Electronic component testing device and testing method

Abstract

The present invention provides an electronic component testing device and a testing method. The electronic component testing device includes: a machine table, which is provided with a machine table top; a supporting chassis, which is provided on the machine table top, and a test plate that can be driven to rotate is provided on the supporting chassis, and a feeding unit, an inspection unit, and a discharge unit are provided outside the periphery of the supporting chassis; wherein, the inspection unit is provided with a first inspection unit, and the first inspection unit is provided with a first seat, a plurality of box-shaped first upper terminal boxes, and a plurality of box-shaped first lower terminal boxes; the first upper terminal box is provided with a plurality of first upper terminals; the first lower terminal box is provided with a plurality of first probes, thereby adapting to the needs of multiple terminal modules.

Description

Technical Field

[0001] The present invention relates to a testing device and a testing method, and more particularly to an electronic component testing device and a testing method suitable for testing electronic components. Background Art

[0002] After manufacturing, general electronic components usually need to be tested to determine their physical properties. For example, the device provided in the patent application for "Circuit Component Loading and Unloading Device" with publication number 411735 for testing capacitor-type electronic components has one or more concentric ring seats with component slots that can rotate relative to the ring center. The slots are evenly spaced at angles and rotate in increments, and the rotation increments are the angular intervals between adjacent slots. The ring seat is tilted at a certain angle, and when the ring seat rotates, the component flow path dumps the component toward the ring seat. The fixed grid adjacent to the outer plate side of the slot seat restricts the components that have not been returned to their original position to randomly roll down to the empty slot seat in the arc segment of the ring seat rotation path due to the power. The random rolling causes the components to Return to the slot seat, there is an electronic contactor for connecting the component and the test machine in the path of the rotating ring seat, the tested component passes under a spray manifold, the spray manifold plate defines many spray holes, and each time the ring seat rotates an increment, the spray holes are aligned with a group of slot seats, the spray pipe is connected to the spray port, the component is sprayed out from the slot seat by the air blowing of each air pressure valve selectively started, by the blowing of air and gravity, the sprayed component falls through the pipe and enters the classification storage box under the guidance of the pipeline plate, the component flow path can be selectively directed to the grid plate in response to the signal of the detector indicating that the grid plate lacks components, and the sensor can detect the components in the seat slot that have not yet been sprayed out by the spray manifold.

[0003] Although the prior art of the patent application with announcement number 411735 provides testing and classification collection of capacitive electronic components, the terminal composition of the prior art is to open five hollow slots on a frame, and then set a terminal module in each slot. Since each terminal module is fixed to one side of the slot by a mounting bracket, leaving the other side vacant to provide the necessary space for the terminal above it and the extension end, the space occupied by each terminal module is quite wide. Although the prior art also mentions that the number of slots and terminal modules can be increased, due to the huge obstacle of the vacant area in each slot caused by the design of the terminal module mechanism, if the number of slots and terminal modules is increased, the frame will be quite large and affect the setting of other mechanisms. In view of this, there is room for improvement. Summary of the Invention

[0004] Therefore, an object of the present invention is to provide an electronic component testing device that can adapt to the needs of multiple terminal modules.

[0005] Another object of the present invention is to provide an electronic component testing method that can more specifically consider the inspection requirements of different detection characteristics.

[0006] Another object of the present invention is to provide an electronic component testing device for executing the electronic component testing method.

[0007] The electronic component testing device according to the purpose of the present invention includes: a machine table, which is provided with a machine table top; a supporting chassis, which is provided on the machine table top, and a test plate that can be driven to rotate is provided on the supporting chassis, and a feeding unit, an inspection unit, and a discharge unit are provided outside the periphery of the supporting chassis; wherein, the inspection unit is provided with a first inspection unit, the first inspection unit is provided with a first seat, a plurality of box-shaped first upper terminal boxes arranged in an arc-shaped parallel manner with a spacing, and a plurality of box-shaped first lower terminal boxes respectively arranged in an arc-shaped parallel manner with a spacing; the first upper terminal box is provided with a plurality of first upper terminals arranged in a straight line parallel with a spacing; the first lower terminal box is provided with a plurality of first probes arranged in a straight line parallel with a spacing and can be slightly moved up and down.

[0008] According to another purpose of the present invention, a method for testing electronic components includes: providing a first inspection unit and a second inspection unit. When the component to be tested is located in a slot on a test board and is transported in a clockwise intermittent rotating flow path, it first passes between a second upper terminal box and a second lower terminal box of the second inspection unit to be tested for capacitance, loss or quality factor, and then passes between a first upper terminal box and a first lower terminal box of the first inspection unit to be tested for insulation resistance.

[0009] According to another aspect of the present invention, an electronic component testing device is used to perform the electronic component testing method.

[0010] The electronic component testing device and testing method of the embodiment of the present invention are such that, since each of the first upper terminals and each of the first probes are integrated into a box, the most appropriate installation planning and arrangement can be made for the installed mounts. The spacing between multiple first upper terminal boxes or multiple first lower terminal boxes can be kept close without affecting the progress of the test, so that the corresponding number of first upper terminal boxes and first lower terminal boxes can be increased to meet the needs of multiple terminal modules and provide more tests. In addition, in the testing method, by separating the second inspection unit for testing capacitance, loss or quality factor from the first inspection unit for testing insulation resistance at a distance to form two independent inspection units supported by different mounts, the first and second inspection units with two different detection characteristics (such as power consumption, electrode loss, number of test terminal groups, etc.) can be more specifically considered, so that the components to be tested can be tested more accurately and effectively. BRIEF DESCRIPTION OF THE DRAWINGS

[0011] Figure 1 The present invention is described as a three-dimensional schematic diagram of an electronic component testing device, which is used to illustrate an embodiment of the present invention.

[0012] Figure 2 This is a schematic diagram of the configuration of various mechanisms on the table of the electronic component testing device.

[0013] Figure 3 This is a schematic diagram of the supporting chassis in the electronic component testing device.

[0014] Figure 4 This is a schematic diagram of each block corresponding to each unit in the electronic component testing device.

[0015] Figure 5 It is a schematic diagram of the upper surface of the test board in the electronic component testing device.

[0016] Figure 6 It is a schematic diagram of the lower surface of the test board in the electronic component testing device.

[0017] Figure 7 The figure is a schematic diagram showing the positional relationship of the first inspection unit in the electronic component testing device and the intermittent rotating flow path of the testing plate.

[0018] Figure 8 It is a schematic diagram of the corresponding relationship of one side of the first inspection unit in the electronic component testing device.

[0019] Figure 9 It is a schematic diagram of the lifting frame in the first inspection unit of the electronic component testing device being lifted up.

[0020] Figure 10 It is a schematic diagram of the configuration relationship between the plurality of first upper terminal assemblies and the plurality of first probes in the first inspection unit in the electronic component testing device.

[0021] Figure 11 It is a partially enlarged schematic diagram of the configuration relationship between the plurality of first upper terminal assemblies and the plurality of first probes in the first inspection unit of the electronic component testing device.

[0022] Figure 12 It is a partially exploded perspective view of the first inspection area and a row of first electrodes of the supporting chassis in the electronic component testing device.

[0023] Figure 13 It is a schematic diagram of the positional relationship of the second inspection unit in the electronic component testing device located in the intermittent rotating flow path of the testing plate.

[0024] Figure 14 It is a schematic diagram of the configuration relationship between the plurality of second upper terminal assemblies and the plurality of second probes in the second inspection unit in the electronic component testing device.

[0025] Figure 15 It is a partially enlarged schematic diagram of the configuration relationship between the plurality of second upper terminal assemblies and the plurality of second probes in the second inspection unit of the electronic component testing device.

[0026] Figure 16 It is a three-dimensional exploded schematic diagram of the second inspection block and the second electrode of the supporting chassis in the electronic component testing device.

[0027] Figure 17 It is a bottom schematic diagram of the second inspection area of the supporting chassis in the electronic component testing device.

[0028]

Explanation of symbols

[0029] A: Machine

[0030] A1: Machine table

[0031] A2: Desktop

[0032] A21: Positioning hole

[0033] B: Carrying chassis

[0034] B1: Feeding area

[0035] B11: Feeding suction groove

[0036] B12: Suction hole

[0037] B13: Short arc side

[0038] B14: Long arc side

[0039] B15: front edge

[0040] B16: Back side

[0041] B17: Empty space

[0042] B171: The third suction groove

[0043] B172: Suction hole

[0044] B2: Check Block

[0045] B21: First inspection block

[0046] B211: First Suction Groove

[0047] B212: Suction hole

[0048] B213: ribs

[0049] B214: Shaft Collar

[0050] B215: shaft hole

[0051] B216: Short arc side

[0052] B217: Long arc side

[0053] B218: Front edge

[0054] B219: rear end edge

[0055] B22: Second inspection block

[0056] B221: Second suction groove

[0057] B222: Suction hole

[0058] B223: diaphragm rib

[0059] B224: Shaft Collar

[0060] B225: shaft hole

[0061] B226: Short arc side

[0062] B227: Long arc side

[0063] B228: Front edge

[0064] B229: rear end edge

[0065] B23: Second inspection block

[0066] B3: Eject block

[0067] B31: discharge nozzle

[0068] B32: Suction hole

[0069] B33: Short arc side

[0070] B34: Long arc side

[0071] B35: front edge

[0072] B36: rear edge

[0073] C: Test board

[0074] C1: Seat

[0075] C2: Guide ditch

[0076] C3: Cleaning tank

[0077] C31: Expanded convex interval

[0078] D: Feeding unit

[0079] E: Inspection unit

[0080] E1: First inspection unit

[0081] E11: First stand

[0082] E111: Fixed seat

[0083] E1111: Fixed part

[0084] E1112: Slide

[0085] E1113: Adjustment parts

[0086] E112: Support frame

[0087] E1121: Rail Seat

[0088] E1122: Sliding part

[0089] E1123: Support

[0090] E1124: Elastic parts

[0091] E1125: Adjustment parts

[0092] E1126: Rod

[0093] E1127: Pivot

[0094] E113: Lifting rack

[0095] E1131: yield range

[0096] E1132: Support part

[0097] E1133: Screw

[0098] E1134: Embedded Hole

[0099] E1135: Blocking hole

[0100] E1136: Gasket

[0101] E12: First upper terminal box

[0102] E121: Box cover

[0103] E1211: Fixed cover seat

[0104] E1212: movable cover

[0105] E122: Upper cartridge seat

[0106] E1221: Connecting seat

[0107] E1222: Upper terminal block

[0108] E123: First upper terminal assembly

[0109] E1231: First upper terminal

[0110] E1232: Upper terminal block

[0111] E1233: Elastic parts

[0112] E1234: Conductive sheet

[0113] E1235: Adapter

[0114] E1236: Connectors

[0115] E1237: Cable

[0116] E13: First lower terminal box

[0117] E131: Probe holder

[0118] E132: Lower cassette seat

[0119] E133: First Probe

[0120] E134: Cable

[0121] E135: First electrode

[0122] E2: Second inspection unit

[0123] E21: Second mount

[0124] E211: Base

[0125] E2111: Latch

[0126] E212: Flip seat

[0127] E2121: Positioning hole

[0128] E2122: Grip

[0129] E2123: Screw

[0130] E2124:Pedestal

[0131] E2125: First fine-tuning seat

[0132] E2126: Second fine-tuning seat

[0133] E2127: Fixed bracket

[0134] E2128: Third fine-tuning seat

[0135] E2129: Fine-tuning knob

[0136] E22: Second upper terminal box

[0137] E221: Base plate

[0138] E222: MOSFET Circuits

[0139] E223: Terminal Block

[0140] E224: Second upper terminal assembly

[0141] E2241: Second upper terminal

[0142] E2242: Upper terminal block

[0143] E2243: Blocking parts

[0144] E2244: Elastic parts

[0145] E2245: Conductive sheet

[0146] E2246: Transfer unit

[0147] E2247: Cable

[0148] E23: Second lower terminal box

[0149] E231: Base plate

[0150] E232: MOSFET Circuit

[0151] E233: Probe holder

[0152] E234: Second probe

[0153] E235: Second electrode

[0154] E2351: Electrode

[0155] E2352: Threaded part

[0156] E2353: Adjustment Department

[0157] E236: Electrode holder

[0158] E2361: Fine-tuning hole

[0159] E3: The third inspection unit

[0160] F: Discharge unit

[0161] G: Feeding unit

[0162] H: material guide rack

[0163] K: Collection Agency

[0164] L: radial axis DETAILED DESCRIPTION

[0165] See also Figure 1 、 2As shown, the embodiment of the present invention is illustrated using an electronic component testing device for testing capacitor-type DUTs, but is not limited to implementation in this application. A disc-shaped metal support base B is provided on a machine table A1 inclined approximately 60 degrees on a machine A. A test plate C is mounted on the support base B, which can be driven to rotate intermittently in a clockwise direction. Furthermore, a loading unit D for loading DUTs, an inspection unit E for testing the characteristics of the DUTs, and a discharge unit F for collecting the tested DUTs are disposed outside the periphery of the support base B. A feeding mechanism G for providing the DUTs and a guide rack H for guiding the discharge unit F to a collection mechanism K are disposed on a horizontal machine table A2 of the machine A. The collection mechanism K is disposed on the front side of the machine A, and is configured to accommodate a plurality of magazines K1.

[0166] See also Figure 2 As shown, the inspection unit E is provided with a first inspection unit E1 for performing insulation resistance (commonly known as IR) inspection of the capacitor, and two second inspection units E2 and E3 for performing capacitance, loss or quality factor (commonly known as CD) inspection of the capacitor, which are respectively located before and after the first inspection unit E1 in the direction of intermittent rotation of the test board C; wherein, the second inspection unit E3 located after the first inspection unit E1 in the direction of intermittent rotation can be omitted as needed.

[0167] See also Figure 3 、 4 As shown, the carrier chassis B is composed of a plurality of independently connected but mutually dockable sector-shaped blocks of different sizes, including a feed block B1 corresponding to the feed unit D, an inspection block B2 corresponding to the inspection unit E, and a discharge block B3 corresponding to the discharge unit F. The inspection block B2 is composed of a first inspection block B21 and two second inspection blocks B22 and B23, which are independently connected but mutually dockable. The first inspection block B21 is arranged corresponding to the first inspection unit E1, and the two second inspection blocks B22 and B23 are arranged corresponding to the two second inspection units E2 and E3 respectively.

[0168] The feed block B1 is provided with multiple rows (eight rows in this embodiment) of concentrically arranged arc-shaped feed suction grooves B11 spaced radially apart. Each feed suction groove B11 is provided with multiple hollow suction holes B12 spaced along the bottom of the feed suction groove B11. The suction holes B12 can be connected to a negative pressure source to draw a vacuum, thereby forming a negative pressure vacuum state in the feed suction groove B11. The feed block B1 includes a short arc side B13 and a long arc side B14 parallel to each other, as well as a front side B15 and a rear side B16 that form an angle with each other.

[0169] The first inspection block B21 is provided with a plurality of concentrically arranged rows (eight rows in this embodiment) of radially spaced first suction grooves B211. Each first suction groove B211 is provided with a plurality of hollow suction holes B212 spaced apart along the bottom of the first suction groove B211. The ribs B213 corresponding to the radially linearly arranged first suction grooves B211 are provided with a plurality of rows (sixteen rows in this embodiment) of spaced-apart shaft rings B214 made of insulating material, each of which is spaced apart and located on the fan-shaped radial axis. Each shaft ring B214 is provided with an axial hole B215. The suction holes B212 can be connected to a negative pressure source to draw a vacuum, thereby forming a negative pressure vacuum state in the first suction groove B211. The first inspection block B211 includes a short arc side B216 and a long arc side B217 parallel to each other, and a front side B218 and a rear side B219 forming an angle with each other.

[0170] The second inspection block B22 is provided with multiple rows (eight rows in this embodiment) of concave annular arc-shaped second suction grooves B221 arranged concentrically at intervals in the radial direction. Each second suction groove B221 is provided with a plurality of hollow suction holes B222 spaced apart along the bottom of the second suction groove B221. The partition ribs B223 corresponding to each other between two second suction grooves B221 arranged in a radial straight line are provided with only one row of shaft rings B224 made of insulating material, each shaft ring B224 having an axial hole B225. The shaft rings B224 in each row are located on the radial axis L in the center of the fan shape. The suction holes B222 can be connected to a negative pressure source to draw a vacuum, so that a negative pressure vacuum state is formed in the second suction grooves B221. The second inspection block B22 includes a short arc side B226 and a long arc side B227 parallel to each other, and a front end side B228 and a rear end side B229 forming an angle with each other.

[0171] The second inspection block B23 has the same structure as the second inspection block B22, and the same reasoning can be applied, so the details are not repeated here. However, when the second inspection unit E3 is omitted as described above, the second inspection block B23 can be Figure 3 As shown, the shaft ring B224 and the shaft hole B225 in the second inspection block B22 are omitted;

[0172] The discharge block B3 is provided with multiple rows (eight rows in this embodiment) of concave annular arc-shaped discharge suction grooves B31 arranged concentrically at intervals in the radial direction. Each discharge suction groove B31 is provided with multiple hollow suction holes B32 spaced apart along the bottom of the discharge suction groove B31. The suction holes B32 can be connected to a negative pressure source to draw a vacuum, thereby forming a negative pressure vacuum state in the discharge suction groove B31. The discharge block B3 includes a short arc side B33 and a long arc side B34 parallel to each other, as well as a front side B35 and a rear side B36 forming an angle with each other.

[0173] The first suction groove B211 on the first inspection block B21 is connected to the second suction groove B221 on the second inspection blocks B22 and B23 when they are combined, but is not connected to the feeding suction groove B11 on the feeding block B1 and the discharge suction groove B31 on the discharge block B3 when they are combined; the feeding suction groove B11 on the feeding block B1 leaves a blank portion B17 at the rear end, and the blank portion B17 is provided with a small third suction groove B171 which is connected to the second suction groove B221 on the second inspection block B22 when they are combined, and a hollow suction hole B172 is provided in the third suction groove B171.

[0174] See also Figure 3 、 5 As shown, the upper surface of the test board C is provided with a plurality of rows (8 rows in this embodiment) of concentric ring-shaped hollow rectangular seat grooves C1 spaced apart in the radial direction. A plurality of the seat grooves C1 are arranged in a ring-shaped manner at intervals in each row, and the seat grooves C1 corresponding to each row are arranged in a straight line at intervals in a plurality of rows; each seat groove C1 can accommodate a component to be tested, such as a capacitor-type electronic component, with electrodes respectively located at the upper and lower ends of the component to be tested. Figure 5 The feeding unit D is placed in the seat groove C1.

[0175] See also Figure 3 、 6 , a concave guide groove C2 is formed at the bottom of each seat groove C1 on the lower surface of the test plate C, and each guide groove C2 is connected to the feed suction groove B11, the first suction groove B211, the second suction groove B221, and the discharge suction groove B31 of the supporting chassis B when the test plate C is intermittently rotated, so that the negative pressure can be introduced through the suction holes B12, the suction holes B1213, the suction holes B1223, and the suction holes B32 in the supporting chassis B during vacuuming. The suction groove B221 and the discharge suction groove B31 adsorb the objects to be tested (capacitor-type electronic components in this embodiment) accommodated in each seat groove C1; a long concave cleaning groove C3 is formed between two rows of seat grooves C1 on the lower surface of the test board C, and a convex area C31 is formed near each seat groove C1 toward the seat groove C1. The cleaning groove C3 is used to accommodate powder generated by friction between the lower surface of the test board C and the supporting chassis B during long-term operation to avoid clogging the bottom aperture of the seat groove C1.

[0176] See also Figures 7-9As shown, the first inspection unit E1 is provided with a first frame E11, a plurality of box-shaped first upper terminal boxes E12 arranged in an arc-shaped parallel manner at intervals on the first frame E11, and a plurality of box-shaped first lower terminal boxes E13 respectively arranged in an arc-shaped parallel manner at intervals below each of the first upper terminal boxes E12; wherein,

[0177] The first seat E11 is provided with a fixed seat E111, a support frame E112 which can move up and down relative to the fixed seat E111, and a lifting frame E113 which can be lifted up or dropped down; the fixed seat E111 is provided with a fixed portion E1111 which is horizontally arranged with the machine table A1 and a slide seat E1112 which is vertically arranged with the machine table A1, and one side of the fixed portion E1111 is provided with two adjusting members E1113 which are composed of bolts, and the two adjusting members E1113 are arranged on the left and right with a distance and are screwed to the fixed seat E1111. Figure 1 The fine-tuning fixing portion A11 on the machine table A1 can fine-tune the left and right tilt positioning of the entire first seat E11; the support frame E112 is provided with a rail seat E1121 arranged parallel to the slide E1112, and the rail seat E1121 is provided with a sliding portion E1122 so that the rail seat E1121 can slide up and down relatively on the slide E1112. The support frame E112 is provided with a support portion E1123 parallel to the machine table A1 on the other side of the rail seat E1121 relative to the fixed portion E1111, and the lower end of the sliding portion E1122 is supported by an elastic member E1124 composed of a spring, so that the support portion E1123 maintains a predetermined height positioning; the support frame E112 and the rail seat E1121 are relative to the fixed portion E1111. A knob-like adjustment piece E1125 is provided on the same side of the part E1111. The adjustment piece E1125 is screwed to the fixing seat E111 with a threaded rod E1126. By rotating and adjusting the adjustment piece E1125, the support frame E112 can be moved up and down; the lifting frame E113 is pivoted to a pivotal portion E1127 on the support frame E112 and can be lifted or placed on the support portion E1124. The support portion E1124 is provided with a return interval E1131 which is arc-shaped and recessed from one side toward the fixing seat E11, so that a left and right support portion E1132 are formed on both sides of the return interval E1131. Each support portion E1132 is respectively provided with a screw E1133, which can screw the lifting frame E113 and the support portion E1124 into position.

[0178] See also Figure 7 、 10As shown in Figure 11, each of the first upper terminal boxes E12 is respectively arranged on the lifting frame E113 of the first base frame E11 and is located above the test board C; each of the first upper terminal boxes E12 is provided with a box cover E121 located above the lifting frame E113 and an upper box seat E122 located below the lifting frame E113; the upper end of the upper box seat E122 is embedded in an embedding hole E1134 of the lifting frame E113, and the lifting frame E113 is covered with a cushion member E1136 on which a plurality of blocking holes E1135 corresponding to the embedding holes E1134 are provided. The aperture 135 is smaller than the aperture of the embedding hole E1134, so that the upper end of the upper box seat E122 can be stopped and positioned; the box cover E121 includes a fixed cover seat E1211 located on one side and fixed on the cushion E1136, and a movable cover seat E1212 located on the other side and detachably arranged on the side of the fixed cover seat E1211; the upper box seat E122 includes a connecting seat E1221 located on the top and an upper terminal seat E1222 located on the bottom, and the connecting seat E1221 is embedded in the embedding hole E1134; the upper box seat E122 is provided with a plurality of spaced-apart spaces. There are 8 first upper terminal assemblies E123 arranged in a straight line, and each of the first upper terminal assemblies E123 is provided with, in order from bottom to top, a first upper terminal E1231 consisting of a rotatable wheel body located above the test board C, an upper terminal seat E1232 located in a cavity E1222 recessed on the upper box seat E122 for mounting the first upper terminal E1231, an elastic member E1233 consisting of a spring located above the upper terminal seat E1232 in the cavity E1222 to provide an elastic driving force for the first upper terminal E1231 to move up and down, and a spring having one end connected to the first upper terminal E1231. A conductive sheet E1234 in the form of an elongated sheet connected to and electrically connected to an upper terminal E1231; an adapter E1235 securing the other end of the conductive sheet E1234; a connector E1236 located in the connector base E1221, one end of which is electrically connected to the other end of the conductive sheet E1234 at the adapter E1235, and the other end of which protrudes into the box cover E121; and an electrical cable E1237 in the box cover E121, which is welded to the connector E1236 and extends through a cable hole E1213 in the box cover E121 to the outside of the first upper terminal box E12.

[0179] Each of the first lower terminal boxes E13 is respectively arranged below the supporting chassis B. The first lower terminal box E13 includes a probe seat E131 located above and a lower box seat E132 located below the probe seat E131. The probe seat E131 is provided with a plurality of (8 in this embodiment) first probes E133 that are spaced apart and arranged in a straight line and parallel to each other and are elastically acted upon (a spring is provided in the probe, not shown in the figure) and can move slightly up and down. One end of the lower side of each first probe E133 is welded in the lower box seat E132 and is connected to a cable E134 that extends through a cable hole E1321 on the lower box seat E132 to the outside of the lower box seat E132; please refer to Figures 11-12 The upper end of each first probe E133 presses against the bottom end of a first electrode E135. The first electrode E135 is rod-shaped and is welded to the corresponding shaft hole B215 on the first inspection block B21 of the supporting chassis B so as not to be displaceable. The upper end surface of the first electrode E135 presses against Figure 6 Below the seat groove C1 on the test board C.

[0180] See also Figures 13-15 As shown, the second inspection unit E2 has the same structure as E3, and the same logic can be used to explain the second inspection unit E2 below. The second inspection unit E2 is provided with a second frame E21, a second upper terminal box E22 in the shape of a box provided on the second frame E21, and a second lower terminal box E23 in the shape of a box provided below the second upper terminal box E22.

[0181] The second frame E21 is provided on the machine table A1 with a base E211, the base E211 is provided with a latch E2111 located on one side for X-axis pulling displacement, a lift base E212 located on the upper surface and pivotally provided with the base E211 on the other side relative to the second upper terminal box E22; the lift base E212 is provided with a positioning hole E2121 located on one side for inserting the latch E2111 when lifting, a handle E2122 located on the upper surface of the lift base E212 in the Z-axis direction for gripping the lift base E212 to lift it to one side, a screw E2123 located on the upper surface of the lift base E212 for locking the lift base E212 to the base E211, and a screw E2123 located on the upper surface of the lift base E212 for locking the lift base E212 to the base E211. A vertical pedestal E2124, with a first fine-tuning seat E2125 for fine-tuning the X-axial displacement of the pedestal E2124 and a second fine-tuning seat E2126 for fine-tuning the Y-axial displacement of the pedestal E2124 provided between the bottom of the pedestal E2124 and the lift base E212. A fixing bracket E2127 for fixing the second upper terminal box E22 is provided on one side of the pedestal E2124. A third fine-tuning seat E2128 for fine-tuning the Y-axial displacement of the fixing bracket E2127 is provided between one side of the pedestal E2124 and the fixing bracket E2127. The third fine-tuning seat E2128 is also provided with a fine-tuning knob E2129 with a scale for fine-tuning the height of the spacing between the second upper terminal box E22 and the upper surface of the test board C;

[0182] The second upper terminal box E22 is provided with a bottom plate E221 for fixing with the fixing frame E2127, the bottom plate E221 is provided with a group of MOSFET circuits E222 composed of circuits on multiple printed circuit boards at the top and a terminal seat E223 at the bottom, the terminal seat E223 is provided with multiple (8 in this embodiment) second upper terminal components E224 arranged in parallel at intervals, each second upper terminal component E224 is provided with a second upper terminal E2241 composed of a rolling wheel body located above the test board C, an upper terminal located in a recessed cavity E2231 on the terminal seat E223 for installing the second upper terminal E2241, and a plurality of (8 in this embodiment) second upper terminal components E224 arranged in parallel at intervals. a base E2242; a stopper E2243 having one end fixed to the upper terminal base E2242 and the other end maintaining a distance from the inner upper edge of the cavity E2231 to limit the upper dead point of the second upper terminal E2241; an elastic member E2244 composed of a spring located above the upper terminal base E2242 in the cavity E2231 and providing an upward and downward elastic driving force for the second upper terminal E2241; a slender sheet-like conductive piece E2245 having one end connected to and electrically connected to the second upper terminal E2241; an adapter E2246 securing the other end of the conductive piece E2245; and a cable E2247 integrally welded to the adapter E2246 and connected to the MOSFET circuit E222.

[0183] The second lower terminal box E23 is arranged below the carrier chassis B. The second lower terminal box E23 is provided with a bottom plate E231. The bottom plate E231 is provided with a group of MOSFET circuits E232 composed of circuits on multiple printed circuit boards at the bottom and a probe base E233 at the top. The probe base E233 is provided with multiple (8 in this embodiment) second probes E234 that are arranged in parallel at intervals and are subject to elastic action (springs are provided in the probes, not shown in the figure) and can move up and down slightly. Please refer to Figures 15-17 The upper end of each second probe E234 is respectively pressed against the bottom end of a second electrode E235. The second electrode E235 is rod-shaped and has an electrode portion E2351, a threaded portion E2352 with an external thread, and an adjustment portion E2353 with a hexagonal cross-section (or an internal hexagonal recess) for turning a tool for fine-tuning up and down. An electrode holder E2353 is provided below the corresponding shaft hole B215 on the second inspection block B22 of the supporting chassis B. 36, the electrode holder E236 is provided with a fine-tuning hole E2361 with an internal thread corresponding to the axial hole B225 on the second inspection block B22 of the carrier chassis B, and the second electrode E235 is screwed into the fine-tuning hole E2361 of the electrode holder E236 with the threaded portion E2352, and the electrode portion E2351 extends through the corresponding axial hole B225 on the second inspection block B22 of the carrier chassis B, and the upper end surface of the electrode portion E2351 is abutted against Figure 6 Below the seat groove C1 on the test board C.

[0184] Taking the capacitor-type component to be tested as an example, when the component to be tested is located in the seat groove C1 on the test board C and is transported in an intermittent clockwise rotating flow path, it first passes between the second upper terminal E2241 and the second electrode E235 of the second inspection unit E2 to test the capacitance, loss or quality factor (commonly known as CD) of the capacitor, and then passes between the first upper terminal E1231 and the first electrode E135 of the first inspection unit E1 to test the insulation resistance (commonly known as IR) of the capacitor, and then passes through the second inspection unit E3 as needed to perform another capacitance, loss or quality factor test of the capacitor; wherein, since the first inspection unit E1 has multiple sets of corresponding first upper terminal boxes E12 and first lower terminal boxes E13, when performing the insulation resistance test of the capacitor, multi-stage testing can be performed in the form of charging, charging, testing and discharging for each four sets.

[0185] Since the first inspection unit E1 is used to check the insulation resistance of the test capacitor, the test power is relatively low, and the first electrode E135 has less loss, so it is welded to the shaft hole B215 corresponding to the carrier chassis B and cannot be displaced. However, the second inspection unit E3 is used to test the capacitance, loss or quality factor of the capacitor, and its test power is higher. Therefore, the design allows the second electrode E235 to be fine-tuned up and down to make relative displacement with the shaft hole B225 on the second inspection block B22 of the carrier chassis B to adapt to the second electrode E235 needing to cope with higher loss!

[0186] In the electronic component testing device of the embodiment of the present invention, since each of the first upper terminals E1231 and each of the first probes E133 are integrated into a box, the most appropriate installation planning and arrangement can be made for the provided mount E11, and the spacing between multiple first upper terminal boxes E12 or multiple first lower terminal boxes E13 can be kept close without affecting the progress of the test, so that the corresponding number of first upper terminal boxes E12 and first lower terminal boxes E13 can be increased to meet the needs of multiple terminal modules and provide more tests; in addition, in the testing method, the second inspection unit E2 for testing capacitance, loss or quality factor is separated from the first inspection unit E1 for testing insulation resistance by a distance to form two independent inspection units supported by different mounts E21 and E11, so that the first and second inspection units E1 and E2 with two different detection characteristics (such as power consumption, electrode loss, number of test terminal groups, etc.) can be more specifically considered, so that the components to be tested can be tested more accurately and effectively.

[0187] The above descriptions are merely embodiments of the present invention and should not be used to limit the scope of implementation of the present invention. Any simple equivalent changes and modifications made in accordance with the scope of the patent application and the contents of the patent specification of the present invention are still within the scope of the patent of the present invention.

Claims

1. An electronic component testing device, comprising: A machine platform with a machine table provided thereon; A supporting chassis is provided on the table of the machine. A test plate that can be driven to rotate is provided on the supporting chassis. A feeding unit, an inspection unit, and a discharge unit are provided outside the periphery of the supporting chassis. The inspection unit is provided with a first inspection unit, the first inspection unit is provided with a first frame, a plurality of box-shaped first upper terminal boxes arranged in an arc-shaped parallel manner with a spacing therebetween on the first frame, and a plurality of box-shaped first lower terminal boxes respectively arranged in an arc-shaped parallel manner with a spacing therebetween below each of the first upper terminal boxes; the first upper terminal box is provided with a plurality of first upper terminals arranged in a straight line with a spacing therebetween; the first lower terminal box is provided with a plurality of first probes arranged in a straight line with a spacing therebetween and capable of slight movement up and down; The inspection unit is also provided with a second inspection unit, which is provided with a second mount, a box-shaped second upper terminal box arranged on the second mount, and a box-shaped second lower terminal box correspondingly arranged below the second upper terminal box; the second upper terminal box is provided with a plurality of second upper terminals arranged in a straight line and parallel to each other with a distance between them; the second lower terminal box is provided with a plurality of second probes arranged in a straight line and parallel to each other with a distance between them and can be slightly moved up and down.

2. The electronic component testing device according to claim 1, wherein: The first seat frame is provided with a fixing seat, a supporting frame which can move up and down relative to the fixing seat, and a lifting frame which can be lifted up and down or placed.

3. The electronic component testing device according to claim 2, wherein: The fixing seat is provided with a fixing portion horizontally arranged with respect to the machine table surface and a sliding seat vertically arranged with respect to the machine table surface. The supporting frame is provided with a rail seat arranged parallel with the sliding seat. The rail seat is provided with a sliding portion so that the rail seat can slide up and down relatively on the sliding seat. The supporting frame is provided with a supporting portion parallel to the machine table surface on the other side of the fixing portion above the rail seat.

4. The electronic component testing device according to claim 3, wherein: The lower end of the sliding part is supported by an elastic member so that the support part is kept at a predetermined height. An adjusting member is provided on the same side of the support frame and the rail seat relative to the fixed part. The adjusting member is screwed to the fixed seat with a threaded rod. By rotating and adjusting the adjusting member, the support frame can be moved up and down.

5. The electronic component testing device according to claim 2, wherein: Two adjusting parts composed of bolts are provided on one side of a fixing part. The two adjusting parts are arranged on the left and right sides with a spacing and can mutually fine-tune the left and right tilt positioning of the first seat frame with the help of a fine-tuning fixing part screwed on the machine table.

6. The electronic component testing device according to claim 2, wherein: The lifting frame is pivotally connected to a pivotal portion on the support frame and can be lifted or placed on the support portion. The support portion is provided with a return interval that is arc-shaped and recessed from one side toward the fixed seat side. A left and right support portion are formed on both sides of the return interval. Each support portion is respectively provided with a screw fixing member, which can screw the lifting frame and the support portion into position.

7. The electronic component testing device according to claim 2, wherein: The first upper terminal box is provided with a box cover located above the lift frame and an upper box seat located below the lift frame. The upper end of the upper box seat is embedded in an embedding hole of the lift frame. The lift frame is covered with a pad having a plurality of blocking holes corresponding to the embedding holes. The diameter of the blocking holes is smaller than the diameter of the embedding holes, so that the upper end of the upper box seat can be stopped and positioned.

8. The electronic component testing device according to claim 7, wherein: The box cover comprises a fixed cover seat located on one side and fixedly arranged on the cushion component, and a movable cover seat located on the other side and detachably arranged on the side of the fixed cover seat.

9. The electronic component testing device according to claim 7, wherein: The upper box seat comprises a connecting seat located at the upper side and an upper terminal seat located at the lower side, and the connecting seat is embedded in the embedding hole.

10. The electronic component testing device according to claim 7, wherein: The upper box seat is provided with a plurality of first upper terminal assemblies arranged in parallel in a straight line with a spacing therebetween. The first upper terminal assembly is provided with, from bottom to top, the first upper terminal located above the test board, an upper terminal seat located in a recessed cavity provided on the upper box seat for mounting the first upper terminal, an elastic member located above the upper terminal seat in the cavity for providing an elastic driving force for the first upper terminal up and down, a conductive sheet connected to and electrically connected with the first upper terminal at one end, a transition portion fixed to the other end of the conductive sheet, a connector having one end electrically connected with the other end of the conductive sheet at the transition portion and the other end protruding from the box cover, and a cable welded to the connector in the box cover and extending to the outside of the first upper terminal box through a cable hole on the box cover.

11. The electronic component testing device according to claim 1, wherein: One end of the first probe is pressed against the bottom end of a first electrode. The upper end of the first electrode is pressed against a groove on the test board. The first electrode is rod-shaped and is welded to an axial hole corresponding to the supporting chassis and cannot be displaced.

12. The electronic component testing device according to claim 1, wherein: The second inspection units are provided with two, and are respectively located in front of and behind the first inspection unit in the direction in which the test plate intermittently rotates.

13. The electronic component testing device according to claim 1, wherein: The supporting chassis is composed of a plurality of sector-shaped blocks of different sizes that are independent of each other but can be docked and combined with each other, including an inspection block arranged corresponding to the inspection unit, wherein the inspection block is composed of a first inspection block and a second inspection block that are independent of each other but can be docked and combined with each other, wherein the first inspection block is arranged corresponding to the first inspection unit, and the second inspection block is arranged corresponding to the second inspection unit.

14. The electronic component testing device according to claim 1, wherein: The second frame is provided with a base on the machine table, the base having a latch on one side capable of being pulled out in the X-axis direction, and a lift seat on the upper surface and pivotally connected to the base on the other side of the second upper terminal box; The lift seat is provided with a positioning hole located on one side for inserting the pin when it is lifted, a handle located on the upper surface of the lift seat in the Z-axis direction for gripping the lift seat to lift it to one side, a screw located on the upper surface of the lift seat for locking the lift seat to the base, and a vertical platform located on the upper surface of the lift seat. A first fine-tuning seat for fine-tuning the X-axial displacement of the seat and a second fine-tuning seat for fine-tuning the Y-axial displacement of the seat are provided between the bottom of the platform and the lift seat. A fixing frame for fixing the second upper terminal box is provided on one side of the platform. A third fine-tuning seat for fine-tuning the Y-axial displacement of the fixing frame is provided between one side of the platform and the fixing frame. The third fine-tuning seat is also provided with a fine-tuning knob with a scale for fine-tuning the height of the spacing between the second upper terminal box and the upper surface of the test board.

15. The electronic component testing device according to claim 1, wherein: The second upper terminal box is provided with a bottom plate, a group of MOSFET circuits are located on the top of the bottom plate and a terminal seat is located on the bottom. The terminal seat is provided with a plurality of second upper terminal components arranged in parallel in a straight line at intervals.

16. The electronic component testing device according to claim 15, wherein: The second upper terminal assembly is provided with the second upper terminal located above the test board in sequence from bottom to top, an upper terminal seat located in a recessed cavity provided on the terminal seat for mounting the second upper terminal, an elastic member located above the upper terminal seat in the cavity for providing an elastic driving force for the second upper terminal to move up and down, a stopper with one end fixed to the upper terminal seat and the other end maintaining a distance from the upper edge of the cavity to limit the upper dead point of the second upper terminal, a conductive sheet with one end connected to the second upper terminal and electrically conductive, a transfer portion to fix the other end of the conductive sheet, and a cable welded to the transfer portion and connected to the MOSFET circuit.

17. The electronic component testing device according to claim 1, wherein: The second lower terminal box is provided with a bottom plate, on which a group of MOSFET circuits are located below and a probe seat is located above. The probe seat is provided with a plurality of second probes which are arranged in parallel in a straight line at intervals and can move slightly up and down under elastic action.

18. The electronic component testing device according to claim 17, wherein: The upper end of the second probe is respectively pressed against the bottom end of a second electrode. The second electrode is rod-shaped and has an electrode portion, a threaded portion with an external thread, and an adjustment portion that can be turned by a tool for fine adjustment.

19. The electronic component testing device according to claim 1, wherein: An electrode holder is provided below an axial hole of the supporting chassis. The electrode holder is provided with a fine-tuning hole corresponding to the axial hole of the supporting chassis and having an internal thread therein. A second electrode is screwed into the fine-tuning hole of the electrode holder with a threaded portion, and an electrode portion extends through the axial hole corresponding to the supporting chassis, and the upper end surface of the electrode portion is abutted against the bottom of a groove on the test plate.

20. A method for testing electronic components, using the electronic component testing device as described in claim 1, the first inspection unit is used to perform insulation resistance inspection of the capacitor, and the second inspection unit is used to perform capacitance, loss or quality factor inspection of the capacitor. When the component to be tested is located in a slot on the test board and is transported by an intermittent rotating flow path, it first passes between the second upper terminal box and the second lower terminal box of the second inspection unit to be tested for capacitance, loss or quality factor, and then passes between the first upper terminal box and the first lower terminal box of the first inspection unit to be tested for insulation resistance.

21. The electronic component testing method according to claim 20, wherein: After the first inspection unit has inspected, the second inspection unit is used to perform another capacitance, loss or quality factor test.

22. The electronic component testing method according to claim 20, wherein: The first inspection unit has a plurality of corresponding first upper terminal boxes and first lower terminal boxes. When performing insulation resistance testing, a multi-stage test is performed in which each four groups are charged, charged, tested, and discharged.

23. The electronic component testing method according to claim 20, wherein: A first electrode of the first inspection unit is welded to an axial hole corresponding to a supporting chassis and cannot be displaced. A second electrode of the second inspection unit can be fine-tuned up and down to move relative to an axial hole of the supporting chassis.

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