X-ray detector, detection method, and x-ray imaging apparatus

Abstract

The application provides an X-ray detector, a detection method and an X-ray imaging device. The X-ray detector comprises at least a plurality of layers of detection unit arrays, the plurality of layers of detection unit arrays comprising a first layer of detection unit arrays and a second layer of detection unit arrays; the first layer of detection unit arrays has a first reaction cross section for X-rays, the second layer of detection unit arrays has a second reaction cross section for X-rays, and the first reaction cross section is greater than or less than the second reaction cross section. In this way, X photons can mainly undergo Compton scattering on the detection unit arrays relatively close to an X-ray emission source and mainly undergo photoelectric effect on the detection unit arrays relatively far from the X-ray emission source, so that the main rays of the incident X photons can be determined according to the positional relationship between the tracks of the X photons detected by each layer of detection unit arrays and the X-ray emission source, and the total energy of the X photons detected by each layer of detection unit arrays as the main rays can be calculated to complete energy spectrum detection.

Description

TECHNICAL FIELD

[0001] The present application relates to the technical field of energy spectrum detection, in particular to an X-ray detector, a detection method and an X-ray imaging device. BACKGROUND

[0002] The X-ray received by each detection unit of the CT detector contains a primary ray part which has not undergone any interaction from the focal spot and a scattered ray part which has changed direction after interacting with the scanned object or the remaining object on the machine before reaching the detector. The proportion of scattered rays can seriously interfere with the final CT image quality. In the third-generation CT detector, the detector and the focal spot position are rigidly fixed, and an anti-scatter grid (ASG) is designed to reduce the proportion of scattered rays reaching the detector, Figure 1 The ASG shields the scattered rays in the third-generation CT detector. In the figure, the ASG side wall extension line is aligned with the focal spot, so the primary ray can pass through the gap between the ASG side walls into the detection unit, and the scattered ray will be absorbed by the ASG side wall and shielded because of the change in its direction.

[0003] The fourth-generation static CT detector usually has the detector and the focal spot distributed in a ring shape throughout the scanning aperture. During the scanning process, each detection unit will receive rays from different focal points. See Figure 2 For the same detector unit, the incident angles of the X-rays emitted by different focal points are not consistent. Therefore, it is impossible to achieve the purpose of suppressing the proportion of scattered rays by ASG. Therefore, the shielding of scattered rays is a problem that has not been solved in the fourth-generation CT. SUMMARY

[0004] The purpose of the present application is to provide an X-ray detector, a detection method and an X-ray imaging device, which can identify scattered rays and primary rays by detecting the tracks of incident X-ray photons, thereby reducing the effect of scattered rays on the image.

[0005] To solve the above technical problems, the present application provides an X-ray detector, comprising a plurality of layers of detection unit arrays, and the plurality of layers of detection unit arrays are arranged side by side along a certain direction.

[0006] The plurality of layers of detection unit arrays comprise a first layer of detection unit arrays and a second layer of detection unit arrays.

[0007] The first layer of detection unit arrays has a first reaction cross section for X-rays, and the second layer of detection unit arrays has a second reaction cross section for X-rays, wherein the first reaction cross section is greater than or less than the second reaction cross section.

[0008] Optionally, in the X-ray detector,

[0009] The first layer of the detector unit array is the detector unit array located at the top layer along a predetermined direction, and the material forming the first layer of the detector unit array has a first atomic number;

[0010] The second layer of the detector array is located below the uppermost detector array, and the material forming the second layer of the detector array has a second atomic number;

[0011] Wherein, the first atomic number is less than the second atomic number.

[0012] Optionally, in the X-ray detector, the first layer of the detector array has a first thickness, and the second layer of the detector array has a second thickness.

[0013] Optionally, in the X-ray detector, the X-ray detector includes multiple arrays of first-layer detection units, which are arranged sequentially along a set direction and are all located above the second-layer detection unit array.

[0014] Optionally, in the X-ray detector, adjacent layers of the detector unit array are spaced apart.

[0015] Optionally, in the X-ray detector, the material of the second layer of detector unit array includes at least one of cadmium antimonide, zinc antimonide, and cadmium zinc antimonide, and the material of the first layer of detector unit array includes at least one of silicon and gallium arsenide.

[0016] The present invention also provides a method for energy spectrum detection using the X-ray detector described above, comprising:

[0017] Based on the relationship between the X-ray photon tracks detected by each layer of the detector array and the position of the X-ray emission source, the main ray of the incident X-ray photons is determined;

[0018] Calculate the total energy of the main rays of the incident X-rays detected by each layer of the detection unit array to obtain projection data;

[0019] The energy spectrum image of the detected object is reconstructed based on the projection data.

[0020] Optionally, in the method for performing energy spectrum detection, the main ray of the incident X-rays is determined based on the positional relationship between the X-ray photon tracks detected by each layer of the detection unit array and the X-ray emission source, including:

[0021] Determine whether the distance between the extended line of the detected X-ray photon's trajectory and the X-ray emission source is within a preset range. If so, then it is determined to be the main ray.

[0022] The present invention also provides an X-ray imaging device, comprising:

[0023] X-ray generator, used to produce X-rays;

[0024] A detector is disposed opposite to the X-ray generator. The detector includes a plurality of layers of detector unit arrays, which includes a first layer of detector unit array and a second layer of detector unit array.

[0025] The distance between the first layer of the detection unit array and the X-ray generator is less than the distance between the second layer of the detection unit array and the X-ray generator;

[0026] The energy of X-rays that can be deposited on the first layer of the detector array is different from the energy of X-rays that can be deposited on the second layer of the detector array; or, the probability of X-rays interacting with the first layer of the detector array is less than the probability of X-rays interacting with the second layer of the detector array.

[0027] Optionally, the first layer of detector unit array and the second layer of detector unit array are stacked along a set direction, which is the direction in which the X-ray generator points to the detector.

[0028] In summary, in the X-ray detector, detection method, and X-ray imaging device provided by this invention, the X-ray detector includes at least a plurality of detector unit arrays, which are arranged side-by-side along a predetermined direction. The plurality of detector unit arrays include a first detector unit array and a second detector unit array. The first detector unit array has a first reaction cross section for X-rays, and the second detector unit array has a second reaction cross section for X-rays, wherein the first reaction cross section is larger than or smaller than the second reaction cross section. This allows X-ray photons to undergo Compton scattering primarily on the detector unit arrays relatively close to the X-ray emission source, and photoelectric effect primarily on the detector unit arrays relatively far from the X-ray emission source. This enables the detection of as much remaining energy of the X-ray photons as possible. Furthermore, based on the positional relationship between the X-ray photon trajectory detected by each detector unit array and the X-ray emission source, the main ray of the incident X-ray photon can be determined; and the total energy of the main ray X-ray detected by each detector unit array can be calculated to complete energy spectrum detection. Attached Figure Description

[0029] Figure 1 A schematic diagram of ASG shielding scattered lines in a third-generation CT scanner;

[0030] Figure 2 This is a schematic diagram showing the distribution of the fourth-generation CT detector and X-ray emission source, as well as the incident radiation.

[0031] Figure 3 This is a top view of the X-ray detector provided in an embodiment of the present invention;

[0032] Figure 4 This is a side view of the X-ray detector provided in an embodiment of the present invention.

[0033] Figure 5 A schematic flowchart of the detection method provided in an embodiment of the present invention;

[0034] Figure 6 This is a schematic diagram illustrating the X-ray trajectory detection effect of an X-ray detector, as exemplified in an embodiment of the present invention. Detailed Implementation

[0035] To make the objectives, advantages, and features of this invention clearer, the invention will be described in detail below with reference to the accompanying drawings and specific embodiments. It should be noted that the drawings are all in a very simplified form and are not drawn to scale, and are only used to facilitate and clearly illustrate the objectives of the embodiments of this invention. Furthermore, the structures shown in the drawings are often part of the actual structures. In particular, different figures may emphasize different aspects and sometimes use different scales. It should also be understood that, unless specifically stated or indicated, the terms "first," "second," "third," etc., in the specification are only used to distinguish the various components, elements, steps, etc., in the specification, and are not used to indicate the logical or sequential relationships between the various components, elements, steps, etc.

[0036] The interaction between X-ray photons and objects is divided into photoelectric effect, Compton scattering and coherent scattering. Among them, the proportion of coherent scattering in the X-ray energy region is relatively small and can be ignored.

[0037] When the photoelectric effect occurs, an X-ray photon loses all its energy in one go. The energy of an X-ray photon is proportional to the fifth power of the atomic number of the cross-section of the atoms in the material (the number of protons in the atomic nuclei of the material contained in the detector).

[0038] σ 光电 ∝Z 5 ;

[0039] During Compton scattering, X-ray photons can interact with matter multiple times, gradually losing energy. The energy of an X-ray photon is proportional to the first power of the atomic number of the interaction cross-section of the matter's atoms.

[0040] σ 康普顿 ∝Z 1 ;

[0041] Therefore, the probability of photoelectric interaction can be adjusted by selecting different detector materials.

[0042] In view of this, embodiments of the present invention provide an X-ray detector, including a plurality of layers of detector unit arrays, wherein the plurality of layers of detector unit arrays are arranged side by side along a predetermined direction; the predetermined direction may be, for example, the direction in which the X-ray generator points to the detector, or the direction in which the X-ray generator points to the hospital bed. The plurality of layers of detector unit arrays being arranged side by side along the predetermined direction may be, for example, multiple layers of detector unit arrays being stacked along the predetermined direction, such that each layer of detector unit array is at a different distance from the X-ray generator.

[0043] The complex layer detector array includes a first layer detector array and a second layer detector array;

[0044] The first layer of detector array has a first reaction cross section for X-rays, and the second layer of detector array has a second reaction cross section for X-rays. The first reaction cross section is larger or smaller than the second reaction cross section. The reaction cross section represents the probability that the X-ray photon beam interacts with all target nuclei in the medium, for example, the probability that the X-ray photon beam interacts with the detector array through photoelectric effect, Compton scattering, and / or coherent scattering. In this embodiment, the first reaction cross section being larger than the second reaction cross section indicates that the probability of the X-ray photon beam interacting with the first layer of detector array is greater than the probability of the X-ray photon beam interacting with the second layer of detector array. Conversely, the first reaction cross section being smaller than the second reaction cross section indicates that the probability of the X-ray photon beam interacting with the first layer of detector array is less than the probability of the X-ray photon beam interacting with the second layer of detector array. Thus, by setting different reaction cross sections for detector arrays at different positions, it is easier to identify scattered rays and main rays by detecting the trajectory of incident X-ray photons, thereby reducing the effect of scattered rays on the image.

[0045] When using the X-ray detector provided in this embodiment to detect the energy of X-ray photons, the detector array with a relatively large reaction cross-section can be positioned further away from the X-ray emission source, while the detector array with a relatively small reaction cross-section can be positioned closer to the X-ray emission source. This allows X-ray photons to undergo Compton scattering primarily on the detector array closer to the X-ray generator, and photoelectric effect primarily on the detector array farther from the X-ray generator. This ensures that as much of the remaining energy of the X-ray photons as possible is detected. Furthermore, based on the relationship between the X-ray photon trajectory detected by each layer of the detector array and the position of the X-ray emission source, the main ray of the incident X-ray photon can be determined; and the total energy of the main ray X-ray detected by each layer of the detector array can be calculated, thus completing the energy spectrum detection.

[0046] Furthermore, in this embodiment, the first layer of detector unit array can be the uppermost detector unit array along a predetermined direction, facing the X-ray emission source / X-ray generator, and is the detector unit array closest to the X-ray generator in the X-ray detector, and the material forming the first layer of detector unit array has a first atomic number; the second layer of detector unit array is located below the uppermost detector unit array, facing the X-ray emission source / X-ray generator, and the distance between the second layer of detector unit array and the X-ray detector is greater than the distance between the first layer of detector unit array and the X-ray detector, and the material forming the second layer of detector unit array has a second atomic number; wherein, the first atomic number is less than the second atomic number. That is, along the predetermined direction, the material used in the lower layer of the second layer of detector unit array has a larger atomic number than the material used in the upper layer of the first layer of detector unit array. The predetermined direction here can be understood as the direction of incident X-ray photon main rays, that is, the direction in which the X-ray generator points to the detector or the direction in which the X-ray generator points to the bed. When the first layer of detector array is different from the second layer of detector array, the probability of X-rays interacting with the first layer of detector array is different from the probability of X-rays interacting with the second layer of detector array. The interaction here can be, for example, the photoelectric effect, Compton scattering, and coherent scattering. The larger the atomic number, the greater the probability of the photoelectric effect and the lower the probability of Compton scattering. Since the atomic number of the second layer of detector array is greater than the thick-son number of the first layer of detector array, X-rays can be mainly subjected to Compton scattering on the first layer of detector array, while they can be mainly subjected to the photoelectric effect on the second layer of detector array.

[0047] Furthermore, the first layer of the detector array has a first thickness, and the second layer of the detector array has a second thickness. When the second layer of the detector array is located in the lower layer, the second thickness is greater than the first thickness. The greater the thickness, the higher the probability of photoelectric effect and the lower the probability of Compton scattering. Therefore, by designing the thickness of the second layer of the detector array to be greater than the thickness of the first layer of the detector array, X-rays will mainly undergo Compton scattering on the first layer of the detector array, while they will mainly undergo photoelectric effect on the second layer of the detector array.

[0048] That is, the relationship between the atomic number and thickness of the second-layer detector array and the first-layer detector array includes the following three cases:

[0049] (1) The first thickness is equal to the second thickness, and the second thick sub-number is greater than the first atomic number;

[0050] (2) The first atomic number is equal to the second atomic number, and the second thickness is greater than the first thickness;

[0051] (3) The second thickness is greater than the first thickness, and the second atomic number is greater than the first atomic number.

[0052] However, since the thickness of the detection unit itself is not too large, the X-ray detector provided in this embodiment preferably adopts the above-mentioned scheme (1) or (3) for the first layer detection unit array and the second detection unit array.

[0053] In this embodiment, to enable the detector to have position resolution capability, multiple detection units in each layer are arranged in a two-dimensional array to form a detection unit array, such as... Figure 3 As shown, multiple detection units are sequentially distributed in the X and Z directions to form the detection unit array. Furthermore, in this embodiment, the spacing between two adjacent detection units can be 0. However, to improve the positional resolution of X-rays, it is preferable to appropriately adjust the spacing between different layers of the detection unit array, such that adjacent layers of the detection unit array are spaced apart. Figure 4 As shown, in the Y direction, there is a certain distance between adjacent arrays of detection units.

[0054] During actual scanning, X-rays are emitted from the focal point of the X-ray tube. As they pass over the object being scanned, there is a certain probability of photoelectric effect and scattering. X-rays affected by the photoelectric effect are absorbed and their position changes cease. Scattered X-rays lose some energy and are deflected at a certain angle. If the X-ray's direction of travel remains unchanged throughout the entire detection process before entering the detector surface, this X-ray is called the main ray; otherwise, if its direction changes, it is called a scattered ray. The deflected scattered X-rays change their direction of travel and enter other detection units, generating interference signals.

[0055] The X-ray detector provided in this embodiment can record the position information of X-ray photons in each layer (if a reaction occurs). Therefore, based on the X-ray detector provided in this embodiment, as... Figure 5 As shown, this embodiment also provides an energy spectrum detection method, including the following steps:

[0056] S11, based on the relationship between the X-ray photon track detected by each layer of the detector unit array and the position of the X-ray emission source, determine the main ray of the incident X-ray photon;

[0057] S12, calculate the total energy of the main X-rays detected by each layer of the detection unit array to obtain projection data.

[0058] S13, Reconstruct the energy spectrum image of the detected object based on the projection data.

[0059] In step S11, the main ray of the incident X-ray photon can be determined as follows: determine whether the distance between the extension line of the track of the detected X-ray photon and the X-ray emission source in the plane where the X-ray emission source is located (i.e., the virtual focus of the extension line of the X-ray photon track) is within a preset range. If so, it is determined to be the main ray.

[0060] In some other embodiments, the main ray of the incident X-ray photon can also be determined as follows: determine whether the angle between the extension of the track of the detected X-ray photon and the perpendicular incident direction of the X-ray emission source is within a preset range; if so, it is determined to be the main ray.

[0061] In yet another embodiment, this application also provides a multi-spectral detection method, comprising:

[0062] First, the target object is scanned separately using X-rays of multiple energy spectra within their respective set ranges;

[0063] Secondly, based on the relationship between the X-ray photon tracks detected by each layer of the detector array and the position of the X-ray emission source, the main X-ray ray of each energy spectrum is determined.

[0064] Next, the total energy of the main X-ray of each energy spectrum detected by each layer of the detector unit array is calculated to determine the multi-energy spectral projection data; and,

[0065] Based on the multi-energy spectral projection data, images of the detected object under each energy spectrum are obtained.

[0066] Optionally, the material contained in the detected object can be further separated / distinguished based on the image of the detected object.

[0067] To distinguish between the primary ray and scattered rays as accurately as possible, in this embodiment, preferably, the X-ray detector includes two or more layers of first-layer detector unit arrays having the first atomic number and the first thickness. At least two of these first-layer detector unit arrays are sequentially arranged along a predetermined direction and are all located above the second-layer detector unit array. That is, the X-ray detector provided in this embodiment includes at least two layers of detector unit arrays that primarily generate Compton scattering, and both are located above detector unit arrays that primarily generate the photoelectric effect. This allows photoelectrons to undergo Compton scattering on the two or more layers of detector unit arrays, thereby achieving the goal of distinguishing all scattered rays as much as possible.

[0068] Figure 3As shown, an X-ray detector exemplified in this embodiment includes: layer 1, layer 2, and layer 3, which are spaced apart. Layer 1 and layer 2 are selected from detector materials with low atomic numbers to reduce the photoelectric effect response cross-section. The materials may include, for example, silicon (Si) or gallium arsenide (GaAs), but other detector materials with low atomic numbers may also be used, and this application is not limited thereto. Layer 3 is selected from detector materials with higher atomic numbers and thickness to increase the photoelectric effect response cross-section. The materials may include, for example, at least one of cadmium antimonide (CdTe), zinc antimonide (ZnTe), and cadmium zinc antimonide (CdZnTe), but other detector materials with high atomic numbers may also be used, and this application is not limited thereto. Ideally, the incident photoelectrons are scattered (Compton scattering) on ​​layer 1 and layer 2, and the photoelectric effect occurs on layer 3, so that all the remaining energy is absorbed by layer 3.

[0069] Figure 6 This is a schematic diagram illustrating the X-ray trajectory detection effect of the X-ray detector in this embodiment. Here, 1, 2…k+2 represent different detector units, d1 represents the spacing between layer 1 and layer 2, d2 represents the spacing between layer 2 and layer 3, the angle between the trajectory extension line and the perpendicular incident direction of the X-ray source is θ, and the distance between the virtual focal point of the X-ray photon trajectory extension line and the X-ray source is d. When θ or d is within a preset range, the corresponding ray is determined to be the main ray.

[0070] In this embodiment, Figure 6The solid line represents the trajectory of X-ray photons. Photons emitted from the focal point of the X-ray tube and detected by detector unit k in layer 1 are identified as main X-ray data; photons emitted from the focal point of the X-ray tube and detected by detector unit k in layer 3 are also identified as main X-ray data. During a certain scanning period, X-rays emitted from the focal point of the X-ray tube pass through the surface of the object being detected (phantom), are scattered on the phantom, and are detected by detector unit k+1 in layer 1 and detector unit k-1 in layer 3. Connecting the two detector units within this scanning period yields the trajectory of the X-rays. In this embodiment, the position detected by detector unit k+1 in layer 1 is used as the first coordinate, and the position detected by detector unit k-1 in layer 3 is used as the second coordinate. By linear fitting, the extension line of the X-ray photon trajectory can be determined. The intersection of the extension line of the X-ray photon trajectory and the horizontal plane where the X-ray tube is located is the virtual focal point. In this embodiment of the application, if the virtual focus and the X-ray tube focus are greater than the set range, the determination result is that the X-rays detected by the detector unit k+1 of layer 1 and the detector unit k-1 of layer 3 are non-primary rays.

[0071] Furthermore, in the X-ray detector provided in this embodiment, both the first thickness and / or the second thickness are adjustable. For example, each detector unit in each layer of the detector unit array adopts a multi-layer splicing structure, and the multi-layers are detachably connected by means of bonding or other methods. Thus, when the thickness needs to be increased, the number of layers can be increased, and when the thickness needs to be decreased, the number of layers can be decreased.

[0072] Accordingly, the energy spectrum detection method provided in this embodiment, in addition to the above steps S11 and S12, may also include: performing at least one of the following adjustments based on the detected energy spectrum:

[0073] Adjust the first thickness and / or the second thickness;

[0074] Adjust the number of layers in the detector array having the second atomic number and the second thickness.

[0075] That is, by adjusting the thickness and number of layers of the detection unit array multiple times, the scattered rays can be distinguished before entering the last layer, and the last layer can absorb all the remaining energy, thereby ensuring the image presentation effect.

[0076] In addition, this embodiment also provides an X-ray imaging device, including:

[0077] X-ray generator, used to produce X-rays;

[0078] A detector is disposed opposite to the X-ray generator. The detector includes a plurality of layers of detector unit arrays, which includes a first layer of detector unit array and a second layer of detector unit array.

[0079] The distance between the first layer of the detection unit array and the X-ray generator is less than the distance between the second layer of the detection unit array and the X-ray generator;

[0080] The energy of X-rays that can be deposited on the first layer of the detector array is different from the energy of X-rays that can be deposited on the second layer of the detector array; or, the probability of X-rays interacting with the first layer of the detector array is less than the probability of X-rays interacting with the second layer of the detector array.

[0081] Furthermore, the first layer of detector unit array and the second layer of detector unit array are stacked along a predetermined direction, which is the direction in which the X-ray generator points to the detector. For example, the X-ray generator and detector are arranged opposite each other within a frame, the frame forming a circumferential detection cavity that extends along an axial direction. In this embodiment, the axial direction corresponds to... Figure 3 In this diagram, the Z-direction, X-direction (left-right or circumferential direction of the detection cavity), and Y-direction (radial direction of the detection cavity) are all perpendicular to each other. The first and second layer detector unit arrays extend within the planes defined by the X and Z directions, and are stacked vertically along the Y-direction. Thus, the first layer detector unit array is closer to the center of the detection cavity, and the distance between the second layer detector unit array and the center of the detection cavity is greater than the distance between the first layer detector unit array and the center of the detection cavity.

[0082] In summary, the X-ray detector, detection method, and X-ray imaging device provided by this invention include an X-ray detector comprising at least a plurality of detector unit arrays arranged side-by-side along a predetermined direction. The plurality of detector unit arrays include a first detector unit array and a second detector unit array. The first detector unit array has a first reaction cross section for X-rays, and the second detector unit array has a second reaction cross section for X-rays, wherein the first reaction cross section is larger than or smaller than the second reaction cross section. This allows X-ray photons to undergo Compton scattering primarily on the detector unit arrays relatively close to the X-ray emission source, and photoelectric effect primarily on the detector unit arrays relatively far from the X-ray emission source. This enables the detection of as much remaining energy of the X-ray photons as possible. Furthermore, based on the positional relationship between the X-ray photon trajectory detected by each detector unit array and the X-ray emission source, the main ray of the incident X-ray photon can be determined; and the total energy of the main ray X-ray detected by each detector unit array can be calculated to complete energy spectrum detection.

[0083] Furthermore, it should be understood that although the present invention has been disclosed above with reference to preferred embodiments, these embodiments are not intended to limit the present invention. For any person skilled in the art, many possible variations and modifications can be made to the technical solutions of the present invention based on the disclosed technical content, or equivalent embodiments with equivalent changes, without departing from the scope of the present invention. Therefore, any simple modifications, equivalent changes, and modifications made to the above embodiments based on the technical essence of the present invention without departing from the content of the present invention shall still fall within the scope of protection of the present invention.

Claims

1. A method for energy spectrum detection, characterized in that, include: An X-ray detector is provided, comprising a plurality of detector unit arrays arranged side-by-side along a predetermined direction; the plurality of detector unit arrays include a first detector unit array and a second detector unit array; the first detector unit array is closer to the X-ray emission source than the second detector unit array, the first detector unit array has a first reaction cross section for X-rays, and the second detector unit array has a second reaction cross section for X-rays, the first reaction cross section being larger than the second reaction cross section, so that X-ray photons can undergo Compton scattering primarily on the detector unit arrays relatively close to the X-ray emission source, while undergoing photoelectric effect primarily on the detector unit arrays relatively far from the X-ray emission source; the main ray of the incident X-ray photons is determined based on the positional relationship between the X-ray photon trajectory detected by each detector unit array and the X-ray emission source; Calculate the total energy of the main rays of the incident X-rays detected by each layer of the detection unit array to obtain projection data; The energy spectrum image of the detected object is reconstructed based on the projection data.

2. The method for energy spectrum detection as described in claim 1, characterized in that, Based on the relationship between the X-ray photon tracks detected by each layer of the detector array and the position of the X-ray emission source, the main rays of the incident X-rays are determined to include: Determine whether the distance between the extended line of the detected X-ray photon's trajectory and the X-ray emission source is within a preset range. If so, then it is determined to be the main ray.

3. The method for energy spectrum detection as described in claim 1, characterized in that, The first layer of the detector unit array is the detector unit array located at the top layer along a set direction, and the material forming the first layer of the detector unit array has a first atomic number; The second layer of the detector array is located below the uppermost detector array, and the material forming the second layer of the detector array has a second atomic number; Wherein, the first atomic number is less than the second atomic number.

4. The method for performing energy spectrum detection as described in claim 3, characterized in that, The first layer of the detector array has a first thickness, and the second layer of the detector array has a second thickness.

5. The method for energy spectrum detection as described in claim 3, characterized in that, The X-ray detector includes at least two layers of the first layer detection unit array, which are arranged sequentially along a set direction and are all located above the second layer detection unit array.

6. The method for performing energy spectrum detection as described in claim 1, characterized in that, The detection unit arrays of two adjacent layers are spaced apart.

7. The method for energy spectrum detection as described in claim 1, characterized in that, The material of the second layer detector array includes at least one of cadmium antimonide, zinc antimonide, and cadmium zinc antimonide, and the material of the first layer detector array includes at least one of silicon and gallium arsenide.

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