Rotational speed sensor failure prediction method, apparatus, device, and medium

Abstract

The application provides a rotating speed sensor fault prediction method, device, equipment and medium. The method comprises the following steps: acquiring a static voltage and a dynamic voltage of a rotating speed sensor, and confirming whether the static voltage of the rotating speed sensor is within a preset static voltage range; if the static voltage of the rotating speed sensor is within the preset static voltage range, confirming whether the dynamic voltage of the rotating speed sensor is abnormal; if the dynamic voltage of the rotating speed sensor is abnormal, confirming whether the rotating speed sensor is faulty according to an abnormal state of the dynamic voltage; and if the abnormal state indicates that the rotating speed sensor is faulty, confirming a fault type of the rotating speed sensor through the abnormal state. The method of the application can accurately predict the fault of the rotating speed sensor and find the fault problem in time.

Description

Technical Field

[0001] This application relates to the field of vehicle technology, and in particular to a method, apparatus, device, and medium for predicting speed sensor failures. Background Technology

[0002] In a vehicle system, an AMT (Automated Mechanical Transmission) gearbox needs to obtain the speed of the input and output shafts in real time through a speed sensor in order to determine the next gear based on the speed of the input and output shafts. If the speed sensor malfunctions, it will definitely affect the operation of the AMT gearbox, resulting in a poor driving experience.

[0003] Existing technologies typically confirm the accuracy of the rotational speed by monitoring whether the input shaft's rotational speed meets preset requirements, thereby determining whether the speed sensor is malfunctioning. If the speed sensor is confirmed to be malfunctioning, it indicates that the speed sensor has failed. However, this approach still suffers from inaccurate fault diagnosis of the speed sensor.

[0004] Therefore, this application proposes a more accurate method for predicting speed sensor faults. Summary of the Invention

[0005] This application provides a method, apparatus, device, and medium for predicting speed sensor faults, in order to solve the problem that the speed sensor fault prediction is not accurate enough in the prior art.

[0006] Firstly, this application provides a method for predicting speed sensor failures, including:

[0007] Acquire the static voltage and dynamic voltage of the speed sensor, and confirm whether the static voltage of the speed sensor is within the preset static voltage range;

[0008] If the static voltage of the speed sensor is within the preset static voltage range, then confirm whether the dynamic voltage of the speed sensor is abnormal;

[0009] If the dynamic voltage of the speed sensor is abnormal, then the speed sensor is confirmed to be faulty based on the abnormal state of the dynamic voltage.

[0010] If the abnormal status indicates that the speed sensor has malfunctioned, the type of malfunction of the speed sensor is confirmed by the abnormal status.

[0011] In one possible implementation, confirming whether the speed sensor is faulty based on the abnormal state of the dynamic voltage includes:

[0012] If, within a preset test period, the abnormal duration of the dynamic voltage is higher than the first time threshold and lower than the second time threshold, or if the dynamic voltage is abnormal at a certain rotational speed, then the abnormal state is confirmed to be a short-term abnormality.

[0013] If the abnormal duration of the dynamic voltage is higher than the third time threshold within the preset test period, the abnormal state is confirmed to be a long-term abnormality, wherein the third time threshold is greater than or equal to the second time threshold.

[0014] If the abnormal state is either a short-term abnormality or a long-term abnormality, then the abnormal state indicates that the speed sensor has malfunctioned.

[0015] In one possible implementation, the step of confirming whether the speed sensor is faulty based on the abnormal state of the dynamic voltage further includes:

[0016] If the duration of the abnormal dynamic voltage is less than the fourth time threshold within a preset period, the abnormal state is confirmed as an instantaneous abnormality, wherein the fourth time threshold is less than or equal to the first time threshold.

[0017] If the abnormal state is a momentary abnormality, then it is confirmed that the abnormal state indicates that the speed sensor is not faulty.

[0018] In one possible implementation, confirming the fault type of the speed sensor through the abnormal state includes:

[0019] If the abnormal state is the short-term abnormality, then the fault type of the speed sensor is confirmed to be the first fault type, wherein the first fault type includes the speed sensor experiencing interference fault.

[0020] If the abnormal state is the long-term abnormality, then the fault type of the speed sensor is confirmed to be the second fault type, wherein the second fault type includes the speed sensor experiencing loose installation, magnetic degradation, or expiration of its lifespan.

[0021] If the static voltage of the speed sensor is not within the preset static voltage range, the method further includes:

[0022] The fault type of the speed sensor was confirmed to be the third fault type, which includes short circuit, open circuit, and damage to internal components of the speed sensor.

[0023] In one possible implementation, before confirming whether the static voltage of the speed sensor is within a preset static voltage range, the method further includes:

[0024] A static voltage test is performed on a standard component of the same type as the speed sensor to obtain the preset static voltage range, and a dynamic voltage test is performed to obtain the preset dynamic voltage range. The preset static voltage range is the voltage range obtained by the standard component when the speed of the device under test is 0, and the preset dynamic voltage range is the voltage range obtained by the standard component when the speed of the device under test is not 0. The preset dynamic voltage range includes a peak range and a trough range.

[0025] In one possible implementation, confirming whether the dynamic voltage of the speed sensor is abnormal includes:

[0026] If the peak range of the dynamic voltage exceeds the peak range of the preset dynamic voltage range, and / or the trough range of the dynamic voltage exceeds the trough range of the preset dynamic voltage range, then it is confirmed that the dynamic voltage of the speed sensor is abnormal.

[0027] In one possible implementation, prior to acquiring the static and dynamic voltages of the speed sensor, the method further includes:

[0028] The reference voltage of the AD converter is determined based on the highest output voltage of the speed sensor, wherein the input terminal of the AD converter is connected to the output terminal of the speed sensor.

[0029] Secondly, this application provides a speed sensor fault prediction device, comprising:

[0030] The acquisition module is used to acquire the static voltage and dynamic voltage of the speed sensor, and to confirm whether the static voltage of the speed sensor is within a preset static voltage range;

[0031] The first processing module is used to confirm whether the dynamic voltage of the speed sensor is abnormal if the static voltage of the speed sensor is within the preset static voltage range.

[0032] The second processing module is used to determine whether the speed sensor is faulty based on the abnormal state of the dynamic voltage if the dynamic voltage of the speed sensor is abnormal.

[0033] The confirmation module is used to confirm the fault type of the speed sensor by means of the abnormal state if the abnormal state indicates that the speed sensor has failed.

[0034] Thirdly, this application provides a speed sensor fault prediction device, comprising: at least one processor and a memory;

[0035] The memory stores computer-executed instructions;

[0036] The at least one processor executes computer execution instructions stored in the memory, causing the at least one processor to perform the speed sensor fault prediction method as described above.

[0037] Fourthly, this application provides a computer-readable storage medium having a computer program stored thereon, which, when executed by a processor, implements the steps of the speed sensor fault prediction method as described above.

[0038] This application provides a method, apparatus, device, and medium for predicting speed sensor faults. The method acquires the static voltage and dynamic voltage of a speed sensor and confirms whether the static voltage of the speed sensor is within a preset static voltage range. If the static voltage of the speed sensor is within the preset static voltage range, it confirms whether the dynamic voltage of the speed sensor is abnormal. If the dynamic voltage of the speed sensor is abnormal, it confirms whether the speed sensor has malfunctioned based on the abnormal state of the dynamic voltage. If the abnormal state indicates that the speed sensor has malfunctioned, it confirms the fault type of the speed sensor through the abnormal state.

[0039] In the above method, if it is confirmed that the static voltage of the speed sensor is within the preset static voltage range, then the static voltage of the speed sensor is normal. Then it can be further confirmed whether the dynamic voltage of the speed sensor is normal. If the dynamic voltage of the speed sensor is abnormal, then the abnormal state of the dynamic voltage can reflect whether the speed sensor is faulty and the corresponding fault type. In this way, it can be accurately determined whether the speed sensor is faulty and the corresponding fault type, so as to solve the problem for different fault types in the future. Attached Figure Description

[0040] To more clearly illustrate the technical solutions in the embodiments of the present invention or the prior art, the drawings used in the description of the embodiments or the prior art will be briefly introduced below. Obviously, the drawings described below are some embodiments of the present invention. For those skilled in the art, other drawings can be obtained based on these drawings without creative effort.

[0041] Figure 1 A schematic diagram illustrating a scenario for predicting a speed sensor fault, provided in an embodiment of this application;

[0042] Figure 2 A flowchart illustrating a speed sensor fault prediction method provided in this application embodiment. Figure 1 ;

[0043] Figure 3 A flowchart illustrating a speed sensor fault prediction method provided in this application embodiment. Figure 2 ;

[0044] Figure 4 A flowchart illustrating a speed sensor fault prediction method provided in this application embodiment. Figure 3 ;

[0045] Figure 5 A diagram of a speed sensor fault prediction device provided in an embodiment of the present invention;

[0046] Figure 6 This is a hardware schematic diagram of a speed sensor fault prediction device provided in an embodiment of the present invention. Detailed Implementation

[0047] To make the objectives, technical solutions, and advantages of the embodiments of the present invention clearer, the technical solutions of the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings. Obviously, the described embodiments are only some embodiments of the present invention, not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those skilled in the art without creative effort are within the scope of protection of the present invention.

[0048] AMT transmissions rely on speed sensors to measure the current input and output shaft speeds in real time and use these speeds as a reference to determine the next gear shift. Therefore, the proper functioning of the speed sensor is crucial. When the speed sensor malfunctions, at best, the speed signal accuracy decreases, affecting AMT shifting performance and resulting in a poor driving experience; at worst, it may fail to measure the speed or produce abnormal output speed values, leading to an inability to shift gears and the vehicle becoming stuck and unable to continue driving.

[0049] Existing technologies typically monitor whether the input shaft speed meets preset requirements to confirm whether the speed is accurate, thereby confirming whether the speed sensor is malfunctioning. If the speed sensor is confirmed to be malfunctioning, it indicates that the speed sensor has failed. However, this method cannot accurately confirm the speed sensor malfunction, nor can it accurately determine the cause of the speed sensor malfunction, resulting in the problem not being resolved in a timely manner.

[0050] Therefore, this application proposes a more accurate method for predicting speed sensor faults and estimates the specific type of fault, so as to remind users to repair or replace the speed sensor in a timely manner, avoid the fault from escalating and causing driving hazards.

[0051] The implementation process of the speed sensor fault prediction method proposed in this application is described below with reference to the accompanying drawings and specific embodiments.

[0052] Figure 1 This is a schematic diagram illustrating a scenario for predicting a speed sensor fault, as provided in an embodiment of this application. Figure 1As shown, the system includes: a speed sensor 101 and a rotating wheel 102; wherein, the speed sensor 101 can be used to obtain the rotational speed of the rotating wheel 102;

[0053] The speed signal obtained by the speed sensor 101 can be output through its own output terminal. In order to detect whether the speed sensor 101 is faulty, the input terminal of the AD converter (analog-to-digital converter) can be connected to the output terminal of the speed sensor 101. The AD converter is used to sample the output signal of the speed sensor 101 in real time, including sampling the static voltage and dynamic voltage of the speed sensor.

[0054] The preset static voltage range is the static voltage range when the speed sensor is working normally. The sampled static voltage can be compared with the preset static voltage range. If the static voltage exceeds the preset static voltage range, it means that the static voltage is normal. Then, it is necessary to further check whether there is an abnormality in the dynamic voltage. If there is an abnormality in the dynamic voltage, it is necessary to confirm whether the speed sensor is faulty and what type of fault it is based on the abnormal state of the dynamic voltage, so that the user can solve the problem in a timely manner according to the fault type.

[0055] Figure 2 A flowchart illustrating a speed sensor fault prediction method provided in this application embodiment. Figure 1 .like Figure 2 As shown, the method includes:

[0056] S201. Obtain the static voltage and dynamic voltage of the speed sensor, and confirm whether the static voltage of the speed sensor is within the preset static voltage range.

[0057] The preset static voltage range is the static voltage range obtained based on the working output of the speed sensor under normal operating conditions.

[0058] For example, a static voltage test is performed on a standard component of the same type as the speed sensor to obtain the preset static voltage range, and a dynamic voltage test is performed to obtain the preset dynamic voltage range. The preset static voltage range is the voltage range obtained by the standard component when the speed of the device under test is 0, and the preset dynamic voltage range is the voltage range obtained by the standard component when the speed of the device under test is not 0. The preset dynamic voltage range includes a peak range and a trough range.

[0059] When obtaining the preset static voltage range, the speed sensor needs to operate under normal working conditions and must be a standard component of the same type (i.e., a confirmed fault-free, normal component). During the normal operation of the standard component, when testing its static voltage range, the device under test (DUT) needs to be kept at a rotational speed of 0. At this time, the standard component outputs a stable voltage signal, but this stable voltage signal has a certain range. The range of the stable voltage signal obtained by testing is taken as the static voltage range of the standard component, and this static voltage range of the standard component is taken as the preset static voltage range. The DUT can be a rotating wheel.

[0060] When testing the dynamic voltage range of a standard component, the device under test (DUT) needs to be rotated, and the rotation speed is gradually increased at certain intervals (the rotation speed of the DUT is not 0). At this time, the output signal of the standard component is a sinusoidal signal with different frequencies, with peaks and troughs. The peaks and troughs measured at each rotation speed also have certain ranges. Therefore, the peak range and trough range are used as the preset dynamic voltage range.

[0061] When predicting whether a speed sensor is faulty, the static and dynamic voltages of the speed sensor are first obtained. The obtained static and dynamic voltages of the speed sensor are sampled values.

[0062] For example, the reference voltage of the AD converter is determined based on the highest output voltage of the speed sensor, wherein the input terminal of the AD converter is connected to the output terminal of the speed sensor.

[0063] The input of the AD converter is connected to the output of the speed sensor and is responsible for sampling the output of the speed sensor, including the static voltage and dynamic voltage of the speed sensor. In order to ensure that the sampling is accurate enough, a reference voltage needs to be confirmed for the AD converter. This reference voltage must first be higher than the maximum output voltage of the speed sensor. Under the premise that the reference voltage is higher than the maximum output voltage of the speed sensor, a smaller reference voltage should be selected as much as possible. For example, the difference between the reference voltage and the maximum output voltage of the speed sensor can be obtained. If the difference is within the preset difference range, then the reference voltage is confirmed to be selected.

[0064] To save on hardware costs and size, the AD converter can use the AD converter interface that comes with the AMT gearbox, and a higher bit-count AD converter should be preferred.

[0065] To eliminate glitches in the sampled values, the sampling results of the AD converter can be filtered to obtain accurate static and dynamic voltages of the speed sensor. First, it should be confirmed whether the static voltage of the speed sensor is within the preset static voltage range.

[0066] Wherein, static voltage and dynamic voltage are different output sampling voltages, and the formula for the filtered output sampling voltage at time k is:

[0067] U out (k)=K·U in (k)+(1-K)·U out (k-1)

[0068] Among them, U out (k) represents the output sampling voltage at time k, K is the filter coefficient, and U in (k) represents the initial sampling voltage at time k, U out (k-1) represents the output sampling voltage at time k-1.

[0069] S202. If the static voltage of the speed sensor is within the preset static voltage range, then confirm whether the dynamic voltage of the speed sensor is abnormal.

[0070] If the static voltage of the speed sensor is within the preset static voltage range, then the static voltage is confirmed to be normal. Further confirmation is needed to check whether the dynamic voltage is abnormal. The way to check whether the dynamic voltage is abnormal is to check whether the dynamic voltage is within the preset dynamic voltage range. If it is, then the dynamic voltage of the speed sensor is confirmed to be abnormal.

[0071] Conversely, if the dynamic voltage is within the preset dynamic voltage range, then the dynamic voltage of the speed sensor is confirmed to be normal, and correspondingly, the speed sensor has not malfunctioned.

[0072] The specific method for obtaining the preset dynamic voltage range is described in the above process. Further confirmation of whether there are any abnormalities in the dynamic voltage based on the preset dynamic voltage range is as follows:

[0073] For example, if the peak range of the dynamic voltage exceeds the peak range of the preset dynamic voltage range, and / or the trough range of the dynamic voltage exceeds the trough range of the preset dynamic voltage range, then it is confirmed that the dynamic voltage of the speed sensor is abnormal.

[0074] Dynamic voltage includes peak voltage and trough voltage. If the peak voltage exceeds the peak range of the preset dynamic voltage range, and / or the trough voltage exceeds the trough range of the preset dynamic voltage range, then the dynamic voltage of the speed sensor is confirmed to be abnormal. That is, as long as either the peak voltage or the trough voltage in the dynamic voltage exceeds the preset dynamic voltage range, then the dynamic voltage is abnormal.

[0075] Conversely, if both the peak and trough voltages in the dynamic voltage are within the preset dynamic voltage range, then the dynamic voltage of the speed sensor is confirmed to be normal, and correspondingly, the speed sensor has not malfunctioned.

[0076] S203. If the dynamic voltage of the speed sensor is abnormal, then determine whether the speed sensor is faulty based on the abnormal state of the dynamic voltage.

[0077] If there is an abnormality in the dynamic voltage, there will be an abnormal manifestation, which is called an abnormal state. The abnormal state can indicate the specific manifestation of the abnormality in the speed sensor. For example, the abnormal manifestation is the duration of the abnormality. Based on the duration of the abnormality in the dynamic voltage, the abnormal state can be divided into different levels. The longer the duration of the abnormality, the higher the level of the abnormal state. If the abnormal state exceeds a certain level, it is confirmed that the speed sensor has failed. Therefore, the abnormal state can reflect whether the speed sensor is faulty.

[0078] S204. If the abnormal state indicates that the speed sensor has malfunctioned, the fault type of the speed sensor is confirmed through the abnormal state.

[0079] Abnormal conditions can be classified not only by their severity level, but also by their specific manifestations. For example, different levels of abnormal conditions correspond to different fault types. In the case of the highest abnormal condition level, the speed sensor is not only faulty but also irreparable, and replacement of the speed sensor is recommended.

[0080] In this embodiment of the application, if it is confirmed that the static voltage of the speed sensor is within the preset static voltage range, then the static voltage of the speed sensor is confirmed to be normal. Then it can be further confirmed whether the dynamic voltage of the speed sensor is normal. If the dynamic voltage of the speed sensor is abnormal, then the abnormal state of the dynamic voltage can reflect whether the speed sensor is faulty and the corresponding fault type. In this way, it can be accurately determined whether the speed sensor is faulty and the corresponding fault type can be accurately determined, so as to solve the problem for different fault types in the future.

[0081] Figure 3 A flowchart illustrating a speed sensor fault prediction method provided in this application embodiment. Figure 2 .like Figure 3 As shown, the method includes:

[0082] S301. If, within a preset test cycle, the abnormal duration of the dynamic voltage is higher than the first time threshold and lower than the second time threshold, or if the dynamic voltage is abnormal at a certain rotation speed, then the abnormal state is confirmed to be a short-term abnormality.

[0083] When sampling the static and dynamic voltages of the speed sensor, a preset test period is set in advance, and data tests are performed within this preset test period. This provides a time reference for confirming the duration of the anomaly later. If the duration of the dynamic voltage anomaly is higher than the first time threshold but lower than the second time threshold within the preset test period, meaning that the dynamic voltage returns to normal after a period of time, it is considered a short-term anomaly. Alternatively, if the dynamic voltage is abnormal at one or more speeds, then the dynamic voltage anomaly is also considered a short-term anomaly.

[0084] S302. If the abnormal duration of the dynamic voltage is higher than the third time threshold within the preset test period, the abnormal state is confirmed as a long-term abnormality, wherein the third time threshold is greater than or equal to the second time threshold.

[0085] Confirm the third time threshold and set the third time threshold to be greater than or equal to the second time threshold to confirm anomalies over a longer period. If the duration of the dynamic voltage anomaly is higher than the third time threshold within the preset test period, it indicates that the duration of the dynamic voltage anomaly is too long and its anomaly state is a long-term anomaly.

[0086] S303. If the abnormal state is the short-term abnormality or the long-term abnormality, then the abnormal state indicates that the speed sensor has malfunctioned.

[0087] Abnormal states, whether short-term or long-term, are characterized by an abnormality lasting for a relatively long time. Therefore, the corresponding abnormal state indicates that the speed sensor has malfunctioned, and is divided into short-term and long-term abnormal faults.

[0088] The duration of the abnormal state could be even shorter:

[0089] For example, if the abnormal duration of the dynamic voltage is less than the fourth time threshold within a preset period, the abnormal state is confirmed as an instantaneous abnormality, wherein the fourth time threshold is less than or equal to the first time threshold.

[0090] If the abnormal state is a momentary abnormality, then it is confirmed that the abnormal state indicates that the speed sensor is not faulty.

[0091] Confirm the fourth time threshold and set it to be less than or equal to the first time threshold to confirm anomalies of shorter durations. If the duration of the dynamic voltage anomaly is less than the fourth time threshold within the preset test cycle, the dynamic voltage anomaly is considered an instantaneous event that can be ignored, or the speed sensor can recover to normal dynamic voltage on its own. In this case, the abnormal state corresponding to the dynamic voltage is an instantaneous anomaly. Since the speed sensor can recover to normal or is negligible under instantaneous anomalies, the instantaneous anomaly does not need to be upgraded to a speed sensor failure, and it can be confirmed that the speed sensor is not faulty.

[0092] In this embodiment, the abnormality is classified according to the duration of the abnormality of the dynamic voltage. Situations above a certain level (such as instantaneous abnormality) are considered as faults, while situations not above that level, such as instantaneous abnormalities, are considered as no faults. This also includes confirming whether the speed sensor is abnormal at certain speeds. If so, the speed sensor is also confirmed to be faulty. Finally, the fault of the speed sensor is accurately confirmed.

[0093] Figure 4 A flowchart illustrating a speed sensor fault prediction method provided in this application embodiment. Figure 3 .like Figure 4 As shown, the method includes:

[0094] S401. If the abnormal state is the short-term abnormality, then the fault type of the speed sensor is confirmed to be the first fault type, wherein the first fault type includes the speed sensor experiencing interference fault.

[0095] If the abnormal status is short-lived, it may be due to interference with the speed sensor, and the corresponding fault type of the speed sensor is the first fault type. The speed sensor affected by interference can be repaired by checking the possible sources of interference so that the speed sensor can be restored to normal use and avoid adverse effects on subsequent use.

[0096] S402. If the abnormal state is the long-term abnormality, then the fault type of the speed sensor is confirmed to be the second fault type, wherein the second fault type includes the speed sensor experiencing loose installation, magnetic degradation, or expiration of its lifespan.

[0097] If the abnormal status is a prolonged abnormality, it may be caused by a more serious problem with the speed sensor. For example, the speed sensor may be experiencing one or more of the following: loose installation, magnetic degradation, or expiration of its lifespan. This can lead to a prolonged abnormality, and the corresponding fault type for the speed sensor is the second fault type. Speed ​​sensors confirmed to be in the second fault type can also be repaired. In this case, since some problems cannot be repaired (such as expiration of lifespan), the speed sensor can be replaced to ensure safe driving in the future.

[0098] S403. If the static voltage of the speed sensor is not within the preset static voltage range, then the fault type of the speed sensor is confirmed to be the third fault type, wherein the third fault type includes short circuit, open circuit, and damage to internal components of the speed sensor.

[0099] Besides the faults confirmed under normal static voltage and abnormal dynamic voltage, if the static voltage is confirmed to be out of range when checking whether the static voltage is within the preset static voltage range, then the speed sensor may be faulty due to one or more of the following: short circuit, open circuit, or damage to internal components. In this case, the fault type of the speed sensor is the third fault type. If the driver is still driving when the third fault type is detected, the driver should be prompted to stop immediately and have the speed sensor repaired to ensure subsequent driving safety.

[0100] In this embodiment, different fault types are identified through different abnormal states, so as to facilitate targeted problem identification for different fault types, ensure accurate understanding of fault information, solve fault problems, and improve driving safety.

[0101] Figure 5 A diagram of a speed sensor fault prediction device provided in an embodiment of the present invention is shown below. Figure 5 As shown, the device includes: an acquisition module 501, a first processing module 502, a second processing module 503, and a confirmation module 504;

[0102] The acquisition module 501 is used to acquire the static voltage and dynamic voltage of the speed sensor, and to confirm whether the static voltage of the speed sensor is within a preset static voltage range.

[0103] The first processing module 502 is used to confirm whether the dynamic voltage of the speed sensor is abnormal if the static voltage of the speed sensor is within the preset static voltage range.

[0104] The second processing module 503 is used to determine whether the speed sensor is faulty based on the abnormal state of the dynamic voltage if the dynamic voltage of the speed sensor is abnormal.

[0105] The second processing module 503 is further configured to confirm that the abnormal state is a short-term abnormality if, within a preset test cycle, the abnormal duration of the dynamic voltage is higher than a first time threshold and lower than a second time threshold, or if the dynamic voltage is abnormal at a certain rotation speed.

[0106] If the abnormal duration of the dynamic voltage is higher than the third time threshold within the preset test period, the abnormal state is confirmed to be a long-term abnormality, wherein the third time threshold is greater than or equal to the second time threshold.

[0107] If the abnormal state is either a short-term abnormality or a long-term abnormality, then the abnormal state indicates that the speed sensor has malfunctioned.

[0108] The second processing module 503 is further configured to confirm that the abnormal state is an instantaneous abnormality if the abnormal duration of the dynamic voltage is less than the fourth time threshold within a preset period, wherein the fourth time threshold is less than or equal to the first time threshold.

[0109] If the abnormal state is a momentary abnormality, then it is confirmed that the abnormal state indicates that the speed sensor is not faulty.

[0110] The confirmation module 504 is used to confirm the fault type of the speed sensor by means of the abnormal state if the abnormal state indicates that the speed sensor has failed.

[0111] The confirmation module 504 is further configured to confirm that the fault type of the speed sensor is a first fault type if the abnormal state is the short-term abnormality, wherein the first fault type includes the speed sensor experiencing an interference fault.

[0112] If the abnormal state is the long-term abnormality, then the fault type of the speed sensor is confirmed to be the second fault type, wherein the second fault type includes the speed sensor experiencing loose installation, magnetic degradation, or expiration of its lifespan.

[0113] If the static voltage of the speed sensor is not within the preset static voltage range, the method further includes:

[0114] The fault type of the speed sensor was confirmed to be the third fault type, which includes short circuit, open circuit, and damage to internal components of the speed sensor.

[0115] This application also provides a speed sensor fault prediction device, comprising: at least one processor and a memory;

[0116] The memory stores computer-executed instructions;

[0117] The at least one processor executes computer execution instructions stored in the memory, causing the at least one processor to execute the speed sensor fault prediction method.

[0118] Figure 6 This is a hardware schematic diagram of a speed sensor fault prediction device provided in an embodiment of the present invention. Figure 6 As shown, the speed sensor fault prediction device 60 provided in this embodiment includes at least one processor 601 and a memory 602. The device 60 also includes a communication component 603. The processor 601, memory 602, and communication component 603 are connected via a bus 604.

[0119] In the specific implementation process, at least one processor 601 executes the computer execution instructions stored in the memory 602, causing at least one processor 601 to execute the speed sensor fault prediction method as described above.

[0120] The specific implementation process of processor 601 can be found in the above method embodiments, and its implementation principle and technical effect are similar. It will not be repeated here.

[0121] In the above Figure 6 In the illustrated embodiments, it should be understood that the processor can be a Central Processing Unit (CPU), or other general-purpose processors, digital signal processors (DSPs), application-specific integrated circuits (ASICs), etc. The general-purpose processor can be a microprocessor or any conventional processor. The steps of the method disclosed in this invention can be directly implemented by a hardware processor, or implemented by a combination of hardware and software modules within the processor.

[0122] The memory may include random access memory (RAM) and may also include non-volatile memory (NVM), such as at least one disk storage device.

[0123] The bus can be an Industry Standard Architecture (ISA) bus, a Peripheral Component Interconnect (PCI) bus, or an Extended Industry Standard Architecture (EISA) bus, etc. Buses can be categorized as address buses, data buses, control buses, etc. For ease of illustration, the buses shown in the accompanying drawings are not limited to a single bus or a single type of bus.

[0124] This application also provides a computer-readable storage medium storing computer-executable instructions, which, when executed by a processor, implement the speed sensor fault prediction method as described above.

[0125] The aforementioned computer-readable storage medium can be implemented by any type of volatile or non-volatile storage device or a combination thereof, such as static random access memory (SRAM), electrically erasable programmable read-only memory (EEPROM), erasable programmable read-only memory (EPROM), programmable read-only memory (PROM), read-only memory (ROM), magnetic storage, flash memory, magnetic disk, or optical disk. The readable storage medium can be any available medium accessible to a general-purpose or special-purpose computer.

[0126] An exemplary readable storage medium is coupled to a processor, enabling the processor to read information from and write information to the readable storage medium. Of course, the readable storage medium can also be a component of the processor. The processor and the readable storage medium can reside in an Application Specific Integrated Circuit (ASIC). Alternatively, the processor and the readable storage medium can exist as discrete components in the device.

[0127] The division of units described herein is merely a logical functional division. In actual implementation, there may be other division methods. For example, multiple units or components may be combined or integrated into another system, or some features may be ignored or not executed. Furthermore, the coupling or direct coupling or communication connection shown or discussed may be indirect coupling or communication connection through some interfaces, devices, or units, and may be electrical, mechanical, or other forms.

[0128] The units described as separate components may or may not be physically separate. The components shown as units may or may not be physical units; that is, they may be located in one place or distributed across multiple network units. Some or all of the units can be selected to achieve the purpose of this embodiment according to actual needs.

[0129] Those skilled in the art will understand that all or part of the steps of the above-described method embodiments can be implemented by hardware related to program instructions. The aforementioned program can be stored in a computer-readable storage medium. When executed, the program performs the steps of the above-described method embodiments; and the aforementioned storage medium includes various media capable of storing program code, such as ROM, RAM, magnetic disks, or optical disks.

[0130] Finally, it should be noted that other embodiments of the invention will readily occur to those skilled in the art upon consideration of the specification and practice of the invention disclosed herein. This invention is intended to cover any variations, uses, or adaptations of the invention that follow the general principles of the invention and include common knowledge or customary techniques in the art not disclosed herein, and is not limited to the precise structures described above and shown in the accompanying drawings, and various modifications and changes can be made without departing from its scope. The scope of the invention is limited only by the appended claims.

Claims

1. A method for predicting faults in a speed sensor, characterized in that, include: Acquire the static voltage and dynamic voltage of the speed sensor, and confirm whether the static voltage of the speed sensor is within a preset static voltage range; the static voltage is the output voltage of the speed sensor when the speed of the device under test is 0, and the dynamic voltage is the output voltage of the speed sensor when the speed of the device under test is not 0. If the static voltage of the speed sensor is within the preset static voltage range, then confirm whether the dynamic voltage of the speed sensor is abnormal; If the dynamic voltage of the speed sensor is abnormal, the speed sensor is confirmed to be faulty based on the abnormal state of the dynamic voltage. The abnormal state includes short-term abnormality and long-term abnormality. The short-term abnormality is: within a preset test period, the duration of the abnormal dynamic voltage is higher than a first time threshold and lower than a second time threshold, or the dynamic voltage is abnormal at a certain speed. The long-term abnormality is: within a preset test period, the duration of the abnormal dynamic voltage is higher than a third time threshold. If the abnormal state indicates that the speed sensor has malfunctioned, the fault type of the speed sensor is confirmed through the abnormal state. The step of confirming whether the dynamic voltage of the speed sensor is abnormal includes: If the peak range of the dynamic voltage exceeds the peak range of the preset dynamic voltage range, and / or the trough range of the dynamic voltage exceeds the trough range of the preset dynamic voltage range, then it is confirmed that the dynamic voltage of the speed sensor is abnormal. The step of confirming the fault type of the speed sensor through the abnormal state includes: If the abnormal state is a short-term abnormality, then the fault type of the speed sensor is confirmed to be the first fault type; the first fault type includes the speed sensor experiencing interference fault; If the abnormal state is a prolonged abnormality, then the fault type of the speed sensor is confirmed to be the second fault type; the second fault type includes the speed sensor experiencing loose installation, magnetic degradation, or reaching the end of its lifespan. If the static voltage of the speed sensor is not within the preset static voltage range, the method further includes: confirming that the fault type of the speed sensor is a third fault type; the third fault type includes short circuit, open circuit, and damage to internal components of the speed sensor.

2. The method according to claim 1, characterized in that, The step of confirming whether the speed sensor is faulty based on the abnormal state of the dynamic voltage includes: If, within a preset test period, the abnormal duration of the dynamic voltage is higher than the first time threshold and lower than the second time threshold, or if the dynamic voltage is abnormal at a certain rotational speed, then the abnormal state is confirmed to be a short-term abnormality. If the abnormal duration of the dynamic voltage is higher than the third time threshold within the preset test period, the abnormal state is confirmed to be a long-term abnormality, wherein the third time threshold is greater than or equal to the second time threshold. If the abnormal state is either a short-term abnormality or a long-term abnormality, then the abnormal state indicates that the speed sensor has malfunctioned.

3. The method according to claim 2, characterized in that, The step of confirming whether the speed sensor is faulty based on the abnormal state of the dynamic voltage further includes: If the duration of the abnormal dynamic voltage is less than the fourth time threshold within a preset period, the abnormal state is confirmed as an instantaneous abnormality, wherein the fourth time threshold is less than or equal to the first time threshold. If the abnormal state is a momentary abnormality, then it is confirmed that the abnormal state indicates that the speed sensor is not faulty.

4. The method according to claim 1, characterized in that, Before confirming whether the static voltage of the speed sensor is within a preset static voltage range, the method further includes: A static voltage test is performed on a standard component of the same type as the speed sensor to obtain the preset static voltage range, and a dynamic voltage test is performed to obtain the preset dynamic voltage range. The preset static voltage range is the voltage range obtained by the standard component when the speed of the device under test is 0, and the preset dynamic voltage range is the voltage range obtained by the standard component when the speed of the device under test is not 0. The preset dynamic voltage range includes a peak range and a trough range.

5. The method according to claim 1, characterized in that, Before acquiring the static and dynamic voltages of the speed sensor, the method further includes: The reference voltage of the AD converter is determined based on the highest output voltage of the speed sensor, wherein the input terminal of the AD converter is connected to the output terminal of the speed sensor.

6. A speed sensor fault prediction device, characterized in that, include: The acquisition module is used to acquire the static voltage and dynamic voltage of the speed sensor, and to confirm whether the static voltage of the speed sensor is within a preset static voltage range; the static voltage is the output voltage of the speed sensor when the speed of the device under test is 0, and the dynamic voltage is the output voltage of the speed sensor when the speed of the device under test is not 0. The first processing module is used to confirm whether the dynamic voltage of the speed sensor is abnormal if the static voltage of the speed sensor is within the preset static voltage range. The second processing module is used to determine whether the speed sensor is faulty if the dynamic voltage of the speed sensor is abnormal, based on the abnormal state of the dynamic voltage. The abnormal state includes short-term abnormality and long-term abnormality. The short-term abnormality is defined as: within a preset test period, the duration of the abnormal dynamic voltage is higher than a first time threshold and lower than a second time threshold, or the dynamic voltage is abnormal at a certain speed. The long-term abnormality is defined as: within a preset test period, the duration of the abnormal dynamic voltage is higher than a third time threshold. The confirmation module is used to determine the fault type of the speed sensor based on the abnormal state if the abnormal state indicates that the speed sensor is faulty. When the first processing module confirms whether the dynamic voltage of the speed sensor is abnormal, it is specifically used to confirm that the dynamic voltage of the speed sensor is abnormal if the peak range of the dynamic voltage exceeds the peak range of the preset dynamic voltage range, and / or the trough range of the dynamic voltage exceeds the trough range of the preset dynamic voltage range. When the confirmation module confirms the fault type of the speed sensor through the abnormal state, it is specifically used to confirm the fault type of the speed sensor as a first fault type if the abnormal state is a short-term abnormality; the first fault type includes the speed sensor experiencing interference faults; if the abnormal state is a long-term abnormality, it is confirmed that the fault type of the speed sensor is a second fault type; the second fault type includes the speed sensor experiencing loose installation, magnetic degradation, or reaching the end of its lifespan. If the static voltage of the speed sensor is not within the preset static voltage range, the confirmation module is further used to confirm that the fault type of the speed sensor is a third fault type; the third fault type includes short circuit, open circuit, and damage to internal components of the speed sensor.

7. A speed sensor fault prediction device, characterized in that, include: At least one processor and memory; The memory stores computer-executed instructions; The at least one processor executes computer execution instructions stored in the memory, causing the at least one processor to perform the speed sensor fault prediction method as described in any one of claims 1-5.

8. A computer-readable storage medium having a computer program stored thereon, characterized in that, When the computer program is executed by the processor, it implements the steps of the speed sensor fault prediction method as described in any one of claims 1-5.

Images