Width measurement method and device

Abstract

The embodiments of the present specification provide a width measurement method and device, wherein the width measurement method comprises: sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information. By sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information, the measurement accuracy is improved.

Description

Technical Field

[0001] The embodiments of the present specification relate to the field of data measurement technology, and in particular to a width measurement method. Background Art

[0002] Existing coil width measurement is generally done manually with handheld measuring tools. Manual measurement is a huge workload during the production process. A small number of methods use industrial cameras to capture images and then use algorithms to identify the coil border to obtain pixel width and actual width, which is then converted through algorithms to obtain the actual width of the coil.

[0003] Manual measurement of coil width will cause a lot of work and reading errors. Continuous measurement cannot be performed during measurement. If the actual width of the coil deviates from the target width value, it cannot be discovered immediately. When adjusting the production equipment, the knob needs to be adjusted manually. In order to reduce the manual workload, some people now use the method of collecting images with cameras to identify the width, which can replace manual work. However, the pixels of industrial cameras are generally low, and the distance between the coil and the camera will also affect the size of the image. The material must be stationary when taking pictures, and the background of the picture must be flat and clean. The background color must be significantly different from the material color. In this way, the accuracy of the width value after algorithm processing is also relatively low, which is suitable for occasions with relatively low requirements. If you want to improve the measurement accuracy, you can only increase the camera's pixels and recognition algorithm, which will increase the cost of the camera.

[0004] Therefore, a better solution is urgently needed. Summary of the invention

[0005] In view of this, the embodiments of this specification provide a width measurement method. One or more embodiments of this specification also relate to a width measurement device, a computing device, a computer-readable storage medium and a computer program to solve the technical defects existing in the prior art.

[0006] According to a first aspect of an embodiment of this specification, a width measurement method is provided, including:

[0007] When the material to be measured is placed in the width gauge, a start command is sent to at least two infrared transmitting tubes;

[0008] When at least two infrared emitting tubes are started, obtaining at least two infrared intensities of the at least two infrared emitting tubes;

[0009] Determining edge information of the material to be measured based on at least two infrared intensities;

[0010] The width data of the material to be measured is determined based on the edge information.

[0011] In a possible implementation, obtaining at least two infrared intensities of at least two infrared emitting tubes includes:

[0012] Determining an acquisition order based on an arrangement order of at least two infrared emitting tubes;

[0013] At least two infrared intensities of at least two infrared emitting tubes are acquired based on an acquisition sequence.

[0014] In a possible implementation, determining edge information of a material to be measured based on at least two infrared intensities includes:

[0015] Comparing at least two infrared intensities with the target intensity in sequence to determine a first edge point and a second edge point;

[0016] The edge information of the material to be measured is determined based on the first edge point and the second edge point.

[0017] In a possible implementation, sequentially comparing at least two infrared intensities with the target intensity to determine a first edge point and a second edge point includes:

[0018] determining a first intensity value and a second intensity value based on the target intensity;

[0019] Select the value of the infrared intensity from the two infrared intensities in turn as the current intensity value;

[0020] When the first current intensity value is not the first intensity value or the second intensity value, determining a first edge point;

[0021] When the second current intensity value is not the first intensity value and the second intensity value, a second edge point is determined.

[0022] In a possible implementation, edge information of the material to be measured is determined based on the first edge point and the second edge point, including:

[0023] Determining a first edge width based on the first edge point and a width calculation rule;

[0024] determining a second edge width based on the second edge point and the width calculation rule;

[0025] Edge information of the material to be measured is determined based on the first edge width and the second edge width.

[0026] In a possible implementation, the at least two infrared emitting tubes include a first infrared emitting tube group and a second infrared emitting tube group;

[0027] The first infrared emitting tube group and the second infrared emitting tube group are arranged in parallel.

[0028] In a possible implementation, determining width data of a material to be measured based on edge information includes:

[0029] Determine first width data based on edge information corresponding to the first infrared emitting tube group;

[0030] Determine the second width data based on the edge information corresponding to the second infrared emitting tube group;

[0031] Width data of the material to be measured is determined based on the first width data and the second width data.

[0032] According to a second aspect of an embodiment of this specification, there is provided a width measuring device, comprising:

[0033] The instruction sending module is configured to send a start instruction to at least two infrared transmitting tubes when the width gauge is placed with the material to be measured;

[0034] The intensity acquisition module is configured to acquire at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started;

[0035] An edge recognition module, configured to determine edge information of the material to be measured based on at least two infrared intensities;

[0036] The width determination module is configured to determine width data of the material to be measured based on the edge information.

[0037] According to a third aspect of an embodiment of this specification, a computing device is provided, including:

[0038] Memory and processor;

[0039] The memory is used to store computer executable instructions, and the processor is used to execute the computer executable instructions. When the computer executable instructions are executed by the processor, the steps of the width measurement method are implemented.

[0040] According to a fourth aspect of the embodiments of this specification, a computer-readable storage medium is provided, which stores computer-executable instructions, and when the instructions are executed by a processor, the steps of the above-mentioned width measurement method are implemented.

[0041] According to a fifth aspect of the embodiments of this specification, a computer program is provided, wherein when the computer program is executed in a computer, the computer is caused to execute the steps of the above-mentioned width measurement method.

[0042] The embodiments of the present specification provide a width measurement method and device, wherein the width measurement method comprises: sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information. By sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information, the measurement accuracy is improved. BRIEF DESCRIPTION OF THE DRAWINGS

[0043] Figure 1 is a flow chart of a width measurement method provided by an embodiment of this specification;

[0044] Figure 2 is a schematic structural diagram of a width measuring device provided by an embodiment of this specification;

[0045] Figure 3 It is a structural block diagram of a computing device provided by an embodiment of this specification. DETAILED DESCRIPTION

[0046] Many specific details are described in the following description to facilitate a full understanding of this specification. However, this specification can be implemented in many other ways than those described herein, and those skilled in the art can make similar generalizations without violating the connotation of this specification, so this specification is not limited to the specific implementation disclosed below.

[0047] The terms used in one or more embodiments of this specification are only for the purpose of describing specific embodiments, and are not intended to limit one or more embodiments of this specification. The singular forms of "a" and "the" used in one or more embodiments of this specification and the appended claims are also intended to include plural forms, unless the context clearly indicates other meanings. It should also be understood that the term "and / or" used in one or more embodiments of this specification refers to and includes any or all possible combinations of one or more associated listed items.

[0048] It should be understood that although the terms first, second, etc. may be used to describe various information in one or more embodiments of this specification, this information should not be limited to these terms. These terms are only used to distinguish the same type of information from each other. For example, without departing from the scope of one or more embodiments of this specification, the first may also be referred to as the second, and similarly, the second may also be referred to as the first. Depending on the context, the word "if" as used herein may be interpreted as "at the time of" or "when" or "in response to determining".

[0049] In this specification, a width measurement method is provided. This specification also relates to a width measurement device, a computing device, and a computer-readable storage medium, which are described in detail one by one in the following embodiments.

[0050] See also Figure 1 , Figure 1 A flow chart of a width measurement method provided according to an embodiment of the present specification is shown, which specifically includes the following steps.

[0051] Step 101: When the material to be measured is placed in the width gauge, a start instruction is sent to at least two infrared emitting tubes.

[0052] In practical applications, the infrared sensor width meter uses the principle of infrared radiating tubes to detect objects. When there is no object between a pair of infrared radiating tubes, the receiving tube can receive the infrared rays emitted by the transmitting tube. When there is an object, the receiving tube cannot receive the infrared signal. When part of the object blocks it, the infrared rays received by the receiving tube will become weaker.

[0053] Based on the principle of a pair of sensors detecting the presence of an object, multiple sets of transmitting tubes and receiving tubes are used to measure the width of an object. The width gauge is designed as a C-shaped sensor structure. A row of neatly spaced infrared transmitting tubes are arranged at the top of the C-shaped structure to emit infrared rays vertically downward, and a row of neatly spaced infrared receiving tubes are arranged at the bottom of the C-shaped structure to receive infrared rays. The spacing is 3mm, and the coil is placed in the middle for width measurement.

[0054] Specifically, the material to be measured is placed on the width gauge, and the infrared emitting tube at the upper end is controlled by the MCU to emit infrared rays.

[0055] Step 102: When at least two infrared emitting tubes are activated, at least two infrared intensities of the at least two infrared emitting tubes are obtained.

[0056] In a possible implementation, obtaining at least two infrared intensities of at least two infrared emitting tubes includes: determining an acquisition order based on an arrangement order of the at least two infrared emitting tubes; and obtaining at least two infrared intensities of the at least two infrared emitting tubes based on the acquisition order.

[0057] Specifically, after starting the infrared transmitting tube, the ADC on the MCU is used to collect and read the infrared intensity value received by the corresponding receiving tube directly below the transmitting tube.

[0058] Step 103: Determine edge information of the material to be measured based on at least two infrared intensities.

[0059] In a possible implementation, edge information of a material to be measured is determined based on at least two infrared intensities, including: sequentially comparing at least two infrared intensities with a target intensity to determine a first edge point and a second edge point; and determining edge information of the material to be measured based on the first edge point and the second edge point.

[0060] Specifically, at least two infrared intensities are compared with the target intensity in sequence to determine the first edge point and the second edge point, including: determining the first intensity value and the second intensity value based on the target intensity; selecting the value of the infrared intensity from the two infrared intensities in sequence as the current intensity value; determining the first edge point when the current intensity value is not the first intensity value and the second intensity value for the first time; and determining the second edge point when the current intensity value is not the first intensity value and the second intensity value for the second time.

[0061] In actual application, the intensity value range of infrared intensity can be 0-1023; if the received infrared intensity is 1023, the maximum, there is no coil material between the infrared radiating tubes; if the received infrared intensity is 0, the minimum, there is coil material between the infrared radiating tubes; if the received infrared intensity value is between the maximum and minimum values, the infrared radiating tubes are at the edge of the material; the method of sending infrared rays from the first group of infrared radiating tubes on the left and collecting the infrared intensity on the receiving tube is executed to the right to the last group. Through this method, the MCU can collect a numerical sequence of infrared intensity from left to right. In this sequence, a sudden change value from large to small can be found from left to right, and this position is the left edge of the coil; a sudden change value from small to large can be found from left to right, and this position is the right edge of the coil.

[0062] In one possible implementation, edge information of the material to be measured is determined based on the first edge point and the second edge point, including: determining a first edge width based on the first edge point and a width calculation rule; determining a second edge width based on the second edge point and the width calculation rule; and determining the edge information of the material to be measured based on the first edge width and the second edge width.

[0063] In practical applications, the above method can be used to determine the positions of the left and right edges of the material, find the mutation point from large to small, and the ADC value (value1) can be converted into the width of the material between the pair of sensors, width W1=3*(1023-value1) / 1024; find the mutation point from small to large, and the ADC value (value2) can be converted into the width of the material between the pair of sensors, width W2=3*(1023-value2) / 1024; the ADC values ​​between these two values ​​are the minimum value 0, and the width completely blocked by the material W3=3*the number of ADC values ​​of 0; the total width of the material W=W1+W2+W3.

[0064] Step 104: Determine width data of the material to be measured based on the edge information.

[0065] In a possible implementation, the at least two infrared emitting tubes include a first infrared emitting tube group and a second infrared emitting tube group; the first infrared emitting tube group and the second infrared emitting tube group are arranged in parallel.

[0066] Specifically, the total width of the material can be obtained by the above method, with a minimum resolution of 0.003mm. In order to improve the repeatability of the measurement, a sliding weighted filtering algorithm can be added to the software implementation, that is, the acquired data is first subjected to a sliding weighted filtering algorithm. A row of infrared radiating tubes can also be added to the hardware to be cross-arranged, and two width values ​​can be obtained after each acquisition.

[0067] In a possible implementation, determining width data of a material to be measured based on edge information includes: determining first width data based on edge information corresponding to a first infrared emitting tube group; determining second width data based on edge information corresponding to a second infrared emitting tube group; and determining width data of the material to be measured based on the first width data and the second width data.

[0068] Specifically, after each acquisition, two width values ​​are obtained, and then the average value of the width values ​​is calculated, which can improve the accuracy of the width measurement.

[0069] In actual application, the width data can be displayed on the screen, and at the same time, the data can be sent to the PLC through the communication line to control the actuator to adjust the width.

[0070] The embodiments of the present specification provide a width measurement method and device, wherein the width measurement method comprises: sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information. By sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information, the measurement accuracy is improved.

[0071] Furthermore, the embodiments of this specification solve the cumbersome steps and manual workload of manually measuring the width of the coil, and solve the error of manual reading. The operator can read the width value directly through the screen. The environmental requirements for industrial camera width measurement are effectively reduced, and the cost of industrial cameras is reduced. The measurement results can be updated in real time, and a warning can be issued immediately when there is a deviation between the actual width and the target width. The width can be adjusted in real time by communicating with the PLC control actuator.

[0072] Corresponding to the above method embodiment, this specification also provides a width measurement device embodiment, Figure 2 FIG. 2 shows a schematic diagram of a width measuring device provided by an embodiment of the present specification. Figure 2 As shown, the device comprises:

[0073] The instruction sending module 201 is configured to send a start instruction to at least two infrared transmitting tubes when the width gauge is placed with the material to be measured;

[0074] The intensity acquisition module 202 is configured to acquire at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started;

[0075] An edge recognition module 203 is configured to determine edge information of the material to be measured based on at least two infrared intensities;

[0076] The width determination module 204 is configured to determine width data of the material to be measured based on the edge information.

[0077] In a possible implementation, the intensity acquisition module 202 is further configured to:

[0078] Determining an acquisition order based on an arrangement order of at least two infrared emitting tubes;

[0079] At least two infrared intensities of at least two infrared emitting tubes are acquired based on an acquisition sequence.

[0080] In a possible implementation, the edge identification module 203 is further configured to:

[0081] Comparing at least two infrared intensities with the target intensity in sequence to determine a first edge point and a second edge point;

[0082] The edge information of the material to be measured is determined based on the first edge point and the second edge point.

[0083] In a possible implementation, the edge identification module 203 is further configured to:

[0084] determining a first intensity value and a second intensity value based on the target intensity;

[0085] Select the value of the infrared intensity from the two infrared intensities in turn as the current intensity value;

[0086] When the first current intensity value is not the first intensity value or the second intensity value, determining a first edge point;

[0087] When the second current intensity value is not the first intensity value and the second intensity value, a second edge point is determined.

[0088] In a possible implementation, the edge identification module 203 is further configured to:

[0089] Determining a first edge width based on the first edge point and a width calculation rule;

[0090] determining a second edge width based on the second edge point and the width calculation rule;

[0091] Edge information of the material to be measured is determined based on the first edge width and the second edge width.

[0092] In a possible implementation, the instruction sending module 201 is further configured to:

[0093] The first infrared emitting tube group and the second infrared emitting tube group are arranged in parallel.

[0094] In a possible implementation, the width determination module 204 is further configured to:

[0095] Determine first width data based on edge information corresponding to the first infrared emitting tube group;

[0096] Determine the second width data based on the edge information corresponding to the second infrared emitting tube group;

[0097] Width data of the material to be measured is determined based on the first width data and the second width data.

[0098] The embodiments of the present specification provide a width measurement method and device, wherein the width measurement device comprises: sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information. By sending a start instruction to at least two infrared emitting tubes when the material to be measured is placed in the width gauge; obtaining at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; determining edge information of the material to be measured based on the at least two infrared intensities; and determining width data of the material to be measured based on the edge information, the measurement accuracy is improved.

[0099] The above is a schematic scheme of a width measuring device of this embodiment. It should be noted that the technical scheme of the width measuring device and the technical scheme of the width measuring method described above are of the same concept, and the details not described in detail in the technical scheme of the width measuring device can be referred to the description of the technical scheme of the width measuring method described above.

[0100] Figure 3 The block diagram of a computing device 300 according to an embodiment of the present specification is shown. The components of the computing device 300 include but are not limited to a memory 310 and a processor 320. The processor 320 is connected to the memory 310 via a bus 330, and the database 350 is used to store data.

[0101] The computing device 300 also includes an access device 340 that enables the computing device 300 to communicate via one or more networks 360. Examples of these networks include a public switched telephone network (PSTN), a local area network (LAN), a wide area network (WAN), a personal area network (PAN), or a combination of communication networks such as the Internet. The access device 340 may include one or more of any type of network interface (e.g., a network interface card (NIC)) of wired or wireless, such as an IEEE 802.11 wireless local area network (WLAN) wireless interface, a world-wide interoperability for microwave access (Wi-MAX) interface, an Ethernet interface, a universal serial bus (USB) interface, a cellular network interface, a Bluetooth interface, and a near field communication (NFC).

[0102] In one embodiment of the present specification, the above components of the computing device 300 and Figure 3 Other components not shown in the figure may also be connected to each other, for example, via a bus. It should be understood that Figure 3 The computing device structure block diagram shown is only for the purpose of illustration, and is not intended to limit the scope of this specification. Those skilled in the art can add or replace other components as needed.

[0103] The computing device 300 may be any type of stationary or mobile computing device, including a mobile computer or mobile computing device (e.g., a tablet computer, a personal digital assistant, a laptop computer, a notebook computer, a netbook, etc.), a mobile phone (e.g., a smart phone), a wearable computing device (e.g., a smart watch, smart glasses, etc.), or other types of mobile devices, or a stationary computing device such as a desktop computer or a personal computer (PC). The computing device 300 may also be a mobile or stationary server.

[0104] The processor 320 is used to execute the following computer executable instructions, which implement the steps of the width measurement method when executed by the processor. The above is a schematic scheme of a computing device of this embodiment. It should be noted that the technical solution of the computing device and the technical solution of the width measurement method described above belong to the same concept, and the details of the technical solution of the computing device that are not described in detail can be found in the description of the technical solution of the width measurement method described above.

[0105] An embodiment of the present specification further provides a computer-readable storage medium storing computer-executable instructions, which can implement the steps of the above-mentioned width measurement method when executed by a processor.

[0106] The above is a schematic scheme of a computer-readable storage medium of this embodiment. It should be noted that the technical scheme of the storage medium and the technical scheme of the width measurement method described above are of the same concept, and the details not described in detail in the technical scheme of the storage medium can be referred to the description of the technical scheme of the width measurement method described above.

[0107] An embodiment of the present specification further provides a computer program, wherein when the computer program is executed in a computer, the computer is caused to execute the steps of the above-mentioned width measurement method.

[0108] The above is a schematic scheme of a computer program of this embodiment. It should be noted that the technical scheme of the computer program and the technical scheme of the width measurement method described above are of the same concept, and the details not described in detail in the technical scheme of the computer program can be found in the description of the technical scheme of the width measurement method described above.

[0109] The above is a description of a specific embodiment of the specification. Other embodiments are within the scope of the appended claims. In some cases, the actions or steps recorded in the claims can be performed in an order different from that in the embodiments and still achieve the desired results. In addition, the processes depicted in the drawings do not necessarily require the specific order or continuous order shown to achieve the desired results. In some embodiments, multitasking and parallel processing are also possible or may be advantageous.

[0110] The computer instructions include computer program codes, which may be in source code form, object code form, executable files or some intermediate forms, etc. The computer-readable medium may include: any entity or device capable of carrying the computer program code, recording medium, USB flash drive, mobile hard disk, magnetic disk, optical disk, computer memory, read-only memory (ROM), random access memory (RAM), electric carrier signal, telecommunication signal and software distribution medium, etc. It should be noted that the content contained in the computer-readable medium may be appropriately increased or decreased according to the requirements of legislation and patent practice in the jurisdiction. For example, in some jurisdictions, according to legislation and patent practice, computer-readable media do not include electric carrier signals and telecommunication signals.

[0111] It should be noted that, for the above-mentioned method embodiments, for the sake of simplicity of description, they are all expressed as a series of action combinations, but those skilled in the art should be aware that the embodiments of this specification are not limited by the order of the actions described, because according to the embodiments of this specification, some steps can be performed in other orders or simultaneously. Secondly, those skilled in the art should also be aware that the embodiments described in the specification are all preferred embodiments, and the actions and modules involved are not necessarily required by the embodiments of this specification.

[0112] In the above embodiments, the description of each embodiment has its own emphasis. For parts that are not described in detail in a certain embodiment, reference can be made to the relevant descriptions of other embodiments.

[0113] The preferred embodiments of this specification disclosed above are only used to help explain this specification. The optional embodiments do not describe all the details in detail, nor do they limit the invention to only the specific implementation methods described. Obviously, many modifications and changes can be made according to the content of the embodiments of this specification. This specification selects and specifically describes these embodiments in order to better explain the principles and practical applications of the embodiments of this specification, so that technicians in the relevant technical field can well understand and use this specification. This specification is only limited by the claims and their full scope and equivalents.

Claims

1. A width measurement method, characterized in that: include: When the material to be measured is placed in the width gauge, a start command is sent to at least two infrared emitting tubes; wherein the width gauge is a C-shaped structure, and infrared emitting tubes are arranged at the upper and lower parts of the C-shaped structure, and the spacing between the infrared emitting tubes is 3 mm; When the at least two infrared emitting tubes are started, obtaining at least two infrared intensities of the at least two infrared emitting tubes; Determining edge information of the material to be measured based on the at least two infrared intensities; Determine width data of the material to be measured based on the edge information; The step of determining edge information of the material to be measured based on the at least two infrared intensities comprises: Comparing the at least two infrared intensities with the target intensity in sequence to determine a first edge point and a second edge point; Determine edge information of the material to be measured based on the first edge point and the second edge point; The step of sequentially comparing the at least two infrared intensities with the target intensity to determine the first edge point and the second edge point includes: determining a first intensity value and a second intensity value based on the target intensity; Selecting the value of the infrared intensity from the two infrared intensities in turn as the current intensity value; When the current intensity value is not the first intensity value or the second intensity value for the first time, determining a first edge point; When the current intensity value is not equal to the first intensity value and the second intensity value for the second time, determining a second edge point; The edge information of the material to be measured is determined based on the first edge point and the second edge point, including: determining a first edge width based on the first edge point and a width calculation rule; determining a second edge width based on the second edge point and the width calculation rule; determining edge information of the material to be measured based on the first edge width and the second edge width; Wherein, the first edge width is W1= 3*(1023-value1) / 1024; the value1 is the ADC value of the first edge point; The second edge width W2 = 3*(1023-value2) / 1024; the value2 is the ADC value of the second edge point; The determining edge information of the material to be measured based on the first edge width and the second edge width includes: W=W1+W2+W3; wherein W is the width data, and W3 is 3 multiplied by the number of ADC values ​​of 0 between the first edge point and the second edge point.

2. The width measurement method according to claim 1, characterized in that: The obtaining of at least two infrared intensities of the at least two infrared emitting tubes includes: Determining an acquisition order based on an arrangement order of the at least two infrared emitting tubes; At least two infrared intensities of the at least two infrared emitting tubes are acquired based on the acquisition sequence.

3. The width measurement method according to claim 1, characterized in that: The at least two infrared emitting tubes include a first infrared emitting tube group and a second infrared emitting tube group; The first infrared emitting tube group and the second infrared emitting tube group are arranged in parallel.

4. A width measuring device, characterized in that: The steps for implementing the width measurement method according to any one of claims 1 to 3 include: An instruction sending module is configured to send a start instruction to at least two infrared emitting tubes when the width gauge is placed with a material to be measured; an intensity acquisition module, configured to acquire at least two infrared intensities of the at least two infrared emitting tubes when the at least two infrared emitting tubes are started; an edge recognition module, configured to determine edge information of the material to be measured based on the at least two infrared intensities; The width determination module is configured to determine width data of the material to be measured based on the edge information.

5. A computing device, characterized in that: include: Memory and processor; The memory is used to store computer executable instructions, and the processor is used to execute the computer executable instructions. When the computer executable instructions are executed by the processor, the steps of the width measurement method according to any one of claims 1 to 3 are implemented. 6 . A computer-readable storage medium storing computer-executable instructions, wherein the computer-executable instructions, when executed by a processor, implement the steps of the width measurement method according to any one of claims 1 to 3.

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