An automatic transformer testing line and a testing method

Abstract

The application discloses a kind of transformer automatic test line and test method, including insulating base plate, annular track is provided on the insulating base plate, test device is provided above the annular track, and the conveyor belt below the annular track conveys transformer to test device and is detected;The test device includes the insulating base plate that is arranged on annular track, and the transformer on the conveying belt is clamped upward by parallel finger through the up-down air cylinder on the insulating base plate, and the driving device on the insulating base plate drives the insulating base plate to drive transformer along annular track trajectory to pass through several detection zones and is detected.The application provides a kind of transformer automatic test line and test method, and transformer is conveyed to test position by conveying belt, it is convenient to clamp transformer by up-down air cylinder and carry out automatic test, avoid to carry out not in place phenomenon when carrying transformer, not easy to cause transformer damage.

Description

Technical Field

[0001] This invention relates to the field of automatic transformer testing lines. Background Technology

[0002] After the transformer is finished, it needs to undergo electrical performance testing before subsequent processes can proceed. The entire testing process is complex, tedious, and time-consuming and labor-intensive, especially for high-frequency products. Conventional automatic transformer testing lines set up a testing station for each test item, and each testing station is moved between them by cylinders moving up, down, left, and right. During the movement, the transformer often fails to be in the correct position, and the transformer's pins are easily misaligned with the test terminals of the testing instrument, which can easily damage the product. Summary of the Invention

[0003] Purpose of the invention: In order to overcome the shortcomings of the existing technology, the present invention provides an automatic transformer testing line and testing method. The transformer is transported to the testing position by a conveyor belt, which facilitates the automatic testing of the transformer by clamping the transformer with upper and lower cylinders, avoiding the phenomenon of improper handling of the transformer during transportation and reducing the risk of transformer damage.

[0004] Technical solution: To achieve the above objectives, the technical solution of the present invention is as follows:

[0005] An automatic transformer testing line includes an insulating base plate with a circular track on it. A testing device is positioned above the circular track, and a conveyor belt below the circular track transports a transformer to the testing device for testing. The testing device includes an insulating base plate mounted on the circular track. Upper and lower cylinders on the insulating base plate grip the transformer on the conveyor belt and move it upwards via parallel fingers. A driving device on the insulating base plate drives the insulating base plate to move the transformer along the circular track through several testing zones for testing.

[0006] Furthermore, the insulating base plate includes fixed plates disposed at both ends of the annular track; the bottom of the annular track is spaced from the ground; the annular track is through-hole, and a matching annular groove is formed on the inner wall of the annular track; a rotating platform is disposed at the middle of both ends of the annular track, and a rotating belt is sleeved between the two rotating platforms; a guide rail is fixedly disposed around the edge of the annular track surface, and multiple rollers at the bottom of the insulating base plate are correspondingly engaged on the guide rail; the rotating belt is detachably connected to the insulating base plate, and the driving device drives the rotating belt to move the insulating base plate around the guide rail, thereby moving the transformer around through several detection zones.

[0007] Furthermore, the bottom of the insulating substrate is provided with upper and lower cylinders, and the bottom of the upper and lower cylinders is provided with parallel fingers; a probe base is installed on the top of the upper and lower cylinders, and the probe base has a through hole for mounting the probe. The upper and lower cylinders are driven to the bottom of the probe base; an insulating plate is provided above the probe base, and multiple connecting grooves are formed around the bottom of the insulating plate. The connecting grooves are along the same circumferential running path as the probe. A metal strip is embedded in the connecting groove. The metal strip is electrically connected to the terminal on the insulating plate, and the terminal is electrically connected to the tester on the insulating plate. The metal strip is segmented, and each segment of the metal strip corresponds to the tester in its respective detection area.

[0008] Furthermore, a connecting block is provided at the bottom of the upper and lower cylinders, and a clamping finger is provided at the bottom of the connecting block. Multiple parallel fingers of the clamping finger form a clamping area for clamping the transformer. Wear-resistant insulating blocks are installed on the parallel fingers. A matching groove is opened at the bottom of the inner wall of the wear-resistant insulating block, and the matching groove is set corresponding to the edge of the transformer. A corresponding groove is opened at the top of the inner wall of the wear-resistant insulating block, and the matching groove communicates with the corresponding groove. The feet of the transformer are correspondingly embedded in the corresponding groove.

[0009] Furthermore, several corresponding grooves are arranged on opposite sidewalls of the wear-resistant insulating blocks, with the number of corresponding grooves exceeding the number of transformer pins. A metal sheet is embedded in each corresponding groove, and the metal sheet is connected to the bottom of the probe via an insulated wire. The upper and lower cylinder drive connecting blocks drive parallel fingers to clamp the transformer downwards, and the pins on the transformer are embedded in the corresponding grooves. The pins of the transformer contact the metal sheet, and then the pins of the transformer are connected to the probe.

[0010] Furthermore, the mounting holes on the probe base are arranged at intervals, the probe passes through the mounting holes, and the top of the probe is rounded; multiple rows of probes are arranged to correspond to multiple parallel fingers; when the probe moves upward, the rounded head of the probe is embedded in the connecting groove, and the rounded head of the probe contacts the metal strip.

[0011] Furthermore, the conveyor belt includes a transport track, a defective track, and a qualified track; the transport track, defective track, and qualified track are located between opposing fixed plates and are arranged in parallel; the upper and lower cylinders can grip the transformer on the transport track with parallel fingers, and after inspection, the transformer can be driven into the corresponding defective track and qualified track by parallel fingers.

[0012] Furthermore, the testing method is as follows: First, the transformer to be tested is transported by the transport track. When the transformer is transported to the bottom of the upper and lower cylinders, the upper and lower cylinders drive the parallel fingers to move downward to the edge of the transformer. Then, the parallel fingers clamp the transformer close to each other. At this time, the transformer's pins are embedded in the corresponding grooves and the transformer's pins are in contact with the metal sheet.

[0013] The second step is to clamp the transformer and then move the transformer upward with the upper and lower cylinders. At the same time, the upper and lower cylinders drive the round head of the probe at the top to be inserted into the connecting groove and the probe to contact the metal strip.

[0014] Third, the rotating belt drives the transformer to rotate around the insulating substrate. The transformer passes through multiple detection zones via probes, thus performing multi-performance tests. Next, the upper and lower cylinders drive the parallel fingers to clamp the transformer on the conveyor track, and the above steps are repeated. After the test is completed, the parallel fingers place qualified products into the qualified track and unqualified products into the unqualified track.

[0015] Beneficial effects: In this invention, the circular track is arranged in a ring, with multiple insulating bases that can move around the track. When the transformer is transported to the bottom of the testing device, the upper and lower cylinders on the insulating bases move downwards, clamping the transformer with parallel fingers, and then driving the transformer through multiple testing zones. Thus, the testing instruments in the testing zones can perform automated testing on the transformer. Then, the conveyor belt continues to drive other transformers to be tested, and the next upper and lower cylinder clamps the transformer with parallel fingers, repeating the above testing action. Because the transformer is transported by the conveyor belt, it is not necessary to move it left and right, thus avoiding damage to the transformer due to misalignment during left and right movement. It also reduces the time spent on transportation and improves efficiency. Attached Figure Description

[0016] Appendix Figure 1 This is a diagram of the automatic test line structure.

[0017] Appendix Figure 2 This is a diagram of a circular track structure.

[0018] Appendix Figure 3 This is a structural diagram of the testing device;

[0019] Appendix Figure 4 This is a structural diagram of the upper and lower cylinders;

[0020] Appendix Figure 5 Diagram of parallel finger structure;

[0021] Appendix Figure 6 Here is the corresponding groove structure diagram;

[0022] Appendix Figure 7 To adjust the structure diagram;

[0023] Appendix Figure 8 Diagram of the extruded block structure;

[0024] Appendix Figure 9 This is a structural diagram of the insulation board;

[0025] Appendix Figure 10 For testing the channel structure diagram;

[0026] Appendix Figure 11 This is a structural diagram of a conveyor belt. Detailed Implementation

[0027] The invention will now be further described with reference to the accompanying drawings.

[0028] As attached Figure 1-11 An automatic transformer testing line includes an insulating base plate 1, a circular track 2 on the insulating base plate 1, a testing device 3 above the circular track 2, and a conveyor belt 21 below the circular track 2 transporting a transformer to the testing device 3 for testing. The testing device 3 includes an insulating base plate 31 disposed on the circular track 2. Upper and lower cylinders 32 on the insulating base plate 31 clamp the transformer on the conveyor belt 21 and move it upward through parallel fingers 34. A driving device on the insulating base plate 1 drives the insulating base plate 31 to move the transformer along the trajectory of the circular track 2 through several testing areas for testing. The device features a circular track with multiple insulating bases that can move around the track. When a transformer is transported to the bottom of the testing device, the upper and lower cylinders on the insulating bases move downwards, gripping the transformer with parallel fingers. The transformer is then moved through multiple testing zones, where the testing instruments can perform automated testing. The conveyor belt continues to move other transformers to be tested, and the next upper and lower cylinder grips the transformer with parallel fingers, repeating the above testing action. The conveyor belt eliminates the need to move the transformer left and right, avoiding damage caused by misalignment during left and right transport, and also reducing transport time and improving efficiency.

[0029] When testing transformers for high-frequency products, handling them by hand can affect test results due to static electricity and body temperature. Furthermore, frequency doubling and high-voltage tests involve high-voltage live testing, and although certain safety protection measures exist, personal safety hazards remain. This is especially true for high-voltage testing, which requires at least several kilovolts to inspect the product, demanding careful operation, resulting in low efficiency and time-consuming manual judgment, which is prone to errors in data observation and misjudgment. However, by installing a testing device on a circular track, when the transformer is conveyed to the testing device by a conveyor belt, the upper and lower cylinders on the device use parallel fingers to grip the transformer, and the transformer is automatically tested by a testing instrument in the testing area. This effectively ensures operator safety, significantly improves efficiency, reduces misjudgment, and increases the product qualification rate.

[0030] The insulating base plate 1 includes fixed plates 22 at both ends of the annular track 2; the bottom of the annular track 2 is spaced from the ground; the annular track 2 is through-run in the middle, and the inner wall of the annular track 2 has a mating groove 25; a rotating platform 24 is provided at the middle of both ends of the annular track 2, and a rotating belt 9 is sleeved between the two rotating platforms 24; a guide rail 26 is fixedly arranged around the edge of the surface of the annular track 2, and multiple rollers 33 at the bottom of the insulating substrate 31 are correspondingly engaged on the guide rail 26. The insulating substrate is guided by the rollers, and the rollers can assist the insulating substrate in moving around the track; the rotating belt 9 is detachably connected to the insulating substrate 31. One end of the insulating substrate corresponding to the rotating belt can be fixed to the side wall of the rotating belt by a connecting wire or bolt. An upper and lower cylinder is provided on the other end of the insulating substrate. When the rotating belt rotates, it can drive the insulating substrate to rotate on the guide rail. The driving device drives the rotating belt 9 to drive the insulating substrate 31 to move around the guide rail 26, thereby driving the transformer to move around through several detection areas. The drive unit drives the rotating table to rotate the rotating belt. The rotating belt drives the transformer to move around the guide rail through the insulating substrate, thereby driving the transformer through several testing areas for testing. This avoids the need to move the transformer to the testing device and prevents it from being moved out of place.

[0031] The insulating substrate 31 has an upper and lower cylinder 32 at its bottom, and parallel fingers 34 at its bottom. A probe base 4 is mounted on the top of the upper and lower cylinders 32, and a mounting hole 411 for mounting a probe 41 is formed through the probe base 4. The upper and lower cylinders 32 are driven to the bottom of the probe base 4. An insulating plate 42 is positioned above the probe base 4. Multiple connecting grooves 421 are formed around the bottom of the insulating plate 42, and these grooves follow the same circumferential path as the probe 41. A metal strip 422 is embedded within each connecting groove 421, and the metal strip 422 connects to the insulating plate 42. The terminals are electrically connected, and the terminals are electrically connected to the tester on the insulating plate 42. The metal strip 422 is segmented, and each segment of the metal strip 422 corresponds to the tester in its respective detection area. The metal strip can be divided into multiple segments as needed to detect multiple performance characteristics. The segments are disconnected from each other, so that when the transformer passes through the detection area of ​​each segment, the detection of each segment will not affect each other. When the transformer is picked up by parallel fingers, the pins of the transformer can connect with the probe. Then the probe moves upward and embeds into the connecting groove. The probe contacts the metal strip, and the metal strip is connected to the tester through the terminals, so that the tester can test the transformer.

[0032] The bottom of the upper and lower cylinders 32 is provided with a connecting block 321, and the bottom of the connecting block 321 is provided with clamping fingers. Multiple parallel fingers 34 of the clamping fingers form a clamping area for clamping the transformer. Wear-resistant insulating blocks 341 are installed on the parallel fingers 34. The bottom of the inner wall of the wear-resistant insulating block 341 is provided with a matching groove 348, which corresponds to the edge of the transformer. The top of the inner wall of the wear-resistant insulating block 341 is provided with a corresponding groove 342. The matching groove 348 communicates with the corresponding groove 342, and the feet of the transformer are correspondingly embedded in the corresponding groove 342. When the transformer is held by parallel fingers, its pins are inserted into the corresponding grooves, and the pins contact the metal plate. The metal plate is connected to the probe via an insulated wire, and the probe is inserted into the connecting groove and connected to the metal strip. The metal strip is connected to the terminal block, and the terminal block is connected to the tester, allowing the tester to test the transformer. Holding the transformer by parallel fingers eliminates the need for lateral movement, making it easier for the pins to be inserted into the corresponding grooves. Lateral movement can easily result in the transformer not being properly positioned, potentially damaging it during testing.

[0033] A plurality of wear-resistant insulating blocks 341 are provided with corresponding grooves 342 on opposite sidewalls. The number of corresponding grooves 342 exceeds the number of transformer pins. A metal sheet 343 is embedded in each corresponding groove 342, and the metal sheet 343 is connected to the bottom of the probe 41 via an insulated wire. The upper and lower cylinders 32 drive the connecting block 321 to move the parallel fingers 34 downward to clamp the transformer. The pins on the transformer are correspondingly embedded in the corresponding grooves 342, and the pins of the transformer contact the metal sheet 343, thereby connecting the pins of the transformer to the probe 41. A plurality of mounting holes 4 are provided on the probe base 4. The probes 41 are arranged at 11 intervals and pass through the mounting holes 411. The top of each probe 41 is rounded. Multiple rows of probes 41 are arranged to correspond to multiple parallel fingers 34. When the probes 41 move upward, the rounded heads of the probes 41 are embedded in the connecting grooves 421 and contact the metal strips 422. The metal strips are connected to the tester through terminals, enabling automatic detection. The connecting grooves are arranged around the probes and contain metal strips to form a detection channel. The detection channel is divided into multiple detection areas. The rounded heads of the probes are embedded in the detection channel and can perform various tests when passing through multiple detection areas.

[0034] The connecting block 321 has fitting grooves 323 at both ends of its bottom. An adjustment structure 5 is provided in the fitting grooves 323. The parallel fingers 34 are positioned in the fitting grooves 323 through the adjustment structure 5, and the spacing of the clamping area can be adjusted by the adjustment structure 5. When the upper and lower cylinders drive the parallel fingers downward to the edge of the transformer, the adjustment structure adjusts the multiple parallel fingers to be relatively close. The multiple parallel fingers clamp the transformer, and the transformer's pins are inserted into the corresponding grooves and contact the metal sheet. In this way, the transformer pins are connected to the probe through the metal sheet, and the probe is connected to the tester through the metal strip, so that the transformer can be tested by the tester. Corresponding grooves are provided on the multiple parallel fingers, and the transformer pins on the conveyor belt can face multiple directions, which is convenient for placement and conveying of the transformer by the conveyor belt.

[0035] The bottom of the connecting block 321 has a through hole 324, which is parallel to the movement direction of the parallel fingers 34. The through hole 324 connects to multiple fitting grooves 323, and an embedding hole 325 is provided at the top center of the through hole 324. The adjusting structure 5 includes a rotating connecting rod 51 and a pushing rod 52. The rotating connecting rod 51 is movably disposed in the embedding hole 325. The pushing rods 52 are embedded in both ends of the through hole 324. One end of the pushing rod 52 extends out of the through hole 324 and is fixedly connected to the mating block at the top of the parallel fingers 34. The mating block is fixedly connected to the inner wall of the fitting groove by a spring 54, and the spring is sleeved on the pushing rod 52. The spring plays a guiding and tensioning role, using the tension force to clamp the transformer. One end of the rotating connecting rod 51 extends into the through hole 324 and pushes the pushing rod 52 to move back and forth in the through hole 324, increasing or decreasing the distance between the multiple parallel fingers 34. The drive unit drives the rotating linkage to rotate. During the rotation, the end of the push rod away from the rotating linkage extends out or enters the connecting hole. This push rod, through the mating block, drives the parallel fingers to move relative to each other. The clamping area formed between the multiple opposing parallel fingers can be adjusted, making it easy to clamp the transformer. At the same time, the transformer's pins can be embedded into the corresponding grooves. When the transformer's pins are connected to the probe, and the probe is connected to the tester, the transformer can be tested by the tester. This automated testing method improves production capacity, reduces the probability of false judgment, increases the pass rate, and ensures the safety of operators.

[0036] The connecting hole 324 and the embedding hole 325 are connected through a cavity 326. A pushing block 53 is provided in the cavity 326. The bottom end of the rotating connecting rod 51 is fixedly connected to the pushing block 53. The cross-section of the pushing block 53 is elliptical. The pushing block 53 is located between the opposing pushing rods 52. The end face of the pushing rod 52 is slidably disposed with the side wall of the pushing block 53. The rotating device in the embedding hole 325 drives the rotating connecting rod 51 to rotate the pushing block 53. The corresponding pushing and pushing rods 52 of the pushing block 53 enter and exit the connecting hole 324, thereby causing the pushing rods 52 to move the parallel fingers 34 closer or further away. The rotating connecting rod drives the push block to rotate within the cavity. Since the push block itself is elliptical, the distance between the parallel fingers is greatest when the major axis of the push block rotates to the position of the push rod, and smallest when the minor axis of the push block rotates to the position of the push rod. Thus, by rotating the push block, the push rod can be driven to move, and the push rod correspondingly drives the parallel fingers to move, thereby adjusting the clamping range between the parallel fingers. This facilitates clamping the transformer and also makes it easier for the transformer's pins to be inserted into the corresponding grooves. When the transformer is clamped, the tester can test the transformer.

[0037] The conveyor belt 21 includes a transport track 211, a defective track 212, and a qualified track 213. The transport track 211, defective track 212, and qualified track 213 are located between opposing fixed plates 22 and are arranged in parallel. The upper and lower cylinders 32 can grip the transformer on the transport track 211 with parallel fingers 34. After testing, the transformer can be driven into the corresponding defective track 212 and qualified track 213 by the parallel fingers 34. Multiple defective tracks can be set according to multiple performance tests. Based on the performance tests that fail, the transformer is placed into the corresponding defective channel.

[0038] The testing method is as follows: First, the transport track 211 transports the transformer to be tested. When the transformer is transported directly below the upper and lower cylinders 32, the upper and lower cylinders 32 drive the parallel fingers 34 to move downwards to the edge of the transformer. Then, the parallel fingers 34 clamp the transformer relatively close to each other. At this time, the transformer's pins are embedded in the corresponding grooves 342, and the transformer's pins are in contact with the metal plate 343. The upper and lower cylinders drive the parallel fingers to approach the transformer, and then the structure is adjusted to adjust the distance between the parallel fingers, so that the transformer can be clamped up for testing by the testing instrument.

[0039] The second step involves clamping the transformer and then using the upper and lower cylinders 32 to move the transformer upwards. Simultaneously, the upper and lower cylinders 32 drive the round head of the top probe 41 to embed into the connecting groove 421, and the probe 41 contacts the metal strip 422. The transformer's pins contact the metal plate, the metal plate connects to the probe, and then the probe connects to the terminal block through the metal strip. The terminal block connects to the tester, thus enabling automatic testing of the transformer through the tester and improving testing efficiency.

[0040] Third, the rotating belt drives the transformer to rotate around the insulating substrate 31. The transformer passes through multiple detection zones via the probe 41, thus performing multi-performance tests. Next, the upper and lower cylinders 32 drive the parallel fingers 34 to clamp the transformer on the conveyor track 211, and the above steps are repeated. After the test is completed, the parallel fingers 34 place qualified products into the qualified track 213 and unqualified products into the unqualified track 212. This improves the testing efficiency, reduces misjudgment, and increases the pass rate of transformer products.

[0041] The above are merely preferred embodiments of the present invention and are not intended to limit the present invention. For those skilled in the art, several improvements and changes can be made without departing from the above principles of the present invention, and these improvements and changes are also considered to be within the scope of protection of the present invention.

Claims

1. An automatic transformer testing line, characterized in that: The device includes an insulating base plate (1), on which a circular track (2) is provided. A testing device (3) is provided above the circular track (2). A conveyor belt (21) below the circular track (2) transports a transformer to the testing device (3) for testing. The testing device (3) includes an insulating base plate (31) provided on the circular track (2). An upper and lower cylinder (32) on the insulating base plate (31) uses parallel fingers (34) to grip the transformer on the conveyor belt (21) and move it upward. A driving device on the insulating base plate (1) drives the insulating base plate (31) to move the transformer along the circular track (2) through several testing areas for testing. The insulating substrate (31) is provided with upper and lower cylinders (32) at the bottom, and parallel fingers (34) are provided at the bottom of the upper and lower cylinders (32); a probe base (4) is installed on the top of the upper and lower cylinders (32), and a mounting hole (411) for mounting the probe (41) is opened through the probe base (4). The upper and lower cylinders (32) are driven to the bottom of the probe base (4); an insulating plate (42) is provided above the probe base (4), and multiple connecting grooves (421) are opened around the bottom of the insulating plate (42). The connecting grooves (421) have the same running path as the probe (41). A metal strip (422) is embedded in the connecting groove (421), and the metal strip (422) is connected to the insulating plate (42). The terminals are electrically connected, and the terminals are electrically connected to the tester on the insulating plate (42); the metal strip (422) is segmented, and each segment of the metal strip (422) corresponds to the tester in its respective detection area; the metal strip (422) can be divided into multiple segments according to the multiple performances to be detected, and the segments are disconnected from each other, so that when the transformer passes through the detection area of ​​each segment, the detection of each segment will not affect each other; when the parallel fingers (34) pick up the transformer, the pins of the transformer can connect with the probe (41), and then the probe (41) moves upward and embeds into the connecting groove (421), the probe (41) contacts the metal strip (422), and the metal strip (422) is connected to the tester through the terminals, so that the tester can test the transformer; The bottom of the upper and lower cylinders (32) is provided with a connecting block (321), and the bottom of the connecting block (321) is provided with a clamping finger. Multiple parallel fingers (34) of the clamping finger form a clamping area for clamping the transformer. A wear-resistant insulating block (341) is installed on the parallel fingers (34). A matching groove (348) is opened at the bottom of the inner wall of the wear-resistant insulating block (341). The matching groove (348) is set corresponding to the edge of the transformer. A corresponding groove (342) is opened at the top of the inner wall of the wear-resistant insulating block (341). The matching groove (348) is connected to the corresponding groove (342). The feet of the transformer are embedded in the corresponding groove (342). When the parallel fingers (34) clamp the transformer, the feet of the transformer are embedded in the corresponding groove (342). The feet of the transformer are in contact with the metal plate. The metal plate is connected to the probe (41) through an insulated wire. The probe (41) is embedded in the connecting groove (421) and connected to the metal strip (422). A plurality of wear-resistant insulating blocks (341) are provided with corresponding grooves (342) on opposite sidewalls. The number of corresponding grooves (342) exceeds the number of transformer pins. A metal sheet (343) is embedded in each corresponding groove (342). The metal sheet (343) is connected to the bottom of the probe (41) via an insulated wire. The upper and lower cylinders (32) drive the connecting block (321) to move the parallel fingers (34) downward to clamp the transformer. The pins on the transformer are embedded in the corresponding grooves (342). The pins of the transformer contact the metal sheet (343), and then the pins of the transformer are connected to the probe (41). The probe (41) has a rounded top; multiple rows of probes (41) are set to correspond to multiple parallel fingers (34); when the probe (41) moves upward, the rounded top of the probe (41) is embedded in the connecting groove (421), and the rounded top of the probe (41) contacts the metal strip (422). The metal strip (422) is connected to the tester through the terminal block, so that automatic detection can be performed. The connecting groove (421) is arranged around the probe, and the metal strip (422) is set inside to form a detection channel. The detection channel is divided into multiple detection areas. The rounded top of the probe (41) is embedded in the detection channel. When it passes through multiple detection areas, it can perform various tests.

2. The automatic transformer testing line according to claim 1, characterized in that: The insulating base plate (1) includes fixed plates (22) set at both ends of the annular track (2); the bottom of the annular track (2) is spaced from the ground; the annular track (2) is through the middle; a rotating platform (24) is set at the middle of both ends of the annular track (2), and a rotating belt (9) is sleeved between the two rotating platforms (24); a guide rail (26) is fixed around the edge of the surface of the annular track (2), and multiple rollers (33) at the bottom of the insulating substrate (31) are correspondingly locked on the guide rail (26); the rotating belt (9) is detachably connected to the insulating substrate (31), and the driving device drives the rotating belt (9) to drive the insulating substrate (31) to move around the guide rail (26), thereby driving the transformer to move around through several detection areas.

3. The automatic transformer testing line according to claim 1, characterized in that: The mounting holes (411) on the probe base (4) are arranged at intervals.

4. The automatic transformer testing line according to claim 3, characterized in that: The conveyor belt (21) includes a transport track (211), a defective track (212), and a qualified track (213); the transport track (211), the defective track (212), and the qualified track (213) are located between opposite fixed plates (22) and are arranged in parallel; the upper and lower cylinders (32) can use parallel fingers (34) to grip the transformer on the transport track (211), and after testing, the transformer can be driven into the corresponding defective track (212) and qualified track (213) by parallel fingers (34).

5. The testing method for an automatic transformer test line according to claims 1-4, characterized in that, The test method is as follows: First, the transport track (211) transports the transformer to be tested. When the transformer is transported to the bottom cylinder (32) directly below, the bottom cylinder (32) drives the parallel finger (34) to move downward to the edge of the transformer. Then, the parallel finger (34) clamps the transformer relatively close to it. At this time, the pin of the transformer is embedded in the corresponding groove (342), and the pin of the transformer contacts the metal plate (343). In the second step, after clamping the transformer, the upper and lower cylinders (32) drive the transformer to move upward. At the same time, the upper and lower cylinders (32) drive the round head of the probe (41) at the top to be inserted into the connecting groove (421), and the probe (41) contacts the metal strip (422). Third, the rotating belt (9) drives the transformer to rotate around through the insulating substrate (31). The transformer passes through multiple detection zones through the probe (41) to perform multi-performance testing. Then, the next upper and lower cylinder (32) drives the parallel finger (34) to clamp the transformer on the transport track (211) and repeat the above steps. After the test is completed, the parallel finger (34) puts the qualified product into the qualified track (213) and the unqualified product into the unqualified track (212).

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