A time-interleaved high-frequency signal single event transient detection method

Abstract

The application discloses a high-frequency signal single event transient detection method based on time interleaving, which comprises the following steps: under the condition of no irradiation, time interleaving high-speed collection is performed on the output of a to-be-detected circuit to obtain a sample value D(t), and an ideal denoising value I(t) and a noise value Z(t) at a corresponding moment are calculated; irradiation test is performed on the to-be-detected circuit, and time interleaving high-speed collection is performed on the high-frequency signal of the output of the to-be-detected circuit to obtain a sample value D'(t); according to the sample value D'(t) and the noise value Z(t) at the corresponding moment, an actual denoising value V(t) at the corresponding moment is calculated; according to the comparison result of V(t) and the ideal denoising value I(t) at the corresponding moment, the amplitude and the pulse width of the single event transient at the corresponding moment are determined; until the irradiation test is finished, a single event transient error characteristic distribution diagram of the to-be-detected circuit under heavy ions is obtained. The application effectively improves the pulse width precision and the amplitude precision of the single event transient signal in the board-level test, and improves the accuracy of the test.

Description

TECHNICAL FIELD

[0001] The application belongs to the technical field of single event effect test, and particularly relates to a high-frequency signal single event transient detection method based on time interleaving. BACKGROUND

[0002] With the rapid development of aerospace industry, the demand for radiation-resistant integrated circuits is increasing, and the development of radiation-resistant integrated circuit technology towards more advanced nanometer technology has become an inevitable trend for future integrated circuit development. Under the nanometer technology, due to the reduction of device size and the increase of working frequency, the proportion of single event transient effect induced errors is increasing year by year, and effective evaluation of single event transient pulse signals is particularly important.

[0003] Single event transient pulse effect refers to the phenomenon of transient current and transient voltage generated before and after irradiation. The generated transient current and transient voltage propagate in the circuit, and finally may cause errors in the function of the device. Single event transient error is common in combinational circuits, optoelectronic devices, digital-to-analog converter devices and analog devices. Single event transient pulse changes the key node level of the bistable circuit and is latched, thereby causing single event upset; the transmission of transient pulse in combinational logic circuit is captured, which causes single event upset; transient current pulse triggers the parasitic silicon controlled current conduction of CMOS circuit, which causes single event latchup; transient current pulse triggers the parasitic BJT of power MOSFET to open, which causes single event burnout; for nanometer-sized devices, single event double transient, single event multiple transient and other radiation effects may occur. Therefore, the single event transient characteristic evaluation method of the device becomes the key of single event effect evaluation.

[0004] For the single event transient characteristic evaluation method, corresponding research has been carried out at home and abroad. Loma and TI are the main representatives abroad. The foreign accelerator does not have a vacuum tank, and can adopt the direct connection mode of an oscilloscope to collect single event transient signals. Since the oscilloscope can only set the trigger condition for the output constant signal, it cannot perform single event test on dynamic waveforms such as sine wave. The domestic accelerator needs to be carried out in a vacuum tank, and cannot be measured by the direct connection mode of an oscilloscope, so the measurement is usually carried out by the mode of an oscilloscope plus an extension line, which leads to the distortion of high-frequency signals due to the extension line. Some people in China have also carried out research on the measurement mode of single event transient signals under steady-state signals by using a high-speed acquisition card. However, due to the limitation of the test method, no one at home and abroad has carried out research on the test of single event transient signals of integrated circuits under dynamic signal test code. SUMMARY

[0005] The technical problem of the application is to overcome the shortcomings of the prior art and provide a high-frequency signal single event transient detection method based on time interleaving, which effectively improves the pulse width accuracy and amplitude accuracy of the single event transient signal of the board-level test, and improves the accuracy of the test.

[0006] To solve the above technical problems, the application discloses a high-frequency signal single event transient detection method based on time interleaving, comprising:

[0007] Step 1, configure the circuit to be tested into a high-frequency mode, and input a high-frequency dynamic test code type into the circuit to be tested through an FPGA;

[0008] Step 2, under the non-irradiation condition, control two analog-to-digital converters to perform time interleaving high-speed collection on the high-frequency signal output by the circuit to be tested through the FPGA, obtain a sampling value D(t) at each sampling moment, and store the sampling value D(t) in an array according to the collection time sequence;

[0009] Step 3, calculate the ideal denoising value I(t) and the noise value Z(t) at the corresponding moment according to the sampling value D(t) at each sampling moment stored in the array;

[0010] Step 4, perform an irradiation test on the circuit to be tested, and control the two analog-to-digital converters to perform time interleaving high-speed collection on the high-frequency signal output by the circuit to be tested through the FPGA, to obtain a sampling value D'(t) at each sampling moment;

[0011] Step 5, calculate the actual denoising value V(t) at the corresponding moment according to the sampling value D'(t) and the noise value Z(t) at the corresponding moment;

[0012] Step 6, determine the amplitude and pulse width of the single event transient at the corresponding moment according to the comparison result of the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding moment, and store them in the corresponding array;

[0013] Step 7, cyclically execute steps 4-6 until the irradiation test is completed, calculate the single event transient error characteristic distribution graph of the circuit to be tested under the heavy ions according to the amplitude and pulse width of the single event transient in the whole cycle, and analyze and evaluate the single event transient effect of the circuit to be tested by using the distribution graph.

[0014] In the high-frequency signal single event transient detection method based on time interleaving, the ideal denoising value I(t) and the noise value Z(t) at the corresponding moment are calculated according to the sampling value D(t) at each sampling moment stored in the array, comprising:

[0015] Substep 31, perform fitting calculation according to the sampling value D(t) at each sampling moment stored in the array to obtain the ideal denoising value I(t) at the corresponding moment;

[0016] Substep 32, compare D(t) and I(t) at the corresponding moment; wherein if D(t)≥I(t), the upper bias noise value Z +(t,m) is: Z + (t,m) = D(t) - I(t); if D(t) < I(t), the lower noise value Z - (t,n) is: Z - (t,n) = I(t) - D(t); Z + (t,m) represents the mth group of t time upper bias noise value, m = 1, 2,..., M; Z - (t,n) represents the nth group of t time lower bias noise value, n = 1, 2,..., N;

[0017] Substep 33, repeat the above substep 32, get M group of t time upper bias noise value, and calculate the average value of t time upper bias noise And the maximum upper bias noise value of t time At the same time, get N group of t time lower bias noise value, and calculate the average value of t time lower bias noise And the maximum lower bias noise value of t time

[0018] Substep 34, the noise value Z(t) corresponding to the sampling value D(t) is Or The maximum noise value Z max (t) is Or

[0019] In the above time interleaved high frequency signal single event transient detection method, according to the sampling value D'(t) and the noise value Z(t) corresponding to the time, the actual denoising value V(t) corresponding to the time without noise is calculated, including:

[0020] The sampling value D'(t) is compared with the ideal denoising value I(t) corresponding to the time; wherein, if D'(t) ≥ I(t), the actual denoising value V(t) corresponding to the time is: V(t) = D'(t) - Z(t); if D'(t) < I(t), the actual denoising value V(t) corresponding to the time is: V(t) = D'(t) + Z(t).

[0021] In the above time interleaved high frequency signal single event transient detection method, according to the comparison result of the actual denoising value V(t) and the ideal denoising value I(t) corresponding to the time, the amplitude and pulse width value of the single event transient corresponding to the time are determined, including:

[0022] The actual denoising value V(t) is compared with the ideal denoising value I(t) corresponding to the time, and the difference ΔG(t) between V(t) and the ideal denoising value I(t) corresponding to the time is obtained;

[0023] If the difference ΔG(t) is greater than the maximum noise value Z max If the difference ΔG(t) is greater than the maximum noise value Z max If the difference ΔG(t) is greater than the maximum noise value Z

[0024] In the above high-frequency signal single event transient detection method based on time interleaving, further comprising: according to the interval time of the single event transient, determining the single event transient as single event single transient, or single event double transient, or single event multi-transient.

[0025] In the above high-frequency signal single event transient detection method based on time interleaving, in the sub-step 31, according to the input high-frequency dynamic test pattern, selecting a sine wave fitting algorithm or a square wave fitting algorithm to perform fitting calculation on the sampling values D(t) stored in the array at each sampling time, to obtain the ideal denoising value I(t) at the corresponding time.

[0026] In the above high-frequency signal single event transient detection method based on time interleaving, the high-frequency dynamic test pattern comprises: a sine wave and a square wave.

[0027] In the above high-frequency signal single event transient detection method based on time interleaving, before the step 2, further comprising: configuring two analog-to-digital converters into a high-speed acquisition mode, and clock synchronizing the two analog-to-digital converters through a signal generator; according to the sampling accuracy requirement, configuring the sampling clock of the two analog-to-digital converters, so that the phase difference of the two analog-to-digital converters is Δφ.

[0028] In the above high-frequency signal single event transient detection method based on time interleaving, Δφ=90°.

[0029] In the above high-frequency signal single event transient detection method based on time interleaving, the circuit to be tested comprises: a combination logic circuit capable of outputting a high-frequency dynamic signal, a digital-to-analog conversion device, and an analog device.

[0030] The present application has the following advantages:

[0031] (1) The application discloses a high-frequency signal single event transient detection method based on time interleaving, adopts double analog-to-digital converters to detect high-frequency signal single event transients, can set a plurality of sampling frequency analog-to-digital converters according to signals of different frequencies, improves sampling precision, effectively realizes the test of high-frequency dynamic signals, and simultaneously reduces the problem of high-frequency signal loss caused by excessively long line length due to the fact that the method is directly connected with a circuit to be detected.

[0032] (2) The application discloses a high-frequency signal single event transient detection method based on time interleaving, continuously collects high-frequency signals before irradiation, calculates noise of a plurality of groups of collected data, obtains average values of upper and lower bias noises at different moments, and can effectively reduce the influence of noise on single event transient signals in the irradiation process and improve the minimum precision of identifiable single event transient signals by performing operation on the collected data and noise data.

[0033] (3) The application discloses a high-frequency signal single event transient detection method based on time interleaving, performs difference calculation on denoised sampling data and ideal data, compares the difference value with a maximum noise value, considers that a single event transient occurs when the difference value is greater than the noise value, then records the difference value at the current moment, compares the next sampling data, continues to record if the next sampling data is greater than the noise value, and sequentially records until the difference value is less than the noise value, and stops recording, simultaneously counts the sampling data amount satisfying the condition that the difference value is greater than the maximum noise value in the calculation process, obtains the width of a transient pulse signal according to a sampling interval, and stores the data amplitude and the data width of the sampling data in arrays respectively. Meanwhile, single event transients, single event double transients and single event multiple transients can be analyzed according to the single event transient interval and the fluence rate of ion incidence. Compared with the present test technology, the test method can effectively reduce the time of test data analysis and realize the ability of automatic analysis. BRIEF DESCRIPTION OF DRAWINGS

[0034] Figure 1 is an implementation principle diagram of the high-frequency signal single event transient detection method based on time interleaving in the embodiment of the application;

[0035] Figure 2 is a curve fitting diagram of the high-frequency signal single event transient detection method based on time interleaving in the embodiment of the application;

[0036] Figure 3 is an error correction diagram of the high-frequency signal single event transient detection method based on time interleaving in the embodiment of the application;

[0037] Figure 4 is a single event transient diagram of the high-frequency signal single event transient detection method based on time interleaving in the embodiment of the application;

[0038] Figure 5 is a single event transient feature distribution map of a high-frequency signal single event transient detection method based on time interleaving in an embodiment of the present application. DETAILED DESCRIPTION

[0039] In order to make the purpose, technical solutions and advantages of the present application clearer, the disclosed embodiments of the present application will be described in further detail below with reference to the drawings.

[0040] One of the core ideas of the present application is that: in view of the fact that domestic single event tests need to be carried out in a vacuum tank, and the fact that oscilloscopes and other instruments cause high-frequency signal distortion when long-line testing is carried out, and the fact that there is a lack of effective high-frequency analog signal testing methods, a high-frequency signal single event transient detection method based on time interleaving is proposed. This method effectively improves the data quantity of high-frequency analog signals by using time interleaving acquisition technology, calculates the average value of noise at different times according to the difference between the sampling values and ideal values at different times, and effectively improves the measurement accuracy of signals by carrying out denoising processing on the signals during irradiation, so that the single event transient signal measurement accuracy is higher, and the measurement pulse width is narrower. This method effectively improves the pulse width accuracy and amplitude accuracy of single event transient signals in board-level testing, and improves the accuracy of testing.

[0041] As Figure 1 In this embodiment, the high-frequency signal single event transient detection method based on time interleaving comprises:

[0042] Step 1: configure the circuit to be tested into a high-frequency mode, and input a high-frequency dynamic test pattern into the circuit to be tested through an FPGA.

[0043] In this embodiment, the circuit to be tested includes but is not limited to: a combination logic circuit, a digital-to-analog conversion device and an analog device that can output a high-frequency dynamic signal. The high-frequency dynamic test pattern includes but is not limited to: a sine wave and a square wave.

[0044] Step 2: under non-irradiation conditions, control two analog-to-digital converters to carry out time interleaving high-speed acquisition on the high-frequency signals output by the circuit to be tested through an FPGA, obtain sampling values D(t) at each sampling time, and store the sampling values D(t) in an array according to the acquisition time sequence.

[0045] Step 3: calculate the ideal denoising value I(t) and the noise value Z(t) at the corresponding time according to the sampling values D(t) at each sampling time stored in the array.

[0046] In this embodiment, the specific implementation of this step 3 can be as follows:

[0047] Sub-step 31, according to the sampling value D(t) stored in the array at each sampling time, the fitting calculation is carried out to obtain the ideal denoising value I(t) at the corresponding time. Wherein, in the fitting calculation, according to the input of the high frequency dynamic test code type, the sine wave fitting algorithm or the square wave fitting algorithm can be selected, and the sampling value D(t) stored in the array at each sampling time is fitted and calculated to obtain the ideal denoising value I(t) at the corresponding time.

[0048] Sub-step 32, compare D(t) with I(t) at the corresponding time. Wherein, if D(t)≥I(t), the upper bias noise value Z + (t,m) is: + (t,m)=D(t)-I(t);if D(t)<I(t), the lower bias noise value Z - (t,n) is: - (t,n)=I(t)-D(t);Z + (t,m) represents the mth group of t time upper bias noise value, m=1, 2,..., M; Z - (t,n) represents the nth group of t time lower bias noise value, n=1, 2,..., N.

[0049] Sub-step 33, repeat the above sub-step 32 to obtain M groups of t time upper bias noise value, and calculate the average value of t time upper bias noise And the maximum upper bias noise value of t time At the same time, N groups of t time lower bias noise value are obtained, and the average value of t time lower bias noise And the maximum lower bias noise value of t time

[0050] Sub-step 34, the noise value Z(t) of the sampling value D(t) at the corresponding time is Or The maximum noise value Z max (t) of the sampling value D(t) at the corresponding time is Or

[0051] Step 4, irradiation test is carried out on the circuit to be tested, and two analog-to-digital converters are controlled by FPGA to perform time interleaving high-speed acquisition on the high-frequency signal output by the circuit to be tested, so as to obtain the sampling value D'(t) at each sampling time.

[0052] Step 5, according to the sampling value D'(t) and the noise value Z(t) at the corresponding time, the actual denoising value V(t) without noise at the corresponding time is calculated.

[0053] In the embodiment, the sampling value D'(t) is compared with the ideal denoising value I(t) at the corresponding time. If D'(t)≥I(t), the actual denoising value V(t) at the corresponding time is V(t)=D'(t)-Z(t); if D'(t)I(t), the actual denoising value V(t) at the corresponding time is V(t)=D'(t)+Z(t).

[0054] Step 6, according to the comparison result of the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding time, the amplitude and pulse width value of the single event transient at the corresponding time are determined and stored in the corresponding array.

[0055] In the embodiment, the actual denoising value V(t) can be compared with the ideal denoising value I(t) at the corresponding time to obtain the difference ΔG(t) between V(t) and the ideal denoising value I(t) at the corresponding time. If the difference ΔG(t) is greater than the maximum noise value Z(t) at the corresponding time, it is considered that a single event transient occurs, and the amplitude of the single event transient signal is calculated according to the difference ΔG(t) between the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding time; and the pulse width value of the single event transient signal is calculated according to the number of sampling points of the difference ΔG(t) between the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding time which is greater than the maximum noise value Z(t) at the corresponding time. max max

[0056] Preferably, the single event transients occurring at the interval time can be determined to be single event single transients, or single event double transients, or single event multiple transients.

[0057] Step 7, steps 4-6 are executed in a loop until the irradiation test is completed, and the single event transient error characteristic distribution graph of the circuit under test under heavy ions is calculated according to the amplitude and pulse width value of the single event transients in the whole cycle, and the single event transient effect of the circuit under test is analyzed and evaluated by using the distribution graph.

[0058] In the embodiment, the single event transient detection method based on time interleaving of the high-frequency signal can further include: before step 2 is executed, configuring the two analog-to-digital converters into a high-speed acquisition mode, and clock synchronizing the two analog-to-digital converters by the signal generator; according to the sampling accuracy requirement, configuring the sampling clock of the two analog-to-digital converters so that the phase difference of the two analog-to-digital converters is Δφ. Preferably, the phase difference Δφ can be set to 90°.

[0059] On the basis of the above-mentioned embodiments, the following takes the high-speed digital-to-analog converter as an example for description.

[0060] The high-speed digital-to-analog converter is selected for single event transient pulse test, and the specific implementation steps are as follows:​​

[0061] a) configure the to-be-tested high-speed digital-to-analog converter into a high-frequency mode, input a high-frequency dynamic test code type into the to-be-tested high-speed digital-to-analog converter through an FPGA, and take the 3GHz analog signal output by the to-be-tested high-speed digital-to-analog converter as an example.

[0062] b) select two 12-bit double-edge analog-to-digital converters with a sampling frequency of 3.2GSPS. The configuration of the analog-to-digital converters is as follows: configure the two analog-to-digital converters into a high-speed acquisition mode; clock synchronize the two analog-to-digital converters through a signal generator; according to the sampling accuracy requirement, configure the sampling clock of the two analog-to-digital converters so that the phase difference of the two analog-to-digital converters is 90°; and enable the two analog-to-digital converters to cross sample the 3GHz analog signal with a period of 333ps and a sampling interval of 78.125ps, so that the average sampling points in each cycle of the analog signal are about 4.5.

[0063] c) under the unirradiated condition, cross sample the 3GHz analog signal output by the to-be-tested high-speed digital-to-analog converter through the FPGA control of the two analog-to-digital converters, sample 1000 pulse periods of the high-frequency signal, obtain 4500 sampling data, sort the sampling values containing noise after sampling according to the sampling sequence, and store the sampling values in an acquisition array.

[0064] d) calculate the ideal denoising value I(t) at the corresponding time without noise according to the sampling value D(t) at each sampling time stored in the array.

[0065] e) calculate the noise value Z(t) at the corresponding time of the sampling value D(t) and the maximum noise value Z max (t).

[0066] compare D(t) with I(t) at the corresponding time. If D(t)≥I(t), the upper deviation noise value Z + (t,m) at the corresponding time is: Z + (t,m)=D(t)-I(t); if D(t)<I(t), the lower deviation noise value Z - (t,n) at the corresponding time is: Z - (t,n)=I(t)-D(t). In this way, M groups of upper deviation noise values at time t and N groups of lower deviation noise values at time t are obtained; the upper deviation noise average value at time t , the maximum upper deviation noise value at time t , the lower deviation noise average value at time t , and the maximum lower deviation noise value at time t are calculated. or The sampling value D(t) corresponds to the maximum noise value Z max (t) is Or As Figure 2 shown, Figure 2 The dots in the figure represent the sampling values, the lines represent the ideal denoising values, and the difference between the dots and the lines is the noise value Z(t).

[0067] f) Perform irradiation test on the to-be-tested high-speed digital-to-analog converter, input a high-frequency dynamic sinusoidal wave test code into the to-be-tested high-speed digital-to-analog converter through the FPGA, and control two analog-to-digital converters to cross collect the 3GHz analog signal output by the to-be-tested high-speed digital-to-analog converter to obtain the sampling value D'(t) at each sampling time.

[0068] g) Compare the sampling value D'(t) with the ideal denoising value I(t) obtained before irradiation, if D'(t)≥I(t), the actual denoising value V(t) at the corresponding time is: V(t)=D'(t)-Z(t); if D'(t)<I(t), the actual denoising value V(t) at the corresponding time is: V(t)=D'(t)+Z(t). As Figure 3 shown, Figure 3 The circles in the figure represent the actual denoising value V(t), and the squares represent the sampling value D'(t).

[0069] h) Compare the actual denoising value V(t) with the ideal denoising value I(t) at the corresponding time to obtain the difference ΔG(t) between V(t) and the ideal denoising value I(t) at the corresponding time; if the difference ΔG(t) is greater than the maximum noise value Z max (t) at the corresponding time, it is considered that a single event transient occurs. When V(t)≥I(t), the difference between V(t) and I(t) is compared with the maximum up-bias noise value . Similarly, when V(t)<I(t), the difference between V(t) and I(t) is compared with the maximum down-bias noise value . As Figure 4 shown, the difference between the amplitude of a single sampling point and the fitting curve is greater than the maximum noise value, and the waveform is distorted.

[0070] i) After the single event transient occurs, store the calculated difference in an array, then perform operation on the next sampling point until the difference is less than the maximum noise value, then it is considered that the single event transient ends, and the number of sampling points at which the single event transient occurs is recorded during the calculation process, and the pulse width is calculated according to the number of sampling points and the sampling interval.

[0071] j) Until the end of the radiation test, according to the amplitude and pulse width of the single event transient signal, the single event transient error characteristic distribution diagram is obtained, as Figure 5The single event transient pulse width and amplitude distribution characteristics under three ions are shown, and the single event transient effect is analyzed and evaluated by using the error characteristic distribution map.

[0072] Although the present application has been disclosed with reference to the preferred embodiments, it is not intended to limit the present application, and any person skilled in the art can make possible changes and modifications to the technical solutions of the present application by using the disclosed methods and technical contents without departing from the spirit and scope of the present application. Therefore, any simple modification, equivalent change and modification made to the above embodiments according to the technical essence of the present application without departing from the technical solutions of the present application shall fall within the protection scope of the technical solutions of the present application.

[0073] The contents not described in detail in the specification of the present application belong to the known technology of the person skilled in the art.

Claims

1. A time-interleaved based high frequency signal single event transient detection method, characterized in that, The method comprises the following steps: Step 1, configure the circuit to be tested into a high-frequency mode, and input a high-frequency dynamic test code into the circuit to be tested through an FPGA; Step 2, under the non-irradiation condition, control two analog-to-digital converters to perform time-interleaved high-speed acquisition on the high-frequency signal output by the circuit to be tested through the FPGA, obtain the sampling value D(t) at each sampling time, and store the sampling value D(t) in an array according to the acquisition time sequence; Step 3, calculate the ideal denoising value I(t) and the noise value Z(t) at the corresponding time according to the sampling value D(t) at each sampling time stored in the array; Step 4, perform an irradiation test on the circuit to be tested, and control the two analog-to-digital converters to perform time-interleaved high-speed acquisition on the high-frequency signal output by the circuit to be tested, and obtain the sampling value D'(t) at each sampling time; Step 5, calculate the actual denoising value V(t) at the corresponding time according to the sampling value D'(t) and the noise value Z(t) at the corresponding time; Step 6, determine the amplitude and pulse width of the single event transient at the corresponding time according to the comparison result of the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding time, and store the amplitude and pulse width in corresponding arrays; Step 7, cyclically execute steps 4-6 until the irradiation test is completed, calculate the single event transient error characteristic distribution graph of the circuit to be tested under the heavy ions according to the amplitude and pulse width of the single event transient in the whole cycle, and analyze and evaluate the single event transient effect of the circuit to be tested by using the distribution graph.

2. The time-interleaved high-frequency signal single-event transient detection method of claim 1, wherein, The ideal denoising value I(t) and the noise value Z(t) at the corresponding time are calculated according to the sampling value D(t) at each sampling time stored in the array, and the method comprises the following steps: Sub-step 31, perform fitting calculation according to the sampling value D(t) at each sampling time stored in the array to obtain the ideal denoising value I(t) at the corresponding time; Sub-step 32, comparing D(t) with I(t) at the corresponding time; wherein, if D(t)≥I(t), the upper bias noise value Z + (t,m) is: Z + (t,m) = D(t) - I(t); if D(t) < I(t), the lower bias noise value Z - (t,n) is: Z - (t,n) = I(t) - D(t); Z + (t,m) represents the upper bias noise value of the mth group of t time, m = 1, 2, …, M; Z - (t,n) represents the lower bias noise value of the nth group of t time, n = 1, 2, …, N; Sub-step 33, repeat the above sub-step 32 to obtain M groups of upper bias noise values at time t, and calculate the average value of the upper bias noise at time t and the maximum upper bias noise value at time t At the same time, obtain N groups of lower bias noise values at time t, and calculate the average value of the lower bias noise at time t and the maximum lower bias noise value at time t Sub-step 34, the sampling value D(t) corresponds to the noise value Z(t) at the moment or The maximum noise value Z max (t) corresponds to the sampling value D(t) at the moment or 3. The time-interleaved high-frequency signal single-event transient detection method of claim 2, wherein, The actual denoising value V(t) at the corresponding time is calculated according to the sampling value D'(t) and the noise value Z(t) at the corresponding time, and the method comprises the following steps: Compare the sampling value D'(t) with the ideal denoising value I(t) at the corresponding time, wherein if D'(t)≥I(t), the actual denoising value V(t) at the corresponding time is V(t)=D'(t)-Z(t); if D'(t)<I(t), the actual denoising value V(t) at the corresponding time is V(t)=D'(t)+Z(t).

4. The time-interleaved high-frequency signal single-event transient detection method of claim 3, wherein, The amplitude and pulse width of the single event transient at the corresponding time are determined according to the comparison result of the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding time, and the method comprises the following steps: Compare the actual denoising value V(t) with the ideal denoising value I(t) at the corresponding time to obtain the difference ΔG(t) between V(t) and the ideal denoising value I(t) at the corresponding time; If the difference ΔG(t) is greater than the maximum noise value Z max (t) at the corresponding moment, it is considered that a single event transient occurs, and the amplitude of the single event transient signal is calculated according to the difference ΔG(t) between the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding moment; and the pulse width value of the single event transient signal is calculated according to the number of sampling points of the difference ΔG(t) between the actual denoising value V(t) and the ideal denoising value I(t) at the corresponding moment being greater than the maximum noise value Z max (t) at the corresponding moment.

5. The time-interleaved high-frequency signal single-event transient detection method of claim 4, wherein, Further comprising: Determine whether the single event transient is a single event single transient, a single event double transient or a single event multiple transient according to the interval time of the single event transients.

6. The time-interleaved high-frequency signal single-event transient detection method of claim 2, wherein, In sub-step 31, according to the input high-frequency dynamic test code type, a sine wave fitting algorithm or a square wave fitting algorithm is selected to perform fitting calculation on the sampling values D(t) stored in the array at each sampling time, to obtain ideal denoising values I(t) at the corresponding time.

7. The time-interleaved high-frequency signal single-event transient detection method of claim 1 or 6, wherein, The high-frequency dynamic test code type includes a sine wave and a square wave.

8. The time-interleaved high-frequency signal single-event transient detection method of claim 1, wherein, Before step 2, further comprising: configuring the two analog-to-digital converters into a high-speed acquisition mode, clock synchronizing the two analog-to-digital converters through a signal generator; and configuring the sampling clock of the two analog-to-digital converters according to the sampling accuracy requirement, so that the phase difference of the two analog-to-digital converters is Δφ.

9. The time-interleaved high-frequency signal single-event transient detection method of claim 8, wherein, Δφ = 90°.

10. The time-interleaved high-frequency signal single-event transient detection method of claim 1, wherein, The circuit under test includes a combination logic circuit capable of outputting a high-frequency dynamic signal, a digital-to-analog conversion device, and an analog device.

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