table air cylinder. One end of the feeding horizontal movement plate is provided with a feeding vertical movement sliding block which cooperates with the feeding vertical movement slide rail. The other end of the feeding horizontal movement plate is fixed to the feeding vertical movement slide table air cylinder. The feeding horizontal movement plate is provided with a feeding horizontal movement slide table air cylinder. The feeding vertical movement slide table air cylinder is provided with a feeding lifting plate. The feeding lifting plate is provided with a feeding lifting slide table air cylinder. The feeding lifting slide table air cylinder is provided with a feeding adsorber.

[0007] More specifically, the conveying device is located below the general base plate; the conveying device comprises a feeding frame, a top feeding plate and a tray; both sides of the feeding frame are provided with feeding conveying belts supporting both sides of the tray, feeding limiting strips are installed beside the feeding conveying belts, the feeding frame is provided with a top feeding nut bearing seat, a top feeding motor and a top feeding guide sleeve, the top feeding motor is in transmission connection with the top feeding nut bearing seat, the bottom of the top feeding plate is provided with a top feeding lead screw and a top feeding guide column, the top feeding lead screw is matched with the top feeding nut bearing seat, the top feeding guide column is matched with the top feeding guide sleeve, and the top feeding plate is matched with the tray.

[0008] More specifically, both sides of the bottom of the tray are provided with supporting openings, and one end of the conveying device is provided with a feeding device; the feeding device comprises a feeding base plate and a feeding lifting plate, the feeding base plate is provided with blanking limiting plates matched with four corners of the tray and blanking telescopic cylinders, the blanking telescopic cylinders are provided with supporting protrusions matched with the supporting openings, the feeding base plate is fixedly provided with a feeding guide sleeve and a feeding nut, the feeding lifting plate is provided with a feeding chute, the feeding lifting plate is provided with a push-in cylinder, the push-in cylinder is provided with a push plate located in the feeding chute, the bottom of the feeding lifting plate is provided with a feeding guide column matched with the feeding guide sleeve, the bottom end of the feeding guide column is provided with a feeding bottom plate, the feeding bottom plate is provided with a feeding lifting motor and a feeding lifting lead screw, the feeding lifting motor is in transmission connection with the feeding lifting lead screw, and the feeding lifting lead screw is matched with the feeding nut.

[0009] More specifically, the bottom of the tray is provided with a pulling groove, and the other end of the conveying device is provided with a discharging device; the discharging device comprises a discharging base plate and a discharging lifting plate, the discharging base plate is provided with stacking limiting plates matched with four corners of the tray and a stacking support seat, the stacking support seat is provided with bearing-connected stacking supporting blocks, the stacking supporting blocks are provided with reset torsion springs, the discharging base plate is provided with a stacking lifting cylinder and a stacking guide sleeve, the stacking lifting cylinder is connected with the discharging lifting plate, the discharging lifting plate is provided with a stacking lifting shaft matched with the stacking guide sleeve, the discharging lifting plate is provided with a discharging chute, the discharging lifting plate is provided with a pulling cylinder, the pulling cylinder is provided with a pulling plate located in the discharging chute, the pulling plate is matched with the pulling groove, the discharging lifting plate is connected with the stacking lifting cylinder, and the discharging lifting plate is provided with a stacking guide column matched with the stacking guide sleeve.

[0010] More preferably, the general base plate is provided with conveying devices side by side, and the conveying devices are provided with a material moving device above; the material moving device comprises a material moving motor, a material moving sliding rail and a material moving plate, the material moving motor and the material moving sliding rail are fixedly installed on the general base plate, the material moving motor is provided with a material moving lead screw, the material moving plate is fixedly provided with a material moving sliding block and a material moving nut, the material moving sliding block is matched with the material moving sliding rail, the material moving nut is matched with the material moving lead screw, the material moving plate is provided with a giving-up hole matched with the feeding lifting plate, the giving-up hole is provided with symmetrically arranged clamping cylinders, and the clamping cylinders are provided with clamping strips matched with both sides of the tray.

[0011] The beneficial effects of the present application are as follows:

[0012] The chip testing machine drives multiple product carriers to move simultaneously by an automatic turntable. When a product in one carrier is tested by a first tester and then moves to a next tester, another product moves to the first tester at the same time to be tested simultaneously with the first product. In this way, the chip testing machine can test multiple chips simultaneously, thereby reducing the waiting time for each test and reducing the cost of arranging workers or installing mechanical hands to place or take out products in or from the testing equipment. BRIEF DESCRIPTION OF DRAWINGS

[0013] In order to more clearly illustrate the specific embodiments of the present application, the following will be a brief description of the drawings and labels used in the description of the specific embodiments.

[0014] Figure 1 is a structural diagram of the present application;

[0015] Figure 2 is a structural diagram of the feeding device of the present application;

[0016] Figure 3 is a structural diagram of the testing device of the present application;

[0017] Figure 4 is a side elevation view of the testing device of the present application;

[0018] Figure 5 is a structural diagram of the automatic turntable of the present application;

[0019] Figure 6 is a structural diagram of the tester of the present application;

[0020] Figure 7 is a structural diagram of the chip carrier of the present application;

[0021] Figure 8 is a structural diagram of the conveying device of the present application

[0022] Figure 9 is a side elevation view of the conveying device of the present application;

[0023] Figure 10 is a structural diagram of the feeding device of the present application;

[0024] Figure 11 is a sectional view of the feeding device of the present application;

[0025] Figure 12 is a structural diagram of the discharging device of the present application;

[0026] Figure 13 is a sectional view of the discharge device of the present application;

[0027] Figure 14 is a sectional view of the stacking support seat of the present application;

[0028] Figure 15 is a structural schematic view of the material moving device of the present application;

[0029] Figure 16 is a structural schematic view of the material tray of the present application.

[0030] Reference signs:

[0031] 10, general base plate; 11, material tray; 110, supporting opening; 111, material pulling groove;

[0032] 2, conveying device; 21, material feeding frame; 211, material feeding conveying belt; 212, conveying limiting strip; 213, material lifting nut bearing seat; 214, material lifting motor; 215, material lifting guide sleeve; 22, material lifting plate; 221, material lifting screw rod; 222, material lifting guide column;

[0033] 3, material feeding device; 31, left material feeding seat; 311, material feeding longitudinal moving slide rail; 32, right material feeding seat; 321, material feeding longitudinal moving slide table cylinder; 33, material feeding transverse moving plate; 331, material feeding longitudinal moving slide block; 332, material feeding transverse moving slide table cylinder; 34, material feeding lifting plate; 35, material feeding lifting slide table cylinder; 36, material feeding adsorber;

[0034] 4, testing device; 41, testing base plate; 411, automatic turntable; 412, testing slide rail; 413, testing guide column; 414, lifting motor; 415, chip carrier; 416, testing hole; 417, testing transverse moving screw rod; 42, testing lifting plate; 421, testing lifting guide sleeve; 422, lower inclined pushing seat; 423, tester; 424, testing needle; 425, induction window; 43, slide block plate; 431, upper inclined pushing seat; 432, testing transverse moving nut; 433, chip information inductor; 44, testing top plate; 441, burner;

[0035] 5, material feeding device; 51, material feeding base plate; 511, material falling limiting plate; 512, material falling telescopic cylinder; 513, supporting protrusion; 514, material feeding guide sleeve; 515, material feeding nut; 516, material feeding chute; 517, pushing cylinder; 518, pushing plate; 52, material feeding lifting plate; 521, material feeding guide column; 53, material feeding base plate; 531, material feeding lifting motor; 532, material feeding lifting screw rod;

[0036] 6, discharging device; 61, discharging base plate; 611, stacking limiting plate; 612, stacking support seat; 613, stacking supporting block; 6130, reset torsion spring; 614, stacking lifting cylinder; 615, stacking guide sleeve; 62, discharging lifting plate; 621, discharging chute; 622, pulling cylinder; 623, pulling plate; 624, stacking guide column;

[0037] 7, material moving device; 71, material moving motor; 711, material moving screw rod; 72, material moving slide rail; 73, material moving plate; 731, material moving slide block; 732, material moving nut; 74, let go hole; 741, clamping cylinder; 742, clamping strip. DETAILED DESCRIPTION

[0038] In order to make the objects, technical solutions and advantages of the present application clearer, further detailed description will be made to the present application with reference to the specific embodiments and the accompanying drawings. It should be understood that these descriptions are only exemplary and are not intended to limit the scope of the present application. In addition, in the following description, the description of the known structures and technologies is omitted to avoid unnecessary confusion of the concept of the present application.

[0039] As shown in Figure 1 , the present application comprises a general base plate 10, which is installed with a conveying device 2, a feeding device 3, a testing device 4, a feeding device 5, a discharging device 6 and a material moving device 7.

[0040] As shown in Figures 3 to 7 , the testing device 4 comprises a testing base plate 41 and a testing lifting plate 42;

[0041] The testing base plate 41 is installed with an automatic turntable 411, a testing slide rail 412, a testing guide column 413 and a lifting motor 414;

[0042] The automatic turntable 411 is provided with a plurality of chip carriers 415 which are symmetrically arranged at the center, and the chip carriers 415 are provided with testing holes 416;

[0043] The testing slide rail 412 is provided with a slide block plate 43, which is provided with a fixed upper inclined push seat 431, a testing horizontal moving nut 432 and a chip information inductor 433, and the lifting motor 414 is provided with a testing horizontal moving screw rod 417 which cooperates with the testing horizontal moving nut 432;

[0044] The bottom of the test lifting plate 42 is provided with a test lifting guide sleeve 421 matched with the test guide column 413 and a lower inclined push seat 422 symmetrically inclined with the upper inclined push seat 431. The top of the test lifting plate 42 is provided with a tester 423 symmetrically centered with the chip carrier 415 and matched with the tester 423. The tester 423 is provided with test needles 424 matched with the test holes 416. The test lifting plate 42 is provided with an induction window 425 symmetrically centered with the tester 423 and corresponding to the chip information inductor 433.

[0045] The conveying device 2 moves the chip to the feeding device 3. The feeding device 3 clamps and places the chip in the carrier above the induction window 425.

[0046] When reading the chip information, the lifting motor 414 drives the test horizontal moving lead screw 417 to rotate. The test horizontal moving lead screw 417 drives the sliding block plate 43 to move on the test sliding rail 412 through cooperation with the test horizontal moving nut 432. The sliding block plate 43 drives the chip information inductor 433 to move below the induction window 425 to read the information of the chip above the induction window 425.

[0047] When testing, the lifting motor 414 drives the test horizontal moving lead screw 417 to rotate. The test horizontal moving lead screw 417 drives the sliding block plate 43 to move on the test sliding rail 412 through cooperation with the test horizontal moving nut 432. The sliding block plate 43 drives the lower inclined push seat 422 to move. The lower inclined push seat 422 drives the test lifting plate 42 to rise through cooperation with the upper inclined push seat 431, so that the test needles 424 rise to contact the chip in the carrier, thereby testing the chip through electrification.

[0048] The automatic turntable 411 drives the chip carrier 415 to move. When the chip in the first chip carrier 415 is moved to the position of the first tester 423, the feeding device 3 places the second chip in the second chip carrier 415. When the first chip is tested by the first tester 423, the second chip is read by the chip information inductor 433. Thereafter, when the chip in the first chip carrier 415 is moved to the position of the second tester 423, the chip in the second chip carrier 415 is moved to the position of the first tester 423. The feeding device 3 places the nth chip in the nth chip carrier 415. The first chip is tested by the second tester 423. The second chip is tested by the first tester 423. The nth chip is read by the chip information inductor 433. When the chip in the chip carrier 415 completes all tests, it completes one week of movement and moves back to above the induction window 425. At this time, the feeding device 3 takes out the chip and places it back on the conveying device 2, and places the nth+1 chip in the chip carrier 415.

[0049] In some embodiments, the testing device 4 further comprises a testing top plate 44, which is installed with a burner 441 that is centrally symmetrical and cooperates with the chip carrier 415, so as to realize the input of information to the chip before or after the chip is tested by the tester 423.

[0050] As shown in Figure 2 some embodiments, the feeding device 3 comprises a left feeding seat 31, a right feeding seat 32 and a feeding horizontal moving plate 33, the left feeding seat 31 is provided at the top with a feeding longitudinal moving slide rail 311, the right feeding seat 32 is installed with a feeding longitudinal moving slide table cylinder 321, one end of the feeding horizontal moving plate 33 is installed with a feeding longitudinal moving slide block 331 that cooperates with the feeding longitudinal moving slide rail 311, the other end of the feeding horizontal moving plate 33 is fixedly installed on the feeding longitudinal moving slide table cylinder 321, the feeding horizontal moving plate 33 is installed with a feeding horizontal moving slide table cylinder 332, the feeding longitudinal moving slide table cylinder is provided with a feeding lifting plate 34, the feeding lifting plate 34 is installed with a feeding lifting slide table cylinder 35, and the feeding lifting slide table cylinder 35 is provided with a feeding suction device 36.

[0051] The feeding longitudinal moving slide table cylinder 321 drives the feeding horizontal moving plate 33 to move longitudinally back and forth on the feeding longitudinal moving slide rail 311, the feeding horizontal moving slide table cylinder 332 on the feeding horizontal moving plate 33 drives the feeding lifting plate 34 to move transversely back and forth, and the feeding lifting slide table cylinder 35 drives the feeding suction device 36 to move up and down back and forth, so as to realize the suction and placement of the product on the conveying device 2 into the chip carrier 415 or the taking out of the chip from the chip carrier 415.

[0052] The chip testing machine drives multiple carriers on which products are placed to move simultaneously through the automatic turntable 411, when the product in one carrier is moved to the next tester 423 to be tested after the previous tester 423 completes the test, another product is simultaneously moved to the first tester 423 to be tested at the same time as the first product, and the chip testing machine realizes the simultaneous testing of multiple chips on multiple items, so as to reduce the waiting time of the product in each test, and reduce the arrangement of workers or the installation of mechanical hands on each test station to place the product into the testing equipment or take it out, so as to reduce the testing cost.

[0053] As shown in Figure 8 and 9As shown in some embodiments: the conveying device 2 is located below the total base plate 10, the conveying device 2 includes a feeding frame 21, a feeding plate 22 and a tray 11; both sides of the feeding frame 21 are provided with feeding conveying belts 211 supporting both sides of the tray 11, and conveying limiting strips 212 are provided beside the feeding conveying belts 211; the feeding frame 21 is provided with a feeding nut bearing seat 213, a feeding motor 214 and a feeding guide sleeve 215, and the feeding motor 214 is in driving connection with the feeding nut bearing seat 213; the bottom of the feeding plate 22 is fixedly provided with a feeding lead screw 221 and a feeding guide column 222, the feeding lead screw 221 cooperates with the feeding nut bearing seat 213, the feeding guide column 222 cooperates with the feeding guide sleeve 215, and the feeding plate 22 cooperates with the tray 11.

[0054] The tray 11 is arranged to place a plurality of chips, the feeding conveying belts 211 drive the tray 11 to move to below the feeding device 3 and above the feeding plate 22, then the feeding motor 214 drives the feeding nut bearing seat 213 to rotate, the feeding nut bearing seat 213 drives the feeding lead screw 221 to move, so as to drive the feeding plate 22 to rise, thereby the tray 11 is lifted, and the problem of displacement of the tray 11 on the conveying belt during the feeding is avoided.

[0055] As shown in some embodiments: Figure 10 , 11 and 15: the bottom of the tray 11 is provided with tray supporting openings 110, and one end of the conveying device 2 is provided with a feeding device 5.

[0056] The feeding device 5 includes a feeding base plate 51 and a feeding lifting plate 52, the feeding base plate 51 is provided with a feeding limiting plate 511 cooperating with four corners of the tray 11 and a feeding telescopic cylinder 512, and the feeding telescopic cylinder 512 is provided with tray supporting protrusions 513 cooperating with the tray supporting openings 110.

[0057] The feeding base plate 51 is fixedly provided with a feeding guide sleeve 514 and a feeding nut 515.

[0058] The feeding lifting plate 52 is provided with a feeding chute 516, and is provided with a push-in cylinder 517, the push-in cylinder 517 is provided with a push plate 518 located in the feeding chute 516, the bottom of the feeding lifting plate 52 is provided with a feeding guide column 521 cooperating with the feeding guide sleeve 514, the bottom end of the feeding guide column 521 is provided with a feeding bottom plate 53, the feeding bottom plate 53 is provided with a feeding lifting motor 531 and a feeding lifting lead screw 532, the feeding lifting motor 531 is in driving connection with the feeding lifting lead screw 532, and the feeding lifting lead screw 532 cooperates with the feeding nut 515.

[0059] The tray supporting protrusions 513 support the tray supporting openings 110 of the tray 11, a plurality of trays 11 are stacked on the tray 11, and the feeding limiting plate 511 makes the stacked trays 11 neatly stacked.

[0060] During feeding, the feeding lifting motor 531 drives the feeding lifting screw 532 to rotate forward. The feeding lifting screw 532, in conjunction with the feeding nut 515, drives the feeding lifting plate 52 to rise, so that the feeding lifting plate 52 supports the lowest material tray 11. Then, the dropping telescopic cylinder 512 drives the supporting protrusion 513 to retract inward, and the feeding lifting motor 531 drives the feeding lifting screw 532 to rotate in the opposite direction, so as to drive the feeding lifting plate 52 to descend. Then, the dropping telescopic cylinder 512 drives the supporting protrusion 513 to extend outward, so as to support the second lowest material tray 11. The feeding lifting plate 52 continues to descend, so as to separate the lowest material tray 11 from the second lowest material tray 11. Then, the pushing cylinder 517 drives the push plate 518 to move in the feeding chute 516, so as to push the material tray 11 onto the feeding conveyor belt 211 through the push plate 518; so as to realize automated unmanned testing of large batches of chips.

[0061] like Figures 12 to 14 As shown in 16, in the following embodiments: the bottom of the material tray 11 is provided with a material pulling groove 111, and the other end of the conveying device 2 is provided with a discharge device 6, which includes a discharge base plate 61 and a discharge lifting plate 62.

[0062] The discharge base plate 61 is equipped with a stacking plate 611 that cooperates with the four corners of the material tray 11 and a stacking support base 612. The stacking support base 612 is equipped with a stacking block 613 connected by a bearing. The stacking block 613 is a one-way reset block. The bottom of the stacking block 613 is provided with an outward inclined surface. The top of the stacking block 613 is a plane that supports the material tray 11. The side of the stacking block 613 is a support surface that cooperates with the stacking support base 612. The stacking block 613 is provided with a reset torsion spring 6130.

[0063] The discharge base plate 61 is equipped with a stacking lifting cylinder 614 and a stacking guide sleeve 615. The stacking lifting cylinder 614 is connected to the discharge lifting plate 62. The discharge lifting plate 62 is equipped with a stacking lifting shaft that cooperates with the stacking guide sleeve 615.

[0064] The discharge lifting plate 62 is provided with a discharge chute 621. The discharge lifting plate 62 is equipped with a material pulling cylinder 622. The material pulling cylinder 622 is provided with a material pulling plate 623 located in the discharge chute 621. The material pulling plate 623 cooperates with the material pulling groove 111. The discharge lifting plate 62 is connected to the stacking lifting cylinder 614. The discharge lifting plate 62 is equipped with a stacking guide post 624 that cooperates with the stacking guide sleeve 615.

[0065] When the material tray 11 is fed out, the discharge lifting plate 62 is lower than the feeding conveyor belt 211. After the feeding conveyor belt 211 moves one side of the material tray 11 onto the discharge lifting plate 62, the pulling cylinder 622 drives the pulling plate 623 to move in the discharge chute 621. The pulling plate 623 pulls the material tray 11 out through the pulling chute 111. After that, the stacking lifting cylinder 614 drives the discharge lifting plate 62 to rise, and the discharge lifting plate 62 drives the material tray 11 to rise. As the material tray 11 moves upward, the stacking support block 613 pushes outward. After the material tray 11 passes the stacking support block 613, the reset torsion spring 6130 drives the stacking support block 613 to reset. After that, the stacking lifting cylinder 614 drives the discharge lifting plate 62 to descend. The stacking support block 613 supports the four corners of the material tray 11 to stack the material trays 11 one by one from the bottom. The stacking limit plate 611 limits the position of the material trays 11 when stacking, so that the material trays 11 are stacked neatly.

[0066] like Figure 15 As shown, in some embodiments: a conveying device 2 is mounted side by side on the main substrate 10, and a transfer device 7 is mounted above the conveying device 2;

[0067] The material transfer device 7 includes a material transfer motor 71, a material transfer slide rail 72, and a material transfer plate 73. The material transfer motor 71 and the material transfer slide rail 72 are fixedly installed on the main base plate 10. The material transfer motor 71 is provided with a material transfer screw 711. The material transfer plate 73 is fixedly installed with a material transfer slider 731 and a material transfer nut 732. The material transfer slider 731 cooperates with the material transfer slide rail 72, and the material transfer nut 732 cooperates with the material transfer screw 711. The material transfer plate 73 is provided with a clearance hole 74 that cooperates with the feeding lifting plate 52. The clearance hole 74 is equipped with symmetrically arranged clamping cylinders 741. The clamping cylinders 741 are provided with clamping bars 742 that cooperate with both sides of the material tray 11.

[0068] The top plate 22 drives the tray 11 to rise into the clearance hole 74, and the clamping cylinder 741 drives the clamping bar 742 to extend to clamp and fix the tray 11, so that the feeding device 3 can more stably pick up the chip in the tray 11 and place it into the test carrier or pick up the chip from the test carrier and put it back into the tray 11.

[0069] When two or more conveying devices 2 are installed on the main base plate 10, after the clamping cylinder 741 clamps and fixes the material tray 11 through the clamping bar 742, the transfer motor 71 drives the transfer screw 711 to rotate. The transfer screw 711, in cooperation with the transfer nut 732, drives the transfer plate 73 to move on the transfer slide rail 72, thereby moving the material tray 11 to the position of the feeding device 3, so that the feeding device 3 can pick up or put down the material from the clamped and fixed material tray 11.

[0070] It should be understood that the foregoing detailed description of the application, rather than limiting the application, is intended to explain and describe the current implementation of the application. Therefore, any modification, equivalent replacement, improvement, etc. made without departing from the spirit and scope of the application shall be included in the protection scope of the application. In addition, the appended claims of the application are intended to cover all changes and modifications falling within the scope and boundary of the appended claims, or the equivalent forms of such scope and boundary.

Claims

1. A multi-station chip testing machine comprising a general base plate (10) mounted with a conveying device (2), a feeding device (3) and a testing device (4), characterized in that: the testing device (4) comprises a testing base plate (41) and a testing lifting plate (42), the testing base plate (41) is mounted with an automatic turntable (411), a testing slide rail (412), a testing guide column (413) and a lifting motor (414), the automatic turntable (411) is provided with a plurality of chip carriers (415) symmetrically at the center, the chip carriers (415) are provided with testing holes (416), the testing slide rail (412) is provided with a sliding block plate (43), the sliding block plate (43) is provided with a fixed upper inclined push seat (431), a testing horizontal moving nut (432) and a chip information inductor (433), the lifting motor (414) is provided with a testing horizontal moving screw rod (417) matched with the testing horizontal moving nut (432), the testing lifting plate (42) is mounted at the bottom with a testing lifting guide sleeve (421) and a lower inclined push seat (422), the testing lifting guide sleeve (421) is matched with the testing guide column (413), the lower inclined push seat (422) is symmetrically inclined with the upper inclined push seat (431), the testing lifting plate (42) is mounted at the top with testers (423) symmetrically at the center and matched with the chip carriers (415), the testers (423) are provided with testing needles (424) matched with the testing holes (416), the testing lifting plate (42) is provided with inductive windows (425) symmetrically at the center and corresponding to the chip information inductors (433).

2. The multi-site wafer prober according to claim 1, wherein: the testing device (4) further comprises a testing top plate (44) mounted with burners (441) symmetrically at the center and matched with the chip carriers (415).

3. The multi-site wafer prober of claim 1, wherein: the feeding device (3) comprises a left feeding seat (31), a right feeding seat (32) and a feeding horizontal moving plate (33), the left feeding seat (31) is provided at the top with a feeding vertical moving slide rail (311), the right feeding seat (32) is mounted with a feeding vertical moving slide table air cylinder (321), one end of the feeding horizontal moving plate (33) is mounted with a feeding vertical moving sliding block (331) matched with the feeding vertical moving slide rail (311), the other end of the feeding horizontal moving plate (33) is mounted fixedly on the feeding vertical moving slide table air cylinder (321), the feeding horizontal moving plate (33) is mounted with a feeding horizontal moving slide table air cylinder (332), the feeding vertical moving slide table air cylinder (321) is provided with a feeding lifting plate (34), the feeding lifting plate (34) is mounted with a feeding lifting slide table air cylinder (35), the feeding lifting slide table air cylinder (35) is provided with a feeding adsorber (36).

4. The multi-site wafer prober of claim 1, wherein: the conveying device (2) is located below the general base plate (10). The conveying device (2) comprises a feeding frame (21), a material lifting plate (22) and a tray (11); both sides of the feeding frame (21) are provided with feeding conveying belts (211) for supporting both sides of the tray (11), and conveying limiting strips (212) are arranged beside the feeding conveying belts (211); the feeding frame (21) is provided with a material lifting nut bearing seat (213), a material lifting motor (214) and a material lifting guide sleeve (215), the material lifting motor (214) is in driving connection with the material lifting nut bearing seat (213), the bottom of the material lifting plate (22) is provided with a material lifting lead screw (221) and a material lifting guide column (222), the material lifting lead screw (221) is matched with the material lifting nut bearing seat (213), and the material lifting guide column (222) is matched with the material lifting guide sleeve (215); and the material lifting plate (22) is matched with the tray (11).

5. A multi-site chip tester according to claim 4, wherein: Both sides of the bottom of the tray (11) are provided with supporting openings (110), and one end of the conveying device (2) is provided with a feeding device (5); The feeding device (5) comprises a feeding base plate (51) and a feeding lifting plate (52), the feeding base plate (51) is provided with a material falling limiting plate (511) matched with four corners of the tray (11) and a material falling telescopic cylinder (512), the material falling telescopic cylinder (512) is provided with a supporting protrusion (513) matched with the supporting opening (110), the feeding base plate (51) is fixedly provided with a feeding guide sleeve (514) and a feeding nut (515), the feeding lifting plate (52) is provided with a feeding chute (516), the feeding lifting plate (52) is provided with a pushing cylinder (517), the pushing cylinder (517) is provided with a pushing plate (518) located in the feeding chute (516), the bottom of the feeding lifting plate (52) is provided with a feeding guide column (521) matched with the feeding guide sleeve (514), and the bottom end of the feeding guide column (521) is provided with a feeding bottom plate (53), the feeding bottom plate (53) is provided with a feeding lifting motor (531) and a feeding lifting lead screw (532), the feeding lifting motor (531) is in driving connection with the feeding lifting lead screw (532), and the feeding lifting lead screw (532) is matched with the feeding nut (515).

6. The multi-site wafer prober of claim 4, wherein: The bottom of the tray (11) is provided with a material pulling groove (111), and the other end of the conveying device (2) is provided with a discharging device (6). The discharge device (6) comprises a discharge base plate (61) and a discharge lifting plate (62), the discharge base plate (61) is installed with a stack limiting plate (611) matched with four corners of the tray (11) and a stack supporting seat (612), the stack supporting seat (612) is installed with a stack supporting block (613) connected through bearings, the stack supporting block (613) is provided with a reset torsional spring (6130), the discharge base plate (61) is installed with a stack lifting cylinder (614) and a stack guide sleeve (615), the stack lifting cylinder (614) is connected with the discharge lifting plate (62), the discharge lifting plate (62) is installed with a stack lifting shaft matched with the stack guide sleeve (615), The discharge lifting plate (62) is provided with a discharge chute (621), the discharge lifting plate (62) is installed with a pulling cylinder (622), the pulling cylinder (622) is provided with a pulling plate (623) located in the discharge chute (621), the pulling plate (623) is matched with the pulling groove (111), the discharge lifting plate (62) is connected with the stack lifting cylinder (614), and the discharge lifting plate (62) is installed with a stack guide column (624) matched with the stack guide sleeve (615).

7. The multi-site wafer prober of claim 5, wherein: The total base plate (10) is installed side by side with a conveying device (2), and the conveying device (2) is installed above a material moving device (7); The material moving device (7) comprises a material moving motor (71), a material moving slide rail (72) and a material moving plate (73), the material moving motor (71) and the material moving slide rail (72) are fixedly installed on the total base plate (10), the material moving motor (71) is provided with a material moving screw rod (711), the material moving plate (73) is fixedly installed with a material moving slide block (731) and a material moving nut (732), the material moving slide block (731) is matched with the material moving slide rail (72), the material moving nut (732) is matched with the material moving screw rod (711), the material moving plate (73) is provided with a gap hole (74) matched with the feeding lifting plate (52), the gap hole (74) is installed with symmetrically arranged clamping cylinders (741), and the clamping cylinders (741) are provided with clamping strips (742) matched with both sides of the tray (11).

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