Transport and fixation device for scanning electron microscope samples of radioactive coating materials

Abstract

This invention belongs to the field of post-irradiation detection and microscopic characterization technology of nuclear fuel and materials, specifically relating to a transport and fixation device for scanning electron microscope (SEM) samples of radioactive coating materials. The invention includes an upper cover, a base, and a fixing clamp. The upper cover and the base are connected by threads, and the fixing clamp is installed between the upper cover and the base. The fixing clamp is used to hold and fix the SEM sample of the radioactive coating material. This invention has a simple structure and is easy to install. It can clamp the coating sample both horizontally and vertically, effectively reducing the radiation dose received by experimental operators during sample loading, transport, and testing, while simultaneously reducing radiation damage to the electron microscope equipment during analysis and testing.

Description

Technical Field

[0001] This invention belongs to the field of post-irradiation detection and microscopic characterization technology of nuclear fuel and materials, specifically relating to a transfer and fixation device for scanning electron microscope samples of radioactive coating materials. Background Technology

[0002] Researchers worldwide have accelerated the research and design of Accident Tolerant Fuels (ATFs) and materials to mitigate and improve the poor performance of commercial zirconium alloys under Loss-of-Coolness Accidents (LOCA), Reactive Introduction Accidents (RIA), and Beyond Design Basis Accidents (BDBA). Preparing protective coatings on existing zirconium alloy surfaces is a crucial branch of ATF research. Over the past decade, researchers have screened various coating samples that performed well in off-core tests and conducted in-core trials under actual operating conditions. For these coating samples, the focus is on their failure behavior under high-temperature oxidation, high-temperature corrosion, and neutron irradiation conditions. Therefore, observing and analyzing changes in the microstructure and chemical composition of the coating surface and interfaces before and after neutron irradiation is a crucial criterion for revealing failure behavior.

[0003] Because neutron-irradiated coated samples exhibit strong induced radioactivity, samples used for scanning electron microscopy (SEM) observation are generally small in size. This makes pasting, fixing, and mounting the samples more difficult and time-consuming, leading to increased radiation doses for the experimental operators. Simultaneously, the radiation emitted by the samples during analysis and testing can also cause irradiation damage to the electron microscope equipment.

[0004] In order to improve and solve the above problems, there is an urgent need to provide a transfer and fixation device for scanning electron microscope samples of radioactive coating materials. Summary of the Invention

[0005] The technical problem solved by this invention is to provide a transfer and fixation device for scanning electron microscope samples of radioactive coating materials, which can effectively reduce the difficulty of sample loading and transfer and reduce the radiation dose to experimental operators and the wear and tear on the instrument.

[0006] The technical solution adopted in this invention is as follows:

[0007] Compared with the prior art, the beneficial effects of the present invention are as follows:

[0008] (1) The present invention provides a transfer and fixation device for scanning electron microscope samples of radioactive coating materials. It has a simple structure and is easy to install. It can clamp the coating samples in the horizontal and vertical directions, effectively reduce the radiation dose to the experimental operators during sample loading, transfer and testing, and at the same time reduce the radiation damage to the electron microscope equipment during the analysis and testing process.

[0009] (2) The present invention provides a transfer and fixation device for scanning electron microscope samples of radioactive coating materials. The device consists of an upper cover that is assembled and cooperates with each other, a fixing clamp for holding and fixing the coating sample, and a base. It can complete the horizontal and vertical clamping of the coating sample and effectively reduce the difficulty of sample loading and transfer and reduce the radiation dose to experimental operators and the wear and tear on the instrument. Attached Figure Description

[0010] Figure 1 This is a diagram showing the disassembled effect of the present invention.

[0011] Figure 2 This is a structural diagram of the top cover of the present invention.

[0012] Figure 3 This is a structural diagram of the base of the present invention.

[0013] Figure 4 This is a structural diagram of the solid clamp of the present invention.

[0014] Figure 5 This is a side view of the present invention.

[0015] Figure 6 yes Figure 5 Schematic diagram of the AA section structure.

[0016] Figure 7 This is a top view of the solid clamp of the present invention.

[0017] Figure 8 yes Figure 7 Schematic diagram of the cross-sectional structure of the middle BB.

[0018] In the diagram: 1. Top cover; 2. Base; 3. Fixture; 11. Cross boss; 12. Pin hole; 13. Internal thread groove; 21. Vertical groove; 22. Fixture mounting groove; 31. Fixture seat; 32. Movable clamp; 33. Semi-threaded control lever; 311. Threaded through hole; 312. Sample mounting boss; 321. Mounting hole; 322. Positioning pin; 323. Movable clamp protrusion; 331. Pin positioning groove; 332. Pin piece; 333. Clamping pin. Detailed Implementation

[0019] The technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, and not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0020] In the description of this invention, it should be noted that the terms "center," "upper," "lower," "left," "right," "vertical," "horizontal," "inner," and "outer," etc., indicate the orientation or positional relationship based on the orientation or positional relationship shown in the accompanying drawings. They are used only for the convenience of describing the invention and for simplifying the description, and do not indicate or imply that the device or element referred to must have a specific orientation, or be constructed and operated in a specific orientation. Therefore, they should not be construed as limitations on the invention. Furthermore, the terms "first," "second," and "third" are used for descriptive purposes only and should not be construed as indicating or implying relative importance.

[0021] In the description of this invention, it should be noted that, unless otherwise explicitly specified and limited, the terms "installation," "connection," and "linking" should be interpreted broadly. For example, they can refer to a fixed connection, a detachable connection, or an integral connection; they can refer to a mechanical connection or an electrical connection; they can refer to a direct connection or an indirect connection through an intermediate medium; and they can refer to the internal connection of two components. Those skilled in the art can understand the specific meaning of the above terms in this invention based on the specific circumstances.

[0022] like Figures 1 to 8 As shown, the present invention provides a transfer and fixation device for scanning electron microscope (SEM) samples of radioactive coating materials, comprising an upper cover 1, a base 2, and a fixing clamp 3. The upper cover 1 and the base 2 are connected by threads, and the fixing clamp 3 is installed between the upper cover 1 and the base 2. The fixing clamp 3 is used to clamp and fix the SEM sample of the radioactive coating material.

[0023] The lower part of the top cover 1 is a hollow cylindrical structure with an internal threaded groove 13 on the inner wall of the bottom and a cross boss 11 on the top. The side wall of the cross boss 11 has a pin hole 12.

[0024] The base 2 is a cylinder with a square fixing clamp mounting groove 22 at the center of the upper part. The outer surface of the top cylinder is provided with an external thread and a vertical groove 21 is provided on one side. The external thread and the internal thread groove 13 are engaged.

[0025] The fixed clamp 3 includes a clamp base 31, a movable clamping platform 32, and a semi-threaded control lever 33. The clamp base 31 has a U-shaped structure, and the size of its base plate matches the size of the fixed clamp mounting groove 22. The clamp base 31 is placed inside the fixed clamp mounting groove 22. A threaded through hole 311 is opened on one side of the vertical plate of the clamp base 31, and a sample loading boss 312 is provided on the inner wall of the other side of the vertical plate. The movable clamping platform 32 is placed inside the clamp base 31. A groove is provided in the middle of the movable clamping platform 32, and a clamping platform protrusion 323 is provided at the upper end of the movable clamping platform 32. The groove, the clamping platform protrusion 323 and the sample loading boss 312 are engaged. The lower end of the movable clamping platform 32 is a hollow structure. An installation hole 321 is opened on the upper surface of the hollow structure. A positioning pin 322 is provided in the installation hole 321. A threaded hole is opened on the side wall of the hollow structure. The threaded hole and the threaded through hole 311 have the same size and are arranged horizontally.

[0026] The semi-threaded control lever 33 has a pin positioning groove 331 on one side and a pin 332 and a locking pin 333 on the other side for connection and easy tightening; the semi-threaded control lever 33 has a thread on the rod near the pin positioning groove 331, and the thread engages with the threaded through hole 311.

[0027] First, place the movable clamp 32 inside the fixture base 31. Then, insert the semi-threaded control rod 33 into the threaded through hole 311. Insert the positioning pin 322 from the mounting hole 321 and lock it in the pin positioning groove 331. Place the coating sample on the sample mounting boss 312. The coating sample can be installed horizontally and vertically to observe the surface and cross-section of the sample. Rotate the semi-threaded control rod 33 to move the movable clamp 32 forward and clamp the coating sample.

[0028] After the fixing clamp 3 is placed into the fixing clamp mounting slot 22, the semi-threaded control rod 33 falls into the side-opening vertical slot of the base 2;

[0029] The aforementioned clamping fixture 3 is suitable for holding the coating sample in both the horizontal and vertical directions. Specifically, scanning electron microscopy observation of the coating sample is divided into two methods: observing the surface and observing the cross-section. This is used to observe the morphology at different locations. Holding the sample horizontally is for observing its surface, while holding it vertically is for observing its cross-section. The sample mounting boss 312 is the position for placing the coating sample.

[0030] The device is made of tungsten alloy material.

[0031] In this embodiment, the various components of the device are independent of each other and are assembled and connected in a simple manner. Different fixtures can be selected for different samples and different observation surfaces (sample surface and cross-section). The irradiated coated sample, which has been transferred to the hot chamber or radioactive shielded glove box, is placed in the fixture 3 using a robotic arm and tweezers. The semi-threaded control lever 33 is rotated to clamp the sample on the movable clamp 32. After tightening the top cover 1, the sample is transferred to the scanning electron microscope laboratory via a special transport container. The device is placed on the electron microscope sample mounting stage, the top cover 1 is quickly unscrewed, the scanning electron microscope sample mounting chamber is closed, and the experiment is conducted.

[0032] It will be apparent to those skilled in the art that the present invention is not limited to the details of the exemplary embodiments described above, and that the invention can be implemented in other specific forms without departing from its spirit or essential characteristics. Therefore, the embodiments should be considered in all respects as exemplary and non-limiting, and the scope of the invention is defined by the appended claims rather than the foregoing description. Thus, all variations falling within the meaning and scope of equivalents of the claims are intended to be included within the present invention. No reference numerals in the claims should be construed as limiting the scope of the claims.

[0033] Furthermore, it should be understood that although this specification describes embodiments, not every embodiment contains only one independent technical solution. This narrative style is merely for clarity. Those skilled in the art should consider the specification as a whole, and the technical solutions in each embodiment can also be appropriately combined to form other embodiments that can be understood by those skilled in the art.

Claims

1. A transfer fixture for scanning electron microscopy samples of radioactive coating materials, characterized in that, The utility model provides a fixing clamp for radioactivity coating material scanning electron microscope sample, which comprises an upper cover (1), a base (2) and a fixing clamp (3), the upper cover (1) and the base (2) are connected through threads, and the fixing clamp (3) is installed between the upper cover (1) and the base (2). The lower part of the upper cover (1) is a hollow cylindrical structure, and the inner wall of the bottom is provided with an internal thread groove (13). The top of the upper cover (1) is provided with a cross-shaped boss (11), and the sidewall of the cross-shaped boss (11) is provided with a pin hole (12). The base (2) is a cylinder, a square fixing clamp mounting groove (22) is formed in the central position of the upper part, the outer surface of the top cylinder is provided with external threads, and one side is provided with a vertical groove (21); the external threads are matched with the internal thread groove (13). The fixing clamp (3) comprises a clamp seat (31), a movable clamp table (32) and a half-thread control rod (33), the clamp seat (31) is a U-shaped structure, the size of the bottom plate of the clamp seat (31) is matched with the size of the fixing clamp mounting groove (22), and the clamp seat (31) is placed in the fixing clamp mounting groove (22); a threaded hole (311) is formed in the vertical plate on one side of the clamp seat (31), and a sample mounting boss (312) is arranged on the inner wall of the vertical plate on the other side; the movable clamp table (32) is placed in the clamp seat (31), the half-thread control rod (33) is inserted into the threaded hole (311), the movable clamp table (32) is pushed to clamp the sample, and the sample is placed on the sample mounting boss (312).

2. The transfer fixture for scanning electron microscopy samples coated with radioactive materials according to claim 1, wherein, The middle part of the movable clamp table (32) is provided with a groove, the upper end of the movable clamp table (32) is a clamp table protrusion (323), and the groove, the clamp table protrusion (323) and the sample mounting boss (312) are matched.

3. The transfer fixture for scanning electron microscopy samples coated with radioactive materials according to claim 2, wherein, The lower end of the movable clamp table (32) is a hollow structure, the upper end face of the hollow structure is provided with a mounting hole (321), the mounting hole (321) is provided with a positioning pin (322), the sidewall of the hollow structure is provided with a threaded hole, the threaded hole is consistent with the size of the threaded hole (311) and is arranged horizontally.

4. The transfer fixture for scanning electron microscopy samples coated with radioactive materials according to claim 3, wherein, One side of the half-thread control rod (33) is provided with a pin positioning clamping groove (331), and the other side is provided with a pin piece (332) and a clamping needle (333) for connection and convenient tightening; the rod close to the pin positioning clamping groove (331) of the half-thread control rod (33) is provided with a thread, and the thread is matched with the threaded hole (311).

5. The transfer fixture for scanning electron microscopy samples coated with radioactive materials according to claim 4, wherein, The half-thread control rod (33) is inserted into the threaded hole (311), the positioning pin (322) is loaded into the pin positioning clamping groove (331) from the mounting hole (321), the half-thread control rod (33) is rotated, and the movable clamp table (32) moves forward to clamp the coating sample.

6. The transfer fixture for scanning electron microscopy samples coated with radioactive materials according to claim 5, wherein, After the fixing clamp (3) is placed in the fixing clamp mounting groove (22), the half-thread control rod (33) falls into the side opening vertical groove of the base (2).

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