A spectrum measurement method, measurement system and storage medium

Abstract

A spectrum measurement method, measurement system, and storage medium are disclosed. The measurement method includes: adjusting the transmittance of an optical component and placing the optical component at the opening of an integrating sphere; measuring the spectrum of the measuring point of the integrating sphere using a spectrometer to obtain a first measured spectrum of a standard lamp; measuring the spectrum of the measuring point of the integrating sphere using a spectrometer to obtain a second measured spectrum of the lamp under test; varying the transmittance of the optical component and repeating the measurement to obtain a first measured spectrum and a second measured spectrum corresponding to each transmittance; obtaining all first measured spectra and all second measured spectra, fitting them using a fitting function to obtain fitting parameters for the first and second spectra; and calculating a second spectrum based on the first spectra and the fitting parameters. This application can quickly and accurately calculate the second spectrum of the lamp under test.

Description

Technical Field

[0001] The present invention relates to the technical field of endoscope light sources, and in particular to a spectrum measurement method, a measurement system and a storage medium. Background Art

[0002] In medical endoscopes, the spectrum and color temperature of the light source significantly impact the quality of imaging, necessitating accurate measurement of the spectrum. Common measurement equipment involves using a spectrometer and integrating sphere to measure the spectrum of the light source.

[0003] An integrating sphere is a hollow sphere coated with a material with high and uniform spectral reflectivity. It typically has an opening on its surface to receive light from the source being measured. The sphere also has an interface for connecting to a spectrometer to sample and measure the spectrum.

[0004] Existing spectral measurement methods require a standard lamp with a known spectrum as a reference for comparison. The spectrum of the lamp under test is then calculated proportionally using the spectrometer's readings. While this comparative measurement is relatively fast, it can be subject to inaccuracy. This is particularly true when the surface shape or reflectivity of the standard lamp and the light source under test differ significantly. This is due to light leakage through the opening of the integrating sphere. Light that leaks through the opening reflects off the standard lamp or light source under test outside the sphere and then returns to the integrating sphere. This reflected light, however, varies depending on the shape of the standard lamp or light source under test, introducing measurement errors. Summary of the Invention

[0005] The main technical problem solved by the present invention is the large error in existing spectrum measurement.

[0006] According to a first aspect, an embodiment provides a spectrum measurement method, which is applied to a measurement system, wherein the measurement system includes a standard lamp, an integrating sphere, a spectrometer, and an optical component, wherein the optical component has at least three adjustable transmittances, and the measurement method includes:

[0007] Adjust the transmittance of the optical component and set the optical component at the opening of the integrating sphere;

[0008] Turning on the standard lamp, allowing light from the standard lamp to pass through the optical assembly and the opening and enter the integrating sphere; measuring the spectrum of the measuring point of the integrating sphere using a spectrometer to obtain a first measured spectrum of the standard lamp; the standard lamp has a determined first spectrum;

[0009] Turning on the lamp to be tested, allowing light from the lamp to be tested to pass through the optical component and the opening and then enter the integrating sphere; using a spectrometer to measure the spectrum of a measuring point of the integrating sphere to obtain a second measured spectrum of the lamp to be tested; the lamp to be tested has a second measured spectrum;

[0010] Changing the transmittance of the optical component and repeating the measurement to obtain a first measurement spectrum and a second measurement spectrum corresponding to each transmittance;

[0011] All first measurement spectra and all second measurement spectra are acquired, and fitting parameters of the first spectra and the second spectra are obtained by using a fitting function; and the second spectrum is obtained by calculation based on the first spectra and the fitting parameters.

[0012] According to a second aspect, an embodiment provides a spectrum measurement system for measuring a second spectrum of a lamp to be tested, the measurement system comprising:

[0013] a standard lamp having a defined first spectrum;

[0014] An integrating sphere having an opening and a measuring point, wherein a ratio of the opening to an inner surface area of ​​the integrating sphere is a first ratio;

[0015] Spectrometer, used to connect to the integrating sphere to measure the spectrum of the measurement point;

[0016] An optical assembly is provided in front of the opening and has at least three adjustable transmittances; a standard lamp and a lamp to be tested pass through the optical assembly and the opening, respectively, and then enter the integrating sphere; the spectrometer outputs a first measured spectrum of the standard lamp at each transmittance and a second measured spectrum of the lamp to be tested at each transmittance;

[0017] The processing module uses a fitting function to obtain fitting parameters of the first spectrum and the second spectrum according to all the first measurement spectra and all the second measurement spectra; and calculates the second spectrum according to the first spectra and the fitting parameters.

[0018] According to a third aspect, an embodiment provides a computer-readable storage medium, on which a program is stored. The program can be executed by a processor to implement the measurement method described in the first aspect.

[0019] According to the spectrum measurement method, measurement system, and storage medium of the above-mentioned embodiment, by setting an optical component at the opening of the integrating sphere, the first measurement spectrum and the second measurement spectrum can be fitted through multiple transmittance test environments, and the fitting parameters of the first spectrum and the second spectrum can be calculated. The second spectrum of the lamp to be tested is calculated based on the determined first spectrum. This test method can quickly and accurately calculate the second spectrum of the lamp to be tested, which is particularly suitable for large-scale testing needs. BRIEF DESCRIPTION OF THE DRAWINGS

[0020] Figure 1 A schematic diagram of the structure of an existing spectrum measurement system (I);

[0021] Figure 2 A schematic diagram of the structure of an existing spectrum measurement system (II);

[0022] Figure 3 Schematic diagram of another existing spectrum measurement system (I);

[0023] Figure 4 Schematic diagram of another existing spectrum measurement system (II);

[0024] Figure 5 A schematic diagram of the structure of a measurement system provided in one embodiment of the present application (I);

[0025] Figure 6 A schematic diagram of the structure of a measurement system provided in one embodiment of the present application (II);

[0026] Figure 7 A schematic diagram of the structure of an optical component provided in one embodiment of the present application (I);

[0027] Figure 8 A schematic diagram of the structure of an optical component provided in one embodiment of the present application (II);

[0028] Figure 9 A schematic diagram of the structure of an optical component provided in one embodiment of the present application (III);

[0029] Figure 10 A flow chart of a measurement method provided in one embodiment of the present application.

[0030] Reference numerals: 1 - standard lamp; 2 - integrating sphere; 201 - measuring point; 202 - opening; 3 - spectrometer; 301 - optical fiber; 4 - optical component; 41 - turntable; 42 - filter; 43 - polarizer; 5 - processing module; 6 - lamp to be tested. DETAILED DESCRIPTION

[0031] The present invention will be further described in detail below by means of specific embodiments in conjunction with the accompanying drawings. Similar elements in different embodiments are numbered with associated similar elements. In the following embodiments, many detailed descriptions are provided to enable the present application to be better understood. However, those skilled in the art will readily appreciate that some of the features may be omitted in different circumstances, or may be replaced by other elements, materials, or methods. In some cases, some operations related to the present application are not shown or described in the specification. This is to avoid the core portion of the present application being overwhelmed by excessive descriptions, and for those skilled in the art, it is not necessary to describe these related operations in detail. They will fully understand the related operations based on the description in the specification and the general technical knowledge in the art.

[0032] In addition, the features, operations, or characteristics described in the specification may be combined in any appropriate manner to form various embodiments. Furthermore, the steps or actions in the method description may be reordered or adjusted in a manner readily apparent to those skilled in the art. Therefore, the various sequences in the specification and drawings are provided solely for the purpose of clearly describing a particular embodiment and are not intended to be mandatory, unless otherwise specified.

[0033] The serial numbers assigned to components herein, such as "first," "second," etc., are used solely to distinguish the objects being described and do not convey any sequential or technical meaning. References to "connection" and "coupling" herein, unless otherwise specified, include both direct and indirect connections (couplings).

[0034] like Figure 1 and Figure 2 As shown, the first existing spectral measurement method, such as Figure 1 As shown, a standard lamp (whose spectrum has been measured as φ1) is installed at the outlet of the integrating sphere, and the standard lamp is turned on, and the reading of the spectrometer is y1.

[0035] like Figure 2 As shown, install the lamp to be tested (endoscope tip) at the opening of the integrating sphere, turn on the endoscope light source, and the reading of the spectrum system is y2.

[0036] At this time, the spectrum of the endoscope light source can be calculated as: φ2 = y2 × φ1 / y1.

[0037] While the above measurement method is relatively fast, it can also be prone to inaccuracy. This is particularly true when the surface shape or reflectivity of the standard lamp and the light source (under test lamp) differ significantly. This is due to light leakage through the opening of the integrating sphere. Light that leaks through the opening reflects off the standard lamp or light source outside the sphere and then returns to the integrating sphere. This reflected light, however, varies depending on the shape of the standard lamp or light source outside the sphere, causing measurement errors.

[0038] like Figure 3 and Figure 4 As shown, the second existing spectrum measurement method, such as Figure 3 As shown, install and light the standard lamp to calibrate the system, and measure the spectrometer reading: y1.

[0039] Turn off the standard lamp and turn on the auxiliary lamp to test the spectrum data. The measured spectrometer reading is: y f1 .

[0040] like Figure 4 As shown, the standard lamp is replaced with the lamp to be tested, and the auxiliary lamp is lit to test the spectrum. The measured spectrometer reading is: y f2 .

[0041] Turn off the auxiliary light and light up the lamp to be tested. The spectrum of the lamp y2 to be tested is calculated as:

[0042]

[0043] Where φ1 is the standard lamp spectrum.

[0044] Figure 3 and Figure 4 The measurement method uses an auxiliary lamp to compensate for the difference in reflected light between the standard lamp and the lamp under test. However, whether the compensation is effective is still uncertain, and the auxiliary lamp needs to be frequently turned on and off. Each time the auxiliary lamp is turned on, it takes about 10 minutes for the spectrum to stabilize. When testing large quantities of large specifications, it is also easy to introduce human error. The above measurement method is time-consuming, cumbersome, and easily affected by human error.

[0045] The embodiment of the present application provides a spectrum measurement method, measurement system, and storage medium, which can eliminate the reflection error between the standard lamp 1 and the lamp to be tested 6 at the opening, and can also quickly improve the spectrum measurement efficiency of the lamp to be tested 6.

[0046] like Figure 5 and Figure 6 As shown, an embodiment of the present application provides a spectrum measurement system for measuring a second spectrum of a lamp to be tested 6 . The measurement system may include: a standard lamp 1 , an integrating sphere 2 , a spectrometer 3 , an optical component 4 and a processing module 5 .

[0047] The standard lamp 1 has a defined first spectrum.

[0048] The integrating sphere 2 has a measuring point 201 and an opening 202 . Light entering the integrating sphere 2 is transmitted to the optical fiber 301 of the spectrometer 3 via the measuring point 201 . The ratio of the opening 202 to the inner surface area of ​​the integrating sphere 2 is a first ratio.

[0049] The spectrometer 3 is connected to the integrating sphere 2 via the optical fiber 301 , measures the spectrum of the measuring point 201 , and outputs the measured value to the processing module 5 .

[0050] The optical component 4 is arranged in front of the opening 202 and has at least three adjustable transmittances. The standard lamp 1 and the lamp to be tested 6 enter the integrating sphere 2 after passing through the optical component 4 and the opening 202 respectively. The spectrometer 3 outputs a first measurement spectrum of the standard lamp 1 at each transmittance and a second measurement spectrum of the lamp to be tested 6 at each transmittance.

[0051] The processing module 5 obtains fitting parameters of the first and second spectra using a fitting function according to all the first measured spectra and all the second measured spectra; and obtains the second spectrum according to the first spectra and the fitting parameters.

[0052] In one embodiment, all transmittances of the optical component 4 are less than or equal to 0.1. The optical component 4 can reduce the reflection error at the opening 202 of the integrating sphere 2 by controlling the transmittance.

[0053] In one embodiment, Figure 7 and Figure 8 As shown, the optical component 4 may include at least three filters 42 , each filter 42 has a different transmittance, and one filter 42 or a combination of multiple filters 42 forms a transmittance of the optical component 4 .

[0054] In one embodiment, Figure 9 As shown, the optical component 4 may include at least two polarizers 43 , and the surfaces of the two polarizers 43 are bonded together. By changing the relative polarization directions of the two polarizers 43 to change the transmittance of the two polarizers 43 , the transmittance of the optical component 4 is correspondingly changed.

[0055] The measurement method is described in detail below.

[0056] like Figure 10 As shown, the embodiment of the present application also provides a spectrum measurement method, which is applied to a measurement system. The measurement system includes a standard lamp 1, an integrating sphere 2, a spectrometer 3, and an optical component 4. The optical component 4 has at least three adjustable transmittances. The measurement method may include:

[0057] Step 1: Adjust the transmittance of the optical component 4 and place the optical component 4 in the opening 202 of the integrating sphere 2.

[0058] Step 2: Figure 5 As shown, the standard lamp 1 is turned on, and the light of the standard lamp 1 passes through the optical component 4 and the opening 202 and enters the integrating sphere 2; the spectrum of the measuring point 201 of the integrating sphere 2 is measured using the spectrometer 3 to obtain a first measured spectrum of the standard lamp 1; the standard lamp 1 has a determined first spectrum.

[0059] Step 3: Figure 6 As shown, the lamp 6 to be tested is turned on, and the light of the lamp 6 to be tested enters the integrating sphere 2 after passing through the optical component 4 and the opening 202; the spectrum of the measuring point 201 of the integrating sphere 2 is measured by the spectrometer 3 to obtain a second measured spectrum of the lamp 6 to be tested; the lamp 6 to be tested has a second spectrum to be measured.

[0060] Step 4: Repeat steps 1 to 3 to change the transmittance of optical component 4, obtaining a first measurement spectrum and a second measurement spectrum corresponding to each transmittance. The order of executing steps 2 and 3 is not limited. Steps 2 and 3 may be repeated once for each change in the transmittance of optical component 4. Alternatively, for each transmittance of optical component 4, only one of steps 2 and 3 may be repeated, followed by the other step for each transmittance of optical component 4.

[0061] Step 5: Obtain all first measured spectra and all second measured spectra, use a fitting function to obtain fitting parameters for the first and second spectra, and calculate the second spectrum based on the first spectra and the fitting parameters. The fitting parameters are used to characterize the proportional relationship between the first and second spectra.

[0062] In one embodiment, the fitting function may be:

[0063]

[0064] Wherein, a is the fitting parameter, b = x × r1, c = x × r2, r1 is the reflectance of light leakage from the standard lamp 1 at the opening 202, r2 is the reflectance of light leakage from the lamp to be tested 6 at the opening 202, x is the ratio of the area of ​​the opening 202 to the inner surface area of ​​the integrating sphere 2, t is the transmittance of the optical component 4; y1 is the first measured spectrum, and y2 is the second measured spectrum.

[0065] The second spectrum can be calculated using the following formula 1:

[0066] φ2=φ1×a.

[0067] Wherein, φ1 is the first spectrum and φ2 is the second spectrum.

[0068] The following description will be made by taking the optical component 4 as a plurality of filters 42 as an example.

[0069] In one embodiment, when three or more filters 42 are used, as shown in FIG. Figure 5 and Figure 6 As shown, a filter 42 with a preset transmittance is placed in front of the opening 202 of the integrating sphere 2, and the first measurement spectrum y1 of the standard lamp 1 and the second measurement spectrum y2 of the lamp to be tested 6 at the current transmittance are measured. The filter 42 with different transmittances is replaced and y1 and y2 are measured multiple times. Each time, the ratio of the second measurement spectrum to the first measurement spectrum is calculated, that is, f = y2 / y1, and the fitting function f(x) = a × (1-b × t 2 ) / (1-c×t 2 ), fit the fitting parameter a, and finally φ2=a×φ1.

[0070] The specific analysis process is as follows:

[0071] 1. Assume that the spectrum of the lamp 6 to be tested is φ2. The light leakage ratio of the opening 202 of the integrating sphere 2 is x (the ratio of the area of ​​the opening 202 to the inner surface area of ​​the integrating sphere 2). Then the light leaking from the opening is x×φ2.

[0072] 2. Assuming that the transmittance of the filter 42 is t, the reflectance of the lamp under test 6 to the light leaking from the opening 202 is r2.

[0073] 3. The luminous flux that is directly or reflected from the opening 202 of the integrating sphere 2 through the lamp 6 to be tested and enters the integrating sphere 2 multiple times is and the value measured by the spectrometer 3 is:

[0074]

[0075] 4. Similarly, when the lamp to be tested 6 is replaced with the standard lamp 1, the value measured by the spectrometer 3 is:

[0076]

[0077] Wherein φ1 is the luminous flux of the standard lamp 1 , and r1 is the reflectance of the light leaked from the standard lamp 1 at the opening 202 .

[0078] 5. From 3 and 4 we can know:

[0079]

[0080] 6. According to the above analysis, in the first existing test solution, since the absence of the filter 42 is equivalent to t=1, the error source is that r1-r2 is not equal to 0.

[0081] 7. When the ratio x of the standard lamp 1, the lamp to be tested 6 and the opening 202 of the integrating sphere 2 is relatively small, under the primary approximation, the measurement error is proportional to (r1-r2)xt 2 , using a filter 42 with a transmittance of 0.1 can reduce the measurement error (reflection error) to 1% of the original error. Therefore, using only one filter 42 with a transmittance less than or equal to 0.1 can significantly reduce the measurement error.

[0082] The formula in step 5 above can also be rewritten as:

[0083]

[0084] It can be seen that φ2 / φ1 is the fitting function f(x) = a×(1-b×t 2 ) / (1-c×t 2 ) can be obtained by using multiple (at least 3) filters 42, such as Figure 7 and Figure 8As shown, by switching the filters 42 with different transmittances through a rotating disk 41, the ratio f=y2 / y1 at each transmittance is measured, and the curve f(x) is fitted to obtain a=φ2 / φ1. Since the first spectrum φ1 is the spectrum value of the standard lamp 1, the second spectrum φ2 of the lamp to be tested 6 can be calculated.

[0085] As can be seen, the fitting function described above is based on the relationship between the first spectrum, the first measured spectrum, and the reflection error, as well as the relationship between the second spectrum, the second measured spectrum, and the reflection error. This is proposed after analyzing the relationship between the first spectrum and the first measured spectrum, and cleverly introduces filter 42 (optical component 4) to reduce the reflection error and solve for the fitting parameters. Ultimately, the second spectrum is measured while significantly reducing the reflection error (to below 1%) and improving measurement efficiency.

[0086] In one embodiment, when the optical component 4 uses at least two polarizers 43, as shown in FIG. Figure 9 As shown, the optical component 4 includes two polarizers 43 as an example.

[0087] In order to make the above fitting function f(x) = a×(1-b×t 2 ) / (1-c×t 2 ) to get a more accurate fit, or you can take Figure 9 By using two linear polarizers 43 and changing (rotating one of the polarizers 43) the relative polarization direction of the two polarizers 43, the transmittance of light in the two polarizers 43 can be continuously changed, thereby obtaining a continuous transmittance, so that f(x) = a×(1-b×t 2 ) / (1-c×t 2 Compared with the method of using the filter 42, the combination of the polarizer 43 can provide more transmittance measurement conditions and reduce the measurement cost.

[0088] That is to say, a plurality of continuous different transmittances can be formed, and more ratios f=y2 / y1 under transmittances can be obtained, so that the fitting is more precise, and the second spectrum calculated by the above method is more accurate.

[0089] The measurement system and measurement method of the above embodiment can compensate for the error caused by the different reflectivities of the standard lamp 1 and the lamp to be tested 6; eliminate the need to install an auxiliary lamp inside the integrating sphere 2, simplifying the measurement device; and save a large amount of auxiliary lamp switching and spectrum stabilization time, making it suitable for large-scale testing of light sources in mass production.

[0090] In summary, this application analyzes the causes of reflection errors and proposes to use a light source component to reduce reflection errors. It further proposes to perform spectral measurements with multiple transmittances, fit multiple first measurement spectra and second measurement spectra, and determine the fitting parameters of the first spectrum and the second spectrum through a fitting function, so as to quickly and accurately obtain the second spectrum.

[0091] Those skilled in the art will appreciate that all or part of the functions of the various methods in the above embodiments can be implemented by hardware or by computer program. When all or part of the functions in the above embodiments are implemented by computer program, the program can be stored in a computer-readable storage medium, and the storage medium can include: read-only memory, random access memory, disk, optical disk, hard disk, etc., and the program is executed by a computer to implement the above functions. For example, the program is stored in the memory of the device, and when the program in the memory is executed by the processor, all or part of the above functions can be implemented. In addition, when all or part of the functions in the above embodiments are implemented by computer program, the program can also be stored in a storage medium such as a server, another computer, disk, optical disk, flash disk or mobile hard disk, and saved in the memory of the local device by downloading or copying, or the system of the local device is updated. When the program in the memory is executed by the processor, all or part of the functions in the above embodiments can be implemented.

[0092] This document is described with reference to various exemplary embodiments. However, those skilled in the art will recognize that changes and modifications may be made to the exemplary embodiments without departing from the scope of this document. For example, the various operational steps and components used to perform the operational steps may be implemented in different ways (e.g., one or more steps may be deleted, modified, or incorporated into other steps) depending on the specific application or considering any number of cost functions associated with the operation of the system.

[0093] Although the principles of this invention have been shown in various embodiments, many modifications of structure, arrangement, proportion, elements, materials and components that are particularly suitable for specific environments and operational requirements can be used without departing from the principles and scope of this invention. The above modifications and other changes or amendments are intended to be included within the scope of this invention.

[0094] The foregoing detailed description has been described with reference to various embodiments. However, those skilled in the art will recognize that various modifications and changes can be made without departing from the scope of this disclosure. Therefore, the present disclosure will be considered in an illustrative rather than a restrictive sense, and all such modifications will be included within its scope. Similarly, the advantages, other advantages and solutions to the problems of the various embodiments have been described above. However, the benefits, advantages, solutions to the problems and any elements that can produce these, or make them more specific, should not be interpreted as critical, required or necessary. The term "comprising" and any other variants used in this article are all non-exclusive inclusions, so that a process, method, article or device that includes a list of elements includes not only these elements, but also other elements that are not explicitly listed or do not belong to the process, method, system, article or device. In addition, the term "coupled" and any other variants used in this article refer to physical connections, electrical connections, magnetic connections, optical connections, communication connections, functional connections and / or any other connections.

[0095] Those skilled in the art will recognize that many changes can be made to the details of the above embodiments without departing from the basic principles of the invention. Therefore, the scope of the present invention should be determined solely by the claims.

Claims

1. A method for measuring a spectrum, characterized in that: Applied to a measurement system comprising a standard lamp, an integrating sphere, a spectrometer, and an optical component, wherein the optical component has at least three adjustable transmittances, the measurement method comprises: adjusting the transmittance of the optical component and placing the optical component at the opening of the integrating sphere; Turning on a standard lamp, allowing light from the standard lamp to pass through the optical assembly and the opening and then enter the integrating sphere; measuring a spectrum at a measuring point of the integrating sphere using the spectrometer to obtain a first measured spectrum of the standard lamp; the standard lamp having a determined first spectrum; Turning on the lamp to be tested, allowing light from the lamp to pass through the optical assembly and the opening and then enter the integrating sphere; measuring a spectrum at a measuring point of the integrating sphere using the spectrometer to obtain a second measured spectrum of the lamp to be tested; the lamp to be tested has a second measured spectrum; Changing the transmittance of the optical component and repeating the measurement to obtain the first measurement spectrum and the second measurement spectrum corresponding to each transmittance; All the first measured spectra and all the second measured spectra are acquired, and fitting parameters of the first spectra and the second spectra are obtained by using a fitting function; and the second spectrum is obtained by calculation based on the first spectra and the fitting parameters.

2. The measuring method according to claim 1, wherein The fitting function is: Wherein, a is the fitting parameter, b=x×r1, c=x×r2, r1 is the reflectance of light leakage of the standard lamp at the opening, r2 is the reflectance of light leakage of the lamp under test at the opening, x is the ratio of the opening area to the inner surface area of ​​the integrating sphere, i.e., the first ratio, t is the transmittance of the optical component; y1 is the first measured spectrum, and y2 is the second measured spectrum; The second spectrum is calculated using the following formula 1: φ2=φ1×a; Wherein, φ1 is the first spectrum, and φ2 is the second spectrum.

3. The measuring method according to claim 1, wherein: All transmittances of the optical components are less than or equal to 0.

1.

4. The measuring method according to any one of claims 1 to 3, wherein: The optical component includes at least three filters, each of which has a different transmittance, and one filter or a combination of multiple filters forms a transmittance of the optical component.

5. The measuring method according to any one of claims 1 to 3, characterized in that: The optical component includes at least two polarizers, and the surfaces of the two polarizers are bonded together. By changing the relative polarization directions of the two polarizers, the transmittance of the two polarizers is changed, and the transmittance of the optical component is correspondingly changed.

6. A spectrum measurement system, characterized in that: For measuring a second spectrum of a lamp to be tested, the measuring system comprises: a standard lamp having a defined first spectrum; An integrating sphere having an opening and a measuring point, wherein a ratio of the opening to an inner surface area of ​​the integrating sphere is a first ratio; A spectrometer, connected to the integrating sphere, for measuring the spectrum of the measurement point; an optical assembly disposed in front of the opening and having at least three adjustable transmittances; the standard lamp and the lamp to be tested respectively pass through the optical assembly and the opening and then enter the integrating sphere, and the spectrometer outputs a first measured spectrum of the standard lamp at each transmittance and a second measured spectrum of the lamp to be tested at each transmittance; The processing module uses a fitting function to obtain fitting parameters of the first spectrum and the second spectrum according to all the first measured spectra and all the second measured spectra; and calculates the second spectrum according to the first spectra and the fitting parameters.

7. The measurement system according to claim 6, wherein: All transmittances of the optical components are less than or equal to 0.

1.

8. The measuring system according to claim 6 or 7, characterized in that The optical component includes at least three filters, each of which has a different transmittance, and one filter or a combination of multiple filters forms a transmittance of the optical component.

9. The measuring system according to claim 6 or 7, characterized in that The optical component includes at least two polarizers, and the surfaces of the two polarizers are bonded together. By changing the relative polarization directions of the two polarizers, the transmittance of the two polarizers is changed, and the transmittance of the optical component is correspondingly changed.

10. A computer-readable storage medium, characterized in that The medium stores a program, which can be executed by a processor to implement the measurement method according to any one of claims 1 to 5.

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