High-precision measuring device and method for bending deformation of beam in mechanical equipment

Abstract

The application relates to a high-precision measuring device and method for the bending deformation of a beam in a mechanical device, which comprises a probe needle, a motion conversion device, a rotatable mirror, a laser generator, a laser receiver and a signal processor; the probe needle is arranged on the beam and is used for displacement with the deformation of the beam; the motion conversion device is connected with the probe needle and the mirror respectively and is used for converting the displacement of the probe needle into the rotation of the mirror; the laser generator is arranged correspondingly with the mirror and is used for emitting incident laser to the mirror; the mirror is used for receiving the incident laser and forming reflected laser, so that the deflection distance of the reflected laser before and after the rotation of the mirror is formed on the laser receiver; and the signal processor is connected with the laser receiver and is used for obtaining the bending deformation value of the beam according to the deflection distance on the laser receiver. The application has low requirements for the structure of the measured beam, is convenient to install, does not affect the actual deformation of the beam, has high measuring accuracy and is more robust in the used measuring mode.

Description

Technical Field

[0001] This invention relates to the field of mechanical equipment measurement technology, specifically to a high-precision measuring device and method for measuring the bending deformation of beams in mechanical equipment. Background Technology

[0002] In mechanical equipment, many components such as gears and shafts in transmission devices, arm structures in robots, and lifting arms and counterweight arms in lifting devices can be classified as beams. They are generally classified into several types, such as simply supported beams and cantilever beams, and will deform under the action of external forces.

[0003] To determine the magnitude of beam deformation, strain gauge measurement is currently the most common method. This involves attaching pre-cut strain gauges to the desired locations, connecting and adjusting the wiring, and then analyzing and converting the electrical signals to calculate the required strain magnitude. However, strain gauge measurement methods have limitations in terms of space and signal line arrangement. Uneven surfaces and confined spaces may prevent the proper attachment of strain gauges.

[0004] Existing technology discloses a laser measurement method and system for bridge deflection in the field of civil engineering deformation measurement. The system includes: a laser emitting and receiving module and a laser reflection module installed on the bridge. The laser emitting and receiving module is used to emit and receive laser beams; the laser reflection module is used to reflect the laser beam emitted by the laser emitting module to the laser receiving module; and a calculation module, connected to the laser receiving module, is used to calculate the bridge deflection based on a preset first ratio value and the laser beam position offset measured by the laser receiving module. The first ratio value characterizes the proportional relationship between the laser beam position offset measured by the laser receiving module and the bridge deflection; the deflection is the vertical linear displacement at the center of the mid-span section of the bridge when the bridge undergoes bending deformation. This method achieves high-precision bridge deflection measurement by installing the laser emitting and receiving module, the laser reflection module, and the calculation module on the bridge. It is easy to install and has low cost.

[0005] It has the following technical problems:

[0006] The arrangement of the reflector and laser source on the beam places high demands on the structure of the beam being measured, requiring a certain amount of space to accommodate the measurement device; the bottom width of the reflector can cause errors in the correlation between the measured beam deformation and the position of the measurement point; since the bottom of the reflector is tightly connected to the beam, its width will affect the actual deformation of the beam.

[0007] It is only applicable to the measurement of beams in the field of civil engineering. Since the size of beams in mechanical equipment is much smaller than that of beams in civil engineering, the amount of deformation measured is even smaller. Therefore, this existing technology cannot be applied to the deformation detection of beams in mechanical equipment. Summary of the Invention

[0008] To address the problems existing in the prior art, one of the objectives of this invention is to provide a high-precision measuring device for the bending deformation of beams in mechanical equipment, which has low structural requirements for the beam being measured, is easy to install, does not affect the actual deformation of the beam, and has high measurement accuracy.

[0009] The second objective of this invention is to provide a high-precision method for measuring the bending deformation of beams in mechanical equipment.

[0010] To achieve the above objectives, the present invention adopts the following technical solution:

[0011] A high-precision measuring device for the bending deformation of beams in mechanical equipment includes a probe, a motion conversion device, a rotatable reflector, a laser generator, a laser receiver, and a signal processor.

[0012] The probe is mounted on the beam to move as the beam deforms;

[0013] The motion conversion device is connected to the probe and the reflector respectively, and is used to convert the displacement of the probe into the rotation of the reflector;

[0014] The laser generator is arranged correspondingly to the reflector to emit incident laser light to the reflector;

[0015] The reflector is used to generate reflected laser light so that the reflected laser light before and after the reflector is rotated will be deflected at the laser receiver by a certain distance.

[0016] The signal processor is connected to the laser receiver and is used to obtain the bending deformation value of the beam based on the deflection distance on the laser receiver.

[0017] Furthermore, a beam splitter is provided on one side of the laser generator. The beam splitter is used to split the incident laser emitted by the laser generator into a transmitted beam and a reflected beam. The reflected beam is used to be emitted to the beam splitter to form a reflected laser.

[0018] Multiple beam splitters, probes, and reflectors are provided, and each corresponds to one another. The multiple beam splitters and multiple reflectors are arranged at intervals along the emission direction of the laser generator. In two adjacent beam splitters, the beam splitter behind receives the transmitted beam from the beam splitter in front as the incident laser.

[0019] Furthermore, the motion conversion device includes a pulley system and a thin wire. The thin wire is attached to the pulley system, with one end connected to the probe tip and the other end connected to the reflector.

[0020] Furthermore, the pulley system includes at least one movable pulley.

[0021] Furthermore, a steering pulley for adjusting the direction of the fine filament is fixed on one side of the reflector.

[0022] Furthermore, a fixed bracket is fixedly provided on one side of the reflector, and a detection connecting rod is provided between the fixed bracket and the detection needle. The filament slides and overlaps with the fixed bracket, and the detection needle is connected to the filament through the detection connecting rod.

[0023] Furthermore, a mandrel is fixed below the reflector, and a spool is sleeved on the mandrel. The lower end of the reflector is fixed to the spool, and the other end of the filament is connected to the spool.

[0024] A high-precision measurement method for the bending deformation of beams in mechanical equipment, employing a high-precision measurement device for the bending deformation of beams in mechanical equipment, includes the following steps.

[0025] The probe is placed on the beam so that it moves as the beam deforms.

[0026] The displacement of the probe tip is converted into the rotation of the reflector using a motion conversion device;

[0027] A laser generator is used to emit incident laser light toward a reflector;

[0028] The incident laser is reflected to the laser receiver by a mirror, and the reflected laser before and after the mirror rotates forms a deflection distance on the laser receiver.

[0029] The bending deformation value of the beam is obtained by using a signal processor based on the deflection distance on the laser receiver.

[0030] In summary, the present invention has the following advantages:

[0031] When the beam deforms, the probes mounted on the beam shift along with the deformation. A motion conversion device converts the probe displacement into the rotation of a reflector. A laser generator emits an incident laser beam into the reflector, which is reflected to form a reflected laser beam. The reflected laser beam before and after rotation creates a deflection distance on the laser receiver. The signal processor calculates the beam's bending deformation value based on this deflection distance. This invention utilizes probes to detect beam deformation. Compared to strain gauges, probes are smaller, less affected by space constraints, and easier to place on the beam. The laser generator, laser receiver, and reflector are all located outside the beam, unrestricted by space limitations on the beam, resulting in lower structural requirements for the beam. The reflector's bottom is not connected to the beam, and its width does not affect the actual beam deformation or cause errors in the correspondence between the measured beam deformation and the measurement point position. This results in high measurement accuracy and applicability to measuring the deformation of even smaller beams. Attached Figure Description

[0032] Figure 1 This is a schematic diagram of the structure of the high-precision measuring device for beam bending deformation in the mechanical equipment of the present invention.

[0033] Figure 2for Figure 1 A schematic diagram of direction A.

[0034] Figure 3 This is a schematic diagram of the probe assembly of the present invention.

[0035] Figure 4 This is a schematic diagram of the deformable display component of the present invention.

[0036] Figure 5 for Figure 4 A schematic diagram of direction B.

[0037] Figure 6 This is a structural schematic diagram of the fixed support assembly of the present invention.

[0038] Figure 7 This is a schematic diagram of the structure of the light source and display component of the present invention.

[0039] Figure 8 This is a schematic diagram illustrating the principle of reflected light measurement.

[0040] Figure 9 This is a structural schematic diagram of a beam.

[0041] In the picture:

[0042] 1-Beam;

[0043] 2-Detector assembly, 21-Detector tip, 22-Detector connecting rod, 23-Fine wire A section, 24-Spring, 25-Spring retaining block;

[0044] 3-Deformation display assembly, 31-Fixed pulley A, 32-Moving pulley fixing plate, 33-Moving pulley, 34-Fine wire section B, 35-Reflector, 36-Switch, 37-Mandrel, 38-Steering pulley;

[0045] 4-Fixed bracket assembly, 41-Fixed rod A, 42-Fixed pulley B, 43-Detector rod fixing rod, 44-Fixed rod B, 45-Fixed pulley C, 46-Fixed rod C, 47-Fixed pulley fixing plate;

[0046] 5-Light source and display components, 51-Laser generator, 52-Laser beam, 53-Beam splitter, 54-Laser receiver, 55-Signal line, 56-Signal processor;

[0047] 61 - Incident laser A, 62 - Reflected laser A, 63 - Reflected laser B. Detailed Implementation

[0048] The present invention will now be described in further detail.

[0049] like Figures 1-3 , Figure 5 , Figure 7As shown, a high-precision measuring device for the bending deformation of beam 1 in a mechanical device includes a probe 21, a motion conversion device, a rotatable reflector 35, a laser generator 51, a laser receiver 54, and a signal processor 56.

[0050] The probe 21 is mounted on the beam 1 and is designed to move as the beam 1 deforms. A downward pressure is applied by the spring 24 to maintain contact with the beam 1.

[0051] The motion conversion device is connected to the probe 21 and the reflector 35 respectively, and is used to convert the displacement of the probe 21 into the rotation of the reflector 35.

[0052] The laser generator 51 is arranged correspondingly to the reflector 35 and is used to emit incident laser light to the reflector 35.

[0053] The reflector 35 is used to generate reflected laser light so that the reflected laser light before and after the reflector 35 rotates forms a deflection distance on the laser receiver 54.

[0054] The signal processor 56 is connected to the laser receiver 54 and is used to obtain the bending deformation value of the beam 1 based on the deflection distance on the laser receiver 54.

[0055] When beam 1 deforms, the probe 21 mounted on beam 1 is displaced by the spring 24 as beam 1 deforms. The motion conversion device converts the displacement of the probe 21 into the rotation of the reflector 35; the laser generator 51 emits incident laser light to the reflector 35 before and after rotation; the incident laser light is reflected by the reflector 35 to the laser receiver 54, forming a deflection distance on the laser receiver 54; the signal processor 56 calculates the bending deformation value of beam 1 based on the deflection distance on the laser receiver 54. This invention utilizes a probe 21 to detect the deformation displacement of beam 1. Compared to strain gauges, the probe 21 is smaller and less affected by space, making it easier to place on beam 1. The laser generator 51, laser receiver 54, and reflector 35 are all located outside beam 1, not limited by the space on beam 1, thus having low structural requirements for the beam 1 being measured. The bottom of the reflector 35 is not connected to beam 1, and its width does not affect the actual deformation of beam 1, nor does it cause errors in the correspondence between the measured deformation of beam 1 and the position of the measurement point, resulting in high measurement accuracy.

[0056] A high-precision method for measuring the bending deformation of beam 1 in a mechanical device includes the following steps:

[0057] The probe 21 is placed on the beam 1, and a downward pressure is applied by the spring 24 to keep it in contact with the beam 1, so that it is displaced as the beam 1 deforms.

[0058] The displacement of the probe tip 21 is converted into the rotation of the reflector 35 using a motion conversion device;

[0059] The laser generator 51 emits incident lasers to the reflector 35 before and after rotation, respectively.

[0060] The incident laser is reflected by the rotating reflector 35, so that the reflected laser is reflected to the laser receiver 54 and a deflection distance is formed on the laser receiver 54.

[0061] The bending deformation value of beam 1 is obtained by signal processor 56 based on the deflection distance on laser receiver 54.

[0062] Specifically, the high-precision measuring device for the bending deformation of beam 1 includes a probe assembly 2, a deformation display assembly 3, a fixed support assembly 4, and a light source and display assembly 5.

[0063] The main components of each part are as follows:

[0064] The probe assembly 2 includes a probe tip 21, a probe connecting rod 22, a thin filament segment A 23, a spring 24, and a spring fixing block 25. The probe tip 21 is pointed, the probe connecting rod 22 is an irregularly shaped rod, and the thin filament segment A 23 is a thin strip of wire with a high elastic modulus. The probe tip 21, probe connecting rod 22, and thin filament segment A 23 are connected sequentially, and the spring fixing block 25 is fixedly sleeved on the probe connecting rod 22. The lower end of the spring 24 abuts against the spring fixing block 25, and the upper end is fixed to the probe rod fixing rod 43. The probe connecting rod 22 passes through the spring 24 and connects to the thin filament segment A 23. The elastic force of the spring 24 keeps the probe tip 21 upright on the beam 1.

[0065] like Figure 4 As shown, the deformable display assembly 3 includes a fixed pulley A31, a movable pulley fixing plate 32, a movable pulley 33, a thin wire segment B 34, a reflector 35, a drum 36, a spindle 37, and a guide pulley 38. Multiple fixed pulleys A31 are fixed to the fixed bracket assembly 4. Multiple sets of movable pulleys 33 are connected to the movable pulley fixing plate 32. The number of pulley sets can be increased as needed to obtain a greater magnification. The thin wire segment B 34 is connected to the thin wire segment A 23 and fixed to the drum 36 via the guide pulley 38. The reflector 35 is connected to the drum 36 and to the spindle 37. The assembly consisting of the reflector 35 and the drum 36 can rotate axially around the spindle 37.

[0066] like Figure 6As shown, the fixed support assembly 4 includes a fixed rod A41, a fixed pulley B42, a probe rod fixing rod 43, a fixed rod B44, a fixed pulley C45, a fixed rod C46, ​​and a fixed pulley fixing plate 47. Multiple sets of fixed pulleys B42 are connected to the fixed rod A41 and fixed to the probe rod fixing rod 43. The probe rod fixing rod 43 is sequentially connected to the fixed rods B44 and C46. A fixed pulley C45 is fixed to the fixed rod B44, and a fixed pulley fixing plate 47 is fixed to the fixed rod C46.

[0067] The light source and display component 5 includes a laser generator 51, a laser beam 52, a beam splitter 53, a laser receiver 54, a signal line 55, and a signal processor 56. The laser generator 51 emits a laser beam 52, which is separated by the beam splitter 53 to obtain multiple sets of laser beams 52. After the multiple sets of laser beams 52 illuminate the reflector 35, they are received by the laser receiver 54. The laser receiver 54 is connected to the signal line 55, and the received signals are processed by the signal processor 56.

[0068] Specific implementation process:

[0069] When detecting the deformation or strain of beam 1, the position of the fixing bracket assembly 4 is adjusted according to the installation position of beam 1 on site to ensure that the probe tip 21 in the probe assembly 2 is in contact with the measured position of beam 1. Furthermore, by adjusting the position of the pulleys, the laser beam 52 emitted by the laser generator 51 in the light source and display assembly 5 is ensured to illuminate the reflector 35. After adjusting the above positions, the initial position data of beam 1 before deformation can be recorded.

[0070] When beam 1 deforms, the probe tip 21 in probe assembly 2 will move downward under the action of spring 24. Since the probe connecting rod 22 is the probe rod fixing rod 43 mounted on the fixed bracket assembly 4, it can only move vertically. The displacement of probe tip 21 will pull the thin wire A segment 23 to move through the probe connecting rod 22. The thin wire A segment 23 passes through the fixed pulley B42 fixed on the fixed rod A41 on the fixed bracket assembly 4, and the fixed pulley C45 on the fixed rod B44, and then passes through the movable pulley 33 fixed on the movable pulley fixing plate 32 in the deformation display assembly 3 before connecting with the thin wire B segment 34. The thin wire B passes through the fixed pulley C45 fixed on the fixed pulley fixing plate 47, and then passes through the fixed pulley A31 and the deflecting pulley 38 for reversal before connecting to the drum 36. When the thin wire B segment 34 moves, it can pull the reflector 35 fixed on the drum 36 to rotate around the spindle 37. The displacement of the probe 21 is amplified by the intermediate pulley system and then converted into the rotation of the reflector 35.

[0071] Before beam 1 deforms, laser generator 51 emits a single laser beam. The single laser beam is split into multiple laser beams 52 by beam splitter 53. The incident laser A61 in the laser beam 52 is incident on reflector 35 and forms reflected laser A62. The reflected laser A62 is incident on laser receiver 54 in light source and display assembly 5, and its position is transmitted to signal processor 56 through signal line 55 for recording and processing.

[0072] like Figure 8 As shown, after beam 1 deforms, the reflector 35 rotates by a certain angle. Therefore, the incident laser A61 in the laser beam 52, after hitting the reflector 35, forms the reflected laser B63, which in turn forms a position signal on the laser receiver 54. In triangle FHG, given the lengths of FG and GH, and ∠FGH, ∠GFH can be calculated using the law of cosines. This allows us to determine the rotation angle β of the reflector 35. Based on the dimensions of the drum 36, the movement length of the filament segment 34 (B) can be calculated. Using the pulley system's magnification, we can obtain the true deformation of beam 1 at the measurement position. Adjusting the distance between the laser receiver 54 and the reflector 35 allows us to obtain a sufficiently long change in distance GH before and after deformation, thus achieving a greater displacement magnification and obtaining more accurate measurement results.

[0073] After completing the deformation measurement at the current location, move the probe 21 to perform the next deformation measurement.

[0074] The present invention has the following advantages:

[0075] (1) Measurement method of multiple laser beams 52

[0076] Existing technologies using strain gauge electrical signal measurement require grinding and attaching strain gauges at each measurement location, which is cumbersome and the number of measurement points is limited by the number of channels in the signal acquisition device. This invention uses a single laser light source for beam splitting, obtaining multiple laser beams 52, enabling simultaneous measurement of more locations. There is no limit to the number of deformation locations measured in a single measurement. It eliminates the need for arranging and connecting multiple signal lines 55, and avoids grinding the measurement surface, preventing sudden phenomena such as strain gauge detachment due to equipment vibration. By moving the probe 21, deformation parameters at different locations can be obtained without reattaching strain gauges, resulting in fast detection speed and short detection time. The detection relies primarily on the light source, is less affected by the external environment, and can also be applied in motion scenarios.

[0077] (2) Needle-shaped probe design

[0078] Existing technologies use strain gauges with specific dimensions, which limit their application in continuous bonding positions. This limitation restricts the spatial arrangement and signal line layout, making it difficult to bond strain gauges due to uneven surfaces or confined spaces, inevitably resulting in gaps between measurement points. In contrast, this invention uses a tiny probe 21, which is less affected by the detection location and structure, allowing for a denser arrangement of measurement points and more continuous results. Furthermore, if the beam 1 has an uneven, irregular surface, strain gauges cannot be bonded there, but the probe 21 of this invention is not subject to this limitation, thus allowing for a wider measurement range.

[0079] (3) Method for calculating the deformation of a 35° deflection mirror

[0080] This invention uses a measurement method that converts minute deformations into the deflection distance of laser reflection lines. Compared with the measurement principle of strain gauge resistance change, it is less affected by external environmental factors such as temperature, humidity, and magnetic fields, and the measurement method used is more robust.

[0081] (4) Methods for amplifying deformation

[0082] In existing measurement techniques, the deformation of beam 1 needs to be sufficiently large to obtain objective measurement results. Small deformations of beam 1 are insufficient to cause a change in the position of reflector 35, thus failing to yield accurate measurement results. This invention utilizes a two-stage amplification process—using a set of 33 movable pulleys and the deflection of reflector 35—to magnify the minute deformation of beam 1 before measurement. The magnification factor can be adjusted as needed, enabling the capture of minute deformation amounts and making it suitable for measuring even finer deformations. The deformation calculated in this invention is a comparison of the relative distance before and after deformation, and the operation is simpler. Because the detection principle uses relative error, the accuracy of the detection is less dependent on the operator, resulting in more objective and accurate measurement results.

[0083] (5) Method for converting the deformation of beam 1

[0084] Unlike existing technologies that convert physical quantities into electrical signals for measurement, this invention uses a pulley system to convert minute physical deformations into the movement distance of a thin rope, enabling direct measurement of physical quantities and avoiding conversions between different forms of change and the various errors introduced therein.

[0085] The above embodiments are preferred embodiments of the present invention, but the embodiments of the present invention are not limited to the above embodiments. Any changes, modifications, substitutions, combinations, or simplifications made without departing from the spirit and principle of the present invention shall be considered equivalent substitutions and shall be included within the protection scope of the present invention.

Claims

1. A high-precision measuring device for the bending deformation of beams in mechanical equipment, characterized in that: It includes a probe, a motion conversion device, a rotatable reflector, a laser generator, a laser receiver, and a signal processor; The probe is mounted on the beam to move as the beam deforms; The motion conversion device is connected to the probe and the reflector respectively, and is used to convert the displacement of the probe into the rotation of the reflector; The laser generator is arranged correspondingly to the reflector to emit incident laser light into the reflector; The reflector is used to receive the incident laser and form the reflected laser, so that the reflected laser before and after the reflector rotates forms a deflection distance on the laser receiver; The signal processor is connected to the laser receiver and is used to obtain the bending deformation value of the beam based on the deflection distance on the laser receiver; A beam splitter is provided on one side of the laser generator. The beam splitter is used to split the incident laser emitted by the laser generator into a transmitted beam and a reflected beam. The reflected beam is used to be emitted to the beam splitter to form a reflected laser. Multiple beam splitters, probes, and reflectors are provided and correspond one-to-one. Multiple beam splitters and multiple reflectors are arranged at intervals along the emission direction of the laser generator. In two adjacent beam splitters, the beam splitter behind receives the transmitted beam from the beam splitter in front as the incident laser. The motion conversion device includes a pulley system and a thin wire. The thin wire is attached to the pulley system, with one end connected to the probe tip and the other end connected to the reflector. The laser generator, laser receiver, and reflector are all located outside the beam.

2. The high-precision measuring device for the bending deformation of beams in mechanical equipment according to claim 1, characterized in that: A pulley system includes at least one movable pulley.

3. The high-precision measuring device for the bending deformation of beams in mechanical equipment according to claim 1, characterized in that: A steering pulley for adjusting the direction of the fine filament is fixed on one side of the reflector.

4. The high-precision measuring device for the bending deformation of beams in mechanical equipment according to claim 1, characterized in that: A fixed bracket is fixed on one side of the reflector, and a detection connecting rod is provided between the fixed bracket and the detection needle. The filament slides and overlaps the fixed bracket, and the detection needle is connected to the filament through the detection connecting rod.

5. A high-precision measuring device for the bending deformation of beams in mechanical equipment according to claim 1, characterized in that: A mandrel is fixed below the reflector, and a spool is sleeved on the mandrel. The lower end of the reflector is fixed to the spool, and the other end of the fine wire is connected to the spool.

6. A high-precision method for measuring the bending deformation of beams in mechanical equipment, characterized in that: The high-precision measuring device for the bending deformation of beams in mechanical equipment according to any one of claims 1-5 includes the following steps: The probe is placed on the beam so that it moves as the beam deforms. The displacement of the probe tip is converted into the rotation of the reflector using a motion conversion device; A laser generator is used to emit incident laser light toward a reflector; The incident laser is reflected to the laser receiver by a mirror, and the reflected laser before and after the mirror rotates forms a deflection distance on the laser receiver. The bending deformation value of the beam is obtained by using a signal processor based on the deflection distance on the laser receiver.

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