Three-point measuring base for crystal size

Abstract

This application relates to a three-point measurement base for crystal ingot dimensions, and to the technical field of crystal ingot measurement. The measurement base includes a base and at least two support columns disposed on the base, which cooperate to support the crystal ingot and keep it horizontal. This application uses multiple support columns to support the crystal ingot, which is then tested by a tester. This greatly reduces the contact area between the crystal ingot and the base during testing, facilitates the discharge of bubbles between the crystal ingot and the multiple support columns, and significantly improves measurement efficiency and accuracy.

Description

Technical Field

[0001] The present application relates to the technical field of crystal ingot measurement, and in particular to a three-point measurement base for crystal ingot dimensions. Background Art

[0002] The electronic information industry is a pillar of my country's national economy, and quartz wafers play a vital role within it. The industry has experienced rapid growth in recent years, and the demand for processing equipment and online high-precision measurement and control equipment used in the production of quartz wafer (crystal ingot) components has also been increasing.

[0003] During the grinding process of existing quartz wafers, the thickness of the quartz wafers needs to be tested to improve the grinding quality. During measurement, the base is flat, and all contact surfaces of the crystal ball must be cleaned and thoroughly wiped dry with a dust-free cloth. Then, the crystal ball is placed on the measuring base, pressed by hand, and moved repeatedly until the small bubbles generated by the large-area contact between the crystal ball and the measuring base are expelled to ensure the accuracy of the crystal ball measurement. As a result, the entire measurement process is complicated and time-consuming, reducing the efficiency and accuracy of the measurement. Summary of the Invention

[0004] In order to improve the efficiency and accuracy of measurement, this application provides a three-point measurement base for crystal size.

[0005] The three-point measuring base for crystal ingot size provided in this application adopts the following technical solutions:

[0006] A three-point measuring base for crystal ingot size includes a base and support columns arranged on the base. The number of the support columns is at least two and they cooperate to support the crystal ingot and make the crystal ingot in a horizontal state.

[0007] By adopting the above technical solution, during measurement, the crystal mass is cleaned and dried, then placed on the top of multiple support pillars, and the small bubbles between the crystal mass and the multiple support pillars are discharged by translation. The tester pull rod is placed on the crystal mass for testing. This greatly reduces the contact area between the test crystal mass and the base, facilitates the discharge of bubbles between the crystal mass and the multiple support pillars, and greatly improves the efficiency and accuracy of the measurement.

[0008] Optionally, there are three support pillars and a line connecting the center points of the three support pillars forms an equilateral triangle. The top of each support pillar is provided with an arc-shaped support surface for buffering the crystal ingot.

[0009] By adopting the above technical solution, the three support pillars are evenly distributed. Therefore, during measurement, the tester is placed at the same distance from the three support pillars for testing, thereby further improving the test accuracy. At the same time, it also reduces the probability of uneven local pressure of the tester pull rod on the crystal ingot, reducing the probability of damage to the crystal ingot.

[0010] The support surface is used to cushion the contact between the crystal mass and the support column, reducing the probability of pressing the crystal mass and causing the part of the crystal mass outside the support column to rotate downward and contact the support column, thereby reducing the probability of damage to the crystal mass. Moreover, through the design of the support surface, the contact area with the crystal mass is further reduced, thereby further improving the convenience of placing the crystal mass and discharging bubbles, thereby improving the efficiency and accuracy of measurement.

[0011] Optionally, the support column is provided with a truncated cone-shaped mounting surface connected to the support surface, and the top diameter of the mounting surface is smaller than the bottom diameter.

[0012] By adopting the above technical solution, the mounting surface design reduces the contact area with the crystal mass while increasing the area with the support column and the connecting plate, thereby improving the connection strength between the support column and the connecting plate, improving the stability of multiple support columns, and improving the efficiency and accuracy during measurement.

[0013] Optionally, a connecting plate is detachably mounted on the base, the support column is arranged on the connecting plate, and a leveling surface for leveling is provided on the connecting plate.

[0014] By adopting the above technical solution, the connecting plate connects multiple support columns to each other, thereby improving the uniformity of the positions of the multiple support columns. The connecting plate is used to achieve a detachable connection with the base, so that the multiple support columns are in the same horizontal plane, and it is also convenient to replace the support columns as required. At the same time, the plane can be used to calibrate the installation position of the connecting plate, thereby improving the convenience when replacing the support columns and improving the efficiency and accuracy of the measurement.

[0015] Optionally, a connection slot is provided on the connection plate and a positioning screw is connected to the screw, the base is plugged into and installed on the connection slot for positioning and the positioning screw is pressed against the side wall of the base for positioning.

[0016] By adopting the above technical solution, the base is plugged into the connecting groove, and then the positioning screw is tightened on the base for positioning, so as to realize the detachable connection between the base and the connecting plate; at the same time, support columns of different specifications are installed on the connecting plate, and the connecting plate is connected to the same base, so as to realize the replacement of support columns of different specifications, thereby improving the convenience when replacing the support columns.

[0017] Optionally, the connecting plate is provided with a protective component for housing a plurality of support column covers therein for protection, the protective component comprising:

[0018] A connecting soft belt, which is arranged on the connecting plate and is made of a soft material;

[0019] The protective cover is arranged on the connecting soft belt and has a plurality of placement slots for plugging and cooperating with the support columns. After the measurement is completed, the plurality of support columns are plugged and installed in the plurality of placement slots for protection.

[0020] By adopting the above technical solution, when inspection is required, the protective cover is pushed upward to separate the protective cover from the multiple support columns, and then measurement can be carried out; when the measurement is completed and no longer needed, the protective cover is rotated close to the multiple support columns, so that the multiple support columns are plugged into and matched with the multiple placement slots, thereby realizing protection of the top ends of the multiple support columns, reducing the probability of impurities adhering to the top ends of the support columns, thereby reducing the probability of wasting time on cleaning impurities and forgetting to clean them, which will have an adverse effect on the measurement, and improving measurement blanking and accuracy.

[0021] Optionally, a positioning component for positioning is provided on the base, and the positioning component includes:

[0022] A counterweight block, which is used to be placed on the measuring table and used for counterweight positioning;

[0023] A positioning plate, the positioning plate being detachably mounted on the counterweight block via a plurality of positioning screws;

[0024] A positioning ring is provided on the upper surface of the positioning plate, the base is plugged and installed on the positioning ring, and the positioning plate is provided with a fixing screw that passes through the positioning plate and is threadedly connected to the base and is used to position the base.

[0025] By adopting the above technical solution, the counterweight block is placed on the measuring table for counterweighting, the base is plugged into the positioning ring, the fixing screw is threadedly connected to the base, so that the base is pressed against the positioning plate for positioning, thereby realizing the replacement and positioning of the base, and then the positioning plate on the base is placed on the counterweight block, and multiple positioning screws are threadedly connected to the counterweight block, and then the horizontality of the standard surface can be detected. At the same time, multiple positioning screws are used to fix the positioning plate, so that multiple support columns are in the same horizontal plane. At the same time, the counterweight block and the positioning plate are used to counterweight and position multiple support columns, which reduces the probability of pushing the base and multiple support columns to move during crystal testing, and further improves measurement efficiency and accuracy.

[0026] Optionally, a support assembly for temporarily supporting the tester pull rod is provided on the connecting plate, and the support assembly includes:

[0027] A mounting rod, the mounting rod being arranged on the connecting plate and having a first groove body and a second groove body connected to each other in both vertical and horizontal directions;

[0028] A moving block, wherein the moving block is slidably arranged on the first trough body or the second trough body;

[0029] The support rod is arranged on the moving block and temporarily supports and positions the tester pull rod when in a horizontal state and is convenient for storage when in a vertical state.

[0030] By adopting the above technical solution, the tester pull rod is manually pulled up, and the support rod is pushed to drive the moving block to the second slot body, so that the moving block is pressed against the second slot body for positioning, and then the tester pull rod is loosened so that the tester pull rod is pressed against the support rod, and then the crystal mass can be placed on the support column, and then the support rod is pulled horizontally to the outside of the tester pull rod, so that the tester pull rod is pressed against the crystal mass for positioning, thereby realizing the measurement of the crystal mass. Therefore, when placing the crystal mass, there is no need to pull the tester pull rod and the crystal mass can be supported by both hands, which improves the convenience and accuracy of crystal mass measurement, and improves the efficiency and accuracy of measurement.

[0031] At the same time, the tester pull rod can be placed as close to the crystal mass as possible, so that the tester pull rod is pressed against the crystal mass for measurement after the support rod is removed, reducing the probability of the tester pull rod being subjected to large vibrations due to manual pulling of the tester pull rod to a large distance from the crystal mass, reducing the probability of damage to the tester pull rod, and improving test efficiency and accuracy.

[0032] Optionally, an inclined guide surface is provided at one end of the support rod close to the support column, and the guide surface connects the upper and lower surfaces of the support rod and is used to guide the tester pull rod onto the crystal ingot.

[0033] By adopting the above technical solution, as the support rod moves, the tester pull rod is pressed against the guide surface, and the guide surface makes the tester pull rod gradually approach the crystal mass, thereby further shortening the distance between the tester pull rod and the support rod and the crystal mass, further reducing the probability of tester damage and improving the test accuracy.

[0034] Optionally, the top end of the first trough is connected to an end of the second trough away from the support column, and the mounting rod is provided with a limiting mechanism for limiting the support rod, and the limiting mechanism includes:

[0035] A limiting column is provided on the mounting rod and is located below the second slot body and on a side of the first slot body close to the second slot body;

[0036] A tension component, which is arranged on the mounting rod and connected to the limiting column and is always in a tensioned state;

[0037] When the moving block is located on the first trough body, the moving block is pressed against the bottom end of the first trough body for positioning under the action of the tension of the tension component, or when the moving block is located on the second trough body, the moving block is pressed against the end of the second trough body away from the first trough body for positioning under the action of the tension of the tension component.

[0038] By adopting the above technical solution, after the measurement is completed, the support rod is pulled away from the tester pull rod, and the movement of the support rod drives the moving block to move horizontally to the connection between the second trough body and the first trough body and then enter the first trough body, so that the support rod is rotated from horizontal to vertical state, and the support rod is released. The moving block moves downward under the action of the pulling assembly and presses against the bottom end of the first trough body for positioning, so that the support rod is placed in a vertical state.

[0039] When measurement is required, the support rod is pushed upward, and the upward movement of the support rod drives the moving block to move up to the connection between the first slot body and the second slot body and then enters the second slot body. The support rod is rotated from a vertical to a horizontal state, and the support rod is released, so that the moving block is pressed against the end of the second slot body away from the first slot body for positioning, thereby maintaining the support rod in a horizontal state, thereby improving the stability of the support rod when it is in a vertical or horizontal state, and also improving the convenience during movement, thereby improving the efficiency and accuracy of measurement.

[0040] Optionally, the tension component includes:

[0041] A fixed column, the fixed column being arranged on the support rod;

[0042] The tension spring has two ends hooked on the fixing column and the limiting column and is always in a stretched state.

[0043] By adopting the above technical solution, the tension spring pulls the fixed column to move, and the replacement of the tension spring is also convenient.

[0044] In summary, this application includes at least one of the following beneficial technical effects:

[0045] The crystal ingot is supported by multiple support columns and then tested by the tester, which greatly reduces the contact area between the crystal ingot and the base during testing, facilitates the discharge of bubbles between the crystal ingot and the multiple support columns, and greatly improves the efficiency and accuracy of the measurement. BRIEF DESCRIPTION OF THE DRAWINGS

[0046] Figure 1 1 is a schematic diagram of the three-dimensional structure of the base embodiment 1;

[0047] Figure 2 2 is a schematic diagram of the three-dimensional structure of the base embodiment 2;

[0048] Figure 3 Schematic diagram of the structure of the support assembly and the limiting mechanism in the base embodiment 2;

[0049] Figure 4 This is a structural diagram of the support assembly and the limiting mechanism in base embodiment 2 from another angle.

[0050] Figure markings: 1. base; 11. connecting plate; 12. positioning screw; 2. support column; 21. mounting surface; 22. support surface; 3. positioning assembly; 31. counterweight block; 32. positioning plate; 33. positioning ring; 34. positioning screw; 4. protective assembly; 41. connecting soft belt; 42. protective cover; 43. placement slot; 5. support assembly; 51. mounting rod; 511. vertical part; 512. horizontal part; 513. first slot body; 514. second slot body; 52. moving block; 53. support rod; 54. guide surface; 6. limiting mechanism; 61. limiting column; 62. tension assembly; 63. fixing column; 64. tension spring. DETAILED DESCRIPTION

[0051] The following is combined with Figure 1-4 This application is described in further detail.

[0052] The embodiments of the present application disclose a three-point measurement base for crystal ingot dimensions.

[0053] Example 1

[0054] Reference Figure 1 The three-point measuring base for the crystal size includes a base 1 for being placed on a measuring table, and a plurality of support columns 2 fixedly mounted on the base 1. There are at least two support columns 2, and in this example there are three support columns 2. The three support columns 2 cooperate to support the crystal and make the crystal in a horizontal state.

[0055] The base 1 is a rectangular structure in a vertical state, the bottom of the base 1 is square, and the length of the base 1 is smaller than the height; the three support columns 2 are arranged in a herringbone shape and the bottoms are fixedly mounted on the upper surface of the base 1, so that the center line of the bottom of the three support columns 2 forms an equilateral triangle, and the projection of the center of the tester pull rod on the bottom of the support column 2 coincides with the center of the equilateral triangle, so that the pressure of the tester pull rod on the crystal ingot is balanced during the test, reducing the damage to the crystal ingot during the test.

[0056] A truncated cone-shaped mounting surface 21 is provided on the support column 2. The top diameter of the mounting surface 21 is smaller than the bottom diameter. The mounting surface 21 extends to the top of the support column 2. The design of the mounting surface 21 ensures the connection strength between the support column 2 and the base 1, while also reducing the contact area between the support column 2 and the crystal ingot. A circular arc-shaped supporting surface 22 is provided at the top of the support column 2. The supporting surface 22 is connected to the mounting surface 21. When the crystal ingot is pressed and a part of the crystal ingot located outside the support column 2 rotates downward, causing the crystal ingot to tilt, the supporting surface 22 can provide buffering when the crystal ingot contacts the support column 2, thereby reducing the probability of damage to the crystal ingot.

[0057] The working principle of the embodiment of this application is as follows:

[0058] Place the base 1 on the measuring table, then calibrate the positions of the three support pillars 2, pull the tester rod upward, clean and dry the crystal mass and place it on the three support pillars 2, move the crystal mass to expel the bubbles between the crystal mass and the support pillars 2, loosen the tester rod so that the tester rod is pressed against the crystal mass for testing, thereby greatly reducing the contact area between the crystal mass and the base 1 during testing, thereby improving the test efficiency and accuracy.

[0059] Example 2

[0060] Reference Figure 2 The difference between this embodiment and embodiment 1 is that the top of the base 1 is detachably mounted on the connecting plate 11, and the three support columns 2 are fixedly mounted on the upper surface of the connecting plate 11; at the same time, the base 1 is provided with a positioning component 3 for positioning and a protective component 4 for protecting the multiple support columns 2, and the base 1 is also provided with a support component 5 for temporarily supporting the tester pull rod.

[0061] The lower surface of the connecting plate 11 is provided with a connecting groove, into which the top end of the base 1 is inserted. The outer wall of the connecting plate 11 is threaded with multiple positioning screws 12 that press against the side wall of the base 1 for positioning. After tightening the positioning screws 12, the connecting plate 11 is removed, and a new connecting plate 11 and support column 2 are then replaced. The positioning screws 12 are tightened against the base 1 for positioning, allowing support columns 2 of different sizes to be replaced as needed.

[0062] Reference Figure 2 The positioning assembly 3 includes a counterweight 31, a positioning plate 32 and a positioning ring 33. The counterweight 31 and the tester used for measurement are placed on the measuring table. The measuring table is in a horizontal state. The counterweight 31 has a cube-shaped structure and is used for counterweighting, which reduces the probability of displacement of the support column 2 when used for measurement; the positioning plate 32 has a square structure and is placed on the upper surface of the counterweight 31. Positioning screws 34 are provided at the four corners of the upper surface of the positioning plate 32. The positioning screws 34 pass through the positioning plate 32 and are threadedly connected to the counterweight 31, so as to realize a detachable connection between the positioning plate 32 and the counterweight 31.

[0063] The positioning ring 33 is fixedly mounted on the upper surface of the positioning plate 32, and the center lines of the positioning ring 33 and the positioning plate 32 coincide with each other. The bottom of the base 1 is plugged into the positioning ring 33, and a fixing screw is provided on the lower surface of the positioning plate 32, passing through the positioning plate 32 and threadedly connected to the bottom of the base 1. The head of the fixing screw is located in the positioning plate 32, so as to realize the detachable connection between the base 1 and the positioning plate 32. At the same time, the fixing screw pulls the base 1 to press against the upper surface of the positioning plate 32 for positioning.

[0064] A leveling surface is provided on the upper surface of the connecting plate 11 for leveling multiple support columns 2. After the connecting plate 11 is replaced, the positioning plate 32 is connected to the counterweight block 31 through four positioning screws 34, and the four positioning screws 34 are not tightened first. Use a dial indicator to press on the leveling surface, move the dial indicator or the counterweight block 31, and tighten the four positioning screws 34 according to the horizontal situation, so as to calibrate the positions of the three support columns 2 so that the three support columns 2 are on the same horizontal plane.

[0065] Reference Figure 2 A protective component 4 is provided on the connecting plate 11 and on the side of the three support columns 2 away from the support assembly 5. The protective component 4 is used to cover the three support columns 2 for protection. The protective component 4 includes a connecting soft belt 41 and a protective cover 42. The connecting soft belt 41 is fixedly mounted on the side wall of the connecting plate 11 and is made of a soft material, which can be soft plastic. The protective cover 42 is fixedly mounted on the connecting soft belt 41 and is provided with three placement grooves 43 that are plugged into the support columns 2. The protective cover 42 is buckled onto the three support columns 2 so that the three support columns 2 are plugged into the three placement grooves 43, thereby preventing dust from adhering to the top of the support columns 2, reducing the probability of subsequently cleaning the top of the support columns 2, and also reducing the probability of forgetting to clean the support columns 2 when performing measurements, thereby improving the efficiency and accuracy of the measurement.

[0066] Reference Figure 2 and Figure 3 The support assembly 5 includes a mounting rod 51, a moving block 52 and a support rod 53. The mounting rod 51 includes a vertical portion 511 and a horizontal portion 512 connected to each other. The vertical portion 511 is fixedly mounted on the upper surface of the side wall of the connecting plate 11 by screws and extends vertically above the support column 2. The horizontal portion 512 is located at the top of the vertical portion 511 and on the side wall close to the support column 2 and is in a horizontal state; a first groove 513 is vertically opened on the vertical portion 511, and a second groove 514 is horizontally opened on the horizontal portion 512. The top of the first groove 513 is connected to the end of the second groove 514 away from the support column 2 and the connection is arc-shaped. The widths of the first groove 513 and the second groove 514 are the same; the moving block 52 is slidably mounted on the first groove 513 or the second groove 514 and extends to the outside of the first groove 513 and the second groove 514.

[0067] The support rod 53 is fixedly mounted on the moving block 52. When the moving block 52 is located on the second trough body 514, the support rod 53 extends horizontally to above the multiple support columns 2 at one end close to the support column 2 and is in a horizontal state. At the same time, a downwardly inclined guide surface 54 is provided on the upper surface of the end of the support rod 53 close to the support column 2. The guide surface 54 extends to the lower surface of the support rod 53. The tester pull rod is pressed against the upper surface of the support rod 53 for positioning, and the guide surface 54 is used to guide the tester pull rod to the upper surface of the crystal ingot; or, when the moving block 52 is located on the first trough body 513, the support rod 53 is in a vertical state for easy storage, and the moving block 52 is pressed against the bottom of the first trough body 513 for positioning the support rod 53.

[0068] Reference Figure 3 and Figure 4 The mounting rod 51 is provided with a limiting mechanism 6 for limiting the support rod 53. The limiting mechanism 6 includes a limiting column 61 and a tension component 62. The limiting column 61 is fixedly mounted on the vertical portion 511, and the limiting column 61 is located on the side of the first trough 513 close to the second trough 514 and below the first trough 513 and the second trough 514; the tension component 62 is provided on the mounting rod 51 and is connected to the limiting column 61 and is always in a stretched state.

[0069] When the moving block 52 is located in the first slot 513, the moving block 52 is pressed against the bottom end of the first slot 513 under the pulling force of the tension assembly 62 to maintain its position. When the moving block 52 is located in the second slot 514, the moving block 52 is pressed against the end of the second slot 514 away from the first slot 513 under the pulling force of the tension assembly 62 to maintain its position. The tension assembly 62 includes a fixed column 63 and a tension spring 64. The fixed column 63 is fixedly mounted on the side wall of the support rod 53 near the limiting column 61, with the axes of the fixed column 63 and the limiting column 61 being parallel. The ends of the tension spring 64 are hooked on the fixed column 63 and the limiting column 61, and the tension spring 64 is always in a stretched state.

[0070] Reference Figure 2 、 Figure 3 and Figure 4 Before measurement, the support rod 53 is in a vertical state for easy storage; during measurement, the tester pull rod is pulled up, and the support rod 53 is pushed to drive the moving block 52 to move up to the connection between the first slot body 513 and the second slot body 514 and then enter the second slot body 514, so that the support rod 53 is turned from a vertical state to a horizontal state, and the support rod 53 is released. The moving block 52 is pressed against the end of the second slot body 514 away from the first slot body 513 under the action of the tension spring 64 for positioning. Then the tester pull rod is released so that the tester pull rod is pressed against the support rod 53 for positioning, and the crystal ingot is placed on the three support columns 2 and below the support rod 53. Hold both ends of the crystal ingot with both hands and move to expel the bubbles between the crystal ingot and multiple support columns 2.

[0071] The crystal ingot is released, and the support rod 53 is pulled, causing the movable block 52 to move to the junction of the first and second troughs 513 and 514, then into the first trough 513. This allows the tester's pull rod to move onto the guide surface 54 and, guided by the guide surface 54, gradually approach and press against the crystal ingot. This reduces the impact force when the tester's pull rod contacts the crystal ingot, lowering the probability of damage to the tester and the crystal ingot. Under the action of the tension spring 64, the movable block 52 moves downward and presses against the bottom of the first trough 513, thus positioning the support rod 53 in an upright position and enabling measurement of the crystal ingot.

[0072] The working principle of the embodiment of this application is as follows:

[0073] During measurement, the tester pull rod is moved upward, pushing the support rod 53 to a horizontal state, and the tester pull rod is released so that the tester pull rod is pressed against the support rod 53 for temporary support. Then, the cleaned and dried crystal block is placed on the three support columns 2, and the crystal block is moved to expel the bubbles between the crystal block and the support columns 2. The support rod 53 is pulled to a vertical state, and the tester pull rod is pressed against the upper surface of the crystal block for positioning under the action of the guide surface 54, thereby realizing the measurement of the crystal block and improving the efficiency and accuracy of the measurement.

[0074] After the measurement is completed, the protective cover 42 is buckled onto the three support columns 2, and the three support columns 2 are plugged into the three placement slots 43 for positioning, so as to protect the three support columns 2. Before measurement, the protective cover 42 is pushed to separate from the three support columns 2, and then the measurement is carried out. At the same time, the counterweight block 31 and the positioning plate 32 position the base 1 and the three support columns 2, reducing the probability of displacement of the support columns 2 during measurement, thereby improving the efficiency and accuracy of the measurement.

[0075] The above are all preferred embodiments of the present application, and are not intended to limit the scope of protection of the present application. Therefore, any equivalent changes made based on the structure, shape, and principle of the present application should be included in the scope of protection of the present application.

Claims

1. The three-point measuring base for crystal size is characterized by: It comprises a base (1) and support columns (2) arranged on the base (1), wherein the number of the support columns (2) is at least two and they cooperate to support the crystal ingot and make the crystal ingot in a horizontal state; A connecting plate (11) is detachably mounted on the base (1), the support column (2) is arranged on the connecting plate (11), and a leveling surface for leveling is provided on the connecting plate (11); A support assembly (5) for temporarily supporting the tester pull rod is provided on the connecting plate (11), and the support assembly (5) comprises: A mounting rod (51), the mounting rod (51) being arranged on the connecting plate (11) and having a first trough (513) and a second trough (514) that are connected to each other in both vertical and horizontal directions, wherein the top end of the first trough (513) is connected to an end of the second trough (514) that is away from the support column (2); A moving block (52), wherein the moving block (52) is slidably disposed on the first trough body (513) or the second trough body (514); A support rod (53), the support rod (53) being arranged on the moving block (52) and temporarily supporting and positioning the tester pull rod when in a horizontal state and being convenient for storage when in a vertical state; An inclined guide surface (54) is provided at one end of the support rod (53) close to the support column (2). The guide surface (54) connects the upper and lower surfaces of the support rod (53) and is used to guide the tester pull rod onto the crystal ingot.

2. The three-point measurement base for crystal ingot size according to claim 1, characterized in that: There are three support columns (2), and the center points of the three support columns (2) are connected to form an equilateral triangle. The top of the support column (2) is provided with a support surface (22) in an arc shape for buffering the crystal ingot.

3. The three-point measurement base for crystal ingot size according to claim 2, characterized in that: The support column (2) is provided with a truncated cone-shaped mounting surface (21) connected to the support surface (22), and the top diameter of the mounting surface (21) is smaller than the bottom diameter.

4. The three-point measurement base for crystal ingot size according to claim 1, characterized in that: The connecting plate (11) is provided with a protective component (4) for housing a plurality of support columns (2) for protection. The protective component (4) comprises: A connecting soft belt (41), the connecting soft belt (41) is arranged on the connecting plate (11) and is made of a soft material; A protective cover (42) is provided on the connecting soft belt (41) and is provided with a plurality of placement slots (43) for plugging and matching with the support columns (2). After the measurement is completed, the plurality of support columns (2) are plugged and installed in the plurality of placement slots (43) for protection.

5. The three-point measurement base for crystal ingot size according to claim 1, characterized in that: A positioning assembly (3) for positioning is provided on the base (1), and the positioning assembly (3) comprises: A counterweight block (31), the counterweight block (31) being used for placement on the measuring table and for counterweight positioning; a positioning plate (32), the positioning plate (32) being detachably mounted on the counterweight (31) via a plurality of positioning screws (34); A positioning ring (33) is provided on the upper surface of the positioning plate (32), the base (1) is plugged and installed on the positioning ring (33), and the positioning plate (32) is provided with a fixing screw that passes through the positioning plate (32) and is threadedly connected to the base (1) and is used to position the base (1).

6. The three-point measurement base for crystal ingot size according to claim 1, characterized in that: The mounting rod (51) is provided with a limiting mechanism (6) for limiting the support rod (53), and the limiting mechanism (6) comprises: a limiting column (61), the limiting column (61) being arranged on the mounting rod (51) and being located below the second trough body (514) and on a side of the first trough body (513) close to the second trough body (514); A tension component (62), the tension component (62) is connected to the limiting column (61) and is always in a tensioned state; When the moving block (52) is located on the first trough body (513), the moving block (52) is pressed against the bottom end of the first trough body (513) under the pulling force of the pulling assembly (62) for positioning; or, when the moving block (52) is located on the second trough body (514), the moving block (52) is pressed against the end of the second trough body (514) away from the first trough body (513) for positioning under the pulling force of the pulling assembly (62).

7. The three-point measurement base for crystal ingot size according to claim 6, characterized in that: The tension component (62) includes: A fixing column (63), wherein the fixing column (63) is arranged on the support rod (53); A tension spring (64), wherein both ends of the tension spring (64) are hooked on the fixing column (63) and the limiting column (61) and are always in a stretched state.

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