Spherical near-field measurement method and system

Abstract

The present invention provides a spherical near-field measurement method and system. The spherical near-field measurement method of the present invention adopts an asymptotic approximation measurement method combined with a numerical interpolation method, thereby reducing the sampling points of the #imgabs0# surface while ensuring measurement accuracy, greatly improving measurement efficiency, shortening measurement time, and alleviating the technical problem of the existing spherical near-field measurement method having a large number of sampling points, resulting in long measurement time and low measurement efficiency.

Description

Technical Field

[0001] The present invention relates to the technical field of communications, and in particular to a spherical near-field measurement method and system. Background Art

[0002] Antennas are essential components in applications such as communications and radar, and measuring and verifying antenna parameters is an integral part of the antenna design process. Key aspects of antenna measurement include measuring the antenna's electrical and radiation parameters to evaluate its performance. Spherical near-field measurement, based on spherical wave expansion, is a widely used and comprehensive approach for antenna pattern measurement. It is commonly used for antenna pattern measurements on large devices under test, such as automotive antennas, satellite antennas, and phased array antennas.

[0003] Spherical near-field measurement is a measurement method that collects data in the near-field area of the device under test and then uses an algorithm to restore the near-field data to the far-field. The spherical wave expansion method is the basis of spherical near-field measurement. The sampling interval required by the spherical wave expansion method is related to the number of modes of the antenna under test. The more modes there are, the denser the sampling interval is required. In spherical near-field measurement, the coordinate system is as follows: Figure 1 As shown in the spherical wave expansion method, the maximum number of modes calculated on the θ plane is usually expressed as N. The surface is represented by M, and N depends on the frequency and size of the antenna under test. The higher the frequency and the larger the size of the device under test, the larger the number of modes N is, and the smaller the sampling interval is required. The number of modes of the surface is M≤N, and in most cases, The maximum mode number of a surface is usually M=N. Therefore, in the current spherical wave algorithm, M=N is usually taken, which can be conveniently used to calculate the inverse Fourier transform and ensure that the complete mode number can be calculated to obtain accurate calculation results. Therefore, the currently commonly used spherical near-field measurements are all for the θ surface and The same sampling interval is adopted for all surfaces.

[0004] Existing spherical near-field measurement methods require a large number of sampling points and a long measurement time, especially for millimeter-wave antennas or large antennas. For antennas operating at frequencies ranging from tens to hundreds of GHz, a sampling interval of 0.1° or even smaller may be required. At this sampling interval, measuring the entire spherical surface of the antenna would require approximately 1,800 x 3,600 = 6,480,000 angular positions, potentially taking several days to complete, making the measurement process extremely inefficient.

[0005] In summary, the existing spherical near-field measurement method has technical problems such as long measurement time and low measurement efficiency due to the large number of sampling points. Summary of the Invention

[0006] In view of this, the object of the present invention is to provide a spherical near-field measurement method and system to alleviate the technical problems of the existing spherical near-field measurement method having a large number of sampling points, resulting in long measurement time and low measurement efficiency.

[0007] In a first aspect, an embodiment of the present invention provides a spherical near-field measurement method, comprising:

[0008] Performing a first sampling on the antenna under test, performing a first interpolation process on the obtained first sampling data, and calculating the sampling data after the first interpolation process to obtain a first far-field radiation pattern of the antenna under test, wherein, in the first sampling, The sampling interval of the θ plane is a first sampling interval, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the first sampling interval is greater than the sampling interval of the θ plane;

[0009] Performing a second sampling on the antenna under test, performing a second interpolation process on the obtained second sampling data and the first sampling data, and calculating the sampling data after the second interpolation process to obtain a second far-field radiation pattern of the antenna under test, wherein the second sampling is a second interpolation of the previous sampling. Surface encryption and supplementary sampling;

[0010] Determine whether two adjacent far-field radiation patterns meet the preset measurement accuracy;

[0011] If satisfied, the first sampling interval or The corresponding sampling interval after surface encryption supplementary sampling is used as The target sampling interval of the surface, and the first far-field radiation pattern or the second far-field radiation pattern is used as the antenna pattern of the antenna under test;

[0012] If not, the second sampling data and the first sampling data are used as the first sampling data, and the step of performing the second sampling on the antenna under test is returned to, until the two adjacent far-field radiation patterns meet the preset measurement accuracy, and any sampling interval in the sampling intervals corresponding to the two adjacent far-field radiation patterns is used as The target sampling interval of the surface is set, and any far-field radiation pattern of the two adjacent far-field radiation patterns is used as the antenna pattern of the antenna under test.

[0013] Furthermore, before performing the first sampling on the antenna under test, the method further includes:

[0014] The antenna under test is simulated and measured according to the spherical near field measurement method, and the simulated measurement results are The target sampling interval of the surface is used as the first sampling interval.

[0015] Furthermore, before performing the first sampling on the antenna under test, the method further includes:

[0016] Obtaining a correspondence between beam width and sampling interval, wherein the correspondence is obtained by performing simulation measurement on antennas under test with different beam widths according to the spherical near-field measurement method;

[0017] Obtaining the beam width of the antenna under test;

[0018] Determining, according to the beam width of the antenna under test and the corresponding relationship, a sampling interval corresponding to the beam width of the antenna under test;

[0019] A sampling interval corresponding to the beam width of the antenna under test is used as the first sampling interval.

[0020] Furthermore, returning to the step of performing a second sampling on the antenna under test includes:

[0021] Determine the target of measurement accuracy that does not meet the preset Angular range;

[0022] In the target The antenna under test is sampled for the second time within an angular range.

[0023] Furthermore, the areas of the first sampling and the second sampling are located in the local spherical area of the antenna under test. After the target sampling interval of the surface is reached, the method further comprises:

[0024] The The target sampling interval of the surface is used as the first sampling interval, and the process returns to the step of performing the first sampling on the antenna under test.

[0025] Furthermore, if the antenna under test is any one of a batch of identical antennas under test and / or the antenna under test is a qualified antenna under test, the method further includes:

[0026] Performing a spherical near-field measurement on the antenna under test to obtain a standard far-field radiation pattern of the antenna under test, wherein in the spherical near-field measurement, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the sampling interval of the θ plane is equal to Sampling interval of the surface;

[0027] Determining whether the first far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy;

[0028] If satisfied, the first sampling interval is used as The target sampling interval of the surface, and the The target sampling interval of the surface is used to sample other antennas under test in the batch of identical antennas under test, so as to perform spherical near-field measurement on the other antennas under test;

[0029] If not, determining whether the second far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy;

[0030] If satisfied, then The corresponding sampling interval after surface encryption supplementary sampling is used as The target sampling interval of the surface, and the The target sampling interval of the surface is used to sample other antennas under test in the batch of identical antennas under test, so as to perform spherical near-field measurement on the other antennas under test;

[0031] If not, return to the step of performing a second sampling on the antenna under test until the latest second far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy, and use the sampling interval corresponding to the latest second far-field radiation pattern as The target sampling interval of the surface, and then, the The target sampling interval of the surface is used to sample other antennas under test in the batch of identical antennas under test, so as to perform spherical near-field measurement on the other antennas under test.

[0032] Furthermore, if the antenna under test is any one of a batch of identical antennas under test and / or the antenna under test is a qualified antenna under test, the method further includes:

[0033] Performing a spherical near-field measurement on the antenna under test to obtain a standard far-field radiation pattern of the antenna under test, wherein in the spherical near-field measurement, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the sampling interval of the θ plane is equal to Sampling interval of the surface;

[0034] Sparse sampling is performed on the antenna under test, and a third interpolation process is performed on the obtained sparse sampling data, and the sampling data after the third interpolation process is calculated to obtain a third far-field radiation pattern of the antenna under test, wherein, in the sparse sampling, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, The sampling interval of the surface is greater than the sampling interval of the θ surface;

[0035] Determining whether the third far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy;

[0036] If satisfied, return to the step of sparse sampling of the antenna under test until the latest third far-field radiation pattern and the standard far-field radiation pattern do not meet the preset measurement accuracy, and the sampling interval corresponding to the last third far-field radiation pattern is used as The target sampling interval of the surface, and then, the The target sampling interval of the surface is used to sample other antennas under test in the batch of identical antennas under test, so as to perform spherical near-field measurement on the other antennas under test.

[0037] Furthermore, the preset measurement accuracy includes: a gain difference between two adjacent far-field radiation patterns is less than a preset threshold.

[0038] Furthermore, the local spherical area includes the main beam of the antenna under test.

[0039] Furthermore, the number of the first sampling interval is at least one, The number of intervals corresponding to surface encryption supplementary sampling is at least one.

[0040] In a second aspect, an embodiment of the present invention further provides a spherical near-field measurement system, which uses the spherical near-field measurement method described in any one of the first aspects to perform spherical near-field measurement on the antenna under test. The spherical near-field measurement system includes: a measuring antenna, a measuring instrument, and a host computer.

[0041] In an embodiment of the present invention, a spherical near-field measurement method is provided, comprising: performing a first sampling on the antenna under test, performing a first interpolation process on the obtained first sampling data, and calculating the sampled data after the first interpolation process to obtain a first far-field radiation pattern of the antenna under test, wherein, in the first sampling, The sampling interval of the θ plane is the first sampling interval, and the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the first sampling interval is greater than the sampling interval of the θ plane; performing a second sampling on the antenna under test, and performing a second interpolation process on the obtained second sampling data and the first sampling data, and calculating the sampling data after the second interpolation process to obtain a second far-field radiation pattern of the antenna under test, wherein the second sampling is a second sampling of the previous sampling. The surface is encrypted and supplemented with sampling; it is judged whether the two adjacent far-field radiation patterns meet the preset measurement accuracy; if so, the first sampling interval or the The corresponding sampling interval after surface encryption supplementary sampling is used as The target sampling interval of the surface is determined, and the first far-field radiation pattern or the second far-field radiation pattern is used as the antenna pattern of the antenna under test; if it is not satisfied, the second sampling data and the first sampling data are used as the first sampling data, and the step of performing the second sampling on the antenna under test is returned to, until the two adjacent far-field radiation patterns meet the preset measurement accuracy, and any sampling interval in the sampling intervals corresponding to the two adjacent far-field radiation patterns is used as The target sampling interval of the surface is set, and any of the two adjacent far-field radiation patterns is used as the antenna pattern of the antenna under test. From the above description, it can be seen that the spherical near-field measurement method of the present invention adopts a progressive approximation measurement method combined with a numerical interpolation method to achieve the goal of reducing the measurement accuracy under the premise of ensuring the measurement accuracy. The sampling points on the surface greatly improve the measurement efficiency, shorten the measurement time, and alleviate the technical problems of the existing spherical near-field measurement method with a large number of sampling points, which leads to long measurement time and low measurement efficiency. BRIEF DESCRIPTION OF THE DRAWINGS

[0042] In order to more clearly illustrate the specific embodiments of the present invention or the technical solutions in the prior art, the following briefly introduces the drawings required for use in the specific embodiments or the description of the prior art. Obviously, the drawings described below are some embodiments of the present invention. For ordinary technicians in this field, other drawings can be obtained based on these drawings without paying any creative work.

[0043] Figure 1 Schematic diagram of the spherical near-field measurement coordinate system;

[0044] Figure 2 The present invention provides a flowchart of a spherical near-field measurement method. DETAILED DESCRIPTION

[0045] The following will clearly and completely describe the technical solutions of the present invention in conjunction with the embodiments. Obviously, the embodiments described are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by ordinary technicians in this field without making creative efforts are within the scope of protection of the present invention.

[0046] Currently, the commonly used spherical near-field measurements are all about the θ surface and The same sampling interval is adopted for all surfaces, so a large number of sampling points are required, the measurement time is long, and the measurement efficiency is low.

[0047] Based on this, the spherical near-field measurement method of the present invention adopts a progressive approximation measurement method combined with a numerical interpolation method to achieve the goal of reducing the measurement accuracy under the premise of ensuring the measurement accuracy. The sampling points on the surface greatly improve the measurement efficiency and shorten the measurement time.

[0048] To facilitate understanding of this embodiment, a spherical near-field measurement method disclosed in an embodiment of the present invention is first introduced in detail.

[0049] Example 1:

[0050] According to an embodiment of the present invention, an embodiment of a spherical near-field measurement method is provided. It should be noted that the steps shown in the flowchart of the accompanying drawings can be executed in a computer system such as a set of computer-executable instructions, and although a logical order is shown in the flowchart, in some cases, the steps shown or described can be executed in an order different from that shown here.

[0051] Figure 2 FIG. 1 is a flow chart of a spherical near-field measurement method according to an embodiment of the present invention. Figure 2 As shown, the method includes the following steps:

[0052] Step S201: perform a first sampling on the antenna under test, perform a first interpolation process on the obtained first sampling data, and calculate the sampling data after the first interpolation process to obtain a first far-field radiation pattern of the antenna under test, wherein, in the first sampling, The sampling interval of the plane is a first sampling interval, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the first sampling interval is greater than the sampling interval of the θ plane;

[0053] Specifically, a numerical interpolation method is used to perform a first interpolation process on the first sampled data to obtain sampled data after the first interpolation process, wherein the sampled data after the first interpolation process is The sampling interval of the plane is equal to the sampling interval of the θ plane. Then, the sampling data after the first interpolation processing is calculated using the spherical wave expansion method to obtain the first far-field radiation pattern of the antenna under test.

[0054] The above-mentioned numerical interpolation method can adopt spline interpolation or other interpolation methods (for example, linear interpolation, Lagrange interpolation, Newton interpolation, piecewise interpolation or other polynomial interpolation methods). Because the characteristics of different antennas under test are different, if necessary, a customized and optimized interpolation method can be adopted for a specific antenna under test.

[0055] The number of the first sampling intervals is at least one, that is, The sampling intervals of the surface can be equal or unequal.

[0056] Step S202: perform a second sampling on the antenna under test, perform a second interpolation process on the obtained second sampling data and the first sampling data, and calculate the sampling data after the second interpolation process to obtain a second far-field radiation pattern of the antenna under test, wherein the second sampling is a second far-field radiation pattern of the previous sampling. Surface encryption and supplementary sampling;

[0057] Specifically, for example, the first sampling The second sampling can be performed on four sections of 0°, 90°, 180° and 270°. It is carried out on four sections at 45°, 135°, 225° and 315°.

[0058] After obtaining the second sampling data, the first sampling data and the second sampling data are combined, and the combined sampling data are subjected to a second interpolation process by using a numerical interpolation method to obtain the sampling data after the second interpolation process, wherein the sampling data after the second interpolation process is The sampling interval of the plane is equal to the sampling interval of the θ plane. Then, the sampling data after the second interpolation processing is calculated using the spherical wave expansion method to obtain the second far-field radiation pattern of the antenna under test.

[0059] above The number of intervals corresponding to the surface encryption supplementary sampling is at least one, that is, Surface encryption supplementary sampling can be equally spaced Surface encryption and supplementary sampling can also be unequally spaced Surface encryption and supplementary sampling.

[0060] Step S203, determining whether two adjacent far-field radiation patterns meet a preset measurement accuracy;

[0061] The above-mentioned preset measurement accuracy includes: a gain difference between two adjacent far-field radiation patterns is less than a preset threshold.

[0062] As an example, the preset threshold may be 0.1 dB. The measurement accuracy requirements for different locations in the far-field radiation pattern may vary. For example, the measurement accuracy requirements for locations with high energy, such as the main lobe, are generally higher, while the requirements for locations with low energy, such as the null point, may be relaxed. The specific requirements are set based on meeting measurement requirements.

[0063] Step S204: If satisfied, the first sampling interval or The corresponding sampling interval after surface encryption supplementary sampling is used as The target sampling interval of the surface, and the first far-field radiation pattern or the second far-field radiation pattern is used as the antenna pattern of the antenna under test;

[0064] Step S205: If the condition is not met, the second sampling data and the first sampling data are used as the first sampling data, and the process returns to the step of performing the second sampling on the antenna under test until the far-field radiation patterns of two adjacent times meet the preset measurement accuracy, and any sampling interval in the sampling intervals corresponding to the two adjacent far-field radiation patterns is used as the second sampling interval. The target sampling interval of the surface is set, and any of the two adjacent far-field radiation patterns is taken as the antenna pattern of the antenna under test.

[0065] In the present invention, the sampling interval of the θ plane is not changed. The radiation pattern of the antenna is Surfaces usually have certain symmetry or change patterns. The number of modes of a face is usually less than N, but if we simply reduce The number of sampling points on the surface will cause calculation errors in the spherical wave expansion method. Based on this, the present invention adopts a progressive approximation measurement method combined with a numerical interpolation method to achieve the goal of reducing the number of sampling points on the surface while ensuring the measurement accuracy. The sampling points on the surface can greatly improve the measurement efficiency.

[0066] In an embodiment of the present invention, a spherical near-field measurement method is provided, comprising: performing a first sampling on the antenna under test, performing a first interpolation process on the obtained first sampling data, and calculating the sampled data after the first interpolation process to obtain a first far-field radiation pattern of the antenna under test, wherein, in the first sampling, The sampling interval of the θ plane is the first sampling interval, and the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the first sampling interval is greater than the sampling interval of the θ plane; performing a second sampling on the antenna under test, and performing a second interpolation process on the obtained second sampling data and the first sampling data, and calculating the sampling data after the second interpolation process to obtain a second far-field radiation pattern of the antenna under test, wherein the second sampling is a second sampling of the previous sampling. The surface is encrypted and supplemented with sampling; it is judged whether the two adjacent far-field radiation patterns meet the preset measurement accuracy; if so, the first sampling interval or the The corresponding sampling interval after surface encryption supplementary sampling is used as The target sampling interval of the surface is determined, and the first far-field radiation pattern or the second far-field radiation pattern is used as the antenna pattern of the antenna under test; if it is not satisfied, the second sampling data and the first sampling data are used as the first sampling data, and the step of performing the second sampling on the antenna under test is returned to, until the two adjacent far-field radiation patterns meet the preset measurement accuracy, and any sampling interval in the sampling intervals corresponding to the two adjacent far-field radiation patterns is used as The target sampling interval of the surface is set, and any of the two adjacent far-field radiation patterns is used as the antenna pattern of the antenna under test. From the above description, it can be seen that the spherical near-field measurement method of the present invention adopts a progressive approximation measurement method combined with a numerical interpolation method to achieve the goal of reducing the measurement accuracy under the premise of ensuring the measurement accuracy. The sampling points on the surface greatly improve the measurement efficiency, shorten the measurement time, and alleviate the technical problems of the existing spherical near-field measurement method with a large number of sampling points, which leads to long measurement time and low measurement efficiency.

[0067] The above content briefly introduces the spherical near-field measurement method of the present invention. The specific contents involved are described in detail below.

[0068] In an optional embodiment of the present invention, before performing the first sampling on the antenna under test, the method further includes:

[0069] The antenna under test is simulated and measured according to the spherical near-field measurement method, and the simulated measurement results are The target sampling interval of the surface is used as the first sampling interval. This process can reduce the number of subsequent iterations. It can be understood that the simulation measurement here is to perform calculations in the simulation software according to the spherical near-field measurement method of the present invention.

[0070] The following table simulates the far-field radiation pattern data obtained by full measurement (i.e., using the sampling interval in the prior art) and the data obtained by different In this embodiment, the first side lobe, the second side lobe, the first null depth, and the second null depth are used to determine whether the measurement accuracy meets the requirements. The preset measurement accuracy requirement is 0.1 dB. The first sampling interval of the surface is 20°, and then The sampling interval of the surface is increased to 10°, and the far-field radiation pattern results obtained twice are compared. It is found that the difference between many results exceeds 0.1dB, so the measurement accuracy requirement is not met, and the sampling is continued. When the sampling interval of the surface is increased to 5°, the difference between the far-field radiation pattern and the 10° result is less than 0.1dB, so the measurement accuracy requirement is met, and the iteration can be stopped, and 5° or 10° is determined to meet the above measurement accuracy requirements. The target sampling interval of the surface is used as the first sampling interval for actual measurement of the antenna under test.

[0071]

[0072] In an optional embodiment of the present invention, before performing the first sampling on the antenna under test, the method further includes:

[0073] (1) Obtain the corresponding relationship between beam width and sampling interval, where the corresponding relationship is obtained by simulating the measured antennas with different beam widths according to the spherical near-field measurement method. The sampling interval here refers to the one obtained by simulation measurement. Target sampling interval for the surface;

[0074] (2) Obtain the beam width of the antenna under test;

[0075] (3) determining a sampling interval corresponding to the beam width of the antenna under test based on the beam width of the antenna under test and the corresponding relationship;

[0076] (4) The sampling interval corresponding to the beam width of the antenna under test is used as the first sampling interval.

[0077] The first sampling interval determined by the above process can reduce the number of iterations in actual measurement, thereby reducing the time used for actual measurement and improving measurement efficiency.

[0078] In an optional embodiment of the present invention, returning to the step of performing a second sampling on the antenna under test specifically includes the following steps:

[0079] (1) Identify the target that does not meet the preset measurement accuracy Angular range;

[0080] (2) In the target The angle range is used to perform a second sampling of the antenna under test.

[0081] Specifically, if only part of When the angle range does not meet the measurement accuracy requirements, when performing the second sampling of the antenna under test, only the part that does not meet the measurement accuracy requirements can be encrypted and supplemented. For example, the comparison results of two adjacent far-field radiation patterns show that only the 0-10° angle range is not met. If the measurement accuracy does not meet the requirements within the angle range, the second sampling of the antenna under test can be performed only for the angle range of 0 to 10 degrees. Or, for example, the comparison results show that the preset measurement accuracy is met in the θ angle range of 0 to 30 degrees, but the preset measurement accuracy requirement is not met in the θ angle range of 30 to 90 degrees. In this case, when performing the second sampling on the antenna under test, only the corresponding θ angle range of 30 to 90 degrees can be sampled. Encrypted supplementary sampling is carried out on the surface.

[0082] In an optional embodiment of the present invention, the first sampling and the second sampling areas are located in the local spherical area of the antenna under test. After the target sampling interval of the surface is reached, the method further comprises:

[0083] Will The target sampling interval of the surface is used as the first sampling interval, and the process returns to the step of performing the first sampling on the antenna under test.

[0084] That is, the above steps S201 to S205 are performed on the local spherical surface of the antenna under test to obtain the local spherical surface. The target sampling interval of the surface (which can be understood as pre-scan), and then The target sampling interval of the surface is used as the first sampling interval in the formal scan of the spherical near-field measurement of the antenna under test (depending on the specific measurement requirements, this may be a complete sphere, a hemisphere, or other partial sphere), and steps S201 to S205 are performed again. The advantage of this is that the pre-scan area is relatively small, which can reduce the operating time of the scanning mechanism (mechanical structure), quickly obtain a suitable first sampling interval, reduce the number of iterations of the formal scan, and improve efficiency.

[0085] Optionally, the local spherical area includes a main beam of the antenna under test.

[0086] In an optional embodiment of the present invention, if the antenna under test is any one of a batch of identical antennas under test and / or the antenna under test is a qualified antenna under test, the method further includes:

[0087] (1) Perform spherical near-field measurement on the antenna under test to obtain the standard far-field radiation pattern of the antenna under test. In the spherical near-field measurement, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the sampling interval of the θ plane is equal to Sampling interval of the surface;

[0088] The qualified antenna under test is one that has passed radiation performance verification. Preferably, the antenna under test is any one of a batch of identical antennas under test, and the antenna under test is a qualified one. If any of the selected antennas under test has performance issues, the radiation characteristics of the entire batch of antennas under test will not be reflected.

[0089] (2) determining whether the first far-field radiation pattern and the standard far-field radiation pattern meet a preset measurement accuracy;

[0090] (3) If satisfied, the first sampling interval is taken as The target sampling interval of the surface, and The target sampling interval of the surface is used to sample other antennas under test in a batch of the same antennas under test, so as to perform spherical near-field measurements on the other antennas under test;

[0091] (4) If not, determining whether the second far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy;

[0092] (5) If satisfied, The corresponding sampling interval after surface encryption supplementary sampling is used as The target sampling interval of the surface and The target sampling interval of the surface is used to sample other antennas under test in a batch of the same antennas under test, so as to perform spherical near-field measurements on the other antennas under test;

[0093] (6) If not, return to the step of performing a second sampling on the antenna under test until the latest second far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy, and use the sampling interval corresponding to the latest second far-field radiation pattern as The target sampling interval of the surface, and then, The target sampling interval of the surface is used to sample other antennas under test in a batch of the same antennas under test, so as to perform spherical near-field measurements on the other antennas under test.

[0094] The above will obtain the antenna under test The target sampling interval of the surface is directly used for the spherical near-field measurement of other antennas under test, which improves the spherical near-field measurement efficiency of batches of identical antennas under test.

[0095] In an optional embodiment of the present invention, if the antenna under test is any one of a batch of identical antennas under test and / or the antenna under test is a qualified antenna under test, the method further includes:

[0096] (1) Perform spherical near-field measurement on the antenna under test to obtain the standard far-field radiation pattern of the antenna under test. In the spherical near-field measurement, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the sampling interval of the θ plane is equal to Sampling interval of the surface;

[0097] The qualified antenna under test is one that has passed radiation performance verification. Preferably, the antenna under test is any one of a batch of identical antennas under test, and the antenna under test is a qualified one. If any of the selected antennas under test has performance issues, the radiation characteristics of the entire batch of antennas under test will not be reflected.

[0098] (2) Sparse sampling is performed on the antenna under test, and a third interpolation process is performed on the obtained sparse sampling data, and the sampling data after the third interpolation process is calculated to obtain a third far-field radiation pattern of the antenna under test, wherein in the sparse sampling, the sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, The sampling interval of the surface is larger than that of the θ surface;

[0099] The above sparse sampling refers to increasing The sampling interval of the surface.

[0100] (3) determining whether the third far-field radiation pattern and the standard far-field radiation pattern meet a preset measurement accuracy;

[0101] (4) If satisfied, return to the step of sparse sampling of the antenna under test until the latest third far-field radiation pattern and the standard far-field radiation pattern do not meet the preset measurement accuracy, and the sampling interval corresponding to the last third far-field radiation pattern is used as The target sampling interval of the surface, and then, The target sampling interval of the surface is used to sample other antennas under test in a batch of the same antennas under test, so as to perform spherical near-field measurements on the other antennas under test.

[0102] The above will obtain the antenna under test The target sampling interval of the surface is directly used for the spherical near-field measurement of other antennas under test, which improves the spherical near-field measurement efficiency of batches of identical antennas under test.

[0103] The spherical near-field measurement method of the present invention effectively reduces the number of measurement points and reduces the measurement time. For millimeter wave antennas or large antennas under test, the measurement efficiency can be greatly improved. For batch measurements of similar antennas under test, it is only necessary to iteratively measure one antenna under test to determine the parameters applicable to all antennas under test. The surface sampling interval improves the efficiency of batch measurement.

[0104] Example 2:

[0105] An embodiment of the present invention further provides a spherical near-field measurement system, which uses the spherical near-field measurement method of any one of the above-mentioned embodiments to perform spherical near-field measurement on the antenna under test. The spherical near-field measurement system includes: a measuring antenna, a measuring instrument and a host computer.

[0106] In addition, in the description of the embodiments of the present invention, unless otherwise expressly specified or limited, the terms "mounted," "connected," and "connected" should be understood in a broad sense. For example, they may refer to fixed connections, detachable connections, or integral connections; they may refer to mechanical connections or electrical connections; they may refer to direct connections or indirect connections through an intermediate medium; and they may refer to internal communication between two components. Those skilled in the art will understand the specific meanings of the above terms in the present invention based on the specific circumstances.

[0107] In the description of the present invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicating orientations or positional relationships, are based on the orientations or positional relationships shown in the accompanying drawings and are intended solely to facilitate and simplify the description of the present invention. They are not intended to indicate or imply that the devices or components referred to must have, be constructed, or operate in a specific orientation, and therefore should not be construed as limitations on the present invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0108] Finally, it should be noted that the above embodiments are only used to illustrate the technical solutions of the present invention, rather than to limit it. Although the present invention has been described in detail with reference to the above embodiments, those skilled in the art should understand that they can still modify the technical solutions described in the above embodiments, or replace some or all of the technical features therein with equivalents. However, these modifications or replacements do not cause the essence of the corresponding technical solutions to deviate from the scope of the technical solutions of the embodiments of the present invention.

Claims

1. A spherical near-field measurement method, characterized in that: include: Performing first sampling on the antenna under test, performing first interpolation processing on the obtained first sampled data, and calculating the sampled data after the first interpolation processing to obtain a first far-field radiation pattern of the antenna under test, wherein, in the first sampling, a sampling interval of the φ plane is a first sampling interval, a sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and the first sampling interval is greater than the sampling interval of the θ plane; performing a second sampling on the antenna under test, performing a second interpolation process on the obtained second sampled data and the first sampled data, and calculating the sampled data after the second interpolation process to obtain a second far-field radiation pattern of the antenna under test, wherein the second sampling is an encrypted supplementary sampling of the φ plane of the previous sampling; Determine whether two adjacent far-field radiation patterns meet the preset measurement accuracy; If the conditions are met, the first sampling interval or the sampling interval corresponding to the encrypted supplementary sampling of the φ plane is used as the target sampling interval of the φ plane, and the first far-field radiation pattern or the second far-field radiation pattern is used as the antenna pattern of the antenna under test; If it is not satisfied, the second sampling data and the first sampling data are used as the first sampling data, and the step of performing the second sampling on the antenna under test is returned to until the far-field radiation patterns of two adjacent times meet the preset measurement accuracy, and any sampling interval in the sampling intervals corresponding to the two adjacent far-field radiation patterns is used as the target sampling interval of the φ plane, and any far-field radiation pattern in the two adjacent far-field radiation patterns is used as the antenna pattern of the antenna under test.

2. The spherical near-field measurement method according to claim 1, characterized in that: Before performing the first sampling on the antenna under test, the method further includes: A simulation measurement is performed on the antenna under test according to the spherical near-field measurement method, and a target sampling interval of the φ plane obtained by the simulation measurement is used as the first sampling interval.

3. The spherical near-field measurement method according to claim 1, characterized in that: Before performing the first sampling on the antenna under test, the method further includes: Obtaining a correspondence between beam width and sampling interval, wherein the correspondence is obtained by performing simulation measurement on antennas under test with different beam widths according to the spherical near-field measurement method; Obtaining the beam width of the antenna under test; Determining, according to the beam width of the antenna under test and the corresponding relationship, a sampling interval corresponding to the beam width of the antenna under test; A sampling interval corresponding to the beam width of the antenna under test is used as the first sampling interval.

4. The spherical near-field measurement method according to claim 1, characterized in that: Returning to the step of performing a second sampling on the antenna under test, comprising: Determining a target φ angle range that does not meet the preset measurement accuracy; A second sampling is performed on the antenna under test within the target φ angle range.

5. The spherical near-field measurement method according to claim 1, characterized in that: The first sampling and the second sampling areas are located in a local spherical area of the antenna under test. After obtaining the target sampling interval of the φ plane, the method further includes: The target sampling interval of the φ plane is used as the first sampling interval, and the process returns to the step of performing the first sampling on the antenna under test.

6. The spherical near-field measurement method according to claim 1, characterized in that: If the antenna under test is any one of a batch of identical antennas under test and / or the antenna under test is a qualified antenna under test, the method further includes: Performing a spherical near-field measurement on the antenna under test to obtain a standard far-field radiation pattern of the antenna under test, wherein in the spherical near-field measurement, a sampling interval of a θ plane is determined according to the frequency and size of the antenna under test, and the sampling interval of the θ plane is equal to the sampling interval of the φ plane; Determining whether the first far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy; If the conditions are met, the first sampling interval is used as the target sampling interval of the φ plane, and the target sampling interval of the φ plane is used to sample other antennas under test in the batch of the same antennas under test, so as to perform spherical near-field measurement on the other antennas under test; If not, determining whether the second far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy; If the conditions are met, the sampling interval corresponding to the encrypted supplementary sampling of the φ plane is used as the target sampling interval of the φ plane, and the target sampling interval of the φ plane is used to sample other antennas under test in the batch of the same antennas under test, so as to perform spherical near-field measurement on the other antennas under test; If not, return to the step of performing a second sampling on the antenna under test until the newly obtained second far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy, and use the sampling interval corresponding to the newly obtained second far-field radiation pattern as the target sampling interval of the φ plane. Then, use the target sampling interval of the φ plane to sample other antennas under test in the batch of the same antennas under test, so as to perform spherical near-field measurement on the other antennas under test.

7. The spherical near-field measurement method according to claim 1, characterized in that: If the antenna under test is any one of a batch of identical antennas under test and / or the antenna under test is a qualified antenna under test, the method further includes: Performing a spherical near-field measurement on the antenna under test to obtain a standard far-field radiation pattern of the antenna under test, wherein in the spherical near-field measurement, a sampling interval of a θ plane is determined according to the frequency and size of the antenna under test, and the sampling interval of the θ plane is equal to the sampling interval of the φ plane; performing sparse sampling on the antenna under test, performing a third interpolation process on the obtained sparse sampled data, and calculating the sampled data after the third interpolation process to obtain a third far-field radiation pattern of the antenna under test, wherein, in the sparse sampling, a sampling interval of the θ plane is determined according to the frequency and size of the antenna under test, and a sampling interval of the φ plane is greater than the sampling interval of the θ plane; Determining whether the third far-field radiation pattern and the standard far-field radiation pattern meet the preset measurement accuracy; If satisfied, return to the step of sparse sampling of the antenna under test until the newly obtained third far-field radiation pattern and the standard far-field radiation pattern do not meet the preset measurement accuracy, and use the sampling interval corresponding to the last third far-field radiation pattern as the target sampling interval of the φ plane, and then use the target sampling interval of the φ plane to sample other antennas under test in the batch of identical antennas under test, so as to perform spherical near-field measurement on the other antennas under test.

8. The spherical near-field measurement method according to claim 1, characterized in that: The preset measurement accuracy includes: a gain difference between two adjacent far-field radiation patterns is less than a preset threshold.

9. The spherical near-field measurement method according to claim 5, characterized in that: The local spherical area contains the main beam of the antenna under test.

10. The spherical near-field measurement method according to claim 1, characterized in that: The number of the first sampling intervals is at least one, and the number of intervals corresponding to the φ-plane encrypted supplementary sampling is at least one.

11. A spherical near-field measurement system, characterized in that: The spherical near-field measurement system adopts the spherical near-field measurement method according to any one of claims 1 to 10 to perform spherical near-field measurement on the antenna under test. The spherical near-field measurement system includes: a measuring antenna, a measuring instrument, and a host computer.

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