X-ray exposure detection method and x-ray exposure detection system

Abstract

An X-ray exposure detection method and an X-ray exposure detection system, the X-ray exposure detection method comprising the following steps: in a first mode, comparing, by a processor of a flat panel sensor, a first image and a second image stored in a memory of the flat panel sensor to generate a comparison result, the first image and the second image being obtained by the flat panel sensor sensing; in the first mode, determining, by the processor, whether the comparison result exceeds a preset threshold; if the comparison result exceeds the preset threshold, switching, by the processor, the first mode of the flat panel sensor to a second mode; in the second mode, reading, by the processor, a third image and a fourth image stored in the memory, the third image and the fourth image being obtained by the flat panel sensor being irradiated by X-rays; and in the second mode, transmitting, by the processor, the third image and the fourth image stored in the memory to an external system.

Description

Technical Field

[0001] This case relates to a sensing device and method. More specifically, it relates to an X-ray exposure detection method and an X-ray exposure detection system. Background Technology

[0002] In existing X-ray equipment, an additional radiation dosimeter or embedded light sensor is usually required to detect the time it takes for X-rays to strike the flat panel sensor. In other words, additional hardware is needed to detect the X-ray strike.

[0003] Next, if the X-ray equipment needs to be used in the fields of wireless communication or waterproofing, the additional hardware will result in additional production costs, and additional designs will be required to prevent water from entering the additional hardware.

[0004] Therefore, the above-mentioned technologies still have many shortcomings, and practitioners in this field need to develop other suitable X-ray exposure detection designs. Summary of the Invention

[0005] One aspect of this case relates to an X-ray exposure detection method. The X-ray exposure detection method includes the following steps: in a first mode, the processor of a flat panel sensor compares a first image and a second image stored in the memory of the flat panel sensor to generate a comparison result, wherein the first image and the second image are obtained by the flat panel sensor; in the first mode, the processor determines whether the comparison result exceeds a preset threshold; if the comparison result exceeds the preset threshold, the processor switches the first mode of the flat panel sensor to a second mode; in the second mode, the processor reads a third image and a fourth image stored in the memory, wherein the third image and the fourth image are obtained by the flat panel sensor being irradiated by X-rays; and in the second mode, the processor transmits the third image and the fourth image stored in the memory to an external system.

[0006] Another aspect of this case relates to an X-ray exposure detection system, including a flat panel sensor. The flat panel sensor includes a sensing array, a memory, and a processor. The sensing array is used for light sensing to obtain a first image and a second image. The sensing array is also used to sense X-rays from an X-ray generator to generate a third image and a fourth image. The processor is coupled to the memory and the sensing array and is used to compare the first image and the second image in a first mode to generate a comparison result. In the first mode, the processor determines whether the comparison result exceeds a preset threshold. If the comparison result exceeds the preset threshold, the processor switches the flat panel sensor from the first mode to a second mode. In the second mode, the processor reads the third image and the fourth image stored in the memory by the sensing array and transmits the third image and the fourth image stored in the memory to an external system. Attached Figure Description

[0007] The following paragraphs describing the implementation methods and the diagrams below will provide a better understanding of the content of this case:

[0008] Figure 1 The circuit block diagram of an X-ray exposure detection system illustrated according to some embodiments of this case is shown below.

[0009] Figure 2 This is a flowchart illustrating the steps of an X-ray exposure detection method according to some embodiments of this case;

[0010] Figure 3 This is a schematic diagram of signal waveforms illustrating the actual operation of an X-ray exposure detection method according to some embodiments of this case;

[0011] Figures 4A to 4F This is a schematic diagram of the region of interest of an X-ray exposure detection method according to some embodiments of this case;

[0012] Figure 5A A schematic diagram of the data state of a first mode of an X-ray exposure detection method according to some embodiments of this case; and

[0013] Figure 5B This is a schematic diagram of the data state of a second mode of an X-ray exposure detection method according to some embodiments of this case.

[0014] Figure label:

[0015] 100: X-ray exposure inspection system

[0016] 110: Flat Panel Sensor

[0017] 111: Memory

[0018] 112: Processor

[0019] 113: Sensor Array

[0020] 120: X-ray generator

[0021] 900: External System

[0022] O: Target object

[0023] 200: Method

[0024] 210-250: Steps

[0025] I1~I3: Stages

[0026] I21~I22: Sub-stage

[0027] XRAY: X-ray signal

[0028] Readout: Reads signals

[0029] Reset: Reset signal

[0030] ROI: Alignment result signal

[0031] Transfer: Control signal

[0032] Frame M to Frame M+4: Images

[0033] Frame N to Frame N+4: Images Detailed Implementation

[0034] The spirit of this case will be clearly explained below with diagrams and detailed description. Anyone skilled in the art can make changes and modifications based on the technology taught in this case after understanding the embodiments of this case, without departing from the spirit and scope of this case.

[0035] The terminology used herein is for the purpose of describing specific embodiments only and is not intended to limit the scope of this work. Singular forms such as “a,” “this,” “this,” “the,” and “the” as used herein also include plural forms.

[0036] The terms “include,” “including,” “have,” “contain,” etc., used in this article are all open-ended terms, meaning that they include but are not limited to.

[0037] Unless otherwise specified, the terms used herein generally have their ordinary meaning in the context of the art, the subject matter, and the specific content of this case. Certain terms used to describe this case will be discussed below or elsewhere in this specification to provide additional guidance to those skilled in the art in describing the case.

[0038] Figure 1 The diagram shows a circuit block representation of an X-ray exposure detection system 100 according to some embodiments of this invention. In some embodiments, please refer to... Figure 1 The X-ray exposure detection system 100 includes a flat panel sensor 110 and an X-ray generator 120.

[0039] In some embodiments, the X-ray exposure detection system 100 may be an X-ray machine, a mobile X-ray machine, a digital mammography system, or an oral X-ray machine. It should be noted that the types of X-ray exposure detection systems 100 are not limited to the examples listed in the embodiments of this case.

[0040] In some embodiments, the flat panel sensor 110 includes a memory 111, a processor 112, and a sensing array 113. The sensing array 113 is used for light sensing to obtain a first image and a second image. The sensing array 113 is used to sense X-rays from the X-ray generator 120 to generate a third image and a fourth image. The processor 112 is coupled to the memory 111 and the sensing array 113, and is used to compare the first image and the second image in a first mode to generate a comparison result. The processor 112 is used to determine in the first mode whether the comparison result exceeds a preset threshold.

[0041] Next, if the comparison result exceeds the preset threshold, the processor 112 switches the first mode of the flat panel sensor 110 to the second mode. In the second mode, the processor 112 reads the third and fourth images stored in the memory 111 by the sensing array 113. In the second mode, the processor 112 transmits the third and fourth images stored in the memory 111 to the external system 900.

[0042] In some embodiments, please refer to Figure 1 The sensing array 113 includes multiple sensing pixels (not shown in the figure). The multiple sensing pixels (not shown in the figure) are respectively disposed on multiple sensing pixel rows and multiple pixel sensing columns of the sensing array 113.

[0043] In some embodiments, the external system 900 may be a computer, tablet computer, or server. The external system 900 is used to read the images captured by the X-ray exposure detection system 100 for analysis or for reference by medical personnel.

[0044] In some embodiments, the target object O may be a skeletal structure, hard structure, or diseased soft structure of the human body. For example, the target object O may be a rib in the chest cavity, a tooth in the mouth, or breast tissue from breast cancer. It should be noted that the target object O is not limited to the examples listed in the embodiments of this case.

[0045] Figure 2 This is a schematic flowchart illustrating the steps of an X-ray exposure detection method 200 according to some embodiments of this invention. In some embodiments, the X-ray exposure detection method 200 may be performed by... Figure 1 The X-ray exposure detection system is implemented by Institute 100.

[0046] In step 210, the flat panel sensor enters a first mode to read the first image and the second image from the flat panel sensor's memory.

[0047] In some embodiments, please refer to Figure 1 and Figure 2The flat panel sensor 110 of the X-ray exposure detection system 100 enters a first mode, whereby the processor 112 of the X-ray exposure detection system 100 reads a first image and a second image from the memory 111 of the flat panel sensor 110. It should be noted that the first image and the second image are images captured by the sensing array 113 of the flat panel sensor 110 through light sensing. Specifically, the images of the flat panel sensor 110 can be read line by line, column by column, or the sensing array 113 of the flat panel sensor 110 can be divided into multiple regions of interest, and images of each region of interest can be read separately.

[0048] In step 220, it is determined whether the grayscale values ​​of the regions of interest in the first image and the second image exceed a preset threshold.

[0049] In some embodiments, please refer to Figure 1 and Figure 2 The flat panel sensor 110 determines whether the grayscale values ​​of the regions of interest in the first and second images exceed a preset threshold, thereby generating a comparison result.

[0050] If the comparison result shows that the grayscale values ​​of the regions of interest in the first image and the second image do not exceed a preset threshold, then step 210 is executed by the processor 112 of the flat panel sensor 110. If the comparison result shows that the grayscale values ​​of the regions of interest in the first image and the second image exceed a preset threshold, then step 230 is executed by the processor 112 of the flat panel sensor 110.

[0051] In some embodiments, the first mode is a rolling mode. In the first mode, the processor 112 of the flat panel sensor 110 continuously reads the first image and the second image from the memory 111, and determines whether the grayscale value of the region of interest in the first image and the second image exceeds a preset threshold.

[0052] It should be noted that in the first mode, by continuously reading the first image and the second image from the memory 111 by the processor 112 of the flat panel sensor 110, the charge accumulated by multiple sensing pixels of the sensing array 113 of the flat panel sensor 110 can be continuously cleared, thereby reducing the image transmission delay.

[0053] In step 230, the flat panel sensor enters the second mode to read the third and fourth images from the flat panel sensor's memory.

[0054] In some embodiments, please refer to Figure 1 and Figure 2If the comparison result shows that the gray values ​​of the regions of interest of the first image and the second image exceed a preset threshold, the processor 112 of the flat panel sensor 110 switches the first mode of the flat panel sensor 110 to the second mode, so as to read the third image and the fourth image in the memory 111 of the flat panel sensor 110 in the second mode.

[0055] In step 240, it is determined whether the grayscale values ​​of the regions of interest in the third and fourth images exceed a preset threshold.

[0056] In some embodiments, please refer to Figure 1 and Figure 2 Next, if the grayscale values ​​of the regions of interest in the third and fourth images read by the processor 112 of the flat panel sensor 110 still exceed the preset threshold, then the processor 112 of the flat panel sensor 110 executes step 240. If the grayscale values ​​of the regions of interest in the third and fourth images read by the processor 112 of the flat panel sensor 110 do not exceed the preset threshold, then the processor 112 of the flat panel sensor 110 executes step 210 to switch the second mode back to the first mode.

[0057] In step 250, the third and fourth images stored in the memory are transferred to an external system.

[0058] In some embodiments, please refer to Figure 1 and Figure 2 If the grayscale values ​​of the regions of interest in the third and fourth images read by the processor 112 of the flat panel sensor 110 exceed a preset threshold, the third and fourth images in the transfer memory 111 of the flat panel sensor 110 are transferred to the external system 900 by the processor 112 of the flat panel sensor 110.

[0059] It should be noted that the third and fourth images mentioned above are images of the sensing array 113 of the flat panel sensor 110 being irradiated with X-rays.

[0060] Next, the second mode is the normal mode. In the second mode, the processor 112 of the flat panel sensor 110 continuously reads the third and fourth images from the memory 111 and determines whether the grayscale values ​​of the regions of interest in the third and fourth images exceed a preset threshold. If the grayscale values ​​of the regions of interest in the third and fourth images exceed the preset threshold, the processor 112 of the flat panel sensor 110 transmits the third and fourth images from the memory 111 to the external system 900.

[0061] It should be noted that the difference between the first mode and the second mode lies in whether or not images are transmitted to an external system. Furthermore, the second mode occurs only when the sensing array 113 of the flat panel sensor 110 is irradiated with X-rays.

[0062] Figure 3 This is a schematic diagram of signal waveforms illustrating the actual operation of an X-ray exposure detection method according to some embodiments of this case.

[0063] In some embodiments, please refer to Figure 1 and Figure 3 XRAY is the X-ray signal generated by the X-ray generator 120. Readout is the read signal of the processor 112 of the flat panel sensor 110 reading the image stored in the memory 111 by the sensing array 113. Reset is the reset signal of the processor 112 of the flat panel sensor 110 resetting the sensing array 113.

[0064] Next, ROI is the comparison result signal obtained by the processor 112 of the flat panel sensor 110 in determining whether the gray value of the region of interest in the image exceeds a preset threshold H. Transfer is the control signal by which the processor 112 of the flat panel sensor 110 transmits the image to the external system 900 based on the comparison result signal ROI.

[0065] In some embodiments, please refer to Figures 1 to 3 In the first stage I1, the X-ray generator 120 does not generate an X-ray signal, and the flat panel sensor 110 is in the first mode. The processor 112 of the flat panel sensor 110 executes steps 210 and 220 to continuously read the image (e.g., image Frame M) stored in the memory 111 by the sensing array 113, thereby comparing whether the gray value of the region of interest in the image exceeds a preset threshold H. At time point P1, the processor 112 of the flat panel sensor 110 determines that the gray value of the region of interest in image Frame M does not exceed the preset threshold H. Therefore, the flat panel sensor 110 continues to maintain the first mode.

[0066] In some embodiments, please refer to Figures 1 to 3 In the first sub-stage I12 of the second stage I2, the X-ray generator 120 generates an X-ray signal, and the flat panel sensor 110 is in the first mode. The processor 112 of the flat panel sensor 110 executes steps 210 and 220. Due to X-ray irradiation, the grayscale value of the region of interest in the image of the sensing array 113 of the flat panel sensor 110 exceeds a preset threshold H. At time point P2, the processor 112 of the flat panel sensor 110 determines that the grayscale value of the region of interest in the image exceeds the preset threshold H. Therefore, the processor 112 of the flat panel sensor 110 executes step 230 to switch the first mode of the flat panel sensor 110 to the second mode.

[0067] At the same time, before the processor 112 switches the flat panel sensor 110 from the first mode to the second mode, the processor 112 also generates a reset signal Reset to reset the sensing array 113 of the flat panel sensor 110 so that the processor 112 can read the image stored in the memory 111 by the sensing array 113 in the second mode.

[0068] It should be noted that the method of resetting the sensing array 113 of the flat panel sensor 110 can be a row-by-row reset method, a column-by-column reset method, or a partition reset method, and is not limited to the embodiment of this case. The first sub-stage I12 is the same as the buffer stage for switching from the first mode to the second mode.

[0069] In some embodiments, please refer to Figures 1 to 3 In the second sub-stage I22 of the second stage I2, the X-ray generator 120 continuously irradiates the X-ray signal, and the flat panel sensor 110 is in the second mode. The processor 112 of the flat panel sensor 110 executes step 240.

[0070] Next, at time point P3, the processor 112 of the flat panel sensor 110 determines that the gray value of the region of interest of the image Frame N exceeds the preset threshold H. Therefore, the processor 112 will transmit the image Frame N to the external system 900 at time point P4.

[0071] Furthermore, the processor 112 of the flat panel sensor 110 compares images Frame N and Frame N+1 at time point P4 to determine whether the grayscale value of the region of interest in image Frame N+1 exceeds a preset threshold H, thereby generating a comparison result. If the comparison result indicates that the grayscale value of the region of interest in image Frame N+1 exceeds the preset threshold H, the processor 112 will transmit image Frame N+1 to the external system 900 at time point P5.

[0072] Next, the processor 112 of the flat panel sensor 110 compares images Frame N+1 and Frame N+2 at time point P5 to determine whether the grayscale value of the region of interest in image Frame N+2 exceeds a preset threshold H, thereby generating a comparison result. If the comparison result indicates that the grayscale value of the region of interest in image Frame N+2 exceeds the preset threshold H, the processor 112 will transmit image Frame N+2 to the external system 900 at time point P6.

[0073] Next, the processor 112 of the flat panel sensor 110 compares images Frame N+2 and Frame N+3 at time point P6 to determine whether the grayscale value of the region of interest in image Frame N+3 exceeds a preset threshold H, thereby generating a comparison result. If the comparison result indicates that the grayscale value of the region of interest in image Frame N+3 exceeds the preset threshold H, the processor 112 will transmit image Frame N+3 to the external system 900 at time point P7.

[0074] Furthermore, the processor 112 of the flat panel sensor 110 compares images Frame N+3 and Frame N+4 at time point P7 to determine whether the grayscale value of the region of interest in image Frame N+4 exceeds a preset threshold H, thereby generating a comparison result. If the comparison result shows that the grayscale value of the region of interest in image Frame N+4 does not exceed the preset threshold H, the processor 112 switches from the second mode to the first mode and does not transmit image Frame N+4 to the external system 900 at time point P8. The second sub-stage I22 is the same as the processing stage of the second mode.

[0075] In some embodiments, please refer to Figures 1 to 3 In the third stage I3, the X-ray generator 120 stops generating X-ray signals, and the flat panel sensor 110 is in the first mode. The processor 112 of the flat panel sensor 110 executes steps 210 and 220. The detailed steps have been described in the preceding paragraphs and will not be repeated here.

[0076] Figures 4A to 4F This is a schematic diagram of the region of interest for an X-ray exposure detection method according to some embodiments of this case. In some embodiments, please refer to... Figures 4A to 4F The halftone dots in the multiple diagrams represent the regions of interest between the compared images. It should be noted that the shape of the region of interest can be designed according to actual needs and is not limited to the embodiments shown in this case.

[0077] To further clarify, the time point for setting the region of interest should be... Figure 3 Before the first stage I1.

[0078] Figure 5A This is a signal timing diagram illustrating a first mode of an X-ray exposure detection method according to some embodiments of this case. In some embodiments, please refer to... Figure 3 and Figure 5A , Figure 5A The signal timing diagram corresponds to Figure 3 Phase I1. It should be noted that, in the first mode, Figure 1The processor 112 of the flat panel sensor 110 of the X-ray exposure detection system 100 will sequentially read images Frame M to Frame M+4 stored in the memory 111. The processor 112 will sequentially compare the gray values ​​of the same region of interest of two temporally adjacent images to see if they exceed a preset threshold H (e.g., compare images Frame M and Frame M+1, compare images Frame M+1 and Frame M+2).

[0079] Then, due to Figure 1 The X-ray exposure detection system 100's sensing array 113 is not irradiated with X-rays, and images Frame M to Frame M+4 are not transmitted to the external system 900.

[0080] Figure 5B This is a signal timing diagram illustrating a second mode of an X-ray exposure detection method according to some embodiments of this case. In some embodiments, please refer to... Figure 3 and Figure 5B , Figure 5B The signal timing diagram corresponds to Figure 3 Phase 2, I2. It should be noted that in the second mode, Figure 1 The processor 112 of the flat panel sensor 110 of the X-ray exposure detection system 100 sequentially reads images Frame N to Frame N+4 stored in the memory 111. The processor 112 sequentially compares the gray values ​​of the same region of interest in two temporally adjacent images to see if they exceed a preset threshold H (e.g., comparing images Frame N and Frame N+1, comparing images Frame N+1 and Frame N+2). If the gray values ​​of the regions of interest in all images exceed the preset threshold H, the processor 112 transmits images Frame N to Frame N+4 to the external system 900.

[0081] According to the foregoing embodiments, this invention provides an X-ray exposure detection method 200 and an X-ray exposure detection system 100, which determines whether the sensing array 113 of the X-ray exposure detection system 100 is irradiated with X-rays by comparing whether the gray values ​​of the regions of interest between images exceed a preset threshold. This eliminates the need for additional hardware devices in the X-ray exposure detection system 100 and clears the accumulated charge in the sensing array 113 in the first mode (e.g., standby mode) to avoid image ghosting in the second mode (e.g., sensing and transmitting X-ray images).

[0082] Although detailed embodiments have been disclosed above, this application does not exclude other possible implementations. Therefore, the scope of protection of this application shall be determined by the appended claims and not by the foregoing embodiments.

[0083] For those skilled in the art, various modifications and refinements can be made to this case without departing from its spirit and scope. Based on the foregoing embodiments, all modifications and refinements made to this case are also covered within the protection scope of this case.

Claims

1. An X-ray exposure detection method, comprising: In a first mode, the processor of the flat panel sensor compares the first image and the second image stored in the memory of the flat panel sensor to generate a comparison result, wherein the first image and the second image are two temporally adjacent images obtained by the flat panel sensor. In this first mode, the processor determines whether the comparison result exceeds a preset threshold; If the comparison result exceeds the preset threshold, the processor switches the first mode of the flat panel sensor to the second mode. In this second mode, the processor reads the third and fourth images stored in the memory, wherein the third and fourth images are two temporally adjacent images obtained by the flat panel sensor being irradiated with X-rays; and In the second mode, the processor transmits the third and fourth images stored in the memory to an external system.

2. The X-ray exposure detection method as claimed in claim 1, wherein in the first mode, the step of generating the comparison result by comparing the first image and the second image stored in the memory of the flat panel sensor by the processor of the flat panel sensor includes: The processor compares the grayscale values ​​of the regions of interest in the first image and the second image obtained from the memory to see if they exceed the preset threshold, thereby generating the comparison result.

3. The X-ray exposure detection method as claimed in claim 2, wherein in the first mode, the step of generating the comparison result by comparing the first image and the second image stored in the memory of the flat panel sensor by the processor of the flat panel sensor further comprises: If the comparison result indicates that the grayscale value of the region of interest does not exceed the preset threshold, the processor causes the flat panel sensor to execute the first mode, thereby preventing the transmission of the first image and the second image to the external system.

4. The X-ray exposure detection method as described in claim 1, wherein the step of switching the first mode to the second mode of the flat panel sensor by the processor if the comparison result exceeds the preset threshold includes: The processor resets the sensing array of the flat panel sensor so that the processor can read the third and fourth images stored in the memory by the sensing array in the second mode.

5. The X-ray exposure detection method as described in claim 1, wherein the step of reading the third image and the fourth image stored in the memory by the processor includes: The processor compares the grayscale values ​​of the regions of interest in the third and fourth images to see if they exceed a preset threshold, thereby generating the comparison result; and If the comparison result indicates that the grayscale value of the region of interest does not exceed the preset threshold, the processor switches the second mode of the flat panel sensor to the first mode, thereby transmitting the third image to the external system and not transmitting the fourth image to the external system.

6. An X-ray exposure detection system, comprising: Flat panel sensor, including: A sensing array is used to perform light sensing to obtain a first image and a second image that are temporally adjacent, wherein the sensing array is used to sense X-rays from an X-ray generator to generate a third image and a fourth image that are temporally adjacent. A memory, coupled to the sensing array, is used to store the first image, the second image, the third image, and the fourth image; and A processor, coupled to the memory and the sensing array, is used to compare a first image and a second image in a first mode to generate a comparison result; The processor is used to determine whether the comparison result exceeds a preset threshold in the first mode. If the comparison result exceeds the preset threshold, the processor is used to switch the first mode of the flat panel sensor to the second mode. In the second mode, the processor is used to read the third image and the fourth image stored in the memory by the sensing array, and the processor is used to transmit the third image and the fourth image stored in the memory to an external system in the second mode.

7. The X-ray exposure detection system as claimed in claim 6, wherein the processor is further configured to compare whether the grayscale values ​​of the regions of interest of the first image and the second image obtained by the memory exceed the preset threshold, so as to generate the comparison result.

8. The X-ray exposure detection system of claim 7, wherein if the comparison result indicates that the gray value of the region of interest does not exceed the preset threshold, the processor is further configured to cause the flat panel sensor to execute the first mode, thereby not transmitting the first image and the second image to the external system.

9. The X-ray exposure detection system of claim 6, wherein the processor is further configured to reset the sensing array of the flat panel sensor during the buffer phase of the second mode, and to read the third image and the fourth image stored in the memory by the sensing array during the processing phase of the second mode.

10. The X-ray exposure detection system of claim 6, wherein the processor is further configured to compare whether the gray values ​​of the regions of interest of the third image and the fourth image exceed the preset threshold to generate the comparison result; if the comparison result indicates that the gray value of the region of interest does not exceed the preset threshold, the processor is further configured to switch the second mode of the flat panel sensor to the first mode, thereby transmitting the third image to the external system and not transmitting the fourth image to the external system.

Images