A method and device for bidirectional measurement of optical fiber line attenuation, electronic equipment and storage medium

Abstract

The application discloses a kind of optical fiber line attenuation bidirectional measurement method, in optical fiber line attenuation bidirectional measurement device setting semiconductor optical amplifier, to the measured optical fiber sends light measurement pulse signal, according to the measurement data obtained by optical fiber line attenuation bidirectional measurement device determines the time of arrival of reflected signal, respectively to the state of semiconductor optical amplifier in first time period and second time period is adjusted to obtain forward backscattering signal data and backward backscattering signal data, and according to forward backscattering signal data and backward backscattering signal data is measured.Thereby can be only by one end of the measured optical fiber realizes bidirectional measurement.Greatly reduce artificial cost and equipment cost.

Description

Technical Field

[0001] This invention relates to the field of optical fiber measurement technology, and in particular to a bidirectional method for measuring optical fiber line attenuation. The invention also relates to a bidirectional optical fiber line attenuation measurement device, electronic equipment, and storage medium. Background Technology

[0002] Currently, two methods are commonly used to measure fiber optic line attenuation: one is to use a light source and optical power meter, and the other is to use an OTDR (Optical Time-of-Difference Reduction) device. The OTDR method can measure not only fiber optic line attenuation but also fiber length and the quality of fiber optic connections, offering high efficiency and thus is widely used in fiber optic communication engineering.

[0003] In developing this invention, the inventors discovered that when using existing OTDRs for fiber optic line measurements, the presence of false gain leads to discrepancies between the fiber optic connection point loss obtained from unidirectional testing and the true value. Therefore, bidirectional measurements are often required: OTDR measurements are taken from both ends of the fiber optic line under test, and the arithmetic average of the obtained connection point loss or line attenuation values ​​is calculated to obtain a more accurate result. However, this bidirectional measurement method not only reduces work efficiency, but also increases system measurement costs, especially in online fiber optic cable monitoring systems where OTDR measurement modules need to be configured at both ends of the monitored cable. Summary of the Invention

[0004] This invention provides a method, apparatus, electronic device, and storage medium for bidirectional measurement of optical fiber line attenuation, enabling bidirectional measurement through only one end of the optical fiber under test. This significantly reduces labor and equipment costs.

[0005] A first aspect provides a method for bidirectional measurement of optical fiber line attenuation. The method is applied to a system comprising a bidirectional optical fiber line attenuation measuring device, a light reflector, and an optical fiber under test. The bidirectional optical fiber line attenuation measuring device includes a semiconductor optical amplifier. The bidirectional optical fiber line attenuation measuring device is connected to one end of the optical fiber under test, and the light reflector is connected to the other end of the optical fiber under test. The method includes:

[0006] The optical fiber line attenuation bidirectional measurement device sends an optical measurement pulse signal to the optical fiber under test.

[0007] The start time is defined as the moment when the optical fiber line attenuation bidirectional measuring device emits an optical measurement pulse signal. The arrival time of the reflected signal corresponding to the optical measurement pulse signal to the optical fiber line attenuation bidirectional measuring device is determined based on the measurement data obtained by the optical fiber line attenuation bidirectional measuring device.

[0008] The state of the semiconductor optical amplifier is adjusted in a first time period to obtain the forward backscattering signal data of the optical fiber under test, wherein the first time period is the time period between the start time and the arrival time;

[0009] The state of the semiconductor optical amplifier is adjusted in a second time period to obtain the backscattered signal data of the optical fiber under test. The second time period is the time period between a second moment and the end of the measurement. The second moment is the moment after the arrival time is delayed by a preset time. The preset time is generated according to the width of the optical measurement pulse signal.

[0010] The optical fiber under test is measured based on the forward backscatter signal data and the reverse backscatter signal data.

[0011] In some embodiments, the start time is defined as the moment when the optical fiber line attenuation bidirectional measuring device emits an optical measurement pulse signal, and the arrival time of the reflected signal corresponding to the optical measurement pulse signal at the optical fiber line attenuation bidirectional measuring device is determined based on the measurement data obtained by the optical fiber line attenuation bidirectional measuring device. Specifically:

[0012] Obtain the reflected signal pulse generated by the light reflector from the measurement data;

[0013] The arrival time is the time corresponding to the starting position of the reflected signal pulse.

[0014] In some embodiments, adjusting the state of the semiconductor optical amplifier in a first time period to obtain forward backscattering signal data of the optical fiber under test specifically involves:

[0015] The semiconductor optical amplifier is set to an amplification state during a first time period, and the semiconductor optical amplifier is set to an attenuation state during other time periods besides the first time period.

[0016] The backscattering signal data obtained from the optical fiber line attenuation bidirectional measurement device toward the optical reflector is used as the forward backscattering signal data.

[0017] In some embodiments, adjusting the state of the semiconductor optical amplifier in a second time period to obtain the backscattered signal data of the optical fiber under test specifically involves:

[0018] The semiconductor optical amplifier is set to an amplification state in the second time period and to an attenuation state in other time periods besides the second time period.

[0019] The backscattered signal data acquired before the arrival time is discarded;

[0020] The backscattering signal data obtained from the light reflector toward the optical fiber line attenuation bidirectional measurement device is used as the reverse backscattering signal data.

[0021] Secondly, a bidirectional optical fiber attenuation measuring device is provided, applied in a system comprising an optical fiber under test, a light reflector, and the bidirectional optical fiber attenuation measuring device, wherein the light reflector is connected to one end of the optical fiber under test, and the bidirectional optical fiber attenuation measuring device is connected to the other end of the optical fiber under test, and the bidirectional optical fiber attenuation measuring device comprises:

[0022] An optical transmitter, connected to an optical direction coupler, is used to transmit optical measurement pulse signals to the optical fiber under test through the optical direction coupler;

[0023] The optical directional coupler is connected to the optical fiber under test and the semiconductor optical amplifier module, respectively, and is used to send the optical measurement pulse signal to the optical fiber under test.

[0024] The semiconductor optical amplifier module is connected to the optical direction coupler and the signal conversion module, respectively, and is used to adjust the state of the semiconductor optical amplifier in a first time period to obtain the forward backscattering signal data of the optical fiber under test and to adjust the state of the semiconductor optical amplifier in a second time period to obtain the reverse backscattering signal data of the optical fiber under test. The first time period is the time period between the start time and the arrival time, and the second time period is the time period between the second time and the measurement end time. The second time is the time after the arrival time delayed by a preset time, and the preset time is generated according to the width of the optical measurement pulse signal.

[0025] The signal conversion module is connected to the semiconductor optical amplifier module and is used to convert backscattered light signals and reflected light signals into electrical signals and perform analog-to-digital conversion.

[0026] The control and calculation module is used to set the start time as the time when the optical fiber line attenuation bidirectional measurement device emits an optical measurement pulse signal, determine the arrival time of the reflected signal corresponding to the optical measurement pulse signal to the optical fiber line attenuation bidirectional measurement device based on the measurement data obtained by the optical fiber line attenuation bidirectional measurement device, and measure the optical fiber under test based on the forward backscatter signal data and the reverse backscatter signal data.

[0027] In some embodiments, the control and calculation module is specifically used for:

[0028] Obtain the reflected signal pulse generated by the light reflector from the measurement data;

[0029] The arrival time is the time corresponding to the starting position of the reflected signal pulse.

[0030] In some embodiments, the semiconductor optical amplifier module is specifically used for:

[0031] The semiconductor optical amplifier is set to an amplification state during a first time period, and the semiconductor optical amplifier is set to an attenuation state during other time periods besides the first time period.

[0032] The backscattering signal data obtained from the optical fiber line attenuation bidirectional measurement device toward the optical reflector is used as the forward backscattering signal data.

[0033] In some embodiments, the semiconductor optical amplifier module is specifically used for:

[0034] The semiconductor optical amplifier is set to an amplification state in the second time period and to an attenuation state in other time periods besides the second time period.

[0035] The backscattered signal data acquired before the arrival time is discarded;

[0036] The backscattering signal data obtained from the light reflector toward the optical fiber line attenuation bidirectional measurement device is used as the reverse backscattering signal data.

[0037] Thirdly, an electronic device, characterized in that it comprises:

[0038] Processor; and

[0039] Memory for storing the executable instructions of the processor;

[0040] The processor is configured to execute the bidirectional fiber optic line attenuation measurement method described above by executing the executable instructions.

[0041] Fourthly, a computer-readable storage medium is provided, on which a computer program is stored, wherein the computer program, when executed by a processor, implements the bidirectional optical fiber line attenuation measurement method as described in any of the preceding claims.

[0042] By applying the above technical solution, a semiconductor optical amplifier is set up in the bidirectional fiber optic line attenuation measurement device to send optical measurement pulse signals to the fiber under test. Based on the measurement data obtained by the bidirectional fiber optic line attenuation measurement device, the arrival time of the reflected signal is determined. The state of the semiconductor optical amplifier is adjusted in the first and second time periods to obtain forward backscattered signal data and reverse backscattered signal data, respectively. Measurements are then performed based on these forward and reverse backscattered signal data. This allows for bidirectional measurement through only one end of the fiber under test, significantly reducing labor and equipment costs. Attached Figure Description

[0043] To more clearly illustrate the technical solutions in the embodiments of this application, the accompanying drawings used in the description of the embodiments will be briefly introduced below. Obviously, the accompanying drawings described below are only some embodiments of this application. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0044] Figure 1 This is a flowchart illustrating a bidirectional measurement method for optical fiber line attenuation proposed in this invention.

[0045] Figure 2 This is a schematic diagram of the attenuation trace of the OTDR fiber optic line in the AB direction in a specific embodiment of the present invention;

[0046] Figure 3 This is a schematic diagram of the attenuation trace of the OTDR fiber optic line in the BA direction in a specific embodiment of the present invention;

[0047] Figure 4 This is a block diagram and measurement connection diagram of a bidirectional OTDR device in a specific embodiment of the present invention;

[0048] Figure 5 This is a schematic diagram of the signal trace at time t1 when the reflected signal generated by the optical reflector reaches the optical receiver, as shown in a specific embodiment of the present invention.

[0049] Figure 6 This is a schematic diagram illustrating the steps of bidirectional measurement of an optical fiber line using an OTDR device for bidirectional measurement in a specific embodiment of the present invention.

[0050] Figure 7 This is a schematic diagram of the structure of the bidirectional optical fiber line attenuation measurement device proposed in this invention. Detailed Implementation

[0051] The technical solutions of the embodiments of this application will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of this application, and not all embodiments. Based on the embodiments of this application, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of this application.

[0052] It should be noted that other embodiments of this application will readily conceive of by those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This application is intended to cover any variations, uses, or adaptations of this application that follow the general principles of this application and include common knowledge or customary techniques in the art not disclosed herein. The specification and embodiments are to be considered exemplary only, and the true scope and spirit of this application are indicated in the claims section.

[0053] It should be understood that this application is not limited to the precise structures described below and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of this application is limited only by the appended claims.

[0054] The following is combined Figure 1 This application describes a bidirectional fiber optic line attenuation measurement method according to exemplary embodiments thereof. It should be noted that the following application scenarios are shown only to facilitate understanding of the spirit and principles of this application, and the embodiments of this application are not limited in any way. Rather, the embodiments of this application can be applied to any applicable scenario.

[0055] It should be noted that this method is applied to a system comprising a bidirectional fiber optic line attenuation measuring device, a light reflector, and the fiber under test. The bidirectional fiber optic line attenuation measuring device is equipped with a semiconductor optical amplifier. The bidirectional fiber optic line attenuation measuring device is connected to one end of the fiber under test, and the light reflector is connected to the other end of the fiber under test. The method includes the following steps:

[0056] S101, the optical measurement pulse signal is sent to the optical fiber under test through the optical fiber line attenuation bidirectional measurement device.

[0057] S102, the start time is set at the moment when the optical fiber line attenuation bidirectional measuring device emits the optical measurement pulse signal, and the arrival time of the reflected signal corresponding to the optical measurement pulse signal to the optical fiber line attenuation bidirectional measuring device is determined according to the measurement data obtained by the optical fiber line attenuation bidirectional measuring device.

[0058] In this embodiment of the invention, the start time is defined as the moment when the optical fiber line attenuation bidirectional measuring device emits an optical measurement pulse signal. The arrival time of the reflected signal corresponding to the optical measurement pulse signal at the optical fiber line attenuation bidirectional measuring device is determined based on the measurement data obtained by the optical fiber line attenuation bidirectional measuring device. Specifically:

[0059] Obtain the reflected signal pulse generated by the light reflector from the measurement data;

[0060] The arrival time is the time corresponding to the starting position of the reflected signal pulse.

[0061] S103, the state of the semiconductor optical amplifier is adjusted in the first time period to obtain the forward backscattering signal data of the optical fiber under test, wherein the first time period is the time period between the start time and the arrival time.

[0062] In this embodiment of the invention, adjusting the state of the semiconductor optical amplifier in a first time period to obtain the forward backscattering signal data of the optical fiber under test is specifically as follows:

[0063] The semiconductor optical amplifier is set to an amplification state during a first time period, and the semiconductor optical amplifier is set to an attenuation state during other time periods besides the first time period.

[0064] The backscattering signal data obtained from the optical fiber line attenuation bidirectional measurement device toward the optical reflector is used as the forward backscattering signal data.

[0065] S104, the state of the semiconductor optical amplifier is adjusted in the second time period to obtain the backscattering signal data of the optical fiber under test, wherein the second time period is the time period between the second moment and the measurement end moment, the second moment is the moment after the arrival moment delayed by a preset time, and the preset time is generated according to the width of the optical measurement pulse signal.

[0066] In this embodiment of the invention, the state of the semiconductor optical amplifier is adjusted in the second time period to obtain the backscattered signal data of the optical fiber under test, specifically as follows:

[0067] The semiconductor optical amplifier is set to an amplification state in the second time period and to an attenuation state in other time periods besides the second time period.

[0068] The backscattered signal data acquired before the arrival time is discarded;

[0069] The backscattering signal data obtained from the light reflector toward the optical fiber line attenuation bidirectional measurement device is used as the reverse backscattering signal data.

[0070] S105, the optical fiber under test is measured based on the forward backscattering signal data and the reverse backscattering signal data.

[0071] By applying the above technical solution, a semiconductor optical amplifier is set up in the bidirectional fiber optic line attenuation measurement device to send optical measurement pulse signals to the fiber under test. Based on the measurement data obtained by the bidirectional fiber optic line attenuation measurement device, the arrival time of the reflected signal is determined. The state of the semiconductor optical amplifier is adjusted in the first and second time periods to obtain forward backscattered signal data and reverse backscattered signal data, respectively. Measurements are then performed based on these forward and reverse backscattered signal data. This allows for bidirectional measurement through only one end of the fiber under test, significantly reducing labor and equipment costs.

[0072] To achieve the above objectives, the present invention also proposes a bidirectional optical fiber attenuation measurement device, applied in a system comprising an optical fiber under test, a light reflector, and the bidirectional optical fiber attenuation measurement device, characterized in that the light reflector is connected to one end of the optical fiber under test, and the bidirectional optical fiber attenuation measurement device is connected to the other end of the optical fiber under test, as shown below. Figure 7 As shown, the bidirectional optical fiber line attenuation measurement device includes:

[0073] An optical transmitter 710 is connected to an optical direction coupler and is used to transmit optical measurement pulse signals to the optical fiber under test through the optical direction coupler.

[0074] The optical directional coupler 720 is connected to the optical fiber under test and the semiconductor optical amplifier module respectively, and is used to send the optical measurement pulse signal to the optical fiber under test.

[0075] The semiconductor optical amplifier module 730 is connected to the optical direction coupler and the signal conversion module, respectively, and is used to adjust the state of the semiconductor optical amplifier in a first time period to obtain the forward backscattering signal data of the optical fiber under test and to adjust the state of the semiconductor optical amplifier in a second time period to obtain the reverse backscattering signal data of the optical fiber under test. The first time period is the time period between the start time and the arrival time, and the second time period is the time period between the second time and the measurement end time. The second time is the time after the arrival time delayed by a preset time, and the preset time is generated according to the width of the optical measurement pulse signal.

[0076] The signal conversion module 740 is connected to the semiconductor optical amplifier module and is used to convert backscattered light signals and reflected light signals into electrical signals and perform analog-to-digital conversion.

[0077] The control and calculation module 750 is used to set the start time as the time when the optical fiber line attenuation bidirectional measurement device emits an optical measurement pulse signal, determine the arrival time of the reflected signal corresponding to the optical measurement pulse signal to the optical fiber line attenuation bidirectional measurement device based on the measurement data obtained by the optical fiber line attenuation bidirectional measurement device, and measure the optical fiber under test based on the forward backscatter signal data and the reverse backscatter signal data.

[0078] In a specific embodiment of the present invention, the control and calculation module is specifically used for:

[0079] Obtain the reflected signal pulse generated by the light reflector from the measurement data;

[0080] The arrival time is the time corresponding to the starting position of the reflected signal pulse.

[0081] In a specific embodiment of the present invention, the semiconductor optical amplifier module is specifically used for:

[0082] The semiconductor optical amplifier is set to an amplification state during a first time period, and the semiconductor optical amplifier is set to an attenuation state during other time periods besides the first time period.

[0083] The backscattering signal data obtained from the optical fiber line attenuation bidirectional measurement device toward the optical reflector is used as the forward backscattering signal data.

[0084] In a specific embodiment of the present invention, the semiconductor optical amplifier module is specifically used for:

[0085] The semiconductor optical amplifier is set to an amplification state in the second time period and to an attenuation state in other time periods besides the second time period.

[0086] The backscattered signal data acquired before the arrival time is discarded;

[0087] The backscattering signal data obtained from the light reflector toward the optical fiber line attenuation bidirectional measurement device is used as the reverse backscattering signal data.

[0088] The purpose of this invention is to provide a bidirectional OTDR device and method, which allows operators to perform bidirectional OTDR measurements by only needing to connect to one end of the fiber being measured.

[0089] To achieve the above objectives, the present invention provides the following solution:

[0090] A bidirectional measurement OTDR device includes an optical transmitter, an optical direction coupler, an optical reflector, a semiconductor optical amplifier (SOA) and driver, an APD transimpedance amplifier (APD-TIA), an analog-to-digital converter (ADC), and a control and computing unit.

[0091] The control and computing unit is connected to an optical transmitter, a semiconductor optical amplifier and driver, and an analog-to-digital converter circuit. The optical transmitter is connected to one end of the optical fiber under test through an optical directional coupler. The other end of the optical fiber under test is connected to an optical reflector. The optical directional coupler is also connected to the semiconductor optical amplifier. The semiconductor optical amplifier is connected to an APD transimpedance amplifier. The APD transimpedance amplifier is connected to the analog-to-digital converter circuit.

[0092] Under the control of the control and computing unit, the optical transmitter emits optical pulse signals with different pulse widths and periods according to existing OTDR technology.

[0093] In this system, a light reflector with a reflectivity greater than -1 dB is connected to the far end of the optical fiber under test. During OTDR measurement, the optical pulse signal output by the optical transmitter travels through the optical fiber to the far-end light reflector. In this process, the resulting backscattered signal returns to the APD transimpedance amplifier, is amplified and digitized to form the forward OTDR measurement data of the optical fiber under test. The high reflectivity of the light reflector generates a strong reflected pulse. This reflected pulse, as it propagates through the optical fiber, also generates a backscattered signal. This backscattered signal is then reflected by the light reflector and returns to the APD transimpedance amplifier, where it is amplified and digitized to form the reverse OTDR measurement data of the optical fiber under test.

[0094] Under the control of the control and computing unit, the driver of the semiconductor optical amplifier can generate drive currents of different amplitudes. Through drive currents of different amplitudes, the semiconductor optical amplifier can be in an amplification state or an attenuation state. The drive current generated by the driver of the semiconductor optical amplifier can be in DC form or in pulse form. When in the attenuation state, the attenuation value ranges from 20 to 50 dB. The semiconductor optical amplifier can be used as both an optical backscattering signal amplifier and a fast optical attenuator to attenuate or block strong reflection signals, ensuring that the APD transimpedance amplifier does not enter a deep overload state when strong reflection signals occur.

[0095] The present invention also provides a bidirectional OTDR measurement method, which is applied to the measuring device and includes the following steps:

[0096] a) Connect the bidirectional OTDR device to the fiber under test:

[0097] Connect the measurement signal port of the bidirectional OTDR device to one end of the optical fiber under test, and connect the other end of the optical fiber under test to the light reflector.

[0098] b) Measure the time t1 when the reflected signal generated by the optical reflector arrives at the optical receiver:

[0099] The control and computing unit controls the driver of the semiconductor optical amplifier to put the semiconductor optical amplifier in an attenuation state with an attenuation value between 20 and 30 dB, and controls the optical transmitter to emit an optical measurement pulse signal.

[0100] The analog-to-digital converter (ADC) circuit performs synchronous ADC conversion, sampling and digitally converting the output signal of the APD transimpedance amplifier before sending it to the control and calculation unit to obtain a set of measurement data [A]. i ];

[0101] According to existing OTDR technology methods, in [A i Find the reflected signal pulse generated by the light reflector contained in the image, and the time t1 corresponding to its starting position is the time when the reflected signal arrives at the light receiver.

[0102] c) Obtain the backscattered signal in the AB direction of the fiber under test [B a-b ]:

[0103] From time 0 to time t1, the control and computing unit controls the semiconductor optical amplifier to be in the amplification state, and in the attenuation state during the rest of the time period, with an attenuation value between 40 and 50 dB.

[0104] Using existing OTDR technology, a set of backscattered signal data of the tested optical fiber is obtained, that is, a set of backscattered signal data in the AB direction of the tested optical fiber is obtained [B a-b ];

[0105] d) Obtain the backscattered signal in the BA direction of the fiber under test [B b-a ]:

[0106] From time 0 to time t1+w, the control and calculation unit controls the semiconductor optical amplifier to be in attenuation state, with an attenuation value between 40 and 50 dB; during the remaining time period, it is in amplification state; w is 1 to 1.2 times the width of the optical measurement pulse signal.

[0107] Using existing OTDR technology, a set of backscattered signal data of the tested optical fiber is obtained, and the data before time t1 is discarded, thus obtaining a set of backscattered signal data in the BA direction of the tested optical fiber [B b-a ].

[0108] e) Process the backscattered signal data in the AB direction separately according to existing OTDR technology methods [B a-b ]

[0109] Backscattered signal data in the BA direction [B b-a ].

[0110] According to the specific embodiments provided above, the present invention discloses the following technical effects:

[0111] Compared with traditional OTDRs, the bidirectional measurement OTDR device and method of the present invention allow operators to perform bidirectional OTDR measurements only at one end of the fiber being measured.

[0112] To further illustrate the technical concept of this invention, the technical solution will now be described in conjunction with specific application scenarios. The purpose of this invention is to provide a bidirectional OTDR device and method, allowing operators to perform bidirectional OTDR measurements from only one end of the fiber being measured.

[0113] like Figure 1 As shown, when using existing OTDR technology to perform bidirectional measurements on an optical fiber line, the OTDR is first connected to end A of the optical fiber line to perform measurements in the AB direction; then the OTDR is connected to end B of the optical fiber line to perform measurements in the BA direction.

[0114] When performing measurements in the AB direction, the obtained OTDR trace is as follows: Figure 2 As shown, the starting event is A, the ending event is B, and event S corresponds to the weld point S; when measuring in the BA direction, the obtained OTDR trace is as follows. Figure 3 As shown, the starting event is A', the ending event is B', and event S' corresponds to the weld point S. The results of events S and S' are different; the loss of event S is positive, while the loss of event S' is negative. The loss result of the weld point S should be the arithmetic mean of the losses of events S and S'.

[0115] like Figure 4 The diagram shows the structural composition of the measuring device of the present invention:

[0116] A bidirectional measurement OTDR device includes an optical transmitter, an optical direction coupler, an optical reflector, a semiconductor optical amplifier (SOA) and driver, an APD transimpedance amplifier (APD-TIA), an analog-to-digital converter (ADC), and a control and computing unit.

[0117] The control and computing unit is connected to an optical transmitter, a semiconductor optical amplifier and driver, and an analog-to-digital converter circuit. The optical transmitter is connected to one end of the optical fiber under test through an optical directional coupler. The other end of the optical fiber under test is connected to an optical reflector. The optical directional coupler is also connected to the semiconductor optical amplifier. The semiconductor optical amplifier is connected to an APD transimpedance amplifier. The APD transimpedance amplifier is connected to the analog-to-digital converter circuit.

[0118] Under the control of the control and computing unit, the optical transmitter emits optical pulse signals with different pulse widths and periods according to existing OTDR technology.

[0119] In this system, a light reflector with a reflectivity greater than -1 dB is connected to the far end of the optical fiber under test. During OTDR measurement, the optical pulse signal output by the optical transmitter travels through the optical fiber to the far-end light reflector. In this process, the resulting backscattered signal returns to the APD transimpedance amplifier, is amplified and digitized to form the forward OTDR measurement data of the optical fiber under test (the forward direction being from the signal end of the measuring device to the light reflector). The high reflectivity of the light reflector generates a strong reflected pulse. This reflected pulse, when transmitted through the optical fiber under test, also generates a backscattered signal. This backscattered signal is then reflected by the light reflector and returns to the APD transimpedance amplifier, where it is amplified and digitized to form the reverse OTDR measurement data of the optical fiber under test (the reverse direction being from the light reflector to the signal end of the measuring device).

[0120] Under the control of the control and computing unit, the driver of the semiconductor optical amplifier can generate drive currents of different amplitudes; through drive currents of different amplitudes, the semiconductor optical amplifier can be in an amplification state or an attenuation state; the drive current generated by the driver of the semiconductor optical amplifier can be in DC form or in pulse form; when in the attenuation state, the attenuation value ranges from 20 to 50 dB.

[0121] A semiconductor optical amplifier can function as both an optical backscattering signal amplifier and a fast optical attenuator. When used as a fast optical attenuator, it rapidly attenuates or blocks strong reflected signals, ensuring that the APD transimpedance amplifier does not enter a deep overload state when receiving strong reflected signals. In the device of this invention, when a strong reflected signal generated by the optical reflector reaches the semiconductor optical amplifier, the control and calculation unit controls the driver of the semiconductor optical amplifier, causing the amplifier to quickly enter an attenuation state, greatly reducing the strong reflected signal and preventing the APD transimpedance amplifier from entering an overload state when the signal reaches the APD detector. After the window period for the strong reflected signal has passed, the control and calculation unit controls the driver of the semiconductor optical amplifier, causing it to quickly enter an amplification state, allowing the backscattered signal generated by the optical fiber to pass and be amplified normally before entering the APD detector, where it undergoes photoelectric conversion and amplification by the APD transimpedance amplifier.

[0122] When using the measuring device of the present invention to perform bidirectional measurement of an optical fiber line, it is necessary to measure the time t1 that the optical pulse signal emitted by the optical transmitter takes from the signal input / output port of the measuring device to the optical reflector and then back to the signal input / output port of the measuring device.

[0123] To obtain time t1, the control and calculation unit controls the driver of the semiconductor optical amplifier to put the semiconductor optical amplifier in an attenuation state, with an attenuation value between 20 and 30 dB, and controls the optical transmitter to emit an optical measurement pulse signal. The analog-to-digital conversion circuit synchronously performs analog-to-digital conversion, samples and digitally converts the output signal of the APD transimpedance amplifier, and sends it to the control and calculation unit to obtain a set of measurement data [A]. i ]; Measurement data [A i OTDR traces as follows Figure 5 As shown; according to existing OTDR technology methods, in [A] i Find the reflected signal pulse generated by the light reflector contained in the image, and the time corresponding to its starting position is the time t1 that needs to be acquired.

[0124] When performing forward measurement of an optical fiber line using the measuring device of this invention, i.e., acquiring the backscattered signal in the AB direction of the optical fiber under test, from time 0 to time t1, the control and calculation unit controls the semiconductor optical amplifier to be in amplification mode, i.e., normally receiving the backscattered signal in the AB direction; during the remaining time period, it is in attenuation mode, with an attenuation value between 40 and 50 dB, i.e., shielding the strong reflection signal from the optical reflector and the backscattered signal in the BA direction; according to the existing OTDR technology method, a set of backscattered signal data of the optical fiber under test is obtained, i.e., a set of backscattered signal data in the AB direction of the optical fiber under test is obtained [B a-b ].

[0125] When performing reverse measurement of an optical fiber line using the measuring device of this invention, i.e., acquiring the backscattered signal in the BA direction of the optical fiber under test, from time 0 to time t1+w, the control and calculation unit controls the semiconductor optical amplifier to be in an attenuation state, with an attenuation value of 40 to 50 dB, i.e., shielding the backscattered signal in the AB direction and the strong reflection signal generated by the optical reflector; during the remaining time period, it is in an amplification state, i.e., normally receiving the backscattered signal in the BA direction; according to the existing OTDR technology method, a set of backscattered signal data of the optical fiber under test is obtained, and the data before time t1 is discarded, and time t1 is set as the starting point of the backscattered signal data in the BA direction, i.e., a set of backscattered signal data in the BA direction of the optical fiber under test is obtained [B b-a ] where w is 1 to 1.2 times the width of the optical measurement pulse signal.

[0126] Figure 6As shown, the present invention also provides a bidirectional OTDR measurement method, which is applied to the measuring device and includes the following steps:

[0127] a) Connect the bidirectional OTDR device to the fiber under test:

[0128] Connect the measurement signal port of the bidirectional OTDR device to one end of the optical fiber under test, and connect the other end of the optical fiber under test to the light reflector.

[0129] b) Measure the time t1 when the reflected signal generated by the optical reflector arrives at the optical receiver:

[0130] The control and computing unit controls the driver of the semiconductor optical amplifier to put the semiconductor optical amplifier in an attenuation state with an attenuation value between 20 and 30 dB, and controls the optical transmitter to emit an optical measurement pulse signal.

[0131] The analog-to-digital converter (ADC) circuit performs synchronous ADC conversion, sampling and digitally converting the output signal of the APD transimpedance amplifier before sending it to the control and calculation unit to obtain a set of measurement data [A]. i ];

[0132] According to existing OTDR technology methods, in [A i Find the reflected signal pulse generated by the light reflector contained in the image, and the time t1 corresponding to its starting position is the time when the reflected signal arrives at the light receiver.

[0133] c) Obtain the backscattered signal in the AB direction of the fiber under test [B a-b ]:

[0134] From time 0 to time t1, the control and computing unit controls the semiconductor optical amplifier to be in the amplification state, and in the attenuation state during the rest of the time period, with an attenuation value between 40 and 50 dB.

[0135] Using existing OTDR technology, a set of backscattered signal data of the tested optical fiber is obtained, that is, a set of backscattered signal data in the AB direction of the tested optical fiber is obtained [B a-b ];

[0136] d) Obtain the backscattered signal in the BA direction of the fiber under test [B b-a ]:

[0137] From time 0 to time t1+w, the control and calculation unit controls the semiconductor optical amplifier to be in attenuation state, with an attenuation value between 40 and 50 dB; during the remaining time period, it is in amplification state; w is 1 to 1.2 times the width of the optical measurement pulse signal.

[0138] Using existing OTDR technology, a set of backscattered signal data of the tested optical fiber is obtained, and the data before time t1 is discarded, thus obtaining a set of backscattered signal data in the BA direction of the tested optical fiber [B b-a ].

[0139] Process the backscattered signal data in the AB direction separately according to existing OTDR technology methods [B a-b Backscattered signal data in the BA direction [B] b-a ].

[0140] By applying the above technical solution, a semiconductor optical amplifier is set up in the bidirectional fiber optic line attenuation measurement device to send optical measurement pulse signals to the fiber under test. Based on the measurement data obtained by the bidirectional fiber optic line attenuation measurement device, the arrival time of the reflected signal is determined. The state of the semiconductor optical amplifier is adjusted in the first and second time periods to obtain forward backscattered signal data and reverse backscattered signal data, respectively. Measurements are then performed based on these forward and reverse backscattered signal data. This allows for bidirectional measurement through only one end of the fiber under test, significantly reducing labor and equipment costs.

[0141] Accordingly, the present invention also proposes an electronic device, comprising:

[0142] Processor; and

[0143] Memory for storing the executable instructions of the processor;

[0144] The processor is configured to perform a bidirectional fiber optic line attenuation measurement method as described above by executing the executable instructions.

[0145] Accordingly, the present invention also proposes a computer-readable storage medium storing a computer program thereon, characterized in that the computer program, when executed by a processor, implements a bidirectional optical fiber line attenuation measurement method as described above.

[0146] By applying the above technical solution, a semiconductor optical amplifier is set up in the bidirectional fiber optic line attenuation measurement device to send optical measurement pulse signals to the fiber under test. Based on the measurement data obtained by the bidirectional fiber optic line attenuation measurement device, the arrival time of the reflected signal is determined. The state of the semiconductor optical amplifier is adjusted in the first and second time periods to obtain forward backscattered signal data and reverse backscattered signal data, respectively. Measurements are then performed based on these forward and reverse backscattered signal data. This allows for bidirectional measurement through only one end of the fiber under test, significantly reducing labor and equipment costs.

[0147] The aforementioned communication bus can be a PCI (Peripheral Component Interconnect) bus or an EISA (Extended Industry Standard Architecture) bus, etc. This communication bus can be divided into address bus, data bus, control bus, etc. For ease of illustration, only one thick line is used to represent it in the diagram, but this does not indicate that there is only one bus or one type of bus.

[0148] The communication interface is used for communication between the aforementioned terminal and other devices.

[0149] The memory may include RAM (Random Access Memory) or non-volatile memory, such as at least one disk storage device. Optionally, the memory may also be at least one storage device located remotely from the aforementioned processor.

[0150] The processors mentioned above can be general-purpose processors, including CPUs (Central Processing Units), NPs (Network Processors), etc.; they can also be DSPs (Digital Signal Processors), ASICs (Application Specific Integrated Circuits), FPGAs (Field-Programmable Gate Arrays), or other programmable logic devices, discrete gate or transistor logic devices, or discrete hardware components.

[0151] In the above embodiments, implementation can be achieved entirely or partially through software, hardware, firmware, or any combination thereof. When implemented using software, it can be implemented entirely or partially in the form of a computer program product. The computer program product includes one or more computer instructions. When the computer program instructions are loaded and executed on a computer, all or part of the processes or functions described in the embodiments of the present invention are generated. The computer can be a general-purpose computer, a special-purpose computer, a computer network, or other programmable device. The computer instructions can be stored in a computer-readable storage medium or transmitted from one computer-readable storage medium to another. For example, the computer instructions can be transmitted from one website, computer, server, or data center to another website, computer, server, or data center via wired (e.g., coaxial cable, fiber optic, digital subscriber line) or wireless (e.g., infrared, wireless, microwave, etc.) means. The computer-readable storage medium can be any available medium that a computer can access or a data storage device such as a server or data center that integrates one or more available media. The available medium can be a magnetic medium (e.g., floppy disk, hard disk, magnetic tape), an optical medium (e.g., DVD), or a semiconductor medium (e.g., solid-state drive), etc.

[0152] It should be noted that, in this document, relational terms such as "first" and "second" are used only to distinguish one entity or operation from another, and do not necessarily require or imply any such actual relationship or order between these entities or operations. Furthermore, the terms "comprising," "including," or any other variations thereof are intended to cover non-exclusive inclusion, such that a process, method, article, or apparatus that comprises a list of elements includes not only those elements but also other elements not expressly listed, or elements inherent to such a process, method, article, or apparatus. Without further limitations, an element defined by the phrase "comprising one..." does not exclude the presence of other identical elements in the process, method, article, or apparatus that includes said element.

[0153] The various embodiments in this specification are described in a related manner. The same or similar parts between the various embodiments can be referred to each other. Each embodiment focuses on describing the differences from other embodiments.

[0154] The above description is merely a preferred embodiment of the present invention and is not intended to limit the scope of protection of the present invention. Any modifications, equivalent substitutions, improvements, etc., made within the spirit and principles of the present invention are included within the scope of protection of the present invention.

Claims

1. A method of bidirectional measurement of optical fiber line attenuation, characterized in that, The method is applied to a system comprising a fiber line attenuation bidirectional measurement device, an optical reflector and a measured optical fiber, the fiber line attenuation bidirectional measurement device is provided with a semiconductor optical amplifier, the fiber line attenuation bidirectional measurement device is connected with one end of the measured optical fiber, and the optical reflector is connected with the other end of the measured optical fiber, and the method comprises the following steps: sending an optical measurement pulse signal to the measured optical fiber through the fiber line attenuation bidirectional measurement device; taking the time point when the optical measurement pulse signal is emitted by the fiber line attenuation bidirectional measurement device as a starting time point, and determining the arrival time point of the reflection signal corresponding to the optical measurement pulse signal at the fiber line attenuation bidirectional measurement device according to the measurement data obtained by the fiber line attenuation bidirectional measurement device; adjusting the state of the semiconductor optical amplifier in a first time period to obtain the forward backscattering signal data of the measured optical fiber, wherein the first time period is the time period between the starting time point and the arrival time point; adjusting the state of the semiconductor optical amplifier in a second time period to obtain the reverse backscattering signal data of the measured optical fiber, wherein the second time period is the time period between the second time point and the measurement ending time point, the second time point is the time point after the arrival time point is delayed by a preset time, and the preset time is generated according to the width of the optical measurement pulse signal; measuring the measured optical fiber according to the forward backscattering signal data and the reverse backscattering signal data; taking the time point when the optical measurement pulse signal is emitted by the fiber line attenuation bidirectional measurement device as a starting time point, and determining the arrival time point of the reflection signal corresponding to the optical measurement pulse signal at the fiber line attenuation bidirectional measurement device according to the measurement data obtained by the fiber line attenuation bidirectional measurement device, specifically: obtaining the reflection signal pulse containing the reflection signal generated by the optical reflector from the measurement data; taking the time point corresponding to the starting position of the reflection signal pulse as the arrival time point; adjusting the state of the semiconductor optical amplifier in a first time period to obtain the forward backscattering signal data of the measured optical fiber, specifically: setting the semiconductor optical amplifier in the first time period to an amplification state, and setting the semiconductor optical amplifier in other time periods except the first time period to an attenuation state; taking the obtained backscattering signal data from the fiber line attenuation bidirectional measurement device to the optical reflector as the forward backscattering signal data; adjusting the state of the semiconductor optical amplifier in a second time period to obtain the reverse backscattering signal data of the measured optical fiber, specifically: setting the semiconductor optical amplifier in the second time period to an amplification state, and setting the semiconductor optical amplifier in other time periods except the second time period to an attenuation state; discarding the obtained backscattering signal data before the arrival time point; taking the obtained backscattering signal data from the optical reflector to the fiber line attenuation bidirectional measurement device as the reverse backscattering signal data.

2. An optical fiber link attenuation bidirectional measurement device for implementing the method according to claim 1, applied in a system comprising a fiber under test, an optical reflector, and said optical fiber link attenuation bidirectional measurement device, characterized in that, The optical reflector is connected with one end of the measured optical fiber, and the optical fiber line attenuation bidirectional measurement device is connected with the other end of the measured optical fiber, and the optical fiber line attenuation bidirectional measurement device comprises: An optical transmitter is connected with the optical directional coupler, and is used for transmitting an optical measurement pulse signal to the measured optical fiber through the optical directional coupler; The optical directional coupler is connected with the measured optical fiber and the semiconductor optical amplifier module respectively, and is used for transmitting the optical measurement pulse signal to the measured optical fiber; The semiconductor optical amplifier module is connected with the optical directional coupler and the signal conversion module respectively, and is used for adjusting the state of the semiconductor optical amplifier in a first time period to obtain forward backscattering signal data of the measured optical fiber and adjusting the state of the semiconductor optical amplifier in a second time period to obtain reverse backscattering signal data of the measured optical fiber, wherein the first time period is a time period between a starting time and the arrival time, the second time period is a time period between a second time and a measurement end time, the second time is a time delayed by a preset time after the arrival time, and the preset time is generated according to the width of the optical measurement pulse signal; The signal conversion module is connected with the semiconductor optical amplifier module, and is used for converting optical backscattering signals and optical reflection signals into electrical signals and performing analog-to-digital conversion; The control and calculation module is used for taking the time when the optical fiber line attenuation bidirectional measurement device transmits the optical measurement pulse signal as the starting time, determining the arrival time of the reflection signal corresponding to the optical measurement pulse signal to the optical fiber line attenuation bidirectional measurement device according to the measurement data obtained by the optical fiber line attenuation bidirectional measurement device, and measuring the measured optical fiber according to the forward backscattering signal data and the reverse backscattering signal data.

3. The apparatus of claim 2, wherein, The control and calculation module is specifically used for: Obtaining the reflection signal pulse generated by the optical reflector from the measurement data; Taking the time corresponding to the starting position of the reflection signal pulse as the arrival time.

4. The apparatus of claim 3, wherein, The semiconductor optical amplifier module is specifically used for: Setting the semiconductor optical amplifier in the first time period to an amplification state, and setting the semiconductor optical amplifier in other time periods except the first time period to an attenuation state; Taking the obtained backscattering signal data from the optical fiber line attenuation bidirectional measurement device to the optical reflector as the forward backscattering signal data.

5. The apparatus of claim 2, wherein, The semiconductor optical amplifier module is specifically used for: Setting the semiconductor optical amplifier in the second time period to an amplification state, and setting the semiconductor optical amplifier in other time periods except the second time period to an attenuation state; Discarding the obtained backscattering signal data before the arrival time; Taking the obtained backscattering signal data from the optical reflector to the optical fiber line attenuation bidirectional measurement device as the reverse backscattering signal data.

6. An electronic device, comprising: Comprise: A processor; And A memory for storing executable instructions of the processor; The processor is configured to execute the bidirectional measurement method of fiber line attenuation according to claim 1 by executing the executable instructions.

7. A computer readable storage medium having stored thereon a computer program, characterized in that, The computer program is executed by the processor to implement the bidirectional measurement method of fiber line attenuation according to claim 1.

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